Full-automatic spinneret plate microscopic examination system and method
By designing a fully automatic spinneret microscopic inspection system, using rotating mechanism, robot, blowing and suction device and line scanning camera array, the problems of low automation and low detection efficiency of existing equipment are solved, and efficient and automated spinneret inspection is achieved.
Patent Information
- Application Number
- CN202411866074.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-18
- Publication Date
- 2025-03-28
- Estimated Expiration
- 2044-12-18
AI Technical Summary
The existing spinneret microscopic inspection equipment has low degree of automation and low detection efficiency, and cannot effectively detect special-shaped holes, resulting in slow detection speed and high cost.
A fully automatic spinneret microscopic examination system is designed, including detection equipment and corresponding methods. The detection equipment consists of a rack table, a rotating mechanism, a robot, a blow-sucking device and a line-sweep camera array. It realizes fully automatic detection through automatic loading, rotation detection, image analysis and automatic discharge packaging.
It improves the automation level of spinneret detection, significantly improves detection efficiency, reduces human intervention, reduces detection costs, and can effectively detect circular and special-shaped holes.