Automatic inspection method and device based on heterogeneous database cluster architecture

Abstract

The invention relates to an automatic inspection method and device based on a heterogeneous database cluster architecture, and belongs to the technical field of inspection, and the method comprises the steps: generating an acquisition device and an analysis device; the inspection system obtains to-be-inspected host information in the asset system and issues the acquisition device to the to-be-inspected host; the inspection system starts an acquisition device, and the acquisition device acquires database information, middleware information and association configuration of a database and middleware and returns an acquisition result to the inspection system; the inspection system puts the collection results into the same cluster to form database cluster information; the analysis device performs diffusion analysis by taking the middleware in the database cluster information as a center, and searches multiple types of databases having a cluster relationship with the middleware to form a multiple types of cross-middleware database clusters; and traversing multiple types of cross-middleware database clusters to form a heterogeneous database cluster tree topology. According to the invention, database and middleware information is collected, and a cluster relationship is analyzed to generate a topology inspection result.

Description

Technical Field

[0001] The present invention belongs to the field of inspection technology, and in particular relates to an automated inspection method and device based on a heterogeneous database cluster architecture. Background Art

[0002] With the advent of the information age and the continuous expansion of enterprise information applications, enterprise information has become the core business content of major enterprises. As a medium for storing information, the daily safe operation of the database has also become a key protection task for each enterprise. To ensure the daily operation of the database, enterprise database administrators will regularly inspect the database to check for hidden dangers in the database. However, with the increase in database types, continuous innovation of high-availability architecture types, and continuous iteration of versions, traditional single-node inspections and manual inspections can no longer meet the current complex database environment and huge database scale. Summary of the invention

[0003] In view of the above-mentioned deficiencies in the prior art, the purpose of the invention is to provide an automated inspection method and device based on a heterogeneous database cluster architecture, which automatically collects database information and middleware information of the inspected host, automatically analyzes the cluster relationship of the collected results and generates topological inspection results, which can meet the current complex database environment and huge database scale.

[0004] The first aspect of the present invention provides an automated inspection method based on a heterogeneous database cluster architecture, comprising:

[0005] Generate a collection device and an analysis device;

[0006] The acquisition device receives the user's operation and sets default parameters;

[0007] The inspection system obtains the information of the host to be inspected in the asset system and sends the collection device to the host to be inspected;

[0008] The inspection system starts the collection device, which collects database information, middleware information and the associated configuration between the database and the middleware and returns the database information, middleware information and the associated configuration between the database and the middleware to the inspection system;

[0009] The inspection system places the database information, middleware information and the associated configuration of the database and the middleware into the same cluster to form database cluster information;

[0010] The analysis device performs diffusion analysis from the middleware in the database cluster information as the center, and searches for multiple types of databases that have a cluster relationship with the middleware to form multiple types of cross-middleware database clusters;

[0011] Traverse various types of cross-middleware database clusters to form a heterogeneous database cluster tree topology.

[0012] Furthermore, in the above-mentioned automated inspection method based on heterogeneous database cluster architecture, the generating and collecting device includes:

[0013] Obtain common database and middleware acquisition programs written by database administrators;

[0014] The general database and middleware acquisition program are placed in an independent environment for processing to generate the acquisition device.

[0015] Furthermore, in the above-mentioned automated inspection method based on heterogeneous database cluster architecture, the generating and analyzing device includes:

[0016] Obtain common database and middleware analysis programs written by database administrators;

[0017] The general database and middleware analysis program are placed in an independent and non-dependent environment for processing to generate an analysis device.

[0018] Furthermore, in the above-mentioned automated inspection method based on heterogeneous database cluster architecture, the inspection system starts the collection device, and further includes:

[0019] Check whether the inspection system has passed customized parameters to the collection device;

[0020] If the detection result is that the inspection system has not passed customized parameters to the collection device, the collection device is started using the default parameters.

[0021] Furthermore, in the above-mentioned automated inspection method based on heterogeneous database cluster architecture, the inspection system starts the collection device, and further includes:

[0022] Check whether the inspection system has passed customized parameters to the collection device;

[0023] If the detection result is a customized parameter transmitted from the inspection system to the collection device, the collection device is started using the customized parameter.

[0024] Furthermore, in the above-mentioned automated inspection method based on heterogeneous database cluster architecture, before the inspection system places the database information, the middleware information and the associated configuration of the database and the middleware into the same cluster to form the database cluster information, it also includes:

[0025] Classify and filter the collected database information and middleware information.

[0026] Furthermore, in the above-mentioned automated inspection method based on heterogeneous database cluster architecture, multiple types of cross-middleware database clusters are traversed to form a heterogeneous database cluster tree topology, including:

[0027] Determine whether there is a correlation between databases in multiple types of cross-middleware database clusters;

[0028] If the judgment result is that the databases between clusters are related, a heterogeneous database cluster tree topology is formed.

[0029] The second aspect of the present invention further proposes an automatic inspection device based on a heterogeneous database cluster architecture, comprising:

[0030] Generation module: used to generate collection devices and analysis devices;

[0031] Receiving module: used for the acquisition device to receive the user's operation and set the default parameters;

[0032] Acquisition module: used by the inspection system to obtain the information of the host to be inspected in the asset system, and send the collection device to the host to be inspected;

[0033] Collection module: used for the inspection system to start the collection device, which collects database information, middleware information and the associated configuration between the database and the middleware and returns the database information, middleware information and the associated configuration between the database and the middleware to the inspection system;

[0034] Placement module: used by the inspection system to place database information, middleware information, and the associated configuration of the database and middleware into the same cluster to form database cluster information;

[0035] Search module: used for analyzing the diffusion analysis of the middleware in the database cluster information by the analysis device, and searching for multiple types of databases that have a cluster relationship with the middleware to form multiple types of cross-middleware database clusters;

[0036] Traversal module: used to traverse various types of cross-middleware database clusters to form a heterogeneous database cluster tree topology.

[0037] According to a third aspect of the present invention, an electronic device is provided, comprising: a processor and a memory;

[0038] The processor is used to execute any one of the above-mentioned automated inspection methods based on heterogeneous database cluster architecture by calling the program or instruction stored in the memory.

[0039] In a fourth aspect of the present invention, a computer-readable storage medium is further proposed, wherein the computer-readable storage medium stores a program or instruction, and the program or instruction enables a computer to execute any one of the above-mentioned automated inspection methods based on a heterogeneous database cluster architecture.

[0040] The beneficial effects of the present invention are as follows: the present invention generates a collection device and an analysis device; the collection device receives the user's operation and sets the default parameters; the inspection system obtains the host information to be inspected in the asset system, and sends the collection device to the host to be inspected; the inspection system starts the collection device, and the collection device collects database information, middleware information and the associated configuration of the database and the middleware and returns the database information, middleware information and the associated configuration of the database and the middleware to the inspection system; the inspection system places the database information, middleware information and the associated configuration of the database and the middleware into the same cluster to form database cluster information; the analysis device diffuses and analyzes from the middleware in the database cluster information as the center, and searches for multiple types of databases with cluster relationships with the middleware to form multiple types of cross-middleware database clusters; traverses multiple types of cross-middleware database clusters to form a heterogeneous database cluster tree topology. The present invention automatically collects the database information and middleware information of the host to be inspected, and automatically analyzes the cluster relationship of the collection results to generate a topology inspection result, which can meet the current complex database environment and huge database scale. BRIEF DESCRIPTION OF THE DRAWINGS

[0041] The accompanying drawings are only used to illustrate specific embodiments and are not considered to limit the present invention. In the entire drawings, the same reference symbols represent the same components. Obviously, the drawings described below are only some embodiments recorded in the embodiments of the present invention. For those of ordinary skill in the art, other drawings can also be obtained based on these drawings.

[0042] Figure 1 A diagram of an automated inspection method based on a heterogeneous database cluster architecture provided by an embodiment of the present invention;

[0043] Figure 2 A method diagram of generating a collection device provided by an embodiment of the present invention;

[0044] Figure 3 A method diagram of generating an analysis device provided by an embodiment of the present invention;

[0045] Figure 4 A method for starting a collection device in a patrol inspection system provided by an embodiment of the present invention Figure 1 ;

[0046] Figure 5 A method for starting a collection device in a patrol inspection system provided by an embodiment of the present invention Figure 2 ;

[0047] Figure 6 A diagram of a method for forming a heterogeneous database cluster tree topology provided by an embodiment of the present invention;

[0048] Figure 7A diagram of an automated inspection device based on a heterogeneous database cluster architecture provided by an embodiment of the present invention;

[0049] Figure 8 A schematic block diagram of an electronic device provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0050] In order to enable those skilled in the art to better understand the technical solutions in the embodiments of the present invention, the technical solutions of the present invention will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the described embodiments are part of the embodiments of the present invention, rather than all of the embodiments. It should be understood that these descriptions are only exemplary and are not intended to limit the scope of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in the field without making creative work should fall within the scope of protection of the present invention.

[0051] Furthermore, in the following description, descriptions of well-known structures and technologies are omitted to avoid unnecessarily obscuring the concepts disclosed in the present invention.

[0052] In the description of the present invention, the terms "first", "second", and "third" are used for descriptive purposes only and should not be understood as indicating or implying relative importance. The terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be internal communication between two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0053] Exemplary embodiments will be described in detail herein, examples of which are shown in the accompanying drawings. When the following description refers to the drawings, unless otherwise indicated, the same numbers in different drawings represent the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present invention. Instead, they are merely examples of methods and systems consistent with some aspects of the present invention as detailed in the appended claims.

[0054] The present invention proposes an automated inspection method, device, electronic device and storage medium based on a heterogeneous database cluster architecture, which automatically collects database information and middleware information of the host to be inspected, and automatically analyzes the cluster relationship of the collected results to generate topological inspection results, which can meet the current complex database environment and huge database scale.

[0055] Method Embodiment

[0056] Figure 1A diagram of an automated inspection method based on a heterogeneous database cluster architecture provided in an embodiment of the present invention.

[0057] In the first aspect of the present invention, an automated inspection method based on a heterogeneous database cluster architecture is proposed. Figure 1 , including seven steps from S1 to S7:

[0058] S1: Generate a collection device and an analysis device.

[0059] Specifically, in the embodiment of the present invention, the method of generating the collection device and the analysis device is described in detail below. Both the collection device and the analysis device are devices that are not dependent on the environment.

[0060] S2: The acquisition device receives the user's operation and sets default parameters.

[0061] Specifically, in the embodiment of the present invention, after the collection device is generated, default parameters of the collection device are set, and the inspection system can start the collection device through the default parameters.

[0062] S3: The inspection system obtains the information of the host to be inspected in the asset system and sends the collection device to the host to be inspected.

[0063] Specifically, in the embodiment of the present invention, the inspection system obtains the information of the host to be inspected through the host list information of the asset system, and sends the collection device to the host to be inspected in a timed and automated manner.

[0064] S4: The inspection system starts the collection device, which collects database information, middleware information, and the associated configuration between the database and the middleware, and returns the database information, middleware information, and the associated configuration between the database and the middleware to the inspection system.

[0065] Specifically, in the embodiment of the present invention, the inspection system may start the collection device through default parameters, or may start the collection device through customized parameters.

[0066] If the collection device is started with the default parameters, it will use the default parameters to scan the database and middleware in the host to be inspected, collect the database information, middleware information and the associated configuration between the database and the middleware, and return the database information, middleware information and the associated configuration between the database and the middleware to the inspection system. The database can be MySQL, MongoDB, PostgreSQL, TIDB; the middleware can be HAPROXY, ETCD, CONSUL, KEEPALIVED.

[0067] If customized parameters are used to start the collection device, the collection device uses the customized parameters to scan the database and middleware in the inspection host to collect database information, middleware information and the associated configuration of the database and middleware, and returns the database information, middleware information and the associated configuration of the database and middleware to the inspection system. The database can be MySQL, MongoDB, PostgreSQL, TIDB: the middleware can be HAPROXY, ETCD, CONSUL, KEEPALIVED.

[0068] S5: The inspection system places the database information, the middleware information, and the associated configurations of the database and the middleware into the same cluster to form database cluster information.

[0069] Specifically, in an embodiment of the present invention, after the collection device returns the database information, middleware information and the associated configuration between the database and the middleware to the inspection system, the inspection system places the database information, middleware information and the associated configuration between the database and the middleware into the same cluster and organizes them into database cluster information. The database cluster information is a visual architecture tree topology formed by an array to feedback the inspection results.

[0070] S6: The analysis device performs diffusion analysis from the middleware in the database cluster information as the center, and searches for multiple types of databases that have a cluster relationship with the middleware to form multiple types of cross-middleware database clusters.

[0071] Specifically, in an embodiment of the present invention, in order to be compatible with the reuse of middleware, the analysis device will conduct a diffusion analysis centered on the middleware in the database cluster information, search for multiple types of databases that have a cluster relationship with the middleware to form a heterogeneous database cluster architecture, and finally organize it into a complete multi-type cross-middleware database cluster inspection information.

[0072] S7: Traverse multiple types of cross-middleware database clusters to form a heterogeneous database cluster tree topology.

[0073] Specifically, in an embodiment of the present invention, a method for repeatedly traversing multiple types of cross-middleware database clusters to form a heterogeneous database cluster tree topology is described in detail below.

[0074] Figure 2 A method diagram for generating a collection device provided in an embodiment of the present invention.

[0075] Furthermore, in the above-mentioned automated inspection method based on heterogeneous database cluster architecture, a collection device is generated, combined with Figure 2 , including two steps from S21 to S22:

[0076] S21: Obtaining a general database and middleware collection program written by a database administrator;

[0077] S22: placing the general database and the middleware acquisition program in an independent environment for processing and generating an acquisition device.

[0078] Specifically, in an embodiment of the present invention, a database administrator presets a collection program that is compatible with all databases and middleware configurations, and places the collection program that is compatible with all databases and middleware configurations in an independent and non-dependent environment for debugging and compilation. After the debugging and compilation is successful, the environment-dependent collection program is generated into an environment-independent and portable collection device through compilation and compression plug-ins.

[0079] Figure 3 A diagram of a method for generating an analysis device provided by an embodiment of the present invention.

[0080] Furthermore, in the above-mentioned automated inspection method based on heterogeneous database cluster architecture, the generating and analyzing device is combined with Figure 3 , including two steps from S31 to S32:

[0081] S31: Obtain a general database and middleware analysis program written by a database administrator;

[0082] S32: placing the general database and the middleware analysis program in an independent and non-dependent environment for processing to generate an analysis device.

[0083] Specifically, in an embodiment of the present invention, a database administrator presets an analysis program that is compatible with all databases and middleware configurations, and places the analysis program that is compatible with all databases and middleware configurations in an independent and non-dependent environment for debugging and compilation. After the debugging and compilation is successful, the environment-dependent analysis program is generated into an environment-independent and portable analysis device through compilation and compression plug-ins.

[0084] Figure 4 A method for starting a collection device in a patrol inspection system provided by an embodiment of the present invention Figure 1 .

[0085] Furthermore, in the above-mentioned automated inspection method based on heterogeneous database cluster architecture, the inspection system starts the collection device, combined with Figure 4 , and also includes two steps S41 to S42:

[0086] S41: Detect whether the inspection system has passed customized parameters of the collection device;

[0087] S42: If the detection result is that the inspection system has not passed customized parameters to the collection device, the collection device is started using default parameters.

[0088] Specifically, in an embodiment of the present invention, the customized parameters of the collection device may be the host IP, customized commands and customized configurations; the collection device detects whether the inspection system has passed the customized parameters of the collection device. If the detection result is that the inspection system has not passed the customized parameters of the collection device, the collection device is started using the default parameters. The collection device uses the default parameters to scan the database and middleware in the host to be inspected, collect database information, middleware information and the associated configuration of the database and the middleware, and return the database information, middleware information and the associated configuration of the database and the middleware to the inspection system.

[0089] Figure 5 A method for starting a collection device in a patrol inspection system provided by an embodiment of the present invention Figure 2 .

[0090] Furthermore, in the above-mentioned automated inspection method based on heterogeneous database cluster architecture, the inspection system starts the collection device, combined with Figure 5 , and also includes two steps S51 to S52:

[0091] S51: Detect whether the inspection system has passed customized parameters of the collection device;

[0092] S52: If the detection result is a customized parameter transmitted from the inspection system to the collection device, the collection device is started using the customized parameter.

[0093] Specifically, in an embodiment of the present invention, the customized parameters of the collection device may be the host IP, customized commands and customized configurations; the collection device detects whether the inspection system has passed the customized parameters of the collection device. If the detection result is that the inspection system has passed the customized parameters of the collection device, the collection device is started using the customized parameters. The collection device uses the customized parameters to scan the database and middleware in the inspection host to collect database information, middleware information and the associated configuration of the database and the middleware, and returns the database information, middleware information and the associated configuration of the database and the middleware to the inspection system.

[0094] Furthermore, in the above-mentioned automated inspection method based on heterogeneous database cluster architecture, before the inspection system places the database information, the middleware information and the associated configuration of the database and the middleware into the same cluster to form the database cluster information, it also includes:

[0095] Classify and filter the collected database information and middleware information.

[0096] Specifically, in the embodiment of the present invention, the inspection system classifies and filters the collected database information and middleware information, that is, the database information is one category and the middleware information is another category, which improves the accuracy of the subsequent tree topology of the heterogeneous database cluster.

[0097] Figure 6 A diagram of a method for forming a heterogeneous database cluster tree topology provided by an embodiment of the present invention.

[0098] Furthermore, in the above-mentioned automated inspection method based on heterogeneous database cluster architecture, multiple types of cross-middleware database clusters are traversed to form a heterogeneous database cluster tree topology, combined with Figure 6 , including two steps from S61 to S62:

[0099] S61: Determine whether there is a connection between databases in multiple types of cross-middleware database clusters;

[0100] S62: If the judgment result is that the databases between the clusters are associated, a heterogeneous database cluster tree topology is formed.

[0101] Specifically, in an embodiment of the present invention, multiple types of cross-middleware database clusters are repeatedly traversed to determine whether there is a correlation between databases in the multiple types of cross-middleware database clusters. If the judgment result is that there is a correlation between databases in the clusters, a heterogeneous database cluster tree topology is formed.

[0102] Device Embodiment

[0103] Figure 7 A diagram of an automated inspection device based on a heterogeneous database cluster architecture provided in an embodiment of the present invention.

[0104] In the second aspect of the present invention, an automatic inspection device based on a heterogeneous database cluster architecture is also proposed. Figure 7 ,include:

[0105] Generating module 71: used to generate a collection device and an analysis device.

[0106] Specifically, in the embodiment of the present invention, the generation module 71 generates a collection device and an analysis device, and both the collection device and the analysis device are devices that are not dependent on the environment.

[0107] Receiving module 72: used for the acquisition device to receive user operations and set default parameters.

[0108] Specifically, in the embodiment of the present invention, after the collection device is generated, the receiving module 72 receives the user's operation to set the default parameters of the collection device, and the inspection system can start the collection device according to the default parameters.

[0109] Acquisition module 73: used by the inspection system to acquire the information of the host to be inspected in the asset system, and send the collection device to the host to be inspected.

[0110] Specifically, in the embodiment of the present invention, the acquisition module 73 of the inspection system acquires the host information to be inspected through the host list information of the asset system, and sends the collection device to the host to be inspected in a timed and automated manner.

[0111] Collection module 74: used for the inspection system to start the collection device, which collects database information, middleware information and the associated configuration between the database and the middleware and returns the database information, middleware information and the associated configuration between the database and the middleware to the inspection system.

[0112] Specifically, in the embodiment of the present invention, the inspection system may start the collection device through default parameters, or may start the collection device through customized parameters.

[0113] If the collection device is started using the default parameters, the collection module 74 of the collection device uses the default parameters to scan the database and middleware in the inspected host to collect database information, middleware information and the associated configuration of the database and middleware, and returns the database information, middleware information and the associated configuration of the database and middleware to the inspection system.

[0114] If customized parameters are used to start the collection device, the collection module 74 of the collection device uses the customized parameters to scan the database and middleware in the inspection host to collect database information, middleware information and the associated configuration of the database and the middleware, and returns the database information, middleware information and the associated configuration of the database and the middleware to the inspection system.

[0115] Placement module 75: used for the inspection system to place database information, middleware information and associated configurations of the database and the middleware into the same cluster to form database cluster information.

[0116] Specifically, in an embodiment of the present invention, after the collection device returns the database information, middleware information and the associated configuration between the database and the middleware to the inspection system, the inspection system places the database information, middleware information and the associated configuration between the database and the middleware into the same cluster through the placement module 75 to organize them into database cluster information. The database cluster information is a visual architecture tree topology formed by an array to feedback the inspection results.

[0117] Search module 76: used for the analysis device to perform diffusion analysis from the middleware in the database cluster information, and to search for multiple types of databases that have a cluster relationship with the middleware to form multiple types of cross-middleware database clusters.

[0118] Specifically, in an embodiment of the present invention, in order to be compatible with the reuse of middleware, the analysis device will diffuse the analysis from the middleware in the database cluster information as the center, and the search module 76 will search for multiple types of databases that have a cluster relationship with the middleware to form a heterogeneous database cluster architecture, and finally organize it into a complete multi-type cross-middleware database cluster inspection information.

[0119] Traversal module 77: used to traverse various types of cross-middleware database clusters to form a heterogeneous database cluster tree topology.

[0120] Specifically, in an embodiment of the present invention, the traversal module 77 repeatedly traverses multiple types of cross-middleware database clusters to determine whether there is an association between databases in the multiple types of cross-middleware database clusters. If the judgment result is that there is an association between databases in the clusters, a heterogeneous database cluster tree topology is formed.

[0121] According to a third aspect of the present invention, an electronic device is provided, comprising: a processor and a memory;

[0122] The processor is used to execute any one of the above-mentioned automated inspection methods based on heterogeneous database cluster architecture by calling the program or instruction stored in the memory.

[0123] In a fourth aspect of the present invention, a computer-readable storage medium is further proposed, wherein the computer-readable storage medium stores a program or instruction, and the program or instruction enables a computer to execute any one of the above-mentioned automated inspection methods based on a heterogeneous database cluster architecture.

[0124] Figure 8 It is a schematic block diagram of an electronic device provided by an embodiment of the present invention.

[0125] like Figure 8 As shown, the electronic device includes: at least one processor 801, at least one memory 802 and at least one communication interface 803. The various components in the electronic device are coupled together through a bus system 804. The communication interface 803 is used to transmit information between external devices. It can be understood that the bus system 804 is used to achieve connection and communication between these components. In addition to the data bus, the bus system 804 also includes a power bus, a control bus and a status signal bus. However, for the sake of clarity, Figure 8 Various buses are labeled as bus system 804 .

[0126] It can be understood that the memory 802 in this embodiment can be a volatile memory or a non-volatile memory, or can include both volatile and non-volatile memories.

[0127] In some implementations, the memory 802 stores the following elements, executable units or data structures, or a subset thereof, or an extended set thereof: an operating system and application programs.

[0128] The operating system includes various system programs, such as a framework layer, a core library layer, a driver layer, etc., which are used to implement various basic services and process hardware-based tasks. The application includes various application programs, such as a media player (Media Player), a browser (Browser), etc., which are used to implement various application services. A program that implements any method in an automated inspection method based on a heterogeneous database cluster architecture provided in an embodiment of the present invention can be included in the application.

[0129] In an embodiment of the present invention, the processor 801 calls a program or instruction stored in the memory 802, specifically, a program or instruction stored in an application, and the processor 801 is used to execute the steps of each embodiment of an automated inspection method based on a heterogeneous database cluster architecture provided in an embodiment of the present invention.

[0130] Generate a collection device and an analysis device;

[0131] The acquisition device receives the user's operation and sets default parameters;

[0132] The inspection system obtains the information of the host to be inspected in the asset system and sends the collection device to the host to be inspected;

[0133] The inspection system starts the collection device, which collects database information, middleware information and the associated configuration between the database and the middleware and returns the database information, middleware information and the associated configuration between the database and the middleware to the inspection system;

[0134] The inspection system places the database information, middleware information and the associated configuration of the database and the middleware into the same cluster to form database cluster information;

[0135] The analysis device performs diffusion analysis from the middleware in the database cluster information as the center, and searches for multiple types of databases that have a cluster relationship with the middleware to form multiple types of cross-middleware database clusters;

[0136] Traverse multiple types of cross-middleware database clusters to form a heterogeneous database cluster tree topology.

[0137] Any method in the method for automated inspection based on heterogeneous database cluster architecture provided in an embodiment of the present invention can be applied to the processor 801, or implemented by the processor 801. The processor 801 can be an integrated circuit chip with signal processing capabilities. In the implementation process, each step of the above method can be completed by an integrated logic circuit of hardware in the processor 801 or an instruction in the form of software. The above-mentioned processor 801 can be a general-purpose processor, a digital signal processor (Digital Signal Processor, DSP), an application-specific integrated circuit (Application Specific Integrated Circuit, ASIC), a field programmable gate array (Field Programmable Gate Array, FPGA) or other programmable logic devices, discrete gates or transistor logic devices, discrete hardware components. The general-purpose processor can be a microprocessor or the processor can also be any conventional processor, etc.

[0138] The steps of any method in the method for automated inspection based on heterogeneous database cluster architecture provided by the embodiment of the present invention can be directly embodied as being executed by a hardware decoding processor, or being executed by a combination of hardware and software units in the decoding processor. The software unit can be located in a mature storage medium in the art such as a random access memory, a flash memory, a read-only memory, a programmable read-only memory, or an electrically erasable programmable memory, a register, etc. The storage medium is located in the memory 802, and the processor 801 reads the information in the memory 802, and completes the steps of the method in combination with its hardware.

[0139] Those skilled in the art will appreciate that although some embodiments described herein include certain features included in other embodiments but not other features, the combination of features from different embodiments is meant to be within the scope of the present invention and to form different embodiments.

[0140] Those skilled in the art will appreciate that the description of each embodiment has its own emphasis, and for parts not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0141] Although the embodiments of the present invention are described in conjunction with the accompanying drawings, those skilled in the art may make various modifications and variations without departing from the spirit and scope of the present invention, and such modifications and variations all fall within the scope defined by the appended claims. The above are only specific embodiments of the present invention, but the protection scope of the present invention is not limited thereto. Any person skilled in the art who is familiar with the technical field can easily think of various equivalent modifications or substitutions within the technical scope disclosed by the present invention, and these modifications or substitutions should be included in the protection scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.

[0142] The above are only specific embodiments of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can easily think of various equivalent modifications or replacements within the technical scope disclosed by the present invention, and these modifications or replacements should be included in the protection scope of the present invention. Therefore, the protection scope of the present invention shall be based on the protection scope of the claims.

Claims

1. An automated inspection method based on a heterogeneous database cluster architecture, characterized in that: include: Generate a collection device and an analysis device; The acquisition device receives the user's operation and sets default parameters; The inspection system obtains the information of the host to be inspected in the asset system and sends the collection device to the host to be inspected; The inspection system starts the collection device, which collects database information, middleware information and the associated configuration between the database and the middleware and returns the database information, middleware information and the associated configuration between the database and the middleware to the inspection system; The inspection system places the database information, middleware information and the associated configuration of the database and the middleware into the same cluster to form database cluster information; The analysis device performs diffusion analysis from the middleware in the database cluster information as the center, and searches for multiple types of databases that have a cluster relationship with the middleware to form multiple types of cross-middleware database clusters; Traverse various types of cross-middleware database clusters to form a heterogeneous database cluster tree topology.

2. According to claim 1, an automated inspection method based on heterogeneous database cluster architecture is characterized in that: The generation and collection device includes: Obtain common database and middleware acquisition programs written by database administrators; The general database and the middleware acquisition program are placed in an independent environment for processing to generate an acquisition device.

3. The method for automated inspection based on heterogeneous database cluster architecture according to claim 1, characterized in that: The generation and analysis device includes: Obtain common database and middleware analysis programs written by database administrators; The general database and middleware analysis program are placed in an independent environment for processing to generate an analysis device.

4. The method for automated inspection based on heterogeneous database cluster architecture according to claim 1, characterized in that: The inspection system starts the collection device, and also includes: Check whether the inspection system has passed customized parameters to the collection device; If the detection result is that the inspection system has not passed customized parameters to the collection device, the collection device is started using the default parameters.

5. The method for automated inspection based on heterogeneous database cluster architecture according to claim 1, characterized in that: The inspection system starts the collection device, and also includes: Check whether the inspection system has passed customized parameters to the collection device; If the detection result is a customized parameter transmitted from the inspection system to the collection device, the collection device is started using the customized parameter.

6. The method for automated inspection based on heterogeneous database cluster architecture according to claim 1, characterized in that: Before the inspection system places the database information, the middleware information and the associated configuration of the database and the middleware into the same cluster to form the database cluster information, it also includes: Classify and filter the collected database information and middleware information.

7. The method for automated inspection based on heterogeneous database cluster architecture according to claim 1, characterized in that: Traverse various types of cross-middleware database clusters to form a heterogeneous database cluster tree topology, including: Determine whether there is a correlation between databases in multiple types of cross-middleware database clusters; If the judgment result is that the databases between clusters are related, a heterogeneous database cluster tree topology is formed.

8. An automated inspection device based on a heterogeneous database cluster architecture, characterized in that: include: Generation module: used to generate collection devices and analysis devices; Receiving module: used for the acquisition device to receive the user's operation and set the default parameters; Acquisition module: used by the inspection system to obtain the information of the host to be inspected in the asset system, and send the collection device to the host to be inspected; Collection module: used for the inspection system to start the collection device, which collects database information, middleware information and the associated configuration between the database and the middleware and returns the database information, middleware information and the associated configuration between the database and the middleware to the inspection system; Placement module: used by the inspection system to place database information, middleware information, and the associated configuration of the database and middleware into the same cluster to form database cluster information; Search module: used for analyzing the diffusion analysis of the middleware in the database cluster information by the analysis device, and searching for multiple types of databases that have a cluster relationship with the middleware to form multiple types of cross-middleware database clusters; Traversal module: used to traverse various types of cross-middleware database clusters to form a heterogeneous database cluster tree topology.

9. An electronic device, characterized in that: include: Processor and memory; The processor is used to execute the automatic inspection method based on a heterogeneous database cluster architecture as described in any one of claims 1 to 7 by calling the program or instruction stored in the memory.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a program or instruction, and the program or instruction enables a computer to execute an automated inspection method based on a heterogeneous database cluster architecture as described in any one of claims 1 to 7.

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