A test device and method for preparing optoelectronic devices

Abstract

The present invention discloses a test device and method for preparing optoelectronic devices, and relates to the technical field of optical testing of optoelectronic devices. The present invention includes a plurality of photosensitive diodes installed in a test box, and also includes: a servo motor, the servo motor is fixedly installed on the side wall of the test box, and the output end of the servo motor is fixedly connected to a drive shaft, a connecting frame is fixedly installed on the side wall of the drive shaft, and a plurality of mounting shafts are fixedly installed on the connecting frame; the following steps are included: S1: firstly connect the power supply of the test device for preparing optoelectronic devices, debug the servo motor to observe whether it is operating normally, and deal with it in time if an abnormality is found. The advantage is that the present invention utilizes the reciprocating swinging action of the mounting block, and can automatically and continuously complete the spectral response detection of the photosensitive diode and the sensitivity detection of different incident angles, which greatly improves the detection efficiency while increasing the detection range.

Description

Technical Field

[0001] The present invention relates to the technical field of optical testing of optoelectronic devices, and in particular to testing equipment and a method for preparing optoelectronic devices. Background Art

[0002] Optoelectronic devices are devices that use the interaction between light and electrons to achieve specific functions, such as light-emitting diodes, laser diodes, and photosensitive diodes. Among them, photosensitive diodes use a PN junction with photosensitivity characteristics, are very sensitive to changes in light, have unidirectional conductivity, and are widely used in measuring instruments and optical communication receiving parts.

[0003] In the production process of photodiodes, the spectral response test is crucial, which can help the performance evaluation, application matching and optimization design of photodiodes. When conducting spectral response test, it is necessary to use light of different wavelengths to illuminate the photodiode, so as to complete the result analysis according to the change of its response ability.

[0004] At present, when performing spectral response tests, switching between light sources of different wavelengths is relatively complicated and requires the use of precise optical equipment to complete the operation. In addition, the existing spectral response tests can only control the wavelength of the incident light, but cannot adjust the incident angle of incident light of different wavelengths. This leads to the singleness of the test results and the inability to fully evaluate the performance of the photodiode. Therefore, it is necessary to design a test device and method for the preparation of optoelectronic devices. Summary of the invention

[0005] In view of the deficiencies in the prior art, the present invention provides a testing device and method for preparing an optoelectronic device, which solves the problems raised in the above-mentioned background technology.

[0006] In order to achieve the above object, the present invention adopts the following technical solutions:

[0007] A test device for preparing an optoelectronic device, comprising a plurality of photosensitive diodes installed in a test box, and further comprising:

[0008] A servo motor, wherein the servo motor is fixedly mounted on the side wall of the test box, and the output end of the servo motor is fixedly connected to a driving shaft, a connecting frame is fixedly mounted on the side wall of the driving shaft, and a plurality of mounting shafts are fixedly mounted on the connecting frame, a mounting block is rotatably mounted on each of the mounting shafts, a plurality of lasers are fixedly mounted on each of the mounting blocks, and each laser emits a different wavelength, and the laser located at the lower end of each of the mounting blocks corresponds to the position of the photodiode. When the servo motor is working, the plurality of mounting shafts are driven to swing simultaneously in the test box through the driving shaft and the connecting frame, so that the laser irradiates the photodiode at different incident angles;

[0009] A rotating rod, the rotating rod is rotatably installed in the installation shaft, and the rotating rod and the installation shaft are not coaxial, two fixed gear rings are fixedly installed on the rotating rod, and a rotating hole matching the installation shaft is opened on the installation block, and two inner gear rings are fixedly installed in the rotating hole. When the rotating rod rotates, the inner gear ring is driven to rotate through the fixed gear ring, so that the installation block rotates on the installation shaft to switch the positions of multiple lasers in sequence;

[0010] A round rod is installed on the installation shaft through a one-way mechanism, and a transmission mechanism is installed between the one-way mechanism and the rotating rod. A fixed gear is fixedly installed at one end of the round rod away from the installation shaft, and an arc-shaped rack meshing with the fixed gear is fixedly installed in the test box.

[0011] Furthermore, a taking slot is provided on the front side wall of the test box, and a dustproof sealing door is hingedly connected to the taking slot. The mounting block is a cube, and the number of the lasers is four.

[0012] Furthermore, a plug board is provided in the test box, and a plurality of groups of plug holes are provided on the plug board, each group of the plug holes is respectively matched with a corresponding photodiode, a controller is fixedly installed on the test box, and the controller is electrically connected to the servo motor, and the controller is used to control the servo motor to drive the drive shaft to perform a reciprocating rotation of 0-90°.

[0013] Furthermore, the inner gear ring is coaxial with the installation shaft, and the inner gear ring is meshed with the fixed gear ring, and the installation shaft is provided with an annular groove matching with the inner gear ring.

[0014] Furthermore, a groove is provided on the inner wall of the rotating hole, and a plurality of power connection blocks are fixedly installed in the groove, and each power connection block is electrically connected to the corresponding laser, and a power supply plate is fixedly installed at the installation shaft located in the groove, and the power supply plate is located at the lower end of the installation shaft, and the power supply plate cooperates with the plurality of power connection blocks.

[0015] Furthermore, the one-way mechanism consists of a rotating groove, a rotating shaft and a one-way bearing. The rotating groove is opened on the side wall of the mounting shaft. The rotating shaft is rotatably mounted on the rotating groove through a damping bearing. The round rod is mounted on the rotating shaft through a one-way bearing.

[0016] Furthermore, the transmission mechanism consists of a driven bevel gear, a driving bevel gear and a connecting cavity, the connecting cavity is opened on the side wall of the rotating groove, the driven bevel gear is fixedly mounted on one end of the rotating rod located in the connecting cavity, the driving bevel gear is fixedly mounted on one end of the rotating shaft located in the connecting cavity, and the driving bevel gear is meshed with the driven bevel gear.

[0017] A test method for preparing an optoelectronic device, using the above-mentioned test equipment for preparing an optoelectronic device, comprises the following steps:

[0018] S1: First, connect the power supply of the test equipment for preparing optoelectronic devices to observe whether the servo motor is operating normally. If any abnormality is found, handle it in time. If no abnormality is found, test the photodiode;

[0019] S2: Take a number of photosensitive diodes after production, open the dustproof sealing door on the test box, plug multiple photosensitive diodes into the plug-in board in sequence, and ensure that they are in a vertical state;

[0020] S3: Adjust the servo motor so that the emitting end of the laser at the lower end of the mounting block is vertically aligned with the top of the photodiode, and start the test;

[0021] S4: The servo motor drives the multiple mounting blocks to rotate 90° in a clockwise direction with the drive shaft as the axis through the controller. During this process, the incident angle of the lowest laser to the photodiode gradually increases, which is used to detect the sensitivity of the photodiode at different incident angles;

[0022] S5: When the mounting block rotates counterclockwise with the drive shaft as the axis, the one-way bearing is in a rotating state. At this time, the meshing effect of the arc-shaped rack and the fixed gear will drive the round rod to rotate, but will not drive the rotating shaft to rotate;

[0023] S6: After the mounting block rotates 90° clockwise with the drive shaft as the axis, the controller causes the servo motor to drive the mounting block to rotate counterclockwise to reset. During this process, the one-way bearing is in a locked state. At this time, the meshing effect of the arc-shaped rack and the fixed gear drives the round rod to rotate, and the rotating shaft rotates;

[0024] S7: When the shaft rotates, the meshing effect of the active bevel gear and the driven bevel gear causes the rotating rod to rotate, and then the mounting block rotates 90° on the mounting shaft under the cooperation of the fixed gear ring and the inner gear ring, and the position of the laser is switched. When the mounting block rotates 90°, another laser is located at its lower end, and its corresponding power connection block contacts the power-on board. At this time, the new laser is powered on and starts to emit light sources of different wavelengths, and the spectral response test of the photodiode at different wavelengths is carried out;

[0025] S8: Repeat steps S4-S7 until multiple lasers have completed the sensitivity test of the photodiode at different incident angles and the spectral response test at different wavelengths, turn off the power, open the dust-proof sealing door and take out the photodiode that has been tested from the test box.

[0026] Compared with the prior art, the present invention has the following advantages:

[0027] 1: Through the cooperation of the driving shaft and the connecting frame, multiple mounting blocks can be simultaneously made to swing back and forth within a certain range relative to the specified photodiode, so that the sensitivity of multiple photodiodes under the specified wavelength and different incident angles can be detected. The simple structure can be used to complete the detection of more photodiodes at a single time, effectively improving the detection efficiency.

[0028] 2: Through the cooperation of the rotating rod, the fixed gear ring and the inner gear ring, the mounting block can be rotated on the mounting shaft to switch the positions of multiple lasers thereon, thereby completing the detection of the spectral response ability of the photodiode to light of different wavelengths, effectively improving the detection range of the device, and being able to perform two different tests on the photodiode at one time, greatly improving the overall detection efficiency.

[0029] 3: Through the cooperation of the one-way mechanism and the transmission mechanism, after completing the sensitivity test of the photodiode under the specified wavelength and different incident angles, the reset action of the mounting block can be used to automatically complete the position switching of the laser thereon, so that the sensitivity of the photodiode under another wavelength and different incident angles can be directly tested without performing additional switching actions. The overall test is more coherent, and based on the analysis of the test results after multiple irradiations with different wavelengths of light sources at different incident angles, the spectral response test results of the photodiode to different wavelengths can be directly obtained, which effectively simplifies the detection steps.

[0030] In summary, the present invention utilizes the reciprocating swinging motion of the mounting block to automatically and continuously complete the spectral response detection of the photodiode and the sensitivity detection at different incident angles, thereby greatly improving the detection efficiency while increasing the detection range. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] Figure 1 A schematic diagram of the structure of a test device for preparing optoelectronic devices proposed by the present invention;

[0032] Figure 2 for Figure 1 Another perspective structural diagram after removing the test box;

[0033] Figure 3 for Figure 2 An enlarged schematic diagram of the structure at one of the mounting blocks;

[0034] Figure 4 for Figure 3 Schematic diagram of the structure without the installation shaft;

[0035] Figure 5 for Figure 3 Schematic diagram of the structure at the middle mounting shaft;

[0036] Figure 6 for Figure 3A front view of

[0037] Figure 7 for Figure 6 Schematic diagram of the structure of the AA surface in the middle;

[0038] Figure 8 for Figure 7 A schematic diagram of the structure enlargement of part a;

[0039] Fig. 9 for Figure 3 A top view of

[0040] Fig.10 for Fig. 9 Schematic diagram of the structure of the middle BB surface.

[0041] In the figure: 1. test box; 2. photodiode; 3. pick-up slot; 4. servo motor; 5. drive shaft; 6. connecting frame; 7. mounting shaft; 8. mounting block; 9. laser; 10. rotating hole; 11. inner gear ring; 12. annular groove; 13. rotating rod; 14. fixed gear ring; 15. driven bevel gear; 16. rotating slot; 17. rotating shaft; 18. driving bevel gear; 19. connecting cavity; 20. one-way bearing; 21. round rod; 22. fixed gear; 23. arc rack; 24. groove; 25. power board; 26. power connection block. DETAILED DESCRIPTION

[0042] Reference Figure 1-Figure 10 A test device for preparing optoelectronic devices includes a plurality of photodiodes 2 installed in a test box 1. A plug board is provided in the test box 1, and a plurality of groups of plug holes are provided on the plug board. Each group of plug holes is respectively matched with the corresponding photodiode 2. The plug board is connected to an oscilloscope through wires. The plug board can adopt an existing Arduino board or an experimental board and other products that can be connected to the pins of the photodiode 2 and power it. The oscilloscope is an existing product. When a light source is irradiated on the photodiode 2, the corresponding current change waveform will be displayed on the oscilloscope. Through the change of the current change waveform, it can be used to test the sensitivity and spectral response of the photodiode 2. The equipment for displaying the response of the photodiode 2 can not only use an oscilloscope, but also existing products such as a spectrum analyzer.

[0043] A taking slot 3 is provided on the front side wall of the test box 1, and a dustproof sealing door is hingedly connected to the taking slot 3. The design of the taking slot 3 facilitates the taking of the photodiode 2, and the design of the dustproof sealing door can prevent dust from entering the test box 1 and affecting the test results.

[0044] The test box 1 also includes a servo motor 4, which is an existing product. Specifically, a micro servo motor of the MGX1MB01A010AS model can be used. The servo motor 4 is fixedly mounted on the side wall of the test box 1, and the output end of the servo motor 4 is fixedly connected to a drive shaft 5. A connecting frame 6 is fixedly mounted on the side wall of the drive shaft 5, and a plurality of mounting shafts 7 are fixedly mounted on the connecting frame 6. A mounting block 8 is rotatably mounted on each mounting shaft 7, and a plurality of lasers 9 are fixedly mounted on each mounting block 8. The wavelength emitted by each laser 9 is different. The laser 9 located at the lower end of each mounting block 8 corresponds to the position of the photodiode 2. The laser 9 is an existing product. When powered on, it can emit a light source of corresponding wavelength for irradiating the photodiode 2. The mounting block 8 is a cube, and the number of lasers 9 is four. In specific design, the mounting block 8 can also be set to a polygon, and lasers 9 of corresponding wavelengths are installed on different sides thereof in turn. Through the design of lasers 9 of different wavelengths, the response ability of the photodiode 2 under the irradiation of light sources of different wavelengths can be detected.

[0045] When the servo motor 4 is working, the driving shaft 5 and the connecting frame 6 drive multiple mounting shafts 7 to swing simultaneously in the test box 1, so that the laser 9 irradiates the photodiode 2 at different incident angles. When the servo motor 4 is working, the sensitivity of the photodiode 2 irradiated at different incident angles at the same wavelength can be detected, thereby expanding the test range of the device, allowing the device to complete two different tests at one time, greatly improving the detection efficiency of the photodiode 2.

[0046] The rotating rod 13 is rotatably installed in the mounting shaft 7, and the rotating rod 13 is not coaxial with the mounting shaft 7. Two fixed gear rings 14 are fixedly installed on the rotating rod 13. A rotating hole 10 matching the mounting shaft 7 is provided on the mounting block 8, and two inner gear rings 11 are fixedly installed in the rotating hole 10. The inner gear ring 11 is coaxial with the mounting shaft 7, and the inner gear ring 11 meshes with the fixed gear ring 14. An annular groove 12 matching the inner gear ring 11 is provided on the mounting shaft 7. When the rotating rod 13 rotates, the inner gear ring 11 is driven to rotate through the fixed gear ring 14, so that the mounting block 8 rotates on the mounting shaft 7 to make multiple lasers 9 switch positions in turn. After the laser 9 completes the position switching on the mounting block 8, the photodiode 2 can be irradiated with different wavelengths, thereby realizing the spectral response test of the photodiode 2.

[0047] A controller is fixedly installed on the test box 1, and the controller is electrically connected to the servo motor 4. The controller is an existing product, and specifically a KV-16AT model controller can be used. The controller is used to control the servo motor 4 to drive the drive shaft 5 to reciprocate by 0-90°, so that the mounting block 8 drives the laser 9 to irradiate the photodiode 2 within the incident angle range of 0-90°, thereby realizing the sensitivity detection of the photodiode 2 under different incident angles of light.

[0048] The round rod 21 is installed on the mounting shaft 7 through a one-way mechanism. The one-way mechanism consists of a rotating groove 16, a rotating shaft 17 and a one-way bearing 20. The rotating groove 16 is opened on the side wall of the mounting shaft 7. The rotating shaft 17 is rotatably installed on the rotating groove 16 through a damping bearing. The round rod 21 is installed on the rotating shaft 17 through the one-way bearing 20. The end of the round rod 21 away from the mounting shaft 7 is fixedly installed with a fixed gear 22. An arc-shaped rack 23 meshing with the fixed gear 22 is fixedly installed in the test box 1. Figure 6 As shown, when the fixed gear 22 rotates counterclockwise, the one-way bearing 20 is in a rotating state, and the round rod 21 will not drive the rotating shaft 17 to rotate at the same time. When the fixed gear 22 rotates clockwise, the one-way bearing 20 is in a locked state, and the rotation of the round rod 21 will drive the rotating shaft 17 to rotate at the same time. Figure 2 When viewed from the right, when the drive shaft 5 drives the mounting block 8 to rotate clockwise, the meshing of the arc-shaped rack 23 and the fixed gear 22 causes the round rod 21 to rotate counterclockwise, so the rotating shaft 17 does not rotate at this time. When the drive shaft 5 drives the mounting block 8 to rotate counterclockwise to reset, the round rod 21 drives the rotating shaft 17 to rotate clockwise at the same time.

[0049] A transmission mechanism is installed between the one-way mechanism and the rotating rod 13, and the transmission mechanism is composed of a driven bevel gear 15, a driving bevel gear 18 and a connecting cavity 19. The connecting cavity 19 is opened on the side wall of the rotating groove 16, and the driven bevel gear 15 is fixedly installed on one end of the rotating rod 13 located in the connecting cavity 19, and the driving bevel gear 18 is fixedly installed on one end of the rotating shaft 17 located in the connecting cavity 19, and the driving bevel gear 18 is meshed with the driven bevel gear 15. When the rotating shaft 17 rotates, the meshing effect of the driving bevel gear 18 and the driven bevel gear 15 can drive the rotating rod 13 to rotate at the same time, thereby causing the mounting block 8 to rotate on the mounting shaft 7. The design of the transmission ratio between the ring 14 and the inner gear ring 11, and the transmission ratio between the fixed gear 22 and the arc-shaped rack 23, can make the mounting shaft 7 rotate exactly 90° during the counterclockwise rotation and resetting of the mounting block 8 to complete the position switching of different lasers 9 thereon, so that after completing the sensitivity detection of the photodiode 2 under the condition of irradiation with different incident angles at a specified wavelength, the laser 9 with different wavelengths can be automatically switched to continue to test the sensitivity of the photodiode 2 under the condition of irradiation with different incident angles at another wavelength, and by analyzing the detection results after multiple switching of the laser 9, the spectral response test of the photodiode 2 can also be completed.

[0050] A groove 24 is provided on the inner wall of the rotating hole 10, and a plurality of power connection blocks 26 are fixedly installed in the groove 24, and each power connection block 26 is electrically connected to the corresponding laser 9. A power-on plate 25 is fixedly installed at the installation shaft 7 located in the groove 24, and the power-on plate 25 is located at the lower end of the installation shaft 7. The power-on plate 25 cooperates with the plurality of power connection blocks 26. A battery can be arranged in the installation shaft 7, and the power-on plate 25 is connected to the battery. After the corresponding power connection block 26 contacts the power-on plate 25, the corresponding laser 9 can be powered to emit a light source of a specified wavelength.

[0051] In the present invention, a test method for preparing an optoelectronic device, when using an oscilloscope to detect the spectral response performance of a photodiode 2, comprises the following steps:

[0052] S1: First, power on the test equipment for preparing optoelectronic devices, debug the servo motor 4 and the oscilloscope to observe whether they are operating normally. If any abnormality is found, handle it in time. If no abnormality is found, test the photodiode 2;

[0053] S2: Take a number of produced photodiodes 2, open the dustproof sealing door on the test box 1, and plug a plurality of photodiodes 2 into the plug board in sequence, and ensure that they are in a vertical state;

[0054] S3: Adjust the servo motor 4 so that the emitting end of the laser 9 at the lower end of the mounting block 8 is vertically aligned with the top of the photodiode 2, and turn on the oscilloscope for testing;

[0055] S4: The servo motor 4 is used by the controller to drive the multiple mounting blocks 8 to rotate 90° in the clockwise direction with the driving shaft 5 as the axis, and the oscilloscope is powered on. During this process, the incident angle of the bottom laser 9 to the photodiode 2 gradually increases, and the sensitivity of the photodiode 2 at different incident angles is judged by the waveform changes on the oscilloscope;

[0056] S5: When the mounting block 8 rotates counterclockwise with the drive shaft 5 as the axis, the one-way bearing 20 is in a rotating state. At this time, the meshing effect of the arc-shaped rack 23 and the fixed gear 22 will drive the round rod 21 to rotate, but will not drive the rotating shaft 17 to rotate;

[0057] S6: After the mounting block 8 rotates 90° in the clockwise direction with the driving shaft 5 as the axis, the controller causes the servo motor 4 to drive the mounting block 8 to rotate counterclockwise to reset, and the oscilloscope is powered off during this period. During this process, the one-way bearing 20 is in a locked state, and the meshing effect of the arc-shaped rack 23 and the fixed gear 22 drives the round rod 21 to rotate, and causes the rotating shaft 17 to rotate;

[0058] S7: When the rotating shaft 17 rotates, the meshing effect of the active bevel gear 18 and the driven bevel gear 15 causes the rotating rod 13 to rotate, and then the mounting block 8 is rotated 90° on the mounting shaft 7 under the cooperation of the fixed gear ring 14 and the inner gear ring 11, so as to switch the position of the laser 9. When the mounting block 8 rotates 90°, another laser 9 is located at its lower end, and its corresponding power connection block 26 contacts the power supply plate 25. At this time, the new laser 9 is powered on and starts to emit light sources of different wavelengths, so as to perform the spectrum response test of the photodiode 2 at different wavelengths.

[0059] S8: Repeat steps S4-S7 until multiple lasers 9 complete the sensitivity test of the photodiode 2 at different incident angles and the spectral response test at different wavelengths, turn off the power, open the dust-proof sealing door and take out the photodiode 2 that has been tested from the test box 1.

[0060] The above shows and describes the basic principles and main features of the present invention and the advantages of the present invention. It should be understood by those skilled in the art that the present invention is not limited by the above embodiments, and the above embodiments and descriptions are only for explaining the principles of the present invention. Without departing from the spirit and scope of the present invention, the present invention may have various changes and improvements, and these changes and improvements all fall within the scope of the present invention to be protected.

Claims

1. A test device for preparing an optoelectronic device, comprising a plurality of photodiodes (2) installed in a test box (1), characterized in that: Also includes: A servo motor (4), wherein the servo motor (4) is fixedly mounted on a side wall of a test box (1), and an output end of the servo motor (4) is fixedly connected to a drive shaft (5), a connecting frame (6) is fixedly mounted on the side wall of the drive shaft (5), and a plurality of mounting shafts (7) are fixedly mounted on the connecting frame (6), a mounting block (8) is rotatably mounted on each of the mounting shafts (7), a plurality of lasers (9) are fixedly mounted on each of the mounting blocks (8), and each laser (9) emits a different wavelength, and the laser (9) located at the lower end of each of the mounting blocks (8) corresponds to the position of the photodiode (2); when the servo motor (4) is working, the plurality of mounting shafts (7) are driven by the drive shaft (5) and the connecting frame (6) to swing simultaneously in the test box (1), so that the lasers (9) irradiate the photodiode (2) at different incident angles; A rotating rod (13), the rotating rod (13) being rotatably mounted in the mounting shaft (7), and the rotating rod (13) and the mounting shaft (7) being not coaxial, two fixed gear rings (14) being fixedly mounted on the rotating rod (13), a rotating hole (10) matching the mounting shaft (7) being provided on the mounting block (8), and two inner gear rings (11) being fixedly mounted in the rotating hole (10), the two inner gear rings (11) respectively meshing with corresponding fixed gear rings (14), and when the rotating rod (13) rotates, the fixed gear rings (14) drive the inner gear rings (11) to rotate, thereby causing the mounting block (8) to rotate on the mounting shaft (7) so that the plurality of lasers (9) are switched in position in sequence; A round rod (21), the round rod (21) being mounted on the mounting shaft (7) via a one-way mechanism, and a transmission mechanism being mounted between the one-way mechanism and the rotating rod (13); a fixed gear (22) being fixedly mounted on one end of the round rod (21) away from the mounting shaft (7); and an arc-shaped rack (23) meshing with the fixed gear (22) being fixedly mounted in the test box (1); A groove (24) is provided on the inner wall of the rotating hole (10), a plurality of power connection blocks (26) are fixedly installed in the groove (24), and each power connection block (26) is electrically connected to a corresponding laser (9), and a power supply plate (25) is fixedly installed at the location of the installation shaft (7) in the groove (24), and the power supply plate (25) is located at the lower end of the installation shaft (7), and the power supply plate (25) cooperates with the plurality of power connection blocks (26); The one-way mechanism is composed of a rotating groove (16), a rotating shaft (17) and a one-way bearing (20); the rotating groove (16) is formed on a side wall of the mounting shaft (7); the rotating shaft (17) is rotatably mounted on the rotating groove (16) via a damping bearing; and the round rod (21) is mounted on the rotating shaft (17) via the one-way bearing (20); The transmission mechanism comprises a driven bevel gear (15), a driving bevel gear (18) and a connecting cavity (19); the connecting cavity (19) is formed on a side wall of the rotating groove (16); the driven bevel gear (15) is fixedly mounted on one end of the rotating rod (13) located in the connecting cavity (19); the driving bevel gear (18) is fixedly mounted on one end of the rotating shaft (17) located in the connecting cavity (19); and the driving bevel gear (18) is meshed with the driven bevel gear (15).

2. A test device for preparing optoelectronic devices according to claim 1, characterized in that: A taking slot (3) is provided on the front side wall of the test box (1), and a dustproof sealing door is hingedly connected to the taking slot (3). The mounting block (8) is a cube, and the number of the lasers (9) is four.

3. A test device for preparing optoelectronic devices according to claim 2, characterized in that: The test box (1) is provided with a plug board, and the plug board is provided with a plurality of groups of plug holes, each group of the plug holes is respectively matched with a corresponding photosensitive diode (2), and a controller is fixedly installed on the test box (1), and the controller is electrically connected to the servo motor (4), and the controller is used to control the servo motor (4) to drive the drive shaft (5) to perform a reciprocating rotation of 0-90 degrees.

4. The test equipment for preparing optoelectronic devices according to claim 3, characterized in that: The inner gear ring (11) is coaxial with the mounting shaft (7), and the mounting shaft (7) is provided with an annular groove (12) that matches the inner gear ring (11).

5. A method for testing the preparation of an optoelectronic device, using the test equipment for the preparation of an optoelectronic device as claimed in claim 4, characterized in that: The following steps are involved: S1: First, the test equipment for preparing optoelectronic devices is powered on, and the servo motor (4) is debugged to observe whether it is operating normally. If an abnormality is found, it is promptly processed. If no abnormality is found, the photosensitive diode (2) can be tested; S2: Take a number of produced photosensitive diodes (2), open the dustproof sealing door on the test box (1), and plug the plurality of photosensitive diodes (2) into the plug-in board in sequence, and ensure that the plug-in board is in a vertical state; S3: adjusting the servo motor (4) so ​​that the emitting end of the laser (9) at the lower end of the mounting block (8) is vertically aligned with the top of the photodiode (2) for testing; S4: The servo motor (4) is used by the controller to drive the plurality of mounting blocks (8) to rotate 90° in a clockwise direction with the drive shaft (5) as the axis. During this process, the incident angle of the bottom laser (9) to the photodiode (2) gradually increases, so as to test the sensitivity of the photodiode (2) at different incident angles; S5: When the mounting block (8) rotates counterclockwise with the drive shaft (5) as the axis, the one-way bearing (20) is in a rotating state. At this time, the meshing effect of the arc-shaped rack (23) and the fixed gear (22) drives the round rod (21) to rotate, but does not drive the rotating shaft (17) to rotate; S6: After the mounting block (8) rotates 90° in the clockwise direction with the drive shaft (5) as the axis, the controller causes the servo motor (4) to drive the mounting block (8) to rotate counterclockwise to reset. During this process, the one-way bearing (20) is in a locked state. At this time, the meshing effect of the arc-shaped rack (23) and the fixed gear (22) drives the round rod (21) to rotate, and causes the rotating shaft (17) to rotate; S7: When the rotating shaft (17) rotates, the meshing effect of the active bevel gear (18) and the driven bevel gear (15) causes the rotating rod (13) to rotate, and then the mounting block (8) is rotated 90° on the mounting shaft (7) under the cooperation of the fixed gear ring (14) and the inner gear ring (11), so as to switch the position of the laser (9). When the mounting block (8) rotates 90°, another laser (9) is located at its lower end, and its corresponding power connection block (26) contacts the power supply plate (25). At this time, the new laser (9) is powered on and starts to emit light sources of different wavelengths, so as to perform a spectral response test of the photodiode (2) at different wavelengths; S8: Repeat steps S4-S7 until the multiple lasers (9) have completed the sensitivity test of the photodiode (2) at different incident angles and the spectral response test at different wavelengths, turn off the power, open the dustproof sealing door and take out the photodiode (2) that has been tested from the test box (1).

Images