Device and method for automatically simulating power supply and ground short circuit

Abstract

The invention discloses a device and a method for automatically simulating power supply and ground short circuit, and relates to the field of power supply and ground short circuit testing. The test channels are in one-to-one correspondence with the circuits to be tested; each test channel comprises a first circuit, a second circuit and an output pin PORT1; wherein the second control module is used for accessing a second external signal CTR2P1; when the second external signal CTR2P1 is at a high level, the second control module controls a coil of a second relay TX1 to be electrified and a third normally open contact and a fourth normally open contact to be closed, and at the moment, the relay accesses a positive pole power supply or ground signal output by the output end of the second control unit and outputs the positive pole power supply or ground signal to a corresponding circuit to be tested through an output pin PORT1; power supply short circuit and ground short circuit simulation tests of a plurality of to-be-tested circuits can be processed at the same time, manual intervention and test cost are reduced, and test speed and accuracy are improved.

Description

Technical Field

[0001] The invention relates to the field of power supply and ground short circuit testing, and in particular to an automatic power supply and ground short circuit simulation device and method. Background Art

[0002] In the automotive electronics manufacturing industry, in order to ensure that the product can still function normally when encountering various fault phenomena in the actual vehicle environment, improving the reliability of the circuit has become a key link in the early development and testing of the product. However, in the actual testing process, due to the large number of circuits that need to be tested, the traditional manual method such as using a multimeter, oscilloscope or professional circuit acquisition equipment to collect and test a single circuit one by one is not only time-consuming and labor-intensive, but also inefficient, resulting in a huge increase in the demand for testing tools and equipment, high purchase costs, and a large amount of human and material resources. With the increasing diversification of the company's product functions and the increase in the number of project types, this traditional testing method has been unable to meet the needs of efficient and rapid product development and mass production testing. There is an urgent need to introduce automated testing equipment to optimize the testing process, improve testing efficiency, reduce costs, and ensure product reliability and availability. Summary of the invention

[0003] In order to implement power supply or ground short circuit test for multiple circuits at the same time through one device, the present invention proposes an automatic power supply and ground short circuit simulation device, which is used to implement power supply short circuit and ground short circuit simulation test for multiple circuits to be tested; the simulation device comprises: multiple test channels; the test channels correspond to the circuits to be tested one by one; each test channel comprises:

[0004] A first circuit, comprising a first control module and a first relay module;

[0005] The first control module includes a first control unit and a second control unit; the first relay module includes a coil of a first relay TX33, and a first normally closed contact, a second normally closed contact, a first normally open contact and a second normally open contact corresponding thereto;

[0006] The second circuit includes a second control module and a second relay module; the second relay module includes: a coil of a second relay TX1, and a third normally closed contact, a fourth normally closed contact, a third normally open contact and a fourth normally open contact corresponding thereto;

[0007] Output pin PORT1; where:

[0008] The first control unit is used to access the first external signal CTR3; when the first external signal CTR3 is at a high level, the first control unit controls the coil of the first relay TX33 to be energized, and the first normally open contact and the second normally open contact are closed. At this time, the relay is connected to the positive power supply and outputs through the output end of the second control unit; when the first external signal CTR3 is at a low level, the coil of the first relay TX33 is not energized, the first normally closed contact and the second normally closed contact remain closed, and at this time, the relay is connected to the ground signal and outputs through the output end of the second control unit;

[0009] The second control module is used to access the second external signal CTR2_P1; when the second external signal CTR2_P1 is at a high level, the second control module controls the coil of the second relay TX1 to be energized, and the third normally open contact and the fourth normally open contact are closed. At this time, the relay is connected to the positive power supply or ground signal output by the output end of the second control unit, and outputs to the corresponding circuit to be tested through the output pin PORT1.

[0010] Furthermore, each test channel also includes:

[0011] A self-checking circuit, comprising a third control module and a third relay module; the third relay module comprises a coil of a third relay TX2, and a fifth normally closed contact, a sixth normally closed contact, a fifth normally open contact and a sixth normally open contact corresponding thereto;

[0012] The third control module is used to access the third external signal CTR1_P1; when the third external signal CTR1_P1 is at a low level, the fifth normally closed contact and the sixth normally closed contact remain closed, and at this time, the output pin is connected to the load; when the third external signal CTR1_P1 is at a high level, the third control module controls the coil of the third relay TX2 to be energized, and the fifth normally open contact and the sixth normally open contact are closed, and at this time, the output pin is switched from being connected to the load to being connected to the self-test pin SIG1;

[0013] The SIG1 pin is used to feed back the signal output by the output pin to the main control module.

[0014] Furthermore, each test channel also includes: an indicator light control module;

[0015] The indicator light control module comprises:

[0016] The power short circuit function indication circuit is used to indicate that the corresponding test channel is currently in the power short circuit test state;

[0017] The short-circuit-to-ground function indication circuit is used to indicate that the corresponding test channel is currently in the short-circuit-to-ground test state;

[0018] The first indicator light control unit is used to receive the first external signal CTR3 and the second external signal CTR2_P1; and when the first external signal CTR3 and the second external signal CTR2_P1 are both at high levels, output a positive power supply to the power short circuit function indication circuit to light up the indicator light in the power short circuit function indication circuit;

[0019] The second indicator light control unit is used to connect the fourth external signal *CTR3 and the second external signal CTR2_P1; and when the fourth external signal *CTR3 and the second external signal CTR2_P1 are both at high levels, output a positive power supply to the short-circuit function indication circuit to light up the indicator light in the short-circuit function indication circuit to the ground; the fourth external signal *CTR3 is a level signal output by the first external signal CTR3 after passing through an inverter.

[0020] Furthermore, in the first circuit:

[0021] The first control module includes an eighth zero transistor U80, a third three voltage regulator diode ZD33, and a seventh nine inverter U79A; wherein:

[0022] The first pin GATE of the eighth zero transistor U80 is connected to the input end of the seventh ninth inverter U79A and then connected to the first external signal CTR3; the third pin SOURCE is grounded and connected to the positive end of the third third voltage regulator diode ZD33; the negative end of the third third voltage regulator diode ZD33 is sequentially connected to the fourth pin and the second pin of the eighth zero transistor U80 and then connected to one end of the coil of the first relay TX33; the output end of the seventh ninth inverter U79A is used to output the fourth external signal *CTR3 to the second indicator light control unit;

[0023] In the first relay module:

[0024] The other end of the coil of the first relay TX33 is connected to a +12V power supply; the normally open contact 4 and the normally open contact 5 of the first relay TX33 are connected to a positive power supply, the normally closed contact 2 and the normally closed contact 7 of the first relay TX33 are connected to a ground signal POWER_GND; the common contact 3 and the common contact 6 of the first relay TX33 are connected to a second control unit; in the first relay TX33:

[0025] The common contact 3 and the normally closed contact 2 form a first normally closed contact, and the common contact 6 and the normally closed contact 7 form a second normally closed contact;

[0026] The common contact 3 and the normally open contact 4 form a first normally open contact, and the common contact 6 and the normally open contact 5 form a second normally open contact.

[0027] Furthermore, in the second circuit:

[0028] The second control module includes: a second transistor U2 and a first voltage zener diode ZD1; the first pin GATE of the second transistor U2 is connected to the second external signal CTR2_P1, and the third pin SOURCE is grounded and connected to the positive terminal of the first voltage zener diode ZD1; the negative terminal of the first voltage zener diode ZD1 is connected to the fourth pin and the second pin of the second transistor U2 in sequence and then connected to one end of the coil of the second relay TX1;

[0029] In the second relay module:

[0030] The other end of the coil of the second relay TX1 is connected to a +12V power supply;

[0031] The normally open contact 4 and the normally open contact 5 of the second relay TX1 are connected to the output terminal SHOPT of the second control unit, and the common contact 3 and the common contact 6 of the second relay TX1 are connected to the output pin PORT1; in the second relay TX1:

[0032] Common contact 3 and normally closed contact 2 form a third normally closed contact, and common contact 6 and normally closed contact 7 form a fourth normally closed contact;

[0033] The common contact 3 and the normally open contact 4 form a third normally open contact, and the common contact 6 and the normally open contact 5 form a fourth normally open contact.

[0034] Furthermore, in the self-checking circuit:

[0035] The third control module includes: a third transistor U3 and a second voltage stabilizing diode ZD2; the first pin GATE of the third transistor U3 is connected to the third external signal CTR1_P1, the third pin SOURCE is grounded and connected to the positive terminal of the second voltage stabilizing diode ZD2; the negative terminal of the second voltage stabilizing diode ZD2 is connected to the fourth pin and the second pin of the third transistor U3 in sequence, and then connected to one end of the coil of the third relay TX2;

[0036] In the third relay module:

[0037] The other end of the coil of the third relay TX2 is connected to a +12V power supply;

[0038] The normally closed contact 2 and the normally closed contact 7 of the third relay TX2 are connected to the load, and the normally open contact 4 and the normally open contact 5 are both connected to one end of the fifth resistor R5; the other end of the fifth resistor R5 is connected to one end of the first resistor R1 and then connected to the main control module through the self-test pin SIG1; the other end of the first resistor R1 is grounded; the common contact 3 and the common contact 6 of the third relay TX2 are connected to the output pin PORT1; in the third relay TX2:

[0039] Common contact 3 and normally closed contact 2 form a fifth normally closed contact, and common contact 6 and normally closed contact 7 form a sixth normally closed contact;

[0040] The common contact 3 and the normally open contact 4 form a fifth normally open contact, and the common contact 6 and the normally open contact 5 form a sixth normally open contact.

[0041] Furthermore, in the indicator light control module:

[0042] The first indicator light control unit comprises: a NAND gate U11A and a thirteenth chip U13; the first input end of the NAND gate U11A is connected to the first external signal CTR3, the second input end is connected to the second external signal CTR2_P1, and the output end is connected to the input end IN of the thirteenth chip U13; the output end OUT of the thirteenth chip U13 is connected to the power short circuit function indication circuit, and the ground end GED is grounded;

[0043] The second indicator light control unit includes: a NAND gate U11B and a fourteenth chip U14; the first input end of the NAND gate U11B is connected to the fourth external signal *CTR3, the second input end is connected to the second external signal CTR2_P1, and the output end is connected to the input end IN of the fourteenth chip U14; the output end OUT of the fourteenth chip U14 is connected to the short-circuit function indication circuit to ground, and the ground end GED is grounded.

[0044] Furthermore, the simulation device also includes:

[0045] A main control module, a first single-chip microcomputer and a second single-chip microcomputer connected to the main control module;

[0046] The main control module is used to control the first single chip microcomputer to send a second external signal CTR2_P1 to the second control module in each test channel; and is also used to control the second single chip microcomputer to send a third external signal CTR1_P1 to the third control module in each test channel.

[0047] The present invention also proposes a method for simulating automatic short circuits between power supply and ground, comprising:

[0048] Automatic simulation of power short circuit:

[0049] The main control module sends a high-level first external signal CTR3 to the first control unit of the first circuit in each test channel;

[0050] After receiving the high-level first external signal CTR3, the first control unit controls the coil of the first relay TX33 to be energized, so that the first normally open contact and the second normally open contact of the first relay TX33 are closed; at this time, the first relay TX33 is connected to the positive power supply and outputs through the output end of the second control unit;

[0051] The main control module sends a high-level second external signal CTR2_P1 to the second control module in each test channel through the first single-chip microcomputer;

[0052] After receiving the high-level second external signal CTR2_P1, the second control module controls the coil of the second relay TX1 to be energized, so that the third normally open contact and the fourth normally open contact are closed; at this time, the second relay TX1 is connected to the positive power supply at the output end of the second control unit, and outputs the positive power supply to the corresponding circuit to be tested through the output pin PORT1;

[0053] Simulation of automatic short circuit to ground:

[0054] The main control module sends a low-level first external signal CTR3 to the first control unit of the first circuit in each test channel;

[0055] After the first control unit receives the low-level first external signal CTR3, the coil of the first relay TX33 is de-energized, and the first normally closed contact and the second normally closed contact of the first relay TX33 remain closed; at this time, the first relay TX33 receives the ground signal and outputs it through the output terminal of the second control unit;

[0056] The main control module sends a high-level second external signal CTR2_P1 to the second control module in each test channel through the first single-chip microcomputer;

[0057] After receiving the high-level second external signal CTR2_P1, the second control module controls the coil of the second relay TX1 to be energized, so that the third normally open contact and the fourth normally open contact are closed; at this time, the second relay TX1 is connected to the ground signal at the output end of the second control unit, and outputs the positive power supply to the corresponding circuit to be tested through the output pin PORT1.

[0058] Furthermore, the simulation method also includes level detection of the output pin:

[0059] When simulating an automatic short circuit to the power supply or an automatic short circuit to the ground, the main control module controls the second single-chip microcomputer to send a high-level third external signal CTR1_P1 to the third control module in each test channel. At this time, the coil of the third relay TX2 is energized, the fifth normally open contact and the sixth normally open contact of the third relay TX2 are closed, and the output pin is switched from being connected to the load to being connected to the self-test pin SIG1;

[0060] The main control module analyzes whether the corresponding output pin is outputting normally according to the level signal inputted by the SIG1 pin; when simulating the automatic short circuit of the power supply, when the level signal inputted by the SIG1 pin is the positive power supply, it indicates that the output is normal; when simulating the automatic short circuit to the ground, when the level signal inputted by the SIG1 pin is the ground signal, it indicates that the output is normal.

[0061] Compared with the prior art, the present invention has at least the following beneficial effects:

[0062] (1) The simulation device of the present invention comprises: a plurality of test channels; the test channels correspond to the circuits to be tested one by one; each test channel comprises a first circuit, a second circuit and an output pin PORT1; wherein: the second control module is used to access the second external signal CTR2_P1; when the second external signal CTR2_P1 is at a high level, the second control module controls the coil of the second relay TX1 to be energized, and the third normally open contact and the fourth normally open contact are closed. At this time, the relay accesses the positive power supply or ground signal output by the output end of the second control unit, and outputs to the corresponding circuit to be tested through the output pin PORT1; it can simultaneously process the power supply short circuit and ground short circuit simulation tests of multiple circuits to be tested, reducing manual intervention and testing costs, and improving testing speed and accuracy; this is not only applicable to the product development stage, but also to mass production testing, greatly shortening the time to market for new products;

[0063] (2) The present invention utilizes a combination of a main control module, a single-chip microcomputer, and a relay module to accurately control the state transition of each test channel (such as access to a positive power supply or a ground signal), thereby ensuring the consistency and repeatability of the test conditions and improving the reliability of the test results;

[0064] (3) The present invention introduces a self-checking circuit that can verify the status of the output pin without changing the external connection, thereby ensuring the normal operation of the device itself and facilitating troubleshooting;

[0065] (4) The present invention uses an indicator light control module to display the working status of each test channel in real time (power short circuit or ground short circuit), so that the operator can intuitively understand the current test process, increasing the transparency of operation and user experience;

[0066] (5) Compared with traditional manual testing methods, the equipment of the present application reduces the required human and material resource investment and reduces the procurement cost of professional testing instruments; in addition, since the testing process is more efficient and accurate, it indirectly reduces the risk of product rework or recall due to testing errors. BRIEF DESCRIPTION OF THE DRAWINGS

[0067] Figure 1 is a circuit diagram of a first circuit in an embodiment of the present invention;

[0068] Figure 2 is a circuit diagram of a second circuit and a self-test circuit in an embodiment of the present invention;

[0069] Figure 3 is a circuit diagram of a first indicator light control unit in an embodiment of the present invention;

[0070] Figure 4 is a circuit diagram of a second indicator light control unit in an embodiment of the present invention;

[0071] Figure 5 A circuit diagram of a power short circuit function indication circuit and a ground short circuit function indication circuit in an embodiment of the present invention;

[0072] Figure 6 is a circuit diagram of a power supply circuit in an embodiment of the present invention;

[0073] Figure 7 is a circuit diagram of a first single chip microcomputer in an embodiment of the present invention;

[0074] Figure 8 is a circuit diagram of a second single chip computer in an embodiment of the present invention;

[0075] Fig. 9 A circuit diagram of a working status indicator light of an analog device in an embodiment of the present invention;

[0076] Fig.10 4 is a circuit diagram of a main control module in an embodiment of the present invention. DETAILED DESCRIPTION

[0077] The following are specific embodiments of the present invention and the accompanying drawings to further describe the technical solution of the present invention, but the present invention is not limited to these embodiments.

[0078] In order to implement power supply or ground short circuit test on multiple circuits at the same time through one device, the present invention proposes an automatic power supply and ground short circuit simulation device, which is used to implement power supply short circuit and ground short circuit simulation test on multiple circuits to be tested; the simulation device comprises: multiple test channels; the test channels correspond to the circuits to be tested one by one;

[0079] Each test channel includes:

[0080] A first circuit, comprising a first control module and a first relay module;

[0081] The first control module includes a first control unit and a second control unit; the first relay module includes a coil of a first relay TX33, and a first normally closed contact, a second normally closed contact, a first normally open contact and a second normally open contact corresponding thereto;

[0082] like Figure 1As shown, in the first circuit:

[0083] The first control module includes an eighth zero transistor U80, a third three voltage regulator diode ZD33, and a seventh nine inverter U79A; wherein:

[0084] The first pin GATE of the eighth zero transistor U80 is connected to the input end of the seventh ninth inverter U79A and then connected to the first external signal CTR3; the third pin SOURCE is grounded and connected to the positive end of the third third voltage regulator diode ZD33; the negative end of the third third voltage regulator diode ZD33 is sequentially connected to the fourth pin and the second pin of the eighth zero transistor U80 and then connected to one end of the coil of the first relay TX33; the output end of the seventh ninth inverter U79A is used to output the fourth external signal *CTR3 to the second indicator light control unit;

[0085] In the first relay module:

[0086] The other end of the coil of the first relay TX33 is connected to a +12V power supply; the normally open contact 4 and the normally open contact 5 of the first relay TX33 are connected to a positive power supply, the normally closed contact 2 and the normally closed contact 7 of the first relay TX33 are connected to a ground signal POWER_GND; the common contact 3 and the common contact 6 of the first relay TX33 are connected to a second control unit; in the first relay TX33:

[0087] The common contact 3 and the normally closed contact 2 form a first normally closed contact, and the common contact 6 and the normally closed contact 7 form a second normally closed contact;

[0088] The common contact 3 and the normally open contact 4 form a first normally open contact, and the common contact 6 and the normally open contact 5 form a second normally open contact.

[0089] The second circuit includes a second control module and a second relay module; the second relay module includes: a coil of a second relay TX1, and a third normally closed contact, a fourth normally closed contact, a third normally open contact and a fourth normally open contact corresponding thereto;

[0090] like Figure 2 As shown, in the second circuit:

[0091] The second control module includes: a second transistor U2 and a first voltage zener diode ZD1; the first pin GATE of the second transistor U2 is connected to the second external signal CTR2_P1, and the third pin SOURCE is grounded and connected to the positive terminal of the first voltage zener diode ZD1; the negative terminal of the first voltage zener diode ZD1 is connected to the fourth pin and the second pin of the second transistor U2 in sequence and then connected to one end of the coil of the second relay TX1;

[0092] In the second relay module:

[0093] The other end of the coil of the second relay TX1 is connected to a +12V power supply;

[0094] The normally open contact 4 and the normally open contact 5 of the second relay TX1 are connected to the output terminal SHOPT of the second control unit, and the common contact 3 and the common contact 6 of the second relay TX1 are connected to the output pin PORT1; in the second relay TX1:

[0095] Common contact 3 and normally closed contact 2 form a third normally closed contact, and common contact 6 and normally closed contact 7 form a fourth normally closed contact;

[0096] The common contact 3 and the normally open contact 4 form a third normally open contact, and the common contact 6 and the normally open contact 5 form a fourth normally open contact.

[0097] The simulation device also includes:

[0098] like Fig.10 The main control module shown in the figure and the main control module connected to the Figure 7 The first microcontroller shown is Figure 8 The second microcontroller shown;

[0099] It should be noted that the simulation device of the present invention can simultaneously implement the testing of 64 circuits to be tested, that is, the simulation device of the present invention includes 64 test channels.

[0100] This embodiment of Figure 7 Two first single-chip microcomputers are included, wherein CTR2_P1 to CTR2_P16 are all second external signals, but the present invention is not limited to two first single-chip microcomputers, and the specific number of the first single-chip microcomputers is set based on the number of test channels.

[0101] This embodiment of Figure 8 Two second single-chip microcomputers are included, wherein CTR1_P1 to CTR1_P16 are all third external signals, but the present invention is not limited to two second single-chip microcomputers, and the specific number of the second single-chip microcomputers is set based on the number of test channels.

[0102] The main control module is used to control the first single chip microcomputer to send a second external signal CTR2_P1 to the second control module in each test channel; and is also used to control the second single chip microcomputer to send a third external signal CTR1_P1 to the third control module in each test channel.

[0103] Output pin PORT1; where:

[0104] The first control unit is used to access the first external signal CTR3; when the first external signal CTR3 is at a high level, the first control unit controls the coil of the first relay TX33 to be energized, and the first normally open contact and the second normally open contact are closed. At this time, the relay is connected to the positive power supply and outputs through the output end of the second control unit; when the first external signal CTR3 is at a low level, the coil of the first relay TX33 is not energized, the first normally closed contact and the second normally closed contact remain closed, and at this time, the relay is connected to the ground signal and outputs through the output end of the second control unit;

[0105] The second control module is used to access the second external signal CTR2_P1; when the second external signal CTR2_P1 is at a high level, the second control module controls the coil of the second relay TX1 to be energized, and the third normally open contact and the fourth normally open contact are closed. At this time, the relay is connected to the positive power supply or ground signal output by the output end of the second control unit, and outputs to the corresponding circuit to be tested through the output pin PORT1.

[0106] Each test channel also includes:

[0107] A self-checking circuit, comprising a third control module and a third relay module; the third relay module comprises a coil of a third relay TX2, and a fifth normally closed contact, a sixth normally closed contact, a fifth normally open contact and a sixth normally open contact corresponding thereto;

[0108] like Figure 2 As shown, in the self-test circuit:

[0109] The third control module includes: a third transistor U3 and a second voltage stabilizing diode ZD2; the first pin GATE of the third transistor U3 is connected to the third external signal CTR1_P1, the third pin SOURCE is grounded and connected to the positive terminal of the second voltage stabilizing diode ZD2; the negative terminal of the second voltage stabilizing diode ZD2 is connected to the fourth pin and the second pin of the third transistor U3 in sequence, and then connected to one end of the coil of the third relay TX2;

[0110] In the third relay module:

[0111] The other end of the coil of the third relay TX2 is connected to a +12V power supply;

[0112] The normally closed contact 2 and the normally closed contact 7 of the third relay TX2 are connected to the load, and the normally open contact 4 and the normally open contact 5 are both connected to one end of the fifth resistor R5; the other end of the fifth resistor R5 is connected to one end of the first resistor R1 and then connected to the main control module through the self-test pin SIG1; the other end of the first resistor R1 is grounded; the common contact 3 and the common contact 6 of the third relay TX2 are connected to the output pin PORT1; in the third relay TX2:

[0113] Common contact 3 and normally closed contact 2 form a fifth normally closed contact, and common contact 6 and normally closed contact 7 form a sixth normally closed contact;

[0114] The common contact 3 and the normally open contact 4 form a fifth normally open contact, and the common contact 6 and the normally open contact 5 form a sixth normally open contact.

[0115] The third control module is used to access the third external signal CTR1_P1; when the third external signal CTR1_P1 is at a low level, the fifth normally closed contact and the sixth normally closed contact remain closed, and at this time, the output pin is connected to the load; when the third external signal CTR1_P1 is at a high level, the third control module controls the coil of the third relay TX2 to be energized, and the fifth normally open contact and the sixth normally open contact are closed, and at this time, the output pin is switched from being connected to the load to being connected to the self-test pin SIG1;

[0116] The SIG1 pin is used to feed back the signal output by the output pin to the main control module.

[0117] The present invention introduces a self-checking circuit, which can verify the state of the output pin without changing the external connection, thereby ensuring the normal operation of the device itself and providing convenience for troubleshooting.

[0118] Short circuit to power supply and short circuit to ground, based on Figure 1 and Figure 2 As shown, in detail:

[0119] Short circuit to power supply, including:

[0120] 1. CTR3 signal is set to high level:

[0121] The main control module sends a high-level first external signal CTR3 to the first control unit of the first circuit;

[0122] After the GATE pin of the eighth zero transistor U80 in the first control unit receives the CTR3 high level signal, U80 is turned on.

[0123] U80 is turned on so that the coil of the first relay TX33 is energized, and the first normally open contact and the second normally open contact of the first relay TX33 are closed, so that SHORT and POWER are turned on, and POWER is connected to the +12V power supply.

[0124] 2. Set the CTR2_P1 signal to high level:

[0125] The main control module sends a high level second external signal CTR2_P1 to the second control module of the second circuit through the first single chip microcomputer.

[0126] After the GATE pin of the second transistor U2 in the second control module receives the CTR2_P1 high level signal, U2 is turned on.

[0127] U2 is turned on so that the coil of the second relay TX1 is energized, the third normally open contact and the fourth normally open contact are closed, and PORT1 and SHORT are turned on.

[0128] 3. CTR1_P1 signal is set to low level:

[0129] The main control module sends a low-level third external signal CTR1_P1 to the third control module of the self-test circuit through the second single-chip microcomputer.

[0130] After the GATE pin of the third transistor U3 in the third control module receives the CTR1_P1 low level signal, U3 is turned off.

[0131] U3 is not conducting, so the coil of the third relay TX2 is not energized, the fifth normally closed contact and the sixth normally closed contact remain closed, LOAD1 and PORT1 are conducting, and LOAD1 is +12V.

[0132] 4. Last for 1 minute:

[0133] During this period, LOAD1 remains at +12V.

[0134] 5. CTR2_P1 signal is set to low level:

[0135] The main control module sets CTR2_P1 to a low level through the first single-chip microcomputer, and the GATE pin of the second transistor U2 is no longer powered, so U2 is not turned on.

[0136] The second relay TX1 coil loses power, the third normally open contact and the fourth normally open contact are disconnected, PORT1 and SHORT are disconnected, and the power supply short-circuit test is completed.

[0137] Short circuit to ground, including:

[0138] 1. CTR3 signal is set to low level:

[0139] The main control module sends a low-level first external signal CTR3 to the first control unit of the first circuit.

[0140] After the GATE pin of the eighth zero transistor U80 in the first control unit receives the CTR3 low level signal, U80 is turned off.

[0141] U80 is not conducting, so the coil of the first relay TX33 is not energized, the first normally closed contact and the second normally closed contact remain closed, SHORT and POWER_GND are conducting, and POWER_GND is grounded.

[0142] 2. Set the CTR2_P1 signal to high level:

[0143] The main control module sends a high level second external signal CTR2_P1 to the second control module of the second circuit through the first single chip microcomputer.

[0144] After the GATE pin of the second transistor U2 in the second control module receives the CTR2_P1 high level signal, U2 is turned on.

[0145] U2 is turned on so that the coil of the second relay TX1 is energized, the third normally open contact and the fourth normally open contact are closed, and PORT1 and SHORT are turned on.

[0146] 3. CTR1_P1 signal is set to low level:

[0147] The main control module sends a low-level third external signal CTR1_P1 to the third control module of the self-test circuit through the second single-chip microcomputer.

[0148] After the GATE pin of the third transistor U3 in the third control module receives the CTR1_P1 low level signal, U3 is turned off.

[0149] U3 is not conducting, so that the coil of the third relay TX2 is not energized, the fifth normally closed contact and the sixth normally closed contact remain closed, LOAD1 and PORT1 are conducting, and LOAD1 is POWER_GND 0V.

[0150] 4. Last for 1 minute:

[0151] During this time, LOAD1 remains at POWER_GND 0V.

[0152] 5. CTR2_P1 signal is set to low level:

[0153] The main control module sets CTR2_P1 to a low level through the first single-chip microcomputer, and the GATE pin of the second transistor U2 is no longer powered, so U2 is not turned on.

[0154] The second relay TX1 coil loses power, the third normally open contact and the fourth normally open contact are disconnected, PORT1 and SHORT are disconnected, and the short-circuit experiment to ground is completed.

[0155] Each test channel also includes: an indicator light control module;

[0156] The indicator light control module includes: Figure 5 The power supply short circuit function indication circuit and the ground short circuit function indication circuit shown;

[0157] Figure 516 groups of indication circuits are shown, each group of indication circuits corresponds to one test channel; the indication circuits include a power short circuit function indication circuit and a ground short circuit function indication circuit; it should be noted that, Figure 5 Although 16 groups of indicator circuits are shown, the present invention is not limited to the 16 groups of indicator circuits, and the specific number of groups of indicator circuits is set based on the number of test channels.

[0158] in:

[0159] The power short circuit function indicator circuit, when it is on, indicates that the corresponding test channel is currently in the power short circuit test state;

[0160] The short-circuit to ground function indicator circuit, when it is on, indicates that the corresponding test channel is currently in the short-circuit to ground test state;

[0161] In the indicator light control module:

[0162] like Figure 3 As shown, the first indicator light control unit includes: a NAND gate U11A and a thirteenth chip U13; the first input end of the NAND gate U11A is connected to the first external signal CTR3, the second input end is connected to the second external signal CTR2_P1, and the output end is connected to the input end IN of the thirteenth chip U13; the output end OUT of the thirteenth chip U13 is connected to the power short circuit function indication circuit, and the ground end GED is grounded;

[0163] like Figure 4 As shown, the second indicator light control unit includes: a NAND gate U11B and a fourteenth chip U14; the first input end of the NAND gate U11B is connected to the fourth external signal *CTR3, the second input end is connected to the second external signal CTR2_P1, and the output end is connected to the input end IN of the fourteenth chip U14; the output end OUT of the fourteenth chip U14 is connected to the short-circuit function indication circuit to ground, and the ground end GED is grounded.

[0164] The first indicator light control unit is used to receive the first external signal CTR3 and the second external signal CTR2_P1; and when the first external signal CTR3 and the second external signal CTR2_P1 are both at high levels, output a positive power supply to the power short circuit function indication circuit to light up the indicator light in the power short circuit function indication circuit;

[0165] The second indicator light control unit is used to connect the fourth external signal *CTR3 and the second external signal CTR2_P1; and when the fourth external signal *CTR3 and the second external signal CTR2_P1 are both at high levels, output a positive power supply to the short-circuit function indication circuit to light up the indicator light in the short-circuit function indication circuit to the ground; the fourth external signal *CTR3 is a level signal output by the first external signal CTR3 after passing through an inverter.

[0166] The simulation device in this embodiment also includes:

[0167] like Figure 6 The power supply circuit shown is used to provide a positive power supply (+12V power supply) to the analog device and to provide a 5V power supply to the main control module, the first single-chip microcomputer and the second single-chip microcomputer.

[0168] like Fig. 9 The working status indicator light circuit diagram of the analog device shown is used to display the working status of the analog device through the indicator light.

[0169] The simulation device in the present invention includes: multiple test channels; the test channels correspond to the circuits to be tested one by one; each test channel includes a first circuit, a second circuit and an output pin PORT1; wherein: the second control module is used to access the second external signal CTR2_P1; when the second external signal CTR2_P1 is at a high level, the second control module controls the coil of the second relay TX1 to be energized, and the third normally open contact and the fourth normally open contact are closed. At this time, the relay is connected to the positive power supply or ground signal output by the output end of the second control unit, and outputs it to the corresponding circuit to be tested through the output pin PORT1; it can simultaneously process power supply short circuit and ground short circuit simulation tests of multiple circuits to be tested, reducing manual intervention and testing costs, and improving test speed and accuracy; this is not only applicable to the product development stage, but also to mass production testing, greatly shortening the time to market for new products.

[0170] The embodiment of the present invention further provides a method for simulating automatic short circuit between power supply and ground, comprising:

[0171] Automatic simulation of power short circuit:

[0172] The main control module sends a high-level first external signal CTR3 to the first control unit of the first circuit in each test channel;

[0173] After receiving the high-level first external signal CTR3, the first control unit controls the coil of the first relay TX33 to be energized, so that the first normally open contact and the second normally open contact of the first relay TX33 are closed; at this time, the first relay TX33 is connected to the positive power supply and outputs through the output end of the second control unit;

[0174] The main control module sends a high-level second external signal CTR2_P1 to the second control module in each test channel through the first single-chip microcomputer;

[0175] After receiving the high-level second external signal CTR2_P1, the second control module controls the coil of the second relay TX1 to be energized, so that the third normally open contact and the fourth normally open contact are closed; at this time, the second relay TX1 is connected to the positive power supply at the output end of the second control unit, and outputs the positive power supply to the corresponding circuit to be tested through the output pin PORT1;

[0176] Simulation of automatic short circuit to ground:

[0177] The main control module sends a low-level first external signal CTR3 to the first control unit of the first circuit in each test channel;

[0178] After the first control unit receives the low-level first external signal CTR3, the coil of the first relay TX33 is de-energized, and the first normally closed contact and the second normally closed contact of the first relay TX33 remain closed; at this time, the first relay TX33 receives the ground signal and outputs it through the output terminal of the second control unit;

[0179] The main control module sends a high-level second external signal CTR2_P1 to the second control module in each test channel through the first single-chip microcomputer;

[0180] After receiving the high-level second external signal CTR2_P1, the second control module controls the coil of the second relay TX1 to be energized, so that the third normally open contact and the fourth normally open contact are closed; at this time, the second relay TX1 is connected to the ground signal at the output end of the second control unit, and outputs the positive power supply to the corresponding circuit to be tested through the output pin PORT1.

[0181] The simulation method also includes level detection of the output pin:

[0182] When simulating an automatic short circuit to the power supply or an automatic short circuit to the ground, the main control module controls the second single-chip microcomputer to send a high-level third external signal CTR1_P1 to the third control module in each test channel. At this time, the coil of the third relay TX2 is energized, the fifth normally open contact and the sixth normally open contact of the third relay TX2 are closed, and the output pin is switched from being connected to the load to being connected to the self-test pin SIG1;

[0183] The main control module analyzes whether the corresponding output pin is outputting normally according to the level signal inputted by the SIG1 pin; when simulating the automatic short circuit of the power supply, when the level signal inputted by the SIG1 pin is the positive power supply, it indicates that the output is normal; when simulating the automatic short circuit to the ground, when the level signal inputted by the SIG1 pin is the ground signal, it indicates that the output is normal.

[0184] It should be noted that all directional indications in the embodiments of the present invention (such as up, down, left, right, front, back, etc.) are only used to explain the relative position relationship, movement status, etc. between the components under a certain specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indication will also change accordingly.

[0185] In addition, in the present invention, descriptions such as "first", "second", "one", etc. are only used for descriptive purposes and cannot be understood as indicating or implying their relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" or "second" may explicitly or implicitly include at least one of the features. In the description of the present invention, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0186] In the present invention, unless otherwise clearly specified and limited, the terms "connection", "fixation", etc. should be understood in a broad sense. For example, "fixation" can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0187] In addition, the technical solutions between the various embodiments of the present invention can be combined with each other, but it must be based on the fact that ordinary technicians in the field can implement it. When the combination of technical solutions is contradictory or cannot be implemented, it should be deemed that such combination of technical solutions does not exist and is not within the scope of protection required by the present invention.

Claims

1. A simulation device for automatically short-circuiting power supply and ground, characterized in that: Used to simulate power supply short circuit and ground short circuit tests on multiple circuits to be tested; The simulation device comprises: a plurality of test channels; the test channels correspond to the circuits to be tested one by one; each test channel comprises: A first circuit, comprising a first control module and a first relay module; The first control module includes a first control unit and a second control unit; the first relay module includes a coil of a first relay TX33, and a first normally closed contact, a second normally closed contact, a first normally open contact and a second normally open contact corresponding thereto; The second circuit includes a second control module and a second relay module; the second relay module includes: a coil of a second relay TX1, and a third normally closed contact, a fourth normally closed contact, a third normally open contact and a fourth normally open contact corresponding thereto; Output pin PORT1; where: The first control unit is used to access the first external signal CTR3; when the first external signal CTR3 is at a high level, the first control unit controls the coil of the first relay TX33 to be energized, and the first normally open contact and the second normally open contact are closed. At this time, the relay is connected to the positive power supply and outputs through the output end of the second control unit; when the first external signal CTR3 is at a low level, the coil of the first relay TX33 is not energized, the first normally closed contact and the second normally closed contact remain closed, and at this time, the relay is connected to the ground signal and outputs through the output end of the second control unit; The second control module is used to access the second external signal CTR2_P1; when the second external signal CTR2_P1 is at a high level, the second control module controls the coil of the second relay TX1 to be energized, and the third normally open contact and the fourth normally open contact are closed. At this time, the relay is connected to the positive power supply or ground signal output by the output end of the second control unit, and outputs to the corresponding circuit to be tested through the output pin PORT1.

2. A simulation device for automatically short-circuiting power supply and ground according to claim 1, characterized in that: Each test channel also includes: A self-checking circuit, comprising a third control module and a third relay module; the third relay module comprises a coil of a third relay TX2, and a fifth normally closed contact, a sixth normally closed contact, a fifth normally open contact and a sixth normally open contact corresponding thereto; The third control module is used to access the third external signal CTR1_P1; when the third external signal CTR1_P1 is at a low level, the fifth normally closed contact and the sixth normally closed contact remain closed, and at this time, the output pin is connected to the load; when the third external signal CTR1_P1 is at a high level, the third control module controls the coil of the third relay TX2 to be energized, and the fifth normally open contact and the sixth normally open contact are closed, and at this time, the output pin is switched from being connected to the load to being connected to the self-test pin SIG1; The SIG1 pin is used to feed back the signal output by the output pin to the main control module.

3. A simulation device for automatically short-circuiting power supply and ground according to claim 2, characterized in that: Each test channel also includes an indicator light control module; The indicator light control module comprises: The power short circuit function indication circuit is used to indicate that the corresponding test channel is currently in the power short circuit test state; The short-circuit to ground function indication circuit is used to indicate that the corresponding test channel is currently in the short-circuit to ground test state; The first indicator light control unit is used to receive the first external signal CTR3 and the second external signal CTR2_P1; and when the first external signal CTR3 and the second external signal CTR2_P1 are both at high levels, output a positive power supply to the power short circuit function indication circuit to light up the indicator light in the power short circuit function indication circuit; The second indicator light control unit is used to connect the fourth external signal *CTR3 and the second external signal CTR2_P1; and when the fourth external signal *CTR3 and the second external signal CTR2_P1 are both at high levels, output a positive power supply to the short-circuit function indication circuit to light up the indicator light in the short-circuit function indication circuit to the ground; the fourth external signal *CTR3 is a level signal output by the first external signal CTR3 after passing through an inverter.

4. The device for simulating automatic short circuit between power supply and ground according to claim 3, characterized in that: In the first circuit: The first control module includes an eighth zero transistor U80, a third three voltage regulator diode ZD33, and a seventh nine inverter U79A; wherein: The first pin GATE of the eighth zero transistor U80 is connected to the input end of the seventh ninth inverter U79A and then connected to the first external signal CTR3; the third pin SOURCE is grounded and connected to the positive end of the third third voltage regulator diode ZD33; the negative end of the third third voltage regulator diode ZD33 is sequentially connected to the fourth pin and the second pin of the eighth zero transistor U80 and then connected to one end of the coil of the first relay TX33; the output end of the seventh ninth inverter U79A is used to output the fourth external signal *CTR3 to the second indicator light control unit; In the first relay module: The other end of the coil of the first relay TX33 is connected to a +12V power supply; the normally open contact 4 and the normally open contact 5 of the first relay TX33 are connected to a positive power supply, the normally closed contact 2 and the normally closed contact 7 of the first relay TX33 are connected to a ground signal POWER_GND; the common contact 3 and the common contact 6 of the first relay TX33 are connected to a second control unit; in the first relay TX33: The common contact 3 and the normally closed contact 2 form a first normally closed contact, and the common contact 6 and the normally closed contact 7 form a second normally closed contact; The common contact 3 and the normally open contact 4 form a first normally open contact, and the common contact 6 and the normally open contact 5 form a second normally open contact.

5. A simulation device for automatically short-circuiting power supply and ground according to claim 4, characterized in that: In the second circuit: The second control module includes: a second transistor U2 and a first voltage zener diode ZD1; the first pin GATE of the second transistor U2 is connected to the second external signal CTR2_P1, and the third pin SOURCE is grounded and connected to the positive terminal of the first voltage zener diode ZD1; the negative terminal of the first voltage zener diode ZD1 is connected to the fourth pin and the second pin of the second transistor U2 in sequence and then connected to one end of the coil of the second relay TX1; In the second relay module: The other end of the coil of the second relay TX1 is connected to a +12V power supply; The normally open contact 4 and the normally open contact 5 of the second relay TX1 are connected to the output terminal SHOPT of the second control unit, and the common contact 3 and the common contact 6 of the second relay TX1 are connected to the output pin PORT1; in the second relay TX1: Common contact 3 and normally closed contact 2 form a third normally closed contact, and common contact 6 and normally closed contact 7 form a fourth normally closed contact; The common contact 3 and the normally open contact 4 form a third normally open contact, and the common contact 6 and the normally open contact 5 form a fourth normally open contact.

6. A simulation device for automatically short-circuiting power supply and ground according to claim 5, characterized in that: In the self-test circuit: The third control module includes: a third transistor U3 and a second voltage stabilizing diode ZD2; the first pin GATE of the third transistor U3 is connected to the third external signal CTR1_P1, the third pin SOURCE is grounded and connected to the positive terminal of the second voltage stabilizing diode ZD2; the negative terminal of the second voltage stabilizing diode ZD2 is connected to the fourth pin and the second pin of the third transistor U3 in sequence, and then connected to one end of the coil of the third relay TX2; In the third relay module: The other end of the coil of the third relay TX2 is connected to a +12V power supply; The normally closed contact 2 and the normally closed contact 7 of the third relay TX2 are connected to the load, and the normally open contact 4 and the normally open contact 5 are both connected to one end of the fifth resistor R5; the other end of the fifth resistor R5 is connected to one end of the first resistor R1 and then connected to the main control module through the self-test pin SIG1; the other end of the first resistor R1 is grounded; the common contact 3 and the common contact 6 of the third relay TX2 are connected to the output pin PORT1; in the third relay TX2: Common contact 3 and normally closed contact 2 form a fifth normally closed contact, and common contact 6 and normally closed contact 7 form a sixth normally closed contact; The common contact 3 and the normally open contact 4 form a fifth normally open contact, and the common contact 6 and the normally open contact 5 form a sixth normally open contact.

7. A simulation device for automatically short-circuiting power supply and ground according to claim 6, characterized in that: In the indicator light control module: The first indicator light control unit comprises: a NAND gate U11A and a thirteenth chip U13; the first input end of the NAND gate U11A is connected to the first external signal CTR3, the second input end is connected to the second external signal CTR2_P1, and the output end is connected to the input end IN of the thirteenth chip U13; the output end OUT of the thirteenth chip U13 is connected to the power short circuit function indication circuit, and the ground end GED is grounded; The second indicator light control unit includes: a NAND gate U11B and a fourteenth chip U14; the first input end of the NAND gate U11B is connected to the fourth external signal *CTR3, the second input end is connected to the second external signal CTR2_P1, and the output end is connected to the input end IN of the fourteenth chip U14; the output end OUT of the fourteenth chip U14 is connected to the short-circuit function indication circuit to ground, and the ground end GED is grounded.

8. The automatic short-circuit simulation device for power supply and ground according to claim 6, characterized in that: The simulation device also includes: A main control module, a first single-chip microcomputer and a second single-chip microcomputer connected to the main control module; The main control module is used to control the first single chip microcomputer to send a second external signal CTR2_P1 to the second control module in each test channel; and is also used to control the second single chip microcomputer to send a third external signal CTR1_P1 to the third control module in each test channel.

9. A method for simulating automatic short circuits to power supply and ground, characterized in that: include: Automatic simulation of power short circuit: The main control module sends a high-level first external signal CTR3 to the first control unit of the first circuit in each test channel; After receiving the high-level first external signal CTR3, the first control unit controls the coil of the first relay TX33 to be energized, so that the first normally open contact and the second normally open contact of the first relay TX33 are closed; at this time, the first relay TX33 is connected to the positive power supply and outputs through the output end of the second control unit; The main control module sends a high-level second external signal CTR2_P1 to the second control module in each test channel through the first single-chip microcomputer; After receiving the high-level second external signal CTR2_P1, the second control module controls the coil of the second relay TX1 to be energized, so that the third normally open contact and the fourth normally open contact are closed; at this time, the second relay TX1 is connected to the positive power supply at the output end of the second control unit, and outputs the positive power supply to the corresponding circuit to be tested through the output pin PORT1; Simulation of automatic short circuit to ground: The main control module sends a low-level first external signal CTR3 to the first control unit of the first circuit in each test channel; After the first control unit receives the low-level first external signal CTR3, the coil of the first relay TX33 is de-energized, and the first normally closed contact and the second normally closed contact of the first relay TX33 remain closed; at this time, the first relay TX33 receives the ground signal and outputs it through the output terminal of the second control unit; The main control module sends a high-level second external signal CTR2_P1 to the second control module in each test channel through the first single-chip microcomputer; After receiving the high-level second external signal CTR2_P1, the second control module controls the coil of the second relay TX1 to be energized, so that the third normally open contact and the fourth normally open contact are closed; at this time, the second relay TX1 is connected to the ground signal at the output end of the second control unit, and outputs the positive power supply to the corresponding circuit to be tested through the output pin PORT1.

10. A method for simulating automatic short circuits to power supply and ground according to claim 9, characterized in that: The simulation method also includes level detection of the output pin: When simulating an automatic short circuit to the power supply or an automatic short circuit to the ground, the main control module controls the second single-chip microcomputer to send a high-level third external signal CTR1_P1 to the third control module in each test channel. At this time, the coil of the third relay TX2 is energized, the fifth normally open contact and the sixth normally open contact of the third relay TX2 are closed, and the output pin is switched from being connected to the load to being connected to the self-test pin SIG1; The main control module analyzes whether the corresponding output pin is outputting normally according to the level signal inputted by the SIG1 pin; when simulating the automatic short circuit of the power supply, when the level signal inputted by the SIG1 pin is the positive power supply, it indicates that the output is normal; when simulating the automatic short circuit to the ground, when the level signal inputted by the SIG1 pin is the ground signal, it indicates that the output is normal.

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