High-precision single crystal blade residual stress measurement method based on neutron diffraction technology

Through the high-precision single-crystal blade residual stress measurement method based on neutron diffraction technology, the problem of insufficient residual stress detection accuracy at key positions of single-crystal blades is solved, and high-precision stress measurement is achieved, providing reliable data support for process evaluation and performance optimization.

CN119533731APending Publication Date: 2025-02-28INSTITUTE OF NUCLEAR PHYSICS AND CHEMISTRY CHINA ACADEMY OF ENGINEERING PHYSICS
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Patent Information

Application Number
CN202411580740.7
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-11-07
Publication Date
2025-02-28

AI Technical Summary

Technical Problem

It is difficult for the prior art to achieve high-precision residual stress detection at key positions such as the blade body, tenon head, air membrane periphery, and internal reinforcement ribs of single crystal blades.

Method used

A high-precision single-crystal blade residual stress measurement method is adopted based on neutron diffraction technology. Through laser theodolite positioning, Kappa goniometer lifting and neutron diffraction data acquisition, etc., combined with a slit fine-tuning system and a two-dimensional detector, a high-precision measurement of residual stress at key positions is achieved.

Benefits of technology

It realizes high-precision detection of residual stress at key positions of single crystal blades, improves testing accuracy, and provides reliable data for process evaluation and performance optimization.

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Abstract

The invention discloses a high-precision single crystal blade residual stress measurement method based on a neutron diffraction technology, which further amplifies the high-precision advantage of a stress spectrometer based on a reactor neutron source, and integrates the technical advantages of a Kappa goniometer and an Euler ring of texture measurement equipment. And high-precision measurement of the residual stress of the single crystal blade based on the neutron diffraction technology is realized. According to the method, the neutron diffraction technology is utilized to carry out high-precision measurement of the residual stress of the single crystal blade with the complex and fine configuration, so that accurate measurement of the residual stress of key positions such as blade body air film hole peripheries and internal reinforcing ribs is realized, guidance is provided for the processing technology, and reliable data support is provided for evaluation of the service performance and the service life of the blade. Meanwhile, the method can also be applied to high-precision measurement of three-dimensional residual stress of other complex structure components.
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Description

Technical Field

[0001] The present application relates to the field of residual stress testing, and in particular to a high-precision single crystal blade residual stress measurement method based on neutron diffraction technology. Background Art

[0002] The residual stress of single crystal high temperature alloy turbine blades of advanced aero-engines directly affects their service life and service safety. Characterizing and regulating residual stress is crucial for process evaluation and performance optimization. The macroscopic configuration of single crystal blades is very complex. They usually adopt a hollow thin-walled structure, with complex cooling channels such as partition walls, longitudinal ribs, and transverse ribs inside. The surface of the blade is coated with layers and multiple exhaust film holes are distributed. Therefore, the accurate characterization of residual stress at key positions of single crystal blades places extremely high demands on the spatial resolution and stress accuracy of characterization technology. Neutron diffraction technology has many advantages in measuring residual stress of engineering components, such as deep penetration and non-destructive testing. For residual stress detection of high temperature alloy disks and single crystal blades, relevant research work and engineering applications have been carried out based on neutron sources at home and abroad. However, since the neutron sampling volume is usually in the millimeter range, the detection of residual stress at key positions such as blade body, tenon, air film hole, and reinforcement ribs needs to further improve the test accuracy. Summary of the invention

[0003] In view of this, the purpose of the present invention is to provide a high-precision single crystal blade residual stress measurement method based on neutron diffraction technology, which solves the problem of high-precision detection of residual stress in key positions such as the blade body, tenon, air film hole, internal reinforcement ribs, etc. of single crystal blades, and develops effective control technology for the neutron beam spot size and the distance between the neutron beam and the sample, providing a practical technical solution for the accurate detection of residual stress in single crystal blades.

[0004] The present invention provides a high-precision single crystal blade residual stress measurement method based on neutron diffraction technology, characterized in that the test method comprises the following steps:

[0005] a. Laser theodolite positioning

[0006] The neutron stress analysis spectrometer sample stage (1), laser theodolite I (27) and laser theodolite II (31) are located at three vertices of a triangle, and are located at the vertex corresponding to the longest side of the triangle and the other two vertices respectively. The laser theodolite I (27) and laser theodolite II (31) are adjusted to be horizontal, and the height of the laser theodolite I (27) and laser theodolite II (31) is adjusted so that the cross in the field of view of the laser theodolite I (27) and laser theodolite II (31) is The laser theodolite (27) and the laser theodolite (31) are aligned with the incident slit (15) and the diffraction slit (16) respectively, and the YZ coordinates of the incident slit (15) and the diffraction slit (16) are adjusted so that the center of the crosshairs in the field of view of the laser theodolite (27) and the laser theodolite (31) are located at the center of the slit, and the optical positioning corresponds to the diffraction volume;

[0007] b. Kappa goniometer hoisting

[0008] The Kappa goniometer (6) is hoisted onto the sample stage bottom plate (1), and the horizontal center of the Kappa goniometer (6) is adjusted to be located at the center of the sample stage bottom plate (1), and the vertical center of the Kappa goniometer (6) is aligned with the neutron beam height;

[0009] c. Sample preparation

[0010] The single crystal blade sample (14) to be measured is mounted on a Kappa goniometer (6) on a Kappa goniometer three-dimensional coordinate adjustment rotating table (7).

[0011] d. Optical positioning of the single crystal blade sample to be tested

[0012] d1. Mark the test point, determine the XZ coordinates of the test point using laser theodolite I (27), verify the Z coordinate of the test point using laser theodolite II (31), and determine the Y coordinate of the test point;

[0013] d2. Use the rotation (11) and tilt (12) functions of the Kappa goniometer (6) to rotate the single crystal blade sample (14) to be tested. If the test point of the single crystal blade sample (14) to be tested is always located at the center of the laser theodolite I (27) and the laser theodolite II (31) during the rotation process, the positioning is successful. If the test point deviates from the center of the laser theodolite I (27) and the laser theodolite II (31) during the rotation process of the single crystal blade sample (14) to be tested, the XYZ coordinates of the test point are fine-tuned until the test point completely coincides with the center of the neutron sampling volume, thereby obtaining the XYZ coordinates of the test point.

[0014] e. Confirmation of the distance between the single crystal blade sample (14) to be tested and the slit

[0015] Repeat step d to determine the order of movement of each test point, and determine in turn the safe distance between the single crystal blade sample (14) to be tested and the slit during the pole figure scanning process, the minimum allowable distance between the sample and the slit during the formal measurement process, and the corresponding X-coordinate values ​​of the slit fine-tuning system (19) and (20) under the diffraction geometry conditions of each {hkl} crystal plane to be tested.

[0016] f. Scanning and positioning of the single crystal blade sample to be tested

[0017] According to the parameters of each test point determined in steps d and e, a test point is selected to measure the pole figure of the single crystal blade sample (14) to be tested, and the spatial orientation of the diffraction signal is determined. The surface of the single crystal blade sample (14) to be tested is scanned at a certain spatial orientation where the diffraction signal exists at the test point to obtain the precise coordinates of the test point, and the coordinates of each test point of the single crystal blade sample (14) to be tested are corrected to obtain accurate XYZ coordinates.

[0018] g. Neutron diffraction data collection

[0019] The pole figures of each {hkl} crystal plane to be tested at each test point are measured in turn, and a fine scan is performed in the span range of 5° to 10° with a step size of 0.1° in the presence of the spatial orientation of the diffraction signal to obtain the data required for strain matrix analysis of each {hkl} crystal plane to be tested at each test point.

[0020] Furthermore, in step a, a laser theodolite support platform (29) is provided to adjust the laser theodolite I (27) and the laser theodolite II (31) to a horizontal position, a laser theodolite lifting rod (28) is provided to adjust the height of the laser theodolite I (27) and the laser theodolite II (31), and a laser theodolite tripod bracket (30) is provided for support.

[0021] Furthermore, in step a, a slit fine-tuning system I (19) and a slit fine-tuning system II (20) are provided to adjust the YZ coordinates of the incident slit (15) and the diffraction slit (16), and the incident slit (15) and the diffraction slit (16) are provided with an incident slit bracket (17) and a diffraction slit bracket (18).

[0022] Furthermore, in step a, the slit fine-tuning system I (19) and the slit fine-tuning system II (20) are provided with an incident slit telescopic arm support frame (21), a diffraction slit telescopic arm support frame (22), an incident slit telescopic arm (23), and a diffraction slit telescopic arm (24).

[0023] Furthermore, in step a, a two-dimensional detector (25) is provided at the rear end of the diffraction slit (16).

[0024] Furthermore, in step b, the sample stage base plate (1) is also provided with a sample stage X-coordinate adjustment motor (2), a sample stage Y-coordinate adjustment motor (3), a sample stage X-coordinate adjustment screw (4), and a sample stage Y-coordinate adjustment screw (5), and by adjusting the XYZ coordinates of the sample stage base plate (1), it is ensured that the horizontal center of the Kappa goniometer (6) is located at the center of the sample stage base plate (1).

[0025] Furthermore, in step b, a standard Φ0.5 steel wire is used to calibrate the XYZ coordinates of the sample stage of the neutron stress analysis spectrometer corresponding to the center of the Euler ring.

[0026] Furthermore, in step c, the Kappa goniometer three-dimensional coordinate adjustment rotating platform (7) is also provided with a Kappa goniometer X-coordinate adjustment motor (8), a Kappa goniometer Y-coordinate adjustment motor (9), and a Kappa goniometer Z-coordinate adjustment motor (10).

[0027] Furthermore, in step c, the Kappa goniometer (6) is also provided with a Kappa goniometer self-rotation support assembly (11), a Kappa goniometer tilt adjustment assembly (12), and a Kappa goniometer 1 / 4 arc notch space (13).

[0028] Furthermore, in step e, during the rotation of the single crystal blade sample (14), the safety distance between the single crystal blade sample (14) to be tested and the incident slit (15) and the diffraction slit (16) is the blade height + 40 mm, and during measurement, the safety distance between the single crystal blade sample (14) to be tested and the incident slit (15) and the diffraction slit (16) is 5 mm to 20 mm.

[0029] Furthermore, in step f, when scanning the surface of the single crystal blade sample (14) to be tested, the selected orientation has an angle of 75° to 90° with the Z axis, so as to minimize the interference of the blade configuration.

[0030] Beneficial effects of the present invention:

[0031] The high-precision single crystal blade residual stress measurement method based on neutron diffraction technology of the present invention further amplifies the high-precision advantage of the stress spectrometer based on the reactor neutron source, and integrates the technical advantages of the texture measurement equipment Kappa goniometer and Euler ring to achieve high-precision measurement of the residual stress of single crystal blades based on neutron diffraction technology. This has important application value for the accurate measurement of residual stress at key positions of blades and process evaluation based on stress distribution. The present invention is mainly used to carry out high-precision measurement of residual stress of single crystal blades with complex and fine configurations using neutron diffraction technology, thereby achieving accurate measurement of residual stress at key positions such as the air film holes around the blade body and internal reinforcement ribs, thereby providing guidance for the processing technology and providing reliable data support for the evaluation of blade service performance and service life. At the same time, the present invention can also be applied to the high-precision measurement of three-dimensional residual stress of other complex structural components. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] Figure 1 A test flow chart of a high-precision single crystal blade residual stress measurement method based on neutron diffraction technology according to an embodiment of the present invention;

[0033] Figure 2 It is a schematic diagram of a high-precision single crystal blade residual stress measurement method based on neutron diffraction technology of the present invention;

[0034] In the figure, 1. Sample stage bottom plate 2. Sample stage X coordinate adjustment motor 3. Sample stage Y coordinate adjustment motor 4. Sample stage X coordinate adjustment screw 5. Sample stage Y coordinate adjustment screw 6. Kappa goniometer 7. Kappa goniometer three-dimensional coordinate adjustment rotating table 8. Kappa goniometer X coordinate adjustment motor 9. Kappa goniometer Y coordinate adjustment motor 10. Kappa goniometer Z coordinate adjustment motor 11. Kappa goniometer self-rotation support assembly 12. Kappa goniometer tilt adjustment assembly 13. Kappa goniometer 1 / 4 arc notch space 14. Single crystal blade sample 15. Incident slit 16. Diffraction slit 17. Incident Slit bracket 18. Diffraction slit bracket 19. Incident slit fine-tuning system 20. Diffraction slit fine-tuning system 21. Incident slit telescopic arm support bracket 22. Diffraction slit telescopic arm support bracket 23. Incident slit telescopic arm 24. Diffraction slit telescopic arm 25. Two-dimensional detector 26. Neutron beam height marking target 27. Laser theodolite 1# 28. Laser theodolite lifting rod 29. Laser theodolite support platform 30. Laser theodolite tripod bracket 31. Laser theodolite 2# 32. Neutron stress analysis spectrometer sample stage coordinate direction 33. Kappa goniometer sample stage coordinate direction 34. Incident slit fine-tuning system coordinate direction 35. Diffraction slit fine-tuning system coordinate direction. DETAILED DESCRIPTION

[0035] Example 1

[0036] Figure 1 This is a test flow chart of the high-precision single crystal blade residual stress measurement method based on neutron diffraction technology of the present invention. Figure 2 The present invention is a schematic diagram of the layout relationship of the positioning device of the high-precision single crystal blade residual stress measurement method based on neutron diffraction technology, the Kappa goniometer and the equipped three-dimensional sample stage, the incident / diffraction slit fine-tuning system, the incident / diffraction slit automatic telescopic device and the detector.

[0037] The present invention provides a high-precision single crystal blade residual stress measurement method based on neutron diffraction technology, characterized in that the test method comprises the following steps:

[0038] a. Laser theodolite positioning

[0039] The neutron stress analysis spectrometer sample stage 1, laser theodolite I 27 and laser theodolite II 31 are located at three vertices of the triangle, and are respectively located at the angular vertex corresponding to the longest side of the triangle and the other two vertices. The laser theodolite I 27 and laser theodolite II 31 are adjusted to be horizontal, and the heights of the laser theodolite I 27 and laser theodolite II 31 are adjusted so that the crosshairs in the fields of view of the laser theodolite I 27 and laser theodolite II 31 coincide with the center crosshairs of the neutron beam height identification target 26. The theodolite is rotated horizontally so that the laser theodolite I 27 and laser theodolite II 31 are respectively aligned with the incident slit 15 and the diffraction slit 16. The YZ coordinates of the incident slit 15 and the diffraction slit 16 are adjusted so that the center of the crosshairs in the fields of view of the laser theodolite I 27 and laser theodolite II 31 is located at the center of the slit, and the optical positioning corresponds to the diffraction volume. In Example 1, the size of the incident slit and the diffraction slit is 0.5 mm×0.5 mm.

[0040] b. Kappa goniometer hoisting

[0041] The Kappa goniometer 6 is hoisted to the sample stage bottom plate 1, and the horizontal center of the Kappa goniometer 6 is adjusted to be located at the center of the sample stage bottom plate 1, and the vertical center of the Kappa goniometer 6 is aligned with the neutron beam height;

[0042] c. Sample preparation

[0043] The single crystal blade sample 14 to be tested is mounted on the Kappa goniometer 6 and the Kappa goniometer three-dimensional coordinate adjustment rotating table 7.

[0044] d. Optical positioning of the single crystal blade sample to be tested

[0045] d1. Mark the test point, determine the XZ coordinates of the test point using the laser theodolite I27, check the Z coordinate of the test point using the laser theodolite II31, and determine the Y coordinate of the test point;

[0046] d2. Use the rotation 11 and tilt 12 functions of the Kappa goniometer 6 to rotate the single crystal blade sample 14 to be tested. If the test point of the single crystal blade sample 14 to be tested is always located at the center of the laser theodolite Ⅰ27 and the laser theodolite Ⅱ31 spot during the rotation process, the positioning is successful. If the test point deviates from the center of the laser theodolite Ⅰ27 and the laser theodolite Ⅱ31 spot during the rotation process of the single crystal blade sample 14 to be tested, fine-tune the XYZ coordinates of the test point until the test point completely coincides with the center of the neutron sampling volume, thereby obtaining the XYZ coordinates of the test point.

[0047] e. Confirm the distance between the single crystal blade sample to be tested and the slit

[0048] Repeat step d to determine the order of movement of each test point, and determine in turn the safety distance between the single crystal blade sample 14 to be tested and the slit during the pole figure scanning process, the closest allowable distance between the sample and the slit during the formal measurement process, and the corresponding slit fine-tuning system 19 and 20X coordinate values ​​under the diffraction geometry conditions of each {hkl} crystal plane to be tested. In Example 1, the safety distance between the incident slit, the diffraction slit and the sample during the rotation of the blade is the blade height + 40mm, and the safety distance between the sample and the slit during the formal measurement is 5mm to 20mm. In Example 1, the order of movement of each test point is determined, and the inclination angle step size Δχ=5°, the range 0°~90° and the rotation angle step size of the Kappa goniometer are set. The range is 0°~360°, and the pole figures of each {hkl} crystal plane to be measured are measured in turn to find the spatial orientation where the diffraction signal exists.

[0049] f. Scanning and positioning of the single crystal blade sample to be tested

[0050] According to the parameters of each test point determined in steps d and e, select a test point to perform pole figure measurement of the single crystal blade sample 14 to be tested, determine the spatial orientation of the diffraction signal, scan the surface of the single crystal blade sample 14 to be tested at a certain spatial orientation where the diffraction signal exists at the test point, obtain the precise coordinates of the test point, and correct the coordinates of each test point of the single crystal blade sample 14 to be tested to obtain accurate XYZ coordinates.

[0051] g. Neutron diffraction data collection

[0052] The pole figures of each {hkl} crystal plane to be tested at each test point are measured in turn, and a fine scan is performed in the span range of 5° to 10° with a step size of 0.1° in the presence of the spatial orientation of the diffraction signal to obtain the data required for strain matrix analysis of each {hkl} crystal plane to be tested at each test point.

[0053] Furthermore, in step a, a laser theodolite support platform 29 is provided to adjust the laser theodolite I 27 and the laser theodolite II 31 to a horizontal level, a laser theodolite lifting rod 28 is provided to adjust the height of the laser theodolite I 27 and the laser theodolite II 31, and a laser theodolite tripod bracket 30 is provided for support.

[0054] Furthermore, in step a, a slit fine-tuning system I 19 and a slit fine-tuning system II 20 are provided to adjust the YZ coordinates of the incident slit 15 and the diffraction slit 16 , and the incident slit 15 and the diffraction slit 16 are provided with an incident slit bracket 17 and a diffraction slit bracket 18 .

[0055] Furthermore, in step a, the slit fine-tuning system I19 and the slit fine-tuning system II20 are provided with an incident slit telescopic arm support frame 21, a diffraction slit telescopic arm support frame 22, an incident slit telescopic arm 23, and a diffraction slit telescopic arm 24.

[0056] Furthermore, in step a, a two-dimensional detector 25 is provided at the rear end of the diffraction slit 16 .

[0057] Furthermore, in step b, the sample stage base plate 1 is also provided with a sample stage X-coordinate adjustment motor 2, a sample stage Y-coordinate adjustment motor 3, a sample stage X-coordinate adjustment screw 4, and a sample stage Y-coordinate adjustment screw 5. By adjusting the XYZ coordinates of the sample stage base plate 1, it is ensured that the horizontal center of the Kappa goniometer 6 is located at the center of the sample stage base plate 1.

[0058] Furthermore, in step b, a standard Φ0.5 steel wire is used to calibrate the XYZ coordinates of the sample stage of the neutron stress analysis spectrometer corresponding to the center of the Euler ring.

[0059] Furthermore, in step c, the Kappa goniometer three-dimensional coordinate adjustment rotating platform 7 is further provided with a Kappa goniometer X-coordinate adjustment motor 8, a Kappa goniometer Y-coordinate adjustment motor 9, and a Kappa goniometer Z-coordinate adjustment motor 10.

[0060] Furthermore, in step c, the Kappa goniometer 6 is further provided with a Kappa goniometer self-rotation support assembly 11 , a Kappa goniometer tilt adjustment assembly 12 , and a Kappa goniometer 1 / 4 arc notch space 13 .

[0061] Furthermore, in step e, during the rotation of the single crystal blade sample 14 , the safety distance between the single crystal blade sample 14 and the incident slit 15 and the diffraction slit 16 is the blade height + 40 mm, and during measurement, the safety distance between the single crystal blade sample 14 and the incident slit 15 and the diffraction slit 16 is 5 mm to 20 mm.

[0062] Furthermore, in step f, when scanning the surface of the single crystal blade sample 14 to be tested, the selected orientation has an angle of 75° to 90° with the Z axis, so as to minimize the interference of the blade configuration.

[0063] The present invention is described in detail above in combination with specific implementation methods and exemplary examples. The above description is exemplary, not exhaustive, and is not limited to the disclosed embodiments; the above description cannot be understood as limiting the present invention. Those skilled in the art understand that, without departing from the spirit and scope of the present invention, the technical solution of the present invention and its implementation methods may be subjected to a variety of equivalent substitutions, modifications or improvements, all of which fall within the scope of the present invention; the protection scope of the present invention shall be subject to the attached claims.

Claims

1. A high-precision single crystal blade residual stress measurement method based on neutron diffraction technology, characterized in that: The test method includes the following steps: a. Laser theodolite positioning The neutron stress analysis spectrometer sample stage (1), laser theodolite I (27) and laser theodolite II (31) are located at three vertices of a triangle, and are located at the vertex corresponding to the longest side of the triangle and the other two vertices respectively. The laser theodolite I (27) and laser theodolite II (31) are adjusted to be horizontal, and the height of the laser theodolite I (27) and laser theodolite II (31) is adjusted so that the cross in the field of view of the laser theodolite I (27) and laser theodolite II (31) is The laser theodolite (27) and the laser theodolite (31) are aligned with the incident slit (15) and the diffraction slit (16) respectively, and the YZ coordinates of the incident slit (15) and the diffraction slit (16) are adjusted so that the center of the crosshairs in the field of view of the laser theodolite (27) and the laser theodolite (31) are located at the center of the slit, and the optical positioning corresponds to the diffraction volume; b. Kappa goniometer hoisting The Kappa goniometer (6) is hoisted onto the sample stage bottom plate (1), and the horizontal center of the Kappa goniometer (6) is adjusted to be located at the center of the sample stage bottom plate (1), and the vertical center of the Kappa goniometer (6) is aligned with the neutron beam height; c. Sample preparation The single crystal blade sample (14) to be measured is mounted on a Kappa goniometer (6) on a Kappa goniometer three-dimensional coordinate adjustment rotating table (7); d. Optical positioning of the single crystal blade sample to be tested d1. Mark the test point, determine the XZ coordinates of the test point using laser theodolite I (27), verify the Z coordinate of the test point using laser theodolite II (31), and determine the Y coordinate of the test point; d2. The single crystal blade sample (14) to be tested is rotated using the rotation (11) and tilt (12) functions of the Kappa goniometer (6). If the test point of the single crystal blade sample (14) to be tested is always located at the center of the laser theodolite I (27) and the laser theodolite II (31) during the rotation process, the positioning is successful. If the test point deviates from the center of the laser theodolite I (27) and the laser theodolite II (31) during the rotation process of the single crystal blade sample (14) to be tested, the XYZ coordinates of the test point are fine-tuned until the test point completely coincides with the center of the neutron sampling volume, thereby obtaining the XYZ coordinates of the test point; e. Confirmation of the distance between the single crystal blade sample (14) to be tested and the slit Repeat step d to determine the order of each test point, and determine in turn the safe distance between the single crystal blade sample (14) to be tested and the slit during the pole figure scanning process, the minimum allowable distance between the sample and the slit during the formal measurement process, and the corresponding X coordinate values ​​of the slit fine-tuning system (19) and (20) under the diffraction geometry conditions of each {hkl} crystal plane to be tested; f. Scanning and positioning of the single crystal blade sample to be tested According to the parameters of each test point determined in steps d and e, a test point is selected to measure the pole figure of the single crystal blade sample (14) to be tested, and the spatial orientation of the diffraction signal is determined. The surface of the single crystal blade sample (14) to be tested is scanned at a certain spatial orientation where the diffraction signal exists at the test point to obtain the precise coordinates of the test point, and the coordinates of each test point of the single crystal blade sample (14) to be tested are corrected to obtain accurate XYZ coordinates; g. Neutron diffraction data collection The pole figures of each {hkl} crystal plane to be tested at each test point are measured in turn, and a fine scan is performed in the span range of 5° to 10° with a step size of 0.1° in the presence of the spatial orientation of the diffraction signal to obtain the data required for strain matrix analysis of each {hkl} crystal plane to be tested at each test point.

2. According to claim 1, a high-precision single crystal blade residual stress measurement method based on neutron diffraction technology is characterized in that: In step a, a laser theodolite support platform (29) is provided to adjust the laser theodolite I (27) and the laser theodolite II (31) to a horizontal level, a laser theodolite lifting rod (28) is provided to adjust the height of the laser theodolite I (27) and the laser theodolite II (31), and a laser theodolite tripod bracket (30) is provided for support.

3. The high-precision single crystal blade residual stress measurement method based on neutron diffraction technology according to claim 1 is characterized in that: In step a, a slit fine-tuning system I (19) and a slit fine-tuning system II (20) are provided to adjust the YZ coordinates of the incident slit (15) and the diffraction slit (16), and the incident slit (15) and the diffraction slit (16) are provided with an incident slit bracket (17) and a diffraction slit bracket (18).

4. The high-precision single crystal blade residual stress measurement method based on neutron diffraction technology according to claim 1 is characterized in that: In step a, a slit fine-tuning system I (19) and a slit fine-tuning system II (20) are provided with an incident slit telescopic arm support frame (21), a diffraction slit telescopic arm support frame (22), an incident slit telescopic arm (23), and a diffraction slit telescopic arm (24).

5. The high-precision single crystal blade residual stress measurement method based on neutron diffraction technology according to claim 1 is characterized in that: In step a, a two-dimensional detector (25) is arranged at the rear end of the diffraction slit (16).

6. The high-precision single crystal blade residual stress measurement method based on neutron diffraction technology according to claim 1 is characterized in that: In step b, the sample stage base plate (1) is also provided with a sample stage X-coordinate adjustment motor (2), a sample stage Y-coordinate adjustment motor (3), a sample stage X-coordinate adjustment lead screw (4), and a sample stage Y-coordinate adjustment lead screw (5). By adjusting the XYZ coordinates of the sample stage base plate (1), it is ensured that the horizontal center of the Kappa goniometer (6) is located at the center of the sample stage base plate (1).

7. The high-precision single crystal blade residual stress measurement method based on neutron diffraction technology according to claim 1 is characterized in that: In step b, a standard Φ0.5 steel wire is used to calibrate the XYZ coordinates of the neutron stress analysis spectrometer sample stage corresponding to the center of the Euler ring.

8. The high-precision single crystal blade residual stress measurement method based on neutron diffraction technology according to claim 1 is characterized in that: In step c, the Kappa goniometer three-dimensional coordinate adjustment rotating platform (7) is also provided with a Kappa goniometer X-coordinate adjustment motor (8), a Kappa goniometer Y-coordinate adjustment motor (9), and a Kappa goniometer Z-coordinate adjustment motor (10).

9. The high-precision single crystal blade residual stress measurement method based on neutron diffraction technology according to claim 1 is characterized in that: In step c, the Kappa goniometer (6) is further provided with a Kappa goniometer self-rotation support assembly (11), a Kappa goniometer tilt adjustment assembly (12), and a Kappa goniometer 1 / 4 arc notch space (13).

10. The high-precision single crystal blade residual stress measurement method based on neutron diffraction technology according to claim 1 is characterized in that: In step e, during the rotation of the single crystal blade sample (14), the safety distance between the single crystal blade sample (14) to be tested and the incident slit (15) and the diffraction slit (16) is the blade height + 40 mm. During measurement, the safety distance between the single crystal blade sample (14) to be tested and the incident slit (15) and the diffraction slit (16) is 5 mm to 20 mm.

11. The high-precision single crystal blade residual stress measurement method based on neutron diffraction technology according to claim 1 is characterized in that: In step f, when scanning the surface of the single crystal blade sample (14) to be tested, the selected orientation has an angle of 75° to 90° with the Z axis.

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