A method and system for rapid estimation of air gap defect depth in basin-type insulators

Abstract

This invention discloses a method and system for rapid estimation of air gap defect depth in basin-type insulators, comprising: obtaining the time vector of the occurrence of the maximum surface temperature difference of a target basin-type insulator containing air gap defects under a first thermal excitation; fitting each component of the time vector of the occurrence of the maximum surface temperature difference according to a first mathematical model to construct a first fitting model; and rapidly estimating the air gap defect depth of the basin-type insulator based on the first fitting model. This application significantly improves detection efficiency and accuracy through a precise mathematical model and a rapid calculation process. Compared with traditional detection methods, this application not only reduces the time required for detection but also lowers the skill requirements for operators, making the detection process more standardized and automated. Furthermore, the system design of this application is flexible and easily integrated into existing GIS equipment detection processes, providing strong technical support for the safe operation of power systems.

Description

Technical Field

[0001] This invention relates to the field of rapid estimation of air gap defect depth in basin-type insulators, and particularly to a method and system for rapid estimation of air gap defect depth in basin-type insulators. Background Technology

[0002] Pot-type insulators are a key component of gas-insulated switchgear (GIS). During production, transportation, assembly, and operation, defects such as near-surface air gaps inevitably occur, severely impacting the reliability of pot-type insulators. Existing non-destructive testing technologies, such as ultrasonic and X-ray methods, suffer from poor interference resistance, complex equipment, and high testing costs. In production and operation, traditional methods struggle to pinpoint the cause of accidents after they occur, and effective preventative measures are lacking. Furthermore, during production, withstand voltage and partial discharge methods can only qualitatively assess the electrical characteristics of pot-type insulators, failing to establish the intrinsic link between internal defects and electrical performance. This can lead to defective insulator components being put into operation, seriously affecting the safety and stability of electrical equipment. This invention aims to utilize novel infrared waves, which have excellent penetrating power through non-polar, non-metallic, and dry materials, to research a defect detection method for pot-type insulators based on infrared imaging technology. This method aims to achieve rapid detection of internal defects in GIS pot-type insulators, thereby improving and optimizing the production and operating conditions of pot-type insulators. Summary of the Invention

[0003] The purpose of this section is to outline some aspects of embodiments of the present invention and to briefly describe some preferred embodiments. Simplifications or omissions may be made in this section, as well as in the abstract and title of this application, to avoid obscuring the purpose of these documents; however, such simplifications or omissions should not be construed as limiting the scope of the invention.

[0004] In view of the aforementioned existing problems, the present invention is proposed.

[0005] Therefore, the present invention provides a method and system for rapid estimation of air gap defect depth in basin insulators, which can solve the problems mentioned in the background art.

[0006] To solve the above-mentioned technical problems, the present invention provides the following technical solution:

[0007] In a first aspect, the present invention provides a method for rapid estimation of the air gap defect depth in a basin-type insulator, comprising:

[0008] Obtain the time vector of the occurrence of the maximum surface temperature difference of the target basin insulator containing air gap defects under the first thermal excitation;

[0009] The components of the time vector in which the maximum surface temperature difference occurs are fitted according to the first mathematical model to construct the first fitting model.

[0010] The depth of air gap defects in basin-type insulators is rapidly estimated based on the first fitted model.

[0011] As a preferred embodiment of the rapid estimation method for air gap defect depth of the basin-type insulator described in this invention, the step of obtaining the time vector of the occurrence of the maximum surface temperature difference of the target basin-type insulator containing air gap defects under the first thermal excitation includes:

[0012] The target basin insulator containing air gap defects is selected from the first preset defect planning table;

[0013] The first preset defect planning table includes the defect size and defect depth that occur in the actual production process, and the defect depth and defect size are arranged in the rows and columns of the defect planning table according to the first arrangement order.

[0014] As a preferred embodiment of the rapid estimation method for air gap defect depth of the basin-type insulator described in this invention, the step of obtaining the time vector of the occurrence of the maximum surface temperature difference of the target basin-type insulator containing air gap defects under the first thermal excitation further includes:

[0015] The target basin insulator containing air gap defects is subjected to a first thermal excitation.

[0016] Acquire surface temperature data of the region containing air gap defects under the first thermal excitation;

[0017] The temperature difference vector of the air gap defect surface is calculated based on the surface temperature data of the region containing the air gap defect under the first thermal excitation, and the maximum temperature difference value is searched from the temperature difference vector of the air gap defect surface.

[0018] As a preferred embodiment of the rapid estimation method for air gap defect depth of basin-type insulators according to the present invention, the step of fitting each component of the time vector in which the maximum surface temperature difference occurs according to the first mathematical model to construct the first fitting model includes:

[0019] The first fitting model is a mathematical relationship between the time vector of the maximum surface temperature difference under different defect diameters and the defect depth.

[0020] As a preferred embodiment of the rapid estimation method for air gap defect depth of basin-type insulators according to the present invention, the step of fitting each component of the time vector in which the maximum surface temperature difference occurs according to the first mathematical model to construct the first fitting model further includes:

[0021] The first fitting model is transformed from the model of the relationship between the time vector of the maximum surface temperature difference and the defect depth into a model of the relationship between the defect depth and the time vector of the maximum surface temperature difference.

[0022] As a preferred embodiment of the rapid estimation method for air gap defect depth of basin-type insulators according to the present invention, the rapid estimation of air gap defect depth of basin-type insulators based on the first fitting model includes:

[0023] Obtain the actual defect diameter and the time vector of the occurrence of the maximum actual surface temperature difference of the pot-type insulator under test;

[0024] Based on the actual defect diameter and the time vector of the occurrence of the maximum temperature difference on the actual surface, and combined with the first fitting model, the depth of the air gap defect in the basin insulator is quickly estimated.

[0025] As a preferred embodiment of the rapid estimation method for air gap defect depth of basin-type insulators described in this invention, it further includes:

[0026] When a new pot-type insulator needs to be tested, the testing process is initiated directly. The actual defect diameter and the time vector of the occurrence of the maximum temperature difference on the actual surface of the pot-type insulator are calculated. The depth of near-surface porosity defects of the pot-type insulator is then quickly calculated in conjunction with the first fitting model.

[0027] Secondly, the present invention provides a rapid estimation system for air gap defect depth in basin-type insulators, comprising:

[0028] The parameter acquisition module is used to acquire the time vector of the occurrence of the maximum surface temperature difference of the target basin insulator containing air gap defects under the first thermal excitation.

[0029] The model building module is used to fit each component in the time vector of the occurrence of the maximum surface temperature difference according to the first mathematical model to construct the first fitting model.

[0030] The calculation module is used to quickly estimate the depth of air gap defects in basin insulators based on the first fitting model.

[0031] Thirdly, the present invention provides a computer device including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps of the method described above.

[0032] Fourthly, the present invention provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps of the method described above.

[0033] Compared with existing technologies, the beneficial effects of this invention are as follows: This invention proposes a rapid estimation method and system for air gap defects in basin-type insulators. It obtains the time vector of the occurrence of the maximum surface temperature difference of a basin-type insulator containing air gap defects under the first thermal excitation; fits each component of the time vector of the occurrence of the maximum surface temperature difference according to a first mathematical model to construct a first fitting model; and rapidly estimates the air gap defect depth of the basin-type insulator based on the first fitting model. This application significantly improves detection efficiency and accuracy through a precise mathematical model and a rapid calculation process. Compared with traditional detection methods, this application not only reduces the time required for detection but also lowers the skill requirements for operators, making the detection process more standardized and automated. Furthermore, the system design of this application is flexible and easily integrated into existing GIS equipment detection processes, providing strong technical support for the safe operation of power systems. Through the implementation of this application, power system failures caused by insulator defects can be effectively prevented, thereby ensuring the stability and reliability of the power grid. Attached Figure Description

[0034] To more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort. Wherein:

[0035] Figure 1 This is a flowchart of a method and system for rapid estimation of air gap defect depth in a basin-type insulator, provided in one embodiment of the present invention.

[0036] Figure 2 A detailed flowchart of a method and system for rapid estimation of air gap defect depth in a basin-type insulator, provided as an embodiment of the present invention;

[0037] Figure 3 This is a schematic diagram of the maximum temperature difference-defect depth fitting image of a method and system for rapid estimation of air gap defect depth in a basin-type insulator provided in an embodiment of the present invention.

[0038] Figure 4 This is an internal structural diagram of a computer device for a method and system for rapid estimation of air gap defect depth in a basin-type insulator, provided as an embodiment of the present invention. Detailed Implementation

[0039] To make the above-mentioned objects, features, and advantages of the present invention more apparent and understandable, specific embodiments of the present invention will be described in detail below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all of them. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the protection scope of the present invention.

[0040] Example 1

[0041] Reference Figures 1-4 This is the first embodiment of the present invention, which provides a method and system for rapid estimation of air gap defect depth in a basin-type insulator, comprising:

[0042] In related technologies, there are various methods for detecting insulator defects, but these methods often require complex equipment and professional technicians, and the detection process is time-consuming.

[0043] This application provides a method and system for rapidly estimating the air gap defect depth of the basin insulator that can effectively solve the problems mentioned above. The following will describe in detail how to realize the method and system for rapid estimation of air gap defect depth of the basin insulator with multiple embodiments.

[0044] Figure 1 A flowchart illustrating a method and system for rapid estimation of air gap defect depth in basin-type insulators is shown, including:

[0045] S101, Obtain the time vector of the occurrence of the maximum surface temperature difference of the target basin insulator containing air gap defects under the first thermal excitation;

[0046] In this embodiment of the application, obtaining the time vector of the occurrence of the maximum surface temperature difference of the target basin insulator containing air gap defects under the first thermal excitation includes:

[0047] The target pot insulators containing air gap defects are selected from the first preset defect planning table;

[0048] The first preset defect planning table includes the defect size and defect depth that occur in the actual production process, and the defect depth and defect size are arranged in the rows and columns of the defect planning table according to the first arrangement order.

[0049] In this embodiment of the application, obtaining the time vector of the occurrence of the maximum surface temperature difference of the target basin insulator containing air gap defects under the first thermal excitation further includes:

[0050] The first thermal excitation is performed on the target basin insulator containing air gap defects;

[0051] Acquire surface temperature data of the region containing air gap defects under the first thermal excitation;

[0052] The temperature difference vector of the air gap defect surface is calculated based on the surface temperature data of the region containing the air gap defect under the first thermal excitation, and the maximum temperature difference value is searched from the temperature difference vector of the air gap defect surface.

[0053] In one optional embodiment, the first arrangement order can be arranged according to a uniform gradient, or in reverse order according to a uniform gradient, or in a right-angled triangle, etc., which can flexibly adapt to different detection needs. In this way, it can be ensured that the defect area can be accurately located during the detection process, and the time point of occurrence of the maximum temperature difference can be quickly obtained.

[0054] In the embodiments of this application, when a uniform gradient arrangement is selected, a defect planning table is designed based on the defect size and defect depth that may occur in the actual production process. The defect depth and defect size are arranged in the rows and columns of the defect planning table according to a uniform gradient. One defect depth and one defect size constitute a complete defect containing two defect parameters.

[0055] Table 1: Example of Defect Programming

[0056]

[0057] It should be noted that, according to the defect planning table, the placement of air gap defects in the pot insulator sample should be planned reasonably to ensure that there is a sufficiently large normal area around each air gap defect in order to avoid the mutual influence of thermal conduction between defects. Then, pot insulator samples containing air gap defects should be made and marked to distinguish air gap defects with different parameters.

[0058] In one alternative embodiment, the first thermal excitation can be thermal pulse heating, or it can be achieved by other means, such as an electric heater, an infrared heater, or other rapid heating devices. During implementation, parameters such as the duration, intensity, and frequency of the thermal pulse need to be precisely controlled based on the thermal characteristics of the insulator material and the characteristics of the air gap defects to ensure heating effectiveness and measurement accuracy.

[0059] In this embodiment of the application, when thermal pulse heating is selected to heat the surface of the basin insulator, thermal pulse heating Q is performed on the surface of the basin insulator, and infrared thermal imaging equipment is used to record the surface temperature change during the cooling stage at a high frame rate f, and the surface temperature data of the area containing air gap defects is marked in detail.

[0060] Furthermore, temperature data from the surface of the air gap defect and the normal region surface are extracted, and the temperature difference vector of the air gap defect surface is calculated.

[0061]

[0062] in, It is the temperature difference vector on the surface of the air gap defect. This represents the temperature vector of the defect region. Let ΔT1, ΔT2, ..., ΔT be the temperature vector of the defect-free region. N Temperature difference vector of the concave surface The experiment consists of N components, where N is the total number of data collections during the experiment, and T is the total number of data collections. d1 ,T d2 ,...,T dN With T s1 ,T s2 ,…,T sN They are respectively and N components;

[0063] Furthermore, the maximum temperature difference value ΔT is searched from the temperature difference vector on the surface of the air gap defect. max And record the maximum temperature difference value ΔT. max The time t at which the defect occurs is taken as the time when the maximum temperature difference occurs. The maximum temperature difference defect time on the surface of each air gap defect will be calculated. Fill in the corresponding defect locations in the defect planning table to form the time matrix of the maximum temperature difference occurrence on the surface of the air gap defect [t]. max ] m×n ;

[0064] Furthermore, based on the time t when the maximum temperature difference occurs... max From the expression, we can see that t max The depth is proportional to the square of the defect depth. All other parameters in the expression are constants determined by material properties and do not change with thermal excitation or defect parameters. Therefore, under a fixed depth, the defect size has no effect on the time to the maximum temperature difference, and each depth corresponds one-to-one with a specific time to the maximum temperature difference. The depth sequence z1, z2, ..., z in the basin-type insulator sample is shown. n Each corresponding defect will have a unique maximum temperature difference value. The time t when the maximum temperature difference occurs n That is, the time t when the maximum temperature difference occurs. max A maximum temperature difference occurrence time matrix of the same dimension can be constructed [t] max ] m×n :

[0065]

[0066] From the above formula derivation, it can be seen that the time t for the maximum temperature difference to occur is... max It is only affected by the defect depth z, and does not change with the defect diameter d. Therefore, in practice, for any set of defects d1z with the same depth but different diameters...x d2z x ,…,d n z x In other words, the time when their corresponding maximum temperature difference occurs. It is unique, that is:

[0067]

[0068] Therefore, the time matrix of the maximum temperature difference [t] can be used. max ] m×n Dimensionality reduction to the time vector of maximum temperature difference occurrence

[0069]

[0070] in, The maximum temperature difference occurrence time vector contains the same number of components m as the set number of defect depths z. The time vector of the occurrence of the maximum temperature difference m components; It corresponds to defect d n z m The time when the maximum temperature difference occurs;

[0071] It should be noted that step S101 can improve computational efficiency by simplifying the data processing flow. In practical applications, reducing the dimensionality of matrix operations can significantly reduce the consumption of computational resources, thereby accelerating the speed of defect depth estimation. Furthermore, since the time of occurrence of the maximum temperature difference is only related to the defect depth, the influence of the defect diameter can be ignored when estimating the defect depth, simplifying the model's complexity. Finally, by constructing the vector of the time of occurrence of the maximum temperature difference, the air gap defect depth in the pot insulator can be quickly classified and identified, providing strong data support for the maintenance and replacement of insulators.

[0072] S102, Fit each component in the time vector of the occurrence of the maximum surface temperature difference according to the first mathematical model to construct the first fitting model;

[0073] In this embodiment of the application, the components of the time vector in which the maximum surface temperature difference occurs are fitted according to a first mathematical model to construct the first fitting model, which includes:

[0074] The first fitting model is a mathematical relationship between the time vector of the occurrence of the maximum temperature difference on the surface under different defect diameters and the defect depth.

[0075] In this embodiment of the application, the first fitting model is constructed by fitting each component of the time vector in which the maximum surface temperature difference occurs according to the first mathematical model.

[0076] The first fitting model is transformed from the model of the relationship between the time vector of the maximum surface temperature difference and the defect depth into a model of the relationship between the defect depth and the time vector of the maximum surface temperature difference.

[0077] In an optional embodiment, the temperature difference between the defective and non-defective regions on the specimen surface can be derived from the formula as follows:

[0078]

[0079] Furthermore, the extrema and the corresponding values ​​of the independent variable can be obtained by taking the first derivative:

[0080]

[0081] The equation can be set to 0. After rearranging and simplifying, we can solve for:

[0082]

[0083] That is: when t = t max At this point, ΔT can reach its maximum value, at which time the difference between the surface temperature of the defect region and the surface temperature of the non-defect region reaches its maximum, and the maximum temperature is:

[0084]

[0085] The time t for the occurrence of the maximum temperature difference was obtained. max Relationship with air gap defect depth z:

[0086] t max ∝z 2

[0087] In an optional embodiment, the first fitting model can be fitted using a second-order polynomial fitting model, or it can be fitted using a linear fitting model, an exponential fitting model, or other mathematical models to adapt to the data characteristics under different conditions. By selecting an appropriate fitting model, the accuracy of defect depth estimation can be improved. For example, a linear fitting model is suitable for cases where there is a linear relationship between defect depth and the time of occurrence of the maximum temperature difference, while an exponential fitting model is suitable for cases where the data exhibits an exponential growth or decay trend.

[0088] In an optional embodiment, when a second-order polynomial fitting model is selected for fitting, the time vector of the occurrence of the maximum surface temperature difference is calculated. The mathematical relationship between the defect depth z and the fitting equation is a second-order polynomial fitting model, namely:

[0089] t max =p1z 2 +p2z+p3

[0090] Where p1, p2, and p3 are three constants to be calculated in the second-order polynomial fitting model. Then, fitting curves of the time to maximum temperature difference versus defect depth can be plotted sequentially.

[0091] Furthermore, given the known defect depth, the maximum temperature difference on the defect surface can be quickly estimated using a fitting model of the time when the maximum temperature difference occurs and the defect depth, which helps on-site personnel to roughly determine the time window for identifying the defect.

[0092] Furthermore, based on the fitting relationship between the time of occurrence of the maximum temperature difference on the surface of the air gap defect and the defect depth, the expression for the air gap defect depth can be derived from the mathematical formula. Using the quadratic formula method, the two roots of the function for the time of occurrence of the maximum temperature difference can be obtained. First, the time t of occurrence of the maximum temperature difference is rearranged. max The relationship with the defect depth z is as follows:

[0093] p1z 2 +p2z+(p3-t max ) = 0

[0094] When specifying the exact time t when the maximum temperature difference occurs. max This is a quadratic equation in one variable concerning the defect depth h, which can be solved using the quadratic formula to find the defect depth h:

[0095]

[0096] This yields two possible solutions for the defect depth;

[0097] It should be noted that, considering the actual physical meaning of the defect depth z, the air gap defect depth h must be a unique constant greater than 0, and the range of the root is limited according to the physical definition of defect depth. From the formula derivation above, it can be seen that the time to the maximum temperature difference increases more rapidly with the increase of defect depth, and the relationship must be a second-order polynomial with the opening facing upwards, i.e., the time to the maximum temperature difference t. max In the expression relating defect depth h, p1 must be a positive value. When the sign in the defect depth expression is negative, the numerator in the expression for defect depth z is negative, and the value of defect depth z will be negative, which obviously contradicts its physical definition. Therefore, when the sign in the defect depth expression is positive, a unique defect depth z can be determined:

[0098]

[0099] In an optional embodiment, for defects of all defect diameters in the defect planning table, the same method can be used to calculate the defect depth calculation expression z1, z2, ..., z for each defect size. m :

[0100]

[0101] It should be noted that the advantage of step S102 is that it provides a unified computational framework for defects of different sizes, thereby simplifying the defect depth estimation process. This method allows for rapid depth estimation of defects of various sizes without requiring complex calculations for each size individually. Furthermore, this method is adaptable to defect detection under different material and environmental conditions, improving the versatility and flexibility of the detection system. In practical applications, this method can effectively assist engineers and maintenance personnel in fault diagnosis and preventative maintenance, thereby improving the reliability and safety of power systems.

[0102] S103, Rapidly estimate the depth of air gap defects in basin insulators based on the first fitting model.

[0103] In this embodiment of the application, the rapid estimation of the air gap defect depth of the basin insulator based on the first fitting model includes:

[0104] Obtain the actual defect diameter and the time vector of the occurrence of the maximum actual surface temperature difference of the pot-type insulator under test;

[0105] Based on the actual defect diameter and the time vector of the occurrence of the maximum temperature difference on the actual surface, combined with the first fitting model, the depth of the air gap defect in the basin insulator is quickly estimated.

[0106] In an optional embodiment, the specific steps for forming a fast estimation method for air gap defect depth using the air gap defect depth expressions for all defect sizes obtained by inverse solving are as follows:

[0107] Based on the calculated diameter d of n types of defects n The calculation expressions for all depths z1, z2, ..., z m Construct the formula for calculating the defect depth z for each defect diameter d: z = f(t) max ):

[0108] Table 2: Example of Defect Depth Calculation

[0109] defect Defect 1 Defect 2 ... Defect n Defect depth <![CDATA[z1=f1(t max )]]> <![CDATA[z2=f2(t max )]]> ... <![CDATA[z n =f n (t max )]]>

[0110] In an optional embodiment, when a new pot insulator needs to be tested, the testing process is directly initiated. The actual defect diameter and the time vector of the occurrence of the maximum actual surface temperature difference of the pot insulator are calculated, and the depth of near-surface porosity defects of the pot insulator is quickly calculated in combination with the first fitting model.

[0111] In the embodiments of this application, such as Figure 2As shown, the process begins here (201). Sample Planning and Preparation (202): This step designs and prepares sample materials for testing or research purposes. Defect Diameter (203): At this stage, the diameter of defects in the sample is measured or determined. Defect Depth (204): Similarly, the depth of defects is measured or determined. Defect Definition (205): This step involves classifying or defining the observed defect type. Infrared Thermometry Test (206): Experiments or tests are conducted using infrared thermometry. Forming a Maximum Temperature Difference Time Vector from Surface Temperature Data (207): Surface temperature data is collected and processed to create a vector representing the maximum temperature difference over time. Heat Transfer Physics (208): The principles of heat transfer are applied to understand the collected data. Maximum Temperature Difference Occurrence Time-Defect Depth Fitting Model (209): A model is built that correlates the time of maximum temperature difference occurrence with the defect depth. Root Formula (210): Mathematical formulas are used to solve or calculate certain parameters. Experimental Data Acquisition (211): More data is acquired through experiments. Inverse Equation for Defect Depth (212): An equation is solved that can be used to inversely deduce the defect depth. Data Processing Flow 213: Further processing and analysis of all collected data. Developing a Rapid Defect Depth Estimation Method 214: Utilizing the results of the above steps, a rapid method for estimating defect depth is developed. End 215: The process terminates here.

[0112] In summary, this invention proposes a rapid estimation method and system for air gap defects in basin-type insulators. The method involves obtaining the time vector of the maximum surface temperature difference occurring under the first thermal excitation on a basin-type insulator containing air gap defects; fitting each component of the time vector to a first mathematical model to construct a first fitting model; and then rapidly estimating the air gap defect depth based on the first fitting model. This application significantly improves detection efficiency and accuracy through a precise mathematical model and rapid calculation process. Compared with traditional detection methods, this application not only reduces the time required for detection but also lowers the skill requirements for operators, making the detection process more standardized and automated. Furthermore, the system design of this application is flexible and easily integrated into existing GIS equipment detection processes, providing strong technical support for the safe operation of power systems. Implementation of this application can effectively prevent power system failures caused by insulator defects, thereby ensuring the stability and reliability of the power grid.

[0113] This embodiment also provides a rapid estimation system for air gap defect depth in basin-type insulators, including:

[0114] The parameter acquisition module is used to acquire the time vector of the occurrence of the maximum surface temperature difference of the target basin insulator containing air gap defects under the first thermal excitation.

[0115] The model building module is used to fit each component in the time vector of the occurrence of the maximum surface temperature difference according to the first mathematical model to construct the first fitting model.

[0116] The calculation module is used to quickly estimate the depth of air gap defects in basin insulators based on the first fitted model.

[0117] The above-mentioned unit modules can be embedded in the processor of the computer device in hardware form or independent of it, or they can be stored in the memory of the computer device in software form, so that the processor can call and execute the corresponding operations of the above modules.

[0118] This embodiment also provides a computer device, which may be a terminal, and its internal structure diagram may be as follows. Figure 4 As shown, the computer device includes a processor, memory, communication interface, display screen, and input devices connected via a system bus. The processor provides computational and control capabilities. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores the operating system and computer programs. The internal memory provides an environment for the operation of the operating system and computer programs stored in the non-volatile storage media. The communication interface is used for wired or wireless communication with external terminals; wireless communication can be achieved through Wi-Fi, carrier networks, NFC (Near Field Communication), or other technologies. When executed by the processor, the computer program implements a method for rapidly estimating the depth of air gap defects in basin-type insulators. The display screen can be an LCD screen or an e-ink screen. The input devices can be a touch layer covering the display screen, buttons, a trackball, or a touchpad mounted on the computer device casing, or an external keyboard, touchpad, or mouse.

[0119] This embodiment also provides a computer-readable storage medium on which a computer program is stored, and when the computer program is executed by a processor, it performs the following steps:

[0120] Obtain the time vector of the occurrence of the maximum surface temperature difference of the target basin insulator containing air gap defects under the first thermal excitation;

[0121] The components of the time vector in which the maximum surface temperature difference occurs are fitted according to the first mathematical model to construct the first fitting model.

[0122] The depth of air gap defects in basin-type insulators is rapidly estimated based on the first fitted model.

[0123] Example 2

[0124] Reference Figures 2-3As an embodiment of the present invention, a method and system for rapid estimation of air gap defect depth in basin-type insulators are provided. To verify the beneficial effects of the present invention, scientific demonstration is carried out through experiments.

[0125] A portion of the defect planning table is shown as an example. The six selected defects have identical diameters but varying depths, each depth corresponding to a unique time of occurrence of the maximum temperature difference.

[0126] Table 3: Partial Defect Planning Table

[0127]

[0128]

[0129] A 126kV basin insulator sample containing the above-mentioned defects was subjected to thermal excitation. The thermal excitation was pulsed, and the maximum heat flux density was Q = 10. 6 W / m 2 The pulse duration was t = 0.1s, and an infrared thermal imager was used to collect temperature change data on the surface of the basin insulator at a frequency of f = 10Hz. The collected area included temperature changes in both defective and non-defective areas.

[0130] The time of occurrence of the maximum temperature difference on each defect surface is calculated according to the calculation method described in the invention. The following timetable for the occurrence of the maximum temperature difference is obtained:

[0131] Table 4: Timeline of Maximum Temperature Difference

[0132] defect <![CDATA[d1z1]]> <![CDATA[d1z2]]> <![CDATA[d1z3]]> <![CDATA[d1z4]]> <![CDATA[d1z5]]> <![CDATA[d1z6]]> <![CDATA[t max ]]> 1.7s 4.0s 5.9s 8.3s 11.4s 15.3s

[0133] Therefore, the time vector of the maximum temperature difference for:

[0134]

[0135] For the time vector of the maximum temperature difference By fitting the model to the defect depth z using the aforementioned second-order polynomial fitting model, the fitting result can be obtained:

[0136] Table 5 Fitting Results

[0137]

[0138] exist Figure 3 The window plots the time t when the maximum temperature difference occurs. max The scatter plot and fitted curve plot of the true value of the defect depth z show that the fitted curve is a quadratic function with an upward opening, and it reflects the time t when the maximum temperature difference occurs well. max Numerical relationship with defect depth z:

[0139] For the time t when the maximum temperature difference occurs max Fitting function t with defect depth z max =0.182z 2 +1.519z – 0.380, using the quadratic formula to inversely solve for the defect depth z:

[0140]

[0141] Based on the above analysis, the ± value in the numerator is undefined, therefore the unique solution for the defect depth z can be obtained:

[0142]

[0143] This provides a rapid estimation method for the defect depth z when the defect diameter d1 = 8 mm. It only requires measuring the time t at which the maximum temperature difference occurs in the experiment. max Therefore, the defect depth z can be quickly calculated using the formula for calculating the defect depth z.

[0144] Example 3

[0145] Based on the analysis of the previous embodiment, it can be seen that the time t for the maximum temperature difference to occur when the defect diameter d1 = 8 mm is... max The fitting function with respect to the defect depth z is:

[0146] t max =0.182z 2 +1.519z–0.380

[0147] The fast estimation expression for the defect depth z when the defect diameter d1 = 8 mm under the same conditions is:

[0148]

[0149] A new defect d1z7 was introduced into a pot-type insulator to verify the effectiveness of the rapid air gap defect depth estimation method described in this invention. The parameters of the new defect d1z7 are as follows:

[0150] d1 = 8mm, z7 = 2.5mm, t max =4.6s

[0151] It is evident that the depth of this defect differs from any of the aforementioned defects. Given the defect parameters d1z7, the time of occurrence of the maximum temperature difference is first calculated using the known defect depth z7, and the deviation is verified. The defect depth z7 = 2.5 mm is substituted into the time of occurrence of the maximum temperature difference t. max The following can be obtained by calculating from the fitted function:

[0152]

[0153] Calculated value Compared with the true value t max The relative error is calculated as shown in the table below. It can be seen that the relative error is around 1%, and the calculation method of the present invention is relatively accurate.

[0154] Table 6 Error Analysis Results

[0155]

[0156] Then at time t when the maximum temperature difference occurs max Calculate the defect depth z7 given the known conditions and verify the deviation. Calculate the time t at which the maximum temperature difference occurs, as measured experimentally. max Substituting 4.6s into the fast estimation expression for defect depth z, we get:

[0157]

[0158] Calculated value The relative error between the actual value z7 and the actual value z7 is calculated as shown in the table below. It can be seen that the relative error is around 1%, and the calculation method of the present invention is relatively accurate.

[0159] Table 7 Error Analysis Results

[0160]

[0161]

[0162] It should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit it. Although the present invention has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solutions of the present invention without departing from the spirit and scope of the technical solutions of the present invention, and all such modifications or substitutions should be covered within the scope of the claims of the present invention.

[0163] Those skilled in the art will understand that embodiments of this application can be provided as methods, systems, or computer program products. Therefore, this application can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, this application can take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code. The solutions in the embodiments of this application can be implemented in various computer languages, such as the object-oriented programming language Java and the interpreted scripting language JavaScript.

[0164] This application is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of this application. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the flowchart... Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0165] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.

[0166] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.

[0167] Although preferred embodiments of this application have been described, those skilled in the art, upon learning the basic inventive concept, can make other changes and modifications to these embodiments. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments as well as all changes and modifications falling within the scope of this application.

[0168] Obviously, those skilled in the art can make various modifications and variations to this application without departing from the spirit and scope of this application. Therefore, if such modifications and variations fall within the scope of the claims of this application and their equivalents, this application also intends to include such modifications and variations.

Claims

1. A method for rapid estimation of air gap defect depth in a basin-type insulator, characterized in that, include: Obtain the time vector of the occurrence of the maximum surface temperature difference of the target basin insulator containing air gap defects under the first thermal excitation, including: The target basin insulator containing air gap defects is selected from the first preset defect planning table; The first preset defect planning table includes the defect size and defect depth that occur in the actual production process, and the defect depth and defect size are arranged in the rows and columns of the defect planning table according to the first arrangement order; It also includes performing a first thermal excitation on the target basin insulator containing air gap defects; Acquire surface temperature data of the region containing air gap defects under the first thermal excitation; The temperature difference vector of the air gap defect surface is calculated based on the surface temperature data of the region containing the air gap defect under the first thermal excitation, and the maximum temperature difference value is searched from the temperature difference vector of the air gap defect surface. The components of the time vector in which the maximum surface temperature difference occurs are fitted according to the first mathematical model to construct the first fitting model, including: The first fitting model is a mathematical relationship between the time vector of the occurrence of the maximum surface temperature difference under different defect diameters and the defect depth. It also includes: converting the first fitting model from the inverse solution of the relationship model between the time vector of the occurrence of the maximum surface temperature difference and the defect depth into a relationship model between the defect depth and the time vector of the occurrence of the maximum surface temperature difference; Based on the first fitted model, a rapid estimation of the air gap defect depth of the basin-type insulator is performed, including: Obtain the actual defect diameter and the time vector of the occurrence of the maximum actual surface temperature difference of the pot-type insulator under test; Based on the actual defect diameter and the time vector of the occurrence of the maximum temperature difference on the actual surface, and combined with the first fitting model, the depth of the air gap defect in the basin insulator is quickly estimated.

2. The method for rapid estimation of air gap defect depth in basin-type insulators as described in claim 1, characterized in that, Also includes: When a new pot-type insulator needs to be tested, the testing process is initiated directly. The actual defect diameter and the time vector of the occurrence of the maximum temperature difference on the actual surface of the pot-type insulator are calculated. The depth of near-surface porosity defects of the pot-type insulator is then quickly calculated in conjunction with the first fitting model.

3. A rapid estimation system for air gap defect depth in a basin-type insulator, employing the rapid estimation method for air gap defect depth in a basin-type insulator as described in claim 1, characterized in that... include: The parameter acquisition module is used to acquire the time vector of the occurrence of the maximum surface temperature difference of the target basin insulator containing air gap defects under the first thermal excitation. The model building module is used to fit each component in the time vector of the occurrence of the maximum surface temperature difference according to the first mathematical model to construct the first fitting model. The calculation module is used to quickly estimate the depth of air gap defects in basin insulators based on the first fitting model.

4. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that, When the processor executes the computer program, it implements the steps of the method according to any one of claims 1 to 2.

5. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 2.

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