A quartz sensor testing device

Abstract

The application provides a quartz sensor testing device, a quartz sensor is fixedly installed on a support through a fastener and a spring sheet, the support is connected with a measurement and control circuit through an embedded tail welding needle to realize signal connection, the measurement and control circuit is fixedly connected with a bottom plate through a fastener and a damper assembly to realize overall damping, signal interference isolation, a flat top, flexible conductive material and a welding needle structure are used in a hole corresponding to a sensor pin position of the support, a sensor pin is inserted into a corresponding lead hole of the support, the flat top and the flexible conductive material are compressed to realize stable connection, the welding needle is connected with the measurement and control circuit in signal connection, a shielding plate in the support is connected with a power signal ground to realize signal shielding. The application is used for quartz sensor testing and screening, reduces interference, improves testing stability and accuracy, is convenient to disassemble and replace.

Description

Technical Field

[0001] This invention relates to the field of inertial instrument testing technology, and more particularly to a quartz sensor testing device. Background Technology

[0002] Quartz sensors are the core sensitive components in assembling micro inertial instruments. With matching circuitry, they can be assembled into quartz inertial instruments, and their performance determines the performance of the quartz inertial instruments.

[0003] Quartz sensors mainly consist of a quartz sensing structure, a housing, and lead pins. The overall structure is hermetically sealed and features small size and precise structure. The core sensing element of the quartz sensor is the quartz sensing structure, which works based on the piezoelectric effect and Coriolis vibration principle of quartz crystals. The piezoelectric effect causes the driving end to vibrate. When the sensor rotates axially, the Coriolis inertial force causes the driving end to generate a vibration component that is coupled to the detection end. The electrodes on the detection end generate a sensitive charge signal proportional to the angular velocity and the driving vibration displacement through the piezoelectric effect. This charge signal is amplified and demodulated to obtain a DC output proportional to the input angular velocity. By measuring the voltage, the angular velocity signal can be finally obtained.

[0004] Quartz sensing structures are mainly fabricated using micro-machining techniques. Due to the anisotropic nature of quartz materials, coupling stiffness errors can occur during sensor movement. After the quartz sensing structure is encapsulated, these errors can affect the output zero-point change under temperature variations, necessitating temperature performance level screening tests for the quartz sensor.

[0005] Quartz sensors have weak output signals that are easily interfered with. During screening tests, external signal interference such as the sensor's own micro-displacement and micro-vibration must be isolated. The small size of the sensors causes coupling between strong input signals and weak output signals, requiring shielding. Simultaneously, the tests must meet requirements for accuracy, rapid installation, disassembly, and easy replacement. The most accurate screening method is to assemble the product into an inertial instrument for temperature testing. However, the assembly process is complex, and as the sensor is an independent component, unqualified products require disassembly, easily generating a large number of waste components and wasting resources. This method does not meet the requirements for rapid installation and disassembly. Chinese patent CN 111964690A uses screw locking and a round hole socket to test the quartz meter head, which is relatively easy to install. However, problems such as loose round hole sockets, inconvenient disassembly and replacement of parts, poor contact, and a high retest rate result in an inability to quickly and accurately evaluate the temperature performance of quartz sensors. Summary of the Invention

[0006] The present invention aims to solve at least one of the technical problems existing in the prior art.

[0007] Therefore, this invention provides a quartz sensor testing device. This testing device is interference-resistant, highly accurate, easy to disassemble, and facilitates component replacement, solving the performance testing problem of quartz sensors under temperature change conditions, effectively improving production efficiency and meeting the needs of mass production.

[0008] The technical solution of the present invention is as follows: A quartz sensor testing device is provided, comprising: a support, a shielding plate, multiple springs, multiple first fasteners, multiple flexible conductive materials, multiple flat tops, multiple second fasteners, multiple vibration damper assemblies, a measurement and control circuit, and a base plate, wherein:

[0009] The upper end of the bracket has a groove, and the quartz sensor is placed in the groove. Multiple first fasteners are correspondingly arranged with multiple springs. One end of any spring is fixed to the upper surface of the bracket by the corresponding first fastener. The spring can rotate back and forth. The other end of the spring can be selectively pressed onto the quartz sensor to fix the quartz sensor in the groove. The lower end of the bracket has multiple welding pins, and the bracket is welded to the measurement and control circuit through the welding pins. Multiple mounting holes are opened inside the bracket corresponding to the sensor pins, and each hole corresponds to one of the welding pins, the pins of the quartz sensor, the flexible conductive material, and the flat top. The system should be configured such that the flexible conductive material and the flat top are sequentially disposed within corresponding mounting holes, with limiting devices within the holes to prevent the flat top from detaching during use. The flexible conductive material is also connected to corresponding welding pins. When the pins of the quartz sensor are installed downwards within the mounting holes, the flat top presses against the flexible conductive material to achieve a stable electrical connection for the sensor. The bracket internally uses a shielding plate connected to the power signal ground to shield the signals between the sensor's input and output. The flexible conductive material is composed of a mixture of conductive adhesive, indium particles, and silicone rubber, with a mass ratio of 10%–30% conductive adhesive, 45%–85% indium particles, and 5%–25% silicone rubber.

[0010] The measurement and control circuit is fixedly connected to the base plate through the second fastener and the vibration damper assembly.

[0011] Furthermore, the indium particles have a diameter of 100μm-200μm.

[0012] Furthermore, the testing device also includes a housing, which is fixedly connected to the base plate, and all components of the testing device except the base plate are disposed inside the housing.

[0013] Furthermore, the first fastener is a locking screw.

[0014] Furthermore, the second fastener is a screw.

[0015] Furthermore, the testing device also includes a shim disposed between the second fastener and the vibration damper assembly.

[0016] The above technical solution, through the design of a quartz sensor testing device, adopts an integrated vibration damping assembly, bracket, and spring-loaded sensor clamping method to meet the requirements of interference signal isolation and rapid installation and disassembly. By designing a dedicated bracket, employing grooves and mounting holes, fastener locking, compression flat top, flexible conductive materials, welding pins, and shielding, stable electrical connections are achieved, reducing poor contact and solving problems such as weak output signals, shielding isolation, and susceptibility to external interference, thus improving test accuracy. The reciprocating rotation of the spring allows for convenient installation and fixation of the quartz sensor, improving testing efficiency. The integrated vibration damping fastener connection method meets the requirements for rapid component replacement and facilitates batch testing. Attached Figure Description

[0017] The accompanying drawings, which form part of this specification, are provided to further illustrate embodiments of the invention and, together with the textual description, explain the principles of the invention. It is obvious that the drawings described below are merely some embodiments of the invention, and those skilled in the art can obtain other drawings based on these drawings without any creative effort.

[0018] Figure 1 This is a schematic diagram of the structure of the quartz sensor testing device provided in an embodiment of the present invention. Detailed Implementation

[0019] It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other. The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all of them. The following description of at least one exemplary embodiment is merely illustrative and is in no way intended to limit the present invention or its application or use. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0020] It should be noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the exemplary embodiments according to this application. As used herein, the singular form is intended to include the plural form as well, unless the context clearly indicates otherwise. Furthermore, it should be understood that when the terms "comprising" and / or "including" are used in this specification, they indicate the presence of features, steps, operations, devices, components, and / or combinations thereof.

[0021] Unless otherwise specifically stated, the relative arrangement, numerical expressions, and values ​​of the components and steps set forth in these embodiments do not limit the scope of the invention. It should also be understood that, for ease of description, the dimensions of the various parts shown in the drawings are not drawn to actual scale. Techniques, methods, and devices known to those skilled in the art may not be discussed in detail, but where appropriate, such techniques, methods, and devices should be considered part of the specification. In all examples shown and discussed herein, any specific values ​​should be interpreted as merely exemplary and not as limitations. Therefore, other examples of exemplary embodiments may have different values. It should be noted that similar reference numerals and letters in the following figures denote similar items; therefore, once an item is defined in one figure, it need not be further discussed in subsequent figures.

[0022] like Figure 1 As shown, in one embodiment of the present invention, a quartz sensor 1 testing device is provided. The testing device includes: a bracket 2, a shielding plate 14, multiple springs 4, multiple first fasteners 3, multiple flexible conductive materials 12, multiple flat tops 11, multiple second fasteners 5, multiple vibration damper assemblies 7, a measurement and control circuit 8, and a base plate 9. The bracket 2 has a groove at its upper end, and the quartz sensor 1 is disposed in the groove. The multiple first fasteners 3 are correspondingly arranged with the multiple springs 4. One end of any spring 4 is fixed to the upper surface of the bracket 2 by the corresponding first fastener 3. The spring 4 can rotate back and forth, and the other end of the spring 4 can be selectively pressed onto the quartz sensor 1 to fix the quartz sensor 1 in the groove. The lower end of the bracket 2 has multiple welding pins 13, and the bracket 2 is welded to the measurement and control circuit 8 by welding pins. The bracket 2 has multiple... Each mounting hole corresponds to a plurality of welding pins 13, a plurality of pins of the quartz sensor 1, a plurality of flexible conductive materials 12, and a plurality of flat tops 11. The flexible conductive materials 12 and the flat tops 11 are sequentially arranged in the corresponding mounting holes. The flexible conductive materials 12 are also connected to the corresponding welding pins 13. When the pins of the quartz sensor 1 are installed downward in the mounting holes, the flat tops 11 press down on the flexible conductive materials 12 to achieve a stable electrical connection of the sensor. The bracket 2 uses a shielding plate 14 connected to the power signal ground to achieve signal shielding between the sensor input and output. The flexible conductive material 12 is composed of a mixture of conductive adhesive, indium particles, and silicone rubber, with a mass ratio of 10% to 30% conductive adhesive, 45% to 85% indium particles, and 5% to 25% silicone rubber. The measurement and control circuit 8 is fixedly connected to the base plate 9 through the second fastener 5 and the vibration damper assembly 7.

[0023] That is, the quartz sensor 1 is fixedly mounted on the bracket 2 by fasteners and spring 4, and the bracket 2 is connected to the measurement and control circuit 8 by the embedded tail welding pin 13. The measurement and control circuit 8 is fixed to the base plate 9 by fasteners and vibration damper assembly 7 to achieve overall vibration reduction and reduce signal interference. The bracket 2 hole adopts a structure of flat top 11, flexible conductive material and welding pin 13. The sensor pin is inserted into the hole of the bracket 2, and the flat top 11 and flexible conductive material are compressed to achieve a stable connection. The welding pin 13 is connected to the measurement and control circuit 8 for signal connection. The shielding plate 14 in the bracket is connected to the power signal ground to achieve shielding.

[0024] By employing the above technical solutions, the isolation of interference signals and the requirements for rapid installation and disassembly are achieved through the use of an integrated vibration damping assembly, a bracket, and a spring-loaded sensor clamping method. The bracket design, incorporating grooves and mounting holes, fastener locking, a compressed flat top, flexible conductive materials, and shielding, ensures stable electrical connections, reduces poor contact, and resolves issues such as weak output signals, signal shielding, and susceptibility to external interference, thereby improving test accuracy. Furthermore, the use of a spring for reciprocating rotation facilitates convenient installation and fixation of the quartz sensor, while the integrated vibration damping fastener connection method meets the requirements for rapid installation, disassembly, and component replacement, facilitating batch testing and improving testing efficiency.

[0025] Preferably, the indium particle diameter is 100μm-200μm.

[0026] Preferably, the testing device further includes a housing 10, which is fixedly connected to the base plate 9, and all components of the testing device except the base plate 9 are disposed inside the housing 10.

[0027] That is, the outer casing 10 is placed on the base plate 9, and the shock absorber assembly 7 and the outer casing 10 can isolate external vibrations and other interference.

[0028] According to one embodiment of the present invention, the first fastener 3 is a locking screw.

[0029] According to one embodiment of the present invention, the second fastener 5 is a screw.

[0030] Preferably, the testing device further includes a shim 6 disposed between the second fastener 5 and the vibration damper assembly 7.

[0031] The testing device of the present invention will be described in detail below with reference to a specific embodiment.

[0032] like Figure 1As shown, a quartz sensor testing device includes a bracket 2, a vibration damper assembly 7, a measurement and control circuit 8, a base plate 9, and a housing 10. The quartz sensor 1 is fixedly mounted on the bracket 2 by locking screws and a spring 4. The spring 4 can be easily installed and fixed by rotating back and forth without disassembly. The bracket 2 is electrically connected to the measurement and control circuit 8 by a solder pin 13 embedded at its tail, outputting the sensor signal to the measurement and control circuit 8. Sensor performance is obtained through external signal acquisition and analysis. The bracket 2 is easy to assemble and disassemble, with internal mounting holes for easy sensor insertion and removal. Flexible conductive material 12 is placed inside the mounting holes. The flexible conductive material is a mixture of 2g conductive adhesive, 4.5g indium granules (100μm-200μm in diameter), and 1g silicone adhesive. When the sensor pins are installed downwards, the flexible conductive material 12 is pressed by the flat top 11 to achieve a stable electrical connection of the sensor. At the same time, the shielding plate 14 inside the bracket is connected to the power signal ground to shield the signal between the sensor input and output, thereby achieving the purpose of anti-interference. The measurement and control circuit 8 is fixedly connected to the base plate 9 by screws, washers 6, and vibration damper assembly 7, which is easy to replace. The outer shell 10 is placed on the base plate 9. The vibration damper assembly 7 and the outer shell 10 can isolate external vibration and other interference.

[0033] For ease of description, spatial relative terms such as "above," "on top of," "on the upper surface of," "above," etc., are used herein to describe the spatial positional relationship of a device or feature as shown in the figures to other devices or features. It should be understood that spatial relative terms are intended to encompass different orientations in use or operation beyond the orientation of the device as described in the figures. For example, if the device in the figures were inverted, a device described as "above" or "on top of" other devices or structures would subsequently be positioned as "below" or "under" other devices or structures. Thus, the exemplary term "above" can include both "above" and "below." The device may also be positioned in other different ways (rotated 90 degrees or in other orientations), and the spatial relative descriptions used herein will be interpreted accordingly.

[0034] Furthermore, it should be noted that the use of terms such as "first" and "second" to define components is merely for the purpose of distinguishing the corresponding components. Unless otherwise stated, the above terms have no special meaning and therefore should not be construed as limiting the scope of protection of this invention.

[0035] The above description is merely a preferred embodiment of the present invention and is not intended to limit the invention. Various modifications and variations can be made to the present invention by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. A quartz sensor testing device, characterized in that, The testing device includes: a bracket, a shielding plate, multiple springs, multiple first fasteners, multiple flexible conductive materials, multiple flat tops, multiple second fasteners, multiple vibration damper assemblies, a measurement and control circuit, and a base plate, wherein: The upper end of the bracket has a groove, and the quartz sensor is placed in the groove. Multiple first fasteners are correspondingly arranged with multiple springs. One end of any spring is fixed to the upper surface of the bracket by the corresponding first fastener. The spring can rotate back and forth. The other end of the spring can be selectively pressed onto the quartz sensor to fix the quartz sensor in the groove. The lower end of the bracket has multiple welding pins, and the bracket is welded to the measurement and control circuit through the welding pins. Multiple mounting holes are opened inside the bracket corresponding to the sensor pins, and each hole corresponds to one of the welding pins, the pins of the quartz sensor, the flexible conductive material, and the flat top. The system should be configured such that the flexible conductive material and the flat top are sequentially disposed within corresponding mounting holes, with limiting devices within the holes to prevent the flat top from detaching during use. The flexible conductive material is also connected to corresponding welding pins. When the pins of the quartz sensor are installed downwards within the mounting holes, the flat top presses against the flexible conductive material to achieve a stable electrical connection for the sensor. The bracket internally uses a shielding plate connected to the power signal ground to shield the signals between the sensor's input and output. The flexible conductive material is composed of a mixture of conductive adhesive, indium particles, and silicone rubber, with a mass ratio of 10%~30% conductive adhesive, 45%~85% indium particles, and 5%~25% silicone rubber. The measurement and control circuit is fixedly connected to the base plate through the second fastener and the vibration damper assembly.

2. The quartz sensor testing device according to claim 1, characterized in that, The diameter of the indium particles is 100μm-200μm.

3. The quartz sensor testing device according to claim 1, characterized in that, The testing device also includes a housing, which is fixedly connected to the base plate. All components of the testing device except the base plate are housed within the housing.

4. A quartz sensor testing device according to any one of claims 1-3, characterized in that, The first fastener is a locking screw.

5. A quartz sensor testing device according to claim 4, characterized in that, The second fastener is a screw.

6. The quartz sensor testing device according to claim 1, characterized in that, The testing device also includes a shim disposed between the second fastener and the vibration damper assembly.

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