System and method for testing line width of physical part of CPT atomic clock
By designing a CPT atomic clock physical part linewidth testing system including a computer, a linewidth testing device circuit board and a program-controlled frequency counter, the problem of difficult to effectively test and compare the physical part linewidth of different batches and types of CPT atomic clocks in the prior art is solved, and fast and accurate linewidth measurement and production efficiency are achieved.
Patent Information
- Application Number
- CN202411910966.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-24
- Publication Date
- 2025-03-11
AI Technical Summary
The prior art is difficult to effectively test and compare the line widths of physical parts of CPT atomic clocks of different batches and types, resulting in batch differences in the performance of the whole machine.
A CPT atomic clock physical part line width test system is designed, including a computer, line width test device circuit board, program-controlled frequency counter and signal connection line. Frequency testing is carried out through the MCU controller, laser, microwave signal source and 10MHz crystal oscillator to achieve rapid and accurate measurement of the physical part line width of the CPT atomic clock physical part.
The system can quickly and accurately measure the line width of the physical part of the CPT atomic clock, promote the development and production efficiency of various types of physical parts and the entire machine product, and reduce the consumption of test equipment resources.
Smart Images
Figure CN119596665A_ABST
Abstract
Description
Technical Field
[0001] The invention relates to the field of CPT atomic clocks, and in particular to a physical part line width test system and method for a CPT atomic clock. Background Art
[0002] The CPT atomic clock is a miniature atomic clock. Since it does not require the microwave cavity of a traditional atomic clock, the size and power consumption of the CPT atomic clock can be very small in theory, and can reach the real "chip-level" size and power consumption standards. This feature makes the widespread promotion and application of atomic clocks and chip-level atomic clock products possible. Therefore, CPT atomic clock technology has attracted much attention in the field of miniaturized atomic clocks.
[0003] The line width of the physical part of a CPT atomic clock is one of the main parameters that affect the performance of the entire machine. At present, domestic manufacturers are able to carry out large-scale production of various types of physical parts of CPT atomic clocks, and the line widths of various types of physical parts are different. The line width data of physical parts of the same type produced in different batches are also different. After the subsequent physical parts are installed in the atomic clock machine, the performance of the whole machine will be affected by them and will also have batch differences accordingly. Therefore, it is necessary to design a method and device that can test the line widths of various types of physical parts, so as to test the physical parts of CPT atomic clocks, thereby promoting the research and production efficiency of various types of physical parts and CPT atomic clock products. Summary of the invention
[0004] The present invention provides a CPT atomic clock physical part line width test system and method, which are used to test the physical part of the CPT atomic clock, thereby promoting the research and production efficiency of various types of physical parts and CPT atomic clock complete products.
[0005] In the first aspect, a line width test system for the physical part of a CPT atomic clock is provided, comprising: a host computer, a line width test device circuit board, a programmable frequency counter and a signal connection line; the host computer, the line width test device circuit board and the programmable frequency counter are connected via a signal connection line; the line width test device circuit board comprises: an MCU controller, a laser, a microwave signal source, a 10MHz crystal oscillator, and a physical part of a CPT atomic clock;
[0006] The host computer is used to display, set and save various working data through the host computer display and control software; the line width test device circuit board is used to perform frequency testing of the line width of the physical part of the CPT atomic clock; the programmable frequency counter is used to read and output the frequency data output by the line width test device circuit board.
[0007] In one embodiment, the MCU controller is used to control the working state of the physical part of the CPT atomic clock; to perform servo control on the laser; to perform frequency scanning control on the 10MHz crystal oscillator; and to receive the optical detection signal of the physical part of the CPT atomic clock.
[0008] In one implementation, the physical part of the CPT atomic clock has different structural forms, and the physical parts of the CPT atomic clock with different interface forms use different connection adapter areas to be connected to and fixed on the line width test device.
[0009] In one embodiment, the upper computer display and control software is specifically used to calculate and save the display and control data sent by the MCU controller during the CPT signal scanning process, and in combination with the frequency data output by the programmable frequency counter and the parameter setting of the microwave loop, the line width value of the physical part of the current measured CPT atomic clock is calculated.
[0010] In one embodiment, the C field coil and magnetic shielding box required for the operation of the physical part of the CPT atomic clock can be used or not according to actual needs.
[0011] In a second aspect, a method for testing the line width of a physical part of a CPT atomic clock is provided, and the method is applied to the above-mentioned system, comprising:
[0012] After the physical part of the CPT atomic clock is connected and fixed and the working parameters are set, the corresponding working parameters are downloaded to the MCU controller of the line width test device to start the test process;
[0013] After the working states of the laser and the physical part are stable, microwave signal scanning is performed. When the CPT phenomenon occurs, the display and control software in the host computer calculates the displayed and recorded data, and combines the reading record of the output frequency data of the programmable frequency counter and the parameter setting of the microwave loop to measure the line width data of the physical part of the CPT atomic clock currently being measured.
[0014] In one embodiment, before the physical part of the CPT atomic clock is connected and fixed and the working parameters are set, it also includes: using different connection adapter areas for the physical parts of the CPT atomic clock with different interface forms, connecting and fixing them on the line width test device; setting and adjusting the parameters of the physical parts of different types of CPT atomic clocks through the host computer display and control software in the host computer, and forming a corresponding physical part parameter template for saving.
[0015] In one embodiment, the parameters of the different types of physical parts include: temperature control parameters, C field current, and injected microwave signal power.
[0016] In one embodiment, before the working states of the laser and the physical part reach stability, it also includes: the MCU controller configures and servo controls the physical part, microwave signal, and laser of the CPT atomic clock.
[0017] In one embodiment, the C field coil and magnetic shielding box required for the operation of the physical part of the CPT atomic clock can be used or not according to actual needs.
[0018] The embodiment of the present invention provides a line width test system and method for the physical part of a CPT atomic clock. The system comprises: a host computer, a line width test device circuit board, a programmable frequency counter and a signal connection line; the host computer, the line width test device circuit board and the programmable frequency counter are connected via a signal connection line; the line width test device circuit board comprises: an MCU controller, a laser, a microwave signal source, a 10 MHz crystal oscillator, and a physical part of a CPT atomic clock; the host computer is used to display, set and save various working data through the host computer display and control software; the line width test device circuit board is used to perform a frequency test on the line width of the physical part of the CPT atomic clock; the programmable frequency counter is used to read and output the frequency data output by the line width test device circuit board. Through the above system, the physical part of the CPT atomic clock is tested, thereby promoting the research and production efficiency of various types of physical parts and CPT atomic clock complete products.
[0019] Other features and advantages of the present invention will be described in the following description, and partly become apparent from the description, or understood by practicing the present invention. The purpose and other advantages of the present invention can be realized and obtained by the structure particularly pointed out in the written description, claims, and drawings thereof. BRIEF DESCRIPTION OF THE DRAWINGS
[0020] The drawings described herein are used to provide a further understanding of the present invention and constitute a part of the present invention. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the drawings:
[0021] Figure 1 It is a schematic diagram of the structure of a linewidth test system for the physical part of a CPT atomic clock according to an embodiment of the present invention;
[0022] Figure 2 It is a flow chart of a method for testing the line width of the physical part of a CPT atomic clock according to an embodiment of the present invention;
[0023] Figure 3 Schematic diagram of a CPT quantum phenomenon signal waveform observed according to an embodiment of the present invention. DETAILED DESCRIPTION
[0024] In order to test the physical part of a CPT atomic clock, thereby promoting the research and production efficiency of various types of physical parts and complete CPT atomic clock products, a linewidth test system and method for the physical part of a CPT atomic clock is provided.
[0025] The preferred embodiments of the present invention are described below in conjunction with the drawings. It should be understood that the preferred embodiments described herein are only used to illustrate and explain the present invention, and are not used to limit the present invention. In addition, the embodiments of the present invention and the features in the embodiments may be combined with each other if there is no conflict.
[0026] like Figure 1 As shown, the embodiment provides a CPT atomic clock physical part line width test system, including: a host computer, a line width test device circuit board, a programmable frequency counter and a signal connection line; the host computer, the line width test device circuit board and the programmable frequency counter are connected through a signal connection line; the line width test device circuit board includes: an MCU controller, a laser, a microwave signal source, a 10MHz crystal oscillator, and a CPT atomic clock physical part;
[0027] The host computer is used to display, set and save various working data through the host computer display and control software; the line width test device circuit board is used to perform frequency testing of the line width of the physical part of the CPT atomic clock; the programmable frequency counter is used to read and output the frequency data output by the line width test device circuit board.
[0028] In one embodiment, the MCU controller is used to control the working state of the physical part of the CPT atomic clock; to perform servo control on the laser; to perform frequency scanning control on the 10MHz crystal oscillator; and to receive the optical detection signal of the physical part of the CPT atomic clock.
[0029] In one implementation, the physical part of the CPT atomic clock has different structural forms, and the physical parts of the CPT atomic clock with different interface forms use different connection adapter areas to be connected to and fixed on the line width test device.
[0030] In one embodiment, the upper computer display and control software is specifically used to calculate and save the display and control data sent by the MCU controller during the CPT signal scanning process, and in combination with the frequency data output by the programmable frequency counter and the parameter setting of the microwave loop, the line width value of the physical part of the CPT atomic clock currently being measured is calculated.
[0031] In one embodiment, the C field coil and magnetic shielding box required for the operation of the physical part of the CPT atomic clock can be used or not according to actual needs.
[0032] The embodiment provides a CPT atomic clock physical part line width test system, which can display, set, and save various working data through the upper computer display control software without using large-scale precision test equipment such as spectrum analyzer, oscilloscope, signal generator, high-precision digital inspection instrument, etc., and quickly and accurately test the physical part line width of the CPT atomic clock. It has the advantages of convenience and flexibility, saving test equipment resources, and high guidance for CPT atomic clock testing and production.
[0033] Based on the same technical concept, an embodiment of the present application also provides a CPT atomic clock physical part linewidth test method. Since the method is applied to the above-mentioned system, the implementation of the method can refer to the implementation of the system, and the repeated parts will not be repeated.
[0034] like Figure 2 As shown, a method for testing the line width of the physical part of a CPT atomic clock is provided, and the method is applied to the above-mentioned system, comprising:
[0035] After the physical part of the CPT atomic clock is connected and fixed and the working parameters are set, the corresponding working parameters are downloaded to the MCU controller of the line width test device to start the test process;
[0036] After the working states of the laser and the physical part are stable, microwave signal scanning is performed. When the CPT phenomenon occurs, the display and control software in the host computer calculates the displayed and recorded data, and combines the reading record of the output frequency data of the programmable frequency counter and the parameter setting of the microwave loop to measure the line width data of the physical part of the CPT atomic clock currently being measured.
[0037] In one embodiment, before the physical part of the CPT atomic clock is connected and fixed and the working parameters are set, it also includes: using different connection adapter areas for the physical parts of the CPT atomic clock with different interface forms, connecting and fixing them on the line width test device; setting and adjusting the parameters of the physical parts of different types of CPT atomic clocks through the host computer display and control software in the host computer, and forming a corresponding physical part parameter template for saving.
[0038] In one embodiment, the parameters of the different types of physical parts include: temperature control parameters, C field current, and injected microwave signal power.
[0039] In one embodiment, before the working states of the laser and the physical part reach stability, it also includes: the MCU controller configures and servo controls the physical part, microwave signal, and laser of the CPT atomic clock.
[0040] In one embodiment, the C field coil and magnetic shielding box required for the operation of the physical part of the CPT atomic clock can be used or not according to actual needs.
[0041] In the specific implementation, first, when testing the physical parts of CPT atomic clocks with different structural forms, different physical parts can be installed in the corresponding adaptation area of the test system circuit board according to their respective structural forms. The C field coil and magnetic shielding box required for the physical part can be used or not according to actual needs. Use the signal connection line to connect the host computer, the line width test device circuit board and the programmable frequency counter.
[0042] After the physical part is connected and fixed, the laser's light output height and other parameters can be adjusted according to the current structure of the physical part being tested, so that the laser and the physical part being tested can work better together. After setting the appropriate working parameters in the upper computer display and control software interface, start the test.
[0043] After the test starts, the physical part, microwave signal, and laser are configured and servo controlled. After the laser and physical part work in a stable state, the CPT signal is scanned. Figure 2 The waveforms adjacent to the trough and peak shown are CPT signals. The upper computer display and control software will calculate and save the display and control data sent by the MCU control during the CPT signal scanning process, and combine the output frequency data of the program-controlled frequency counter and the parameter settings of the microwave loop to calculate the line width value of the physical part of the CPT atomic clock currently being measured.
[0044] Although the preferred embodiments of the present invention have been described, those skilled in the art may make additional changes and modifications to these embodiments once they have learned the basic creative concept. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments and all changes and modifications that fall within the scope of the present invention.
[0045] Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include these modifications and variations.
Claims
1. A CPT atomic clock physical part linewidth test system, characterized in that: include: Host computer, line width test device circuit board, program-controlled frequency counter and signal connection line; The host computer, the line width test device circuit board and the program-controlled frequency counter are connected via a signal connection line; The line width test device circuit board includes: MCU controller, laser, microwave signal source, 10MHz crystal oscillator, CPT atomic clock physical part; The host computer is used to display, set and save various working data through the host computer display and control software; the line width test device circuit board is used to perform frequency testing of the line width of the physical part of the CPT atomic clock; the programmable frequency counter is used to read and output the frequency data output by the line width test device circuit board.
2. The system according to claim 1, characterized in that The MCU controller is used to control the working state of the physical part of the CPT atomic clock; to perform servo control on the laser; to perform frequency scanning control on the 10MHz crystal oscillator; and to receive the optical detection signal of the physical part of the CPT atomic clock.
3. The system according to claim 1, characterized in that The physical part of the CPT atomic clock has different structural forms. The physical part of the CPT atomic clock with different interface forms uses different connection adapter areas, which are connected to and fixed on the line width test device.
4. The system according to claim 1, characterized in that The upper computer display and control software is specifically used to calculate and save the display and control data sent by the MCU controller during the CPT signal scanning process, and in combination with the frequency data output by the programmable frequency counter and the parameter setting of the microwave loop, the line width value of the physical part of the currently measured CPT atomic clock is calculated.
5. The system according to claim 1, characterized in that The C field coil and magnetic shielding box required for the physical part of the CPT atomic clock can be used or not according to actual needs.
6. A method for testing the line width of the physical part of a CPT atomic clock, the method being applied to the systems described in 1 to 5, characterized in that: include: After the physical part of the CPT atomic clock is connected and fixed and the working parameters are set, the corresponding working parameters are downloaded to the MCU controller of the line width test device to start the test process; After the working states of the laser and the physical part are stable, microwave signal scanning is performed. When the CPT phenomenon occurs, the display and control software in the host computer calculates the displayed and recorded data, and combines the reading record of the output frequency data of the programmable frequency counter and the parameter setting of the microwave loop to measure the line width data of the physical part of the CPT atomic clock currently being measured.
7. The method according to claim 6, characterized in that Before the physical part of the CPT atomic clock is connected and fixed and the working parameters are set, it also includes: using different connection adapter areas for the physical parts of the CPT atomic clock with different interface forms, connecting and fixing them on the line width test device; setting and adjusting the parameters of the physical parts of different types of CPT atomic clocks through the host computer display and control software in the host computer, and forming a corresponding physical part parameter template for saving.
8. The method according to claim 7, characterized in that The parameters of the different types of physical parts include: temperature control parameters, C field current, and injected microwave signal power.
9. The method according to claim 6, characterized in that Before the working state of the laser and the physical part reaches stability, it also includes: the MCU controller configures and servo controls the physical part of the CPT atomic clock, the microwave signal, and the laser.
10. The method according to claim 6, characterized in that The C field coil and magnetic shielding box required for the physical part of the CPT atomic clock can be used or not according to actual needs.