A calibration system and method

Abstract

The disclosure discloses a calibration system and method. The system comprises: a light waveguide tooling with a plurality of through holes formed through the first side and the second side, so that the first opening is formed on the first side and the second opening is formed on the second side; the through hole is determined according to the test position and the test angle of the to-be-tested light waveguide eyebox; the corner cube prism is arranged on the first opening, and the center of the corner cube prism is on the axis of the through hole; the diaphragm is arranged on the lens of the test camera, and the optical axis of the diaphragm is on the optical axis of the lens of the test camera; the test camera is located on the first side of the light waveguide tooling; the light transceiver device is used for emitting light and receiving reflected light, and is located on the second side of the light waveguide tooling; at least one of the test camera, the light waveguide tooling and the light transceiver device can adjust the pose, so that the test camera and the light transceiver device are on the extension line of one of the through holes. The precise positioning of different positions and angles of the light waveguide eyebox is realized, and then the optical performance evaluation is carried out.

Description

TECHNICAL FIELD

[0001] The present disclosure relates generally to the field of optical testing. More specifically, the present disclosure relates to a calibration system and method. BACKGROUND

[0002] Nowadays, optical waveguide technology has been applied in augmented reality (AR) devices, through which image information can be guided to the retina of a user, thereby achieving a light and thin display effect with a wide field of view.

[0003] For an optical waveguide, the optical performance (e.g., field of view, size, dispersion, etc.) of the image observed in its eyebox is an important indicator for evaluating the design process of the optical waveguide, and therefore it is crucial to test and evaluate the optical performance of the image observed in the eyebox of the optical waveguide. Currently, the conventional testing and evaluation scheme is to test the optical waveguide eyebox at a fixed position and angle, which does not conform to the actual use scenario of the human eye. In order to conform to the actual use scenario of the human eye, it is necessary to test and evaluate the optical performance of the image observed at different positions and angles of the optical waveguide eyebox.

[0004] Therefore, there is an urgent need to provide a calibration system and method to achieve accurate positioning of the optical waveguide eyebox at different positions and angles, and then use the calibrated system to test and evaluate the optical performance of the image observed at different positions and angles of the optical waveguide eyebox. SUMMARY

[0005] To at least solve one or more of the above-mentioned technical problems, the present disclosure proposes a calibration system and method in various aspects.

[0006] In a first aspect, the present disclosure provides a calibration system for testing the optical performance of an image observed in an optical waveguide eyebox to be tested, the system comprising: a test camera, an aperture, a corner cube, an optical waveguide emulating tool, and an optical transceiver; wherein the optical waveguide emulating tool has a plurality of through holes formed through a first side and a second side, thereby forming a first opening on the first side and a second opening on the second side; the through holes are determined based on a test position and a test angle of the optical waveguide eyebox to be tested; each through hole corresponds to a test position and a test angle of the optical waveguide eyebox to be tested; the corner cube is removably disposed on the first opening, and the center of the corner cube is The optical waveguide emulating tool is located on the axis of the through hole; the aperture is removably provided on the lens of the test camera, and the optical axis of the aperture is located on the optical axis of the lens of the test camera; the test camera is located on a first side of the emulating optical waveguide tool; the optical transceiver is used to emit light and receive reflected light, and is located on a second side of the emulating optical waveguide tool; at least one of the test camera, the emulating optical waveguide tool and the optical transceiver is capable of adjusting its position so that the test camera and the optical transceiver are located on the extension line of one of the through holes, so as to test the optical performance of the image observed at the test position and test angle of the optical waveguide eye box to be tested corresponding to the through hole.

[0007] In some embodiments, the system is calibrated based on the posture of the test camera, and the system further includes: a first adjustment device and a second adjustment device; wherein the first adjustment device is connected to the emulation optical waveguide tooling and is used to adjust the posture of the emulation optical waveguide tooling; the second adjustment device is connected to the optical transceiver and is used to adjust the posture of the optical transceiver.

[0008] In some embodiments, the rotation center of the first adjustment device is consistent with the rotation center of the second adjustment device; the first adjustment device is an electric adjustment device; and the second adjustment device is a manual adjustment device.

[0009] In some embodiments, the system is calibrated based on the posture of the simulated optical waveguide tooling, and the system further includes: a second adjustment device and a third adjustment device; wherein the second adjustment device is connected to the optical transceiver and is used to adjust the posture of the optical transceiver; the third adjustment device is connected to the test camera and is used to adjust the posture of the test camera.

[0010] In some embodiments, the rotation center of the second adjustment device is consistent with the rotation center of the third adjustment device; the second adjustment device and the third adjustment device are both electric adjustment devices.

[0011] In some embodiments, the height of the simulated optical waveguide tooling is greater than a specified height.

[0012] In some embodiments, the diameter of the aperture is the same as the diameter of the through hole.

[0013] In some embodiments, the light emitted by the optical transceiver includes: a first light and a second light; wherein the first light is a collimated laser; and the second light is a cross parallel light.

[0014] In a second aspect, the present disclosure provides a method for calibration using a system according to the first aspect or any embodiment of the first aspect, comprising: setting a corner cube prism at at least one first opening; for a through hole provided with a corner cube prism at any first opening, controlling an optical transceiver to emit a first light ray toward the through hole and receiving a reflected light ray from the corner cube prism; adjusting the posture of the optical transceiver based on a first position of the reflected light ray on the optical transceiver; when the corner cube prism is removed, controlling the optical transceiver to emit a first light ray through the through hole and through the aperture to reach the test camera; adjusting the position of the test camera based on a second position and a second form formed by the first light ray on the test camera; when the corner cube prism, the aperture and the simulated optical waveguide tooling are removed, controlling the optical transceiver to emit a second light ray to the test camera; and adjusting the angle of the test camera based on a third position formed by the second light ray on the test camera.

[0015] In some embodiments, after adjusting the angle of the test camera, the method further includes: controlling the optical transceiver to emit a first light ray through the through hole and through the aperture to reach the test camera while removing the corner cube prism; and adjusting the position of the test camera based on a fourth position and a fourth form formed by the first light ray on the test camera.

[0016] In some embodiments, the method further includes: controlling the optical transceiver and the test camera to rotate in the same direction by a specified angle; and repeating the step of controlling the optical transceiver to emit a first light ray toward a through hole provided with a corner cube prism.

[0017] In a third aspect, the present disclosure provides a method of calibrating the system of the first aspect or any embodiment of the first aspect, comprising: disposing a corner cube prism at the at least one first opening; for any through hole at which a corner cube prism is disposed, controlling the light transceiver to emit a first light ray to the test camera through the diaphragm with the light waveguide jig and the corner cube prism removed; adjusting a position of the light transceiver based on a fifth position and a fifth shape of the first light ray formed on the test camera; controlling the light transceiver to emit a second light ray to the test camera with the light waveguide jig, the corner cube prism, and the diaphragm removed; adjusting an angle of the light transceiver based on a sixth position of the second light ray on the test camera; controlling the light transceiver to emit a first light ray to the through hole and receive a reflected light ray from the corner cube prism; and adjusting a pose of the light waveguide jig based on a seventh position of the reflected light ray on the light transceiver.

[0018] In some embodiments, the method further comprises: controlling the light waveguide jig to rotate by a specified angle; and repeating the step of controlling the light transceiver to emit a first light ray with the light waveguide jig and the corner cube prism removed.

[0019] By the calibration system and method as provided above, embodiments of the present disclosure calibrate the system by marking through holes on the light waveguide jig corresponding to the test positions and test angles of the light waveguide eyebox to be tested, and then for each through hole, adjusting the pose of at least one of the test camera, the light waveguide jig, and the light transceiver to calibrate the system, so as to test the optical performance of the image observed by the light waveguide eyebox to be tested at the test position and test angle corresponding to the through hole based on the calibrated system. The optical performance of the image observed by the light waveguide eyebox at different test positions and test angles can be accurately evaluated. Further, different light waveguide jigs can be replaced to evaluate the optical performance of the light waveguide eyebox at different positions and angles. BRIEF DESCRIPTION OF DRAWINGS

[0020] The above and other objects, features and advantages of the exemplary embodiments of the present disclosure will be more apparent from the following detailed description taken in conjunction with the accompanying drawings, in which:

[0021] Figure 1 A schematic diagram of a calibration system according to an embodiment of the present disclosure is shown;

[0022] Figure 2 A schematic diagram of through holes formed on a light waveguide jig according to some embodiments of the present disclosure is shown;

[0023] Figure 3 A schematic diagram showing calibration with respect to a pose of a test camera is shown for some embodiments of the present disclosure;

[0024] Figure 4 A schematic diagram showing calibration with respect to a pose of a light waveguide tooling is shown for some embodiments of the present disclosure;

[0025] Figure 5 An exemplary flowchart of a calibration method is shown for some embodiments of the present disclosure;

[0026] Figure 6 An exemplary flowchart of another calibration method is shown for some embodiments of the present disclosure.

[0027] BRIEF DESCRIPTION OF DRAWINGS

[0028] Test camera (10); aperture stop (20); corner cube (30); light waveguide tooling (40);

[0029] Light transceiver (50); first opening (60); second opening (70);

[0030] First adjustment device (80); second adjustment device (90); third adjustment device (100). DETAILED DESCRIPTION

[0031] The technical solutions in the embodiments of the present disclosure will be described clearly and completely below with reference to the drawings in the embodiments of the present disclosure. Obviously, the described embodiments are part of the embodiments of the present disclosure, rather than all the embodiments. Based on the embodiments in the present disclosure, all other embodiments obtained by a person skilled in the art without creative labor fall within the scope of protection of the present disclosure.

[0032] It should be understood that the terms “comprise” and “include” used in the specification and claims of the present disclosure indicate the presence of the described features, integers, steps, operations, elements, and / or components, but do not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and / or groups thereof.

[0033] It should also be understood that the terms used in the specification of the present disclosure are only for the purpose of describing specific embodiments, and are not intended to limit the present disclosure. As used in the specification and claims of the present disclosure, the singular forms “a,” “an,” and “the” are intended to include the plural forms, unless the context clearly indicates otherwise. It should be further understood that the term “and / or” used in the specification and claims of the present disclosure means one or more of the associated listed items as well as all possible combinations of the items.

[0034] As used in the specification and claims, the term "if' can be interpreted as meaning "when" or "upon" or "in response to a determination" or "in response to a detection" depending on the context. Similarly, the phrase "if it is determined" or "if [the described condition or event] is detected" can be interpreted as meaning "upon a determination" or "in response to a determination" or "upon a detection of [the described condition or event]" or "in response to a detection of [the described condition or event]" depending on the context.

[0035] A detailed description of specific embodiments of the disclosure follows.

[0036] The calibration system of the embodiments of the disclosure is applied to the optical performance test of the image observed by the to-be-tested optical waveguide eyebox.

[0037] Referring to Figure 1 , Figure 1 is a schematic diagram of the calibration system of the embodiments of the disclosure, as Figure 1 shown, in the embodiments of the disclosure, the calibration system comprises a test camera (10), an aperture (20), a corner cube prism (30), a light waveguide simulation tooling (40), and a light transceiver device (50); wherein the light waveguide simulation tooling (40) is formed with a plurality of through holes passing through the first side and the second side, so that a first opening (60) is formed on the first side and a second opening (70) is formed on the second side; the through holes are determined according to the test positions and the test angles of the to-be-tested optical waveguide eyebox; each through hole corresponds to a test position and a test angle of the to-be-tested optical waveguide eyebox; the corner cube prism (30) is removably arranged on the first opening (60), and the center of the corner cube prism (30) is on the axis of the through hole; the aperture (20) is removably arranged on the lens of the test camera (10), and the optical axis of the aperture (20) is on the optical axis of the lens of the test camera (10); the test camera (10) is located on the first side of the light waveguide simulation tooling (40); the light transceiver device (50) is used for emitting light and receiving reflected light, and is located on the second side of the light waveguide simulation tooling (40); at least one of the test camera (10), the light waveguide simulation tooling (40), and the light transceiver device (50) can adjust the pose, so that the test camera (10) and the light transceiver device (50) are on the extension line of one of the through holes, so as to test the optical performance of the image observed at the test position and the test angle of the to-be-tested optical waveguide eyebox corresponding to the through hole.

[0038] Exemplarily, in the embodiment, the light waveguide simulation tooling (40) is arranged on a device specially used for erecting the to-be-tested light waveguide, the light waveguide simulation tooling is consistent with the shape of the to-be-tested light waveguide, but the height of the light waveguide simulation tooling (40) is greater than the specified height. Here, the specified height can be 10 mm or 12 mm, and the embodiment of the disclosure is not specifically limited thereto, and the embodiment of the disclosure can be described by taking 10 mm as an example.

[0039] By setting the height of the light waveguide simulation tooling (40) to be greater than the specified height, the situation that the positions of the through holes corresponding to different positions and different angles of the to-be-tested light waveguide eyebox coincide can be avoided when the through holes are punched on the light waveguide simulation tooling (40).

[0040] Specifically, refer to Figure 2 , Figure 2 The schematic diagram of the through holes formed on the light waveguide simulation tooling (40) of some embodiments of the disclosure is shown. Figure 2 As shown, the height from the bottom of the light waveguide simulation tooling (40) to the center of the to-be-tested light waveguide eyebox is E, and the distance from the top of the light waveguide simulation tooling (40) to the center of the to-be-tested light waveguide eyebox is defined as D, so that the height of the light waveguide simulation tooling (40) is E-D, and based on the above description, E-D is greater than 10 mm.

[0041] The plurality of through holes are formed on the light waveguide simulation tooling (40) through the first side and the second side, here, the first side and the second side can be opposite sides or adjacent sides, and the embodiment of the disclosure is not specifically limited thereto, and the embodiment of the disclosure is only described by taking the first side and the second side as opposite sides as an example.

[0042] As shown, Figure 2 , Figure 2 AA1 and OO1 and the like in the figure are the through holes formed on the light waveguide simulation tooling (40), for the through hole AA1, a first opening (60) A is formed on the first side of the light waveguide simulation tooling (40), and a second opening (70) A1 is formed on the second side; for the through hole OO1, a first opening (60) O is formed on the first side of the light waveguide simulation tooling (40), and a second opening (70) O1 is formed on the second side.

[0043] In the embodiment, the through holes AA1 and OO1 are determined according to the test position and the test angle of the to-be-tested optical waveguide eyebox; each through hole corresponds to a test position and a test angle of the to-be-tested optical waveguide eyebox. For example, if the center of the to-be-tested optical waveguide eyebox is taken as the test position and the direction perpendicular to the to-be-tested optical waveguide eyebox is taken as the test angle, the position mapped on the first side of the simulated optical waveguide tooling (40) is the O point, the position mapped on the second side of the simulated optical waveguide tooling (40) is the O1 point, and the line connecting the OO1 is punched into a through hole, that is, the test position is the center of the to-be-tested optical waveguide eyebox, the test angle is the direction perpendicular to the to-be-tested optical waveguide eyebox, and the corresponding through hole is OO1. For another example, if the center of the to-be-tested optical waveguide eyebox is taken as the test position and the angle of θ with respect to the direction perpendicular to the to-be-tested optical waveguide eyebox is taken as the test angle, the position mapped on the first side of the simulated optical waveguide tooling (40) is the A point, the position mapped on the second side of the simulated optical waveguide tooling (40) is the A1 point, and the line connecting the AA1 is punched into a through hole, where AO = Dtanθ and A1O1 = Etanθ, that is, the test position is the center of the to-be-tested optical waveguide eyebox, the test angle is the angle of θ with respect to the direction perpendicular to the to-be-tested optical waveguide eyebox, and the corresponding through hole is AA1. Similarly, a plurality of through holes corresponding to different test positions and test angles of the to-be-tested optical waveguide eyebox are formed on the simulated optical waveguide tooling (40).

[0044] Here, the diameter of the through hole can be any value, for example, 1 mm, 0.5 mm, etc., and the disclosure does not specifically limit the diameter of the through hole, which can be determined according to the actual situation.

[0045] For example, in the embodiment, the corner cube prism (30) can be arranged on the simulated optical waveguide tooling (40), specifically, it can be removably arranged on the first opening (60), and the center of the corner cube prism (30) is on the axis of the through hole. Here, the corner cube prism (30) is not affected by the alignment, and the light is reflected back to the original direction by three reflections after being incident on the corner cube prism (30).

[0046] In the embodiment, when the corner cube prism (30) is deployed, only one corner cube prism (30) can be deployed, which can be deployed at any first opening (60) on the simulated optical waveguide tooling (40), and when actual calibration is performed, the corner cube prism (30) can be arranged at the first opening (60) of the through hole that needs to be calibrated. When the corner cube prism (30) is deployed, a plurality of corner cube prisms (30) can also be deployed, specifically, the corner cube prisms (30) can be deployed on a plurality of first openings (60) on the simulated optical waveguide tooling (40) according to the actual calibration situation, or one corner cube prism (30) can be deployed at each first opening (60) on the simulated optical waveguide tooling (40), and the disclosure does not specifically limit this.

[0047] Based on the above description of the light waveguide simulation tooling (40), as shown in Figure 1 The test camera (10) is located on the first side of the light waveguide simulation tooling (40); and the light transceiver (50) is located on the second side of the light waveguide simulation tooling (40).

[0048] In this embodiment, the test camera (10) includes, but is not limited to, an imaging colorimeter with a light barrier front lens, a black and white or color camera with a light barrier front lens, a black and white or color camera with an industrial lens, etc. The present embodiment does not specifically limit the test camera (10), which can be determined according to actual conditions.

[0049] For the deployment of the test camera (10), if the test camera (10) is a general camera, the test camera (10) can be close to the light waveguide simulation tooling (40) when deployed; if the test camera (10) is a camera with a light barrier (20), the test camera (10) needs to ensure that the test camera (10) can shoot the light waveguide to be tested when deployed, and the center of the lens of the test camera (10) needs to coincide with the center of the eyebox of the light waveguide to be tested.

[0050] Exemplarily, in this embodiment, the light barrier (20) is removably arranged on the lens of the test camera (10), and the optical axis of the light barrier (20) is on the optical axis of the lens of the test camera (10). Here, the light barrier (20) is an aperture stop, and its diameter can be set according to actual conditions, for example, 1mm, 0.5mm, etc. In order to ensure better transmission of light, the diameter of the light barrier (20) is set to be the same as the diameter of the through hole. As for the length of the light barrier (20), it can be as long as possible without interfering with the light waveguide simulation tooling (40).

[0051] The light transceiver (50) is used for emitting light and receiving reflected light. Specifically, the light transceiver (50) can be a self-collimating instrument. The light emitted by the light transceiver (50) includes: first light and second light; wherein the first light is collimated laser; and the second light is cross parallel light, which can be switched by manual or automatic method. Here, the first light and the second light are on the same optical axis and have the same angle reference.

[0052] Exemplarily, in this embodiment, at least one of the test camera (10), the light waveguide simulation tooling (40) and the light transceiver (50) can adjust the pose, so that the test camera (10) and the light transceiver (50) are on the extension line of one of the through holes, to test the optical performance of the image observed at the test position and the test angle of the eyebox of the light waveguide to be tested corresponding to the through hole.

[0053] Specifically, if the pose of the light-imitating waveguide tooling (40) is to be adjusted, as shown in Figure 3 the calibration system can further include a first adjustment device (80) connected with the light-imitating waveguide tooling (40) and configured to adjust the pose of the light-imitating waveguide tooling (40); if the pose of the light transceiver device (50) is to be adjusted, as shown in Figure 4 the calibration system can further include a second adjustment device (90) connected with the light transceiver device (50) and configured to adjust the pose of the light transceiver device (50); if the pose of the test camera (10) is to be adjusted, as shown in Figure 4 the calibration system can further include a third adjustment device (100) connected with the test camera (10) and configured to adjust the pose of the test camera (10).

[0054] In the embodiment, at least one of the test camera (10), the light-imitating waveguide tooling (40) and the light transceiver device (50) can adjust the pose, so that the test camera (10) and the light transceiver device (50) are on the extension line of one of the through holes, to test the optical performance of the image observed at the test position and the test angle of the to-be-tested optical waveguide eyebox corresponding to the through hole. Specifically, the pose of the test camera (10) can be taken as the calibration reference to adjust the pose of the light-imitating waveguide tooling (40) and the pose of the light transceiver device (50), and the pose of the light-imitating waveguide tooling (40) can also be taken as the calibration reference to adjust the pose of the test camera (10) and the pose of the light transceiver device (50), which are not limited in the disclosure.

[0055] In the specific calibration, if the test camera (10) is small in volume (for example, the test camera (10) is an industrial camera) and easy to change the position and the angle, the pose of the light-imitating waveguide tooling (40) can be taken as the calibration reference, the position of the test camera (10) and the pose of the light transceiver device (50) are calibrated by the first light emitted by the light transceiver device (50), the light-imitating waveguide tooling (40), the diaphragm (20) and the corner cube prism (30), and the angle of the test camera (10) is calibrated by the second light emitted by the light transceiver device (50).

[0056] If the test camera (10) is large in volume (for example, the test camera (10) is an imaging colorimeter) and not easy to move the position and the angle, the pose of the test camera (10) can be taken as the calibration reference, the position of the light transceiver device (50) and the pose of the light-imitating waveguide tooling (40) are calibrated by the first light emitted by the light transceiver device (50), the diaphragm (20) and the corner cube prism (30), and the angle of the light transceiver device (50) is calibrated by the second light emitted by the light transceiver device (50).

[0057] As an optional embodiment of the present disclosure, if the calibration system calibrates based on the pose of the test camera (10), the calibration system further comprises: a first adjusting device (80) and a second adjusting device (90); wherein the first adjusting device (80) is connected with the light simulating waveguide tooling (40) and used for adjusting the pose of the light simulating waveguide tooling (40); and the second adjusting device (90) is connected with the light transceiver device (50) and used for adjusting the pose of the light transceiver device (50).

[0058] Exemplarily, in the present embodiment, the rotation center of the first adjusting device (80) is consistent with the rotation center of the second adjusting device (90), that is, the first adjusting device (80) and the second adjusting device (90) rotate around the same rotation point when rotating. Here, the rotation center of the first adjusting device (80) and the second adjusting device (90) can be set arbitrarily. In the present embodiment, the first adjusting device (80) can be a manual adjusting device (for example, a 6-axis manual adjusting device) or an automatic adjusting device (for example, a 6-axis electric adjusting device), and similarly, the second adjusting device (90) can also be a manual adjusting device (for example, a 6-axis manual adjusting device) or an automatic adjusting device (for example, a 6-axis electric adjusting device), and the present embodiment does not make specific limitation on this.

[0059] Preferably, when the calibration system calibrates based on the pose of the test camera (10), in the calibration process, the position of the light transceiver device (50) and the test camera (10) remains unchanged, and only the light simulating waveguide tooling (40) needs to be rotated by different angles to calibrate different through holes, therefore, in order to save resources, the first adjusting device (80) is set as an electric adjusting device, and the second adjusting device (90) is set as a manual adjusting device.

[0060] As an optional embodiment of the present disclosure, if the calibration system calibrates based on the pose of the light simulating waveguide tooling (40), the calibration system further comprises: a second adjusting device (90) and a third adjusting device (100); wherein the second adjusting device (90) is connected with the light transceiver device (50) and used for adjusting the pose of the light transceiver device (50); and the third adjusting device (100) is connected with the test camera (10) and used for adjusting the pose of the test camera (10).

[0061] Exemplarily, the rotation center of the second adjusting device (90) coincides with the rotation center of the third adjusting device (100); that is, the second adjusting device (90) and the third adjusting device (100) rotate around the same rotation point when rotating. Here, the rotation centers of the second adjusting device (90) and the third adjusting device (100) can be set arbitrarily. In the present embodiment, the second adjusting device (90) can be a manual adjusting device (for example, a 6-axis manual adjusting device) or an automatic adjusting device (for example, a 6-axis electric adjusting device), and similarly, the third adjusting device (100) can also be a manual adjusting device (for example, a 6-axis manual adjusting device) or an automatic adjusting device (for example, a 6-axis electric adjusting device), which is not specifically limited in the present disclosure.

[0062] Preferably, when the calibration system calibrates based on the pose of the light waveguide simulation tooling (40), the pose of the light transceiver device (50) and the test camera (10) needs to be adjusted constantly during the calibration process to calibrate different through holes on the light waveguide simulation tooling (40), therefore, in order to improve the calibration efficiency, the second adjusting device (90) and the third adjusting device (100) are both set as electric adjusting devices.

[0063] It should be noted that in the present disclosure, the calibration system can simultaneously include the first adjusting device (80), the second adjusting device (90) and the third adjusting device (100), and the rotation centers of the first adjusting device (80), the second adjusting device (90) and the third adjusting device (100) coincide, and whether the first adjusting device (80), the second adjusting device (90) and the third adjusting device (100) are automatic adjusting devices or manual adjusting devices can be set according to actual conditions.

[0064] By the calibration system provided above, the present disclosure calibrates the system by marking through holes corresponding to the test positions and test angles of the to-be-tested light waveguide eyebox on the light waveguide simulation tooling, and then for each through hole, the pose of at least one of the test camera, the light waveguide simulation tooling and the light transceiver device is adjusted to realize the calibration of the system, so as to test the optical performance of the image observed at the test position and test angle of the to-be-tested light waveguide eyebox corresponding to the through hole based on the calibrated system, which can accurately evaluate the optical performance of the image observed at different test positions and test angles of the light waveguide eyebox. Further, different light waveguide simulation toolings can be replaced to be compatible with the optical performance evaluation of different positions and different angles of multiple light waveguide eyeboxes.

[0065] Based on the above description of the calibration system, Figure 5 An exemplary flowchart of a calibration method of some embodiments of the present disclosure is shown as Figure 5As shown, the calibration method 500 calibrates based on the pose of the light waveguide tooling, and the calibration method 500 includes: S510: disposing an angular prism at at least one first opening; S520: for any through hole at which an angular prism is disposed at the first opening, controlling the light transceiver device to emit a first light to the through hole, and receiving a reflected light from the angular prism; S530: based on a first position of the reflected light on the light transceiver device, adjusting the pose of the light transceiver device; S540: in the case of removing the angular prism, controlling the light transceiver device to emit the first light through the through hole and to the test camera through the diaphragm; S550: based on a second position and a second shape of the first light formed on the test camera, adjusting the position of the test camera; S560: in the case of removing the angular prism, the diaphragm, and the light waveguide tooling, controlling the light transceiver device to emit a second light to the test camera; and S570: based on a third position of the second light formed on the test camera, adjusting the angle of the test camera.

[0066] Exemplarily, the calibration system includes a test camera, a third adjusting device, a diaphragm, an angular prism, light waveguide tooling, a first adjusting device, a light transceiver device, and a second adjusting device, and the setting method of the angular prism is described in the system embodiment above, which will not be repeated here.

[0067] If the calibration is based on the pose of the light waveguide tooling, specifically, first, the light waveguide tooling and the first adjusting device are leveled using a dial gauge, so that the height difference of the light waveguide tooling in the X direction and the Y direction of the specified coordinate system is less than a specified value (for example, 20 um). Here, the specified coordinate system is established in advance according to the actual situation, for example, a coordinate system is established with the center of the light waveguide tooling as the origin, the horizontal direction as the X direction, the direction perpendicular to the X direction on the horizontal plane as the Y direction, and the vertical direction as the Z direction, or other establishment methods, and the establishment method of the specified coordinate system is not specifically limited in the present disclosure.

[0068] The positions mentioned below are positions in the specified coordinate system, and the angles mentioned below are angles with the specified direction, which is also referred to as the 0deg direction, which is set in advance, for example, it can be the X direction of the specified coordinate system, or the Y direction of the specified coordinate system, and the like, and the present disclosure does not specifically limit it.

[0069] The specific calibration process is as follows:

[0070] For any through hole with a corner cube prism at the first opening (referred to as the first through hole), the test camera in the calibration system and the aperture set on the test camera lens are moved away, and the optical transceiver is controlled to emit a first light (i.e., a collimated laser) toward the above-mentioned first through hole. The first light passes through the first through hole and reaches the corner cube prism, and the reflected light from the corner cube prism is received. The reflected light reaches the CCD board of the optical transceiver, and the second adjustment device is controlled based on the first position of the reflected light on the CCD board to adjust the posture of the optical transceiver until the angle between the line connecting the first position of the reflected light on the CCD board and the origin of the specified coordinate system and the specified direction is less than the specified angle (for example, 0.02 degrees, 0.01 degrees, etc.), and the adjustment is stopped to obtain the posture of the optical transceiver.

[0071] Move the test camera and the aperture back and remove the corner cube. With the corner cube removed, control the optical transceiver to emit a first light ray through the first through-hole and through the aperture to the test camera. Based on the second position and second form formed by the first light ray on the test camera, control the third adjustment device to adjust the position of the test camera. Specifically, the second form refers to the shape of the light spot and the shape of the halo of the first light ray on the test camera. When making adjustments, when the distance from the second position to the center of the optical axis of the test camera is less than or equal to a specified distance (e.g., 20 μm), and the second form is that the light spot is circular and the halo is symmetrical, stop the adjustment and determine the position of the test camera.

[0072] The aperture and waveguide emulating fixture are removed. With the corner cube, aperture, and waveguide emulating fixture removed, the optical transceiver is controlled to emit a second light beam (i.e., a cross of parallel light beams) toward the test camera. Based on the third position of the second light beam on the test camera, the third adjustment device is controlled to adjust the angle of the test camera. Specifically, when the angle between the line connecting the third position of the second light beam on the test camera and the origin of the specified coordinate system and the specified direction is less than or equal to a preset angle (e.g., 0.02 degrees), the adjustment is stopped and the test camera angle is determined.

[0073] Based on the above description, the system calibration is completed at the test position and test angle corresponding to the first through hole. Based on the adjusted position and angle of the test camera and the adjusted position and angle of the simulated optical waveguide tooling, the optical performance of the image observed at the test position and test angle of the optical waveguide eye box to be tested corresponding to the first through hole is tested.

[0074] As an optional implementation of the embodiment of the present disclosure, the adjustment of the position of the test camera is coarse adjustment, and further, the calibration method further comprises: in the case of removing the corner cube prism, controlling the light transceiver device to emit the first light through the first through hole and to the test camera through the diaphragm; based on the fourth position and the fourth shape of the first light formed on the test camera, adjusting the position of the test camera, i.e. fine adjustment of the position of the test camera, to obtain a more accurate position of the test camera. The optical performance of the image observed at the test position and the test angle of the to-be-tested optical waveguide eyebox corresponding to the first through hole is tested based on the position of the test camera after the fine adjustment, the angle of the test camera after the adjustment, and the position and angle of the light simulating waveguide tooling after the adjustment.

[0075] As an optional implementation of the embodiment of the present disclosure, after the optical performance of the image observed at the test position and the test angle corresponding to the first through hole is tested, the optical performance of the image observed at the test position and the test angle corresponding to other through holes can also be tested. Based on this, the calibration method further comprises:

[0076] controlling the light transceiver device and the test camera to rotate by a specified angle in the same rotation direction; and repeatedly performing the step of controlling the light transceiver device to emit the first light to the through hole provided with the corner cube prism.

[0077] For example, in the present embodiment, as shown in Figure 4 after the light transceiver device and the test camera are controlled to rotate by a specified angle (for example, an angle of θ) in the same rotation direction, the step of controlling the light transceiver device to emit the first light to the through hole provided with the corner cube prism is repeatedly performed, the calibration at the test position and the test angle corresponding to the next through hole (denoted as the second through hole) is completed, and the optical performance of the to-be-tested optical waveguide eyebox at the test position and the test angle corresponding to the second through hole is tested. For details, refer to the calibration process at the first through hole described above, which will not be repeated here.

[0078] By the calibration method provided above, the embodiment of the present disclosure punches the through hole corresponding to the test position and the test angle of the to-be-tested optical waveguide eyebox on the light simulating waveguide tooling, and then for each through hole, the system is calibrated by adjusting the pose of at least one of the test camera, the light simulating waveguide tooling, and the light transceiver device, so as to test the optical performance of the image observed at the test position and the test angle of the to-be-tested optical waveguide eyebox corresponding to the through hole based on the calibrated system, and the optical performance of the image observed at different test positions and test angles of the optical waveguide eyebox can be accurately evaluated. Further, different light simulating waveguide toolings can be replaced, so as to be compatible with the optical performance evaluation at different positions and different angles of multiple optical waveguide eyeboxes.

[0079] Based on the above description of the calibration system, Figure 6An exemplary flow chart of another calibration method according to some embodiments of the present disclosure is shown. Figure 6 As shown, the calibration method 600 is calibrated based on the posture of the test camera, and the calibration method 600 includes: S610: setting a corner cube prism at at least one first opening; S620: for any through hole with a corner cube prism set at the first opening, when the emulation waveguide tooling and the corner cube prism are removed, controlling the optical transceiver to emit a first light ray, passing through the aperture to reach the test camera; S630: adjusting the position of the optical transceiver based on the fifth position and fifth form formed by the first light ray on the test camera; S640: when the emulation waveguide tooling, the corner cube prism and the aperture are removed, controlling the optical transceiver to emit a second light ray to the test camera; S650: adjusting the angle of the optical transceiver based on the sixth position of the second light ray on the test camera; S660: controlling the optical transceiver to emit the first light ray to the through hole, and receiving the reflected light ray from the corner cube prism; S670: adjusting the posture of the emulation waveguide tooling based on the seventh position of the reflected light ray on the optical transceiver.

[0080] For example, the disclosed embodiment is described by taking the calibration system including: a test camera, a third adjustment device, an aperture, a corner cube prism, an imitation optical waveguide tooling, a first adjustment device, an optical transceiver device, and a second adjustment device as an example. In this embodiment, the setting method of the corner cube prism refers to the description of the above system embodiment and will not be repeated here.

[0081] If calibration is performed using the test camera's position as a reference, specifically, first, use a micrometer to level the test camera and the third adjustment device so that the height difference of the third adjustment device in the X and Y directions of the specified coordinate system is less than a specified value (e.g., 20 μm). Here, the specified coordinate system is established in advance based on actual conditions. For example, a coordinate system is established with the center of the test camera as the origin, the horizontal direction as the X direction, the direction perpendicular to the X direction on the horizontal plane as the Y direction, and the vertical direction as the Z direction, or other methods are used to establish the coordinate system. The disclosed embodiments do not specifically limit the method for establishing the specified coordinate system.

[0082] The positions mentioned below are all positions in the specified coordinate system, and the angles below are all angles with the specified direction. Here, the specified direction is also called the 0deg direction, which is set in advance. For example, it can be the X direction of the specified coordinate system, or the Y direction of the specified coordinate system, etc., which is not specifically limited in the disclosed embodiments.

[0083] The specific calibration process is as follows:

[0084] For any first opening provided with a corner cube prism (denoted as a third through hole), the light waveguide tooling and the corner cube prism are removed, and the light transceiver device is controlled to emit first light (i.e., collimated laser light) to the test camera through the aperture. Based on a fifth position and a fifth shape of the first light on the test camera, the second adjustment device is controlled to adjust the position of the light transceiver device. Specifically, the fifth shape refers to the shape of the light spot and the shape of the light ring of the first light on the test camera. During specific adjustment, when the fifth position is less than or equal to a specified distance (e.g., 20 μm) from the center of the optical axis of the test camera, and the fifth shape is a circular light spot and a symmetrical light ring, the adjustment is stopped, and the position of the light transceiver device is determined.

[0085] The aperture is removed, and the light waveguide tooling, the corner cube prism, and the aperture are removed. The light transceiver device is controlled to emit second light (i.e., cross parallel light) to the test camera, and based on a sixth position of the second light on the test camera, the second adjustment device is controlled to adjust the angle of the light transceiver device. During specific adjustment, when the sixth position of the second light on the test camera is less than or equal to a preset angle (e.g., 0.02 deg) from the specified direction, the adjustment is stopped, and the angle of the light transceiver device is determined.

[0086] The test camera is removed, and the light waveguide tooling and the corner cube prism are moved back. The light transceiver device is controlled to emit first light to the third through hole. The first light passes through the first through hole to the corner cube prism and receives reflected light from the corner cube prism. The reflected light reaches the CCD plate of the light transceiver device. Based on a seventh position of the reflected light on the CCD plate, the first adjustment device is controlled to adjust the pose of the light waveguide tooling until the seventh position of the reflected light on the CCD plate is less than a preset angle (e.g., 0.02 deg, 0.01 deg, etc.) from the specified direction, and the adjustment is stopped. The pose of the light waveguide tooling is obtained.

[0087] Based on the above description, the system calibration at the test position and the test angle corresponding to the first through hole is completed. The optical performance of the to-be-tested optical waveguide eyebox at the test position and the test angle corresponding to the third through hole is tested based on the position and the angle of the test camera and the position and the angle of the adjusted light waveguide tooling.

[0088] As an optional implementation of the disclosed embodiments, after the optical performance at the test position and the test angle corresponding to the third through hole is tested, the optical performance at the test position and the test angle corresponding to other through holes can also be tested. Based on this, the calibration method further includes: controlling the light waveguide tooling to rotate a specified angle; and repeatedly performing the step of controlling the light transceiver device to emit first light in the case where the light waveguide tooling and the corner cube prism are removed.

[0089] For example, the above-mentioned specified angle may be, for example, an angle θ, and the present disclosure does not specifically limit the specified angle. Figure 3 As shown, the emulating optical waveguide fixture is controlled to rotate a specified angle. The step of controlling the optical transceiver to emit the first light beam is repeated with the emulating optical waveguide fixture and corner cube removed. This completes the calibration at the test position and test angle corresponding to the next through hole (denoted as the fourth through hole). The optical performance of the optical waveguide eye box to be tested at the test position and test angle corresponding to the fourth through hole is then tested. The specific implementation method is similar to the calibration process for the third through hole described above and will not be repeated here.

[0090] Through the calibration method provided above, the disclosed embodiment implements system calibration by marking through-holes on the emulating optical waveguide fixture corresponding to the test positions and test angles of the optical waveguide eye box to be tested. Furthermore, for each through-hole, the position of at least one of the test camera, the emulating optical waveguide fixture, and the optical transceiver is adjusted. Based on the calibrated system, the optical performance of the image observed at the test position and test angle of the optical waveguide eye box to be tested corresponding to the through-hole is tested. This allows accurate evaluation of the optical performance of images observed at different test positions and test angles of the optical waveguide eye box. Furthermore, by replacing different emulating optical waveguide fixtures, the system can be compatible with optical performance evaluation at different positions and angles for multiple optical waveguide eye boxes.

[0091] Although a plurality of embodiments of the present disclosure have been shown and described herein, it will be apparent to those skilled in the art that such embodiments are provided by way of example only. Those skilled in the art may conceive of many modifications, changes, and alternatives without departing from the ideas and spirit of the present disclosure. It should be understood that in practicing the present disclosure, various alternatives to the embodiments of the present disclosure described herein may be adopted. The appended claims are intended to define the scope of protection of the present disclosure and therefore cover equivalents or alternatives within the scope of these claims.

Claims

1. A calibration system, characterized in that: The system is applied to the optical performance test of the image observed in the optical waveguide eye box to be tested, and the system comprises: a test camera, an aperture, a corner cube prism, an optical waveguide imitation tooling and an optical transceiver; The optical waveguide imitation tooling has a plurality of through holes formed through the first side and the second side, thereby forming a first opening on the first side and a second opening on the second side; the through holes are determined according to the test position and test angle of the optical waveguide eye box to be tested; each through hole corresponds to a test position and test angle of the optical waveguide eye box to be tested; The corner cube is removably disposed on the first opening, and the center of the corner cube is located on the axis of the through hole; The diaphragm is removably arranged on the lens of the test camera, and the optical axis of the diaphragm is on the optical axis of the lens of the test camera; The test camera is located on the first side of the imitation optical waveguide tooling; The optical transceiver is used to transmit light and receive reflected light, and is located on the second side of the imitation optical waveguide tooling; At least one of the test camera, the emulating optical waveguide tooling, and the optical transceiver is capable of adjusting its position so that the test camera and the optical transceiver are located on an extension line of one of the through holes, so as to test the optical performance of an image observed at a test position and test angle of the optical waveguide eye box to be tested corresponding to the through hole.

2. The system according to claim 1, wherein: The system is calibrated based on the posture of the test camera, and the system further includes: a first adjustment device and a second adjustment device; Wherein, the first adjustment device is connected to the imitation optical waveguide tooling and is used to adjust the posture of the imitation optical waveguide tooling; The second adjustment device is connected to the optical transceiver device and is used to adjust the posture of the optical transceiver device.

3. The system according to claim 2, characterized in that The rotation center of the first adjustment device is consistent with the rotation center of the second adjustment device; the first adjustment device is an electric adjustment device; and the second adjustment device is a manual adjustment device.

4. The system according to claim 1, wherein: The system is calibrated based on the posture of the imitating optical waveguide tooling, and the system further includes: a second adjustment device and a third adjustment device; Wherein, the second adjustment device is connected to the optical transceiver device and is used to adjust the posture of the optical transceiver device; The third adjustment device is connected to the test camera and is used to adjust the posture of the test camera.

5. The system according to claim 4, characterized in that The rotation center of the second adjustment device is consistent with the rotation center of the third adjustment device; the second adjustment device and the third adjustment device are both electric adjustment devices.

6. The system according to claim 1, wherein: The height of the imitation optical waveguide tooling is greater than a specified height.

7. The system according to claim 1, wherein: The diameter of the aperture is the same as the diameter of the through hole.

8. The system according to claim 1, wherein: The light emitted by the optical transceiver includes: a first light and a second light; The first light is a collimated laser, and the second light is a cross parallel light.

9. A method for calibration using the system according to any one of claims 1 to 8, characterized in that include: Disposing a corner cube in at least one first opening; For any through hole with a corner cube prism provided at the first opening, controlling the optical transceiver to transmit the first light to the through hole and receive the reflected light from the corner cube prism; adjusting the posture of the optical transceiver device based on the first position of the reflected light on the optical transceiver device; When the corner cube prism is removed, controlling the light transceiver to emit a first light beam through the through hole and through the aperture to reach the test camera; adjusting the position of the test camera based on a second position and a second shape formed by the first light on the test camera; When the corner cube prism, the aperture, and the imitation optical waveguide tool are removed, controlling the optical transceiver to emit a second light beam to the test camera; as well as The angle of the test camera is adjusted based on a third position formed by the second light on the test camera.

10. The method according to claim 9, characterized in that After adjusting the angle of the test camera, the method further includes: When the corner cube prism is removed, controlling the optical transceiver to emit a first light beam through the through hole and through the aperture to reach the test camera; The position of the test camera is adjusted based on a fourth position and a fourth shape formed by the first light on the test camera.

11. The method according to claim 9 or 10, characterized in that The method further comprises: Controlling the optical transceiver and the test camera to rotate in the same direction and at a specified angle; Repeat the step of controlling the optical transceiver to emit the first light toward the through hole provided with the corner cube prism.

12. A method for calibration using the system of any one of claims 1 to 8, characterized in that include: Disposing a corner cube in at least one first opening; For any through hole with a corner cube prism at the first opening, when the imitation light waveguide tooling and the corner cube prism are removed, controlling the optical transceiver to emit a first light beam through the aperture to reach the test camera; adjusting the position of the optical transceiver based on a fifth position and a fifth shape formed by the first light on the test camera; When the imitation optical waveguide tooling, the corner cube prism, and the aperture are removed, controlling the optical transceiver to emit a second light beam to the test camera; adjusting an angle of the optical transceiver based on a sixth position of the second light on the test camera; Controlling the optical transceiver to transmit a first light beam toward the through hole and receive a reflected light beam from the corner cube; The posture of the simulating optical waveguide tooling is adjusted based on the seventh position of the reflected light on the optical transceiver.

13. The method according to claim 12, characterized in that The method further comprises: Controlling the imitation optical waveguide tool to rotate at a specified angle; Repeat the step of controlling the optical transceiver to emit the first light when the simulated light waveguide tooling and the corner cube are removed.

Images