Capacitance tester, capacitance testing method and device, electronic equipment and medium

Abstract

The invention provides a capacitance tester, a capacitance test method and device, electronic equipment and a medium. The capacitance tester comprises a test unit, a test selection unit, a sample selection unit, an upper computer and a test calibration unit, the upper computer is respectively connected with the test unit, the test selection unit, the sample selection unit and the test calibration unit; the test selection unit is connected with the test unit and the sample selection unit. The capacitor test comprises the following steps: acquiring first test data of a target capacitor; collecting second test data of the target capacitor on the at least two sample seats; calibrating third test data of the target capacitor according to the first test data and the second test data; and determining a test result of the target capacitor according to the third test data, and generating a test report. The beneficial effects of the invention are that the automatic and high-efficiency test of the aluminum electrolytic capacitor is realized, and the test precision is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of power and signal measurement and control, and in particular to a capacitor tester and a capacitor testing method, device, electronic equipment and medium. Background Art

[0002] Capacitors are one of the most basic components in circuit systems, and they play roles such as DC support and filtering in circuit systems. Aluminum electrolytic capacitors are widely used in electrical devices such as automobiles, photovoltaics, and home appliances due to their advantages such as large specific capacity, and the number of applications is huge. Once there are batch quality problems with aluminum electrolytic capacitors at the application end, it will cause huge economic losses and affect the reputation of the company. In order to avoid major quality problems as much as possible, aluminum electrolytic capacitors need to be tested and evaluated before being put into production. The speed and accuracy of the key parameter test of aluminum electrolytic capacitors directly determines the coverage and effectiveness of reliability assurance activities such as inspection, evaluation, and failure analysis. In general, a single capacitor parameter is directly tested using a test instrument and the test results are manually recorded. There are problems such as low test efficiency and the accuracy of the test is affected by the level of the tester. Summary of the invention

[0003] The main purpose of the embodiments of the present invention is to provide a capacitor tester and a capacitor testing method, device, electronic equipment and medium, which realizes the automation and high-efficiency testing of aluminum electrolytic capacitors and improves the testing accuracy.

[0004] One aspect of the present invention provides a capacitance tester, including a test unit, a test selection unit, a sample selection unit, a host computer and a test calibration unit;

[0005] The host computer is respectively connected to the test unit, the test selection unit, the sample selection unit and the test calibration unit; the test selection unit is respectively connected to the test unit and the sample selection unit;

[0006] The test selection unit is used to determine the type of the test unit connected to the test loop, and the test unit is used to perform the test and record the test data; the sample selection unit is used to connect the capacitors to be tested to the test loop in sequence according to the test order of the capacitors to be tested;

[0007] The host computer is used to select the type of the test unit, switch the conversion switch of the test selection unit to access the test loop, and collect the test data;

[0008] The test calibration unit is used to calibrate the test data.

[0009] According to the capacitance tester, the sample selection unit adopts a test frame, and the test frame includes a sample holder, a relay board, a main control board and a power supply board;

[0010] The sample holder adopts a spring as the main structure, and the spring is used to connect the positive electrode and the negative electrode of the aluminum electrolytic capacitor to be tested;

[0011] The relay board is connected to the test circuit and the positive and negative electrodes of the aluminum electrolytic capacitor through the main contact. When the coil of the relay board is energized, the main contact is connected; when the coil of the relay board is de-energized, the main contact is disconnected; the energization and de-energization of the coil of the relay board are controlled by the main control board;

[0012] The main control board adopts a single-chip microcomputer, and the main control board is connected to the coil of the relay on the relay board through an output port, and the main control board is connected to the host computer through MODBUS RTU communication protocol and RS485 half-duplex mode;

[0013] The power board and the main control board are arranged in the same PCB board, and the power board is used to receive the 220V voltage and convert it into a direct current power supply to power the single chip microcomputer and the relay.

[0014] According to the capacitance tester, it also includes:

[0015] At least two of the test racks are connected in parallel via RS485 and then connected to the host computer via a 485-converter.

[0016] An embodiment of the present invention further discloses a capacitance testing method, comprising:

[0017] Acquire first test data of a target capacitor according to a capacitor test request, wherein the capacitor test request includes at least one of a capacitor value, a capacitor loss, and a capacitor ESR parameter;

[0018] Collecting second test data of the target capacitance on at least two of the sample holders;

[0019] Calibrate the resistance of the circuit of each sample holder according to the target capacitance, and calibrate the third test data of the target capacitance according to the first test data and the second test data, wherein the second test data is used to represent the real test data of the target capacitance;

[0020] A test result of the target capacitance is determined according to the third test data, and a test report is generated.

[0021] According to the capacitance test method, collecting the second test data of the target capacitance on at least two of the sample holders includes:

[0022] The test data of at least two target capacitors on at least two sample holders are obtained, and the average test value of the relay breaking action is calculated as the second test data.

[0023] According to the capacitance testing method, the resistance of each circuit of the sample holder is calibrated according to the target capacitance, and the third test data of the target capacitance is calibrated according to the first test data and the second test data, including:

[0024] Calculate the test circuit calibration resistance R of each sample holder Ji , the calculation formula is

[0025]

[0026] Where i = 1-k, where k is the number of sample holders, n is the number of target capacitors, R Cni is the second test data, used to standardize the average test value of relay disconnection m times on k sample holders; RBn is the first test data, used to represent the first test data directly collected from n capacitors;

[0027] Calibrate the resistance R according to the test circuit Ji , the third test data is obtained by calculation, wherein the third test data is

[0028] C Yi =C Xi

[0029] R SYi =R SXi -R Ji

[0030] tanδ Yi =tanδ Xi -2π*f*C Xi *R Ji

[0031] The test results of the first test data of the target capacitance are C Xi , R SXi and tanδ Xi , the test result of the third test data of the target capacitance is C Yi , R SYi and tanδ SY , where C, R, and tanδ represent the capacitance value, capacitance loss, and capacitance ESR parameters, respectively.

[0032] According to the capacitance testing method, the test request further includes testing the capacitance leakage current of the target capacitance, including:

[0033] At least two pairs of relays are controlled to be disconnected in sequence so that at least two capacitors are connected to the test circuit. After each relay disconnection action, the test unit is controlled to perform the test according to the preset test process and read the test result.

[0034] Another aspect of an embodiment of the present invention provides a capacitance testing device, comprising:

[0035] A first module is used to obtain a capacitance test request and obtain first test data of a target capacitance, wherein the capacitance test request includes at least one of a capacitance value, a capacitance loss and a capacitance ESR parameter;

[0036] A second module is used to collect second test data of the target capacitance on at least two of the sample holders;

[0037] A third module is used to calibrate the resistance of the circuit of each sample holder according to the target capacitance, and to calibrate the third test data of the target capacitance according to the first test data and the second test data, wherein the second test data is used to represent the real test data of the target capacitance;

[0038] The fourth module is used to determine the test result of the target capacitor according to the third test data and generate a test report.

[0039] Another aspect of an embodiment of the present invention provides an electronic device, including a processor and a memory;

[0040] The memory is used to store programs;

[0041] The processor executes the program to implement the method described above.

[0042] The embodiment of the present invention also discloses a computer program product or a computer program, which includes a computer instruction stored in a computer-readable storage medium. A processor of a computer device can read the computer instruction from the computer-readable storage medium, and the processor executes the computer instruction, so that the computer device executes the method described above.

[0043] The beneficial effects of the present invention are as follows: the automatic test of key parameters of aluminum capacitors is realized by integrating a test unit, a test selection unit, a sample selection unit, a host computer and a test calibration unit through a host computer, and the capacitor test stand with an integrated single-chip computer automatic control function realizes the function of connecting capacitors to be tested at different positions to a test circuit, has good scalability, can support a one-time large sample volume aluminum electrolytic capacitor parameter test, and improves the test efficiency; the test accuracy is improved by calibrating the automatic test device and calibrating the test results through the host computer.

[0044] Additional aspects and advantages of the present invention will be given in part in the following description and in part will be obvious from the following description, or will be learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0045] The above and / or additional aspects and advantages of the present invention will become apparent and easily understood from the description of the embodiments in conjunction with the following drawings, in which:

[0046] Figure 1 It is a schematic diagram of the overall structure of a capacitor tester according to an embodiment of the present invention.

[0047] Figure 2 Schematic diagram of a test stand according to an embodiment of the present invention.

[0048] Figure 3a and Figure 3b It is a schematic diagram of the structure of the sample holder and the sample holder retaining spring according to an embodiment of the present invention.

[0049] Figure 4a and Figure 4b Schematic diagram of a relay board according to an embodiment of the present invention.

[0050] Figure 5 It is a schematic diagram of the circuit principle of the test stand according to an embodiment of the present invention.

[0051] Figure 6 It is a schematic diagram of the principle of a multi-test rack parallel circuit according to an embodiment of the present invention.

[0052] Figure 7 It is a flow chart of a capacitance testing method according to an embodiment of the present invention.

[0053] Figure 8 The present invention is an embodiment of the aluminum electrolytic capacitor leakage current automatic test flow chart.

[0054] Fig. 9 Schematic diagram of actual test circuit resistance difference of a capacitor according to an embodiment of the present invention.

[0055] Fig.10 2 is a diagram of a capacitance testing and analyzing device according to an embodiment of the present invention. DETAILED DESCRIPTION

[0056] The embodiments of the present invention are described in detail below, and examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements with the same or similar functions. In the subsequent description, the use of suffixes such as "module", "component" or "unit" used to represent elements is only for the purpose of facilitating the description of the present invention, and has no specific meaning in itself. Therefore, "module", "component" or "unit" can be used in a mixed manner. "First", "second" and the like are only used for the purpose of distinguishing technical features, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of indicated technical features or implicitly indicating the order of the indicated technical features. In this subsequent description, the continuous numbering of the method steps is for the convenience of review and understanding. In combination with the overall technical solution of the present invention and the logical relationship between the various steps, adjusting the implementation order between the steps will not affect the technical effect achieved by the technical solution of the present invention. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be understood as limiting the present invention.

[0057] Reference Figure 1 , Figure 1 Schematic diagram of the overall structure of the capacitor tester. It includes a test unit, a test selection unit, a sample selection unit, a host computer and a test calibration unit, wherein C1, C2...Cn represent the aluminum electrolytic capacitor to be tested; the host computer is respectively connected to the test unit, the test selection unit, the sample selection unit and the test calibration unit; the test selection unit is respectively connected to the test unit and the sample selection unit; the test selection unit is used to determine the type of the test unit connected to the test loop, and the test unit is used to perform the test and record the test data; the sample selection unit is used to connect the capacitor to be tested to the test loop in sequence according to the test sequence of the capacitor to be tested; the host computer is used to select the type of the test unit, switch the switch of the test selection unit connected to the test loop, and collect the test data; the test calibration unit is used to calibrate the test data and finally generate it.

[0058] In some embodiments, the test unit represents a device for testing, such as an LCR bridge and an insulation resistance tester, and the test data is read and recorded by a host computer.

[0059] In some embodiments, the test selection unit may be a multi-way switch in various forms, and each test unit may be selectively connected to the test circuit through a selection module. The control of the switch may be switched manually or by a host computer.

[0060] In some embodiments, the sample holder uses a spring clip as the main structure, and the spring clip is used to connect the positive electrode and the negative electrode of the aluminum electrolytic capacitor to be tested.

[0061] In some embodiments, the sample selection unit uses a test rack, which includes a sample holder, a relay board, a main control board, and a power board. For example, Figure 2 The test stand schematic diagram shown in the figure and the reference Figure 3a And reference Figure 3b The sample holder and the schematic diagram of the sample holder spring structure are shown. The sample holder uses a pair of springs as the main structure, which are respectively connected to the positive and negative poles of the aluminum electrolytic capacitor, and can facilitate the direct insertion and removal of the aluminum electrolytic capacitor pins, with good disassembly and stability.

[0062] In some embodiments, the sample holder size can be customized according to the size series of the aluminum electrolytic capacitor being tested, and can implement testing of aluminum electrolytic capacitors with a wider range of pin sizes. For example, the sample holder is suitable for aluminum electrolytic capacitors with a pin spacing of 6-35 mm.

[0063] The relay board connects the test circuit and the positive and negative electrodes of the aluminum electrolytic capacitor through the main contacts. When the coil of the relay board is energized, the main contacts are connected; when the coil of the relay board is de-energized, the main contacts are disconnected; the energization and de-energization of the coil of the relay board are controlled by the main control board.

[0064] In some embodiments, reference Figure 4a and Figure 4b The relay board has 10 pairs of relays. The main contacts of each pair of relays are connected to the test circuit and the positive and negative electrodes of the aluminum electrolytic capacitor respectively. The main contacts of the relays are opened and closed to determine whether the connected capacitor is connected to the test circuit. When the relay coil is energized, the main contacts of the relay are connected; when the relay coil is de-energized, the main contacts of the relay are disconnected; the coils of each pair of relays are energized or not by the output contacts of the main control board.

[0065] In some embodiments, in some embodiments, reference Figure 5 The circuit schematic diagram of the test stand shown in the figure shows that the main control board is a small single-chip microcomputer with 12 output ports. The output ports are connected to 10 pairs of relay coils. The single-chip microcomputer controls the opening and closing of the output ports to realize the power-on and power-off control of the relay coils. The main control board uses the MODBUS RTU communication protocol and communicates with the computer through the RS485 half-duplex mode.

[0066] In some embodiments, the main control board uses a single-chip microcomputer, the main control board is connected to the coil of the relay on the relay board through the output port, and the main control board is connected to the host computer through the MODBUS RTU communication protocol and RS485 half-duplex mode.

[0067] In some embodiments, the power board and the main control board are arranged in the same PCB board, and the power board is used to receive the 220V voltage and convert it into a DC power supply to power the single-chip microcomputer and the relay.

[0068] The power board converts the AC 220V input into a DC 12V output to power the microcontroller and relays. In order to make full use of the space, the power board and the main control board are integrated on the same PCB.

[0069] In some embodiments, reference Figure 6 The test stand of the embodiment of the present invention has an expansion function, refer to Figure 3a It can be known that multiple identical test racks can be connected in parallel through a parallel interface. The test rack of an embodiment of the present invention can connect the test circuits of multiple test racks in parallel and then connect them to the test unit. After multiple test racks 485 are connected in series for communication, they are connected to the host computer through a converter. This can realize the synchronous control of multiple test racks by the host computer, and the test unit can test the sample parameters on multiple test racks.

[0070] In some embodiments, the test calibration unit analyzes and eliminates the system errors of the automated test device to improve the accuracy of the test results. The test calibration unit needs to calibrate the ESR and loss parameter tests.

[0071] In some embodiments, reference Figure 7 A flow chart of a capacitance testing method is provided, which includes but is not limited to steps S100 to S400:

[0072] S100, obtaining first test data of a target capacitor according to a capacitor test request, wherein the capacitor test request includes at least one of a capacitor value, a capacitor loss, and a capacitor ESR parameter.

[0073] In some embodiments, it also includes an automated test of the leakage current of the aluminum electrolytic capacitor. The test process is as follows: Figure 8 The automatic test flow chart of aluminum electrolytic capacitor leakage current is shown in the figure. The leakage current test can ignore the influence of line impedance and does not require calibration. Through the host computer, the 10 pairs of relays in the test frame are controlled to open and close in sequence, and the 10 capacitors are connected to the test circuit in sequence. After each relay action, the insulation resistance tester is controlled by the host computer to perform the test according to the set test process and read the test results LC i , record and export the aluminum electrolytic capacitor leakage current test results.

[0074] In some embodiments, when multiple parameters need to be tested, multiple test units can be tested in sequence.

[0075] S200, collecting second test data of the target capacitance on at least two sample holders.

[0076] In some embodiments, the embodiments of the present invention test the same test target through different sample holders to obtain an average value thereof to determine the second test data.

[0077] In some embodiments, reference Fig. 9 The following is a schematic diagram of the actual test circuit resistance difference of the capacitor. Since the paths of the capacitors at different positions on the sample holder to connect to the test circuit are different, and the contact resistance of each pair of relay main contacts is slightly different, the inherent resistance of the circuit when the capacitors at each position are connected to the test circuit is different. The test circuit resistance is shown below Figure 7 As shown in the figure, when the ESR parameters of aluminum electrolytic capacitors are tested using an LCR bridge without calibration, the test data is actually the sum of the test circuit resistance, relay contact resistance, and capacitor equivalent series resistance.

[0078]

[0079] Where i=1-5, when i=6-10, the actually measured ESR value is similar to the above formula.

[0080] Therefore, before automation is performed, the test selection unit (test rack) needs to be calibrated, including obtaining test data of at least two target capacitors on at least two sample holders, and calculating the average test value of the relay breaking action as the second test data.

[0081] The calibration process is as follows: Use a bridge to directly test the ESR parameters of three aluminum electrolytic capacitors through the capacitor pins, assuming they are R B1 , R B2 , R B3 ; Use the bridge to test the ESR parameters of 3 capacitors on 10 sample holders respectively through the test stand, assuming that they are R C1i , R C2i , R C3i (where i = 1-10, which is the average value obtained by measuring three times the relay opens and closes).

[0082] S300, calibrating the resistance of the circuit of each sample holder according to the target capacitance, and calibrating the third test data of the target capacitance according to the first test data and the second test data, wherein the second test data is used to represent the real test data of the target capacitance.

[0083] For example, the test circuit calibration resistance R of each sample holder is calculated Ji (where i = 1-10), the calculation formula is as follows:

[0084]

[0085] Where i=1-10.

[0086] Based on the above calibration results, the capacitance, ESR and

[0087] damage

[0088] The test results of consumption are C Xi , R SXi and tanδ Xi , then the actual parameter of the capacitor should be C Yi , R SYi and tanδ SYi :

[0089] C Yi =C Xi

[0090] RSYi=RSXi-RJi

[0091] tanδ Yi =tanδ Xi -2π*f*C Xi *R Ji

[0092] Where i=1-10, f is the selected test frequency, and the above calibration process only needs to be performed once to perform continuous automatic testing on the capacitor.

[0093] Through the host computer, the 10 pairs of relays in the test rack are controlled to open and close in sequence, and the 10 capacitors are connected to the test circuit in sequence. 1-5 seconds after each relay action, the LCR bridge test results are read through the host computer. The results are read 5 times in a row at a fixed time interval. The two results with the largest and smallest ESR are discarded, and the average of the remaining three results is taken as the intermediate test result C. Xi , R SXi and tanδ Xi According to the above formula, the intermediate results are converted to obtain the final test result C Yi , R SYi and tanδ SYi , record and export to EXCLE report.

[0094] In some embodiments, the testing and calibration methods for multiple test racks used in parallel are similar to those for a single test rack and will not be described in detail here.

[0095] S400: Determine a test result of the target capacitance according to the third test data, and generate a test report.

[0096] Fig.10 1 is a diagram of a capacitance testing and analyzing device according to an embodiment of the present invention. The device includes a first module 1010 , a second module 1020 , a third module 1030 and a fourth module 1040 .

[0097] Among them, the first module is used to obtain a capacitor test request and obtain first test data of a target capacitor, wherein the capacitor test request includes at least one of capacitor value, capacitor loss and capacitor ESR parameters; the second module is used to collect second test data of the target capacitor in at least two sample holders; the third module is used to calibrate the line resistance of each sample holder according to the target capacitor, and to calibrate the third test data of the target capacitor according to the first test data and the second test data, wherein the second test data is used to characterize the real test data of the target capacitor; the fourth module is used to determine the test result of the target capacitor according to the third test data and generate a test report.

[0098] Exemplarily, with the cooperation of the first module, the second module, the third module and the fourth module in the device, the embodiment device can implement any of the aforementioned capacitance testing methods, that is, according to a capacitance test request, obtaining the first test data of the target capacitance, the capacitance test request including at least one of the capacitance value, capacitance loss and capacitance ESR parameters; collecting the second test data of the target capacitance in at least two sample holders; calibrating the line resistance of each sample holder according to the target capacitance, and calibrating the third test data of the target capacitance according to the first test data and the second test data, the second test data being used to characterize the real test data of the target capacitance; determining the test result of the target capacitance according to the third test data, and generating a test report. The beneficial effects of the present invention are as follows: the automatic test of key parameters of aluminum capacitors is realized by integrating a test unit, a test selection unit, a sample selection unit, a host computer and a test calibration unit through a host computer, and the capacitor test stand with an integrated single-chip computer automatic control function realizes the function of connecting capacitors to be tested at different positions to a test circuit, has good scalability, can support a one-time large sample volume aluminum electrolytic capacitor parameter test, and improves the test efficiency; the test accuracy is improved by calibrating the automatic test device and calibrating the test results through the host computer.

[0099] An embodiment of the present invention further provides an electronic device, the electronic device comprising a processor and a memory;

[0100] The memory stores a program;

[0101] The processor executes the program to execute the aforementioned capacitance test method; the electronic device has the function of carrying and running the capacitance test software system provided by the embodiment of the present invention, for example, a computer, a speed regulator and a speed regulating device.

[0102] An embodiment of the present invention further provides a computer-readable storage medium, wherein the storage medium stores a program, and the program is executed by a processor to implement the capacitance testing method as described above.

[0103] In some selectable embodiments, the function / operation mentioned in the block diagram may not occur in the order mentioned in the operation diagram. For example, depending on the function / operation involved, the two boxes shown in succession can actually be executed substantially simultaneously or the boxes can sometimes be executed in reverse order. In addition, the embodiment presented and described in the flow chart of the present invention is provided by way of example, for the purpose of providing a more comprehensive understanding of technology. The disclosed method is not limited to the operation and logic flow presented herein. Selectable embodiments are expected, wherein the order of various operations is changed and the sub-operation of a part for which is described as a larger operation is performed independently.

[0104] The embodiment of the present invention also discloses a computer program product or a computer program, which includes a computer instruction stored in a computer-readable storage medium. A processor of a computer device can read the computer instruction from the computer-readable storage medium, and the processor executes the computer instruction, so that the computer device executes the aforementioned capacitance testing method.

[0105] In addition, although the present invention is described in the context of functional modules, it should be understood that, unless otherwise specified, one or more of the functions and / or features described may be integrated into a single physical device and / or software module, or one or more functions and / or features may be implemented in separate physical devices or software modules. It is also understood that a detailed discussion of the actual implementation of each module is unnecessary for understanding the present invention. More specifically, in view of the properties, functions, and internal relationships of the various functional modules in the device disclosed herein, the actual implementation of the module will be understood within the conventional skills of the engineer. Therefore, those skilled in the art can implement the present invention set forth in the claims without excessive experimentation using ordinary techniques. It is also understood that the specific concepts disclosed are merely illustrative and are not intended to limit the scope of the present invention, which is determined by the full scope of the appended claims and their equivalents.

[0106] If the functions are implemented in the form of software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, or the part that contributes to the prior art or the part of the technical solution, can be embodied in the form of a software product. The computer software product is stored in a storage medium, including several instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the methods described in each embodiment of the present invention. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk, etc., which can store program codes.

[0107] The logic and / or steps represented in the flowchart or otherwise described herein, for example, can be considered as an ordered list of executable instructions for implementing logical functions, and can be embodied in any computer-readable medium for use by an instruction execution system, device or apparatus (such as a computer-based system, a system including a processor, or other system that can fetch instructions from an instruction execution system, device or apparatus and execute instructions), or in conjunction with such instruction execution systems, devices or apparatuses. For the purposes of this specification, "computer-readable medium" can be any device that can contain, store, communicate, propagate or transmit a program for use by an instruction execution system, device or apparatus, or in conjunction with such instruction execution systems, devices or apparatuses.

[0108] More specific examples of computer-readable media (a non-exhaustive list) include the following: an electrical connection with one or more wires (electronic device), a portable computer disk case (magnetic device), a random access memory (RAM), a read-only memory (ROM), an erasable and programmable read-only memory (EPROM or flash memory), an optical fiber device, and a portable compact disk read-only memory (CDROM). In addition, the computer-readable medium may even be a paper or other suitable medium on which the program is printed, since the program may be obtained electronically, for example, by optically scanning the paper or other medium, followed by editing, deciphering or, if necessary, processing in another suitable manner, and then stored in a computer memory.

[0109] It should be understood that the various parts of the present invention can be implemented by hardware, software, firmware or a combination thereof. In the above-mentioned embodiments, a plurality of steps or methods can be implemented by software or firmware stored in a memory and executed by a suitable instruction execution system. For example, if implemented by hardware, as in another embodiment, it can be implemented by any one of the following technologies known in the art or their combination: a discrete logic circuit having a logic gate circuit for implementing a logic function for a data signal, a dedicated integrated circuit having a suitable combination of logic gate circuits, a programmable gate array (PGA), a field programmable gate array (FPGA), etc.

[0110] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "examples", "specific examples", or "some examples" means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner.

[0111] Although the embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the claims and their equivalents.

[0112] The above is a specific description of the preferred implementation of the present invention, but the present invention is not limited to the described embodiments. Those skilled in the art may make various equivalent modifications or substitutions without violating the spirit of the present invention. These equivalent modifications or substitutions are all included in the scope defined by the claims of this application.

Claims

1. A capacitance tester, characterized in that: It includes a test unit, a test selection unit, a sample selection unit, a host computer and a test calibration unit; The host computer is respectively connected to the test unit, the test selection unit, the sample selection unit and the test calibration unit; the test selection unit is respectively connected to the test unit and the sample selection unit; The test selection unit is used to determine the type of the test unit connected to the test loop, and the test unit is used to perform the test and record the test data; the sample selection unit is used to connect the capacitors to be tested to the test loop in sequence according to the test order of the capacitors to be tested; The host computer is used to select the type of the test unit, switch the conversion switch of the test selection unit to access the test loop, and collect the test data; The test calibration unit is used to calibrate the test data.

2. The capacitance tester according to claim 1, characterized in that: The sample selection unit adopts a test frame, which includes a sample holder, a relay board, a main control board and a power supply board; The sample holder adopts a spring as the main structure, and the spring is used to connect the positive electrode and the negative electrode of the aluminum electrolytic capacitor to be tested; The relay board is connected to the test circuit and the positive and negative electrodes of the aluminum electrolytic capacitor through the main contact. When the coil of the relay board is energized, the main contact is connected; when the coil of the relay board is de-energized, the main contact is disconnected; the energization and de-energization of the coil of the relay board are controlled by the main control board; The main control board adopts a single-chip microcomputer, and the main control board is connected to the coil of the relay on the relay board through an output port, and the main control board is connected to the host computer through MODBUS RTU communication protocol and RS485 half-duplex mode; The power board and the main control board are arranged in the same PCB board, and the power board is used to receive the 220V voltage and convert it into a direct current power supply to power the single chip microcomputer and the relay.

3. The capacitance tester according to claim 2, characterized in that: Also includes: At least two of the test racks are connected in parallel via RS485 and then connected to the host computer via a 485-converter.

4. A capacitance testing method according to any one of claims 1 to 3, characterized in that: include: Acquire first test data of a target capacitor according to a capacitor test request, wherein the capacitor test request includes at least one of a capacitor value, a capacitor loss, and a capacitor ESR parameter; Collecting second test data of the target capacitance on at least two of the sample holders; Calibrate the resistance of the circuit of each sample holder according to the target capacitance, and calibrate the third test data of the target capacitance according to the first test data and the second test data, wherein the second test data is used to represent the real test data of the target capacitance; A test result of the target capacitance is determined according to the third test data, and a test report is generated.

5. The capacitance testing method according to claim 4, characterized in that: The collecting of second test data of the target capacitance on at least two of the sample holders comprises: The test data of at least two target capacitors on at least two sample holders are obtained, and the average test value of the relay breaking action is calculated as the second test data.

6. The capacitance testing method according to claim 4, characterized in that: The circuit calibration resistance of each sample holder according to the target capacitance, and the third test data of the target capacitance are calibrated according to the first test data and the second test data, including: Calculate the test circuit calibration resistance R of each sample holder Ji , the calculation formula is Where i = 1-k, where k is the number of sample holders, n is the number of target capacitors, R Cni is the second test data, used to standardize the average test value of relay disconnection m times on k sample holders; RBn is the first test data, used to represent the first test data directly collected from n capacitors; Calibrate the resistance R according to the test circuit Ji , the third test data is obtained by calculation, wherein the third test data is C Yi =C Xi R SYi =R SXi -R Ji tanδ Yi =tanδ Xi -2π*f*C Xi *R Ji The test results of the first test data of the target capacitance are C Xi , R SXi and tanδ Xi , the test result of the third test data of the target capacitance is C Yi , R SYi and tanδ SY , where C, R, and tanδ represent the capacitance value, capacitance loss, and capacitance ESR parameters, respectively.

7. The capacitance testing method according to claim 4, wherein the test request further comprises testing a capacitance leakage current of the target capacitance, comprising: At least two pairs of relays are controlled to be disconnected in sequence so that at least two capacitors are connected to the test circuit. After each relay disconnection action, the test unit is controlled to perform the test according to the preset test process and read the test result.

8. A capacitance testing device, characterized in that: include: A first module is used to obtain a capacitance test request and obtain first test data of a target capacitance, wherein the capacitance test request includes at least one of a capacitance value, a capacitance loss and a capacitance ESR parameter; A second module is used to collect second test data of the target capacitance on at least two of the sample holders; A third module is used to calibrate the resistance of the circuit of each sample holder according to the target capacitance, and to calibrate the third test data of the target capacitance according to the first test data and the second test data, wherein the second test data is used to represent the real test data of the target capacitance; The fourth module is used to determine the test result of the target capacitor according to the third test data and generate a test report.

9. An electronic device, characterized in that: including a processor and a memory; The memory is used to store programs; The processor executes the program to implement the capacitance testing method according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: The storage medium stores a program, and the program is executed by a processor to implement the capacitance testing method according to any one of claims 1 to 7.

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