Automatic probe replacement platform
By designing the automatic probe replacement platform, the problems of low probe replacement efficiency and insufficient accuracy are solved, fully automated probe replacement is realized, and the operation efficiency and accuracy of the measurement equipment are improved.
Patent Information
- Application Number
- CN202411961450.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-30
- Publication Date
- 2025-08-26
- Estimated Expiration
- 2044-12-30
AI Technical Summary
The existing probe replacement technology relies on manual operation, has low efficiency, limited accuracy, insufficient automation level, and unstable probe connections, affecting the production efficiency and accuracy of the measurement equipment.
An automatic probe replacement platform is designed, including a probe storage mechanism, a transfer mechanism and a docking mechanism. Through collaborative work, it realizes fully automatic replacement of probes, adopts a modular structure and optimized transmission components, and supports the adaptive design of multi-special probes.
It realizes efficient automation of probe replacement, improves the operating efficiency of measurement equipment, simplifies assembly and maintenance, improves probe storage density and replacement accuracy, and adapts to different measurement needs.
Smart Images

Figure CN119595953B_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of probe replacement, and in particular to an automatic probe replacement platform. Background Art
[0002] Probes are a common measuring tool in modern industrial measurement equipment, widely used in the inspection of precision machinery, electronic circuits, and material properties. The function of a probe is to directly contact the object being measured to complete signal acquisition or parameter measurement. Its accuracy and replacement efficiency are crucial to the overall performance of the measuring instrument. However, in existing technologies, the probe replacement process generally suffers from the following shortcomings:
[0003] 1. The replacement method is simple and relies on manual operation: Currently, the replacement of probes in most measuring equipment mainly relies on manual operation. Specifically, the operator needs to manually remove the old probe from the probe connector of the measuring instrument and install the new probe in its place. Manual probe replacement takes a certain amount of time, especially in application scenarios that require frequent probe replacement (such as high-density multi-point measurement tasks). The efficiency of probe replacement becomes a bottleneck, directly affecting the overall production efficiency of the measuring equipment. In addition, due to lack of experience or negligence, manual operation may result in improper installation of the probe or installation in the wrong direction, thus affecting measurement accuracy.
[0004] 2. Insufficient automation: Although some existing high-end measurement equipment has a certain degree of automated probe replacement function, it still has problems such as inaccurate movement coordination, complex structure, high cost, and poor adaptability;
[0005] 3. Insufficient stability and accuracy of probe docking: The probe replacement process involves not only disassembly and installation, but also docking accuracy requirements. In the existing technology, the docking between the probe storage mechanism and the probe connector lacks effective positioning and auxiliary mechanisms, which can easily cause the probe to shift due to mechanical errors; and the docking mechanism in the existing technology is usually simple in design, and the probe may slip or loosen during installation, affecting the use effect of the measuring instrument. Summary of the Invention
[0006] Technical purpose: In response to the shortcomings of existing probe switching technology, the present invention discloses an automatic probe replacement platform that can realize automatic replacement of probes and solve the problems of low probe replacement efficiency, limited accuracy and poor adaptability in the existing technology.
[0007] Technical solution: To achieve the above technical objectives, the present invention adopts the following technical solution:
[0008] A probe automatic replacement platform includes a platform body, a base, a probe storage mechanism, a probe transport mechanism, a probe docking mechanism and a control unit. A probe connector for connecting to the probe is provided on the platform body. The base is fixedly installed in the working area of the platform body, and the two are connected by a support body; the probe storage mechanism is connected to the probe transport mechanism and is used to store the probe to be replaced. The probe transport mechanism is installed on the support body and is used to drive the probe storage mechanism to adjust its position; the probe docking mechanism is provided on the support body and is connected to the probe connector and is used to drive the probe connector to move in the vertical direction; the control unit is connected to the probe storage mechanism, the probe transport mechanism and the probe docking mechanism and is used to realize the docking, separation and replacement of the probe.
[0009] Preferably, the probe storage mechanism includes a probe rack, a fixed plate and a rotating shaft, the fixed plate is connected to the rotating assembly and the horizontal moving assembly, the rotating shaft is installed on the fixed plate and one end is connected to the rotating assembly, and the other end is connected to the probe rack, and at least two probe storage positions are provided on the probe rack.
[0010] Preferably, the probe storage locations are distributed along a circumference and adjacent angles are less than 90°.
[0011] Preferably, the probe transport mechanism includes a rotating component that drives the probe to rotate around a vertical axis and a horizontal moving component that drives the probe to move in a horizontal plane; the horizontal moving component includes a support frame, a fixed frame, a slide rail 1, a slider 1 and a first motor, the support frame is fixedly mounted on the support body, the slide rail 1 is arranged on the support frame, the slider 1 is mounted on the slide rail 1 and can slide in the horizontal direction along the slide rail 1, the first motor is mounted on the support frame through the fixed frame and its screw rod passes through the fixed frame and the connecting plate, the connecting plate is fixedly connected to the slider 1, and drives the slider 1 to reciprocate as the first motor drives it.
[0012] Preferably, the fixing frame includes a front fixing frame and a rear fixing frame, which are respectively arranged at two ends of the support frame, and the connecting plate is located between the front fixing frame and the rear fixing frame.
[0013] Preferably, the rotating assembly includes a second motor, which is disposed on the fixing frame. The output shaft of the second motor is connected to the probe frame via a rotating shaft, and is used to drive the probe frame to rotate around the vertical axis.
[0014] Preferably, the probe transport mechanism includes a lifting mechanism including a ball screw assembly, which is mounted on the support body and drives the probe joint to move in the vertical direction.
[0015] Preferably, the platform body includes a measuring lens, the measuring lens includes a camera frame and a camera, and the camera frame is installed on the support body through a lifting mechanism.
[0016] Preferably, the lifting mechanism includes a third motor, a buckle, a slider 2 and a slide rail 2. The third motor is fixedly mounted on the camera frame, the camera frame is provided with a slide rail 2, the slider 2 is provided on the slide rail 2 and can move in the vertical direction along the slide rail 2, the screw rod of the third motor is connected with a buckle, and the slider 2 is provided with a slot matching the buckle.
[0017] Preferably, it includes a base, which is fixedly installed in the working area of the platform body, and the two are connected through a support body.
[0018] Beneficial effects: The automatic probe replacement platform provided by the present invention has the following beneficial effects:
[0019] The present invention realizes the fully automated operation of the probe from storage, movement to docking by designing the coordinated work of the probe storage mechanism, the probe transport mechanism and the probe docking mechanism, which greatly reduces the need for manual participation. It is particularly suitable for high-frequency probe replacement scenarios and significantly shortens the probe replacement time, thereby improving the overall operating efficiency of the measuring instrument. The present invention adopts a modular structural design to independently partition the probe storage mechanism, the probe transport mechanism and the probe docking mechanism, making their assembly and maintenance simpler. By optimizing the transmission structure such as the horizontal slider and the rotating assembly, efficient and stable probe replacement is achieved, avoiding the high cost problem of complex mechanical linkage devices.
[0020] The probe storage positions of the probe storage mechanism of the present invention are distributed along the circumference of the probe rack, and the angle between adjacent probe storage positions is less than 90°, which effectively improves the storage density and saves internal space of the equipment; through the combined design of the horizontal moving component and the rotating component, the probe can be quickly switched between the storage position and the docking position, further improving the efficiency of probe replacement.
[0021] The present invention supports automatic replacement of probes of multiple specifications. The probe storage position and probe connector have an adaptive design and are compatible with probes of different sizes and types. The lifting mechanism design of the measuring lens can adapt to measurement requirements of different heights, enhancing the versatility of the platform and making it suitable for a wider range of industrial measurement scenarios. BRIEF DESCRIPTION OF THE DRAWINGS
[0022] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for describing the embodiments or the prior art.
[0023] Figure 1 Schematic diagram of the overall structure of the probe switching platform of the present invention;
[0024] Figure 2 Schematic diagram of the structure of the probe storage mechanism of the present invention;
[0025] Figure 3 It is a structural schematic diagram of the horizontal moving assembly of the present invention;
[0026] Figure 4 It is a structural schematic diagram of the rotating assembly of the present invention;
[0027] Figure 5 It is a structural schematic diagram of the lifting mechanism of the present invention.
[0028] In the figure: 1. Platform body; 11. Measuring lens; 111. Camera holder; 112. Camera; 2. Base; 3. Support body; 4. Probe connector; 51. Probe holder; 511. Probe storage position; 52. Connecting plate; 53. Rotating shaft; 61. Support frame; 62. Fixed frame; 621. Front fixed frame; 622. Rear fixed frame; 63. Slide rail 1; 64. Slider 1; 65. First motor; 71. Second motor; 81. Third motor; 82. Buckle; 83. Slide rail 2; 84. Slider 2. DETAILED DESCRIPTION
[0029] The present invention will be described more clearly and completely below by way of a preferred embodiment in conjunction with the accompanying drawings, but the present invention is not limited to the scope of the embodiment.
[0030] like Figure 1 As shown, the present invention discloses a probe automatic replacement platform, including a platform body 1, a base 2, a probe storage mechanism, a probe transport mechanism, a probe docking mechanism and a control unit. A probe connector 4 for connecting to the probe is provided on the platform body 1, and the base 2 is fixedly installed in the working area of the platform body 1, and the two are connected by a support body 3; the probe storage mechanism is connected to the probe transport mechanism for storing the probe to be replaced, and the probe transport mechanism is installed on the support body 3 for driving the probe storage mechanism to adjust the position and realize automatic docking and separation of the probe; the probe docking mechanism is provided on the support body 3 and is connected to the probe connector 4 for driving the probe connector to move in the vertical direction; the control unit is connected to the probe storage mechanism, the probe transport mechanism and the probe docking mechanism for coordinating the actions of each component to complete the docking, separation and replacement of the probe.
[0031] like Figure 2 The probe storage mechanism includes a probe rack 51, a connecting plate 52 and a rotating shaft 53. At least two probe storage positions 511 are provided on the probe rack 51 for storing multiple probes to be replaced. The probe storage positions 511 are distributed along the circumference and the angle between adjacent probe storage positions is less than 90° to improve storage density and switching efficiency; the connecting plate 52 is linked to the probe transfer mechanism through a horizontal moving component, and the rotating shaft 53 is installed on the connecting plate 52 and one end is connected to the rotating component, and the other end is connected to the probe rack 51, for driving the probe rack to rotate around the vertical axis.
[0032] In one embodiment, the probe storage position is provided with a magnetic device for fixing the probe and preventing it from falling off during rotation or movement. The probe storage position can also be covered by a protective cover when empty to prevent dust and impurities from entering.
[0033] The probe transport mechanism includes a rotating assembly for driving the probe to rotate around a vertical axis and a horizontal moving assembly for driving the probe to move in a horizontal plane; Figure 3 As shown, the horizontal movement assembly includes a support frame 61, a fixed frame 62, a slide rail 63, a slider 64 and a first motor 65. The support frame 61 is fixedly mounted on the support body 3. The fixed frame 62 includes a front fixed frame 621 and a rear fixed frame 622. The front fixed frame 621 and the rear fixed frame 622 are respectively arranged at both ends of the support frame 61.
[0034] The slide rail 63 is fixedly mounted on the support frame 61, and the slider 64 is mounted on the slide rail 63 and can slide in the horizontal direction along the slide rail 63. The first motor 65 drives the slider 64 to reciprocate in the horizontal direction through the screw rod. The connecting plate 52 is located between the front fixing frame 621 and the rear fixing frame 622 and is fixedly connected to the slider 64. The screw rod of the first motor 65 passes through the front fixing frame 621, the connecting plate 52 and the rear fixing plate 622 in sequence. When the screw rod of the first motor 65 is started, it drives the connecting plate 52 to slide back and forth, and the connecting plate 52 reciprocates with the slider 64 driven by the first motor 65.
[0035] like Figure 4 As shown, the rotating assembly includes a second motor 71 , which is disposed on the fixing frame 62 . The output shaft of the second motor 71 is connected to the probe frame 51 through the rotating shaft 53 , and is used to drive the probe frame 51 to rotate around the vertical axis.
[0036] The probe transport mechanism includes a lifting mechanism including a ball screw assembly, which is installed on the support body 3 and drives the probe joint 4 to move in the vertical direction. The ball screw assembly here adopts the existing technology and will not be described in detail here.
[0037] like Figure 5 As shown, the platform body includes a measuring lens 11, which includes a camera frame 111 and a camera 112. The camera frame 111 is installed on the support body 3 through a lifting mechanism. The lifting mechanism includes a third motor 81, a buckle 82, a second slider 84 and a second slide rail 83. The third motor 81 is fixedly mounted on the camera frame 111, and the camera frame 111 is provided with a second slide rail 83. The second slider 84 is provided on the second slide rail 83 and can move in the vertical direction along the second slide rail 83. The screw rod of the third motor 81 is connected to the buckle 82, and the second slider 84 is provided with a slot matching the buckle 82.
[0038] The control unit is connected to the probe storage mechanism, the probe transport mechanism and the probe docking mechanism. In one embodiment, the control unit also includes a position detection module and an action control module. The position detection module is used to monitor the relative position of the probe storage position and the probe connector; the action control module is used to coordinate the synchronous action of the probe transport mechanism, the probe storage mechanism and the probe connector.
[0039] The working principle of the present invention is as follows: first, the control unit initializes the positions of the various components, the probe rack 51 in the probe storage mechanism rotates to the initial position, so that one of the probe storage positions 511 is aligned with the docking position where the probe connector 4 is located; the probe connector 4 is at the initial height in the vertical direction to ensure that there is no interference with the storage position; the slider of the horizontal moving assembly is in the initial position, and the connecting plate 52 is located at the reference point in the horizontal plane;
[0040] The probe storage mechanism is used to store multiple probes. The probe storage positions 511 on the probe rack 51 are distributed along the circumference, and each storage position is used to store one probe. When the control unit issues a replacement instruction: if the installed probe needs to be removed, the empty storage position on the probe rack 51 is aligned with the probe connector 4 through the rotating component; if a new probe needs to be replaced, the target storage position is aligned with the probe connector 4 through the rotating component;
[0041] The probe transport mechanism includes a horizontal moving component and a rotating component, and its working principle is as follows:
[0042] Horizontal moving assembly: The first motor 65 drives the screw to rotate, causing the slider 64 to move along the slide rail 63, while driving the connecting plate 52 and the probe holder 51 thereon to move back and forth in the horizontal direction; the horizontal moving assembly adjusts the probe holder 51 to a suitable position so that the target probe storage position 511 is aligned with the probe connector 4 in the horizontal direction.
[0043] Rotating assembly: The second motor 71 drives the probe holder 51 to rotate around the vertical axis through the output shaft; the rotating assembly adjusts the rotation angle of the probe holder 51 according to the command of the control unit, so that the probe storage position 511 is accurately aligned with the probe connector 4 or the empty position of the probe holder 51.
[0044] The working principle of the probe docking mechanism is as follows: the control unit drives the motor of the ball screw assembly through instructions to move the probe connector 4 in the vertical direction; when removing the probe, the probe connector 4 moves upward and completes docking with the empty storage position on the probe rack 51; when installing a new probe, the probe connector moves downward and completes precise docking with the probe in the target storage position on the probe rack.
[0045] Probe replacement process: The probe docking mechanism first drives the probe connector 4 to move upward and dock with the empty storage position on the probe rack 51. The probe is detached from the connector and stored in the empty storage position. The control unit controls the probe rack 51 to rotate so that the target storage position is aligned with the probe connector. The probe docking mechanism then drives the probe connector to descend and dock with the probe in the target storage position, and loads the probe onto the probe connector. After the probe is installed, the probe rack returns to its initial position, and the probe connector can start a new measurement task.
[0046] Auxiliary work of the measuring lens: The measuring lens adjusts the height of the camera through the lifting mechanism to meet the needs of different measurement tasks; the third motor drives the slider to move in the vertical direction, and the camera frame moves up and down accordingly; the control unit adjusts the position of the camera frame according to the measurement task to ensure that the measuring lens is at the appropriate working height.
[0047] The above is only a preferred embodiment of the present invention. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the principles of the present invention. These improvements and modifications should also be regarded as the scope of protection of the present invention.
Claims
1. A probe automatic replacement platform, characterized in that: The invention comprises a platform body (1), a probe storage mechanism, a probe transport mechanism, a probe docking mechanism and a control unit, wherein a probe connector (4) for connecting with a probe is provided on the platform body (1), and a support body (3) for supporting and fixing other components is also provided on the platform body (1); the probe storage mechanism is connected to the probe transport mechanism and is used to store probes to be replaced; the probe transport mechanism is installed on the support body (3) and is used to drive the probe storage mechanism to adjust its position; the probe docking mechanism is provided on the support body (3) and is connected to the probe connector (4) and is used to drive the probe connector to move in a vertical direction; the control unit is connected to the probe storage mechanism, the probe transport mechanism and the probe docking mechanism and is used to realize docking, separation and replacement of the probe; The probe storage mechanism comprises a probe rack (51), a connecting plate (52) and a rotating shaft (53), wherein the probe rack (51) is provided with at least two probe storage positions (511) for storing a plurality of probes to be replaced, wherein the probe storage positions (511) are distributed along the circumference and the adjacent angles are less than 90°; the connecting plate (52) is linked to the probe transport mechanism via a horizontal moving component, and the rotating shaft (53) is mounted on the connecting plate (52) and connected to the rotating component at one end and connected to the probe rack (51) at the other end, for driving the probe rack to rotate around a vertical axis; the probe transport mechanism comprises a rotating component for driving the probe to rotate around the vertical axis and a horizontal moving component for driving the probe to move in a horizontal plane; the horizontal moving component comprises a support frame (61 ), a fixed frame (62), a slide rail (63), a slider (64) and a first motor (65), wherein the support frame (61) is fixedly mounted on the support body (3), the fixed frame (62) includes a front fixed frame (621) and a rear fixed frame (622), which are respectively arranged at the two ends of the support frame (61), and the connecting plate (52) is located between the front fixed frame (621) and the rear fixed frame (622); the slide rail (63) is arranged on the support frame (61), and the slider (64) is mounted on the slide rail (63) and can slide in the horizontal direction along the slide rail (63); the first motor (65) drives the slider (64) to reciprocate in the horizontal direction through the screw rod; the connecting plate (52) and the slider (64) are fixed to each other. The screw of the first motor (65) passes through the front fixed frame (621), the connecting plate (52) and the rear fixed frame (622) in sequence. When the screw of the first motor (65) is started, it drives the connecting plate (52) to slide back and forth, and the connecting plate (52) reciprocates as the slider (64) is driven by the first motor (65); the rotating assembly includes a second motor (71), the second motor (71) is arranged on the fixed frame (62), and the output shaft of the second motor (71) is connected to the probe frame (51) through the rotating shaft (53) for driving the probe frame to rotate around the vertical axis; the probe docking mechanism includes a lifting mechanism including a ball screw assembly, the ball screw assembly is installed on the support body (3), and drives the probe joint (4) to move in the vertical direction.
2. The automatic probe replacement platform according to claim 1, characterized in that: The platform body includes a measuring lens (11), the measuring lens (11) includes a camera frame (111) and a camera (112), and the camera frame (111) is mounted on the support body (3) via a lifting mechanism.
3. The automatic probe replacement platform according to claim 2, characterized in that: The lifting mechanism includes a third motor (81), a buckle (82), a second slider (84) and a second slide rail (83). The third motor (81) is fixedly mounted on the camera frame (111). The second slide rail (83) is provided on the camera frame (111). The second slider (84) is provided on the second slide rail (83) and can move in a vertical direction along the second slide rail (83). The screw rod of the third motor (81) is connected to the buckle (82). The second slider (84) is provided with a slot matching the buckle (82).
4. The automatic probe replacement platform according to claim 1, characterized in that: The platform body (1) comprises a base (2), wherein the base (2) is fixedly mounted on the working area of the platform body (1), and the two are connected via a support body (3).
Citation Information
Patent Citations
Automatic probe station for module testing
CN112992712A
PCBA automatic positioning device and test system
CN207148159U