An integrating sphere-type AR glasses optical detection device

Abstract

The present application relates to an integrating sphere type AR glasses optical detection device, which belongs to the field of AR glasses optical detection technology. It includes: a detection frame, which includes a lower frame, a lower workbench is provided on the top of the lower frame, an upper frame is provided on the top of the lower workbench, an integrating sphere with a light inlet facing downward is fixed on the upper frame, and the integrating sphere is connected to a spectrometer; a test carrier, which includes a multi-axis drive module connected to the lower workbench, the top of the multi-axis drive module is connected to an upper workbench for positioning the product carrier, and the upper workbench is provided with a test circuit board and a lower probe module connected to each other; a product carrier, which is used to accommodate and position the product to be tested, and a transfer circuit board connected to the lower probe module is provided at the bottom of the product carrier, and a cover is provided on the product carrier, and an upper probe module is provided on the cover that is connected to the transfer circuit board and lights up the product to be tested. The entire detection process of this application is unmanned and automated, with high detection accuracy, improved detection efficiency, and improved factory qualification rate.

Description

Technical Field

[0001] The present application relates to the technical field of optical detection of AR glasses, and in particular to an integrating sphere-type optical detection device for AR glasses. Background Art

[0002] Display screens are now widely used in various scenarios and have become an indispensable part of people's lives. Furthermore, with the development of science and technology, virtual reality (VR) and augmented reality headsets have incorporated many new technologies, gradually attracting attention to near-eye displays (NEDs). Previously, NED system manufacturers lacked an objective and quantitative method to test the quality of their displays, relying solely on manual evaluation.

[0003] However, as NED transitions from novelty to mainstream, achieving reliable and predictable performance will become increasingly critical. For consumer-grade NED systems, ensuring a consistent customer experience and guaranteeing that the product lives up to the manufacturer's brand reputation and performance standards is essential.

[0004] In the development of VR / AR components, displays and optics for head-mounted devices (HMDs) are key. However, the field of view in current HMDs is very small, limiting the user's immersion in the image. Improving this through optics presents challenges in terms of ergonomics, manufacturing size, weight, and scalability.

[0005] Then there’s the visual experience. AR / VR displays project visual information very close to the human eye, covering the user’s full field of view. However, this proximity to the human eye also amplifies display defects that users typically can’t perceive when viewing from a distance.

[0006] Near-eye display defects have a significant impact on the user experience and may hinder visualization and device operability. In order to improve product quality and meet user requirements, advanced optical inspection equipment is required.

[0007] Before head-mounted devices are shipped, they typically undergo display inspection, which involves measuring their brightness and color. This inspection typically involves manually lighting the display and then visually inspecting it. However, manual inspection is prone to missed detections and false detections, resulting in low reliability and efficiency. Summary of the Invention

[0008] An embodiment of the present application provides an integrating sphere-type optical detection device for AR glasses to solve the problem in the related art of manually lighting the display screen and then using the human eye for recognition and judgment, which is prone to missed detection and false detection, low reliability of detection results, and low detection efficiency.

[0009] The present application provides an integrating sphere-type AR glasses optical detection device, comprising:

[0010] A detection rack, the detection rack comprising a lower rack, a lower workbench being provided on the top of the lower rack, an upper rack being provided on the top of the lower workbench, an integrating sphere with a light inlet facing downward being fixed on the upper rack, and the integrating sphere being connected to a spectrometer;

[0011] A test carrier, the test carrier comprising a multi-axis drive module connected to the lower workbench, the top of the multi-axis drive module being connected to an upper workbench for positioning the product carrier, the upper workbench being provided with a test circuit board and a lower probe module connected to each other;

[0012] A product carrier is provided, which is used to accommodate and position the product under test. A transfer circuit board connected to a lower probe module is provided at the bottom of the product carrier. A cover is provided on the product carrier, and an upper probe module connected to the transfer circuit board and lighting up the product under test is provided on the cover.

[0013] In some embodiments, the upper workbench includes a bottom plate and a top plate that are parallel to each other and spaced apart, the bottom plate and the top plate being connected by a vertical plate, the test circuit board being fixed between the bottom plate and the top plate and arranged horizontally, and the test circuit board being connected to the lower probe module by a first flexible cable;

[0014] The lower probe module is fixed on the top plate and exposed to the top surface of the top plate. The top of the top plate is provided with a plurality of positioning guide blocks arranged around the product carrier to position the product carrier on the top plate. The lower probe module is located in the space surrounded by the plurality of positioning guide blocks.

[0015] In some embodiments, a temperature control module is connected to the top plate, the top of the temperature control module protrudes from the top surface of the top plate and extends into the product carrier to contact the product under test, and the temperature control module is used to control the detection temperature of the product under test;

[0016] The top of the temperature control module is provided with a vacuum suction cup for vacuum adsorbing the product to be tested, and the vacuum suction cup is used to fix the product to be tested on the product carrier. The top plate is also provided with a corresponding sensor for detecting the product carrier.

[0017] In some embodiments, the product carrier includes a base plate, a positioning plate is detachably connected to the top of the base plate, and a hinge seat is detachably connected to the cover plate, and the adapter circuit board is fixed to the bottom of the base plate;

[0018] A second flexible cable connected to the adapter circuit board is provided on the cover plate, and the second flexible cable is connected to the upper probe module. The upper probe module exposes the bottom surface of the cover plate and presses down to contact the metal contacts of the product under test.

[0019] In some embodiments, a receiving groove is formed on the top of the positioning plate and is configured to conform to the outer contour of the product to be tested. Two sets of positioning plates and cover plates are provided, and the two sets of positioning plates and cover plates are mirror-symmetrical to each other to respectively position and accommodate the two symmetrically arranged products to be tested.

[0020] The hinge seat is provided with a hinge shaft rotatably connected to the cover plate, the hinge shaft is provided with a torsion spring elastically supporting the cover plate to flip upward, and lock buckles for locking or unlocking the cover plate are respectively provided on both sides of the base plate.

[0021] In some embodiments: the multi-axis drive module includes a Y-axis linear mechanism fixed on the lower workbench, a Z-axis linear mechanism connected to the Y-axis linear mechanism, and an X-axis linear mechanism connected to the top of the Z-axis linear mechanism;

[0022] The Y-axis linear mechanism moves the product carrier from the loading and unloading station to the detection station directly below the integrating sphere, the Z-axis linear mechanism moves the product carrier into or out of the light inlet of the integrating sphere, and the X-axis linear mechanism is used to adjust the positions of the two groups of product carriers.

[0023] In some embodiments: the Y-axis linear mechanism includes a Y-axis linear module and a Y-axis linear guide rail that are parallel to each other and spaced apart and fixed on the lower workbench, and a first slide is connected to the Y-axis linear module and the Y-axis linear guide rail;

[0024] The Z-axis linear mechanism includes a Z-axis linear module and a Z-axis linear guide rail that are parallel to each other and spaced apart and fixed on the first slide. The Z-axis linear module and the Z-axis linear guide rail are connected to a second slide, and the X-axis linear mechanism is fixed on the second slide.

[0025] The lower workbench is provided with an avoidance hole between the Y-axis linear module and the Y-axis linear guide rail, the Z-axis linear module is located in the avoidance hole, and the bottom of the lower workbench is provided with a box-type cover that closes the avoidance hole.

[0026] In some embodiments: the X-axis linear mechanism includes a lower base and an upper slide located on the top of the lower base, the lower base and the upper slide are slidably connected by an X-axis linear guide rail, the lower base is provided with a micrometer rod, and the upper slide is provided with an adjustment seat rotatably connected to the micrometer rod.

[0027] In some embodiments: it also includes a casing, and the detection rack, test carrier and product carrier are all enclosed in the casing. The casing provides a darkroom environment for the product to be tested. The side wall of the casing is provided with loading and unloading ports, as well as a lifting door that closes the loading and unloading ports, and a fan filter is provided on the top of the casing.

[0028] In some embodiments: a beam grating is provided on the outer wall of the housing on both sides of the loading and unloading ports, and a control terminal connected to the spectrometer is also provided on the outer wall of the housing, and the control terminal is a desktop computer or a laptop computer.

[0029] The beneficial effects of the technical solution provided by this application include:

[0030] An embodiment of the present application provides an integrating sphere type optical detection device for AR glasses. Since the integrating sphere type optical detection device for AR glasses of the present application is provided with a detection frame, the detection frame includes a lower frame, a lower workbench is provided on the top of the lower frame, an upper frame is provided on the top of the lower workbench, an integrating sphere with a light inlet facing downward is fixed on the upper frame, and the integrating sphere is connected to a spectrometer; a test carrier, the test carrier includes a multi-axis drive module connected to the lower workbench, the top of the multi-axis drive module is connected to an upper workbench for positioning a product carrier, and the upper workbench is provided with a test circuit board and a lower probe module that are connected to each other; a product carrier, the product carrier is used to accommodate and position a product to be tested, a transfer circuit board connected to the lower probe module is provided at the bottom of the product carrier, a cover plate is provided on the product carrier, and an upper probe module is provided on the cover plate for connecting to the transfer circuit board and lighting up the product to be tested.

[0031] Therefore, the integrating sphere type AR glasses optical detection device of the present application is fixedly provided with an integrating sphere with a light inlet facing downward on the upper frame, and the integrating sphere is connected to a spectrometer. The integrating sphere and the spectrometer are used to automatically perform optical detection on the optical parameters of the tested product after lighting, thereby improving the reliability of the detection results. A multi-axis drive module is arranged on the lower workbench, and the top of the multi-axis drive module is connected to an upper workbench for positioning the product carrier. The multi-axis drive module is used to automatically switch the product carrier placed on the upper workbench between the loading and unloading station and the detection station, thereby improving the detection efficiency of the tested product. After the product carrier is placed on the upper workbench, the lower probe module and the adapter circuit board are electrically connected to each other. After the cover plate presses the tested product onto the product carrier, the upper probe module on the cover plate contacts the metal contacts of the tested product and lights up the tested product, thereby realizing the synchronous action of positioning and circuit connection of the tested product, further improving the detection efficiency of the tested product, and reducing the difficulty of detection.

[0032] When this application performs optical inspection on the product under test, the multi-axis drive module of the test carrier automatically moves the product under test positioned on the product carrier from the loading and unloading station to the inspection station below the integrating sphere. After the product carrier is placed on the upper workbench, the self-positioning of the product carrier and the lighting of the test circuit connection can be completed. The test circuit board, lower probe module, adapter circuit board and upper probe module on the upper workbench and product carrier are powered on to light up the product under test. Finally, the integrating sphere and spectrometer perform optical parameter detection on the lit product under test. The entire inspection process is unmanned and automated, with high inspection accuracy, improved inspection efficiency, and increased factory qualification rate.

[0033] The upper workbench of the present application includes a bottom plate and a top plate that are parallel to each other and spaced apart. The bottom plate and the top plate are connected by a vertical plate. The test circuit board is fixed between the bottom plate and the top plate and is horizontally arranged. The test circuit board is connected to the lower probe module by a first flexible cable. The lower probe module is fixed on the top plate and exposed to the top surface of the top plate. The top of the top plate is provided with a plurality of positioning guide blocks that are arranged around the product carrier to position the product carrier on the top plate. The lower probe module is located in the space surrounded by the plurality of positioning guide blocks. The bottom plate, top plate and vertical plates of the upper workbench are connected to each other to form a space for accommodating and installing the test circuit board, so that the test circuit board can be fixed horizontally between the bottom plate and the top plate. The lower probe module is fixed on the top plate and exposed to the top surface of the top plate, and is located in the space surrounded by the plurality of positioning guide blocks. After the plurality of positioning guide blocks position the product carrier on the top plate, the adapter circuit board and the lower probe module can be accurately aligned, and the test circuit can be turned on.

[0034] A temperature control module is connected to the top plate of the present application. The top of the temperature control module protrudes from the top surface of the top plate and extends into the product carrier to contact the product under test. The temperature control module is used to control the detection temperature of the product under test. A vacuum suction cup for vacuum adsorbing the product under test is provided on the top of the temperature control module. The vacuum suction cup is used to fix the product under test on the product carrier. A beam sensor for detecting the product carrier is also provided on the top plate. The temperature control module contacts the product under test, thereby controlling the detection temperature of the product under test during optical inspection, thereby realizing the optical parameters of the product under test under different temperature environments or constant temperature environments, and thereby accurately and objectively evaluating the imaging effect of the product under test. The temperature control module is also integrated with a vacuum suction cup for adsorbing the product under test. The vacuum suction cup fixes the product under test on the product carrier to avoid displacement of the product under test during movement or inspection. The beam sensor is used to detect whether the cover is in a closed state, thereby improving the safety and reliability of the inspection.

[0035] The product carrier of the present application includes a base plate, the top of the base plate is detachably connected to a positioning plate, and a hinge seat detachably connected to a rotatable connection cover plate, and the adapter circuit board is fixed to the bottom of the base plate; a second flexible cable connected to the adapter circuit board is provided on the cover plate, and the second flexible cable is connected to the upper probe module, and the upper probe module exposes the bottom surface of the cover plate to press and contact the metal contacts of the product under test. The positioning plate and the hinge seat are detachably connected at the top of the base plate, and the positioning plate is used to position and accommodate the product under test, and the hinge seat is used to rotatably connect the cover plate, and the cover plate is rotatably connected to the hinge seat to flip up and down to open or press the product under test. The upper probe module on the cover plate is connected to the adapter circuit board through a second flexible cable, and the second flexible cable is used to improve the flexibility of the cover plate in flipping up and down and increase the flipping angle range of the cover plate. The upper probe module exposes the bottom surface of the cover plate to facilitate the upper probe module to contact the metal contacts of the product under test when the cover plate is closed.

[0036] The top of the positioning plate of the present application is provided with a receiving groove that is set according to the outer contour of the product to be tested. There are two sets of positioning plates and cover plates. The two sets of positioning plates and cover plates are mirror-symmetrical to respectively position and accommodate two symmetrically arranged products to be tested. The hinge seat is provided with a hinge shaft for rotating and connecting the cover plate. The hinge shaft is provided with a torsion spring that elastically supports the cover plate to flip upward. Locks for locking or unlocking the cover plate are provided on both sides of the base plate. The top of the positioning plate is provided with a receiving groove for accommodating and positioning the product to be tested. The receiving groove is adapted to the outer contour of the product to be tested, thereby accurately positioning the product to be tested in the receiving groove, thereby improving the positioning accuracy of the product to be tested. The two sets of positioning plates and the two sets of cover plates are mirror-symmetrical, and are used to respectively adapt to the left-eye display screen and the right-eye display screen that are mirror-symmetrical.

[0037] The multi-axis drive module of the present application includes a Y-axis linear mechanism fixed on the lower workbench, a Z-axis linear mechanism connected to the Y-axis linear mechanism, and an X-axis linear mechanism connected to the top of the Z-axis linear mechanism; the Y-axis linear mechanism moves the product carrier from the loading and unloading station to the detection station directly below the integrating sphere, the Z-axis linear mechanism moves the product carrier into or out of the light inlet of the integrating sphere, and the X-axis linear mechanism is used to adjust the positions of the two groups of product carriers. The Y-axis linear mechanism and the Z-axis linear mechanism cooperate with each other to automatically move the product carrier placed on the upper workbench from the loading and unloading station to the detection station for detection. After the detection is completed, the product carrier is automatically moved from the detection station to the loading and unloading station for unloading, thereby improving the detection efficiency of the tested products. The X-axis linear mechanism is used to adjust the positions of the two groups of product carriers for placing the left-eye display screen and the right-eye display screen respectively, so that one device can perform automated optical detection operations for two products.

[0038] The Y-axis linear mechanism of the present application includes a Y-axis linear module and a Y-axis linear guide fixed on the lower workbench, which are parallel to each other and spaced apart. A first slide is connected to the Y-axis linear module and the Y-axis linear guide; the Z-axis linear mechanism includes a Z-axis linear module and a Z-axis linear guide fixed on the first slide, which are parallel to each other and spaced apart. A second slide is connected to the Z-axis linear module and the Z-axis linear guide, and the X-axis linear mechanism is fixed on the second slide; a avoidance hole is provided on the lower workbench between the Y-axis linear module and the Y-axis linear guide, the Z-axis linear module is located in the avoidance hole, and a box-type cover is provided at the bottom of the lower workbench to close the avoidance hole. A avoidance hole is provided on the workbench to avoid the Z-axis linear module, thereby reducing the height of the Z-axis linear mechanism and improving the stability of the moving product being tested. The box-type cover is used to close the avoidance hole to prevent natural light from entering the detection device through the avoidance hole.

[0039] The X-axis linear mechanism of the present application includes a lower base and an upper slide located on top of the lower base. The lower base and the upper slide are slidably connected via an X-axis linear guide rail. A micrometer rod is provided on the lower base, and an adjustment seat is provided on the upper slide that is rotatably connected to the micrometer rod. The micrometer rod on the lower base adjusts its own length, thereby causing the upper slide to slide on the lower base along the length direction of the X-axis linear guide rail, thereby adjusting the position of the product carrier used to position the left-eye display screen and the right-eye display screen in the X-axis direction respectively. The X-axis linear mechanism is only adjusted when the two product carriers are replaced. Therefore, the X-axis linear mechanism uses a micrometer rod as a manual adjustment structure, which has the advantages of controllable stroke, high positioning accuracy, and low cost.

[0040] The present application also includes a casing, in which the detection rack, test carrier and product carrier are all enclosed. The casing provides a darkroom environment for the product being tested. Loading and unloading ports are provided on the side walls of the casing, as well as a lifting door that closes the loading and unloading ports. A fan filter is provided on the top of the casing. The casing not only serves as a protective cover for the appearance of the detection rack, test carrier and product carrier, but is also used to form an internal closed cavity structure, providing a darkroom environment for the product being tested and preventing external natural light from interfering with the product being tested. The fan filter on the top of the casing creates a dust-free environment for the internal space of the casing. BRIEF DESCRIPTION OF THE DRAWINGS

[0041] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0042] Figure 1 This is a schematic diagram of the structure of the embodiment of the present application without a housing;

[0043] Figure 2 This is a front view of the structure of the embodiment of the present application without the housing;

[0044] Figure 3 This is a schematic diagram of the structure of the rack, test carrier and product carrier in the embodiment of the present application;

[0045] Figure 4 This is a schematic diagram of the structure of the test carrier and product carrier according to the embodiment of the present application;

[0046] Figure 5 This is a schematic structural diagram of a multi-axis drive module according to an embodiment of the present application;

[0047] Figure 6 This is a structural diagram of the product carrier and upper workbench of the embodiment of the present application;

[0048] Figure 7 This is a schematic diagram of the structure of the workbench from a first perspective in an embodiment of the present application;

[0049] Figure 8 This is a schematic diagram of the structure of the upper workbench from a second perspective in an embodiment of the present application;

[0050] Figure 9 This is a schematic diagram of the structure of the product carrier from the first perspective of the embodiment of the present application;

[0051] Figure 10 This is a schematic diagram of the structure of the product carrier from a second perspective according to an embodiment of the present application;

[0052] Figure 11 This is a schematic structural diagram of the casing of an embodiment of the present application.

[0053] Reference numerals:

[0054] 100, detection rack; 110, lower rack; 111, lower workbench; 112, avoidance hole; 113, box-type cover; 120, upper rack; 130, integrating sphere; 131, spectrometer; 140, housing; 141, lift door; 142, beam grating; 143, control terminal; 144, fan filter;

[0055] 200, test carrier; 210, multi-axis drive module; 220, upper workbench; 221, bottom plate; 222, top plate; 223, vertical plate; 224, test circuit board; 225, lower probe module; 226, positioning guide block; 227, first flexible cable; 228, through-beam sensor; 229, temperature control module;

[0056] 230, Y-axis linear mechanism; 231, Y-axis linear module; 232, Y-axis linear guide; 233, first slide; 240, Z-axis linear mechanism; 241, Z-axis linear module; 242, Z-axis linear guide; 243, second slide; 250, X-axis linear mechanism; 251, lower base; 252, upper slide; 253, X-axis linear guide; 254, micrometer rod; 255, adjustment seat;

[0057] 300, product carrier; 301, base plate; 302, positioning plate; 303, hinge seat; 304, cover plate; 305, adapter circuit board; 306, upper probe module; 307, second flexible cable; 308, lock; 309, accommodating groove; 310, hinge axis; 311, torsion spring; 312, permanent magnet; 313, positioning hole; 314, through hole; 400, product under test. DETAILED DESCRIPTION

[0058] To make the purpose, technical solutions, and advantages of the embodiments of this application more clear, the technical solutions in the embodiments of this application will be clearly and completely described below in conjunction with the drawings in the embodiments of this application. Obviously, the described embodiments are part of the embodiments of this application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0059] An embodiment of the present application provides an integrating sphere-type optical detection device for AR glasses, which can solve the problems in the related art of manually lighting the display screen and then using the human eye to identify and judge, which is prone to missed detections, false detections, low reliability of detection results, and low detection efficiency.

[0060] See also Figures 1 to 10 As shown, the embodiment of the present application provides an integrating sphere type AR glasses optical detection device, comprising:

[0061] The detection frame 100 includes a lower frame 110, which is a rectangular frame structure formed by fixedly connecting profiles. A lower workbench 111, formed of a rectangular metal plate, is located on top of the lower frame 110. An upper frame 120, also formed by fixedly connecting profiles, is located on top of the lower workbench 111. An integrating sphere 130, with its light inlet facing downward, is fixed to the upper frame 120. A spectrometer 131 is connected to the integrating sphere 130.

[0062] The spectrometer 131, combined with the integrating sphere 130, can be used to measure parameters such as the luminous flux, color temperature, and luminous efficacy of the product under test 400. By placing the product under test 400 at the light inlet of the integrating sphere 130, the light within the sphere 130 undergoes multiple reflections, resulting in a uniform illumination distribution. At this point, using the spectrometer 131 to measure the light, the spectral distribution of the product under test 400 at different wavelengths can be obtained, allowing calculation of various parameters of the product under test 400. Using the spectrometer 131 in combination with the integrating sphere 130 to inspect the product under test not only improves measurement accuracy but also eliminates interference from ambient light.

[0063] The test vehicle 200 includes a multi-axis drive module 210 connected to the lower workbench 111. The top of the multi-axis drive module 210 is connected to an upper workbench 220 for positioning the product carrier 300. The upper workbench 220 is provided with a test circuit board 224 and a lower probe module 225, which are interconnected. The multi-axis drive module 210 is fixed to the lower workbench 111 and is used to automatically move the upper workbench 220, with the product carrier 300 placed thereon, from the loading and unloading station to the inspection station at the light inlet of the integrating sphere 130. The test circuit board 224 and the lower probe module 225 are used to provide a test signal to illuminate the product 400 under test.

[0064] The product carrier 300 is used to accommodate and position the product under test 400, which is positioned on top of the product carrier 300. A transfer circuit board 305 is located at the bottom of the product carrier 300, connecting to the lower probe module 225. The transfer circuit board 305 has metal contacts that contact the metal probes on the lower probe module 225. A cover 304 is located on the product carrier 300, which houses an upper probe module 306 that connects to the transfer circuit board 305 and illuminates the product under test 400. When the cover 304 is pressed against the product under test 400, the metal probes on the upper probe module 306 contact the metal contacts on the product under test 400, illuminating the product under test 400.

[0065] The integrating sphere-type AR glasses optical inspection device of the present embodiment features an integrating sphere 130 fixed to the upper frame 120, with the light inlet facing downward. This integrating sphere 130 is connected to a spectrometer 131. These integrating spheres 130 and 131 are used to automatically perform optical inspections on the optical parameters of the illuminated product 400 under test, improving the reliability of the inspection results. A multi-axis drive module 210 is attached to the top of the lower workbench 111, and an upper workbench 220 for positioning the product carrier 300 is connected to the top of the multi-axis drive module 210.

[0066] The multi-axis drive module 210 is used to automatically switch the product carrier 300 placed on the upper workbench 220 between the loading and unloading stations and the inspection station, thereby improving the inspection efficiency of the tested product. After the product carrier 300 is placed on the upper workbench 220, the lower probe module 225 is electrically connected to the adapter circuit board 305. After the cover plate 304 presses the tested product 400 onto the product carrier 300, the upper probe module 306 on the cover plate 304 contacts the metal contacts of the tested product 400 and illuminates the tested product 400, achieving the synchronous positioning of the tested product 400 and the lighting of the test circuit connection, further improving the inspection efficiency of the tested product 400 and reducing the difficulty of inspection.

[0067] When the embodiment of the present application performs optical inspection on the product under test 400, the multi-axis drive module 210 of the test carrier 200 automatically moves the product under test 400 positioned on the product carrier 300 from the loading and unloading station to the inspection station below the integrating sphere 130. After the product carrier 300 is placed on the upper workbench 220, the self-positioning of the product carrier 300 and the lighting test circuit connection action can be completed, and the test circuit board 224, the lower probe module 225, the adapter circuit board 305 and the upper probe module 306 on the upper workbench 220 and the product carrier 300 are powered on and illuminated. Finally, the integrating sphere 130 and the spectrometer 131 perform optical parameter detection on the illuminated product under test 400. The entire detection process is unmanned and automated, with high detection accuracy, improved detection efficiency, and increased factory qualification rate.

[0068] In some alternative embodiments, see Figures 6 to 8 As shown, an embodiment of the present application provides an integrating sphere-type optical inspection device for AR glasses. The upper workbench 220 of the inspection device includes a bottom plate 221 and a top plate 222 that are parallel to each other and spaced apart. The bottom plate 221 and the top plate 222 are connected by a vertical plate 223. A test circuit board 224 is fixed between the bottom plate 221 and the top plate 222 and is arranged horizontally. A plurality of vertical columns supporting the test circuit board 224 are provided on the top of the bottom plate 221, so that the test circuit board 224 is suspended in the air, which is beneficial to the heat dissipation of the test circuit board 224. The test circuit board 224 is connected to the lower probe module 225 by a first flexible cable 227.

[0069] The test circuit board 224 is placed within the upper workbench 220 closest to the product under test 400, minimizing the distance between the test circuit board 224 and the product under test 400. This shortens the length of the first flexible cable 227 and reduces test signal transmission loss. The lower probe module 225 is fixed to the top plate 222 and exposed to the top surface of the top plate 222. The top of the top plate 222 is equipped with a plurality of positioning guide blocks 226 that surround the product carrier 300 and position the product carrier 300 on the top plate 222. The lower probe module 225 is located within the space enclosed by the plurality of positioning guide blocks 226.

[0070] The bottom plate 221, top plate 222, and vertical plate 223 of the upper workbench 220 of the embodiment of the present application are interconnected to form a space for accommodating and installing a test circuit board 224, so that the test circuit board 224 can be fixed horizontally between the bottom plate 221 and the top plate 222. The lower probe module 225 is fixed on the top plate 222 and exposed to the top surface of the top plate 222, and is located in the space surrounded by multiple positioning guide blocks 226. After the multiple positioning guide blocks 226 position the product carrier 300 on the top plate 222, the adapter circuit board 305 and the lower probe module 225 are accurately aligned, and the lighting test circuit is turned on.

[0071] In some alternative embodiments, see Figures 6 to 8 As shown, an embodiment of the present application provides an integrating sphere-type optical inspection device for AR glasses. A temperature control module 229 is connected to the top plate 222 of the inspection device. The top of the temperature control module 229 protrudes from the top surface of the top plate 222 and extends into the product carrier 300 to contact the product under test 400. The temperature control module 229 is used to control the inspection temperature of the product under test 400. A vacuum suction cup is provided on the top of the temperature control module 229 to vacuum absorb the product under test. The vacuum suction cup is used to fix the product under test 400 on the product carrier 300. A beam sensor 228 for detecting the product carrier 300 is also provided on the top plate 222.

[0072] The temperature control module 229 of the embodiment of the present application is in contact with the product under test 400, thereby controlling the detection temperature of the product under test 400 during optical detection, thereby enabling the product under test 400 to detect its optical parameters under different temperature environments or constant temperature environments, thereby accurately and objectively evaluating the imaging effect of the product under test 400. The temperature control module 229 is also integrated with a vacuum suction cup for adsorbing the product under test 400. The vacuum suction cup fixes the product under test 400 on the product carrier 300 to prevent the product under test 400 from shifting during movement or detection. The beam sensor 228 is used to detect whether the cover 304 is in a closed state, to prevent the cover 304 from interfering with the position of the integrating sphere 130, resulting in collisions, and to improve the safety and reliability of the detection.

[0073] In some alternative embodiments, see Figure 9 and Figure 10 As shown, an embodiment of the present application provides an integrating sphere-type optical inspection device for AR glasses. The product carrier 300 of the inspection device includes a base plate 301. A positioning plate 302 is detachably connected to the top of the base plate 301, and a hinge 303 is detachably connected to the cover plate 304. The adapter circuit board 305 is fixed to the bottom of the base plate 301. A second flexible cable 307 connected to the adapter circuit board 305 is provided on the cover plate 304. The second flexible cable 307 is connected to the upper probe module 306. The upper probe module 306 exposes the bottom surface of the cover plate 304. When the upper probe module 306 is pressed down, it contacts the metal contacts of the product under test 400.

[0074] In this embodiment, a positioning plate 302 and a hinge seat 303 are detachably connected to the top of a base plate 301. The positioning plate 302 is used to position and accommodate the product under test 400, and the hinge seat 303 is used to rotatably connect to a cover plate 304. The cover plate 304 is rotatably connected to the hinge seat 303, allowing it to be flipped up and down to open or press the product under test 400. An upper probe module 306 on the cover plate 304 is connected to the adapter circuit board 305 via a second flexible cable 307. The second flexible cable 307 is inherently flexible, which improves the flexibility of the cover plate 304 when flipped up and down, and increases the range of the flip angle of the cover plate 304. The upper probe module 306 exposes the bottom surface of the cover plate 304, facilitating contact between the upper probe module 306 and the metal contacts of the product under test 400 when the cover plate 304 is closed.

[0075] A permanent magnet 312 for attracting the top plate 222 is fixedly connected to the bottom of the base plate 301. A permanent magnet 312 for attracting the base plate 301 is also fixed to the top surface of the top plate 222. The permanent magnets 312 of the base plate 301 and the permanent magnets 312 of the top plate 222 attract each other, firmly fixing the product carrier 300 on the upper workbench 220. A positioning hole 313 is provided at the bottom of the base plate 301 to position the base plate 301 on the top plate 222. A positioning pin is fixed to the top plate 222 to match the positioning hole 313. The positioning pin cooperates with the positioning hole 313 to precisely position the product carrier 300 on the upper workbench 220. A through hole 314 is provided on the base plate 301 and the positioning plate 302, which extends into the temperature control module 229. After the temperature control module 229 extends into the through hole 314, it contacts the product 400 under test.

[0076] In some alternative embodiments, see Figure 9 and Figure 10As shown, an embodiment of the present application provides an integrating sphere-type optical inspection device for AR glasses. The top of the positioning plate 302 of the inspection device is provided with a receiving groove 309 configured to follow the outer contour of the product under test 400. There are two sets of positioning plates 302 and cover plates 304. The two sets of positioning plates 302 and cover plates 304 are mirror-symmetrical to respectively position and accommodate two symmetrically arranged products under test 400. A hinge shaft 310 is provided on the hinge seat 303 for rotatably connecting the cover plate 304. The hinge shaft 310 is provided with a torsion spring 311 that elastically supports the cover plate 304 to flip upward. Lock buckles 308 for locking or unlocking the cover plate 304 are provided on both sides of the base plate 301.

[0077] In this embodiment of the present application, a receiving groove 309 is provided on the top of the positioning plate 302 to accommodate and position the product under test 400. This receiving groove 309 conforms to the outer contour of the product under test 400, thereby precisely positioning the product under test 400 within the receiving groove 309 and improving the positioning accuracy of the product under test 400. The two sets of positioning plates 302 and the two sets of cover plates 304 are mirror-symmetrical, respectively accommodating the mirror-symmetrical left-eye and right-eye displays. The left-eye and right-eye displays are arranged in mirror-symmetrical shapes, requiring two sets of positioning plates 302 and two sets of cover plates 304 to provide positioning and pressure for the left-eye and right-eye displays, respectively.

[0078] The positioning plates 302 and hinge base 303 are both detachably connected to the top of the base plate 301. The two sets of positioning plates 302 and two sets of cover plates 304, which position and compress the left-eye and right-eye displays, can share the base plate 301, enhancing the versatility of the base plate 301. The cover plate 304 is connected to the hinge base 303 via a hinge shaft 310, allowing it to rotate around the hinge base 303 with the hinge shaft 310 as the center. A torsion spring 311 on the hinge shaft 310 elastically supports the cover plate 304 in its upward rotation. Locks 308 on either side of the base plate 301 lock and unlock the cover plate 304.

[0079] In some alternative embodiments, see Figures 3 to 5 As shown, an embodiment of the present application provides an integrating sphere-type optical inspection device for AR glasses. The multi-axis drive module 210 of the inspection device includes a Y-axis linear mechanism 230 fixed to the lower workbench 111, a Z-axis linear mechanism 240 connected to the Y-axis linear mechanism 230, and an X-axis linear mechanism 250 connected to the top of the Z-axis linear mechanism 240. The Y-axis linear mechanism 230 moves the product carrier 300 from the loading and unloading station to the inspection station directly below the integrating sphere 130. The Z-axis linear mechanism 240 group moves the product carrier 300 into or out of the light inlet of the integrating sphere 130. The X-axis linear mechanism 250 is used to adjust the positions of the two groups of product carriers 300.

[0080] In this embodiment of the present application, the Y-axis linear mechanism 230 and the Z-axis linear mechanism 240 cooperate to automatically move the product carrier 300 placed on the upper worktable 220 from the loading and unloading station to the inspection station for inspection. After inspection, the product carrier 300 is automatically moved from the inspection station to the loading and unloading station for unloading, thereby improving the inspection efficiency of the tested products. The X-axis linear mechanism 250 is used to adjust the position of the two sets of product carriers 300 for the left-eye display and the right-eye display, respectively. This allows a single device to perform automated optical inspection of both products, meeting the inspection requirements of both left-eye and right-eye displays and shortening the switching time of the customer's production line.

[0081] In some alternative embodiments, see Figures 3 to 5 As shown, an embodiment of the present application provides an integrating sphere-type optical inspection device for AR glasses. The Y-axis linear mechanism 230 of the inspection device includes a Y-axis linear module 231 and a Y-axis linear guide 232, which are parallel to each other and spaced apart, fixed on the lower workbench 111. A first slide 233 is connected to the Y-axis linear module 231 and the Y-axis linear guide 232. The Z-axis linear mechanism 240 includes a Z-axis linear module 241 and a Z-axis linear guide 242, which are parallel to each other and spaced apart, fixed on the first slide 233. A second slide 243 is connected to the Z-axis linear module 241 and the Z-axis linear guide 242. The X-axis linear mechanism 250 is fixed to the second slide 243.

[0082] In this embodiment of the present application, both the Y-axis linear module 231 and the Z-axis linear module 241 are driven by servo motors, which enable closed-loop control and improve positioning accuracy. The servo motors are also equipped with brake mechanisms that immediately stop rotation when power is lost. The lower worktable 111 has a clearance hole 112 between the Y-axis linear module 231 and the Y-axis linear guide 232. The Z-axis linear module 241 is positioned within the clearance hole 112. A box-shaped cover 113 is located at the bottom of the lower worktable 111, sealing the clearance hole 112.

[0083] By providing a clearance hole 112 on the lower workbench 111 to allow for the Z-axis linear module 241 to pass through, the Z-axis linear module 241 can move freely within the clearance hole 112 along the length of the Y-axis linear module 231 and the Z-axis linear module 241. This lowers the Z-axis linear mechanism 240 to the bottom of the lower workbench 111, lowering the height of the product carrier 300 and improving the stability of the movement of the tested product 400. A box-shaped cover 113 seals the clearance hole 112, preventing natural light from entering the testing device through the clearance hole 112.

[0084] In some alternative embodiments, see Figures 3 to 5As shown, the embodiment of the present application provides an integrating sphere-type optical detection device for AR glasses. The X-axis linear mechanism 250 of the detection device includes a lower base 251 and an upper slide 252 located on top of the lower base 251. The lower base 251 and the upper slide 252 are slidably connected via an X-axis linear guide 253. The lower base 251 is provided with a micrometer rod 254, and the upper slide 252 is provided with an adjustment seat 255 rotatably connected to the micrometer rod 254.

[0085] The micrometer rod 254 on the lower base 251 adjusts its length, causing the upper slide 252 to slide along the length of the X-axis linear guide 253 on the lower base 251, thereby adjusting the X-axis position of the product carriers 300 used to position the left-eye and right-eye displays. The X-axis linear mechanism 250 is only adjusted when switching between product carriers 300, a relatively infrequent operation. Therefore, the X-axis linear mechanism 250 utilizes the micrometer rod 254 as a manual adjustment mechanism, offering controllable travel, high positioning accuracy, and low cost.

[0086] In some alternative embodiments, see Figure 11 As shown, an embodiment of the present application provides an integrating sphere-type optical inspection device for AR glasses, which further includes a housing 140. The inspection rack 100, the test carrier 200, and the product carrier 300 are all enclosed within the housing 140. The housing 140 provides a darkroom environment for the product 400 under test. Loading and unloading ports are provided on the side walls of the housing 140, as well as a lifting door 141 that closes the loading and unloading ports. A fan filter 144 is provided on the top of the housing 140.

[0087] The housing 140 not only protects the exterior of the test rack 100, the test carrier 200, and the product carrier 300, but also forms an enclosed internal cavity structure, providing a darkroom environment for testing the product 400 under test, preventing natural light from interfering with the product 400 entering the housing 140. A fan filter 144 on top of the housing 140 creates a dust-free environment within the housing 140.

[0088] The outer wall of the housing 140 is equipped with a beam grating 142 located on either side of the loading and unloading port. This grating 142 detects whether there are any obstacles (such as arms or robotic arms) within the loading and unloading port. When the beam grating 142 detects no obstacles within the loading and unloading port, it sends a closing command to the lift door 141. Also located on the outer wall of the housing 140 is a control terminal 143 connected to the spectrometer 131. This control terminal 143 can be a desktop computer or laptop computer and can control detection commands and output detection results.

[0089] In the description of this application, it should be noted that the terms "upper" and "lower" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on this application. Unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or an indirect connection through an intermediate medium, or it can be internal communication between two elements. For those of ordinary skill in the art, the specific meanings of the above terms in this application can be understood according to the specific circumstances.

[0090] It should be noted that, in this application, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, an element defined by the sentence "comprising a ..." does not exclude the presence of other identical elements in the process, method, article or device comprising the element.

[0091] The foregoing is merely a list of specific embodiments of the present application, intended to enable those skilled in the art to understand or implement the present application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present application. Therefore, the present application is not limited to the embodiments shown herein, but is intended to conform to the broadest scope consistent with the principles and novel features of the present application.

Claims

1. An integrating sphere type AR glasses optical detection device, characterized in that: include: A detection frame (100), the detection frame (100) comprising a lower frame (110), a lower workbench (111) being provided on the top of the lower frame (110), an upper frame (120) being provided on the top of the lower workbench (111), an integrating sphere (130) with a light inlet facing downward being fixedly provided on the upper frame (120), and the integrating sphere (130) being connected to a spectrometer (131); A test carrier (200), the test carrier (200) comprising a multi-axis driving module (210) connected to the lower workbench (111), an upper workbench (220) for positioning a product carrier (300) being connected to the top of the multi-axis driving module (210), and a test circuit board (224) and a lower probe module (225) being provided on the upper workbench (220); A product carrier (300) is provided, the product carrier (300) being used to accommodate and position a product to be tested (400); a transfer circuit board (305) connected to a lower probe module (225) is provided at the bottom of the product carrier (300); a cover plate (304) is provided on the product carrier (300); an upper probe module (306) connected to the transfer circuit board (305) and lighting up the product to be tested (400) is provided on the cover plate (304).

2. The integrating sphere optical detection device for AR glasses according to claim 1, characterized in that: The upper workbench (220) comprises a bottom plate (221) and a top plate (222) which are parallel to each other and spaced apart, the bottom plate (221) and the top plate (222) being connected via a vertical plate (223), the test circuit board (224) being fixed between the bottom plate (221) and the top plate (222) and being arranged horizontally, and the test circuit board (224) and the lower probe module (225) being connected via a first flexible cable (227); The lower probe module (225) is fixed on the top plate (222) and is exposed to the top surface of the top plate (222). The top of the top plate (222) is provided with a plurality of positioning guide blocks (226) arranged around the product carrier (300) to position the product carrier (300) on the top plate (222). The lower probe module (225) is located in the space surrounded by the plurality of positioning guide blocks (226).

3. The integrating sphere optical detection device for AR glasses according to claim 2, wherein: A temperature control module (229) is connected to the top plate (222), the top of the temperature control module (229) protrudes from the top surface of the top plate (222) and extends into the product carrier (300) to contact the product (400) under test, and the temperature control module (229) is used to control the detection temperature of the product (400) under test; A vacuum suction cup for vacuum adsorbing the product to be tested (400) is provided on the top of the temperature control module (229), and the vacuum suction cup is used to fix the product to be tested (400) on the product carrier (300). A corresponding radiation sensor (228) for detecting the product carrier (300) is also provided on the top plate (222).

4. The integrating sphere optical detection device for AR glasses according to any one of claims 1 to 3, characterized in that: The product carrier (300) comprises a base plate (301), a positioning plate (302) is detachably connected to the top of the base plate (301), and a hinge seat (303) is detachably connected to the cover plate (304), and the adapter circuit board (305) is fixed to the bottom of the base plate (301); The cover plate (304) is provided with a second flexible cable (307) connected to the adapter circuit board (305), and the second flexible cable (307) is connected to the upper probe module (306). The upper probe module (306) exposes the bottom surface of the cover plate (304) and presses down to contact the metal contacts of the product under test (400).

5. The integrating sphere optical detection device for AR glasses according to claim 4, characterized in that: The top of the positioning plate (302) is provided with a receiving groove (309) arranged along the outer contour of the product (400) to be tested. The positioning plate (302) and the cover plate (304) are each provided with two groups, and the two groups of positioning plates (302) and cover plates (304) are mirror-symmetrical to respectively position and accommodate two symmetrically arranged products (400) to be tested. The hinge seat (303) is provided with a hinge shaft (310) for rotatably connecting to the cover plate (304); the hinge shaft (310) is provided with a torsion spring (311) for elastically supporting the cover plate (304) to flip upward; and lock buckles (308) for locking or unlocking the cover plate (304) are respectively provided on both sides of the base plate (301).

6. The integrating sphere optical detection device for AR glasses according to claim 1, wherein: The multi-axis driving module (210) comprises a Y-axis linear mechanism (230) fixed on the lower workbench (111), a Z-axis linear mechanism (240) connected to the Y-axis linear mechanism (230), and an X-axis linear mechanism (250) connected to the top of the Z-axis linear mechanism (240); The Y-axis linear mechanism (230) moves the product carrier (300) from the loading and unloading station to the detection station directly below the integrating sphere (130), the Z-axis linear mechanism (240) moves the product carrier (300) into or out of the light inlet of the integrating sphere (130), and the X-axis linear mechanism (250) is used to adjust the positions of the two groups of product carriers (300).

7. The integrating sphere optical detection device for AR glasses according to claim 6, characterized in that: The Y-axis linear mechanism (230) comprises a Y-axis linear module (231) and a Y-axis linear guide rail (232) which are parallel to each other and spaced apart and fixed on the lower workbench (111); a first slide (233) is connected to the Y-axis linear module (231) and the Y-axis linear guide rail (232); The Z-axis linear mechanism (240) comprises a Z-axis linear module (241) and a Z-axis linear guide rail (242) which are parallel to each other and spaced apart and fixed on the first slide (233); a second slide (243) is connected to the Z-axis linear module (241) and the Z-axis linear guide rail (242); and the X-axis linear mechanism (250) is fixed on the second slide (243); The lower workbench (111) is provided with a relief hole (112) located between the Y-axis linear module (231) and the Y-axis linear guide rail (232); the Z-axis linear module (241) is located in the relief hole (112); and the bottom of the lower workbench (111) is provided with a box-type cover (113) for closing the relief hole (112).

8. The integrating sphere optical detection device for AR glasses according to claim 6 or 7, characterized in that: The X-axis linear mechanism (250) comprises a lower base (251) and an upper slide (252) located on the top of the lower base (251); the lower base (251) and the upper slide (252) are slidably connected via an X-axis linear guide rail (253); a micrometer rod (254) is provided on the lower base (251); and an adjustment seat (255) rotatably connected to the micrometer rod (254) is provided on the upper slide (252).

9. The integrating sphere optical inspection device for AR glasses according to claim 1, wherein: The invention also includes a casing (140), wherein the detection rack (100), the test carrier (200) and the product carrier (300) are all enclosed in the casing (140), and the casing (140) provides a darkroom environment for the product (400) to be tested. The side wall of the casing (140) is provided with a loading and unloading port, and a lifting door (141) for closing the loading and unloading port. The top of the casing (140) is provided with a fan filter (144).

10. The integrating sphere type AR glasses optical detection device according to claim 9, characterized in that: The outer wall of the housing (140) is provided with a corresponding grating (142) located on both sides of the loading and unloading ports. The outer wall of the housing (140) is also provided with a control terminal (143) connected to the spectrometer (131).

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