Dual-wiping sampling device and inspection device

Abstract

The invention provides a double-wiping sampling device and an inspection device. The double-wiping sampling equipment comprises a rapid detection sample inlet, a fine detection sample inlet and a sampling part. The sampling part is configured to receive a sample inserted from the rapid detection sample injection port or the fine detection sample injection port and acquire a target substance on the sample. The double-wiping sampling equipment further comprises a sample injection port end cover which is configured to cover the quick detection sample injection port and the fine detection sample injection port and can rotate, and the sample injection port end cover only comprises one sample injection opening so that the sample injection port end cover can be aligned with one of the quick detection sample injection port and the fine detection sample injection port through rotation. And meanwhile, the other one of the quick detection sample inlet and the fine detection sample inlet is shielded.

Description

Technical Field

[0001] The present invention relates to, in particular to a. Background Art

[0002] In the current field of security inspection, ion mobility spectrometry equipment is widely used because of its advantages such as fast detection speed, high sensitivity and small size. It can quickly measure trace chemicals on-site in complex environments and is widely used in the detection of explosives, drugs, chemical warfare agents and toxic and harmful gases.

[0003] Traditional ion mobility spectrometry equipment uses two sampling methods: suction (the object to be tested is gas) or wiping (the object to be tested is solid). For substances that are gaseous at room temperature, such as toxic and harmful gases and chemical warfare agents, suction sampling is used for testing. For substances that are solid at room temperature, such as drugs and explosives, wiping sampling is used for testing. After wiping the substance to be tested with wiping paper, the wiping paper is inserted into the wiping port of the equipment. The high temperature at the wiping port instantly vaporizes the sample to be tested and then enters the ion mobility tube detector for detection.

[0004] However, current inspection equipment needs to be further improved. Summary of the invention

[0005] In view of the above problems, one aspect of the present invention provides a double-wiping sampling device, comprising:

[0006] a rapid-test injection port configured to allow a sample to be inserted through the rapid-test injection port;

[0007] a precision injection port configured to allow a sample to be inserted through the precision injection port; and

[0008] A sampling part, configured to receive a sample inserted from the rapid test injection port or the precise test injection port, and obtain a target substance on the sample;

[0009] The double-wipe sampling device also includes an injection port end cover, which is configured to cover the quick test injection port and the fine test injection port and is capable of rotating. The injection port end cover only includes one injection opening, so that the injection port end cover can be rotated to align with one of the quick test injection port and the fine test injection port while covering the other of the quick test injection port and the fine test injection port, thereby selecting one of the quick test injection port and the fine test injection port to be inserted with the sample.

[0010] In one embodiment, the injection port end cover further comprises a prompt opening, and when the injection opening is aligned with one of the fast test injection port and the fine test injection port, the prompt opening exposes a prompt character representing one of the fast test injection port and the fine test injection port on the surface of the double wipe sampling device.

[0011] In one embodiment, the sampling portion comprises:

[0012] The rapid test semipermeable membrane assembly is configured such that when the sample is inserted into the sampling portion, the first side surface of the rapid test semipermeable membrane assembly faces the sample;

[0013] A precision inspection semipermeable membrane assembly, configured so that when the sample is inserted into the process sampling portion, a first side surface of the precision inspection semipermeable membrane assembly faces the sample;

[0014] A heating unit, wherein the first surface of the heating unit faces and is capable of heating the rapid test semipermeable membrane component, and the second surface of the heating unit faces and is capable of heating the precise test semipermeable membrane component, and the first surface and the second surface of the heating unit are a pair of opposite side surfaces of the heating unit.

[0015] In one embodiment, at least a portion of the first surface of the heating unit includes a concave surface so as to provide a quick test space between the first surface of the heating unit and the second side surface of the quick test semipermeable membrane assembly, and the second side surface of the quick test semipermeable membrane assembly is the opposite side surface of the first side surface of the quick test semipermeable membrane assembly; and / or

[0016] At least a portion of the second surface of the heating unit includes a concave surface to provide an inspection space between the second surface of the heating unit and a second side surface of the inspection semipermeable membrane assembly, which is an opposite side surface of the first side surface of the inspection semipermeable membrane assembly.

[0017] In one embodiment, the projections of the quick inspection space and / or the precise inspection space on the horizontal plane correspond to the quick inspection semipermeable membrane component and the precise inspection semipermeable membrane component, respectively.

[0018] In one embodiment, the heating unit includes a quick test gas path, configured to provide an air flow to sweep over the second side surface of the quick test semipermeable membrane assembly in a sampling state of the double-wipe sampling device, and direct the air flow downstream; and

[0019] The precision inspection gas path is configured to provide an airflow to sweep over the second side surface of the precision inspection semipermeable membrane component in the sampling state of the double-wipe sampling device, and guide the airflow downstream.

[0020] In one embodiment, the rapid inspection gas path includes a rapid inspection gas path purge port arranged at a first rapid inspection space edge of the rapid inspection space and a rapid inspection gas path air receiving port arranged at a second rapid inspection space edge of the rapid inspection space, and the second rapid inspection space edge is an edge opposite to the first rapid inspection space edge of the rapid inspection space; and

[0021] The precision inspection gas path includes a precision inspection gas path purge port arranged at a first precision inspection space edge of the precision inspection space and a precision inspection gas path air receiving port arranged at a second precision inspection space edge of the precision inspection space. The second precision inspection space edge and the first precision inspection space edge are relative edges of the precision inspection space.

[0022] In one embodiment, the quick test air circuit includes a quick test air circuit air inlet and a quick test air circuit air outlet arranged on the side of the double-wipe sampling device, and the precise test air circuit includes a precise test air circuit air inlet and a precise test air circuit air outlet arranged on the side of the double-wipe sampling device, wherein the quick test air circuit air outlet and the precise test air circuit air outlet are arranged on different sides of the double-wipe sampling device.

[0023] In one embodiment, the heating unit comprises:

[0024] Intermediate entities;

[0025] A heating element is embedded in the intermediate body.

[0026] In one embodiment, the intermediate entity is a thermally conductive material.

[0027] In one embodiment, the sampling portion further comprises:

[0028] A first entity layer and a second entity layer, wherein a quick-test semipermeable membrane component is sandwiched between the first entity layer and the intermediate entity of the heating unit, and a precise-test semipermeable membrane component is sandwiched between the second entity layer and the intermediate entity of the heating unit.

[0029] In one embodiment, the first physical layer includes a quick test backflush air port, which is configured to provide an airflow to purge the first side surface of the quick test semipermeable membrane assembly in a standby state of the double-wipe sampling device, and the purge airflow is directed to the quick test inlet; and / or

[0030] The second physical layer includes a precision inspection back-flush air port to provide an air flow to purge the first side surface of the precision inspection semi-permeable membrane assembly, and the purge air flow is directed to the precision inspection sampling port.

[0031] In one embodiment, the dual-swab sampling device further comprises a support, the support accommodating the stacked first and second physical layers and a heating unit, wherein the heating unit is sandwiched between the first and second physical layers.

[0032] In one embodiment, the double-wipe sampling device is configured to switch between a standby state and a sampling state, wherein in the standby state, when a sample is inserted into the quick test injection port or the fine test injection port, the sample is sensed by the injection sensor, and the double-wipe sampling device switches from the standby state to the sampling state.

[0033] Another aspect of the present invention provides an inspection device, comprising:

[0034] A double swab sampling device according to above; and

[0035] The ion mobility spectrometer is configured to communicate with the double-wipe sampling device and detect target substances in the gas provided by the double-wipe sampling device.

[0036] In one embodiment, the inspection device also includes a cluster capillary column configured to be connected to the precision inspection gas outlet of the double-wipe sampling device and the ion mobility spectrometer, so as to pre-separate the gas including the target substance provided by the double-wipe sampling device, and provide the target substance to the ion mobility spectrometer for detection. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] The above contents and other objects, features and advantages of the present invention will become more apparent through the following description of the embodiments of the present invention with reference to the accompanying drawings, in which:

[0038] Figure 1 A schematic diagram of a double-wipe sampling device according to an embodiment of the present invention is schematically shown, wherein the right side figure is a front view, the left side figure is a rear cross-sectional view, and the middle figure is a right cross-sectional view;

[0039] Figure 2 Schematically shows the appearance of a double-wiping sampling device according to an embodiment of the present invention;

[0040] Figure 3 The exploded schematic diagram of the double-wipe sampling device according to an embodiment of the present invention is schematically shown. DETAILED DESCRIPTION

[0041] Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings. However, it should be understood that these descriptions are only exemplary and are not intended to limit the scope of the present invention.

[0042] Instruments based on the principle of ion mobility spectrometry detectors have outstanding detection capabilities for single samples, but are prone to false alarms when detecting mixtures of two or more substances. Traditionally, for the detection of mixtures, the substances to be tested are separated by gas chromatography columns before testing to improve the accuracy of the alarm. The existing wiping device is designed with a single injection mode (wiping fast test or wiping precise test), which cannot meet the needs of on-site rapid (fast test quantity) and accurate (precise test quantity) alarms.

[0043] The present invention proposes a structure in which the wiping sampling insertion end is designed as a double-port structure, that is, the same wiping inspection device can realize wiping fast inspection sampling measurement and wiping precise inspection sampling measurement.

[0044] In the present invention, the wipe fast test is that the substance to be tested directly enters the ion migration tube detector for testing after being vaporized, and is mainly aimed at a single sample.

[0045] In the present invention, the wiping precision measurement is that the substance to be measured first enters the MCC (clustered capillary column) for pre-separation after being vaporized, and then enters the ion migration tube detector for testing. The wiping precision measurement of the present invention is mainly for measuring a mixture of two or more substances to improve the alarm accuracy of the equipment.

[0046] The switching of the dual injection ports designed in the present invention is achieved by rotating the wipe port end cover on the device housing. The design of the wipe port end cover ensures that only one port of the wipe injection port can face the tester, and the other wipe port is hidden to prevent users from operating incorrectly. The detailed structure and instructions for use are described as follows.

[0047] As shown in the figure, the present invention provides a double-wipe sampling device, which includes a quick test injection port 13, configured to allow a sample to be inserted from the quick test injection port 13; a fine test injection port 14, configured to allow a sample to be inserted from the fine test injection port 14; and a sampling part, configured to receive a sample inserted from the quick test injection port 13 or the fine test injection port 14, and obtain a target substance on the sample.

[0048] In another embodiment of the present invention, the double swab sampling device may further include a housing, such as Figure 2 As shown, the housing includes a front cover 201. However, this is not required.

[0049] In one embodiment of the present invention, the double-wiping sampling device further includes an injection port end cover 202, which includes only one injection opening 202-1, so that the injection port end cover 202 can be rotated to align with one of the rapid inspection injection port 13 and the fine inspection injection port 14, while covering the other of the rapid inspection injection port 13 and the fine inspection injection port 14, so as to select one of the rapid inspection injection port 13 and the fine inspection injection port 14 to be inserted with the sample. This embodiment provides a new solution, through the rotatable injection port end cover 202, the desired rapid inspection injection port 13 or the fine inspection injection port 14 can be selected, thereby avoiding mistakes when inserting the sample and causing erroneous operation.

[0050] In another embodiment of the present invention, Figure 2 As shown, the double wiping sampling device includes an injection port end cover 202, which is configured to cover the rapid test injection port 13 and the fine test injection port 14, and the injection port end cover 202 can rotate relative to the rapid test injection port 13 and the fine test injection port 14. In this embodiment, the injection port end cover 202 includes an injection opening 202-1 and a prompt opening 202-2, and is configured so that when the injection opening 202-1 is aligned with the rapid test injection port 13, the sample can be inserted from the injection opening 202-1 into the rapid test injection port 13, and at the same time, the prompt words "Wipe Quick Test" on the double wiping sampling device can be exposed in the prompt opening 202-2, as shown in FIG. Figure 2As shown in 203, it can also be other prompts, such as "quick test", so that the operator can clearly determine that the operation at this time is a quick test operation, and obtaining the target substance on the sample is to perform a quick test. According to this embodiment, the injection port end cover 202 can be rotated 180 degrees, and the injection opening 202-1 is aligned with the fine test injection port 14, and the prompt opening 202-2 now reveals the prompt words "wipe fine test" on the double wiping sampling device, as shown in FIG. Figure 2 As shown in 204, it can also be other prompts, such as "fine inspection", so that the operator can clearly determine that the operation at this time is a fine inspection operation, and obtaining the target substance on the sample is to perform a fine inspection. It should be noted here that the advantage of this embodiment is that the setting of the injection port end cover 202 allows the operator to correctly insert the sample into the quick inspection injection port 13 or the fine inspection injection port 14, because the injection port end cover 202 has only one injection opening 202-1, when it is aligned with the quick inspection injection port 13, it actually covers the fine inspection injection port 14, and also reveals the prompt of "wipe quick inspection". In this embodiment, the injection port end cover 202 can be circular and can rotate about the geometric center of the circle. With the geometric center of the injection port end cover 202 as the center, the quick test injection port 13 and the fine test injection port 14 are on an arc with a radius r at the center of the circle, or to be precise, the distance between the quick test injection port 13 and the fine test injection port 14 and the center of the circle is r1, and the distance between the prompt characters "wipe quick test" and "wipe fine test" and the center of the circle is r2, and r1 and r2 are not equal. Such a setting can achieve the above operation.

[0051] In one embodiment of the present invention, the injection port end cover 202 may include a protrusion, which is located on the surface of the injection port end cover 202 facing the double-wipe sampling device. When the injection opening 202-1 of the injection port end cover 202 is aligned with the quick test injection port 13 or the fine test injection port 14, the protrusion fits into the corresponding hole on the surface of the double-wipe sampling device to help the operator locate. For example, a marble can be set on the back of the injection port end cover 202, and the marble is preloaded by a spring. When the injection port end cover 202 rotates, the marble compresses the spring, and the marble slides on the surface of the double-wipe sampling device. When the marble is aligned with the corresponding hole on the surface of the double-wipe sampling device, the marble enters the hole and makes a clicking sound, prompting the rotation to be in place. In one embodiment, two marbles can be set, and two corresponding holes are set on the surface of the double-wipe sampling device in the horizontal direction. Other settings in the art can also be used.

[0052] In an embodiment of the present invention, the sampling section includes a quick test semipermeable membrane component 108, which is configured so that after the sample is inserted into the quick test injection port 13, the sample is inserted into the sampling section, and the sample faces the first side surface of the quick test semipermeable membrane component 108 (the upward surface in the accompanying drawings). The sampling section includes a precision test semipermeable membrane component 109, which is configured so that after the sample is inserted into the sampling section, the sample faces the first side surface of the precision test semipermeable membrane component 109 (the downward surface in the accompanying drawings). According to this embodiment, the sampling section also includes a heating unit 101, the first surface of the heating unit 101 faces the quick test semipermeable membrane component 108, and the second surface of the heating unit 101 faces the precision test semipermeable membrane component 109, and the first surface and the second surface of the heating unit 101 are a pair of opposite side surfaces of the heating unit 101. In other words, as shown in the figure, the heating unit 101 is located between the quick test semipermeable membrane component 108 and the precise test semipermeable membrane component 109. Such an arrangement can heat the quick test semipermeable membrane component 108 and the precise test semipermeable membrane component 109 by one heating unit 101, which can not only simplify the structure, but also facilitate the control of the heating temperature, so as to achieve the same heating temperature for quick test and precise test. The heating unit 101 is configured to make the temperature of the sampling part reach the range of 150-250 degrees, or the range of 160-220 degrees, or the range of 165-210 degrees, or about 170 degrees. It should be understood and required to be accurately set to a precise temperature here, but a temperature range. In this temperature range, when the sample enters the sampling part, the target substance carried on the sample can be quickly converted into a gaseous state. In an embodiment of the present invention, during the use of the double-wipe sampling device, the sampling part can be maintained at a predetermined temperature by the heating unit 101.

[0053] In one embodiment of the present invention, the heating unit 101 may include an intermediate body 102 and a heating element (not shown), and the heating element is embedded in the intermediate body 102. By such an arrangement, the heating element can be in contact with the intermediate body 102 so as to heat the intermediate body 102 quickly.

[0054] In one embodiment, the intermediate entity 102 may be a heat-conducting material, and the heating element is embedded in the heat-conducting material, for example, embedded in the middle position inside the intermediate entity 102. When the heating element is heated, the intermediate entity 102 is heated. The intermediate entity 102 may be, for example, metal. The heated metal intermediate entity 102 may heat the quick-test semipermeable membrane assembly 108 and the precise-test semipermeable membrane assembly 109 on its two opposite side surfaces. In this embodiment, the metal intermediate entity 102 may heat the quick-test semipermeable membrane assembly 108 and the precise-test semipermeable membrane assembly 109 and the sample inserted into the sampling portion through surface thermal radiation, and may also heat through heat conduction between the intermediate entity 102 and the quick-test semipermeable membrane assembly 108 and the precise-test semipermeable membrane assembly 109. This embodiment may advantageously utilize the intermediate entity 102 for heating, and the heating may be uniform; the intermediate entity 102 is made of metal, and thus has high strength, is non-deformable, and has good durability.

[0055] In an embodiment of the present invention, advantageously, the first surface of the heating unit 101 (the surface on the upper side of the heating unit 101 as shown in the figure) is configured as a first concave surface 1021 (actually on the upper side surface of the intermediate entity), or a portion of the first surface of the heating unit 101 is configured as a first concave surface 1021, thereby providing a quick test space between the first surface and the second side surface of the quick test semipermeable membrane component 108 (the lower side surface of the quick test semipermeable membrane component 108 as shown in the figure). In this embodiment, the sample faces the upper surface of the quick-test semipermeable membrane component 108, and a quick-test space is provided between the lower surface of the quick-test semipermeable membrane component 108 and the heating unit 101. Due to the heating of the heating unit 101, the adjacent components including the quick-test semipermeable membrane component 108 (actually the intermediate entity 102) are heated and heated, and the target substance carried on the sample (through the sample wiping the inspected object, such as luggage or human body) is transformed into a gaseous state and separated from the sample. The gaseous target substance penetrates through the quick-test semipermeable membrane component 108 from the upper side of the quick-test semipermeable membrane component 108 and enters the quick-test space. Similarly, the second surface of the heating unit 101 (the lower surface as shown in the figure) is set as a second concave surface, or a part of the second surface of the heating unit 101 is set as a second concave surface, so as to provide a fine-test space between the second surface and the second side surface of the fine-test semipermeable membrane component 109 (the upper side surface as shown in the figure). In this embodiment, the sample faces the lower surface of the fine inspection semipermeable membrane component 109, and a fine inspection space is reserved between the upper surface of the fine inspection semipermeable membrane component 109 and the heating unit 101. Due to the heating of the heating unit 101, the adjacent components including the fine inspection semipermeable membrane component 109 are heated and heated, wherein the target substance is converted into a gaseous state due to the high temperature, detached from the sample, and penetrates through the fine inspection semipermeable membrane component 109 from the lower side of the fine inspection semipermeable membrane component 109 to enter the fine inspection space. It should be noted that the quick inspection space and the fine inspection space can be set to be symmetrical or different. The shapes of the quick inspection space and the fine inspection space can be set so that the projection on the horizontal plane corresponds to the quick inspection semipermeable membrane component 108 and the fine inspection semipermeable membrane component 109. For example, the projection on the horizontal plane is rectangular or circular, similar to the quick inspection semipermeable membrane component 108 and the fine inspection semipermeable membrane component 109. Such an arrangement can contain the target substances that permeate from the quick test semipermeable membrane assembly 108 and the fine test semipermeable membrane assembly 109 to the greatest extent. However, the projection of the quick test space and the fine test space on the horizontal plane may include the quick test semipermeable membrane assembly 108 and the fine test semipermeable membrane assembly 109.

[0056] It is advantageous to set up a quick inspection space and a precise inspection space, which can allow the gaseous target substance to remain in the quick inspection space or the precise inspection space without being quickly adsorbed onto the surface of the heating unit 101, thereby reducing the sampling efficiency and interference factors.

[0057] In an embodiment of the present invention, the double-wipe sampling device also includes a quick-test gas circuit and a fine-test gas circuit. To a certain extent, the quick-test gas circuit and the fine-test gas circuit are arranged in the heating unit 101 (in the embodiment shown in the figure, they are arranged in the intermediate entity 102). In one embodiment, a pipeline is arranged in the heating unit 101 to allow gas to flow in the pipeline, and a pipeline for gas flow can be provided in the intermediate entity 102 of the heating unit 101 by drilling. Such a scheme is compatible with existing mechanical processing technology and has good gas circuit stability. The quick-test gas circuit is configured to provide an airflow to sweep across the second side surface of the quick-test semipermeable membrane component 108 in the sampling state of the double-wipe sampling device, and to guide the airflow downstream. The fine-test gas circuit is configured to provide an airflow to sweep across the second side surface of the fine-test semipermeable membrane component 109, and to guide the airflow downstream. The airflow is used as a carrier gas to deliver the target substance to the downstream for detection.

[0058] In one embodiment, the quick test gas circuit may include a quick test gas circuit purge port 1021-1 arranged at the edge of the first quick test space (also the edge of the first concave surface) of the quick test space and a quick test gas circuit air intake port 1021-2 arranged at the edge of the second quick test space of the quick test space. In this embodiment, the quick test gas circuit purge port 1021-1 of the quick test gas circuit provides an airflow into the quick test space, and the target substance in the quick test space is mixed with the gas; and the airflow purges the lower surface (second side surface) of the quick test semipermeable membrane assembly 108, and the target substance on the lower surface of the quick test semipermeable membrane assembly 108 is carried away by the gas and mixed with the gas, and then the gas is collected by the quick test gas circuit air intake port 1021-2 and introduced into the downstream for detection. The first quick test space edge and the second quick test space edge are opposite edges of the quick test space, or the same side edges. That is, the quick test gas circuit purge port 1021-1 and the quick test gas circuit air intake port 1021-2 can be arranged on the same side of the quick test space, or on opposite sides. It is advantageous to arrange the rapid test gas path purge port 1021 - 1 and the rapid test gas path air intake port 1021 - 2 on the same side of the rapid test space, so that the target substance and the gas can be mixed more fully.

[0059] The precision inspection gas circuit includes the one arranged in the precision inspection space (in Figure 3The bottom side of the heating element 101 is blocked and not shown) and the precision inspection gas path purge port is arranged at the edge of the first precision inspection space of the precision inspection space and the precision inspection gas path air intake port is arranged at the edge of the second precision inspection space of the precision inspection space. In this embodiment, the precision inspection gas path purge port of the precision inspection gas path provides an airflow to enter the precision inspection space, and the target substance in the precision inspection space is mixed with the gas; and the airflow purges the upper side surface (second side surface) of the precision inspection semipermeable membrane component 109, and the target substance on the upper side surface of the precision inspection semipermeable membrane component 109 is carried away by the gas and mixed with the gas, and then the gas is collected by the precision inspection gas path air intake port and introduced into the downstream for detection. The edge of the first precision inspection space and the edge of the second precision inspection space are opposite edges of the precision inspection space, or the same side edges. That is to say, the precision inspection gas path purge port and the precision inspection gas path air intake port can be arranged on the same side of the precision inspection space, or on opposite sides. It is advantageous for the precision inspection gas path purge port and the precision inspection gas path air intake port to be arranged on the same side of the precision inspection space, so that the target substance and the gas can be mixed more fully. Although in Figure 3 Due to being obscured, the above precision inspection space and surrounding components are not shown. However, those skilled in the art should be able to imagine the arrangement of the precision inspection space and the precision inspection gas path purge port and precision inspection gas path air intake port based on the drawings and the above description, and with reference to the arrangement of the quick inspection space shown on the upper surface of the heating unit 101.

[0060] In an embodiment of the present invention, the quick test gas circuit includes a quick test gas circuit air inlet 103 and a quick test gas circuit air outlet 104 arranged on the side of the double-wipe sampling device, and the precision test gas circuit includes a precision test gas circuit air inlet 105 and a precision test gas circuit air outlet 106 arranged on the side of the double-wipe sampling device.

[0061] In one embodiment, the quick test gas outlet 104 and the precise test gas outlet 106 are arranged on different sides of the double-wipe sampling device, that is, vertical surfaces relative to the upper top surface and the lower bottom surface of the double-wipe sampling device, for example Figure 3 The front, back, left, and right sides shown (actually the middle entity) (will eventually be the sides of the corresponding double-swab sampling device). Figure 3 In the embodiment, the quick test gas circuit outlet 104 is arranged on the left side of the double wiping sampling device, and the fine test gas circuit outlet 106 is arranged on the rear side of the double wiping sampling device, so that the quick test gas circuit and the fine test gas circuit can be easily distinguished, and it is convenient to arrange different downstream devices or devices in space to process the samples of quick test and fine test respectively. In other embodiments, the quick test gas circuit outlet 104 can be arranged on the left side of the double wiping sampling device, and the fine test gas circuit outlet 106 can be arranged on the right side of the double wiping sampling device, or other sides.

[0062] The double-wiping sampling device of the present invention provides a heating unit 101 with an intermediate entity 102, which can realize fast sampling and precise sampling. The sampling part can realize the heating function and the arrangement of the fast gas path and the precise gas path through an intermediate entity 102, and has a compact structure and high reliability. The sampling described in this article refers to the process of separating the target substance from the sample (such as a test paper) by high temperature and sending the target substance to the downstream through the airflow. The target substance can be wiped by the test paper on the object to be tested, such as luggage, human body, vehicle, etc., so that the target substance that may exist is adhered to the test paper. This process can be called a sampling process.

[0063] In one embodiment of the present invention, the sampling unit further includes: a first entity layer 111 and a second entity layer 112. A quick test semipermeable membrane component 108 is sandwiched between the first entity layer 111 and the intermediate entity 102 of the heating unit 101, and a precise test semipermeable membrane component 109 is sandwiched between the second entity layer 112 and the intermediate entity 102 of the heating unit 101.

[0064] In one embodiment, the double-wipe sampling device may further include a bracket 10, the bracket 10 accommodates the stacked first physical layer 111 and the second physical layer 112 (in the figure, the first physical layer 111 is on the upper side of the second physical layer 112) and the heating unit 101, wherein the heating unit 101 is sandwiched between the first physical layer 111 and the second physical layer 112. In this embodiment, a separate integrally formed bracket 10 is provided, and the stacked first physical layer 111 and the second physical layer 112 and the heating unit 101 are accommodated in the bracket 10. Due to the matching of the sizes, the stack of the first physical layer 111 and the second physical layer 112 and the heating unit 101 can be fixed, and there is no need to set additional fixing holes, flanges, and bolts to achieve the fixation of the three. In the embodiment of the present invention, the double-wipe sampling device can be quickly assembled and disassembled by accommodating the stacked first physical layer 111 and the second physical layer 112 and the heating unit 101 through the bracket 10, and the overall rigidity can be achieved through the bracket 10, thereby improving the reliability and safety of the device. In addition, due to the bracket 10, the double-wipe sampling device can be easily installed in other devices, thereby improving compatibility.

[0065] In one embodiment, the bracket 10 can be used as an insulation layer to isolate the outside world from the heating unit in the bracket 10 , and at the same time prevent the heat of the heating element 101 from being quickly dissipated, which is conducive to the rapid heating of the heating element 101 .

[0066] In one embodiment, the first physical layer 111 includes a quick check back-blowing air port. Figure 3At the lower side of the first physical layer 111, the quick-test back-blow air inlet 107 is shown on the upper side of the first physical layer 111. The quick-test back-blow air inlet is configured to provide airflow to purge the first side surface of the quick-test semipermeable membrane component 108 in the standby state of the double-wipe sampling device, and the purge airflow is directed to the quick-test injection port 13; the second physical layer 112 includes a precision-test back-blow air inlet 110-1 to provide airflow to purge the first side surface of the precision-test semipermeable membrane component 109, and the purge airflow is directed to the precision-test injection port 14. Figure 3 In the figure, a fine inspection back-blowing air inlet 110 is provided on the lower side of the second physical layer 112, which is blocked and not visible in the figure. In practical applications, the double-wiping sampling device will be used repeatedly for sampling. In order to reduce or avoid the influence of the previous sampling on the latter sampling, the present invention designs a quick inspection back-blowing air inlet and a fine inspection back-blowing air inlet 110-1. Through this design, the quick inspection back-blowing air inlet purges gas toward the first side surface of the quick inspection semipermeable membrane component 108, and the fine inspection back-blowing air inlet 110-1 purges gas toward the first side surface of the fine inspection semipermeable membrane component 109, thereby blowing the residual impurities or target substances away from the quick inspection semipermeable membrane component 108 or the fine inspection semipermeable membrane component 109. In the present invention, the double-wiping sampling device can be set to be in a standby state or a sampling state. In the standby state, the quick test back-blowing air port purges gas toward the first side surface of the quick test semipermeable membrane assembly 108, and the fine test back-blowing air port 110-1 purges gas toward the first side surface of the fine test semipermeable membrane assembly 109; and, in another embodiment, the heating unit 101 can keep heating the quick test semipermeable membrane assembly 108 and the fine test semipermeable membrane assembly 109, which is conducive to the separation of impurities and target substances. In another embodiment, after the quick test operation, in the standby state, only the quick test back-blowing air port purges gas toward the first side surface of the quick test semipermeable membrane assembly 108. The quick test back-blowing air inlet 107 and the fine test back-blowing air inlet 110 can be connected to the same gas source; in another embodiment, the quick test back-blowing air inlet 107 and the fine test back-blowing air inlet 110 can be connected to their respective gas sources.

[0067] When no sampling is being done, the double-wipe sampling device is in standby mode. When a sample is inserted into the quick test injection port 13 or the precise test injection port 14, the sample is sensed by the injection sensor, and the double-wipe sampling device switches from the standby mode to the sampling mode. The sensor may be an infrared sensor or other sensors. When the sensor senses that the sample is inserted, the controller of the double-wipe sampling device is triggered, so that the double-wipe sampling device switches from the standby mode to the sampling mode, that is, the quick test back-blow air port and the precise test back-blow air port stop blowing gas, and the double-wipe sampling device enters the sampling mode: the heating unit 101 starts heating (if the heating unit 101 has stopped heating), the quick test gas path provides an airflow to sweep across the second side surface of the quick test semi-permeable membrane assembly 108, and directs the airflow downstream; or the precise test gas path provides an airflow to sweep across the second side surface of the precise test semi-permeable membrane assembly 109, and directs the airflow downstream.

[0068] Another aspect of the present invention provides an inspection device, comprising: the above-mentioned double-wipe sampling device; and an ion mobility spectrometer. The ion mobility spectrometer is configured to be connected to the double-wipe sampling device and detect the target substance in the gas provided by the double-wipe sampling device. For example, the ion mobility spectrometer is arranged downstream of the double-wipe sampling device, such as downstream of the fast-test gas path, and is connected to the gas outlet of the fast-test gas path, and the gas containing the target substance in the fast-test gas path is introduced into the ion mobility spectrometer, thereby realizing the detection of the target substance.

[0069] In another embodiment, the inspection device also includes a clustered capillary column, which is connected to the gas outlet of the precision inspection gas path of the double-wipe sampling device. The gas including the target substance in the precision inspection gas path is introduced into the clustered capillary column, and the clustered capillary column pretreats the gas. The pretreated gas is introduced into the ion mobility spectrometer, thereby realizing the detection of the target substance.

[0070] In the present invention, when performing rapid test sampling, the injection port end cover 202 is rotated to align the injection opening 202-1 with the rapid test injection port 13, and the prompt opening 202-2 is exposed to the "wipe rapid test". The heating unit 101 has heated the sampling part to a temperature, such as about 170 degrees, and the sample (test paper) is inserted into the rapid test injection port 13. Since the sensor senses that the sample is inserted, the rapid test is triggered, and the rapid test backflush air port and the precision test backflush air port stop blowing gas;

[0071] Then the sample is further inserted into the sampling part, and the sample is quickly heated to about 170 degrees. The target substance on the sample changes from solid to gaseous, separates from the sample, and penetrates from the first side of the rapid test semipermeable membrane component 108 to the second side, and enters the rapid test space;

[0072] The gas blown into the rapid test gas path purge port 1021-1 is mixed with the gaseous target substance, enters the rapid test gas path air intake port 1021-2, and is introduced downstream, completing the rapid test sampling process.

[0073] In the inspection device of the present invention, the rapid inspection sampling process is first completed; then, the gas including the target substance flows into the ion mobility spectrometer to complete the detection.

[0074] Similarly, in the precision inspection sampling process of the present invention, the injection port end cover 202 is rotated to align the injection opening 202-1 with the precision inspection injection port 14, and the prompt opening 202-2 is exposed to "wipe precision inspection". The heating unit 101 has heated the sampling part to a temperature, such as about 170 degrees. The sample (test paper) is inserted into the precision inspection injection port 14. Since the sensor senses that the sample is inserted, the precision inspection is triggered, and the precision inspection backflush air port and the precision inspection backflush air port stop blowing gas;

[0075] Then the sample is further inserted into the sampling part, and the sample is quickly heated to about 170 degrees. The target substance on the sample changes from solid to gaseous, separates from the sample, and penetrates from the first side of the precision inspection semipermeable membrane component 109 to the second side, and enters the precision inspection space;

[0076] The gas blown into the purge port of the precision inspection gas path is mixed with the gaseous target substance, enters the air intake port of the precision inspection gas path, and is introduced downstream, completing the precision inspection sampling process.

[0077] In the inspection device of the present invention, the precision inspection sampling process is first completed; then, the gas including the target substance flows into the cluster capillary column, the cluster capillary column pre-treats the gas, and the pre-treated gas flows into the ion mobility spectrometer to complete the detection.

[0078] The measures in the various embodiments may not be used in combination to advantage.The scope of the invention is defined by the following claims and their equivalents.

[0079] The multiple embodiments of the present invention can be combined in any way according to the ideas and principles disclosed in this aspect, and the implemented technical solutions are all included in the embodiments of the present invention.

[0080] It should be noted that the word "comprising" does not exclude other elements or steps, and the word "a" or "an" does not exclude a plurality; "upper", "lower", "bottom", "upper part", "lower part" are only used to indicate the orientation of the components in the illustrated structure, rather than to limit their absolute orientation; "first" and "second" are used to distinguish the names of different components rather than to sort or indicate importance or primary and secondary distinction. In addition, any element number in the claims should not be understood as limiting the scope of the invention.

[0081] Although some embodiments of the present general inventive concept have been shown and described, it will be understood by those skilled in the art that changes may be made to these embodiments without departing from the principles and spirit of the present general inventive concept, and the scope of the present invention is defined by the claims and their equivalents. Without departing from the scope of the present invention, those skilled in the art may make various substitutions and modifications, which should all fall within the scope of the present invention.

Claims

1. A double wiping sampling device comprising: a rapid-test injection port configured to allow a sample to be inserted through the rapid-test injection port; a precision check injection port configured to allow a sample to be inserted from the precision check injection port; as well as A sampling part, configured to receive the sample inserted from the rapid test injection port or the precise test injection port, and obtain the target substance on the sample; The double-wipe sampling device further comprises an injection port end cover, which is configured to cover the quick-test injection port and the fine-test injection port and is capable of rotating, and the injection port end cover comprises only one injection opening, so that the injection port end cover can be rotated to align with one of the quick-test injection port and the fine-test injection port while covering the other of the quick-test injection port and the fine-test injection port, thereby selecting one of the quick-test injection port and the fine-test injection port to be inserted with the sample.

2. The double-wipe sampling device according to claim 1, wherein the injection port end cover further comprises a prompt opening, and when the injection opening is aligned with one of the quick-test injection port and the fine-test injection port, the prompt opening exposes a prompt character representing one of the quick-test injection port and the fine-test injection port on the surface of the double-wipe sampling device.

3. The dual-wipe sampling device according to claim 1, wherein the sampling portion comprises: A quick test semipermeable membrane component, configured such that when the sample is inserted into the sampling portion, a first side surface of the quick test semipermeable membrane component faces the sample; A precision inspection semipermeable membrane component, configured such that when the sample is inserted into the sampling portion, a first side surface of the precision inspection semipermeable membrane component faces the sample; A heating unit, wherein the first surface of the heating unit faces and is capable of heating the rapid test semipermeable membrane component, and the second surface of the heating unit faces and is capable of heating the precise test semipermeable membrane component, and the first surface and the second surface of the heating unit are a pair of opposite side surfaces of the heating unit.

4. The dual swab sampling device of claim 3, wherein At least a portion of the first surface of the heating unit includes a concave surface so as to provide a quick test space between the first surface of the heating unit and a second side surface of the quick test semipermeable membrane assembly, wherein the second side surface of the quick test semipermeable membrane assembly is an opposite side surface of the first side surface of the quick test semipermeable membrane assembly; and / or At least a portion of the second surface of the heating unit includes a concave surface to provide an inspection space between the second surface of the heating unit and a second side surface of the inspection semipermeable membrane component, which is an opposite side surface of the first side surface of the inspection semipermeable membrane component.

5. The double-wipe sampling device according to claim 3 or 4, wherein the projections of the rapid inspection space and / or the precise inspection space on the horizontal plane correspond to the rapid inspection semipermeable membrane component and the precise inspection semipermeable membrane component respectively.

6. The double-wipe sampling device according to claim 4, wherein the heating unit comprises a quick-test gas path, configured to provide an airflow to sweep across the second side surface of the quick-test semipermeable membrane assembly and direct the airflow downstream in a sampling state of the double-wipe sampling device; and The precision inspection gas path is configured to provide an air flow to sweep over the second side surface of the precision inspection semipermeable membrane assembly and direct the air flow downstream in the sampling state of the double-wiping sampling device.

7. The double-wiping sampling device according to claim 6, wherein the rapid test gas path comprises a rapid test gas path purge port arranged at a first rapid test space edge of the rapid test space and a rapid test gas path air receiving port arranged at a second rapid test space edge of the rapid test space, the second rapid test space edge being an edge of the rapid test space opposite to the first rapid test space edge; and The precision inspection gas path includes a precision inspection gas path purge port arranged at a first precision inspection space edge of the precision inspection space and a precision inspection gas path air collection port arranged at a second precision inspection space edge of the precision inspection space, and the second precision inspection space edge and the first precision inspection space edge are relative edges of the precision inspection space.

8. The double-wipe sampling device according to claim 7, wherein the quick-test gas circuit comprises a quick-test gas circuit air inlet and a quick-test gas circuit air outlet arranged on the side of the double-wipe sampling device, and the fine-test gas circuit comprises a fine-test gas circuit air inlet and a fine-test gas circuit air outlet arranged on the side of the double-wipe sampling device, wherein the quick-test gas circuit air outlet and the fine-test gas circuit air outlet are arranged on different sides of the double-wipe sampling device.

9. The dual-wipe sampling device according to claim 3, wherein the heating unit comprises: Intermediate entities; A heating element is embedded in the intermediate entity.

10. The dual wipe sampling device of claim 8, wherein the intermediate entity is a thermally conductive material.

11. The dual-wipe sampling device according to claim 2, wherein the sampling portion further comprises: A first entity layer and a second entity layer, wherein a quick-test semipermeable membrane component is sandwiched between the first entity layer and the intermediate entity of the heating unit, and a precise-test semipermeable membrane component is sandwiched between the second entity layer and the intermediate entity of the heating unit.

12. The double-wipe sampling device according to claim 11, wherein the first physical layer comprises a quick-test back-flush air port, the quick-test back-flush air port being configured to provide an airflow to purge the first side surface of the quick-test semipermeable membrane assembly in a standby state of the double-wipe sampling device, and the purge airflow is directed to the quick-test inlet; and / or The second physical layer includes a precision inspection back-blowing air port to provide an air flow to purge the first side surface of the precision inspection semi-permeable membrane assembly, and the purge air flow is directed to the precision inspection sample inlet. 13 . The dual-swab sampling device according to claim 11 , further comprising a support that accommodates the stacked first and second physical layers and the heating unit, wherein the heating unit is sandwiched between the first and second physical layers.

14. The double-wipe sampling device according to claim 12, wherein the double-wipe sampling device is configured to switch between a standby state and a sampling state, wherein in the standby state, when a sample is inserted into the quick-test injection port or the fine-test injection port, the sample is sensed by an injection sensor, and the double-wipe sampling device switches from the standby state to the sampling state.

15. An inspection device comprising: The double wipe sampling device according to any one of claims 1 to 14; and The ion mobility spectrometer is configured to communicate with the double-wipe sampling device and detect target substances in the gas provided by the double-wipe sampling device.

16. The inspection device according to claim 15 further includes a cluster capillary column, which is configured to be connected to the precision inspection gas outlet of the double-wipe sampling device and the ion mobility spectrometer, so as to pre-separate the gas including the target substance provided by the double-wipe sampling device, and provide the target substance to the ion mobility spectrometer for detection.

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