Method and system for testing tearing immediate signal of AMOLED display screen

Abstract

The invention discloses an AMOLED display screen tearing immediate signal testing method and system. The AMOLED display screen tearing immediate signal testing system comprises a testing mainboard and a to-be-tested AMOLED display screen module. The test control unit is used for sending a driving signal to the display control unit to drive and lighten the AMOLED display screen, and the tearing signal module sends a tearing signal pulse to the test control unit through the tearing signal pin; the test control unit calculates the period of the tear-to-go signal pulse to obtain the tear-to-go signal period; and calculating the tearing-in-place signal frequency of the tearing-in-place signal pulse by utilizing the tearing-in-place signal period, and if the tearing-in-place signal frequency is within a specified frequency range and is not less than a specified number, judging that the tearing-in-place signal module is normal. The automatic judgment of the tearing signal is realized, and the problem that the production and manufacturing cost of a factory is increased due to the consumption of a large amount of manpower and material resources is solved.

Description

Technical Field

[0001] The present invention relates to the technical field of AMOLED display testing, and in particular to a tearing signal testing method and system for an AMOLED display screen. Background Art

[0002] AMOLED has bright display effects, high contrast and small screen, and is widely used in smart watch projects. AMOLED display modules are increasingly favored in brand customers' smart watch projects. Since smart watch projects are consumer products, the shipment volume of AMOLED display modules is large, so the factory testing of AMOLED display modules is also very strict.

[0003] If defective products are left to the client, the subsequent maintenance cost will be very high, and it will also bring many negative effects to the company. During the actual factory test, the TE signal (tear-off signal) pin of the AMOLED display module needs to be tested to ensure that the signal appearing at the TE signal pin meets the setting requirements.

[0004] TE signal is mainly used to solve the tearing problem in the display. In the process of LCD display, if the data update is not synchronized with the screen refresh, the screen may tear. The TE signal can coordinate the rhythm of data transmission and screen refresh to ensure the stability and integrity of the display. Therefore, the TE signal plays a very important role in the client's use process. The correctness of the TE signal must be guaranteed for each AMOLED display module shipped out of the factory.

[0005] At present, the test method for TE signal on the factory line is to use the frequency range of the multimeter for testing. Set the multimeter to the test frequency range, connect the positive pole of the multimeter to the TE signal pin, and the other end to the ground wire of the AMOLED display module. When the AMOLED display module is lit normally, the TE signal pin can read 60HZ on the multimeter, which means that the TE signal pin is normal. If it cannot be displayed, the TE signal pin is abnormal, and the sample of this AMOLED display module is defective and cannot be shipped to the customer.

[0006] This testing method on the factory line requires a large number of multimeters and a lot of manpower to test in order to ensure the daily shipment volume of AMOLED display modules, which greatly increases the factory's labor and material costs. Summary of the invention

[0007] In the prior art, when testing the tearing signal of the AMOLED display module, a lot of manpower and material resources are consumed, resulting in an increase in the production and manufacturing costs of the factory.

[0008] In view of the above problems, a tearing signal testing method and system for an AMOLED display screen are proposed. By building a communication connection between a test mainboard and an AMOLED display screen module, and obtaining a pulse signal of a tearing signal pin of a display control unit through an interrupt pin, the test control unit detects and calculates the pulse frequency of the tearing signal, and determines whether the tearing signal is normal based on the pulse frequency, thereby realizing automatic determination of the tearing signal and solving the problem of consuming a large amount of manpower and material resources, leading to an increase in the production and manufacturing costs of the factory.

[0009] In a first aspect, a tearing signal testing method for an AMOLED display screen includes:

[0010] Step 100, providing a tear-and-make-good signal test system including a test mainboard and an AMOLED display module to be tested, wherein the test mainboard is electrically connected to the AMOLED display module to be tested, the test mainboard includes a test control unit, the AMOLED display module to be tested includes a display control unit and an AMOLED display, the display control unit includes a tear-and-make-good signal module and a tear-and-make-good signal pin, and the test control unit is communicatively connected to the tear-and-make-good signal pin;

[0011] Step 200: Use the test control unit to send a driving signal to the display control unit to drive and light up the AMOLED display screen, and the tear-off signal module sends a tear-off signal pulse to the test control unit through the tear-off signal pin;

[0012] Step 300: The test control unit calculates the period of the tear-off signal pulse to obtain the tear-off signal period;

[0013] Step 400: Calculate the tear-through signal frequency of the tear-through signal pulse using the tear-through signal period. If the tear-through signal frequency is within a specified frequency range and is not less than a specified number, determine that the tear-through signal module is normal.

[0014] In conjunction with the tearing signal testing method for an AMOLED display screen according to the first aspect of the present invention, in a first possible implementation manner, step 100 includes:

[0015] Step 110, obtaining an interrupt pin of the test control unit;

[0016] Step 120: connect the interrupt pin to the tear-through signal pin for communication, and connect the tear-through signal module to the tear-through signal pin.

[0017] In combination with the first possible implementation manner of the first aspect of the present invention, in a second possible implementation manner, step 300 includes:

[0018] Step 310, recording a first time of a rising edge of a first pulse and a second time of a rising edge of a second pulse of two adjacent pulses;

[0019] Step 320: Calculate the tear-to-be signal period using the first time and the second time.

[0020] In combination with the first possible implementation of the first aspect of the present invention, in a third possible implementation, step 300 includes:

[0021] Step 330, recording the third time of the falling edge of the first pulse of the two adjacent pulses and the fourth time of the falling edge of the second pulse;

[0022] Step 340: Calculate the tear-to-be signal period using the third time and the fourth time.

[0023] In combination with the second or third possible implementation manner of the first aspect of the present invention, in a fourth possible implementation manner, step 400 includes:

[0024] Step 410, obtaining the tear-up signal period;

[0025] Step 420, using formula (1):

[0026] The tearing signal frequency = 1 / the tearing signal period,

[0027] The tearing signal frequency is calculated.

[0028] In combination with the fourth possible implementation manner of the first aspect of the present invention, in a fifth possible implementation manner, step 400 further includes:

[0029] Step 430: Compare the tearing signal frequency with the specified frequency range;

[0030] Step 440: If the tear-through signal frequency is not within the specified frequency range, determine that the tear-through signal is abnormal.

[0031] In combination with the fifth possible implementation manner of the first aspect of the present invention, in a sixth possible implementation manner, step 400 further includes:

[0032] Step 450: Compare the tearing signal frequency with the specified frequency range;

[0033] Step 460: If the tearing signal frequency is within the specified frequency range, continue to calculate the next pulse cycle and obtain the number of all pulses within the specified range.

[0034] In combination with the sixth possible implementation manner of the first aspect of the present invention, in a seventh possible implementation manner, step 400 further includes:

[0035] Step 470, comparing the number of pulses within the specified range with a specified number;

[0036] Step 480: If the number of book pulses is not less than the specified number, it is determined that the tearing signal module is normal.

[0037] In a second aspect, a tearing signal test system for an AMOLED display screen adopts the tearing signal test method described in the first aspect, including:

[0038] Test the main board and the AMOLED display module to be tested;

[0039] The test mainboard is electrically connected to the AMOLED display screen module to be tested;

[0040] The test mainboard includes a test control unit, the AMOLED display screen module to be tested includes a display control unit and an AMOLED display screen, the display control unit includes a tear-and-make-fit signal module and a tear-and-make-fit signal pin, and the test control unit is communicatively connected with the tear-and-make-fit signal pin;

[0041] The tear-off signal module sends a tear-off signal pulse to the test control unit through the tear-off signal pin;

[0042] The test control unit is used to send a driving signal to the display control unit to drive the AMOLED display screen to light up, calculate the period of the tearing signal pulse, obtain the tearing signal period, and use the tearing signal period to calculate the tearing signal frequency of the tearing signal pulse. If the tearing signal frequency is within a specified frequency range and the number of pulses is not less than a specified number, it is determined that the tearing signal module is normal.

[0043] In combination with the tearing signal test system for the AMOLED display screen described in the second aspect of the present invention, in a first possible implementation manner, the test control unit is further used to compare the tearing signal frequency with the specified frequency range. If the tearing signal frequency is not within the specified frequency range, the tearing signal is judged to be abnormal; if the tearing signal frequency is within the specified frequency range, the next pulse period is continued to be calculated, and the number of all pulses within the specified frequency range is obtained.

[0044] A tearing signal testing method and system for an AMOLED display screen in the present invention is implemented by establishing a communication connection between a test mainboard and an AMOLED display screen module, and obtaining a pulse signal of a tearing signal pin of a display control unit through an interrupt pin. The test control unit detects and calculates the pulse frequency of the tearing signal, and determines whether the tearing signal is normal based on the pulse frequency, thereby realizing automatic determination of the tearing signal and solving the problem of consuming a large amount of manpower and material resources, leading to an increase in the production and manufacturing costs of the factory. BRIEF DESCRIPTION OF THE DRAWINGS

[0045] In order to more clearly illustrate the scheme in the present application, a brief introduction is given below to the drawings required for use in the description of the embodiments of the present application. Obviously, the drawings described below are some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0046] Figure 1 It is a schematic diagram of the process steps of a specific implementation method of the tearing signal testing method of the AMOLED display screen in the present application;

[0047] Figure 2 yes Figure 1 A schematic diagram of the process steps of a specific implementation of S100;

[0048] Figure 3 yes Figure 1 A schematic diagram of the process steps of a specific implementation of S300;

[0049] Figure 4 yes Figure 3 A schematic diagram of the process steps of another specific implementation of S300;

[0050] Figure 5 yes Figure 1 A schematic diagram of the process steps of a specific implementation of S400;

[0051] Figure 6 yes Figure 5 A schematic diagram of the process steps of a specific implementation method after S420 in FIG.

[0052] Figure 7 yes Figure 6 A schematic diagram of the process steps of a specific implementation method after S440 in FIG.

[0053] Figure 8 yes Figure 7 A schematic diagram of the process steps of a specific implementation method after S460;

[0054] Fig. 9 It corresponds to Figure 3 Schematic diagram of the tearing signal pulse waveform;

[0055] Fig.10 It corresponds to Figure 4 Schematic diagram of the tearing signal pulse waveform;

[0056] Fig.11 It is a schematic diagram of the module structure of the tearing signal testing system of the AMOLED display screen in this application. DETAILED DESCRIPTION

[0057] The following will be combined with the accompanying drawings in the invention to clearly and completely describe the technical solutions in the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments in the present invention, other embodiments obtained by ordinary technicians in this field without creative work are all within the scope of protection of the present invention.

[0058] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0059] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by technicians in the technical field to which this application belongs; the terms used in the specification of the application are only for the purpose of describing specific embodiments and are not intended to limit this application; the terms "including" and "having" in the specification and claims of this application and the above-mentioned figure descriptions and any variations thereof are intended to cover non-exclusive inclusions.

[0060] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of this application, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0061] Name Explanation

[0062] AMOLED: Active-Matrix Organic Light Emitting Diode

[0063] TE signal: Tear i ng Effect tearing effect signal

[0064] In the prior art, when testing the tearing signal of the AMOLED display module, a lot of manpower and material resources are consumed, resulting in an increase in the production and manufacturing costs of the factory.

[0065] In view of the above problems, a tearing signal testing method and system for an AMOLED display screen are proposed.

[0066] In the first aspect, a tearing signal testing method for an AMOLED display screen is provided. Figure 1 , Figure 1 It is a schematic diagram of the process steps of a specific implementation method of the tearing signal test method of the AMOLED display screen in the present application; it includes:

[0067] Step 100, providing a tear-off signal test system including a test mainboard 10 and an AMOLED display module 20 to be tested, wherein the test mainboard 10 is electrically connected to the AMOLED display module 20 to be tested, the test mainboard 10 includes a test control unit 11, the AMOLED display module 20 to be tested includes a display control unit 211 and an AMOLED display 22, the display control unit 211 includes a tear-off signal module 211 and a tear-off signal pin TE, and the test control unit 11 is communicatively connected to the tear-off signal pin TE.

[0068] In this embodiment, the display control unit 211 may be a display driver IC of the AMOLED display module 20, which is used to drive the AMOLED display 22 to display. The driver IC is integrated with a tearing signal module 211, which is used to keep the refresh rate of the display synchronized with the frame rate of the graphics card, avoid tearing of different frames between the upper and lower half screens, and improve the display quality.

[0069] In this embodiment, the test control unit 11 may be an integrated circuit IC such as an MCU, and the MCU includes a computing unit such as a CPU.

[0070] In a preferred embodiment, Figure 2 , Figure 2 yes Figure 1A schematic diagram of the process steps of a specific implementation method of S100 in FIG. 100; step 100 includes: step 110, obtaining the interrupt pin I NT of the test control unit 11; step 120, connecting the interrupt pin I NT to the tear-and-go signal pin TE for communication, and connecting the tear-and-go signal module 211 to the tear-and-go signal pin TE.

[0071] In this embodiment, a dedicated computing resource is set in the test control unit 11. In this embodiment, the interrupt pin I NT is communicatively connected with the tear-to-be signal pin TE to obtain the tear-to-be signal pulse.

[0072] Step 200: Use the test control unit 11 to send a driving signal to the display control unit 211 to drive and light up the AMOLED display screen 22. The tear-through signal module 211 sends a tear-through signal pulse to the test control unit 11 through the tear-through signal pin TE.

[0073] Step 300: The test control unit 11 calculates the period of the tear-off signal pulse to obtain the tear-off signal period.

[0074] In a preferred embodiment, Figure 3 , Figure 3 yes Figure 1 A schematic diagram of the process steps of a specific implementation method of S300 in FIG. 300 includes: step 310, recording the first time of the rising edge of the first pulse of two adjacent pulses and the second time of the rising edge of the second pulse; step 320, using the first time t1 and the second time t2 to calculate the tearing signal period.

[0075] The tear-off signal module 211 of the display IC will send out a tear-off signal pulse waveform (under normal circumstances, the pulse frequency is 60HZ) through the tear-off signal pin TE (TE signal pin).

[0076] like Fig. 9 , Fig. 9 It corresponds to Figure 3 The tearing signal pulse waveform diagram is as follows; when the interrupt signal pin of the test control unit 11 of the test mainboard 10 receives the first rising edge waveform of the TE signal, the clock a of the test mainboard 10 CPU is started and the calculation time is started.

[0077] When the interrupt signal pin of the test motherboard 10 receives the second rising edge waveform of the TE signal, the clock a trial calculation of the test motherboard 10 CPU is terminated. At this time, the accumulated time of clock a is calculated to be T (ms).

[0078] In a preferred embodiment, Figure 4 , Figure 4 yes Figure 3A schematic diagram of the process steps of another specific implementation method of S300; step 300 includes: step 330, recording the third time of the falling edge of the first pulse of two adjacent pulses and the fourth time of the falling edge of the second pulse; step 340, using the third time t3 and the fourth time t4 to calculate the tearing signal period.

[0079] The tear-off signal module 211 of the display IC will send out a tear-off signal pulse waveform (under normal circumstances, the pulse frequency is 60HZ) through the tear-off signal pin TE (TE signal pin).

[0080] like Fig.10 , Fig.10 It corresponds to Figure 4 The tearing signal pulse waveform diagram is as follows; when the interrupt signal pin of the test control unit 11 of the test mainboard 10 receives the first falling edge waveform of the TE signal, the clock a of the test mainboard 10 CPU is started and the calculation time is started.

[0081] When the interrupt signal pin of the test motherboard 10 receives the second falling edge waveform of the TE signal, the clock a trial calculation of the test motherboard 10 CPU is terminated. At this time, the accumulated time of clock a is calculated to be T (ms).

[0082] Step 400: Calculate the tear-through signal frequency of the tear-through signal pulse using the tear-through signal period. If the tear-through signal frequency is within a specified frequency range and is not less than a specified number, determine that the tear-through signal module 211 is normal.

[0083] In a preferred embodiment, Figure 5 , Figure 5 yes Figure 1 A schematic diagram of the process steps of a specific implementation method of S400 in FIG. 400; Step 400 includes: Step 410, obtaining the tearing signal period; Step 420, using formula (1): tearing signal frequency (f) = 1 / tearing signal period (T), calculate the tearing signal frequency (f).

[0084] Through the internal operation 1 / T=f, the clock a is synchronously cleared.

[0085] In a preferred embodiment, Figure 6 , Figure 6 yes Figure 5 A schematic diagram of the process steps of a specific implementation method after S420 in the embodiment; step 400 also includes: step 430, comparing the tear-off signal frequency with the specified frequency range; step 440, if the tear-off signal frequency is not within the specified frequency range, determining that the tear-off signal is abnormal.

[0086] In a preferred embodiment, Figure 7 , Figure 7 yes Figure 6 A schematic diagram of a process step of a specific implementation method after S440 in FIG. 400; step 400 also includes:

[0087] Step 450: compare the tearing signal frequency with a specified frequency range;

[0088] Step 460: If the tearing signal frequency is within the specified frequency range, continue to calculate the next pulse cycle and obtain the number of all pulses within the specified range.

[0089] In a preferred embodiment, Figure 8 , Figure 8 yes Figure 7 A schematic diagram of a process step of a specific implementation method after S460 in FIG. 400; step 400 also includes:

[0090] Step 470, comparing the number of pulses within the specified range with the specified number; Step 480, if the number of pulses is not less than the specified number, determining that the tearing signal module 211 is normal.

[0091] If the calculated f is between 59 and 61 Hz, it means that the TE signal is normal. If it is not within this range, it means that the TE signal is abnormal.

[0092] In this embodiment, multiple pulses are tested, and if all the test results indicate that f is within the above range, it is proved that the TE signal is normal. By building a communication connection between the test mainboard 10 and the AMOLED display module 20, and obtaining the pulse signal of the tear-through signal pin TE of the display control unit 211 through the interrupt pin I NT, the test control unit 11 detects and calculates the pulse frequency of the tear-through signal, and determines whether the tear-through signal is normal according to the pulse frequency, thereby realizing automatic determination of the tear-through signal, and solving the problem of consuming a lot of manpower and material resources, resulting in an increase in the production and manufacturing costs of the factory.

[0093] In the second aspect, a tearing signal testing system for an AMOLED display screen is provided. Fig.11 , Fig.11It is a schematic diagram of the module structure of the tearing signal testing system of the AMOLED display screen in this application. The tearing signal test method of the first aspect includes: a test mainboard 10 and an AMOLED display module 20 to be tested; the test mainboard 10 is electrically connected to the AMOLED display module 20 to be tested; the test mainboard 10 includes a test control unit 11, the AMOLED display module 20 to be tested includes a display control unit 211 and an AMOLED display 22, the display control unit 211 includes a tearing signal module 211 and a tearing signal pin TE, and the test control unit 11 is communicatively connected to the tearing signal pin TE; the tearing signal module 211 sends a tearing signal pulse to the test control unit 11 through the tearing signal pin TE; the test control unit 11 is used to send a driving signal to the display control unit 211 to drive the AMOLED display 22 to light up, calculate the period of the tearing signal pulse, obtain the tearing signal period, and use the tearing signal period to calculate the tearing signal frequency of the tearing signal pulse. If the tearing signal frequency is within the specified frequency range and the number of pulses is not less than the specified number, it is determined that the tearing signal module 211 is normal.

[0094] Furthermore, the test control unit 11 is further used to compare the tearing signal frequency with the specified frequency range. If the tearing signal frequency is not within the specified frequency range, the tearing signal is judged to be abnormal. If the tearing signal frequency is within the specified frequency range, the next pulse cycle is continued to be calculated, and the number of all pulses within the specified frequency range is obtained.

[0095] A tearing signal testing method and system for an AMOLED display screen in the present invention is implemented by establishing a communication connection between a test mainboard 10 and an AMOLED display screen module 20, and obtaining a pulse signal of a tearing signal pin TE of a display control unit 211 through an interrupt pin I NT. The test control unit 11 detects and calculates the pulse frequency of the tearing signal, and determines whether the tearing signal is normal based on the pulse frequency, thereby realizing automatic determination of the tearing signal, and solving the problem of consuming a large amount of manpower and material resources, leading to an increase in the production and manufacturing costs of the factory.

[0096] The above are only preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A tearing signal testing method for an AMOLED display screen, characterized in that: include: Step 100, providing a tear-and-make-good signal test system including a test mainboard and an AMOLED display module to be tested, wherein the test mainboard is electrically connected to the AMOLED display module to be tested, the test mainboard includes a test control unit, the AMOLED display module to be tested includes a display control unit and an AMOLED display, the display control unit includes a tear-and-make-good signal module and a tear-and-make-good signal pin, and the test control unit is communicatively connected to the tear-and-make-good signal pin; Step 200: Use the test control unit to send a driving signal to the display control unit to drive and light up the AMOLED display screen, and the tear-off signal module sends a tear-off signal pulse to the test control unit through the tear-off signal pin; Step 300: The test control unit calculates the period of the tear-off signal pulse to obtain the tear-off signal period; Step 400: Calculate the tear-through signal frequency of the tear-through signal pulse using the tear-through signal period. If the tear-through signal frequency is within a specified frequency range and is not less than a specified number, determine that the tear-through signal module is normal.

2. The tearing signal testing method of an AMOLED display screen according to claim 1, characterized in that: The step 100 comprises: Step 110, obtaining an interrupt pin of the test control unit; Step 120: connect the interrupt pin to the tear-through signal pin for communication, and connect the tear-through signal module to the tear-through signal pin.

3. The tearing signal testing method of an AMOLED display screen according to claim 2, characterized in that: The step 300 includes: Step 310, recording a first time of a rising edge of a first pulse and a second time of a rising edge of a second pulse of two adjacent pulses; Step 320: Calculate the tear-to-be signal period using the first time and the second time.

4. The tearing signal testing method of an AMOLED display screen according to claim 2, characterized in that: The step 300 includes: Step 330, recording the third time of the falling edge of the first pulse of the two adjacent pulses and the fourth time of the falling edge of the second pulse; Step 340: Calculate the tear-to-be signal period using the third time and the fourth time.

5. The tearing signal testing method of an AMOLED display screen according to claim 3 or 4, characterized in that: The step 400 includes: Step 410, obtaining the tear-up signal period; Step 420, using formula (1): The tearing signal frequency = 1 / the tearing signal period, The tearing signal frequency is calculated.

6. The tearing signal testing method of an AMOLED display screen according to claim 5, characterized in that: The step 400 further includes: Step 430: Compare the tearing signal frequency with the specified frequency range; Step 440: If the tear-through signal frequency is not within the specified frequency range, determine that the tear-through signal is abnormal.

7. The tearing signal testing method of an AMOLED display screen according to claim 6, characterized in that: The step 400 further includes: Step 450: Compare the tearing signal frequency with the specified frequency range; Step 460: If the tearing signal frequency is within the specified frequency range, continue to calculate the next pulse cycle and obtain the number of all pulses within the specified range.

8. The tearing signal testing method of an AMOLED display screen according to claim 7, characterized in that: The step 400 further includes: Step 470, comparing the number of pulses within the specified range with a specified number; Step 480: If the number of book pulses is not less than the specified number, it is determined that the tearing signal module is normal.

9. A tearing signal test system for an AMOLED display screen, using the tearing signal test method according to any one of claims 1 to 8, characterized in that: include: Test the main board and the AMOLED display module to be tested; The test mainboard is electrically connected to the AMOLED display screen module to be tested; The test mainboard includes a test control unit, the AMOLED display screen module to be tested includes a display control unit and an AMOLED display screen, the display control unit includes a tear-and-make-fit signal module and a tear-and-make-fit signal pin, and the test control unit is communicatively connected with the tear-and-make-fit signal pin; The tear-off signal module sends a tear-off signal pulse to the test control unit through the tear-off signal pin; The test control unit is used to send a driving signal to the display control unit to drive the AMOLED display screen to light up, calculate the period of the tearing signal pulse, obtain the tearing signal period, and use the tearing signal period to calculate the tearing signal frequency of the tearing signal pulse. If the tearing signal frequency is within a specified frequency range and the number of pulses is not less than a specified number, it is determined that the tearing signal module is normal.

10. The tearing signal testing system of the AMOLED display screen according to claim 9, characterized in that: The test control unit is further used for: The tearing signal frequency is compared with the specified frequency range. If the tearing signal frequency is not within the specified frequency range, the tearing signal is judged to be abnormal. If the tearing signal frequency is within the specified frequency range, the calculation of the next pulse cycle is continued, and the number of all pulses within the specified frequency range is obtained.

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