Coating thickness nondestructive measurement method, equipment, medium and product

Abstract

The invention discloses a coating thickness nondestructive measurement method and device, a medium and a product, and relates to the field of coating thickness measurement, and the method comprises the steps: obtaining a phosphorescent light beam; the phosphorescent light beam is a light beam obtained by irradiating an excitation light beam emitted by an excitation light source to the surface of the coating to be detected; the to-be-detected coating contains a phosphorescent substance, and the phosphorescent substance is excited to radiate a phosphorescent light beam; filtering the phosphorescent light beam through an optical filter to obtain a phosphorescent light beam with a single wavelength; carrying out photoelectric data processing on the phosphorescent light beam with the single wavelength to obtain phosphorescent light intensity with the single wavelength; and determining the thickness of the to-be-measured coating according to the corresponding relationship between the phosphorescent light intensity of the single wavelength and the thickness of the to-be-measured coating. According to the method, the coating to be measured has the characteristic of excited radiation phosphorescence by doping the phosphorescent substance in the coating to be measured, and the thickness of the coating to be measured is determined according to the relationship between the light intensity and the thickness of the phosphorescent light beam emitted by the excited radiation of the coating to be measured, so that the non-contact lossless online measurement of the thickness of the coating is realized.

Description

Technical Field

[0001] The present invention relates to the field of coating thickness measurement, and in particular to a coating thickness non-destructive measurement method, equipment, medium and product. Background Art

[0002] With the development of aerospace technology, the temperature before the turbine of an aircraft engine has gradually increased, exceeding the maximum temperature tolerance of high-temperature alloy materials. At present, the means to solve the high temperature problem of turbine blades mainly include the research and development of materials with higher temperature resistance, the development of advanced cooling technology and the use of thermal barrier coatings. Among them, thermal barrier coating technology has low cost and is an effective means to increase the temperature tolerance of engine blades.

[0003] Thermal barrier coatings consist of a ceramic layer and a bonding layer, and are usually applied to the surface of the turbine blade alloy substrate to ensure that the turbine blades work stably in high-temperature environments. Due to long-term operation in harsh environments, affected by factors such as thermal cycle loads and erosion corrosion, the thermal barrier coating will become thinner or even fall off, and in severe cases, even cause damage to the turbine blades. Therefore, effective detection of the thickness of the ceramic layer of the thermal barrier coating is an important research content of non-destructive testing; in addition, the coating thickness is also a key quality indicator of the thermal barrier coating, which affects the service life, stress and bonding strength of the coating, and is also related to the consumption and cost of the coating material. Therefore, it is necessary to monitor the thickness of the thermal barrier coating.

[0004] To ensure the safe operation of turbine blades, the thickness of thermal barrier coatings applied on turbine blades needs to be monitored in real time during the operation of aircraft engines. Currently, the technologies suitable for measuring the thickness of thermal barrier coatings mainly include eddy current thickness measurement technology and ultrasonic thickness measurement technology, both of which are contact measurements. However, the harsh working environment of high temperature, high pressure and high speed of aircraft engine turbine blades makes it difficult to install and operate contact coating thickness measurement devices. Therefore, it is urgent to invent a non-contact online thickness measurement method to support non-contact and non-destructive online measurement of thermal barrier coating thickness. Summary of the invention

[0005] The purpose of the present invention is to provide a coating thickness non-destructive measurement method, equipment, medium and product, which can realize non-contact non-destructive online measurement of coating thickness.

[0006] To achieve the above object, the present invention provides the following solutions:

[0007] In a first aspect, the present invention provides a method for non-destructive measurement of coating thickness, the method comprising:

[0008] Acquire a phosphorescent light beam; the phosphorescent light beam is a light beam obtained by irradiating an excitation light beam emitted by an excitation light source onto the surface of the coating to be tested; the coating to be tested contains a phosphorescent substance, and the phosphorescent substance is stimulated to radiate a phosphorescent light beam.

[0009] The phosphorescent light beam is filtered through a filter to obtain a phosphorescent light beam with a single wavelength.

[0010] Photoelectric data processing is performed on the phosphorescent light beam of the single wavelength to obtain the phosphorescent light intensity of the single wavelength.

[0011] The thickness of the coating to be measured is determined according to the corresponding relationship between the phosphorescence intensity of the single wavelength and the thickness of the coating to be measured.

[0012] Optionally, the corresponding relationship between the phosphorescence intensity of the single wavelength and the thickness of the coating to be measured is expressed as:

[0013] J = I0·q·f(d,K,K1,S,S1);

[0014] Among them, J is the phosphorescence intensity of a single wavelength, I0 is the intensity of the excitation light, q is the quantum yield of phosphorescence, d is the thickness of the coating to be tested, K is the absorption coefficient of the coating to be tested for the excitation light, K1 is the absorption coefficient of the coating to be tested for phosphorescence, S is the scattering coefficient of the coating to be tested for the excitation light, and S1 is the scattering coefficient of the coating to be tested for phosphorescence.

[0015] Optionally, the wavelength of the phosphorescence light beam is different from the wavelength of the excitation light beam.

[0016] Optionally, the coating to be tested is a translucent coating.

[0017] Optionally, the coating to be tested is a thermal barrier coating; the thermal barrier coating comprises: a ceramic layer and a bonding layer.

[0018] The ceramic layer is a semi-transparent coating.

[0019] The bonding layer is a transition layer between the ceramic layer and the metal substrate.

[0020] Optionally, the phosphorescent substance is a rare earth ion.

[0021] Optionally, the material of the coating to be tested is a mixture of a yttria-stabilized zirconia substrate material doped with a phosphorescent substance.

[0022] In a second aspect, the present invention provides a computer device, comprising: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement any of the above-described methods for non-destructive measurement of coating thickness.

[0023] In a third aspect, the present invention provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements any of the above-described methods for non-destructive measurement of coating thickness.

[0024] In a fourth aspect, the present invention provides a computer program product, comprising a computer program, which, when executed by a processor, implements any of the above-mentioned methods for non-destructive measurement of coating thickness.

[0025] According to the specific embodiments provided by the present invention, the present invention discloses the following technical effects:

[0026] The present invention provides a method, equipment, medium and product for non-destructive measurement of coating thickness. The present invention dopes phosphorescent material into the coating to be measured so that it has the characteristic of stimulated radiation phosphorescence. The thickness of the coating to be measured is determined by the relationship between the light intensity and thickness of the phosphorescent light beam stimulated by the coating to be measured, thereby realizing non-contact non-destructive online measurement of the coating thickness and supporting non-contact non-destructive online measurement of the thermal barrier coating thickness. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0028] Figure 1 A schematic flow chart of a method for non-destructive measurement of coating thickness provided in accordance with an embodiment of the present invention.

[0029] Figure 2 A schematic flow chart of a method for non-destructive measurement of thickness of a translucent coating provided in accordance with an embodiment of the present invention.

[0030] Figure 3 A schematic diagram of a semi-transparent coating structure provided in one embodiment of the present invention.

[0031] Figure 4 A schematic flow chart of a method for non-destructive measurement of thermal barrier coating thickness provided in accordance with an embodiment of the present invention.

[0032] Figure 5 A schematic diagram of the thermal barrier coating structure provided in one embodiment of the present invention.

[0033] Figure 6 A schematic diagram of the structure of a computer device provided by an embodiment of the present invention.

[0034] Reference numerals:

[0035] 11. Translucent coating; 12. Base; 21. Ceramic layer; 22. Adhesive layer; 23. Metal base. DETAILED DESCRIPTION

[0036] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0037] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and understandable, the present invention is further described in detail below with reference to the accompanying drawings and specific embodiments.

[0038] In an exemplary embodiment, Figure 1 As shown, a non-destructive coating thickness measurement method is provided, which includes the following steps S1 to S4. Among them:

[0039] S1: Obtain a phosphorescent light beam; the phosphorescent light beam is a light beam obtained by irradiating an excitation light beam emitted by an excitation light source onto the surface of the coating to be tested; the coating to be tested contains a phosphorescent substance, and the phosphorescent substance is stimulated to radiate a phosphorescent light beam.

[0040] S2: filtering the phosphorescent light beam through a filter to obtain a phosphorescent light beam with a single wavelength.

[0041] S3: performing photoelectric data processing on the phosphorescent light beam of the single wavelength to obtain the phosphorescent light intensity of the single wavelength.

[0042] S4: Determine the thickness of the coating to be measured according to the corresponding relationship between the phosphorescence intensity of the single wavelength and the thickness of the coating to be measured.

[0043] By implementing the above-mentioned steps S1 to S4, the present invention dopes phosphorescent materials into the coating so that it has the characteristic of stimulated radiation phosphorescence, and determines the thickness of the coating through the relationship between the light intensity and thickness of the phosphorescent light beam stimulated by the coating, thereby realizing non-contact and non-destructive online measurement of the coating thickness.

[0044] like Figure 2 As shown, a non-destructive measurement method for the thickness of a semi-transparent coating comprises:

[0045] Step A1: an excitation light source emits an excitation light beam to illuminate the surface of the semi-transparent coating to be tested. The semi-transparent coating to be tested contains phosphorescent material. The phosphorescent material is stimulated to radiate a phosphorescent light beam. The wavelength of the phosphorescent light beam is different from the wavelength of the excitation light.

[0046] like Figure 3 As shown, a semi-transparent coating 11 is applied on a substrate 12 .

[0047] The substrate 12 is usually a metal substrate, and the translucent coating 11 is a mixture of a translucent matrix and a phosphorescent substance. The phosphorescent substance is a rare earth ion. The mixing should not affect the preparation process of the translucent coating itself. After the mixing is completed, atmospheric plasma spraying or electron beam physical vapor deposition is used to spray the matrix doped with the phosphorescent substance onto the surface of the substrate 12.

[0048] When the excitation light source emits an excitation light beam to illuminate the surface of the translucent coating 11 to be tested, due to the translucent property of the translucent coating 11 to the ultraviolet or visible light band where the excitation light is located, the excitation light can excite the phosphorescent material in the translucent coating 11 to produce phosphorescence when propagating in the translucent coating 11.

[0049] The semi-transparent coating 11 has a semi-transparent property for the visible light band where phosphorescence is located, and phosphorescence can effectively penetrate the semi-transparent coating 11 and radiate phosphorescence outward.

[0050] Step A2: The phosphorescent light beam with a relatively wide wavelength range is filtered by a filter into a phosphorescent light beam with a single wavelength.

[0051] The wavelength range of phosphorescence beam is relatively wide, and the wavelength range is different from the wavelength of the excitation beam. After the high-energy photons of the excitation beam excite the phosphorescent substance from the ground state to the excited state, they are distributed to different excited state energy levels through processes such as vibration relaxation. In this process, energy is consumed and the material transitions from different excited state energy levels back to the ground state, radiating phosphorescence in the process. The energy of phosphorescence photons is lower than that of the excitation light photons, so the phosphorescence wavelength is longer than that of the excitation light. Since phosphorescence is emitted from different excited state energy levels transitioning back to the ground state, the phosphorescence wavelength range is relatively wide.

[0052] In order to construct the correspondence between phosphorescence intensity and translucent coating thickness, it is necessary to obtain the absorption coefficient, scattering coefficient, transmittance and reflectivity of phosphorescence in the translucent coating, and the absorption coefficient and scattering coefficient of a single wavelength are relatively easy to obtain. Therefore, in order to facilitate the construction of the correspondence between phosphorescence intensity and translucent coating thickness, a filter is used to filter the phosphorescence beam with a relatively wide wavelength range into a phosphorescence beam with a single wavelength. In order to ensure that the phosphorescence has sufficient intensity, a wavelength with a relatively strong light intensity should be selected as the detection wavelength.

[0053] Step A3: After the phosphorescence light beam of a single wavelength is received by the photoelectric detector, the light intensity of the phosphorescence light beam can be obtained through data processing.

[0054] After the phosphorescent light beam of a single wavelength is received by the photodetector, a conversion from an optical signal to an electrical signal occurs in the photodetector, and then the light intensity of the phosphorescent light beam is obtained based on the photoelectric characteristics of the photodetector.

[0055] Step A4: Determine the thickness of the translucent coating 11 to be tested based on the calibrated phosphorescence intensity and its corresponding relationship with thickness (prepare standard samples of different thicknesses, collect the phosphorescence signals of the standard samples, measure the phosphorescence intensity of different thicknesses, and thus establish the corresponding relationship between phosphorescence intensity and thickness).

[0056] Based on the correspondence between phosphorescence intensity and thickness calibrated in advance, the thickness of the semi-transparent coating 11 to be measured is determined according to the phosphorescence intensity.

[0057] The corresponding relationship between phosphorescence intensity and thickness is expressed as:

[0058]

[0059] in,

[0060] Therefore, the above formula can be simplified as:

[0061] J = I0·q·f(d,K,K1,S,S1);

[0062] Among them, J is the phosphorescence intensity of a single wavelength, I0 is the intensity of the excitation light, q is the quantum yield of phosphorescence, d is the thickness of the coating to be tested, K is the absorption coefficient of the coating to be tested for the excitation light, K1 is the absorption coefficient of the coating to be tested for phosphorescence, S is the scattering coefficient of the coating to be tested for the excitation light, and S1 is the scattering coefficient of the coating to be tested for phosphorescence.

[0063] Among them, K, K1, S, S1 are related to the translucent coating material and wavelength, and are constants when the translucent coating material and the wavelengths of the excitation light and phosphorescence are determined; q is related to the phosphorescent material and temperature, and is a constant at a stable temperature when the material is determined; I0 is the intensity of the excitation light, and is a constant when the excitation light is determined. Under the condition of constant temperature, the intensity of phosphorescence of a specific wavelength radiated by a specific material under the excitation of an excitation light of a specific wavelength is a single-valued function of thickness, and the thickness of the translucent coating can be calculated by calibration and measurement of the phosphorescence intensity.

[0064] It should be noted that α, α1, β, β1, φ 1s , C1, C2, C3 and C4 are all dependent variables of K, K1, S and S1, and are intermediate variables in this embodiment. They change only when K, K1, S and S1 change. If K, K1, S and S1 do not change, these variables will not change. α and β are only related to the absorption coefficient K and scattering coefficient S of the coating to be tested for the excitation light; α1 and β1 are only related to the absorption coefficient K1 and scattering coefficient S1 of the coating to be tested for phosphorescence; C1, C2, C3 and C4 are related to the absorption / scattering of the coating to be tested for the excitation light and phosphorescence.

[0065] like Figure 4As shown, a non-destructive measurement method for thickness of thermal barrier coatings comprises:

[0066] Step B1: an excitation light source emits an excitation light beam to illuminate the surface of the thermal barrier coating to be tested, the thermal barrier coating to be tested comprises a ceramic layer 21 and a bonding layer 22, the ceramic layer is a translucent coating, the ceramic layer 21 comprises a phosphorescent substance, the phosphorescent substance is stimulated to radiate a phosphorescent light beam, and the wavelength of the phosphorescent light beam is different from the wavelength of the excitation light beam.

[0067] like Figure 5 As shown, the thermal barrier coating includes a ceramic layer 21 and a bonding layer 22 , which are coated on a metal substrate 23 .

[0068] The metal substrate 23 is usually a turbine blade, the bonding layer 22 is a transition layer between the ceramic layer 21 and the metal substrate 23, the ceramic layer 21 is a mixture of a ceramic matrix and a phosphorescent substance, and the mixture should not affect the preparation process of the thermal barrier coating itself.

[0069] The phosphorescent material doped in the ceramic layer 21 is rare earth ions, and the ceramic layer powder doped with rare earth ions is sprayed onto the surface of the bonding layer 22 by atmospheric plasma spraying or electron beam physical vapor deposition.

[0070] Doping the ceramic layer 21 with phosphorescent material does not change the original heat insulation performance of the thermal barrier coating.

[0071] When the excitation light is irradiated onto the surface of the ceramic layer 21, due to the semi-transparent property of the ceramic layer to the wavelength band where the excitation light and phosphorescence are located, the excitation light can penetrate the ceramic insulation layer 21 to reach the bonding layer 22. When the excitation light propagates in the ceramic layer, it can excite the phosphorescent substance in the ceramic layer 21 to produce phosphorescence.

[0072] The ceramic layer 21 is semi-transparent to ultraviolet light and visible light. The excitation light can effectively penetrate the ceramic layer 21 and excite the phosphorescent material in the ceramic layer 21 to radiate phosphorescence. The phosphorescent light can effectively penetrate the ceramic layer 21 and radiate outward.

[0073] The bonding layer 22 is used to relieve the internal stress caused by the mismatch of thermal expansion coefficients between the metal substrate 23 and the surface ceramic layer 21, thereby extending the service life of the thermal barrier coating.

[0074] Step B2: The phosphorescent light beam with a relatively wide wavelength range is filtered by a filter into a phosphorescent light beam with a single wavelength.

[0075] The wavelength range of phosphorescence beam is relatively wide, and the wavelength range is different from the wavelength of the excitation beam. After the high-energy photons of the excitation beam excite the phosphorescent substance from the ground state to the excited state, they are distributed to different excited state energy levels through processes such as vibration relaxation. In this process, energy is consumed and the material transitions from different excited state energy levels back to the ground state, radiating phosphorescence in the process. The energy of phosphorescence photons is lower than that of the excitation light photons, so the phosphorescence wavelength is longer than that of the excitation light. Since phosphorescence is emitted from different excited state energy levels transitioning back to the ground state, the phosphorescence wavelength range is relatively wide.

[0076] In order to construct the corresponding relationship between phosphorescence intensity and thermal barrier coating thickness, it is necessary to obtain the absorption coefficient, scattering coefficient, transmittance and reflectivity of phosphorescence in the thermal barrier coating, and the absorption coefficient and scattering coefficient of a single wavelength are relatively easy to obtain. Therefore, in order to facilitate the construction of the corresponding relationship between phosphorescence intensity and thermal barrier coating thickness, a filter is used to filter the phosphorescence beam with a relatively wide wavelength range into a phosphorescence beam with a single wavelength. In order to ensure that the phosphorescence has sufficient intensity, a wavelength with a stronger light intensity should be selected as the detection wavelength.

[0077] Step B3: After the phosphorescence light beam of a single wavelength is received by the photoelectric detector, the light intensity of the phosphorescence light beam is obtained through data processing.

[0078] After the phosphorescent light beam of a single wavelength is received by the photoelectric detector, a conversion of the optical signal into an electrical signal occurs in the photoelectric detector, and then the light intensity of the phosphorescent light beam is obtained based on the photoelectric characteristics of the detector.

[0079] Step B4: Determine the thickness of the thermal barrier coating to be tested based on the calibrated phosphorescence intensity and its corresponding relationship with thickness.

[0080] Based on the correspondence between phosphorescence intensity and thickness calibrated in advance, the thickness of the thermal barrier coating ceramic layer 21 is determined according to the phosphorescence intensity.

[0081] J = I0·q·f(d,K,K1,S,S1);

[0082] Among them, J is the phosphorescence intensity of a single wavelength, I0 is the intensity of the excitation light, q is the quantum yield of phosphorescence, d is the thickness of the coating to be tested, K is the absorption coefficient of the coating to be tested for the excitation light, K1 is the absorption coefficient of the coating to be tested for phosphorescence, S is the scattering coefficient of the coating to be tested for the excitation light, and S1 is the scattering coefficient of the coating to be tested for phosphorescence.

[0083] Among them, K, K1, S, S1 are related to the thermal barrier coating material and wavelength, and are constants when the thermal barrier coating material and the wavelengths of the excitation light and phosphorescence are determined; q is related to the phosphorescent material and temperature, and is a constant at a stable temperature when the material is determined; I0 is the intensity of the excitation light, and is a constant when the excitation light is determined. Under the condition of constant temperature, the intensity of phosphorescence of a specific wavelength radiated by a specific material under the excitation of an excitation light of a specific wavelength is a single-valued function of thickness. The thickness of the thermal barrier coating can be calculated by measuring the phosphorescence intensity through prior calibration.

[0084] It should be noted that when calculating the thickness of the thermal barrier coating, it may also be related to the transmittance of the excitation light from the thermal barrier coating to the air, the transmittance of the phosphorescence from the thermal barrier coating to the air, the transmittance of the excitation light from the air to the thermal barrier coating, the reflectivity of the excitation light at the interface between the ceramic layer and the bonding layer, and the reflectivity of the phosphorescence at the interface between the ceramic layer and the bonding layer.

[0085] As an optional implementation, the material of the coating includes but is not limited to a mixture of a base material such as yttria-stabilized zirconia and a phosphor-doped material.

[0086] The present invention dopes phosphorescent material into a translucent coating so that it has the characteristic of stimulated radiation phosphorescence, and determines the thickness of the translucent coating through the relationship between the light intensity and thickness of the phosphorescent light beam stimulated by the translucent coating, thereby realizing non-contact and non-destructive online measurement of the thickness of the translucent coating.

[0087] The present invention also provides an application scenario, which applies the above-mentioned nondestructive measurement method of coating thickness. Specifically: the nondestructive measurement method of coating thickness provided in this embodiment can be applied in the nondestructive measurement scenario of coating thickness. The nondestructive measurement scenario of coating thickness includes: a phosphorescence beam acquisition link, a data processing link and a coating thickness determination link; an excitation light source emits an excitation beam to illuminate the surface of the coating to be measured, the coating to be measured is a translucent coating, the translucent coating contains a phosphorescent substance, the phosphorescent substance is stimulated to radiate a phosphorescence beam, the wavelength of the phosphorescence beam is different from the wavelength of the excitation beam, the wavelength range of the phosphorescence beam is relatively wide, and it is filtered by a filter into a single-wavelength phosphorescence beam. After the single-wavelength phosphorescence beam is received by a photodetector, the light intensity of the single-wavelength phosphorescence beam can be obtained through data processing, and the thickness of the coating to be measured can be determined according to the calibrated phosphorescence intensity and its corresponding relationship with the thickness.

[0088] In an exemplary embodiment, a computer device is provided. The computer device may be a server or a terminal. The internal structure diagram thereof may be as follows: Figure 6As shown. The computer device includes a processor, a memory, an input / output interface (Input / Output, referred to as I / O) and a communication interface. Among them, the processor, the memory and the input / output interface are connected through a system bus, and the communication interface is connected to the system bus through the input / output interface. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the computer device is used to store the correspondence between the phosphorescence intensity of a single wavelength and the thickness of the coating to be measured. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, a non-destructive measurement method for coating thickness is implemented.

[0089] Those skilled in the art will understand that Figure 6 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present invention, and does not constitute a limitation on the computer device to which the solution of the present invention is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0090] In an exemplary embodiment, a computer device is further provided, including a memory and a processor, wherein a computer program is stored in the memory, and the above-mentioned method embodiments are implemented when the processor executes the computer program.

[0091] In an exemplary embodiment, a computer-readable storage medium is provided, storing a computer program, and when the computer program is executed by a processor, the above-mentioned method embodiments are implemented.

[0092] In an exemplary embodiment, a computer program product is provided, including a computer program, and when the computer program is executed by a processor, the above-mentioned method embodiments are implemented.

[0093] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in the present invention are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of relevant data must comply with relevant regulations.

[0094] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiments can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided by the present invention can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM may be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM).

[0095] The database involved in each embodiment provided by the present invention may include at least one of a relational database and a non-relational database. The non-relational database may include a distributed database based on blockchain, etc., but is not limited thereto. The processor involved in each embodiment provided by the present invention may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., but is not limited thereto.

[0096] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0097] The principles and implementation methods of the present invention are described in this article using specific examples. The description of the above embodiments is only used to help understand the method and core idea of ​​the present invention. At the same time, for those skilled in the art, according to the idea of ​​the present invention, there will be changes in the specific implementation methods and application scope. In summary, the content of this specification should not be understood as limiting the present invention.

Claims

1. A non-destructive measurement method for coating thickness, characterized in that: The coating thickness non-destructive measurement method comprises: Acquire a phosphorescent light beam; the phosphorescent light beam is a light beam obtained by irradiating an excitation light beam emitted by an excitation light source onto the surface of the coating to be tested; the coating to be tested contains a phosphorescent substance, and the phosphorescent substance is stimulated to radiate a phosphorescent light beam; filtering the phosphorescent light beam through a filter to obtain a phosphorescent light beam with a single wavelength; Performing photoelectric data processing on the phosphorescent light beam of the single wavelength to obtain the phosphorescent light intensity of the single wavelength; The thickness of the coating to be measured is determined according to the corresponding relationship between the phosphorescence intensity of the single wavelength and the thickness of the coating to be measured.

2. The method for nondestructive measurement of coating thickness according to claim 1, characterized in that: The expression for the corresponding relationship between the phosphorescence intensity of the single wavelength and the thickness of the coating to be measured is: J = I0·q·f(d,K,K1,S,S1); Among them, J is the phosphorescence intensity of a single wavelength, I0 is the intensity of the excitation light, q is the quantum yield of phosphorescence, d is the thickness of the coating to be tested, K is the absorption coefficient of the coating to be tested for the excitation light, K1 is the absorption coefficient of the coating to be tested for phosphorescence, S is the scattering coefficient of the coating to be tested for the excitation light, and S1 is the scattering coefficient of the coating to be tested for phosphorescence.

3. The method for nondestructive measurement of coating thickness according to claim 1, characterized in that: The wavelength of the phosphorescence light beam is different from the wavelength of the excitation light beam.

4. The method for nondestructive measurement of coating thickness according to claim 1, characterized in that: The coating to be tested is a translucent coating.

5. The method for nondestructive measurement of coating thickness according to claim 1, characterized in that: The coating to be tested is a thermal barrier coating; The thermal barrier coating comprises: a ceramic layer and a bonding layer; The ceramic layer is a translucent coating; The bonding layer is a transition layer between the ceramic layer and the metal substrate.

6. The method for nondestructive measurement of coating thickness according to claim 1, characterized in that: The phosphorescent substance is a rare earth ion.

7. The method for nondestructive measurement of coating thickness according to claim 1, characterized in that: The material of the coating to be tested is a mixture of yttria-stabilized zirconium oxide substrate material and phosphorescent material.

8. A computer device comprising: A memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the coating thickness non-destructive measurement method according to any one of claims 1 to 7.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the coating thickness non-destructive measurement method according to any one of claims 1 to 7 is implemented.

10. A computer program product, comprising a computer program, characterized in that When the computer program is executed by a processor, the coating thickness non-destructive measurement method according to any one of claims 1 to 7 is implemented.

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