Method, device and equipment for testing performance of near-infrared photoelectric detector

Abstract

The invention relates to a near-infrared photoelectric detector performance test method, device and equipment. The method comprises the steps of obtaining test parameters corresponding to multiple test strategies in the process of performing performance test on a target detector, performing performance test on the target detector according to each test parameter to obtain a performance parameter corresponding to each test parameter, and determining a performance test result of the target detector according to each performance parameter. Wherein the multiple test strategies comprise at least two of stress test, pulse light response test and noise test. By adopting the method, the test accuracy can be improved.

Description

Technical Field

[0001] The present application relates to the field of near-infrared detection technology, and in particular to a near-infrared photoelectric detector performance testing method, device and equipment. Background Art

[0002] Near-infrared photodetectors are widely used in many fields. Their performance parameters during operation will affect the detection results. Therefore, it is necessary to test the performance parameters of near-infrared photodetectors.

[0003] Traditional testing methods, taking the placement method as an example, usually place the near-infrared photodetector in a test environment, apply external stress, such as mechanical stress or thermal stress, to the near-infrared photodetector in the test environment, and after a set time interval, take the near-infrared photodetector out of the test environment and test its performance.

[0004] However, the above method has the problem of low testing accuracy. Summary of the invention

[0005] Based on this, it is necessary to provide a near-infrared photoelectric detector performance testing method, device and equipment that can improve test accuracy in response to the above technical problems.

[0006] In a first aspect, the present application provides a near-infrared photodetector performance testing method, comprising:

[0007] In the process of performing performance testing on the target detector, test parameters corresponding to multiple test strategies are obtained, where the multiple test strategies include at least two of a stress test, a pulse light response test, and a noise test;

[0008] According to each test parameter, the target detector is tested for performance respectively to obtain the performance parameters corresponding to each test parameter;

[0009] The performance test results of the target detector are determined based on various performance parameters.

[0010] In one embodiment, the test parameters corresponding to the stress test include stress parameters, and the target detector is subjected to performance tests according to the test parameters to obtain performance parameters corresponding to the test parameters, including:

[0011] In a first test time period, according to the stress parameter, a preset stress is continuously applied to the target detector, and first current change data of the target detector in the first test time period is obtained;

[0012] The first current change data is used as a first performance parameter corresponding to the stress parameter.

[0013] In one embodiment, the test parameters corresponding to the pulse light response test include light source parameters, and the target detector is tested for performance according to each test parameter to obtain performance parameters corresponding to each test parameter, and further includes:

[0014] In the second test time period, according to the light source parameters, the pulse light source is continuously turned on within the detection range of the target detector, and second current change data of the target detector in the second test time period is obtained;

[0015] The second current change data is used as a second performance parameter corresponding to the stress parameter.

[0016] In one embodiment, the test parameters corresponding to the noise test include a plurality of different voltage parameters, and the target detector is tested for performance according to each test parameter to obtain performance parameters corresponding to each test parameter, and further includes:

[0017] For each voltage parameter, during a third test time period, continuously applying a preset voltage to the target detector according to the voltage parameter, and acquiring noise data of the target detector during the third test time period;

[0018] Each noise data is used as the third performance parameter corresponding to the stress parameter.

[0019] In one embodiment, determining a performance test result of a target detector according to each performance parameter includes:

[0020] Determine a stability performance test result corresponding to the target detector according to the first performance parameter, determine a response performance test result corresponding to the target detector according to the second performance parameter, and determine a detection performance test result corresponding to the target detector according to the third performance parameter;

[0021] The stability performance test results, the response performance test results, and the detection performance test results are taken as the performance test results.

[0022] In one embodiment, the method further comprises:

[0023] Determine whether the target detector has a fault based on the performance test results;

[0024] When the target detector fails, the target detector is fault-handled.

[0025] In a second aspect, the present application provides a near-infrared photoelectric detector performance testing device, the device comprising:

[0026] An acquisition module, used to acquire test parameters corresponding to a plurality of test strategies during a performance test of a target detector, wherein the plurality of test strategies include at least two of a stress test, a pulse light response test, and a noise test;

[0027] The test module is used to perform performance tests on the target detector according to each test parameter to obtain performance parameters corresponding to each test parameter;

[0028] The determination module is used to determine the performance test result of the target detector according to various performance parameters.

[0029] In a third aspect, an embodiment of the present application provides a computer device, including a memory and a processor, wherein the memory stores a computer program, and the processor implements the steps of the method of the first aspect when executing the computer program.

[0030] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium having a computer program stored thereon, wherein the computer program, when executed by a processor, implements the steps of the method of the first aspect described above.

[0031] In a fifth aspect, the present application further provides a computer program product, wherein the computer program product comprises a computer program, and when the computer program is executed by a processor, the steps of the method in the first aspect are implemented.

[0032] The above-mentioned near-infrared photodetector performance test method, device and equipment obtain test parameters corresponding to multiple test strategies during the process of performance testing the target detector, and perform performance tests on the target detector according to each test parameter, so as to obtain performance parameters corresponding to each test parameter, and determine the performance test results of the target detector according to each performance parameter, wherein the multiple test strategies include at least two of stress testing, pulse light response testing and noise testing. In this way, the performance of the target detector is tested according to multiple test strategies, and the obtained performance test results integrate multiple test dimensions, so that the final performance test results are more accurate. In addition, the near-infrared photodetector performance test method provided in the present application obtains the performance parameters corresponding to the target detector during the performance test, and there is no need to take out the target detector after an interval and then test the performance of the target detector, which avoids the difficult-to-detect changes that may occur to the near-infrared photodetector during the process of taking the near-infrared photodetector out of the test environment in the traditional technology, and further improves the accuracy of the test. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] In order to more clearly illustrate the technical solutions in the embodiments of the present application or related technologies, the drawings required for use in the embodiments of the present application or related technical descriptions will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0034] Figure 1An application environment diagram of a near-infrared photodetector performance testing method according to an embodiment;

[0035] Figure 2 A schematic diagram of a process for testing the performance of a near-infrared photoelectric detector in one embodiment;

[0036] Figure 3 is a flow chart of step 202 in another embodiment;

[0037] Figure 4 is a schematic diagram of exemplary first current variation data in another embodiment;

[0038] Figure 5 It is a flowchart of step 202 in another embodiment in which the test parameters corresponding to the pulse light response test include light source parameters;

[0039] Figure 6 is a schematic diagram of exemplary second current variation data in another embodiment;

[0040] Figure 7 It is a flowchart diagram of step 202 in another embodiment in which the test parameters corresponding to the noise test include a plurality of different voltage parameters;

[0041] Figure 8 is a schematic diagram of exemplary noise data in another embodiment;

[0042] Fig. 9 A structural block diagram of a near-infrared photoelectric detector performance testing device in one embodiment;

[0043] Fig.10 FIG. 4 is a diagram showing the internal structure of a computer device in one embodiment. DETAILED DESCRIPTION

[0044] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0045] Near-infrared photodetectors are widely used in many fields, such as medical diagnosis, fiber-optic communications, military production, etc. Since the performance parameters of near-infrared photodetectors during operation will affect the detection results, it is necessary to test the performance parameters of near-infrared photodetectors.

[0046] Traditional testing methods, taking the placement method as an example, usually place the near-infrared photodetector in a test environment, apply external stress to the near-infrared photodetector in the test environment, such as mechanical stress or thermal stress, etc., and take the near-infrared photodetector out of the test environment after a set time interval, and test its performance. However, in the process of taking the near-infrared photodetector out of the test environment, the near-infrared photodetector may undergo some changes that are difficult to detect, resulting in low accuracy of the final test results. Another traditional testing method is the resistance measurement method, but this measurement method is only applicable to near-infrared photodetectors whose resistance characteristics are closely related to performance parameters, and has a small scope of application.

[0047] Therefore, the above method has the problem of low testing accuracy.

[0048] In view of this, the present application provides a near-infrared photodetector performance test method, device and equipment. In the process of performance testing the target detector, test parameters corresponding to multiple test strategies are obtained, and the target detector is performance tested according to each test parameter. The performance parameters corresponding to each test parameter can be obtained, and the performance test results of the target detector can be determined according to each performance parameter, wherein the multiple test strategies include at least two of stress testing, pulse light response testing and noise testing. In this way, the performance of the target detector is tested according to multiple test strategies, and the obtained performance test results integrate multiple test dimensions, and the final performance test results are more accurate. In addition, the near-infrared photodetector performance test method provided by the present application obtains the performance parameters corresponding to the target detector during the performance test, and there is no need to take out the target detector after an interval and then test the performance of the target detector, which avoids the difficult-to-detect changes that may occur to the near-infrared photodetector during the process of taking the near-infrared photodetector out of the test environment in the traditional technology, further improving the accuracy of the test.

[0049] The near-infrared photoelectric detector performance testing method provided in the embodiment of the present application can be applied to Figure 1In the application environment shown. Among them, the server 101 is communicatively connected with the target detector 102, and the server 101 is also communicatively connected with the test device 103. Among them, the data storage system can store the data that the server 101 needs to process. The data storage system can be integrated on the server 101, or it can be placed on the cloud or other network servers. The server 101 can be an independent physical server, or it can be a server cluster or distributed system composed of multiple physical servers, or it can be a cloud server that provides cloud computing services. The target detector 102 is a detector whose performance is to be tested. In an embodiment of the present application, the target detector 102 can be a near-infrared photoelectric detector. The test device 103 is a device for performing performance testing on the target detector 102. In an embodiment of the present application, the server 101 can adjust the test environment simulated by the test device according to the test parameters, so as to perform performance testing on the target detector 102 according to different test strategies. In an embodiment of the present application, the test device 103 may be different under different test strategies. For example, if the test strategy is stress testing, the test device 103 may be a stress applying device; if the test strategy is pulse light response testing, the test device 103 may be a pulse light source; if the test strategy is noise testing, the test device may be a voltage applying device, etc.

[0050] In an exemplary embodiment, Figure 2 As shown, a near-infrared photoelectric detector performance test method is provided, and the method is applied to Figure 1 The server 101 in the example is used as an example to illustrate, including the following steps 201 to 203. Among them:

[0051] Step 201, in the process of performing performance testing on the target detector, obtaining test parameters corresponding to multiple test strategies.

[0052] In the embodiment of the present application, the test strategy is a test method. In order to test the performance of the target detector more comprehensively, the target detector will be tested through test strategies in multiple dimensions, wherein the multiple test strategies include at least two of stress testing, pulse light response testing and noise testing.

[0053] Optionally, the server may obtain a test strategy input by a user through an external input device; optionally, the server may determine a test strategy to be tested through a preset strategy identifier.

[0054] Regarding the method for the server to obtain test parameters, optionally, the server can determine the test parameters corresponding to the test strategy from the database according to the test strategy; optionally, the server can obtain the test parameters input by the user through an external input device.

[0055] It can be understood that different test strategies correspond to different test parameters. For example, when the test strategy is stress testing, the test parameters include stress type and stress magnitude; when the test strategy is pulse light response testing, the test parameters may include the frequency, intensity, width, etc. of the pulse light source; when the test strategy is noise testing, the test parameters may include different voltage parameters, such as positive voltage, zero bias, and negative pressure, etc.

[0056] Step 202 , performing performance tests on the target detector according to each test parameter, and obtaining performance parameters corresponding to each test parameter.

[0057] According to different test parameters, the server can perform performance tests on the target detector in different dimensions. In one possible implementation, different test strategies correspond to different test environments. The server can set the corresponding test environment according to each test parameter, and use the set test environment to perform performance tests on the target detector, thereby obtaining performance parameters under different test environments. Different performance parameters reflect the different performance states of the target detector.

[0058] Optionally, when the test strategy is stress testing, the performance parameter may be current change data over a period of time, and the performance parameter reflects the stability of the target detector during detection; optionally, when the test strategy is pulse light response testing, the performance parameter may be current signal data output by the target detector when it responds to a pulse light source, and the performance parameter reflects the responsiveness of the target detector to the pulse light source; optionally, when the test strategy is noise testing, the performance parameter may be the current signal of the target detector under different voltage parameters, and the current signal includes a noise signal, and the performance parameter reflects the noise generated by the target detector when detecting under different voltage environments.

[0059] Step 203: Determine the performance test result of the target detector according to each performance parameter.

[0060] After obtaining the performance parameters corresponding to each test strategy, the server can determine the final performance test result. In one possible implementation, the performance test result may include a test pass or a test fail. A test pass can indicate that there is no fault in the target detector, while a test fail can indicate that there is a fault in the target detector.

[0061] Optionally, the server can input the performance parameters into a preset performance test model to obtain a performance test result that is output by the performance test model integrating multiple performance parameters; optionally, for different performance parameters, the server can determine the sub-performance test results corresponding to each test strategy, and obtain the performance test results of the target detector based on each sub-performance test result.

[0062] In a possible implementation, based on the performance test results, the server may determine whether the target detector is faulty. Optionally, if the target detector is faulty, the server may perform fault processing on the target detector. Optionally, if the target detector is not faulty, the server may directly output the performance test results.

[0063] In the above embodiment, the performance of the target detector is tested according to a variety of testing strategies, and the obtained performance test results integrate multiple testing dimensions, so that the final performance test results are more accurate. In addition, the near-infrared photodetector performance testing method provided in the present application obtains the performance parameters corresponding to the target detector during the performance testing process. There is no need to take out the target detector after an interval and then test the performance of the target detector. This avoids the difficult-to-detect changes that may occur in the near-infrared photodetector during the process of taking the near-infrared photodetector out of the test environment in traditional technologies, thereby further improving the accuracy of the test.

[0064] In one embodiment, based on the above Figure 2 The embodiment shown, see Figure 3 , this embodiment involves a process of performing performance tests on a target detector according to various test parameters to obtain performance parameters corresponding to the various test parameters. In this embodiment, the test parameters corresponding to the stress test include stress parameters, such as Figure 3 As shown, step 202 may include step 301 and step 302 .

[0065] Step 301 : continuously applying a preset stress to a target detector according to a stress parameter during a first test time period, and obtaining first current change data of the target detector during the first test time period.

[0066] Step 302: Use the first current change data as the first performance parameter corresponding to the stress parameter.

[0067] In an embodiment of the present application, the stress parameters may include stress type and stress magnitude, and the testing device may be a stress applying device. The server may control the stress applying device to continuously and stably apply preset stress to the target detector according to the stress parameters.

[0068] In this process, the target detector is run, and the server can obtain the first current change data of the target detector in the first test time period. For example, the first current change data can refer to Figure 4 .

[0069] The server may use the first current change data as the first performance parameter corresponding to the stress parameter. In the embodiment of the present application, the stability of the first current change data may be used to characterize the stability performance of the target detector.

[0070] In one embodiment, based on the above Figure 3 The embodiment shown, see Figure 5 This embodiment relates to the implementation process of step 202 when the test parameters corresponding to the pulse light response test include light source parameters. Figure 5 As shown, step 202 may include step 501 and step 502 .

[0071] Step 501, in a second test time period, according to light source parameters, within the detection range of the target detector, the pulse light source is continuously turned on, and second current change data of the target detector in the second test time period is obtained.

[0072] Step 502: Use the second current change data as a second performance parameter corresponding to the light source parameter.

[0073] In an embodiment of the present application, the testing device may be a pulse light source, and the light source parameters may include parameters such as the intensity, frequency, and width of the pulse light source. In a possible implementation, in order to reduce the interference of the external environment on the performance test, the test parameters may also include constant temperature parameters, humidity parameters, etc.

[0074] Based on the above performance parameters, the server can set the test environment, and based on the light source parameters, start the pulse light source within the detection range of the target detector, run the target detector, and the server can obtain the second current change data of the target detector in the second test time period. For example, the second current change data can refer to Figure 6 .

[0075] The server can use the second current change data as the second performance parameter corresponding to the stress parameter. In the embodiment of the present application, the change of the second current change data is used to characterize the response performance of the target detector. For example, in the second current change data, the time required for the current to rise to the amplitude characterizes the response time of the target detector, and the time required for the current to drop to the lowest point characterizes the recovery time of the target detector. The amplitude represents the response amplitude of the target detector, and so on.

[0076] In one embodiment, based on the above Figure 5 The embodiment shown, see Figure 7 , this embodiment relates to the implementation process of step 202 when the test parameters corresponding to the noise test include multiple different voltage parameters. In this embodiment, Figure 7 As shown, step 202 may include step 701 and step 702 .

[0077] Step 701 : for each voltage parameter, during a third test time period, continuously apply a preset voltage to the target detector according to the voltage parameter, and obtain noise data of the target detector during the third test time period.

[0078] Step 702: taking each noise data as a third performance parameter corresponding to each voltage parameter.

[0079] In the embodiment of the present application, the test device may be a voltage applying device, and the voltage parameters may include a positive voltage parameter, a zero bias voltage parameter, and a negative voltage parameter. The server may set different preset voltages according to the voltage parameters, and use the voltage applying device to apply different preset voltages to the target detector, thereby obtaining the noise data of the target detector in the third test time period. For example, the noise data may refer to Figure 8 .

[0080] The server can use the noise data corresponding to each preset voltage as the third performance parameter. The third performance parameter can reflect the noise generated by the target detector under different preset voltages. The size of the noise can reflect the quality of the detection capability of the target detector.

[0081] In a possible implementation, based on the above embodiments, the process of determining the performance test results of the target detector according to each performance parameter may include: determining the stability performance test result corresponding to the target detector according to the first performance parameter, determining the response performance test result corresponding to the target detector according to the second performance parameter, and determining the detection performance test result corresponding to the target detector according to the third performance parameter; and using the stability performance test result, the response performance test result and the detection performance test result as the performance test results.

[0082] In one embodiment, an exemplary near-infrared photodetector performance testing method is provided, which can be applied to Figure 1 In the implementation environment shown.

[0083] Step a: in the process of performing performance testing on the target detector, obtaining test parameters corresponding to a plurality of test strategies.

[0084] The multiple testing strategies include at least two of stress testing, pulse light response testing, and noise testing.

[0085] Step b: When the test parameters corresponding to the stress test include stress parameters, a preset stress is continuously applied to the target detector according to the stress parameters during a first test time period, and first current change data of the target detector during the first test time period is obtained.

[0086] Step c: using the first current change data as the first performance parameter corresponding to the stress parameter.

[0087] Step d, when the test parameters corresponding to the pulse light response test include light source parameters, within the second test time period, according to the light source parameters, within the detection range of the target detector, the pulse light source is continuously turned on, and the second current change data of the target detector within the second test time period is obtained.

[0088] Step e: using the second current change data as the second performance parameter corresponding to the light source parameter.

[0089] In step f, when the test parameters corresponding to the noise test include multiple different voltage parameters, for each voltage parameter, within a third test time period, a preset voltage is continuously applied to the target detector according to the voltage parameter, and noise data of the target detector within the third test time period is obtained.

[0090] Step g: taking each noise data as the third performance parameter corresponding to each voltage parameter.

[0091] Step h: determine the stability performance test result corresponding to the target detector according to the first performance parameter, determine the response performance test result corresponding to the target detector according to the second performance parameter, and determine the detection performance test result corresponding to the target detector according to the third performance parameter.

[0092] Step i, taking the stability performance test results, the response performance test results and the detection performance test results as the performance test results.

[0093] Step j, determining whether the target detector has a fault based on the performance test result.

[0094] Step k: when the target detector fails, perform fault processing on the target detector.

[0095] It should be understood that, although the various steps in the flowcharts involved in the above-mentioned embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps does not have a strict order restriction, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above-mentioned embodiments can include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily to be carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0096] Based on the same inventive concept, the embodiment of the present application also provides a near-infrared photoelectric detector performance test device for implementing the near-infrared photoelectric detector performance test method involved above. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the above method, so the specific limitations in one or more near-infrared photoelectric detector performance test device embodiments provided below can refer to the limitations of the near-infrared photoelectric detector performance test method above, and will not be repeated here.

[0097] In an exemplary embodiment, Fig. 9 As shown, a near-infrared photoelectric detector performance test device is provided, including: an acquisition module 901, a test module 902 and a determination module 903, wherein:

[0098] An acquisition module 901 is used to acquire test parameters corresponding to multiple test strategies during a performance test of a target detector, wherein the multiple test strategies include at least two of a stress test, a pulse light response test, and a noise test;

[0099] A testing module 902 is used to perform a performance test on the target detector according to each of the test parameters to obtain a performance parameter corresponding to each of the test parameters;

[0100] The determination module 903 is used to determine the performance test result of the target detector according to each of the performance parameters.

[0101] In one embodiment, the test parameters corresponding to the stress test include stress parameters, and the test module 902 includes:

[0102] A stress testing unit, configured to continuously apply a preset stress to the target detector according to the stress parameter within a first test time period, and obtain first current change data of the target detector within the first test time period;

[0103] The first performance parameter acquisition unit is used to use the first current change data as the first performance parameter corresponding to the stress parameter.

[0104] In one embodiment, the test parameters corresponding to the pulse light response test include light source parameters, and the test module 902 further includes:

[0105] a pulse light response testing unit, configured to continuously turn on the pulse light source within the detection range of the target detector according to the light source parameters during a second test time period, and obtain second current change data of the target detector during the second test time period;

[0106] The second performance parameter acquisition unit is used to use the second current change data as the second performance parameter corresponding to the light source parameter.

[0107] In one embodiment, the test parameters corresponding to the noise test include a plurality of different voltage parameters, and the test module 902 further includes:

[0108] A noise testing unit, configured to continuously apply a preset voltage to the target detector according to the voltage parameter for each of the voltage parameters during a third testing period, and obtain noise data of the target detector during the third testing period;

[0109] The third performance parameter acquisition unit is used to use each of the noise data as a third performance parameter corresponding to each of the voltage parameters.

[0110] In one embodiment, the determination module 903 includes:

[0111] a sub-result determination unit, configured to determine a stability performance test result corresponding to the target detector according to the first performance parameter, determine a response performance test result corresponding to the target detector according to the second performance parameter, and determine a detection performance test result corresponding to the target detector according to the third performance parameter;

[0112] The result determination unit is used to use the stability performance test result, the response performance test result and the detection performance test result as the performance test result.

[0113] In one embodiment, the apparatus further comprises:

[0114] A fault detection module, used to determine whether the target detector has a fault according to the performance test result;

[0115] The fault processing module is used to perform fault processing on the target detector when the target detector fails.

[0116] Each module in the above-mentioned near-infrared photoelectric detector performance test device can be implemented in whole or in part by software, hardware and a combination thereof. Each of the above-mentioned modules can be embedded in or independent of the processor in the computer device in the form of hardware, or can be stored in the memory in the computer device in the form of software, so that the processor can call and execute the operations corresponding to each of the above modules.

[0117] In an exemplary embodiment, a computer device is provided. The computer device may be a server, and its internal structure diagram may be as shown in FIG. Fig.10As shown. The computer device includes a processor, a memory, an input / output interface (Input / Output, referred to as I / O) and a communication interface. Among them, the processor, the memory and the input / output interface are connected through a system bus, and the communication interface is connected to the system bus through the input / output interface. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the computer device is used to store near-infrared photodetector performance test data. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, a near-infrared photodetector performance test method is implemented.

[0118] Those skilled in the art will understand that Fig.10 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0119] In an exemplary embodiment, a computer device is provided, including a memory and a processor, wherein a computer program is stored in the memory, and when the processor executes the computer program, the following steps are implemented:

[0120] In the process of performing performance testing on the target detector, test parameters corresponding to multiple test strategies are obtained, wherein the multiple test strategies include at least two of a stress test, a pulse light response test, and a noise test;

[0121] Performing performance tests on the target detectors according to the test parameters to obtain performance parameters corresponding to the test parameters;

[0122] A performance test result of the target detector is determined according to each of the performance parameters.

[0123] In one embodiment, the test parameters corresponding to the stress test include stress parameters, and the processor further implements the following steps when executing the computer program:

[0124] In a first test time period, according to the stress parameter, continuously applying a preset stress to the target detector, and acquiring first current change data of the target detector in the first test time period;

[0125] The first current change data is used as a first performance parameter corresponding to the stress parameter.

[0126] In one embodiment, the test parameters corresponding to the pulse light response test include light source parameters, and the processor further implements the following steps when executing the computer program:

[0127] In a second test time period, according to the light source parameters, the pulse light source is continuously turned on within the detection range of the target detector, and second current change data of the target detector in the second test time period is obtained;

[0128] The second current change data is used as a second performance parameter corresponding to the light source parameter.

[0129] In one embodiment, the test parameters corresponding to the noise test include a plurality of different voltage parameters, and the processor further implements the following steps when executing the computer program:

[0130] For each of the voltage parameters, during a third test time period, continuously applying a preset voltage to the target detector according to the voltage parameter, and acquiring noise data of the target detector during the third test time period;

[0131] The noise data are used as third performance parameters corresponding to the voltage parameters.

[0132] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0133] Determine a stability performance test result corresponding to the target detector according to the first performance parameter, determine a response performance test result corresponding to the target detector according to the second performance parameter, and determine a detection performance test result corresponding to the target detector according to the third performance parameter;

[0134] The stability performance test result, the response performance test result and the detection performance test result are taken as the performance test result.

[0135] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0136] Determining whether the target detector has a fault according to the performance test result;

[0137] In the case that the target detector has a fault, the target detector is subjected to fault processing.

[0138] In one embodiment, a computer readable storage medium is provided, on which a computer program is stored, and when the computer program is executed by a processor, the following steps are implemented:

[0139] In the process of performing performance testing on the target detector, test parameters corresponding to multiple test strategies are obtained, wherein the multiple test strategies include at least two of a stress test, a pulse light response test, and a noise test;

[0140] Performing performance tests on the target detectors according to the test parameters to obtain performance parameters corresponding to the test parameters;

[0141] A performance test result of the target detector is determined according to each of the performance parameters.

[0142] In one embodiment, the test parameters corresponding to the stress test include stress parameters, and the computer program, when executed by the processor, further implements the following steps:

[0143] In a first test time period, according to the stress parameter, continuously applying a preset stress to the target detector, and acquiring first current change data of the target detector in the first test time period;

[0144] The first current change data is used as a first performance parameter corresponding to the stress parameter.

[0145] In one embodiment, the test parameters corresponding to the pulse light response test include light source parameters, and the computer program, when executed by the processor, further implements the following steps:

[0146] In a second test time period, according to the light source parameters, the pulse light source is continuously turned on within the detection range of the target detector, and second current change data of the target detector in the second test time period is acquired;

[0147] The second current change data is used as a second performance parameter corresponding to the light source parameter.

[0148] In one embodiment, the test parameters corresponding to the noise test include a plurality of different voltage parameters, and the computer program, when executed by the processor, further implements the following steps:

[0149] For each of the voltage parameters, during a third test time period, continuously applying a preset voltage to the target detector according to the voltage parameter, and acquiring noise data of the target detector during the third test time period;

[0150] The noise data are used as third performance parameters corresponding to the voltage parameters.

[0151] Determine a stability performance test result corresponding to the target detector according to the first performance parameter, determine a response performance test result corresponding to the target detector according to the second performance parameter, and determine a detection performance test result corresponding to the target detector according to the third performance parameter;

[0152] The stability performance test result, the response performance test result and the detection performance test result are taken as the performance test result.

[0153] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0154] Determining whether the target detector has a fault according to the performance test result;

[0155] In the case that the target detector has a fault, the target detector is subjected to fault processing.

[0156] In one embodiment, a computer program product is provided, comprising a computer program, which, when executed by a processor, implements the following steps:

[0157] In the process of performing performance testing on the target detector, test parameters corresponding to multiple test strategies are obtained, wherein the multiple test strategies include at least two of a stress test, a pulse light response test, and a noise test;

[0158] Performing performance tests on the target detectors according to the test parameters to obtain performance parameters corresponding to the test parameters;

[0159] A performance test result of the target detector is determined according to each of the performance parameters.

[0160] In one embodiment, the test parameters corresponding to the stress test include stress parameters, and the computer program, when executed by the processor, further implements the following steps:

[0161] In a first test time period, according to the stress parameter, continuously applying a preset stress to the target detector, and acquiring first current change data of the target detector in the first test time period;

[0162] The first current change data is used as a first performance parameter corresponding to the stress parameter.

[0163] In one embodiment, the test parameters corresponding to the pulse light response test include light source parameters, and the computer program, when executed by the processor, further implements the following steps:

[0164] In a second test time period, according to the light source parameters, the pulse light source is continuously turned on within the detection range of the target detector, and second current change data of the target detector in the second test time period is acquired;

[0165] The second current change data is used as a second performance parameter corresponding to the light source parameter.

[0166] In one embodiment, the test parameters corresponding to the noise test include a plurality of different voltage parameters, and the computer program, when executed by the processor, further implements the following steps:

[0167] For each of the voltage parameters, during a third test time period, continuously applying a preset voltage to the target detector according to the voltage parameter, and acquiring noise data of the target detector during the third test time period;

[0168] The noise data are used as third performance parameters corresponding to the voltage parameters.

[0169] Determine a stability performance test result corresponding to the target detector according to the first performance parameter, determine a response performance test result corresponding to the target detector according to the second performance parameter, and determine a detection performance test result corresponding to the target detector according to the third performance parameter;

[0170] The stability performance test result, the response performance test result and the detection performance test result are taken as the performance test result.

[0171] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0172] Determining whether the target detector has a fault according to the performance test result;

[0173] In the case that the target detector has a fault, the target detector is subjected to fault processing.

[0174] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of relevant data must comply with relevant regulations.

[0175] A person of ordinary skill in the art can understand that all or part of the processes in the above-mentioned embodiment method can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile memory and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, an artificial intelligence (AI) processor, etc., but are not limited to this.

[0176] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this application.

[0177] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. A near-infrared photoelectric detector performance testing method, characterized in that: The method comprises: In the process of performing performance testing on the target detector, test parameters corresponding to multiple test strategies are obtained, wherein the multiple test strategies include at least two of a stress test, a pulse light response test, and a noise test; Performing performance tests on the target detectors according to the test parameters to obtain performance parameters corresponding to the test parameters; A performance test result of the target detector is determined according to each of the performance parameters.

2. The method according to claim 1, characterized in that The test parameters corresponding to the stress test include stress parameters, and the performance test of the target detector is performed according to each of the test parameters to obtain the performance parameters corresponding to each of the test parameters, including: In a first test time period, according to the stress parameter, continuously applying a preset stress to the target detector, and acquiring first current change data of the target detector in the first test time period; The first current change data is used as a first performance parameter corresponding to the stress parameter.

3. The method according to claim 2, characterized in that The test parameters corresponding to the pulse light response test include light source parameters, and the target detector is tested for performance according to each of the test parameters to obtain performance parameters corresponding to each of the test parameters, and further includes: In a second test time period, according to the light source parameters, the pulse light source is continuously turned on within the detection range of the target detector, and second current change data of the target detector in the second test time period is obtained; The second current change data is used as a second performance parameter corresponding to the light source parameter.

4. The method according to claim 3, characterized in that: The test parameters corresponding to the noise test include a plurality of different voltage parameters, and the target detector is subjected to performance tests according to each of the test parameters to obtain performance parameters corresponding to each of the test parameters, and further includes: For each of the voltage parameters, during a third test time period, continuously applying a preset voltage to the target detector according to the voltage parameter, and acquiring noise data of the target detector during the third test time period; The noise data are used as third performance parameters corresponding to the voltage parameters.

5. The method according to claim 4, characterized in that Determining the performance test result of the target detector according to each of the performance parameters includes: Determine a stability performance test result corresponding to the target detector according to the first performance parameter, determine a response performance test result corresponding to the target detector according to the second performance parameter, and determine a detection performance test result corresponding to the target detector according to the third performance parameter; The stability performance test result, the response performance test result and the detection performance test result are taken as the performance test result.

6. The method according to claim 1, characterized in that The method further comprises: Determining whether the target detector has a fault according to the performance test result; In the case that the target detector has a fault, the target detector is subjected to fault processing.

7. A near-infrared photoelectric detector performance testing device, characterized in that: The device comprises: An acquisition module, used to acquire test parameters corresponding to a plurality of test strategies during a performance test of a target detector, wherein the plurality of test strategies include at least two of a stress test, a pulse light response test, and a noise test; A testing module, used to perform performance tests on the target detectors according to the test parameters to obtain performance parameters corresponding to the test parameters; A determination module is used to determine the performance test result of the target detector according to each of the performance parameters.

8. A computer device comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 6 are implemented.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 6 are implemented.

10. A computer program product, comprising a computer program, characterized in that When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 6 are implemented.

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