String test device and test sorting machine

Abstract

The present invention relates to a serial testing device and a testing sorting machine, comprising a material feeding position, a plurality of testing stations and a material discharging position; a driving mechanism, a plurality of conveying mechanisms and a light source mechanism, wherein the driving mechanism is used to drive each light source mechanism and each conveying mechanism to synchronously reciprocate along a first direction, so that the serial testing device switches between a first state, a second state and a third state; when in the first state, the material feeding position and each testing station are corresponding to a conveying mechanism, and the conveying mechanism can pick up electronic components tested by the corresponding material feeding position or upstream testing station; when in the second state, the material discharging position and each testing station are corresponding to a conveying mechanism, and the conveying mechanism can place electronic components to the corresponding downstream testing station or material discharging position; when in the third state, each testing station is one-to-one corresponding to a light source mechanism along the second direction, and the light source mechanism is used to excite the electronic components on the testing station, and the light source mechanism can cooperate with the testing station to crimp the electronic components.

Description

Technical Field

[0001] The present invention relates to the technical field of testing and sorting equipment, and in particular to a string testing device and a testing and sorting machine. Background Art

[0002] Before electronic components (such as chips) leave the factory, their performance needs to be tested, and the performance test of electronic components is generally completed on a sorting machine. When testing some electronic components (such as CIS chips), it is necessary to use a variety of different light sources to excite them, thereby enhancing the sensitivity and reliability of detection.

[0003] Due to architectural limitations, the sorting machine in traditional technology can only be equipped with one test station. And the arrangement of one test station can only be applied to the test scenarios of electronic components that only require one light source for excitation, and cannot meet the test requirements of electronic components that require multiple light sources for excitation. Summary of the invention

[0004] Based on this, it is necessary to provide a serial test device and a test sorting machine that can meet the test needs of electronic components that require multiple light sources for light source excitation, in order to address the problem that traditional sorting machines can only be equipped with one test station, resulting in the inability to meet the test needs of electronic components that require multiple light sources for light source excitation.

[0005] A string testing device, comprising:

[0006] Feeding position, multiple testing stations and discharging position are arranged from upstream to downstream;

[0007] A driving mechanism, a plurality of conveying mechanisms and a plurality of different light source mechanisms, wherein the light source mechanisms and the conveying mechanisms are connected to the driving mechanism, and the driving mechanism is used to drive each of the light source mechanisms and each of the conveying mechanisms to synchronously reciprocate along a first direction, so that the string measurement device switches between a first state, a second state and a third state;

[0008] When the string testing device is in the first state, the feeding position and each of the test stations correspond to the conveying mechanism, and the conveying mechanism can pick up the electronic components that have been tested at the corresponding feeding position or the upstream test station; when the string testing device is in the second state, the discharging position and each of the test stations correspond to the conveying mechanism, and the conveying mechanism can place the electronic components to the corresponding downstream test station or the discharging position; when the string testing device is in the third state, each of the test stations corresponds to the light source mechanism along the second direction, and the light source mechanism is used to excite the electronic components on the test station, and the light source mechanism can generate relative movement with the corresponding test station along the second direction to crimp the electronic components on the test station along the second direction; the first direction intersects with the second direction.

[0009] In one of the embodiments, the test station has a test slot for placing electronic components;

[0010] The light source mechanism comprises a light plate, the light plate comprises a plate body and a pressing block protruding on a surface of one end of the plate body along the second direction, and a light-transmitting hole penetrating the plate body and the pressing block along the second direction is formed on the light plate;

[0011] The plate body is in contact with the surface of the test station facing the plate body along the second direction, and the pressing block can be inserted into the test slot to press the electronic components.

[0012] In one embodiment, the driving mechanism is also used to drive each of the light source mechanisms and each of the conveying mechanisms to move synchronously along the second direction, so that the conveying mechanism approaches or moves away from the corresponding feeding position, the testing station or the discharging position along the second direction, and the light source mechanism approaches the testing station to perform crimping test on electronic components or moves away from the corresponding testing station along the second direction.

[0013] In one embodiment, the test station includes a test module and a floating module connected;

[0014] When the light source mechanism and the test station perform a crimping test on electronic components along the second direction, the test module can adjust the distance relative to the light source mechanism under the action of the floating module, so that the test module and the light source mechanism are tightly crimped.

[0015] In one embodiment, the test module includes a test socket and a test board, the test board is connected to the floating module, the test socket is installed on the test board, the test socket is used to place electronic components, and the test board is electrically connected to the electronic components through probes on the test socket.

[0016] In one embodiment, the floating module includes a first floating module and a second floating module, the second floating module is connected to the first floating module, and the test module is connected to the second floating module;

[0017] The first floating module enables the second floating module and the test module to float relative to the light source mechanism along the second direction and to twist relative to a plane perpendicular to the second direction, and the second floating module enables the test module to float relative to the light source mechanism along the first direction and a third direction and to rotate along a direction surrounding the second direction;

[0018] The first direction, the second direction and the third direction intersect each other.

[0019] In one embodiment, the light source mechanism includes a natural light mechanism, a reflection card mechanism and a light tube mechanism, each of the light source mechanisms includes a light plate installed on the driving mechanism, and the light plate is provided with a light-transmitting hole along the second direction; the light plate cooperates with the test station to crimp the electronic components;

[0020] The light-transmitting hole of the natural light mechanism is used to guide natural light to the electronic components on the test station; the reflection card of the reflection card mechanism is installed on the light board and covers the light-transmitting hole, and the reflection card is used to reflect the light from the electronic components of the test station; the light tube of the light tube mechanism is installed at the light-transmitting hole of the light board, and the light-transmitting hole can guide the non-natural light generated by the light tube to the electronic components on the test station.

[0021] In one embodiment, a avoidance position is formed between the feeding position and the testing station, between every two adjacent testing stations, and between the testing station and the discharging position;

[0022] When the string measurement device is in the first state, the light source mechanism is opposite to the avoidance positions formed between the feeding position and the testing station, and the avoidance positions formed between the testing stations in the second direction; when the string measurement device is in the second state, the light source mechanism is opposite to the avoidance positions formed between the discharging position and the testing station, and the avoidance positions formed between the testing stations in the second direction; when the string measurement device is in the third state, the conveying mechanism is opposite to each of the avoidance positions in the second direction.

[0023] A testing and sorting machine comprises a feeding device, a transfer shuttle, a feeding manipulator, a feeding shuttle, a discharging shuttle, a discharging manipulator, a visual device, a receiving device and the above-mentioned string testing device;

[0024] The transfer shuttle is used to receive the electronic components provided by the feeding device and transfer them to the feeding robot. The feeding robot is used to pick up the electronic components on the transfer shuttle and transfer them to the feeding shuttle. The feeding shuttle drives the electronic components to the feeding position. The discharging shuttle is used to receive the electronic components detected by the string measuring device at the discharging position and transfer them to the discharging robot. The discharging robot is used to pick up the electronic components on the discharging shuttle and transfer them to the visual device. The visual device performs optical detection on the four side surfaces and the bottom surface of the electronic components. The discharging robot is also used to transport the electronic components detected by the visual device to the receiving device for collection.

[0025] In one of the embodiments, the test sorting machine further comprises a rack;

[0026] In the first direction, the feeding device, the transfer shuttle, the feeding manipulator, and the feeding shuttle are arranged at one end of the frame, the discharging shuttle, the discharging manipulator, the visual device, and the receiving device are arranged at the other end of the frame, and the string measuring device is located in the middle of the frame in the first direction;

[0027] In the third direction, the string measuring device is arranged at one end of the frame, the feeding device is arranged away from the string measuring device relative to the feeding robot, and the receiving device is arranged away from the string measuring device relative to the discharging robot;

[0028] Among them, the feeding device is a turntable feeding device, which feeds the material to the turntable for detection through a vibration plate, and feeds the material to the transfer shuttle through the turntable; the receiving device is also used to detect the top surface of the electronic components, and tape the qualified electronic components; the first direction, the second direction and the third direction intersect.

[0029] The above-mentioned serial test device and test sorting machine, when the driving mechanism drives each light source mechanism and each conveying mechanism to reciprocate along the first direction, the serial test device can switch between the first state, the second state and the third state. When the serial test device is in the first state, the conveying mechanism can pick up the electronic components that have been fed into the material feeding position and tested at each test station. When the serial test device is in the second state, the conveying mechanism can place the electronic components picked up by the material feeding position at the downstream test station and place the electronic components that have been tested by the upstream test station at the downstream test station for testing and the material discharging position for discharging. When the serial test device is in the third state, the light source mechanism can correspond to the test station one by one, and while exciting the electronic components of the corresponding test station with the light source, it also cooperates with the test station to crimp the electronic components along the second direction to test them. By cyclically switching the serial test device between the first state, the second state and the third state, the serial test device can cycle between material collection-discharging-testing, thereby realizing the serial testing of electronic components between multiple test stations, and can adapt to the testing requirements of electronic components that require multiple light sources for excitation. At the same time, each light source mechanism and each transport mechanism can move synchronously, thus realizing parallel (synchronous) transport and parallel (synchronous) testing of multiple test stations, thereby improving test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] Figure 1 A structural diagram of a string test device provided in an embodiment of the present application when in a first state;

[0031] Figure 2 for Figure 1 The structural diagram of the string test device shown in is in the second state;

[0032] Figure 3 for Figure 1 The structural diagram of the string test device shown in is in the third state;

[0033] Figure 4 For Figure 1 A structural diagram of a test station of a string test device shown in ;

[0034] Figure 5 for Figure 4 Another structural diagram of the test station shown in;

[0035] Figure 6 for Figure 4 A schematic cross-sectional view of a second floating module of the test station shown in ;

[0036] Figure 7 for Figure 3 A structural diagram of another perspective of the string measurement device shown in ;

[0037] Figure 8 for Figure 7An enlarged view of the string measuring device at D shown in FIG.

[0038] Fig. 9 for Figure 3 A structural diagram of the string measurement device from another perspective shown in ;

[0039] Fig.10 A structural diagram of a test sorting machine provided in one embodiment of the present application;

[0040] Fig.11 for Fig.10 A top view of the test handler shown in FIG.

[0041] Description of reference numerals:

[0042] 1000, test sorting machine; 100, string test device; 10, test station; 11, floating module; 111, first floating module; 112, second floating module; 1121, first floating block; 11211, body; 11212, lug; 1122, second floating block; 11221, accommodating cavity; 11222, limiting groove; 1123, ball bearing; 1124, elastic member; 1125, reset block; 11251, matching groove; 11252, inclined surface; 1126, reset bead; 12, test module; 121, test seat; 1211, test slot; 122, test board; 20, driving mechanism; 30, transport mechanism; 31, nozzle module; 40, light source mechanism; 41, light board; 411, board body; 412, pressing block; 413, light transmission hole; 42. Reflection card; 43. Light tube; 40a. Natural light mechanism; 40b. Reflection card mechanism; 40c. Light tube mechanism; 50. Mounting plate; 200. Feeding device; 300. Transfer shuttle; 400. Feeding manipulator; 500. Feeding shuttle; 600. Discharging shuttle; 700. Discharging manipulator; 800. Visual device; 900. Receiving device; 1100. Frame; A. Feeding position; B. Discharging position; C. Avoiding position. DETAILED DESCRIPTION

[0043] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and easy to understand, the specific embodiments of the present invention are described in detail below in conjunction with the accompanying drawings. In the following description, many specific details are set forth to facilitate a full understanding of the present invention. However, the present invention can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without violating the connotation of the present invention, so the present invention is not limited by the specific embodiments disclosed below.

[0044] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as limiting the present invention.

[0045] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In the description of the present invention, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0046] In the present invention, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0047] In the present invention, unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may mean that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Moreover, a first feature being "above", "above" or "above" a second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. A first feature being "below", "below" or "below" a second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0048] It should be noted that when an element is referred to as being "fixed to" or "disposed on" another element, it may be directly on the other element or there may be a central element. When an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be a central element at the same time. The terms "vertical", "horizontal", "upper", "lower", "left", "right" and similar expressions used herein are for illustrative purposes only and are not intended to be the only implementation method.

[0049] See also Figure 1 , an embodiment of the present application provides a serial testing device 100, which has a feed position A, a plurality of test stations 10 and a discharge position B, and the feed position A, the plurality of test stations 10 and the discharge position B are arranged sequentially from upstream to downstream. That is, on the conveying path of the electronic components, the feed position A, the plurality of test stations 10 and the discharge position B are arranged sequentially. Specifically, the feed position A, the plurality of test stations 10 and the discharge position B are arranged sequentially along the first direction. Figure 1 The X direction is the first direction.

[0050] The string measurement device 100 includes a driving mechanism 20, a plurality of conveying mechanisms 30, and a plurality of different light source mechanisms 40. The light source mechanism 40 and the conveying mechanism 30 are both connected to the driving mechanism 20. Optionally, the string measurement device 100 includes a mounting plate 50, which is connected to the driving mechanism 20. Each light source mechanism 40 and the conveying mechanism 30 is mounted on the mounting plate 50 to be connected to the driving mechanism 20 through the mounting plate 50. Of course, in some other embodiments, the string measurement device 100 may also omit the mounting plate 50, and the light source mechanism 40 and the conveying mechanism 30 are directly connected to the driving mechanism 20, which is not limited here.

[0051] The driving mechanism 20 is used to drive each light source mechanism 40 and each conveying mechanism 30 to synchronously reciprocate along the first direction, so that the string measurement device 100 switches between the first state, the second state and the third state. That is, all conveying mechanisms 30 and all light source mechanisms 40 are connected to the same driving mechanism 20, and the same driving mechanism 20 drives all light source mechanisms 40 and all conveying mechanisms 30 to reciprocate along the first direction, so that the string measurement device 100 switches between the first state, the second state and the third state. That is, when the driving mechanism 20 drives the conveying mechanism 30 and the light source mechanism 40 to reciprocate along the first direction, the conveying mechanism 30 and the light source mechanism 40 can stay at a plurality of preset positions. When staying at a plurality of different preset positions, the corresponding states of the string measurement device 100 are different, thereby realizing the switching of the string measurement device 100 between the first state, the second state and the third state.

[0052] Optionally, the first direction is a straight line direction, and the driving mechanism 20 drives each light source mechanism 40 and each conveying mechanism 30 to reciprocate in a straight line along the first direction, so that the string measurement device 100 switches between the first state, the second state and the third state. It can be understood that in some other embodiments, the first direction can also be a curved direction, and the driving mechanism 20 drives each light source mechanism 40 and each conveying mechanism 30 to reciprocate in a curved line along the first direction.

[0053] Continue reading Figure 1 When the serial testing device 100 is in the first state, the feeding position A and each test station 10 correspond to a handling mechanism 30, and the handling mechanism 30 can pick up the electronic components tested at the corresponding feeding position A or the upstream test station 10. That is, when the serial testing device 100 is in the first state, the feeding position A and each test station 10 correspond to a handling mechanism 30, and the handling mechanism 30 corresponding to the feeding position A can pick up the electronic components of the feeding position A, and the handling mechanism 30 corresponding to each test station 10 can pick up the electronic components tested at the test station 10.

[0054] See also Figure 2 , when the serial testing device 100 is in the second state, the discharge position B and each test station 10 correspond to a transport mechanism 30, and the transport mechanism 30 can place electronic components to the corresponding downstream test station 10 or discharge position B. That is, when the serial testing device 100 is in the second state, each test station 10 and the discharge position B correspond to a transport mechanism 30, and the transport mechanism 30 corresponding to the test station 10 can place the electronic components picked up from the upstream feed position A or the test station 10 to the test station 10, and the transport mechanism 30 corresponding to the discharge position B can place the electronic components picked up from the upstream test station 10 to the discharge position B. That is, when the serial testing device 100 is in the second state, each transport mechanism 30 can place the electronic components picked up from the upstream station on the downstream station adjacent to the upstream station, so that each electronic component can realize the circulation of one station.

[0055] See also Figure 3, when the string test device 100 is in the third state, each test station 10 has a light source mechanism 40 corresponding to it along the second direction, and the light source mechanism 40 is used to excite the electronic components on the test station 10, and the light source mechanism 40 can generate relative movement with the corresponding test station 10 along the second direction to crimp the electronic components on the test station 10 along the second direction. That is, when the string test device 100 is in the third state, each test station 10 corresponds to a different type of light source mechanism 40, and different types of light source mechanisms 40 excite (stimulate) the electronic components on different test stations 10, and can cooperate with the corresponding test station 10 to crimp the electronic components on the test station 10. Among them, the first direction intersects with the second direction. Specifically, the first direction is perpendicular to the second direction, the second direction is the height direction, and the test station 10 is located below the corresponding light source mechanism 40 in the second direction.

[0056] In some specific embodiments, the electronic components are CIS chips, which are CMOS Image Sensor (CIS) chips, and are integrated circuit chips that convert optical images into electronic signals. Among them, Complementary Metal Oxide Semiconductor (CMOS) is a semiconductor that can record changes in light. It is understandable that in some other embodiments, the electronic components can also be other devices that require light excitation testing, which is not limited here.

[0057] The string test device 100 provided in the embodiment of the present application, when the driving mechanism 20 drives each light source mechanism 40 and each conveying mechanism 30 to reciprocate along the first direction, the string test device 100 can switch between the first state, the second state and the third state. When the string test device 100 is in the first state, the conveying mechanism 30 can pick up the electronic components fed into the material feeding position A and the electronic components tested by each test station 10. When the string test device 100 is in the second state, the conveying mechanism 30 can place the electronic components picked up by the material feeding position A at the downstream test station 10 and place the electronic components tested by the upstream test station 10 at the downstream test station 10 for testing and the material discharging position B. When the string test device 100 is in the third state, the light source mechanism 40 can correspond to the test station 10 one by one, and while performing light source excitation on the electronic components of the corresponding test station 10, it also cooperates with the test station 10 to crimp the electronic components along the second direction to test them. By cyclically switching the serial test device 100 between the first state, the second state and the third state, the serial test device 100 can cycle between material collection-material placement-testing, thereby realizing serial testing of electronic components between multiple test stations 10, and can adapt to the testing requirements of electronic components that require multiple light sources for stimulation. At the same time, each light source mechanism 40 and each transport mechanism 30 can move synchronously, thus realizing parallel (synchronous) transport and parallel (synchronous) testing of multiple test stations 10, and improving the test efficiency.

[0058] It should be noted that serial testing means that the electronic components, under the transporting action of the transport mechanism 30, flow through each test station 10 in sequence from upstream to downstream for testing. It should also be noted that the serial testing device 100 in the present application, each light source mechanism 40 and each transport mechanism 30 are connected to the same driving mechanism 20, and the same driving mechanism 20 drives each light source mechanism 40 and each transport mechanism 30 to reciprocate along the first direction, so that the serial testing device 100 switches between the first state, the second state and the third state, thereby realizing the serial testing of electronic components between multiple test stations 10. It can be seen that the serial testing device 100 in the present application has a simple structure and high integration, which can greatly reduce the size of the equipment.

[0059] In some embodiments, see Figure 1-Figure 3 , an avoidance position C is formed between the feeding position A and the most upstream test station 10, every two adjacent test stations 10, the most downstream test station 10 and the discharge position B. That is, the feeding position A and the most upstream test station 10, every two adjacent test stations 10, the most downstream test station 10 and the discharge position B are arranged at intervals to form an avoidance position C between the corresponding two.

[0060] Continue reading Figure 1When the serial testing device 100 is in the first state, the transport mechanism 30 is opposite to the feeding position A and the testing station 10 in the second direction, and the light source mechanism 40 is opposite to the avoidance position C formed by the feeding position A and the most upstream testing station 10 and the avoidance position C formed between each adjacent testing station 10 in the second direction. Figure 2 When the serial testing device 100 is in the second state, the light source mechanism 40 is opposite to the avoidance position C formed between the material discharge position B and the most downstream testing station 10 and the avoidance position C formed between each adjacent testing station 10 in the second direction. Figure 3 When the string measuring device 100 is in the third state, the transport mechanisms 30 are opposite to each avoidance position C in the second direction. That is, the transport mechanisms 30 and the light source mechanisms 40 are alternately arranged in sequence along the first direction, and there is a light source mechanism 40 between every two adjacent transport mechanisms 30, and the number of transport mechanisms 30 is one more than the number of light source mechanisms 40.

[0061] In the above arrangement, the light source mechanism 40 and the conveying mechanism 30 are compactly arranged on the driving mechanism 20. On the one hand, it can reduce the floor space occupied by the string test device 100. On the other hand, the driving mechanism 20 drives the light source mechanism 40 and the conveying mechanism 30 to run a shorter stroke along the first direction, thereby realizing the switching of the string test device 100 between the first state, the second state and the third state, which can reduce the time consumed by the string test device 100 in switching between various states and further improve the test efficiency.

[0062] In some specific implementations, please refer to Figure 3 , the serial testing device 100 includes 3 test stations 10 and 3 different light source mechanisms 40, and the number of the transport mechanisms 30 is 4. The transport mechanisms 30 and the light source mechanisms 40 are arranged alternately in sequence along the first direction, and a light source mechanism 40 is arranged between every two adjacent transport mechanisms 30. The feeding position A, the 3 test stations 10 and the discharging position B are arranged in sequence along the first direction, and a total of 4 avoidance positions C are formed. When the serial testing device 100 is in the first state, the 3 light source mechanisms 40 are respectively located at the first 3 avoidance positions C ( Figure 1 When the string measuring device 100 is in the second device, the three light source mechanisms 40 are respectively located at the last three avoidance positions C ( Figure 2 When the string testing device 100 is in the third state, the four transport mechanisms 30 are located at the four avoidance positions C, respectively.

[0063] It is conceivable that in other embodiments, there is no limitation on the number of test stations 10, the number of light source mechanisms 40, and the number of transport mechanisms 30 included in the string test device 100. For example, the string test device 100 may include 2 or more than 3 test stations 10, the number of light source mechanisms 40 may be 2 or more than 3, and the number of transport mechanisms 30 may be 3 or more than 4.

[0064] In some embodiments, the driving mechanism 20 is further used to drive each light source mechanism 40 and each conveying mechanism 30 to synchronously reciprocate along the second direction, so that the conveying mechanism 30 moves along the second direction ( Figure 2 In this way, when the serial testing device 100 is in the first state and the second state, the driving mechanism 20 drives each conveying mechanism 30 to move forward in the second direction, so as to pick up the electronic components on the feeding position A and the test station 10, and to place the electronic components on the test station 10 and the discharge position B, so as to facilitate the taking and placing of the electronic components. When the serial testing device 100 is in the third state, the driving mechanism 20 drives each light source mechanism 40 to move forward in the second direction, so as to enable the light source mechanism 40 to cooperate with the corresponding test station 10, and to perform pressure testing on the electronic components on the test station 10, so as to facilitate the testing of the electronic components.

[0065] It should be noted here that the driving mechanism 20 can also drive the conveying mechanism 30 and the light source mechanism 40 to move in the opposite direction along the second direction so that the conveying mechanism 30 and the light source mechanism 40 are reset, so as to avoid the test station 10 interfering with the movement of the light source mechanism 40 and the conveying mechanism 30 along the first direction when the string test device 100 switches between various states.

[0066] It is conceivable that in some other embodiments, the relative movement between the transport mechanism 30 and the test station 10 and between the light source mechanism 40 and the test station 10 in the second direction can be achieved by other means, such as setting the transport mechanism 30 and the light source mechanism 40 stationary and driving the test station 10 to move along the second direction.

[0067] In some embodiments, see Figure 4 and Figure 5The test station 10 includes a test module 12 and a floating module 11 connected to each other. When the light source mechanism 40 and the test station 10 perform a crimping test on the electronic components along the second direction, the test module 12 can adjust the distance relative to the light source mechanism 40 under the action of the floating module 11, so that the test module 12 and the light source mechanism 40 are tightly crimped. That is, when the light source mechanism 40 and the test station 10 cooperate to perform a crimping test on the electronic components, the test module 12 adjusts the distance between the light source mechanism 40 under the floating action of the floating module 11, so that the test module 12 and the light source mechanism 40 are tightly fitted, thereby ensuring the crimping effect on the electronic components and reducing the occurrence of problems such as poor crimping and crushing of electronic components. Since the floating module 11 is arranged on the test station 10, the floating module 11 does not need to be integrated on the light source mechanism 40, and there is sufficient light source installation space, and the height and volume of the light source are less restricted, and the volume of the light source can be made larger and the height along the second direction can be made higher.

[0068] Further, the floating module 11 includes a first floating module 111 and a second floating module 112, the second floating module 112 is connected to the first floating module 111, and the test module 12 is connected to the second floating module 112. The first floating module 111 can make the second floating module 112 and the test module 12 float relative to the light source mechanism 40 along the second direction and twist relative to a plane perpendicular to the second direction, and the second floating module 112 can make the test module 12 float relative to the light source mechanism 40 along the first direction and the third direction and rotate along the circumferential direction around the second direction. Among them, the first direction, the second direction and the third direction intersect each other. Specifically, the first direction, the second direction and the third direction are perpendicular to each other. Figure 2 The Y direction is the third direction.

[0069] With the above arrangement, when the light source mechanism 40 cooperates with the test module 12 to perform a crimping test on electronic components, the test module 12 floats along the first direction, the second direction and the third direction relative to the light source mechanism 40 under the cooperation of the first floating module 111 and the second floating module 112, and can also be twisted relative to a plane perpendicular to the second direction and rotated along a circumferential direction around the second direction, thereby ensuring the fitting effect between the light source mechanism 40 and the test module 12, and further ensuring the crimping test effect on the electronic components.

[0070] In some specific embodiments, the first floating module 111 is a diaphragm cylinder, and the pressure of the diaphragm cylinder can be controlled by controlling the air pressure to ensure that the crimping force of the electronic components is controllable. At the same time, the diaphragm cylinder also has the function of floating along the second direction, thereby realizing floating crimping between the test module 12 and the light source mechanism 40, reducing the occurrence of problems such as poor crimping and damage to electronic components.

[0071] Of course, in some other implementations, the first floating module 111 may also be arranged in other ways, which are not limited here.

[0072] In the present application, there is no limitation on the specific configuration of the second floating module 112 , as long as the test module 12 can float along the first direction and the third direction and rotate along the circumferential direction around the second direction.

[0073] In some embodiments, see Figure 6 The second floating module 112 includes a first floating block 1121 and a second floating block 1122 connected to each other. The first floating block 1121 is connected to the first floating module 111, and the second floating block 1122 is movably connected to the first floating block 1121. The second floating block 1122 can float relative to the first floating block 1121 along the first direction and the third direction and rotate relative to the first floating block 1121 along the circling direction around the second direction. It should be noted that, whether the second floating block 1122 floats relative to the first floating block 1121 in the first direction and the third direction or the second floating block 1122 rotates relative to the first floating block 1121 in the circling direction around the second direction, the relative movement distance or angle between the second floating block 1122 and the first floating block 1121 is not large, and both are within a relatively small range of movement.

[0074] Furthermore, a ball 1123 is provided between the first floating block 1121 and the second floating block 1122, so that the sliding friction between the two is converted into rolling friction, so that the second floating block 1122 can float relative to the first floating block 1121 along the first direction and the third direction, and can rotate relative to the first floating block 1121 along the circumferential direction around the second direction. Optionally, the first floating block 1121 includes a body 11211 and a lug 11212, the lug 11212 is connected to the body 11211, the second floating block 1122 has a receiving cavity 11221, the side wall of the receiving cavity 11221 is provided with a limiting groove 11222, a part of the body 11211 is received in the receiving cavity 11221, and the lug 11212 is received and limited in the limiting groove 11222. In the second direction, there are balls 1123 between the upper and lower end surfaces of the lug 11212 and the groove wall of the limiting groove 11222. In this way, under the joint action of the upper and lower layers of balls 1123, the friction between the first floating block 1121 and the second floating block 1122 can be further reduced, making it easier for the first floating block 1121 and the second floating block 1122 to float.

[0075] Furthermore, the second floating module 112 also includes a reset assembly disposed in the accommodating chamber 11221, and the reset assembly includes an elastic member 1124, a reset block 1125, and a reset bead 1126. The reset bead 1126 is connected to the body 11211, and the elastic member 1124 is disposed between the reset block 1125 and the second floating block 1122 along the second direction. A matching groove 11251 is provided on the reset block 1125, and the reset bead 1126 at least partially extends into the matching groove 11251, and the matching groove 11251 has an inclined surface 11252 that matches the reset bead 1126. When the second floating block 1122 is acted upon by an external force, the second floating block 1122 floats relative to the first floating block 1121 in the first direction and the third direction and rotates in the circumferential direction around the second direction, and the reset bead 1126 acts on the reset block 1125 through the inclined surface 11252 in the matching groove 11251, and the reset block 1125 moves in the second direction to compress the elastic member 1124, and the elastic member 1124 stores energy. When the second floating block 1122 is no longer acted upon by an external force, the elastic member 1124 resets the reset block 1125, and at this time, the reset bead 1126 and the first floating block 1121 are reset relative to the second floating block 1122 together.

[0076] In some embodiments, the test module 12 includes a test socket 121 and a test board 122. The test board 122 is connected to the second floating module 112. The test socket 121 is mounted on the test board 122. The test socket 121 is used to place electronic components. The test board 122 is electrically connected to the electronic components through the probes on the test socket 121. In this way, when the light source mechanism 40 is crimped to the electronic components, the electronic components are electrically connected to the probes on the test socket 121, and the signals are transmitted to the test board 122 through the probes. The test board 122 transmits the signals to realize the testing of the electronic components.

[0077] Further reading Figure 5 The test board 122 has a test slot 1211 for placing electronic components. Figure 7 and Figure 8The light source mechanism 40 includes a light board 41, which includes a board body 411 and a pressing block 412 protruding from one end surface of the board body 411 along the second direction. A light-transmitting hole 413 is formed on the light board 41 and passes through the board body 411 and the pressing block 412 along the second direction. The board body 411 is attached to the surface of the test station 10 facing it along the second direction, and the pressing block 412 can be inserted into the test slot 1211 to press the electronic components. With such arrangement, the pressing block 412 can be inserted into the test slot 1211 to crimp the electronic components. On the one hand, the crimping effect on the electronic components can be ensured. On the other hand, the insertion of the pressing block 412 into the test slot 1211 also plays a role in positioning the light board 41 and the test board 122. On still another hand, since the light-transmitting hole 413 runs through the board body 411 and the pressing block 412, when the pressing block 412 is inserted into the test slot 1211 to crimp the periphery of the electronic components, light can pass through the light-transmitting hole 413 to shine on the center position of the electronic components to excite the electronic components with a light source.

[0078] Furthermore, the test board 122 has a plurality of test slots 1211, the number of the pressing blocks 412 included in the optical board 41 is equal to the number of the test slots 1211 and corresponds one to one, and an electronic component is placed in each test slot 1211. In this way, each test station 10 can test multiple electronic components at the same time. Figure 8 Specifically, each transport mechanism 30 includes a nozzle module 31, and the number of the nozzle modules 31 included in each transport mechanism 30 is equal to the number of the test slots 1211 and corresponds one to one, so that the transport mechanism 30 can fill the test slots 1211 of the test station 10 at one time and remove all the electronic components on the test station 10 at one time, thereby improving the test efficiency.

[0079] Specifically, each test board 122 is provided with 8 test slots 1211, and the 8 test slots 1211 are arranged in an array. At this time, each optical board 41 includes 8 pressing blocks 412, and each transport mechanism 30 includes 8 suction nozzle modules 31. The positions of the pressing blocks 412 and the suction nozzle modules 31 correspond to the positions of the test slots 1211.

[0080] It is conceivable that in some other embodiments, there is no limitation on the number of test slots 1211 of the test board 122. For example, the test board 122 can be provided with 1, 2, 3, 4, 5, 6, 7 or more than 8 test slots 1211. In this case, the number of the pressing blocks 412 and the suction nozzle modules 31 are provided corresponding to the test slots 1211.

[0081] Optionally, continue to Figure 3 The light source mechanism 40 includes a natural light mechanism 40a, a reflection card mechanism 40b and a light tube mechanism 40c. Fig. 9The light board 41 of each light source mechanism 40 is connected to the driving mechanism 20, and the light holes 413 of the natural light mechanism 40a are used to guide natural light to the electronic components on the test station 10. The reflection card 42 of the reflection card mechanism 40b is installed on the light board 41 and covers the light holes 413. The reflection card 42 is used to reflect the light from the electronic components of the test station 10. The light tube 43 of the light tube mechanism 40c is installed at the light holes 413 of the light board 41. The light holes 413 can guide the non-natural light generated by the light tube 43 to the electronic components on the test station 10.

[0082] With the above arrangement, the natural light mechanism 40a, the reflection card mechanism 40b and the light tube mechanism 40c can respectively perform natural light excitation, dark box excitation and non-natural light excitation on the electronic components on different test stations 10, thereby meeting the test requirements of electronic components that require multiple light sources for excitation.

[0083] It should be noted that the selection of each light source mechanism 40 is determined according to the needs. At the same time, there can be multiple types of light tube mechanisms 40c, which can respectively emit different types of unnatural light.

[0084] See also Fig.10 and Fig.11 Another embodiment of the present application further provides a test sorting machine 1000, including a feeding device 200, a transfer shuttle 300, an infeed robot 400, an infeed shuttle 500, a discharging shuttle 600, a discharging robot 700, a visual device 800, a material receiving device 900 and the above-mentioned string test device 100.

[0085] The transfer shuttle 300 is used to receive the electronic components provided by the feeding device 200 and transfer them to the feeding robot 400. The feeding robot 400 is used to pick up the electronic components on the transfer shuttle 300 and transfer them to the feeding shuttle 500. The feeding shuttle 500 drives the electronic components to move to the feeding position A. The discharging shuttle 600 is used to receive the electronic components detected by the string detection device 100 at the discharging position B and transfer them to the discharging robot 700. The discharging robot 700 is used to pick up the electronic components on the discharging shuttle 600 and transfer them to the visual device 800. The visual device 800 performs optical inspection on the four side surfaces and the bottom surface of the electronic components. The discharging robot 700 is also used to transport the electronic components detected by the visual device 800 to the receiving device 900 for receiving.

[0086] The test sorting machine 1000 includes a serial test device 100, which can cycle between material collection-discharging-testing, thereby realizing serial testing of electronic components between multiple test stations 10, and can adapt to the testing requirements of electronic components that require multiple light sources for stimulation. At the same time, multiple test stations 10 can perform tests on different electronic components simultaneously, which improves the test efficiency. In addition, the electronic components flow in sequence between the various structures, with a high degree of automation, which further improves the test efficiency.

[0087] Furthermore, the test sorting machine 1000 further includes a frame 1100. In the first direction, the feeding device 200, the transfer shuttle 300, the feeding manipulator 400, and the feeding shuttle 500 are arranged at one end of the frame 1100, the discharging shuttle 600, the discharging manipulator 700, the visual device 800, and the receiving device 900 are arranged at the other end of the frame 1100, and the string measuring device 100 is located in the middle of the frame 1100 in the first direction. In the third direction, the string measuring device 100 is arranged at one end of the frame 1100, the feeding device 200 is arranged away from the string measuring device 100 relative to the feeding manipulator 400, and the receiving device 900 is arranged away from the string measuring device 100 relative to the discharging manipulator 700.

[0088] In the above arrangement, the electronic components flow from a position far from the string test device 100 to the string test device 100 in the third direction, and at the same time, the electronic components flow from the first direction and the third direction to the string test device 100 at the middle position, and then flow from the string test device 100 at the middle position to the other end of the first direction, and flow from the string test device 100 to a position far from the string test device 100 in the third direction, which is equivalent to the electronic components realizing a circular or semi-circular progressive flow. According to this flow method, the operations of the various structures of the test sorting machine 1000 will not interfere with each other. At the same time, the circular progressive flow method can reduce the length of the entire test sorting machine 1000 along the first direction or the third direction, and reduce the floor space.

[0089] In some embodiments, the feeding device 200 is a turntable feeding device 200, which can complete the automatic feeding, inspection, identification and position correction of bulk materials. The bulk materials are fed to the turntable for inspection through a vibrating disk, and then the turntable feeds the materials to the transfer shuttle 300. The transfer shuttle 300 can be set up in a double shuttle manner, so that when one of the transfer shuttles 300 transports the electronic components to the feeding robot 400, the other transfer shuttle 300 can move to the feeding device 200 through the feeding robot 400 to receive the materials. The alternating operation of the two transfer shuttles 300 can realize uninterrupted feeding, efficiently connect the feeding device 200 and the feeding robot 400, and improve work efficiency.

[0090] Optionally, both the feeding robot 400 and the discharging robot 700 adopt a gantry-type dual-drive synchronous belt structure, which is efficient and stable. The receiving device 900 is also used to detect the top surface of the electronic components and to tape the qualified electronic components.

[0091] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0092] The above-mentioned embodiments only express several implementation methods of the present invention, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the invention patent. It should be pointed out that, for ordinary technicians in this field, several variations and improvements can be made without departing from the concept of the present invention, and these all belong to the protection scope of the present invention. Therefore, the protection scope of the patent of the present invention shall be subject to the attached claims.

Claims

1. A string test device, characterized in that: include: A material inlet (A), a plurality of test stations (10) and a material outlet (B) are arranged in sequence from upstream to downstream; A driving mechanism (20), a plurality of transport mechanisms (30) and a plurality of different light source mechanisms (40), wherein the light source mechanisms (40) and the transport mechanisms (30) are connected to the driving mechanism (20), and the driving mechanism (20) is used to drive each of the light source mechanisms (40) and each of the transport mechanisms (30) to synchronously reciprocate along a first direction, so that the string measurement device switches between a first state, a second state and a third state; An avoidance position (C) is formed between the material feeding position (A) and the test station (10), between each two adjacent test stations (10), between the test station (10) and the material discharging position (B); When the serial testing device is in the first state, the feeding position (A) and each of the test stations (10) correspond to the transport mechanism (30), and the transport mechanism (30) can pick up the electronic components that have been tested at the corresponding feeding position (A) or the upstream test station (10), and the light source mechanism (40) is opposite to the avoidance position (C) formed by the feeding position (A) and the test station (10) and the avoidance position (C) formed between the test stations (10) in the second direction; when the serial testing device is in the second state, the discharging position (B) and each of the test stations (10) correspond to the transport mechanism (30), and the transport mechanism (30) can place the electronic components to the corresponding downstream test station (10) or the discharging position (B), and the light source mechanism (40) is opposite to the avoidance position (C) formed by the feeding position (A) and the test station (10) and the avoidance position (C) formed between the test stations (10). The mechanism (40) is opposite to the avoidance position (C) formed between the material discharge position (B) and the test station (10), and the avoidance position (C) formed between the test stations (10) in the second direction; when the serial test device is in the third state, each of the test stations (10) has a corresponding light source mechanism (40) in the second direction, the light source mechanism (40) is used to excite the electronic components on the test station (10), and the light source mechanism (40) can generate relative movement with the corresponding test station (10) in the second direction to crimp the electronic components on the test station (10) in the second direction; the transport mechanism (30) is opposite to each of the avoidance positions (C) in the second direction; the first direction intersects with the second direction.

2. The string measurement device according to claim 1, characterized in that: The test station (10) is provided with a test slot (1211) for placing electronic components; The light source mechanism (40) comprises a light plate (41), the light plate (41) comprising a plate body (411) and a pressing block (412) protruding along the second direction on a surface of one end of the plate body (411), the light plate (41) having a light-transmitting hole (413) formed on the light plate (41) and penetrating the plate body (411) and the pressing block (412) along the second direction; The plate body (411) is fitted with a surface of the test station (10) facing the test station (10) along the second direction, and the pressing block (412) can be inserted into the test slot (1211) to press-connect electronic components.

3. The string measurement device according to claim 1, characterized in that: The driving mechanism (20) is further used to drive each of the light source mechanisms (40) and each of the transport mechanisms (30) to move synchronously along the second direction, so that the transport mechanisms (30) approach or move away from the corresponding material input position (A), the test station (10) or the material output position (B) along the second direction, and so that the light source mechanism (40) approaches the test station (10) along the second direction to perform a crimping test on the electronic components or moves away from the corresponding test station (10).

4. The string measurement device according to any one of claims 1 to 3, characterized in that: The test station (10) comprises a test module (12) and a floating module (11) connected to each other; When the light source mechanism (40) and the test station (10) perform a crimping test on electronic components along the second direction, the test module (12) can adjust the distance relative to the light source mechanism (40) under the action of the floating module (11), so that the test module (12) and the light source mechanism (40) are tightly crimped.

5. The string measurement device according to claim 4, characterized in that: The test module (12) comprises a test seat (121) and a test board (122); the test board (122) is connected to the floating module (11); the test seat (121) is mounted on the test board (122); the test seat (121) is used to place electronic components; and the test board (122) is electrically connected to the electronic components via probes on the test seat (121).

6. The string measurement device according to claim 4, characterized in that: The floating module (11) comprises a first floating module (111) and a second floating module (112), the second floating module (112) being connected to the first floating module (111), and the testing module (12) being connected to the second floating module (112); The first floating module (111) is capable of causing the second floating module (112) and the test module (12) to float relative to the light source mechanism (40) along the second direction and to twist relative to a plane perpendicular to the second direction, and the second floating module (112) is capable of causing the test module (12) to float relative to the light source mechanism (40) along the first direction and a third direction and to rotate along a circumferential direction around the second direction; The first direction, the second direction and the third direction intersect each other.

7. The string measurement device according to claim 1, characterized in that: The light source mechanism (40) comprises a natural light mechanism (40a), a reflection card mechanism (40b) and a light tube mechanism (40c); each of the light source mechanisms (40) comprises a light board (41) mounted on the driving mechanism (20); the light board (41) is provided with a light-transmitting hole (413) extending through it along the second direction; the light board (41) cooperates with the test station (10) to crimp electronic components; The light-transmitting hole (413) of the natural light mechanism (40a) is used to guide natural light to the electronic components on the test station (10); the reflection card (42) of the reflection card mechanism (40b) is installed on the light board (41) and covers the light-transmitting hole (413), and the reflection card (42) is used to reflect light from the electronic components of the test station (10); the light tube (43) of the light tube mechanism (40c) is installed at the light-transmitting hole (413) of the light board (41), and the light-transmitting hole (413) can guide non-natural light generated by the light tube (43) to the electronic components on the test station (10).

8. A test sorting machine, characterized in that: It comprises a feeding device (200), a transfer shuttle (300), an infeed robot (400), an infeed shuttle (500), an outfeed shuttle (600), an outfeed robot (700), a visual device (800), a receiving device (900), and a string detection device as claimed in any one of claims 1 to 7; The transfer shuttle (300) is used to receive the electronic components provided by the feeding device (200) and transfer them to the feeding robot (400). The feeding robot (400) is used to pick up the electronic components on the transfer shuttle (300) and transfer them to the feeding shuttle (500). The feeding shuttle (500) drives the electronic components to move to the feeding position (A). The discharging shuttle (600) is used to receive the electronic components at the discharging position (B) after being passed through the string measuring device. The electronic components are inspected and transferred to the discharging robot (700). The discharging robot (700) is used to pick up the electronic components on the discharging shuttle (600) and transfer them to the visual device (800). The visual device (800) performs optical inspection on the four side surfaces and the bottom surface of the electronic components. The discharging robot (700) is also used to move the electronic components inspected by the visual device (800) to the receiving device (900) for receiving.

9. The test sorting machine according to claim 8, characterized in that: The test sorting machine also includes a rack (1100); In the first direction, the feeding device (200), the transfer shuttle (300), the feeding robot (400), and the feeding shuttle (500) are arranged at one end of the frame (1100), the discharging shuttle (600), the discharging robot (700), the visual device (800), and the receiving device (900) are arranged at the other end of the frame (1100), and the string measuring device is located in the middle of the frame (1100) in the first direction; In the third direction, the string measuring device is arranged at one end of the frame (1100), the feeding device (200) is arranged away from the string measuring device relative to the feeding robot (400), and the receiving device (900) is arranged away from the string measuring device relative to the discharging robot (700); The feeding device (200) is a turntable feeding device, which feeds materials to the turntable for detection via a vibrating plate, and feeds materials to the transfer shuttle (300) via the turntable; the receiving device (900) is also used to detect the top surface of the electronic components, and to tape the electronic components that pass the detection; the first direction, the second direction and the third direction intersect.

Images