An intelligent hardware performance testing system and method

Abstract

The present invention discloses an intelligent hardware performance testing system and method, which relates to the technical field of hardware performance testing. It includes a hardware device data acquisition module, a target reference object selection module, an adjustment parameter analysis module, and a hardware performance testing module. The hardware device data acquisition module collects circuit board data used in different usage environments. The target reference object selection module analyzes the degree of change in the usage environment of different circuit boards, and selects target circuit boards that can provide reference for testing methods according to the analysis results. The adjustment parameter analysis module retrieves the compressive data and maintenance time data of the target circuit board during use to form a set of adjustment parameters to be referenced. The hardware performance testing module selects a testing method to perform a compressive performance test on the current circuit board, improving the adaptability of some circuit boards to the usage environment when they are put into use after passing the compressive performance test.

Description

Technical Field

[0001] The present invention relates to the technical field of hardware performance testing, and specifically to an intelligent hardware performance testing system and method. Background Art

[0002] The compressive performance test of a circuit board is an important means to evaluate the voltage resistance ability of the circuit board material and the insulating layer. The existing test method generally connects the circuit board to a withstand voltage tester, gradually increases the voltage applied to the circuit board to the maximum withstand voltage, and observes whether there is any abnormality during this process. If an abnormality occurs, it is determined that the compressive performance of the circuit board is unqualified, and the performance of the corresponding circuit board needs to be continuously improved. However, the existing test method can only test the maximum withstand voltage value of the circuit board, but cannot test whether the circuit board with corresponding compressive performance can adapt to the use environment during subsequent use. In the actual use process of the circuit board, the voltage it withstands may not be increased gradually, with the same voltage increase value each time and the same duration of withstanding the corresponding voltage. Currently, there is a lack of a better compressive performance test method to predict whether the circuit board can adapt to the use environment during actual use. The existing test method cannot improve the adaptability of some circuit boards to the use environment when they are put into use after passing the compressive performance test. Therefore, it is impossible to specifically improve the performance of unqualified circuit boards to increase the service life of the improved circuit boards in the actual use environment. Summary of the Invention

[0003] The purpose of the present invention is to provide an intelligent hardware performance testing system and method to solve the problems raised in the prior art.

[0004] To achieve the above purpose, the present invention provides the following technical solution: An intelligent hardware performance testing system, the system includes a hardware device data acquisition module, a target reference object selection module, an adjustment parameter analysis module, and a hardware performance testing module;

[0005] Collect circuit board data used in different use environments through the hardware device data acquisition module;

[0006] Analyze the degree of change in the use environment of different circuit boards through the target reference object selection module, and screen out target circuit boards that can provide reference for the test method according to the analysis results;

[0007] Retrieve the compressive data and duration data of the target circuit board during use through the adjustment parameter analysis module, and form a set of adjustment parameters to be referenced;

[0008] Select a test method through the hardware performance testing module to perform a compressive performance test on the current circuit board.

[0009] Preferably, the hardware device data acquisition module includes a compressive stress data acquisition unit and a maintenance time acquisition unit;

[0010] The compressive stress data acquisition unit is used to acquire the historical withstand voltage data of a plurality of circuit boards used in different usage environments during the same time period;

[0011] The maintenance time acquisition unit is used to obtain the time during which the voltage borne by the circuit board remains unchanged.

[0012] Preferably, the target reference object selection module includes a working curve generation unit, a curve matching analysis unit, a change degree analysis unit, and a test reference target screening unit;

[0013] The working curve generation unit is used to generate the historical working curves of a plurality of circuit boards used in different usage environments. The historical working curve is a curve in which the voltage borne by the circuit board changes with time, and each circuit board corresponds to a plurality of historical working curves;

[0014] The curve matching analysis unit is used to analyze the matching scores between the plurality of historical working curves corresponding to any one circuit board;

[0015] The change degree analysis unit is used to set the highest matching score, the second range of matching scores, and the third range of matching scores, count the number of matching score items within different ranges, and analyze the change degree of the usage environment of any one circuit board based on the statistical results;

[0016] The test reference target screening unit is used to compare the change degrees of the usage environments of different circuit boards and screen out the target circuit boards that can provide reference for the test method.

[0017] Preferably, the adjustment parameter analysis module includes a working data retrieval unit and an adjustment parameter set construction unit;

[0018] The working data retrieval unit is used to retrieve the two historical working curves with the highest matching scores from the historical working curves of the target circuit board, retrieve the compressive stress data and maintenance time data used to generate any one of the two historical working curves, and transmit the retrieved data to the adjustment parameter set construction unit;

[0019] The adjustment parameter set construction unit is used to construct a set of adjustment parameters to be referenced during the compressive performance test of the circuit board.

[0020] Preferably, the hardware performance test module includes a test equipment preparation unit, a parameter adjustment management unit, and a compressive performance test unit;

[0021] The test equipment preparation unit is used to prepare a withstand voltage tester to perform a compressive performance test on the current circuit board;

[0022] The parameter adjustment management unit is used to select a compressive performance test method for the current circuit board: determine whether the planned usage environment of the current circuit board is the same as that of the target circuit board: if the planned usage environment of the current circuit board is the same as that of any one of the target circuit boards, the selected compressive performance test method for the current circuit board is: conduct the highest compressive value test and the compressive performance test under the simulated usage environment. When conducting the compressive performance test under the simulated usage environment, adjust and set the parameters according to the set of adjustment parameters to be referenced corresponding to the target circuit board; if the planned usage environment of the current circuit board is different from that of all the target circuit boards, the selected compressive performance test method for the current circuit is: only conduct the highest compressive value test;

[0023] The compressive performance test unit is used to test the current circuit board according to the selected test method and obtain the compressive performance test result.

[0024] An intelligent hardware performance test method includes the following steps:

[0025] S100: Collect data of circuit boards used in different usage environments;

[0026] S200: Analyze the degree of change in the usage environment of different circuit boards, and select target circuit boards that can provide a reference for the test method according to the analysis results;

[0027] S300: Retrieve the compressive data and duration data during the use of the target circuit board, and form a set of adjustment parameters to be referenced;

[0028] S400: Select a test method to conduct a compressive performance test on the current circuit board.

[0029] Preferably, in step S100: collect the historical withstand voltage values of m circuit boards used in different usage environments during the [a, b] time period every day, where a is the initial time for collecting the withstand voltage value data, and b is the end time for collecting the withstand voltage value data, and obtain the time data of different voltages maintained unchanged by the m circuit boards during the [a, b] time period.

[0030] Preferably, in step S200: generate the historical working curves of the m circuit boards. The historical working curve is a curve in which the withstand voltage value of the circuit board changes with time. One circuit board corresponds to n historical working curves. Obtain the curvature functions k1(t) and k2(t) of any two randomly selected curves among the n historical working curves of a randomly selected circuit board, and calculate the matching score Q between the two randomly selected historical working curves according to the following formula i :

[0031]

[0032] Obtain a set of matching scores Q = {Q1, Q2,... Q i ,... Q r} between the historical working curves corresponding to randomly selected circuit boards. Let r represent the number of matching score items in the data set Q. Set the highest matching score as N, the second range of matching scores as [N1, N], and the third range of matching scores as [0, N1], where 0 < N1 < N. It is statistically found that there are U1 matching scores equal to N in the data set Q, U2 matching scores in the range [N1, N], and U3 matching scores in the range [0, N1]. Analyze to obtain the degree of change in the usage environment of a randomly selected circuit board as W j , W j = 1 / (C1*U1 + C2*U2 + C3*U3), where C1 > C2 > C3, and C1, C2, and C3 are weights. Obtain a set of usage environment change degree values W = {W1, W2,... W j ,... W m} for m circuit boards. Set the threshold of the usage environment change degree as W ’ , W ’ = ∑ m j＝1 (W j ) / m. Screen out the circuit boards with a change degree lower than W ’ as the target circuit boards that can provide reference for the test method.

[0033] To achieve the purpose of selecting the best compressive performance test method for the current circuit board, collect the historical compressive data of circuit boards used in different usage environments at different times within the same time period through big data technology, generate the historical working curves of these circuit boards, analyze the usage environment of the circuit boards by analyzing the matching degree between the historical working curves, and thus analyze the degree of change in the usage environment of the circuit boards. The lower the degree of change, the stronger the regularity of the voltage change borne by the corresponding circuit board during use. Use the compressive data of the target circuit boards with a relatively high degree of change in the usage environment as the data of the parameter to be adjusted for reference, which is beneficial to selecting circuit boards that are to be tested and have the same planned usage environment as the target circuit boards to conduct simulated environment compressive tests according to the parameter to be adjusted for reference. Considering that the usage environments of the circuit boards to be tested are different and the usage environments of some circuit boards are variable, it is meaningless to conduct simulated environment compressive tests. Therefore, only select circuit boards with the same usage environment as the target circuit boards to conduct simulated environment compressive tests, which is beneficial to improving the test effect and the accuracy of the test results of the compressive test according to the parameter to be adjusted for reference.

[0034] Preferably, in step S300: a total of x target circuit boards are screened out by counting, two historical working curves with the highest matching scores are retrieved from the historical working curves of a random target circuit board, and the withstand voltage value data used to generate any one of the two historical working curves are retrieved and combined into {V1, V2, ... V f}, the corresponding time data set for the voltage value to remain unchanged is {T1, T2, ...T f}, f represents the number of data items used to generate the corresponding working curve. A random reference adjustment parameter set is constructed during the circuit board compressive performance test as {(V1, T1), (V2, T2), ... (V f , T f )}, a total of x reference adjustment parameter sets are established for x target circuit boards.

[0035] Preferably, in step S400: prepare a withstand voltage tester to perform a withstand voltage performance test on the current circuit board, use the withstand voltage tester to apply voltage to the circuit board, set the maximum allowable leakage current value, test whether the actual leakage current of the circuit board exceeds the maximum allowable leakage current value when the voltage is applied, and select a withstand voltage performance test method for the current circuit board: determine whether the planned use environment of the current circuit board is the same as the use environment of the target circuit board: if the planned use environment of the current circuit board is the same as the use environment of any circuit board in the target circuit boards, select the withstand voltage performance test method for the current circuit board: perform the highest withstand voltage value test and the withstand voltage performance test under the simulated use environment, and when performing the withstand voltage performance test under the simulated use environment, press the use environment The applied voltage value and the applied voltage holding time are adjusted using the reference adjustment parameter set corresponding to the target circuit board in the same environment as the planned use environment of the current circuit board; when performing the maximum withstand voltage value test, the qualified withstand voltage value is set, and the voltage applied to the current circuit board is gradually increased using the withstand voltage tester until the applied voltage reaches the qualified withstand voltage value. When testing the current circuit board in two test methods: whether the actual leakage current of the circuit board exceeds the maximum allowable leakage current value during the test is judged. If so, the withstand voltage performance test result of the current circuit board is unqualified; otherwise, the test result is qualified. When the maximum withstand voltage value test result and the withstand voltage performance test result under the simulated use environment are both qualified, the withstand voltage performance of the current circuit board is judged to be qualified;

[0036] If the planned use environment of the current circuit board is different from the use environment of all target circuit boards, the compression performance test method selected for the current circuit is: only the highest compression value test is performed. If the highest compression value test result is qualified, the compression performance of the current circuit board is judged to be qualified;

[0037] Different compressive performance test methods are selected for circuit boards with the same and different usage environments as the planned usage environment and the target circuit board usage environment, improving the adaptability of some circuit boards to the usage environment when they are put into use after passing the compressive performance test.

[0038] Compared with the prior art, the beneficial effects of the present invention are:

[0039] To achieve the purpose of selecting the best compressive performance test method for the current circuit board, the present invention collects historical compressive data of circuit boards used in different usage environments at different times within the same time period through big data technology, generates historical working curves of these circuit boards, analyzes the usage environment of the circuit boards by analyzing the matching degree between the historical working curves, thereby analyzing the degree of change in the usage environment of the circuit boards, and taking the bearing pressure data of the target circuit board with a relatively high degree of change in the usage environment as the data of the parameter to be adjusted for reference, which is beneficial to select some circuit boards to be tested and with the same usage environment as the target circuit board to conduct simulated environment compressive tests according to the parameter to be adjusted for reference. Considering that the usage environments of the circuit boards to be tested are different and the usage environments of some circuit boards are variable, it is meaningless to conduct simulated environment compressive tests. Therefore, only the circuit boards with the same usage environment as the target circuit board are selected to conduct simulated environment compressive tests, which is beneficial to improve the test effect and the accuracy of the test results of the compressive test according to the parameter to be adjusted for reference; different compressive performance test methods are selected for circuit boards with the same and different usage environments as the planned usage environment and the target circuit board usage environment, improving the adaptability of some circuit boards to the usage environment when they are put into use after passing the compressive performance test. Description of the Drawings

[0040] Figure 1 It is a schematic structural diagram of an intelligent hardware performance test system of the present invention;

[0041] Figure 2 It is a schematic flow diagram of an intelligent hardware performance test method of the present invention. Detailed Embodiments

[0042] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0043] Example 1: As Figure 1As shown in the figure, this embodiment provides an intelligent hardware performance testing system, which includes: a hardware device data acquisition module, a target reference object selection module, an adjustment parameter analysis module, and a hardware performance testing module; the hardware device data acquisition module collects circuit board data used in different usage environments; the target reference object selection module analyzes the degree of change in the usage environment of different circuit boards, and filters out target circuit boards that can provide reference for testing methods according to the analysis results; the adjustment parameter analysis module retrieves the compressive data and maintenance time data of the target circuit board during use, and forms a set of adjustment parameters to be referenced; the hardware performance testing module selects a testing method to perform a compressive performance test on the current circuit board.

[0044] The hardware device data acquisition module includes a compressive data acquisition unit and a maintenance time acquisition unit; the compressive data acquisition unit is used to collect the historical voltage data borne by several circuit boards used in different usage environments during the same time period. The voltage borne by the circuit board during use can be measured by tools such as a multimeter or an oscilloscope; the maintenance time acquisition unit is used to obtain the time during which the voltage borne by the circuit board remains unchanged.

[0045] The target reference object selection module includes a working curve generation unit, a curve matching analysis unit, a change degree analysis unit, and a test reference target screening unit; the working curve generation unit is used to generate the historical working curves of several circuit boards used in different usage environments. The historical working curve is a curve in which the voltage value borne by the circuit board changes with time, and each circuit board corresponds to several historical working curves; the curve matching analysis unit is used to analyze the matching scores between several historical working curves corresponding to any one circuit board; the change degree analysis unit is used to set the highest matching score, the second range of matching scores, and the third range of matching scores, count the number of matching score items within different ranges, and analyze the degree of change in the usage environment of any one circuit board according to the statistical results; the test reference target screening unit is used to compare the degrees of change in the usage environments of different circuit boards, and filter out target circuit boards that can provide reference for testing methods.

[0046] The adjustment parameter analysis module includes a working data retrieval unit and an adjustment parameter set formation unit; the working data retrieval unit is used to retrieve the two historical working curves with the highest matching scores from the historical working curves of the target circuit board, retrieve the compressive data and maintenance time data used to generate any one of the two historical working curves, and transmit the retrieved data to the adjustment parameter set formation unit; the adjustment parameter set formation unit is used to form a set of adjustment parameters to be referenced during the compressive performance test of the circuit board.

[0047] The hardware performance test module includes a test equipment preparation unit, a parameter adjustment management unit, and a compressive performance test unit; the test equipment preparation unit is used to prepare a withstand voltage tester to perform a compressive performance test on the current circuit board; the parameter adjustment management unit is used to select a compressive performance test method for the current circuit board: determine whether the planned usage environment of the current circuit board is the same as that of the target circuit board: if the planned usage environment of the current circuit board is the same as that of any one of the target circuit boards, select the compressive performance test method for the current circuit board as: perform the maximum compressive value test and the compressive performance test under the simulated usage environment, and when performing the compressive performance test under the simulated usage environment, adjust and set the parameters according to the set of adjustment parameters to be referred to corresponding to the target circuit board; if the planned usage environment of the current circuit board is different from that of all target circuit boards, select the compressive performance test method for the current circuit as: only perform the maximum compressive value test; the compressive performance test unit is used to test the current circuit board according to the selected test method and obtain the compressive performance test result.

[0048] Embodiment 2: As Figure 2 shown, this embodiment provides an intelligent hardware performance test method, which is implemented based on the test system in the embodiment, and specifically includes the following steps:

[0049] S100: Collect data of circuit boards used in different usage environments: Collect the historical withstand voltage values of m circuit boards used in different usage environments during the [a, b] time period every day, where a is the initial time for collecting the withstand voltage value data, and b is the end time for collecting the withstand voltage value data, and obtain the time data during which the different voltages borne by the m circuit boards remain unchanged during the [a, b] time period. For example: at time point a, the withstand voltage value of a randomly selected circuit board is collected as A, and at time point c, the voltage value changes to B, then the time during which the withstand voltage value A of the corresponding circuit board remains unchanged is c - a;

[0050] S200: Analyze the degree of change in the usage environment of different circuit boards, and screen out target circuit boards that can provide reference for the test method according to the analysis results: Generate historical working curves of m circuit boards. The historical working curve is a curve in which the withstand voltage value of the circuit board changes with time. One circuit board corresponds to n historical working curves. For example: for a randomly selected circuit board, the first historical working curve is generated from the withstand voltage value data of the circuit board at different times during the [a, b] time period on the first day, and the nth historical working curve is generated from the withstand voltage value data of the circuit board at different times during the [a, b] time period on the nth day. Obtain the curvature functions of any two curves among the n historical working curves of a randomly selected circuit board as k1(t) and k2(t), and calculate the matching score Q between any two historical working curves according to the following formula i :

[0051]

[0052] The set of matching scores between any two historical working curves corresponding to a randomly obtained circuit board is Q = {Q1, Q2,... Q i ,... Q r}, where r represents the number of matching score items in the dataset Q. Set the highest matching score as N, the second range of matching scores as [N1, N], and the third range of matching scores as [0, N1], where 0 < N1 < N. It is statistically found that there are U1 matching scores equal to N in the dataset Q, U2 matching scores in the range [N1, N], and U3 matching scores in the range [0, N1]. The degree of change in the usage environment of a randomly obtained circuit board is analyzed as W j , W j = 1 / (C1 * U1 + C2 * U2 + C3 * U3), where * represents the multiplication sign, C1 > C2 > C3, and C1, C2, and C3 are weights. The set of degrees of change in the usage environment of m circuit boards is W = {W1, W2,... W j ,... W m}. Set the threshold of the degree of change in the usage environment as W ’ , W ’ = ∑ m j＝1 (W j ) / m. The circuit boards with a change degree lower than W ’ are selected as the target circuit boards that can provide reference for the test method;

[0053] For example: The degrees of change in the usage environment of 5 circuit boards are obtained as follows: W1 = 0.30, W2 = 0.34, W3 = 0.22, W4 = 0.10, W5 = 0.52. Set the threshold of the degree of change in the usage environment as W ’ , W ’ = ∑ m j＝1 (W j ) / m = 0.296. Since W3 < W ’ , and W4 < W ’ , the 3rd and 4th circuit boards are taken as the target circuit boards that can provide reference for the test method;

[0054] S300: Retrieve the compressive data and maintenance time data of the target circuit board during use, and form a set of adjustment parameters to be referenced: It is statistically found that a total of x target circuit boards are selected. From the historical working curves of a randomly selected target circuit board, the two historical working curves with the highest matching scores are retrieved. The data of the withstand voltage values used to generate any one of the two historical working curves are combined into {V1, V2,... Vf}, and the time data set during which the corresponding voltage value remains unchanged is {T1, T2,... T f}, where f represents the number of data items used to generate the corresponding working curve. A randomly selected set of adjustable parameters to be referenced during the compressive performance test of the circuit board is {(V1, T1), (V2, T2),... (V f , T f ). For x target circuit boards, x sets of adjustable parameters to be referenced are formed;

[0055] S400: Select a test method to perform a compressive performance test on the current circuit board: Prepare a withstand voltage tester to perform a compressive performance test on the current circuit board. Apply a voltage to the circuit board using the withstand voltage tester, set the maximum allowable leakage current value, and test whether the actual leakage current of the circuit board exceeds the maximum allowable leakage current value when the voltage is applied. Select a compressive performance test method for the current circuit board: Determine whether the planned usage environment of the current circuit board is the same as the usage environment of the target circuit board. If the planned usage environment of the current circuit board is the same as the usage environment of any one of the target circuit boards, select the compressive performance test method for the current circuit board as: Perform the highest compressive value test and the compressive performance test under the simulated usage environment. When performing the compressive performance test under the simulated usage environment, adjust the applied voltage value and the applied voltage holding time according to the set of adjustable parameters to be referenced corresponding to the target circuit board with the same usage environment as the planned usage environment of the current circuit board. For example: If the set of adjustable parameters to be referenced corresponding to the target circuit board with the same usage environment as the planned usage environment of the current circuit board is {(V1, T1), (V2, T2),... (V f , T f ), test the current circuit board according to the corresponding set of adjustable parameters to be referenced. The initial voltage applied is V1, and it is maintained for a duration of T1. After a duration of T1, adjust the applied voltage to V2 and maintain it for a duration of T2, and so on until the applied voltage is adjusted to V f , and it is maintained for a duration of T f . When performing the highest compressive value test, set the qualified compressive value, and gradually increase the voltage applied to the current circuit board using the withstand voltage tester until the applied voltage reaches the qualified compressive value. When performing the two test methods on the current circuit board: Determine whether the actual leakage current of the circuit board exceeds the maximum allowable leakage current value during the test. If it exceeds, the test result of the compressive performance of the current circuit board is unqualified; otherwise, the test result is qualified. When both the highest compressive value test result and the compressive performance test result under the simulated usage environment are qualified, determine that the compressive performance of the current circuit board is qualified;

[0056] If the planned usage environment of the current circuit board is different from that of all target circuit boards, the anti-pressure performance test method for the current circuit is selected as follows: only perform the highest anti-pressure value test. When the test result of the highest anti-pressure value is qualified, it is determined that the anti-pressure performance of the current circuit board is qualified.

[0057] For those skilled in the art, it is obvious that the present invention is not limited to the details of the above-described exemplary embodiments, and can be implemented in other specific forms without departing from the spirit or basic characteristics of the present invention. Therefore, in any aspect, the embodiments should be regarded as exemplary and non-limiting. The scope of the present invention is defined by the appended claims rather than the above description. Therefore, all changes falling within the meaning and scope of the equivalent elements of the claims are intended to be embraced within the present invention. Any reference signs in the claims should not be construed as limiting the claims involved.

Claims

1. An intelligent hardware performance testing system, characterized in that: The system includes a hardware device data acquisition module, a target reference object selection module, an adjustment parameter analysis module, and a hardware performance test module; The hardware device data acquisition module is used to collect circuit board data used in different usage environments; The target reference object selection module analyzes the degree of change in the usage environment of different circuit boards, and filters out target circuit boards that can provide reference for test methods according to the analysis results; The adjustment parameter analysis module retrieves the compressive data and maintenance time data of the target circuit board during use, and forms a set of adjustment parameters to be referenced; The hardware performance test module selects a test method to perform a compressive performance test on the current circuit board; The target reference object selection module includes a working curve generation unit, a curve matching analysis unit, a change degree analysis unit, and a test reference target filtering unit; The working curve generation unit is used to generate historical working curves of several circuit boards used in different usage environments. The historical working curve is a curve in which the voltage value borne by the circuit board changes with time, and each circuit board corresponds to several historical working curves; The curve matching analysis unit is used to analyze the matching scores between several historical working curves corresponding to any one circuit board; The change degree analysis unit is used to set the highest matching score, the second range of matching scores, and the third range of matching scores, count the number of matching score items within different ranges, and analyze the degree of change in the usage environment of any one circuit board according to the statistical results; The test reference target filtering unit is used to compare the degree of change in the usage environment of different circuit boards, and filter out target circuit boards that can provide reference for test methods; 2. The intelligent hardware performance testing system according to claim 1, wherein: The hardware device data acquisition module includes a compressive data acquisition unit and a maintenance time acquisition unit; The compressive data acquisition unit is used to collect historical voltage-bearing data of several circuit boards used in different usage environments during the same time period; The maintenance time acquisition unit is used to obtain the time during which the voltage borne by the circuit board remains unchanged; 3. An intelligent hardware performance testing system according to claim 1, characterized in that: The adjustment parameter analysis module includes a working data retrieval unit and an adjustment parameter set formation unit; The working data retrieval unit is used to retrieve the two historical working curves with the highest matching scores from the historical working curves of the target circuit board, retrieve the compressive data and maintenance time data used to generate any one of the two historical working curves, and transmit the retrieved data to the adjustment parameter set formation unit; The adjustment parameter set formation unit is used to form a set of adjustment parameters to be referenced during the compressive performance test of the circuit board; 4. An intelligent hardware performance testing system according to claim 3, characterized in that: The hardware performance test module includes a test equipment preparation unit, a parameter adjustment management unit, and a compressive performance test unit; The test equipment preparation unit is used to prepare a withstand voltage tester to perform a compressive performance test on the current circuit board; The parameter adjustment management unit is used to select a compressive performance test method for the current circuit board: determine whether the planned usage environment of the current circuit board is the same as that of the target circuit board. If the planned usage environment of the current circuit board is the same as that of any one of the target circuit boards, the selected compressive performance test method for the current circuit board is: conduct the highest compressive value test and the compressive performance test under the simulated usage environment. When conducting the compressive performance test under the simulated usage environment, adjust and set the parameters according to the set of adjustment parameters to be referenced corresponding to the target circuit board. If the planned usage environment of the current circuit board is different from that of all target circuit boards, the selected compressive performance test method for the current circuit is: only conduct the highest compressive value test. The compressive performance test unit is used to test the current circuit board according to the selected test method and obtain the compressive performance test result.

5. An intelligent hardware performance testing method, characterized in that: It includes the following steps: S100: Collect data of circuit boards used in different usage environments. S200: Analyze the degree of change in the usage environment of different circuit boards, and select target circuit boards that can provide reference for the test method according to the analysis results. S300: Retrieve the compressive data and maintenance time data of the target circuit board during use, and form a set of adjustment parameters to be referenced. S400: Select a test method to conduct a compressive performance test on the current circuit board. In step S100: Collect the historical voltage values borne by m circuit boards used in different usage environments during the [a, b] time period every day, where a is the initial time for collecting the voltage value data, b is the end time for collecting the voltage value data, and obtain the time data for different voltages borne by the m circuit boards remaining unchanged during the [a, b] time period. In step S200: Generate the historical working curves of m circuit boards. The historical working curve is a curve showing the change of the voltage value borne by the circuit board over time. One circuit board corresponds to n historical working curves. The curvature functions of any two randomly selected curves among the n historical working curves of a randomly selected circuit board are k1(t) and k2(t) respectively. Calculate the matching score Q between the two randomly selected historical working curves according to the following formula i :[[]]END]] ； Obtain a set of matching scores Q = {Q1, Q2,... Q i ,... Q r} between the historical working curves corresponding to randomly selected circuit boards. Let r represent the number of matching score items in the data set Q. Set the highest matching score as N, the second range of matching scores as [N1, N], and the third range of matching scores as [0, N1], where 0 < N1 < N. , It is statistically found that there are U1 matching scores equal to N in the data set Q, U2 matching scores in the range [N1, N], and U3 matching scores in the range [0, N1]. Analyze that the degree of change in the usage environment of a randomly selected circuit board is W j , W j = 1 / (C1 * U1 + C2 * U2 + C3 * U3), where C1 > C2 > C3, and C1, C2, and C3 are weights. Obtain a set of usage environment change degree W = {W1, W2,... W j ,... W m} for m circuit boards. Set the usage environment change degree threshold as W ’ , W ’ = ∑ m j=1 (W j ) / m. Screen out the circuit boards with a change degree lower than W ’ as the target circuit boards that can provide reference for the test method.

6. The intelligent hardware performance testing method according to claim 5, wherein: In step S300: a total of x target circuit boards are screened out, and two historical working curves with the highest matching scores are retrieved from the historical working curves of a random target circuit board, and the withstand voltage value data used to generate any one of the two historical working curves are retrieved and combined into {V1, V2, ... V f }, the corresponding time data set for the voltage value to remain unchanged is {T1, T2, ...T f }, f represents the number of data items used to generate the corresponding working curve. A random reference adjustment parameter set is constructed during the circuit board compressive performance test as {(V1, T1), (V2, T2), ... (V f , T f )}, a total of x reference adjustment parameter sets are established for x target circuit boards.

7. An intelligent hardware performance testing method according to claim 6, characterized in that: In step S400: Prepare a withstand voltage tester to conduct a compressive performance test on the current circuit board, apply voltage to the circuit board using the withstand voltage tester, set the maximum allowable leakage current value, and test whether the actual leakage current of the circuit board exceeds the maximum allowable leakage current value when applying voltage. Select a compressive performance test method for the current circuit board: determine whether the planned usage environment of the current circuit board is the same as that of the target circuit board. If the planned usage environment of the current circuit board is the same as that of any one of the target circuit boards, the selected compressive performance test method for the current circuit board is: conduct the highest compressive value test and the compressive performance test under the simulated usage environment. When conducting the compressive performance test under the simulated usage environment, adjust the applied voltage value and the applied voltage maintenance time according to the set of adjustment parameters to be referenced corresponding to the target circuit board whose usage environment is the same as that of the current circuit board. When performing the maximum compressive strength test, set the qualified compressive strength value, and use a withstand voltage tester to gradually increase the voltage applied to the current circuit board until the applied voltage reaches the qualified compressive strength value. When testing the current circuit board in two testing methods: judge whether the actual leakage current of the circuit board during the test exceeds the maximum allowable leakage current value. If it exceeds, the test result of the compressive performance of the current circuit board is unqualified; otherwise, the test result is qualified. When both the maximum compressive strength test result and the compressive performance test result under the simulated usage environment are qualified, judge that the compressive performance of the current circuit board is qualified. If the planned usage environment of the current circuit board is different from the usage environments of all target circuit boards, select the compressive performance test method for the current circuit as: only perform the maximum compressive strength test. When the maximum compressive strength test result is qualified, judge that the compressive performance of the current circuit board is qualified.

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