Defect detection system for capacitor metallized film processing

Abstract

The invention relates to the field of defect detection, in particular to a defect detection system for capacitor metallized film processing, which comprises a transmission assembly used for conveying a metallized film, a bending assembly arranged on the transmission assembly and used for enabling the metallized film to generate a bending part, and the bending part is divided into a front bending part and a rear bending part; the front bending part is a metalized film section moving towards the vertex of the bending part in the bending part, and the rear bending part is a metalized film section moving away from the vertex of the bending part in the bending part; the light beam emitter is used for emitting light beams to the metalized film, and the light beams at least cover the front bending part and the rear bending part; and the light beam receiver is used for receiving the light beams reflected by the front bending part and the rear bending part, and detecting defects on the front bending part and the rear bending part respectively based on reflection angle changes generated by the received light beams due to the defects. By the adoption of the technical scheme, the metallized film can be bent, defects are fully exposed, and dead corners in the detection process are reduced.

Description

Technical Field

[0001] The invention relates to the field of defect detection, and in particular to a defect detection system for capacitor metallization film processing. Background Art

[0002] During the processing of metallized film, due to the influence of various factors, defects such as cracks, pits, rust, stains, impurities, mosquitoes and holes may occur on the surface of the film. These defects will not only affect the aesthetics and performance of the product, but may also cause problems in the subsequent processing or use of the product. For example, the partial discharge of metallized film capacitors is usually caused by the discharge phenomenon that cannot penetrate the electrode under the action of the electric field. When the partial discharge accumulates to a certain extent, it is easy to cause insulation breakdown accidents, which directly affects the normal operation of the capacitor. In order to solve the limitations of traditional detection methods, people have begun to study metallized film defect detection systems based on modern technologies such as machine vision and deep learning. These systems usually use high-resolution cameras and specific light sources to obtain images of the film surface, and then analyze and process the images through image processing and computer vision technology to achieve defect identification and positioning.

[0003] In the prior art, for example, patent number CN107917671A discloses a capacitor film thickness error detection method, which detects the metallized film by collecting the reflection of the laser on the metallized film, and determines whether the metallized film has defects based on the imaging of the laser beam. However, during the detection process, the incident angle of the laser beam always remains at a fixed value, so blind spots are prone to appear when facing uneven thickness, depressions, etc. Summary of the invention

[0004] In order to solve the above problems, the present invention provides a defect detection system for capacitor metallized film processing, which can bend the metallized film to fully expose the defects and reduce blind spots in the detection process.

[0005] In order to achieve the above object, the technical solution of the present invention is as follows: A defect detection system for capacitor metallization film processing, comprising: Transmission assembly: used for conveying the metallized film, the transmission assembly is provided with a bending assembly, the bending assembly is used for making the metallized film produce a bending portion, the bending portion is a front bending portion and a rear bending portion, the front bending portion is a metallized film segment in the bending portion moving toward the vertex of the bending portion, and the rear bending portion is a metallized film segment in the bending portion moving away from the vertex of the bending portion; Light beam emitter: used for emitting a light beam to the metallized film, the light beam at least covering the front curved portion and the rear curved portion; Light beam receiver: used to receive the light beams reflected by the front curved part and the rear curved part, and detect the defects on the front curved part and the rear curved part respectively based on the change of the reflection angle of the received light beam caused by the defects.

[0006] The above scheme has the following beneficial effects: 1. In this solution, the transmission component can transport the metallized film so as to continuously change the detection position, thereby performing defect detection on the entire metallized film.

[0007] 2. In this solution, the bending component can bend the metallized film to form a curved portion. Compared with the flat placement in conventional optical detection, the curved portion can provide more incident angles, so that the light beam can be incident at more angles, thereby effectively overcoming the blind spot problem.

[0008] 3. In this solution, the curved part is divided into a front curved part and a rear curved part, and the moving directions of the metallized film segments in the front curved part and the rear curved part are opposite to the apex of the curved part. Therefore, the light beam emitter can irradiate the curved part with multi-angle light beams in front of the defect in the front curved part, and irradiate the rear curved part with multi-angle light beams behind the defect. The covered light beam incident angle is wider, and the light source is unified, so there is no need to set light sources in multiple directions for optical detection before and after the defect.

[0009] Furthermore, it also includes a pressing module, which is used to control the tension of the metallized film at the bending part and stretch the metallized film.

[0010] Beneficial effect: The lamination module can control the tension of the metallized film at the bending part, reducing the impact of additional deformation caused by uneven tension on the detection effect.

[0011] Furthermore, the lamination module comprises a first lamination roller group and a second lamination roller group, and the first lamination roller and the second lamination roller are respectively located on both sides of the bending component.

[0012] Beneficial effect: Both the first pressing roller group and the second pressing roller group can control the transport speed of the metallized film and press the metallized film through roller transmission. The first pressing roller group controls the entry speed of the metallized film to the bending assembly, while the second pressing roller controls the departure speed of the metallized film from the bending assembly, so the tension of the metallized film at the bending portion can be controlled by controlling the entry speed and the departure speed.

[0013] Further, the bending assembly includes a transport roller, and the transport roller forms a triangular transport path with the first pressing roller group and the second pressing roller group.

[0014] Beneficial effect: The metallized film has good bending performance, so by setting the conveying roller, the metallized film generates a bending portion when passing through the conveying roller.

[0015] Further, the light beam receiver includes two CCD photosensitive plates, and the CCD photosensitive plates are used to receive the light beams reflected by the front curved portion and the rear curved portion respectively; The CCD photosensitive plate is used to receive the light beam reflected by the metallized film. When a floating area with a floating value greater than a preset threshold value appears in the coordinates of the light beam impact point, it is determined that there is a defect in the light beam irradiation section of the metallized film.

[0016] Beneficial effects: The CCD photosensitive plate can read the coordinate information of the impact point of the light beam on the CCD photosensitive plate, and the defects on the metallized film will change the reflection angle of the light beam, thereby changing the position of the light beam hitting the CCD photosensitive plate. By reading the coordinates of the impact point detected on the CCD photosensitive plate, it can be known whether there is a defect. The CCD photosensitive plate is located on the side of the transport roller close to the first lamination roller group and the side of the transport roller close to the second lamination roller group, and can detect the light beam reflected from the front bending part and the rear bending part respectively.

[0017] Furthermore, it also includes an image acquisition module, in which the light beam emitter is used to form a grating on the metallized film through a light beam, the image acquisition module is used to obtain the grating image on the metallized film and analyze the grating edge continuity through image recognition, and the defects of the metallized film are judged by the grating edge continuity.

[0018] Beneficial effect: After the metallized film is bent, the original concave can be exposed, so that the edge line change caused by the concave can be clearly observed in the asymptote direction of the bent part. The defects of the metallized film can be judged by identifying the continuity of the raster edge in the image.

[0019] Furthermore, it also includes a thickness measuring component, which is used to measure the thickness of the metallized film after passing through the first lamination roller group.

[0020] Beneficial effect: The light beam transmitter and light beam receiver can only detect surface defects, and the metallized film may become thicker or thinner in an entire section. The thickness measuring component can directly detect the thickness of the metallized film to determine whether there is a thicker metallized film section.

[0021] Furthermore, the thickness measuring component includes two laser distance meters, which are respectively located on both sides of the bottom and top of the metallized film.

[0022] Beneficial effect: The distance between the laser distance meter and the bottom and top of the metallized film is detected by two laser distance meters, and then compared with the distance between the two laser distance meters to calculate the thickness of the metallized film.

[0023] Furthermore, it also includes a conversion processing module, which is used to preset the deformation information of the bending part. The conversion processing module is used to perform shape inversion on the defects detected by the light beam receiver based on the deformation information of the bending part, and the inversion includes the curvature, thickness and length of the metallized film. The inversion outputs the defect information when the metallized film is straightened.

[0024] Beneficial effect: Although the bending part can make the defects more exposed, the metallized film and the defects are deformed due to the bending. If the process reasons need to be analyzed, the shapes of the metallized film and the defects need to be restored. The conversion processing module can restore the shapes of the metallized film and the defects based on the preset bending part deformation information, thereby converting the detection data into the scale of the metallized film when it is straightened.

[0025] Furthermore, the conversion processing module is also used to classify the defects into pits, burrs, bumps, depressions and scratches based on the defect information and count the number and position.

[0026] Beneficial effects: The conversion processing module classifies defects and records their locations based on defect information, thereby facilitating subsequent process improvements based on defect type and location.

[0027] Additional aspects and advantages of the present invention will be given in part in the following description and in part will be obvious from the following description, or will be learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] Figure 1 It is an isometric schematic diagram of an embodiment of a defect detection system for capacitor metallization film processing according to the present invention; Figure 2 It is a front view schematic diagram of an embodiment of a defect detection system for capacitor metallization film processing of the present invention; Figure 3 It is a module schematic diagram of an embodiment of a defect detection system for capacitor metallization film processing according to the present invention.

[0029] The figure marks in the drawings of the specification include: 1. metallized film; 2. front bending part; 3. rear bending part; 4. light beam transmitter; 5. light beam receiver; 6. first lamination roller group; 7. second lamination roller group; 8. transport roller; 9. camera; 10. laser rangefinder. DETAILED DESCRIPTION

[0030] The technical solution of the present invention will be described clearly and completely below in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0031] In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc., indicating the orientation or positional relationship, are based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the present invention. In addition, the terms "first", "second", and "third" are used for descriptive purposes only, and cannot be understood as indicating or implying relative importance.

[0032] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0033] The following is further described in detail through specific implementation methods: As attached Figure 1-Figure 3 Shown: A defect detection system for capacitor metallization film processing, comprising: Transmission assembly: used to convey the metallized film 1. The transmission assembly is a conveyor belt assembly or a conveyor wheel assembly. The transmission assembly is provided with a bending assembly. The bending assembly includes a transport roller 8. The transport roller 8 forms a triangular transport path with the first pressing roller assembly 6 and the second pressing roller assembly 7. The bending assembly is used to make the metallized film 1 produce a bending portion. The bending portion is a front bending portion 2 and a rear bending portion 3. The front bending portion 2 is a section of the metallized film 1 moving toward the vertex of the bending portion in the bending portion, and the rear bending portion 3 is a section of the metallized film 1 moving away from the vertex of the bending portion in the bending portion. The vertex is the point where the middle of the bending portion folds back after the metallized film 1 is bent. For example, if the metallized film 1 bends downward, the vertex is the lowest point of the bending portion. If the metallized film 1 bends upward, the vertex is the highest point of the bending portion.

[0034] Lamination module: The lamination module is used to control the tension of the metallized film 1 at the bending portion and stretch the metallized film 1. The lamination module includes a first lamination roller group 6 and a second lamination roller group 7. The first lamination roller and the second lamination roller are respectively located on both sides of the bending component.

[0035] The light beam emitter 4 is used to emit a light beam to the metallized film 1 , and the light beam at least covers the front curved portion 2 and the rear curved portion 3 .

[0036] The light beam receiver 5 is used to receive the light beams reflected by the front curved portion 2 and the rear curved portion 3, and detect defects on the front curved portion 2 and the rear curved portion 3 based on the change in reflection angle of the received light beams caused by the defects. The light beam receiver 5 includes two CCD photosensitive plates, and the CCD photosensitive plates are used to receive the light beams reflected by the front curved portion 2 and the rear curved portion 3 respectively. In this embodiment, the CCD photosensitive plates are placed on the left and right sides of the transport roller 8 respectively.

[0037] Image acquisition module: The light beam emitter 4 is used to form a grating on the metallized film 1 through a light beam. The image acquisition module is used to obtain the grating image on the metallized film 1 and analyze the continuity of the grating edge through image recognition. The defects of the metallized film 1 are judged by the continuity of the grating edge. The image acquisition module includes a camera 9, which is located on the side of the metallized film 1 close to the light beam emitter 4.

[0038] Thickness measuring component: used to measure the thickness of the metallized film 1 after passing through the first lamination roller group 6, the thickness measuring component includes two laser rangefinders 10, and the laser rangefinders 10 are respectively located in the middle of the beam emitters 4 on both sides of the bottom and top of the metallized film 1.

[0039] Conversion processing module: used to preset the deformation information of the bending part. The conversion processing module is used to perform shape inversion on the defects detected by the light beam receiver 5 based on the deformation information of the bending part. The inversion includes the curvature, thickness and length of the metallized film 1. The inversion outputs the defect information of the metallized film 1 when it is straightened, and based on the defect information, the defects are divided into pits, burrs, bumps, depressions and scratches, and the number and position are counted.

[0040] When in use, the metallized film 1 is transported by the transmission component. The transmission component can transport the metallized film 1 so as to continuously change the detection position, thereby performing defect detection on the entire metallized film 1. The metallized film 1 will enter the bending component area through the first lamination roller group 6. The first lamination roller group 6 and the second lamination roller group 7 can adjust the tension of the metallized film 1 by the rotation speed. After the metallized film 1 passes through the first lamination roller group 6, the thickness measuring component will detect the thickness of the metallized film 1 through the laser rangefinder 10. The distance between the laser rangefinder 10 and the bottom and top of the metallized film 1 is detected by two laser rangefinders 10, and then the thickness of the metallized film 1 can be obtained by comparing and calculating with the distance between the two laser rangefinders 10, so as to determine whether there is a section of the metallized film 1 that is getting thicker or thinner.

[0041] Subsequently, the metallized film 1 will enter the bending assembly, and through the setting of the transport roller 8, the metallized film 1 will form a bending portion when passing through the transport roller 8. Compared with the flat placement in conventional optical detection, the bending portion can provide more incident angles, so that the light beam can be incident at more angles and fully ejected into the defect, thereby effectively overcoming the dead angle problem. The bending portion is a front bending portion 2 and a rear bending portion 3, and the moving direction of the metallized film 1 section in the front bending portion 2 and the rear bending portion 3 is opposite to the apex of the bending portion. Therefore, the light beam emitter 4 can irradiate the front bending portion 2 with a multi-angle light beam in front of the defect, and on the rear bending portion 3, it can complete the multi-angle light beam irradiation behind the defect. The light beam incident angle covered is wider, and the direction of the light source is unified, so there is no need to set light sources in multiple directions for optical detection before and after the defect.

[0042] The lamination module can control the tension of the metallized film 1 at the bending part, and reduce the extra deformation caused by uneven tension that affects the detection effect. The first lamination roller group 6 and the second lamination roller group 7 can both control the transportation speed of the metallized film 1 and lamination the metallized film 1 through roller transmission. The first lamination roller group 6 controls the entry speed of the metallized film 1 to the bending component, and the second lamination roller controls the departure speed of the metallized film 1 from the bending component. Therefore, the tension of the metallized film 1 at the bending part can be controlled by controlling the entry speed and the departure speed.

[0043] The light beam receiver 5 includes two CCD photosensitive plates, which can read the coordinate information of the impact point of the light beam on the CCD photosensitive plate. The defect on the metallized film 1 will change the reflection angle of the light beam, thereby changing the position of the light beam impacting on the CCD photosensitive plate. When a floating area with a floating value greater than a preset threshold value appears in the light beam impact coordinates, it is confirmed that there is a defect in the section of the metallized film 1. The CCD photosensitive plate is located on the side of the transport roller 8 close to the first lamination roller group 6 and the side of the transport roller 8 close to the second lamination roller group 7, and can detect the light beams reflected from the front bending portion 2 and the rear bending portion 3 respectively.

[0044] The conversion processing module is used to preset the deformation information of the bending part. Although the bending part can make the defects better exposed, the metallized film 1 and the defects are deformed due to the bending. If the process reasons need to be analyzed, the shapes of the metallized film 1 and the defects need to be restored to obtain the actual defect image. The conversion processing module can restore the shapes of the metallized film 1 and the defects based on the preset deformation information of the bending part, thereby converting the detection data into the scale of the metallized film 1 when it is straightened, which is convenient for subsequent process optimization and reduces the generation of defects.

[0045] The conversion processing module is also used to classify defects into pits, burrs, bumps, depressions and scratches based on defect information and count the number and location, which can facilitate the generation of a defect data table so that users can understand the concentrated types and locations of defects in the production process based on the defect data table.

[0046] Obviously, the above embodiments are merely examples for the purpose of clear explanation, and are not intended to limit the implementation methods. For those skilled in the art, other different forms of changes or modifications can be made based on the above description. It is not necessary and impossible to list all the implementation methods here. The obvious changes or modifications derived therefrom are still within the scope of protection of the invention.

Claims

1. A defect detection system for capacitor metallization film processing, characterized in that: include: A transmission component: used for conveying a metallized film (1), the transmission component being provided with a bending component, the bending component being used for causing the metallized film (1) to produce a bending portion, the bending portion being a front bending portion (2) and a rear bending portion (3), the front bending portion (2) being a section of the metallized film (1) moving in the bending portion toward the vertex of the bending portion, and the rear bending portion (3) being a section of the metallized film (1) moving in the bending portion away from the vertex of the bending portion; A light beam emitter (4): used for emitting a light beam toward the metallized film (1), wherein the light beam at least covers the front curved portion (2) and the rear curved portion (3); A light beam receiver (5) is used to receive light beams reflected by the front curved portion (2) and the rear curved portion (3), and detect defects on the front curved portion (2) and the rear curved portion (3) based on changes in the reflection angle of the received light beams caused by the defects.

2. The defect detection system for capacitor metallization film processing according to claim 1, characterized in that: It also comprises a pressing module, which is used to control the tension of the metallized film (1) at the bending portion and to stretch the metallized film (1).

3. The defect detection system for capacitor metallization film processing according to claim 2, characterized in that: The lamination module comprises a first lamination roller group (6) and a second lamination roller group (7), wherein the first lamination roller and the second lamination roller are respectively located on two sides of the bending component.

4. The defect detection system for capacitor metallization film processing according to claim 3, characterized in that: The bending assembly comprises a transport roller (8), wherein the transport roller (8) forms a triangular transport path with a first pressing roller group (6) and a second pressing roller group (7).

5. The defect detection system for capacitor metallization film processing according to claim 4, characterized in that: The light beam receiver (5) comprises two CCD photosensitive plates, and the CCD photosensitive plates are used to receive the light beams reflected by the front curved portion (2) and the rear curved portion (3) respectively; The CCD photosensitive plate is used to receive the light beam reflected by the metallized film (1). When a floating area with a floating value greater than a preset threshold value appears in the coordinates of the light beam striking point, it is determined that a defect exists in the light beam irradiation section of the metallized film (1).

6. The defect detection system for capacitor metallization film processing according to claim 5, characterized in that: It also includes an image acquisition module. The light beam emitter (4) is used to form a grating on the metallized film (1) through a light beam. The image acquisition module is used to obtain a grating image on the metallized film (1) and analyze the grating edge continuity through image recognition, and judge the defects of the metallized film (1) through the grating edge continuity.

7. The defect detection system for capacitor metallization film processing according to claim 6, characterized in that: It also includes a thickness measuring component, which is used to measure the thickness of the metallized film (1) after passing through the first lamination roller group (6).

8. The defect detection system for capacitor metallization film processing according to claim 7, characterized in that: The thickness measurement component comprises two laser distance meters (10), and the laser distance meters (10) are respectively located on both sides of the bottom and top of the metallized film (1).

9. The defect detection system for capacitor metallization film processing according to claim 8, characterized in that: It also includes a conversion processing module, which is used to preset the deformation information of the bending part. The conversion processing module is used to perform shape inversion on the defects detected by the light beam receiver (5) based on the deformation information of the bending part, wherein the inversion includes the curvature, thickness and length of the metallized film (1), and the inversion outputs the defect information when the metallized film (1) is straightened.

10. The defect detection system for capacitor metallization film processing according to claim 9, characterized in that: The conversion processing module is also used to classify the defects into pits, burrs, bumps, depressions and scratches based on the defect information and count the number and position.

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