Calibration method, device, equipment, medium, X-ray generator and CT equipment

Abstract

The invention provides a filament calibration method and device, electronic equipment, a storage medium, a program product, an X-ray generator and CT equipment. The lamp filament calibration method is used for correcting the mapping relation between the sampling current of a lamp filament in an X-ray generator and the tube current of a ray generating tube, the mapping relation comprises a lamp filament correction coefficient, and the method comprises the following steps: connecting a high-voltage power supply and the ray generating tube, and obtaining the sampling current of the ray generating tube as a first sampling current; when the first sampling current is equal to a preset current, acquiring a sampling current of the filament as a second sampling current; and according to the second sampling current and a preset filament preheating current, a filament correction coefficient is calibrated, and a set relation exists between the set current and the filament preheating current.

Description

Technical Field

[0001] The present disclosure relates to the field of security inspection technology, and more specifically, to a filament calibration method, a calibration device, an electronic device, a storage medium, a program product, an X-ray generator, and a CT device. Background Art

[0002] The X-ray generator is the core component of the CT security inspection equipment. The X-ray generator includes a high-voltage power supply and an X-ray tube. The X-ray tube is a component that generates X-rays and converts electrical energy into X-rays. The filament and the ray generating tube are part of the X-ray tube. The high-voltage power supply generates a 300V DC voltage that passes through a push-pull circuit to obtain an AC voltage of ±150V, which is then output to the filament through a filament transformer. Figure 7 As shown in the figure, there is a specific relationship between the filament current and the tube current of the ray generating tube, which is also called the filament characteristic curve. For a given filament, within a certain range, the larger the filament current, the larger the tube current. Figure 7 It can be seen that the relationship between tube current and filament current is an exponential nonlinear relationship.

[0003] Therefore, it is understandable that inaccurate filament current sampling will cause many problems. Compared with the sampled filament current, if the actual filament current is smaller, it will cause the tube current to respond slowly during the beam generation process; if the actual filament current is larger, it will cause the tube current to overshoot during beam generation, and will also affect the service life of the filament. In the prior art, for the ray generator of CT security inspection equipment, a filament tool is generally used to correct the error caused by the filament current sampling.

[0004] Specifically, the principle of the filament fixture is to simulate the filament with a resistor whose resistance is close to that of the filament. The filament fixture includes an ammeter to measure the actual filament current.

[0005] The filament current sampling formula is: I smp =k T ×k S ×k C ×I fila .

[0006] Among them, I smp is the filament current sampling value, k T is the filament transformer ratio, k S is the filament current sensor ratio, k C is the ratio of the filament current sampling signal conditioning circuit, I fila is the actual filament current.

[0007] It can be seen from the filament current sampling formula that the filament current sampling error correction method based on the filament tooling can correct the errors of the filament transformer, filament current sensor, and filament current sampling signal conditioning circuit. This method requires the actual filament current in the ammeter to be manually input into the host computer software to achieve the calibration of the filament current sampling error.

[0008] It is understandable that when the high-voltage power supply or X-ray generator of the CT equipment is replaced, it is necessary to calibrate the mapping relationship between the sampling current of the filament and the tube current of the ray generating tube, so as to facilitate the accurate control of the tube current according to the sampling current of the filament. However, there are differences in the filament characteristic curves between different filaments and ray generating tubes, and due to the current sampling error, there is a difference between the sampling current of the filament and the actual current, which makes the mapping relationship between the sampling current of the filaments of different X-ray generators and the tube current of the ray generating tube unstable, and errors will occur when adjusting the tube current of the ray generating tube according to the sampling current of the filament. The filament current sampling error correction method based on the filament tooling can only correct the filament current sampling error, and cannot correct the mapping relationship between the sampling current of the filament and the tube current of the ray generating tube.

[0009] In addition, the filament current sampling error correction method based on the filament tooling needs to rely on customized filament tooling, which is costly. When calibrating the CT equipment on site, not only the filament tooling is required, but also the X-ray tube of the CT equipment needs to be disassembled, which is a cumbersome step. Summary of the invention

[0010] In view of this, the present disclosure provides a filament calibration method, a calibration device, an electronic device, a storage medium, a program product, an X-ray generator and a CT device that are efficient, accurate, low-cost and easy to operate.

[0011] One aspect of the present disclosure provides a filament calibration method for calibrating a mapping relationship between a sampled current of a filament in an X-ray generator and a tube current of a ray generating tube, wherein the mapping relationship includes a filament correction coefficient. The method includes: connecting a high voltage power supply to the ray generating tube, and acquiring a sampled current of the ray generating tube as a first sampled current; when the first sampled current is equal to a preset set current, acquiring a sampled current of the filament as a second sampled current; and calibrating the filament correction coefficient according to the second sampled current and a preset filament preheating current, wherein the set current and the filament preheating current have a set relationship.

[0012] According to the filament calibration method of the embodiment of the present disclosure, by connecting the high-voltage power supply and the ray generating tube, the sampling current of the ray generating tube can be obtained as the first sampling current; then when the first sampling current is equal to the preset set current, the sampling current of the filament can be obtained as the second sampling current; according to the second sampling current and the preset filament preheating current, the filament correction coefficient can be calibrated, wherein there is a set relationship between the set current and the filament preheating current.

[0013] The method disclosed in the present invention sets a filament preheating current in advance, and sets a set relationship between the set current and the filament preheating current, so that the meaning of the filament preheating current is: the tube current of the ray generating tube reaches a specific value, that is, when the current is set, if the sampled value of the filament current, that is, the second sampled current is equal to the filament preheating current, it means that the sampled value of the filament current is closer to the actual value. If the sampled value of the filament current is not equal to the filament preheating current, it means that the sampled value of the filament current is deviated from the actual value. At this time, the filament correction coefficient can be corrected according to the relationship between the second sampled current and the pre-set filament preheating current, so as to realize the mapping relationship between the sampled current of the filament in the X-ray generator and the tube current of the ray generating tube. The mapping relationship comprehensively considers the sampling error of the filament current and the difference in the filament characteristic curve between different filaments and the ray generating tube, and realizes the efficient and accurate correction of the mapping relationship between the sampled current of the filament in the X-ray generator and the tube current of the ray generating tube. In addition, the method disclosed in the present invention does not need to rely on customized filament tooling, and the cost is low. There is no need to disassemble the X-ray generator, and it is easy to operate.

[0014] In some embodiments, the step of calibrating the filament correction coefficient according to the second sampling current and a preset filament preheating current includes: determining the current filament correction coefficient according to the second sampling current, the preset filament preheating current and the previous filament correction coefficient, wherein when the current time is the first time, the previous filament correction coefficient is the initially set filament correction coefficient; and replacing the previous filament correction coefficient with the current filament correction coefficient.

[0015] In some embodiments, the step of presetting the filament preheating current includes: obtaining sampled currents of m experimental ray generating tubes as m first experimental sampled currents, wherein m is an integer greater than or equal to 2; when the m first experimental sampled currents are all equal to the set current, obtaining sampled currents of m experimental filaments corresponding one-to-one to the m experimental ray generating tubes as m second experimental sampled currents; and calculating an average value of the m second experimental sampled currents as the filament preheating current.

[0016] In some embodiments, the step of presetting the filament preheating current includes: sampling the sampling current of the experimental ray generating tube as the first experimental sampling current; when the first experimental sampling currents are equal to the set current, obtaining the sampling current of the experimental filament corresponding to the experimental ray generating tube as the second experimental sampling current; repeatedly sampling the sampling current of the experimental ray generating tube as the first experimental sampling current; when the first experimental sampling currents are equal to the set current, obtaining the sampling current of the experimental filament corresponding to the experimental ray generating tube as the second experimental sampling current n times, and obtaining n second experimental sampling currents, wherein n is an integer greater than or equal to 2; and calculating the average value of the n second experimental sampling currents as the filament preheating current.

[0017] In some embodiments, the set current is: 10% of the rated current, 20% of the rated current, 30% of the rated current, 40% of the rated current, 50% of the rated current, 60% of the rated current, 70% of the rated current, 80% of the rated current, 90% of the rated current or the rated current.

[0018] Another aspect of the present disclosure provides a filament calibration device for calibrating a mapping relationship between a sampled current of a filament in an X-ray generator and a tube current of a ray generating tube, wherein the mapping relationship includes a filament correction coefficient, and the device includes: a first sampling module, wherein the first sampling module is used to connect a high voltage power supply to the ray generating tube, and obtain a sampled current of the ray generating tube as a first sampled current; a second sampling module, wherein the second sampling module is used to obtain a sampled current of the filament as a second sampled current when the first sampled current is equal to a preset set current; and a calibration module, wherein the calibration module is used to calibrate the filament correction coefficient according to the second sampled current and a preset filament preheating current, wherein the set current and the filament preheating current have a set relationship.

[0019] According to the filament calibration device of the embodiment of the present disclosure, by connecting the high-voltage power supply and the ray generating tube, the sampling current of the ray generating tube can be obtained as the first sampling current; then when the first sampling current is equal to the preset set current, the sampling current of the filament can be obtained as the second sampling current; according to the second sampling current and the preset filament preheating current, the filament correction coefficient can be calibrated, wherein there is a set relationship between the set current and the filament preheating current.

[0020] The device disclosed in the present invention sets a filament preheating current in advance, and sets a set relationship between the set current and the filament preheating current, so that the meaning of the filament preheating current is: when the tube current of the ray generating tube reaches a specific value, that is, when the current is set, if the sampled value of the filament current, that is, the second sampled current is equal to the filament preheating current, it means that the sampled value of the filament current is closer to the actual value. If the sampled value of the filament current is not equal to the filament preheating current, it means that there is a deviation between the sampled value of the filament current and the actual value. At this time, the filament correction coefficient can be corrected according to the relationship between the second sampled current and the pre-set filament preheating current, so as to realize the mapping relationship between the sampled current of the filament in the X-ray generator and the tube current of the ray generating tube. The mapping relationship comprehensively considers the sampling error of the filament current and the difference in the filament characteristic curve between different filaments and the ray generating tube, and realizes the efficient and accurate correction of the mapping relationship between the sampled current of the filament in the X-ray generator and the tube current of the ray generating tube. In addition, the method disclosed in the present invention does not need to rely on customized filament tooling, and the cost is low. No need to disassemble the X-ray generator, easy to operate.

[0021] Another aspect of the present disclosure provides an electronic device, comprising one or more processors and one or more memories, wherein the memories are used to store executable instructions, and when the executable instructions are executed by the processors, the above-mentioned method is implemented.

[0022] Another aspect of the present disclosure provides a computer-readable storage medium storing computer-executable instructions, which are used to implement the above method when executed.

[0023] Another aspect of the present disclosure provides a computer program product, comprising a computer program, wherein the computer program comprises computer executable instructions, and the instructions are used to implement the method as described above when executed.

[0024] Another aspect of the present disclosure provides an X-ray generator using the filament calibration method as described above, comprising: a ray generating tube, the ray generating tube comprising a tube shell with a vacuum interior and an anode and a cathode arranged in the tube shell; a high-voltage power supply for providing high voltage between the cathode and the anode; a filament, the filament being electrically connected to the cathode; and a filament transformer, the filament transformer being electrically connected to the filament and being used to provide voltage to the filament.

[0025] In some examples, after correction by the above-mentioned filament calibration method and filament calibration device, the problem of slow dynamic current response of the ray generating tube during beam emission due to the actual filament current being too small, or the problem of overshoot of the current of the ray generating tube during beam emission due to the actual filament current being too large, which affects the service life of the filament, can be avoided.

[0026] Another aspect of the present disclosure provides a CT device, which includes the X-ray generator as described above.

[0027] In some examples, after correction by the above-mentioned filament calibration method and filament calibration device, the problem of slow dynamic current response of the ray generating tube during beam emission due to the actual filament current being too small, or the problem of overshoot of the current of the ray generating tube during beam emission due to the actual filament current being too large, which affects the service life of the filament, can be avoided. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] The above and other objects, features and advantages of the present disclosure will become more apparent through the following description of the embodiments of the present disclosure with reference to the accompanying drawings, in which:

[0029] Figure 1 The flowchart of the filament calibration method according to the embodiment of the present disclosure is schematically shown.

[0030] Figure 2 The flowchart schematically shows the steps of calibrating the filament correction coefficient according to the second sampling current and the preset filament preheating current according to the embodiment of the present disclosure.

[0031] Figure 3 The flowchart schematically shows the steps of presetting the filament preheating current according to an embodiment of the present disclosure.

[0032] Figure 4 The flowchart of the filament calibration method according to the embodiment of the present disclosure is schematically shown.

[0033] Figure 5 The structural block diagram of the filament calibration device according to the embodiment of the present disclosure is schematically shown.

[0034] Figure 6 A block diagram of an electronic device according to an embodiment of the present disclosure is schematically shown.

[0035] Figure 7 The filament characteristic curve between the filament current and the tube current of the ray generating tube is schematically shown. DETAILED DESCRIPTION

[0036] Hereinafter, embodiments of the present disclosure will be described with reference to the accompanying drawings. However, it should be understood that these descriptions are exemplary only and are not intended to limit the scope of the present disclosure. In the following detailed description, for ease of explanation, many specific details are set forth to provide a comprehensive understanding of the embodiments of the present disclosure. However, it is apparent that one or more embodiments may also be implemented without these specific details. In addition, in the following description, descriptions of known structures and technologies are omitted to avoid unnecessary confusion of the concepts of the present disclosure.

[0037] In the technical solution of this disclosure, the acquisition, storage and application of user personal information involved are in compliance with the provisions of relevant laws and regulations, necessary confidentiality measures are taken, and they do not violate public order and good morals. In the technical solution of this disclosure, the acquisition, collection, storage, use, processing, transmission, provision, disclosure and application of data are in compliance with the provisions of relevant laws and regulations, necessary confidentiality measures are taken, and they do not violate public order and good morals.

[0038] The terms used herein are only for describing specific embodiments and are not intended to limit the present disclosure. The terms "comprise", "include", etc. used herein indicate the existence of the features, steps, operations and / or components, but do not exclude the existence or addition of one or more other features, steps, operations or components.

[0039] When using expressions such as "at least one of A, B or C, etc.", it should generally be interpreted in accordance with the meaning of the expression generally understood by those skilled in the art (for example, "a system having at least one of A, B or C" should include but is not limited to a system having A alone, B alone, C alone, A and B, A and C, B and C, and / or A, B, C, etc.). The terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, features defined as "first" and "second" may explicitly or implicitly include one or more of the said features.

[0040] The X-ray generator is the core component of the CT security inspection equipment. The X-ray generator includes a high-voltage power supply and an X-ray tube. The X-ray tube is a component that generates X-rays and converts electrical energy into X-rays. The filament and the ray generating tube are part of the X-ray tube. The high-voltage power supply generates a 300V DC voltage that passes through a push-pull circuit to obtain an AC voltage of ±150V, which is then output to the filament through a filament transformer. Figure 7 As shown in the figure, there is a specific relationship between the filament current and the tube current of the ray generating tube, which is also called the filament characteristic curve. For a given filament, within a certain range, the larger the filament current, the larger the tube current. Figure 7 It can be seen that the relationship between tube current and filament current is an exponential nonlinear relationship.

[0041] Therefore, it is understandable that inaccurate filament current sampling will cause many problems. Compared with the sampled filament current, if the actual filament current is smaller, it will cause the tube current to respond slowly during the beam generation process; if the actual filament current is larger, it will cause the tube current to overshoot during beam generation, and will also affect the service life of the filament. In the prior art, for the ray generator of CT security inspection equipment, a filament tool is generally used to correct the error caused by the filament current sampling.

[0042] Specifically, the principle of the filament fixture is to simulate the filament with a resistor whose resistance is close to that of the filament. The filament fixture includes an ammeter to measure the actual filament current.

[0043] The filament current sampling formula is: I smp =k T ×k S ×k C ×I fila .

[0044] Among them, I smp is the filament current sampling value, k T is the filament transformer ratio, k S is the filament current sensor ratio, k C is the ratio of the filament current sampling signal conditioning circuit, I fila is the actual filament current.

[0045] It can be seen from the filament current sampling formula that the filament current sampling error correction method based on the filament tooling can correct the errors of the filament transformer, filament current sensor, and filament current sampling signal conditioning circuit. This method requires the actual filament current in the ammeter to be manually input into the host computer software to achieve the calibration of the filament current sampling error.

[0046] It is understandable that when the high-voltage power supply or X-ray generator of the CT equipment is replaced, it is necessary to calibrate the mapping relationship between the sampling current of the filament and the tube current of the ray generating tube, so as to facilitate the accurate control of the tube current according to the sampling current of the filament. However, there are differences in the filament characteristic curves between different filaments and ray generating tubes, and due to the current sampling error, there is a difference between the sampling current of the filament and the actual current, which makes the mapping relationship between the sampling current of the filaments of different X-ray generators and the tube current of the ray generating tube unstable, and errors will occur when adjusting the tube current of the ray generating tube according to the sampling current of the filament. The filament current sampling error correction method based on the filament tooling can only correct the filament current sampling error, and cannot correct the mapping relationship between the sampling current of the filament and the tube current of the ray generating tube.

[0047] In addition, the filament current sampling error correction method based on the filament tooling needs to rely on customized filament tooling, which is costly. When calibrating the CT equipment on site, not only the filament tooling is required, but also the X-ray tube of the CT equipment needs to be disassembled, which is a cumbersome step.

[0048] Reference below Figure 1-Figure 6 A filament calibration method, a calibration device, an electronic device, a storage medium, a program product, an X-ray generator, and a CT device according to embodiments of the present disclosure are described.

[0049] Figure 1 The flowchart of the filament calibration method according to the embodiment of the present disclosure is schematically shown. The filament calibration method is used to calibrate the mapping relationship between the sampled current of the filament in the X-ray generator and the tube current of the ray generating tube, and the mapping relationship includes the filament correction coefficient.

[0050] like Figure 1 As shown, the filament calibration method of this embodiment includes operations S110 to S130.

[0051] In operation S110, a high voltage power supply and a ray generating tube are connected, and a sampling current of the ray generating tube is obtained as a first sampling current.

[0052] It is understandable that the method disclosed herein can be implemented on the premise that the high voltage power supply and the ray generating tube have been calibrated. Therefore, in the filament calibration method disclosed herein, the sampled current of the ray generating tube is approximately equal to the actual current of the ray generating tube.

[0053] In operation S120 , when the first sampling current is equal to the preset setting current, the sampling current of the filament is obtained as the second sampling current.

[0054] In operation S130 , the filament correction coefficient is calibrated according to the second sampled current and a preset filament preheating current, wherein a preset relationship exists between the preset current and the filament preheating current.

[0055] It should be noted that the filament preheating current can be understood as the actual current of the filament when the actual current of the ray generating tube is the set current. When implementing the method disclosed in the present invention, by presetting a filament preheating current, a set relationship is set between the set current and the filament preheating current, so that the meaning of the filament preheating current is: when the tube current of the ray generating tube reaches a specific value, that is, when the current is set, if the sampled value of the filament current, that is, the second sampled current is equal to the filament preheating current, it means that the sampled value of the filament current is closer to the actual value. If the sampled value of the filament current is not equal to the filament preheating current, it means that there is a deviation between the sampled value of the filament current and the actual value. At this time, the filament correction coefficient can be corrected according to the relationship between the second sampled current and the pre-set filament preheating current, thereby realizing the mapping relationship between the sampled current of the filament in the X-ray generator and the tube current of the ray generating tube.

[0056] According to the filament calibration method of the embodiment of the present disclosure, by connecting the high-voltage power supply and the ray generating tube, the sampling current of the ray generating tube can be obtained as the first sampling current; then when the first sampling current is equal to the preset set current, the sampling current of the filament can be obtained as the second sampling current; according to the second sampling current and the preset filament preheating current, the filament correction coefficient can be calibrated, wherein there is a set relationship between the set current and the filament preheating current.

[0057] The method disclosed in the present invention sets a filament preheating current in advance, and sets a set relationship between the set current and the filament preheating current, so that the meaning of the filament preheating current is: the tube current of the ray generating tube reaches a specific value, that is, when the current is set, if the sampled value of the filament current, that is, the second sampled current is equal to the filament preheating current, it means that the sampled value of the filament current is closer to the actual value. If the sampled value of the filament current is not equal to the filament preheating current, it means that the sampled value of the filament current is deviated from the actual value. At this time, the filament correction coefficient can be corrected according to the relationship between the second sampled current and the pre-set filament preheating current, so as to realize the mapping relationship between the sampled current of the filament in the X-ray generator and the tube current of the ray generating tube. The mapping relationship comprehensively considers the sampling error of the filament current and the difference in the filament characteristic curve between different filaments and the ray generating tube, and realizes the efficient and accurate correction of the mapping relationship between the sampled current of the filament in the X-ray generator and the tube current of the ray generating tube. In addition, the method disclosed in the present invention does not need to rely on customized filament tooling, and the cost is low. There is no need to disassemble the X-ray generator, and it is easy to operate.

[0058] According to some embodiments of the present disclosure, Figure 2 As shown, operation S130 is a step of calibrating the filament correction coefficient according to the second sampled current and the preset filament preheating current, and includes operation S131 and operation S132.

[0059] In operation S131, the current filament correction coefficient is determined according to the second sampled current, the preset filament preheating current and the last filament correction coefficient, wherein when this is the first time, the last filament correction coefficient is the initially set filament correction coefficient.

[0060] For example, the filament correction factor can be determined by formula (1), and the filament correction factor can be calculated by k f express.

[0061] k f = ×k f0 (1)

[0062] Among them, I f0 Indicates the filament preheating current, I f represents the second sampling current, k f0 Indicates the last filament correction factor.

[0063] In operation S132, the current filament correction coefficient replaces the previous filament correction coefficient.

[0064] Operation S131 and operation S132 can facilitate the step of calibrating the filament correction coefficient according to the second sampled current and the preset filament preheating current.

[0065] According to some embodiments of the present disclosure, Figure 3 As shown, the step of presetting the filament preheating current includes operations S310 to S330.

[0066] In operation S310, sampled currents of m experimental ray generating tubes are obtained as m first experimental sampled currents, where m is an integer greater than or equal to 2.

[0067] In operation S320, when the m first experimental sampling currents are all equal to the set current, sampling currents of m experimental filaments corresponding one-to-one to the m experimental ray generating tubes are obtained as m second experimental sampling currents.

[0068] In operation S330 , an average value of m second experimental sampling currents is calculated as the filament preheating current.

[0069] By operating S310 to S330, it is easy to set a more accurate filament preheating current. In other words, the filament preheating current set by operating S310 to S330 can make the setting relationship between the set current and the filament preheating current more accurate, so that when the tube current of the ray generating tube reaches the set current, the sampled value of the filament current, that is, the second sampled current is compared with the filament preheating current, and the conclusion of whether the sampled value of the filament current is close to the actual value is more accurate. At this time, by correcting the filament correction coefficient more accurately according to the relationship between the second sampled current and the pre-set filament preheating current, the mapping relationship between the sampled current of the filament in the X-ray generator and the tube current of the ray generating tube can be corrected more efficiently and accurately.

[0070] According to some embodiments of the present disclosure, the step of presetting the filament preheating current includes operation S410 and operation S440.

[0071] In operation S410, a sampling current of an experimental ray generating tube is sampled as a first experimental sampling current.

[0072] In operation S420, when the first experimental sampling currents are all equal to the set currents, a sampling current of an experimental filament corresponding to the experimental ray generating tube is obtained as a second experimental sampling current.

[0073] In operation S430, the sampling current of the experimental ray generating tube is repeatedly sampled as the first experimental sampling current; when the first experimental sampling current is equal to the set current, the sampling current of the experimental filament corresponding to the experimental ray generating tube is obtained as the second experimental sampling current n times, and n second experimental sampling currents are obtained, wherein n is an integer greater than or equal to 2.

[0074] In operation S440 , an average value of n second experimental sampling currents is calculated as the filament preheating current.

[0075] By performing operations S410 to S440, it is easy to set a more accurate filament preheating current. In other words, the filament preheating current set by performing operations S410 to S440 can make the setting relationship between the setting current and the filament preheating current more accurate, so that when the tube current of the ray generating tube reaches the setting current, the sampling value of the filament current, that is, the second sampling current is compared with the filament preheating current, and the conclusion of whether the sampling value of the filament current is close to the actual value is more accurate. At this time, by correcting the filament correction coefficient more accurately according to the relationship between the second sampling current and the pre-set filament preheating current, the mapping relationship between the sampling current of the filament in the X-ray generator and the tube current of the ray generating tube can be corrected more efficiently and accurately.

[0076] According to some embodiments of the present disclosure, the pre-set set current may be: 10% of the rated current, 20% of the rated current, 30% of the rated current, 40% of the rated current, 50% of the rated current, 60% of the rated current, 70% of the rated current, 80% of the rated current, 90% of the rated current or the rated current.

[0077] Of course, the preset setting current can also be any setting value, and the setting current can be set according to actual needs.

[0078] Presetting a relatively reasonable set current corresponding to the demand can be conveniently used as a threshold of the first sampling current. When the first sampling current reaches the threshold, the second sampling current can be better collected and resources can be saved. Therefore, the second sampling current can be collected under the premise of saving resources, and the filament correction coefficient can be calibrated according to the second sampling current and the pre-set filament preheating current.

[0079] Refer to the following Figure 4 The filament calibration method according to the embodiment of the present disclosure is described in detail. It is worth noting that the following description is only an exemplary description and is not a specific limitation of the present disclosure.

[0080] According to the filament calibration method of the embodiment of the present disclosure, when a filament calibration instruction is received, the filament calibration is started, the high voltage power supply is set to output the rated voltage to the ray generating tube, and the threshold of the ray generating tube is set to the set current I mA0 , connect the high voltage power supply and the ray generating tube, the ray generating tube emits a beam, and read the first sampling current I of the ray generating tube mA , when I mA = I mA0 When the second sampling current I of the filament is read f , calculate the current filament correction factor: k f = ×k f0 , update the current filament correction coefficient to the filament calibration device to complete the filament correction.

[0081] Based on the above filament calibration method, the present disclosure also provides a filament calibration device. Figure 5 The filament calibration device is described in detail. The filament calibration device is used to calibrate the mapping relationship between the sampling current of the filament in the X-ray generator and the tube current of the ray generating tube, and the mapping relationship includes the filament correction coefficient.

[0082] Figure 5 The structural block diagram of the filament calibration device according to the embodiment of the present disclosure is schematically shown.

[0083] The filament calibration device 10 includes a first sampling module 1 , a second sampling module 2 and a calibration module 3 .

[0084] Specifically, the first sampling module 1 is used to connect the high-voltage power supply and the ray generating tube to obtain the sampling current of the ray generating tube as the first sampling current; the second sampling module 2 is used to obtain the sampling current of the filament as the second sampling current when the first sampling current is equal to the preset set current; the calibration module 3 is used to calibrate the filament correction coefficient according to the second sampling current and the preset filament preheating current, wherein there is a set relationship between the set current and the filament preheating current.

[0085] According to the filament calibration device 10 of the embodiment of the present disclosure, by connecting the high-voltage power supply and the ray generating tube, the sampling current of the ray generating tube can be obtained as the first sampling current; then when the first sampling current is equal to the preset set current, the sampling current of the filament can be obtained as the second sampling current; according to the second sampling current and the preset filament preheating current, the filament correction coefficient can be calibrated, wherein there is a set relationship between the set current and the filament preheating current.

[0086] The device 10 disclosed in the present invention sets a filament preheating current in advance, and sets a set relationship between the set current and the filament preheating current, so that the meaning of the filament preheating current is: when the tube current of the ray generating tube reaches a specific value, that is, when the current is set, if the sampled value of the filament current, that is, the second sampled current is equal to the filament preheating current, it means that the sampled value of the filament current is closer to the actual value. If the sampled value of the filament current is not equal to the filament preheating current, it means that the sampled value of the filament current is deviated from the actual value. At this time, the filament correction coefficient can be corrected according to the relationship between the second sampled current and the pre-set filament preheating current, so as to realize the mapping relationship between the sampled current of the filament in the X-ray generator and the tube current of the ray generating tube. The mapping relationship comprehensively considers the sampling error of the filament current and the difference in the filament characteristic curve between different filaments and the ray generating tube, and realizes the efficient and accurate correction of the mapping relationship between the sampled current of the filament in the X-ray generator and the tube current of the ray generating tube. In addition, the method disclosed in the present invention does not need to rely on customized filament tooling, and the cost is low. No need to disassemble the X-ray generator, easy to operate.

[0087] In addition, according to an embodiment of the present disclosure, any multiple modules among the first sampling module 1, the second sampling module 2 and the calibration module 3 can be combined into one module for implementation, or any one of the modules can be split into multiple modules. Alternatively, at least part of the functions of one or more of these modules can be combined with at least part of the functions of other modules and implemented in one module.

[0088] According to an embodiment of the present disclosure, at least one of the first sampling module 1, the second sampling module 2 and the calibration module 3 may be at least partially implemented as a hardware circuit, such as a field programmable gate array (FPGA), a programmable logic array (PLA), a system on a chip, a system on a substrate, a system on a package, an application specific integrated circuit (ASIC), or may be implemented by hardware or firmware such as any other reasonable way of integrating or packaging the circuit, or may be implemented in any one of the three implementation methods of software, hardware and firmware or in a suitable combination of any of them.

[0089] Alternatively, at least one of the first sampling module 1 , the second sampling module 2 and the calibration module 3 may be at least partially implemented as a computer program module, and when the computer program module is executed, the corresponding function may be executed.

[0090] The present disclosure also provides an X-ray generator using the filament calibration method as described above. According to some embodiments of the present disclosure, the X-ray generator includes a ray generating tube, a high voltage power supply, a filament, and a filament transformer.

[0091] Specifically, the ray generating tube includes a tube shell with a vacuum interior and an anode and a cathode arranged in the tube shell; a high-voltage power supply is used to provide high voltage between the cathode and the anode; the filament is electrically connected to the cathode; and a filament transformer is electrically connected to the filament to provide voltage to the filament.

[0092] According to the X-ray generator disclosed in the present invention, after being calibrated by the above-mentioned filament calibration method and filament calibration device, the problem of slow dynamic current response of the ray generating tube during beam emission caused by the actual filament current being too small, or the problem of overshoot of the current of the ray generating tube during beam emission caused by the actual filament current being too large, which affects the service life of the filament, can be avoided.

[0093] The present disclosure also provides a CT device. According to some embodiments of the present disclosure, the CT device includes the X-ray generator as described above. After correction by the above filament calibration method and filament calibration device, the problem of slow dynamic response of the current of the ray generating tube during beam emission caused by the actual filament current being too small, or the problem of overshoot of the current of the ray generating tube during beam emission caused by the actual filament current being too large, which affects the service life of the filament, can be avoided.

[0094] Figure 6 A block diagram of an electronic device suitable for implementing the above method according to an embodiment of the present disclosure is schematically shown.

[0095] like Figure 6 As shown, the electronic device 900 according to an embodiment of the present disclosure includes a processor 901, which can perform various appropriate actions and processes according to a program stored in a read-only memory (ROM) 902 or a program loaded from a storage part 908 to a random access memory (RAM) 903. The processor 901 may include, for example, a general-purpose microprocessor (e.g., a CPU), an instruction set processor and / or a related chipset and / or a dedicated microprocessor (e.g., an application-specific integrated circuit (ASIC)), etc. The processor 901 may also include an onboard memory for caching purposes. The processor 901 may include a single processing unit or multiple processing units for performing different actions of the method flow according to an embodiment of the present disclosure.

[0096] In RAM 903, various programs and data required for the operation of electronic device 900 are stored. Processor 901, ROM 902 and RAM 903 are connected to each other via bus 904. Processor 901 performs various operations of the method flow according to the embodiment of the present disclosure by executing the program in ROM 902 and / or RAM 903. It should be noted that the program can also be stored in one or more memories other than ROM 902 and RAM 903. Processor 901 can also perform various operations of the method flow according to the embodiment of the present disclosure by executing the program stored in the one or more memories.

[0097] According to an embodiment of the present disclosure, the electronic device 900 may further include an input / output (I / O) interface 905, which is also connected to the bus 904. The electronic device 900 may further include one or more of the following components connected to the I / O interface 905: an input portion 906 including a keyboard, a mouse, etc.; an output portion 907 including a cathode ray tube (CRT), a liquid crystal display (LCD), etc., and a speaker, etc.; a storage portion 908 including a hard disk, etc.; and a communication portion 909 including a network interface card such as a LAN card, a modem, etc. The communication portion 909 performs communication processing via a network such as the Internet. A drive 910 is also connected to the input / output (I / O) interface 905 as needed. A removable medium 911, such as a magnetic disk, an optical disk, a magneto-optical disk, a semiconductor memory, etc., is installed on the drive 910 as needed, so that a computer program read therefrom is installed into the storage portion 908 as needed.

[0098] The present disclosure also provides a computer-readable storage medium, which may be included in the device / apparatus / system described in the above embodiments; or may exist independently without being assembled into the device / apparatus / system. The above computer-readable storage medium carries one or more programs, and when the above one or more programs are executed, the method according to the embodiment of the present disclosure is implemented.

[0099] According to an embodiment of the present disclosure, a computer-readable storage medium may be a non-volatile computer-readable storage medium, for example, may include but is not limited to: a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination thereof. In the present disclosure, a computer-readable storage medium may be any tangible medium containing or storing a program, which may be used by or in combination with an instruction execution system, an apparatus or a device. For example, according to an embodiment of the present disclosure, a computer-readable storage medium may include the ROM 902 and / or RAM 903 described above and / or one or more memories other than ROM 902 and RAM 903.

[0100] The embodiment of the present disclosure also includes a computer program product, which includes a computer program, and the computer program contains program code for executing the method shown in the flowchart. When the computer program product is run in a computer system, the program code is used to enable the computer system to implement the method of the embodiment of the present disclosure.

[0101] The above functions defined in the system / device of the embodiment of the present disclosure are performed when the computer program is executed by the processor 901. According to the embodiment of the present disclosure, the system, device, module, unit, etc. described above can be implemented by a computer program module.

[0102] In one embodiment, the computer program may be based on a tangible storage medium such as an optical storage device, a magnetic storage device, etc. In another embodiment, the computer program may also be transmitted and distributed in the form of a signal on a network medium, and downloaded and installed through the communication part 909, and / or installed from a removable medium 911. The program code contained in the computer program may be transmitted using any appropriate network medium, including but not limited to: wireless, wired, etc., or any suitable combination of the above.

[0103] In such an embodiment, the computer program can be downloaded and installed from the network through the communication part 909, and / or installed from the removable medium 911. When the computer program is executed by the processor 901, the above functions defined in the system of the embodiment of the present disclosure are performed. According to the embodiment of the present disclosure, the system, device, means, module, unit, etc. described above can be implemented by a computer program module.

[0104] According to an embodiment of the present disclosure, the program code for executing the computer program provided by the embodiment of the present disclosure can be written in any combination of one or more programming languages. Specifically, these computing programs can be implemented using high-level process and / or object-oriented programming languages, and / or assembly / machine languages. Programming languages ​​include, but are not limited to, Java, C++, python, "C" language or similar programming languages. The program code can be executed entirely on the user computing device, partially on the user device, partially on the remote computing device, or entirely on the remote computing device or server. In the case of a remote computing device, the remote computing device can be connected to the user computing device through any type of network, including a local area network (LAN) or a wide area network (WAN), or can be connected to an external computing device (for example, using an Internet service provider to connect through the Internet).

[0105] The flow charts and block diagrams in the accompanying drawings illustrate the possible architecture, functions and operations of the systems, methods and computer program products according to various embodiments of the present disclosure. In this regard, each box in the flow chart or block diagram can represent a module, a program segment, or a part of a code, and the above-mentioned module, program segment, or a part of a code contains one or more executable instructions for realizing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the box can also occur in a different order from the order marked in the accompanying drawings. For example, two boxes represented in succession can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each box in the block diagram or flow chart, and the combination of the boxes in the block diagram or flow chart can be implemented with a dedicated hardware-based system that performs a specified function or operation, or can be implemented with a combination of dedicated hardware and computer instructions.

[0106] It will be appreciated by those skilled in the art that the features described in the various embodiments and / or claims of the present disclosure may be combined and / or combined in a variety of ways, even if such combinations and / or combinations are not explicitly described in the present disclosure. In particular, the features described in the various embodiments and / or claims of the present disclosure may be combined and / or combined in a variety of ways without departing from the spirit and teachings of the present disclosure. All of these combinations and / or combinations fall within the scope of the present disclosure.

[0107] The embodiments of the present disclosure are described above. However, these embodiments are only for illustrative purposes and are not intended to limit the scope of the present disclosure. Although the embodiments are described above separately, this does not mean that the measures in the various embodiments cannot be used in combination to advantage. The scope of the present disclosure is defined by the attached claims and their equivalents. Without departing from the scope of the present disclosure, those skilled in the art may make a variety of substitutions and modifications, which should all fall within the scope of the present disclosure.

Claims

1. A filament calibration method for correcting the mapping relationship between the sampled current of the filament in an X-ray generator and the tube current of a ray generating tube, wherein the mapping relationship includes a filament correction coefficient, and the method comprises: Connecting a high-voltage power supply to the ray generating tube to obtain a sampling current of the ray generating tube as a first sampling current; When the first sampling current is equal to the preset setting current, obtaining the sampling current of the filament as the second sampling current; The filament correction coefficient is calibrated according to the second sampling current and a preset filament preheating current, wherein there is a set relationship between the set current and the filament preheating current.

2. The filament calibration method according to claim 1, characterized in that: The step of calibrating the filament correction coefficient according to the second sampling current and the preset filament preheating current includes: Determine the current filament correction coefficient according to the second sampling current, the preset filament preheating current and the last filament correction coefficient, wherein when the current time is the first time, the last filament correction coefficient is the initially set filament correction coefficient; The current filament correction coefficient replaces the previous filament correction coefficient.

3. The filament calibration method according to claim 1, characterized in that: The steps of presetting the filament preheat current include: Obtaining sampled currents of m experimental ray generating tubes as m first experimental sampled currents, where m is an integer greater than or equal to 2; When the m first experimental sampling currents are all equal to the set current, obtaining sampling currents of m experimental filaments corresponding to the m experimental ray generating tubes one by one as m second experimental sampling currents; An average value of the m second experimental sampling currents is calculated as the filament preheating current.

4. The filament calibration method according to claim 1, characterized in that: The steps of presetting the filament preheat current include: The sampling current of the sampling experimental ray generating tube is used as the first experimental sampling current; When the first experimental sampling currents are all equal to the set current, obtaining the sampling current of the experimental filament corresponding to the experimental ray generating tube as the second experimental sampling current; Repeat the sampling of the sampling current of the experimental ray generating tube as the first experimental sampling current; when the first experimental sampling currents are all equal to the set current, obtain the sampling current of the experimental filament corresponding to the experimental ray generating tube as the second experimental sampling current n times, and obtain n second experimental sampling currents, wherein n is an integer greater than or equal to 2; An average value of the n second experimental sampling currents is calculated as the filament preheating current.

5. The filament calibration method according to claim 1, characterized in that: The set current is: 10% of the rated current, 20% of the rated current, 30% of the rated current, 40% of the rated current, 50% of the rated current, 60% of the rated current, 70% of the rated current, 80% of the rated current, 90% of the rated current or the rated current.

6. A filament calibration device, used for correcting the mapping relationship between the sampled current of the filament in an X-ray generator and the tube current of a ray generating tube, wherein the mapping relationship includes a filament correction coefficient, and the device comprises: A first sampling module, the first sampling module is used to connect the high-voltage power supply and the ray generating tube to obtain a sampling current of the ray generating tube as a first sampling current; A second sampling module, wherein the second sampling module is used to obtain the sampling current of the filament as the second sampling current when the first sampling current is equal to a preset setting current; A calibration module is used to calibrate the filament correction coefficient according to the second sampling current and a preset filament preheating current, wherein there is a set relationship between the set current and the filament preheating current.

7. An electronic device comprising: one or more processors; One or more memories, used to store executable instructions, which, when executed by the processor, implement the method according to any one of claims 1 to 5.

8. A computer-readable storage medium, wherein executable instructions are stored on the storage medium, and when the instructions are executed by a processor, the method according to any one of claims 1 to 5 is implemented.

9. A computer program product, comprising a computer program, wherein the computer program comprises one or more executable instructions, and when the executable instructions are executed by a processor, the method according to any one of claims 1 to 4 is implemented.

10. An X-ray generator using the filament calibration method according to any one of claims 1 to 5, comprising: A ray generating tube, the ray generating tube comprising a tube shell with a vacuum interior and an anode and a cathode arranged in the tube shell; A high voltage power supply, used for providing high voltage between the cathode and the anode; a filament, the filament being electrically connected to the cathode; A filament transformer is electrically connected to the filament and is used to provide voltage to the filament.

11. A CT device, comprising the X-ray generator according to claim 10.

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