Signal test case generation method and device, equipment and storage medium

Abstract

The invention relates to the technical field of board card testing, and particularly discloses a signal test case generation method and device, equipment and a storage medium, a board card design file of a target board card is identified by adopting an automatic identification mode to obtain a board card design file, element position information, element connection information and signal flow direction information between elements, and the signal test case generation method and device are used for generating a signal test case. According to the method and the device, the test point position and the test setting parameter are determined, the signal test case of the target board card is generated according to the test point position and the test setting parameter, a scheme capable of automatically generating the signal test case is realized, and a test engineer does not need to manually input test configuration information and manually write the test case; therefore, inconsistency of test standards caused by different writing personnel is avoided, human errors are avoided, and an efficient and low-error-rate signal test case generation scheme is realized.

Description

Technical Field

[0001] The present invention relates to the technical field of board testing, and in particular to a method, device, equipment and storage medium for generating a signal test case. Background Art

[0002] In the testing of intelligent devices such as servers, signal testing is a very important testing task. In order to ensure that the equipment can operate stably for a long time after leaving the factory, sufficiently detailed and comprehensive signal testing must be performed. Before performing signal testing, test engineers will write test cases in detail to achieve a systematic and standardized testing process, which can be used to timely discover potential design defects and signal integrity issues, and can also provide valuable data support for subsequent optimization and debugging.

[0003] As equipment functions become more diverse and instrument accuracy increases, the scale of signal test cases that need to be written is also gradually increasing. As a result, the current reliance on manual writing of signal test cases has resulted in time-consuming and inefficient writing. This not only consumes a lot of human resources and is prone to errors, but may also affect the reliability and accuracy of test results due to inconsistent test standards among different test engineers.

[0004] How to improve the efficiency of writing signal test cases is a technical problem that technical personnel in this field need to solve. Summary of the invention

[0005] The purpose of the present invention is to provide a signal test case generation method, device, equipment and storage medium, which are used to improve the writing efficiency of signal test cases.

[0006] In order to solve the above technical problems, the present invention provides a signal test case generation method, comprising: Get the board design file of the target board; Identify the board design file to obtain task parameters; the task parameters at least include component location information, component connection information and signal flow information between components; Determine test point locations and test setting parameters according to the task parameters; A signal test case for the target board is generated according to the test point location and the test setting parameters.

[0007] On the one hand, the board design file is identified to obtain task parameters, including: Identify the netlist file in the board design file to obtain the names of the components, the connection relationship between the components and the signal flow information; Obtaining the component position information of the component from the printed circuit board drawing file in the board design file according to the name of the component; According to the connection relationship between the components, the wiring position information between the components is obtained from the printed circuit board drawing file, and the wiring position information is used as the component connection information.

[0008] On the other hand, determining the test point position according to the task parameter includes: Determine the signal to be tested of the target board; According to the component position information, the component connection information and the signal flow direction information, a signal test point and a reference location are determined for each of the signals to be tested, and the positions of the signal test points and the reference locations are used as the test point positions of the signals to be tested.

[0009] On the other hand, determining the signal test point for the signal to be tested includes: The signal test point is selected for the signal to be tested according to the priority order of signal series resistance, pull-up and pull-down resistors, capacitors, integrated circuit pins, and connector pins.

[0010] On the other hand, determining the reference location for the signal to be tested includes: Selecting the reference location within a first radius with the location of the signal test point as the center; The lower limit of the first radius range is determined according to the minimum distance between two probes of the oscilloscope, and the upper limit of the first radius range is determined according to the length of the ground line of the target board.

[0011] On the other hand, determining the test setting parameters according to the task parameters includes: Determine the signal to be tested of the target board; Determining the voltage grid width of the oscilloscope according to the signal level of the signal to be tested; According to the type of the signal to be tested, the display interface setting parameters of the oscilloscope and the signal trigger control parameters of the oscilloscope are determined.

[0012] On the other hand, the board design file is identified to obtain task parameters, including: Inputting the recognition task prompt and the board design file into the pre-trained model, and outputting the task parameters; According to the task parameters, determine the test point location and test setting parameters, including: Generate a matching task prompt according to the task parameters and information in the first database, and input the matching task prompt into the pre-trained model so that the pre-trained model outputs the test point location and the test setting parameters according to a first reference historical signal test case in the first database; The signal test case generation method also includes: Generate a correction task prompt according to the test point position, the test setting parameters and the information of the second database, and input the correction task prompt into the pre-trained model so that the pre-trained model outputs the corrected test point position and the corrected test setting parameters according to the second reference historical signal test case in the second database; Generating a signal test case of the target board according to the test point position and the test setting parameters includes: The signal test case is generated according to the corrected test point position and the corrected test setting parameters.

[0013] In order to solve the above technical problems, the present invention also provides a signal test case generating device, comprising: An acquisition unit, used for acquiring a board design file of a target board; An identification unit, used to identify the board design file and obtain task parameters; the task parameters at least include component position information, component connection information and signal flow information between components; A determination unit, used to determine the test point location and test setting parameters according to the task parameters; A generating unit is used to generate a signal test case of the target board according to the test point position and the test setting parameters.

[0014] In order to solve the above technical problems, the present invention also provides a signal test case generating device, comprising: Memory for storing computer programs; A processor is used to execute the computer program, and when the computer program is executed by the processor, the steps of the signal test case generation method as described in any one of the above items are implemented.

[0015] In order to solve the above technical problems, the present invention also provides a non-volatile storage medium on which a computer program is stored. When the computer program is executed by a processor, the steps of the signal test case generation method as described in any one of the above items are implemented.

[0016] The signal test case generation method provided by the present invention has the beneficial effect of obtaining the board design file from the board design file of the target board by adopting an automatic identification method, obtaining component position information, component connection information, signal flow direction information between components, etc., so as to determine the test point position and test setting parameters, and generating the signal test case of the target board according to the test point position and the test setting parameters, realizing a solution that can automatically generate signal test cases without the need for test engineers to manually input test configuration information and manually write test cases, so that there will be no inconsistency in test standards due to different writers, and no human errors will occur, thereby realizing an efficient and low-error signal test case generation solution.

[0017] The signal test case generating device, equipment and non-volatile storage medium provided by the present invention have the above-mentioned beneficial effects, which will not be described in detail here. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the embodiments of the present invention or the technical solutions of the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0019] Figure 1 A flow chart of a signal test case generation method provided by an embodiment of the present invention; Figure 2 A schematic diagram of the positional relationship between a reference location and a signal test point provided in an embodiment of the present invention; Figure 3 A schematic diagram of the structure of a signal test case generating device provided in an embodiment of the present invention. DETAILED DESCRIPTION

[0020] The core of the present invention is to provide a signal test case generation method, device, equipment and storage medium, which are used to improve the writing efficiency of signal test cases.

[0021] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0022] To facilitate understanding of the technical solution provided by the embodiment of the present invention, some key terms used in the embodiment of the present invention are first explained here.

[0023] Printed Circuit Board (PCB) is used to carry various electronic components, so as to realize circuit functions in combination. The design of printed circuit boards is mainly divided into three stages: schematic design, component layout, and wiring. In the embodiment of the present invention, the "target board" may refer to a printed circuit board that has been laid out with components and wired.

[0024] A netlist is generated based on the schematic diagram of a printed circuit board designed by an engineer. The connection information of all components in the circuit can be determined based on the netlist to ensure that the electrical connection of the circuit is correctly implemented on the printed circuit board.

[0025] Layout refers to the physical placement of circuit components during the design process of a printed circuit board.

[0026] Routing refers to determining the actual routing on the printed circuit board based on the connection relationships between components recorded in the netlist after the component layout is determined. The routing path may include but is not limited to on-board routing, vias, pins, etc.

[0027] In devices such as servers, printed circuit boards are one of the carriers of various signals. Before conducting signal testing, test engineers will write signal test cases in detail. These signal test cases need to cover all signals to be tested, test points, signal types, test conditions, and oscilloscope settings. Specifically, the signal test case will list the name and location of each signal to be tested in detail, clearly indicate the type of signal (such as differential signal, single-ended signal, etc.), and define the test conditions, including but not limited to parameters such as signal frequency, amplitude, rise time and fall time. In addition, the oscilloscope settings, such as sampling rate, trigger mode, probe type and attenuation ratio, will also be specified to ensure the accuracy and consistency of the test results. Through this systematic and standardized testing process, not only can potential design defects and signal integrity issues be discovered in a timely manner, but also valuable data support can be provided for subsequent optimization and debugging.

[0028] At present, signal test cases rely on manual writing by test engineers. Even if some current writing tools can be used, they cannot completely get rid of manual labor. Test engineers need to manually enter the detailed information of each signal, including signal name, location, type, test conditions, etc., which greatly reduces work efficiency, increases the time cost of the project, and is prone to human errors. At the same time, even for the same signal test items, the test tasks on different boards are often completed independently by different test engineers, which leads to a lot of duplication of work. The same signal test case needs to be written multiple times and cannot be effectively reused. This inefficient working method not only wastes human resources, but may also lead to inconsistent test standards between different test engineers, thereby affecting the reliability and accuracy of the test results.

[0029] To solve the above problems, the signal test case generation scheme provided by the embodiment of the present invention obtains the board design file from the board design file of the target board by adopting an automatic identification method, obtains component position information, component connection information and signal flow information between components, so as to determine the test point position and test setting parameters, and generates the signal test case of the target board according to the test point position and the test setting parameters, thereby realizing a scheme that can automatically generate signal test cases without the need for test engineers to manually input test configuration information and manually write test cases, so that the test standards will not be inconsistent due to different writers, and human errors will not occur, thereby realizing an efficient and low-error signal test case generation scheme.

[0030] The signal test case generation method provided by the embodiment of the present invention is described below with reference to the accompanying drawings.

[0031] Figure 1 A flowchart of a signal test case generation method provided by an embodiment of the present invention.

[0032] like Figure 1 As shown, the signal test case generation method provided by the embodiment of the present invention includes: S101: Obtain the board design file of the target board; S102: Identify the board design file and obtain task parameters; the task parameters at least include component location information, component connection information, and signal flow information between components; S103: Determine the test point location and test setting parameters according to the task parameters; S104: Generate a signal test case of the target board according to the test point location and the test setting parameters.

[0033] In a specific implementation, the signal test case generation method provided in the embodiment of the present invention can be implemented by developing human-computer interaction software, that is, in the signal test case generation method provided in the embodiment of the present invention, data processing can be implemented by a computer program, and the data processing process can include data preprocessing, signal classification, adding signal flow direction, test point selection, test condition setting, etc. The signal test case generation method provided in the embodiment of the present invention can be applied to the generation of signal test cases for servers, and can also be applied to other equipment products.

[0034] The signal test case generation method provided in the embodiment of the present invention uses a machine to identify the board design file of the target board, extract the information of the signal to be tested, and use a pre-prepared database for the machine to determine the test point location and test setting parameters according to the information of the signal to be tested (including at least component location information, component connection information and signal flow direction information), thereby quickly generating a signal test case.

[0035] For S101, the human-computer interaction software provided in the embodiment of the present invention may provide a file import interface for the user to import the board design file of the target board or input the storage location of the board design file, thereby obtaining the board design file of the target board.

[0036] For S102, task parameters such as component location information, component connection information, and signal flow information between components can be identified from the board design file by methods including but not limited to keyword recognition and image recognition. Among them, component location information refers to the location information of components installed on the target board. Component connection information can refer to the connection relationship, routing information, etc. between components installed on the target board. Signal flow information refers to the signal flow on the connection path between components. According to the test requirements, the types of task parameters may not be limited to component location information, component connection information, and signal flow information.

[0037] Board design files usually include schematics (netlists), printed circuit board output files (board filegerbers), etc. These design files contain different information related to board design. In some optional implementations of the embodiments of the present invention, identifying the board design file in S102 and obtaining task parameters may include: identifying the netlist file in the board design file to obtain the name of the component, the connection relationship between the components and the signal flow information; according to the name of the component, obtaining the component position information of the component from the printed circuit board output file in the board design file; according to the connection relationship between the components, obtaining the routing position information between the components from the printed circuit board output file, and using the routing position information as the component connection information.

[0038] That is to say, by importing the netlist file and the printed circuit board drawing file into the human-computer interaction software provided by the embodiment of the present invention, the task parameters required for generating signal test cases can be identified from these board design files. Among them, the netlist contains the names of all the wire nets on the target board, the names of the components, and the connection relationships between the components, which is the core of the hardware principle design. The printed circuit board drawing file is the drawing file of the printed circuit board, which contains the stacking, vias, layout design, wiring design and other information of the printed circuit board file. Therefore, by importing the netlist file and the printed circuit board drawing file into the human-computer interaction software provided by the embodiment of the present invention, the human-computer interaction software provided by the embodiment of the present invention can capture the task parameters required for generating signal test cases.

[0039] The netlist file can be extracted from the schematic design file of the target board, and the signal of each net can be classified according to the keywords in the net name in the netlist file, and the measurable coordinate points, that is, the test point positions, can be found from the printed circuit board output file.

[0040] For S103, the test point location and test setting parameters can be determined according to the task parameters identified in S102. For each signal to be tested, the corresponding test point location and test setting parameters need to be determined.

[0041] As for S104, the test point position and test setting parameters of each to-be-tested signal determined in S103 are filled into a preset test case template to obtain a signal test case corresponding to the target board.

[0042] Therefore, by adopting the signal test case generation method provided by the embodiment of the present invention, the automatic arrangement and generation of signal test cases can be realized, and high-quality signal test cases can be quickly generated through efficient human-computer interaction, which greatly improves work efficiency and design accuracy. This method not only reduces human errors, but also significantly shortens the test preparation time, ensuring the reliability and consistency of server signal testing.

[0043] After the signal test case is generated, the signal test case can also be sorted according to the user settings, such as formatting, and then the final signal test case can be output.

[0044] The signal test case generation method provided by the embodiment of the present invention obtains the board design file from the board design file of the target board by adopting an automatic identification method, obtains component position information, component connection information and signal flow information between components, so as to determine the test point position and test setting parameters, and generates the signal test case of the target board according to the test point position and the test setting parameters, thereby realizing a solution that can automatically generate signal test cases without the need for test engineers to manually input test configuration information and manually write test cases, so that inconsistent test standards due to different writers will not occur, and human errors will not occur, thereby realizing an efficient and low-error signal test case generation solution.

[0045] Based on the above embodiment, the embodiment of the present invention further illustrates the step of determining the position of the test point.

[0046] Figure 2 A schematic diagram of the positional relationship between a reference location and a signal test point provided in an embodiment of the present invention.

[0047] In the signal test case generation method provided in an embodiment of the present invention, determining the test point position according to the task parameters in S103 may include: determining the signal to be tested of the target board; determining the signal test point and the reference location for each signal to be tested according to the component location information, the component connection information and the signal flow direction information, and taking the location of the signal test point and the location of the reference location as the test point location of the signal to be tested.

[0048] To facilitate the subsequent generation of signal test cases and signal test processes, in an embodiment of the present invention, the signals to be tested can be classified according to signal keywords. In some optional implementations of the embodiments of the present invention, the signals to be tested can be divided into three categories: alternating current signals (AC), direct current signals (DC), and other signals (Normal), which are applied in three test environments to achieve preliminary classification of the signals to be tested. For example, the line network containing the "_PWR_S5_" keyword can be classified as an "AC" signal, the line network containing the "_PWR_S0_" keyword can be classified as a "DC" signal, and the remaining signals can be classified as "Normal" signals.

[0049] Under the three types of signals, AC, DC, and Normal, the test types can be further divided. The test type division method can be determined according to the board design specifications. For example, the line net containing the keywords "P*V*" and "STBY" can be divided into timing signals; the line net containing the keyword "SGPIO" can be divided into serial general purpose input / output (SGPIO) signals; the network containing the keyword "FAN" can be divided into fan signals; the signal that is connected to a complex programmable logic device (CPLD) at one end and does not contain "P*V*" or "GND" can be divided into a complex programmable logic device general purpose input / output port (CPLD GPIO) signal; the signal that is connected to the integrated south bridge (Platform Controller Hub, PCH) at one end and the pin name (Pin name) starts with "GPP" can be divided into an integrated south bridge general purpose input / output port (PCH GPIO) signal; the signal that is connected to the baseboard management controller (Baseboard Management Controller, BMC) at one end and the pin name (Pin name) starts with "GPIO" can be divided into a baseboard management controller general purpose input / output port (BMC GPIO) signal, etc.

[0050] When selecting a signal test point, it is also necessary to refer to the signal flow information. In an embodiment of the present invention, the signal flow direction can be determined by grabbing an offpage from a netlist file. An offpage is an identification arrow designed and added in a netlist file to indicate the signal flow direction. Generally, there are three types of offpages: input (IN), output (OUT), and bidirectional (BI). By grabbing an offpage and determining the type of offpage, the signal flow direction of the signal to be tested can be determined so that a test point can be selected.

[0051] When generating a signal test case, it is necessary to indicate the test point location, which is the location on the target board where the probe of the oscilloscope or the signal input terminal of other test instruments are connected for testing. In an embodiment of the present invention, two test points can be determined for each signal to be tested, namely, a signal test point and a reference point. According to the current test requirements of signal testing, the signal receiving end is usually selected as the signal test point. At this time, the signal receiving end needs to be determined by the signal flow direction determined by the above steps.

[0052] In addition, the task parameters captured from the printed circuit board drawing file can also include the type of routing, such as vias, pins, etc. This is because the routing on the board is usually covered and cannot be touched by the probe. The probe needs to be connected to the exposed pins or vias on the target board to achieve electrical connection.

[0053] From the perspective of operability, determining the signal test point for the signal to be tested may include: selecting the signal test point for the signal to be tested in the order of priority of signal string resistance, pull-up and pull-down resistance, capacitor, integrated circuit pin, and connector pin. That is, the signal test point is selected in the order of signal string resistance>pull-up and pull-down resistance>capacitor>integrated circuit pin>connector pin. The higher the priority, the stronger the operability of the signal test point type, so it is preferred. If there is no signal test point with a high priority, the signal test point with a lower priority is selected for the signal to be tested.

[0054] After determining the signal test point, the reference location is determined according to the position of the signal test point. In an embodiment of the present invention, determining the reference location for the signal to be tested may include: selecting a reference location within a first radius range with the position of the signal test point as the center; wherein the lower limit of the first radius range is determined according to the minimum spacing between the two probes of the oscilloscope, and the upper limit of the first radius range is determined according to the ground line length of the target board. In practical applications, such as Figure 2 As shown, usually the minimum distance between two probes of an oscilloscope is 0.5 mm, and the longest length of a ground wire is usually 120 mm, so the first radius range may be 0.5 mm-120 mm.

[0055] Based on the above embodiment, the embodiment of the present invention further illustrates the step of determining the test setting parameters.

[0056] In the signal test case generation method provided in an embodiment of the present invention, determining the test setting parameters according to the task parameters in S103 may include: determining the signal to be tested of the target board; determining the voltage grid width of the oscilloscope according to the signal level of the signal to be tested; and determining the display interface setting parameters of the oscilloscope and the signal trigger control parameters of the oscilloscope according to the type of the signal to be tested.

[0057] In specific implementation, the signal level of the signal to be tested can be determined by grabbing the name of the signal to be tested from the board design file and identifying the signal level keyword (such as "PxVy") from it. The voltage grid width is determined according to the signal level of the signal to be tested. For example, a 12V signal is set to 4V / div (volts per grid), and a 3.3V signal can be set to 1V / div. If the levels of multiple signals tested at the same time are inconsistent, the highest level signal can be used as the standard for setting. When testing two signals at the same time, channel 1 can be placed above channel 2 for display, with 4 grids in between.

[0058] The display interface setting parameters of the oscilloscope can be configured to set the oscilloscope waveform background to black, and to uniformly set the bandwidth and sampling rate to 500Mhz and 1Gb / s according to the test specifications.

[0059] The signal trigger control parameters of the oscilloscope may include a signal trigger channel and a trigger level, wherein the signal trigger channel may be set to 1 channel by default, and the trigger level may be set to 80% of the signal level of the signal to be tested by default.

[0060] For each signal to be tested, the above test setting parameters are configured, that is, each signal to be tested corresponds to a set of test setting parameters. The test order of the signals to be tested can be determined according to the signal classification method ("AC", "DC", "Normal") introduced in the above embodiment of the present invention, and multiple test subcategories such as timing and GPIO can be set under each category.

[0061] On the basis of the above-mentioned embodiment, the signal test case generation method provided by the embodiment of the present invention further includes: correcting the signal test case according to the historical board test case.

[0062] In the embodiment of the present invention, after the signal test case is generated, in order to further improve the availability of the signal test case, the signal test case can be corrected according to the historical board test case. The historical board test case can be a signal test case that was manually written by a test engineer and tested and is available.

[0063] In an embodiment of the present invention, a database may be maintained for storing historical board test cases, and the database may be updated according to machine-generated signal test cases and manually adjusted signal test cases.

[0064] In the signal test case generation method provided by the embodiment of the present invention, the board design file can be identified by the machine through S101~S104, the task parameters can be extracted and the initial version of the signal test case can be quickly generated. This process can reduce the time and workload of manual input. Then, the human-computer interaction software designed by the embodiment of the present invention can automatically call the database to correct the initial version of the signal test case, and the correction content can include the test point position and the test setting parameters. For example, the historical board test case in the database may provide a more suitable test point position for a certain type of signal to be tested of a certain board type. This process can determine the accuracy and comprehensiveness of the signal test case, automatically correct potential errors, and improve the quality of the signal test case. Then, on the basis of machine generation and correction, the signal test case can also be manually reviewed and adjusted by the test engineer to ensure that the signal test case fully meets the actual needs, covers all necessary test points, and solves special situations that the machine cannot recognize.

[0065] On the basis of manual adjustment, the signal test case generation method provided by the embodiment of the present invention may further include: recording the manual adjustment results of the signal test case, and updating the test case generation script. The test case generation script refers to the program script used in the human-computer interaction software introduced in the above embodiment of the present invention to identify the board design file, extract task parameters and quickly generate the initial version of the signal test case.

[0066] When the human-computer interaction software provided by the embodiment of the present invention is used for the first time to generate test cases, if there is no historical board test case, the database is empty, and the signal test case is completely generated by the software, which requires a lot of manual modification, which is time-consuming. When there is a manually adjusted signal test case, the manual adjustment result is recorded in the database, and the matching is automatically loaded when the program is run next time, thereby reducing the content that needs to be manually adjusted.

[0067] The signal test case generation method provided by the embodiment of the present invention may further include: after generating the signal test case in S104, marking the test points and signal setting parameters corresponding to the key signal type in the signal test case. That is, by marking the relevant test conditions of the pre-configured key signal type in the signal test case, the test engineer can quickly locate and check the relevant test conditions of the key signal type.

[0068] After manually adjusting the signal test case, the human-computer interaction software provided by the embodiment of the present invention can be used to adjust the format of the signal test case according to a preset template and output a final version of the signal test case.

[0069] Based on the above embodiments, in the signal test case generation method provided in the embodiments of the present invention, identifying the board design file in S102 and obtaining the task parameters may include: inputting the identification task prompt and the board design file into a pre-trained model and outputting the task parameters.

[0070] In S103, determining the test point location and test setting parameters according to the task parameters may include: generating a matching task prompt according to the task parameters and information in the first database, and inputting the matching task prompt into a pre-trained model so that the pre-trained model outputs the test point location and test setting parameters according to the first reference historical signal test case in the first database.

[0071] The signal test case generation method provided by an embodiment of the present invention may also include: generating a correction task prompt based on the test point location, test setting parameters and information in a second database, and inputting the correction task prompt into a pre-trained model so that the pre-trained model outputs a corrected test point location and corrected test setting parameters based on a second reference historical signal test case in the second database.

[0072] Generating a signal test case of the target board according to the test point position and the test setting parameters in S104 may include: generating a signal test case according to the corrected test point position and the corrected test setting parameters.

[0073] The embodiment of the present invention provides an implementation method for generating signal test cases using a pre-trained model. The pre-trained model can use a multimodal model to process input data (such as images) of other modalities according to the input prompt. The pre-trained model used in the embodiment of the present invention can be a model trained with general data, and combined with the database introduced in the above embodiment of the present invention to achieve rapid adaptation of the signal case generation task.

[0074] In an embodiment of the present invention, corresponding task prompts are set for each step of generating a signal test case, so as to gradually guide the pre-trained model to generate a signal test case in a thought chain manner, thereby improving the reliability and usability of the generation.

[0075] In an embodiment of the present invention, the first database and the second database are divided to distinguish between the first reference historical signal test case and the second reference historical signal test case. The first database may include rich historical data of various types of signals to be tested of various types of boards, so that a reference basis can be found when initially generating test point locations and test setting parameters. The second database may include the second reference historical signal test cases that have been verified and available as described in the above embodiment, so as to correct unreasonable items in the test point locations and test setting parameters.

[0076] In an embodiment of the present invention, a pre-trained model can be used to automatically generate test cases and perform automatic correction based on a database, and the database can be updated along with the generation process and the correction process to achieve continuous learning and updating of the pre-trained model for the task of generating signal test cases, thereby continuously improving the generation effect.

[0077] It should be noted that in the embodiments of the signal test case generation method of the present invention, some of the steps or features can be ignored or not executed. The hardware or software functional modules divided for the convenience of description are not the only implementation form of the signal test case generation method provided in the embodiment of the present invention.

[0078] The above describes in detail various embodiments corresponding to the signal test case generation method. On this basis, the present invention also discloses a signal test case generation device, equipment, non-volatile storage medium and computer program product corresponding to the above method.

[0079] The signal test case generating device provided by the embodiment of the present invention may include: An acquisition unit, used for acquiring a board design file of a target board; The identification unit is used to identify the board design file and obtain task parameters; the task parameters at least include component position information, component connection information and signal flow information between components; A determination unit, used to determine the test point location and test setting parameters according to the task parameters; The generation unit is used to generate signal test cases of the target board according to the test point positions and test setting parameters.

[0080] The signal test case generating device provided by the embodiment of the present invention may further include: The correction unit is used to correct the signal test case.

[0081] It should be noted that in each implementation of the signal test case generation device provided in the embodiment of the present invention, the division of units is only a logical functional division, and other division methods can be used. The connection method between different units can be electrical, mechanical or other connection methods. The separated units can be located in the same physical location or distributed on multiple network nodes. Each unit can be implemented in the form of hardware or in the form of a software functional unit. That is, part or all of the units provided in the embodiment of the present invention can be selected according to actual needs and the corresponding connection method or integration method can be adopted to achieve the purpose of the embodiment of the present invention.

[0082] Since the embodiments of the apparatus part correspond to the embodiments of the method part, please refer to the description of the embodiments of the method part for the embodiments of the apparatus part, which will not be repeated here.

[0083] Figure 3 A schematic diagram of the structure of a signal test case generating device provided in an embodiment of the present invention.

[0084] like Figure 3 As shown, the signal test case generation device provided in an embodiment of the present invention includes: a memory 310, used to store a computer program 311; a processor 320, used to execute the computer program 311, and when the computer program 311 is executed by the processor 320, the steps of the signal test case generation method provided in any one of the above embodiments are implemented.

[0085] Among them, the processor 320 may include one or more processing cores, such as a 3-core processor, an 8-core processor, etc. The processor 320 may be implemented in at least one hardware form of digital signal processing (DSP), field-programmable gate array (FPGA), and programmable logic array. The processor 320 may also include a main processor and a coprocessor. The main processor is a processor for processing data in the awake state, also known as a central processing unit (CPU); the coprocessor is a low-power processor for processing data in the standby state. In some embodiments, the processor 320 may be integrated with a graphics processing unit (GPU), which is responsible for rendering and drawing the content to be displayed on the display screen. In some embodiments, the processor 320 may also include an artificial intelligence (AI) processor, which is used to process computing operations related to machine learning.

[0086] The memory 310 may include one or more non-volatile storage media, which may be non-transitory. The memory 310 may also include a high-speed random access memory, and a non-volatile memory, such as one or more disk storage devices, flash memory storage devices. In this embodiment, the memory 310 is at least used to store the following computer program 311, wherein the computer program 311, after being loaded and executed by the processor 320, can implement the relevant steps in the signal test case generation method disclosed in any of the aforementioned embodiments. In addition, the resources stored in the memory 310 may also include an operating system 312 and data 313, etc., and the storage method may be temporary storage or permanent storage. Among them, the operating system 312 may be Windows or other types of operating systems. Data 313 may include, but is not limited to, the data involved in the above method.

[0087] In some embodiments, the signal test case generating device may further include a display screen 330 , a power supply 340 , a communication interface 350 , an input / output interface 360 ​​, a sensor 370 , and a communication bus 380 .

[0088] Those skilled in the art will understand that Figure 3 The structure shown in the figure does not constitute a limitation on the signal test case generating device, and may include more or fewer components than those shown in the figure.

[0089] The signal test case generation device provided in an embodiment of the present invention includes a memory and a processor. When the processor executes the program stored in the memory, it can implement the steps of the signal test case generation method provided in the above embodiment, and the effect is the same as above.

[0090] An embodiment of the present invention provides a non-volatile storage medium having a computer program stored thereon. When the computer program is executed by a processor, the steps of the signal test case generation method provided in any one of the above embodiments can be implemented.

[0091] The non-volatile storage medium may include: a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk, and other media that can store program codes.

[0092] For the introduction of the non-volatile storage medium provided in the embodiment of the present invention, please refer to the above method embodiment, and the effect thereof is the same as the signal test case generation method provided in the embodiment of the present invention, and the present invention will not elaborate on it here.

[0093] An embodiment of the present invention provides a computer program product, including a computer program, which, when executed by a processor, implements the steps of the signal test case generation method provided in any one of the above embodiments.

[0094] For an introduction to the computer program product provided by the embodiment of the present invention, please refer to the above method embodiment, and the effect thereof is the same as the signal test case generation method provided by the embodiment of the present invention, and the present invention will not elaborate on it here.

[0095] The above is a detailed introduction to a signal test case generation method, device, equipment and storage medium provided by the present invention. The various embodiments in the specification are described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The same and similar parts between the various embodiments can refer to each other. For the devices, equipment, non-volatile storage media and computer program products disclosed in the embodiments, since they correspond to the methods disclosed in the embodiments, the description is relatively simple, and the relevant parts can refer to the method part description. It should be pointed out that for ordinary technicians in this technical field, without departing from the principles of the present invention, the present invention can also be improved and modified in a number of ways, and these improvements and modifications also fall within the scope of protection of the present invention.

[0096] It should also be noted that, in this specification, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "comprise", "include" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, an element defined by the statement "comprises a ..." does not exclude the presence of other identical elements in the process, method, article or device including the element.

Claims

1. A signal test case generation method, characterized in that: include: Get the board design file of the target board; Identify the board design file and obtain task parameters; The task parameters include at least component location information, component connection information, and signal flow information between components; Determine test point locations and test setting parameters according to the task parameters; A signal test case for the target board is generated according to the test point location and the test setting parameters.

2. The signal test case generation method according to claim 1, characterized in that: Identify the board design file and obtain task parameters, including: Identify the netlist file in the board design file to obtain the names of the components, the connection relationship between the components and the signal flow information; Obtaining the component position information of the component from the printed circuit board drawing file in the board design file according to the name of the component; According to the connection relationship between the components, the wiring position information between the components is obtained from the printed circuit board drawing file, and the wiring position information is used as the component connection information.

3. The signal test case generation method according to claim 1, characterized in that: Determining the test point location according to the task parameters includes: Determine the signal to be tested of the target board; According to the component position information, the component connection information and the signal flow direction information, a signal test point and a reference location are determined for each of the signals to be tested, and the positions of the signal test points and the reference locations are used as the test point positions of the signals to be tested.

4. The signal test case generation method according to claim 3, characterized in that: Determining the signal test point for the signal to be tested includes: The signal test point is selected for the signal to be tested according to the priority order of signal series resistance, pull-up and pull-down resistors, capacitors, integrated circuit pins, and connector pins.

5. The signal test case generation method according to claim 3, characterized in that: Determining the reference location for the signal to be tested includes: Selecting the reference location within a first radius with the location of the signal test point as the center; The lower limit of the first radius range is determined according to the minimum distance between two probes of the oscilloscope, and the upper limit of the first radius range is determined according to the length of the ground line of the target board.

6. The signal test case generation method according to claim 1, characterized in that: Determining the test setting parameters according to the task parameters includes: Determine the signal to be tested of the target board; Determining the voltage grid width of the oscilloscope according to the signal level of the signal to be tested; According to the type of the signal to be tested, the display interface setting parameters of the oscilloscope and the signal trigger control parameters of the oscilloscope are determined.

7. The signal test case generation method according to claim 1, characterized in that: Identify the board design file and obtain task parameters, including: Inputting the recognition task prompt and the board design file into the pre-trained model, and outputting the task parameters; According to the task parameters, determine the test point location and test setting parameters, including: Generate a matching task prompt according to the task parameters and information in the first database, and input the matching task prompt into the pre-trained model so that the pre-trained model outputs the test point location and the test setting parameters according to a first reference historical signal test case in the first database; The signal test case generation method also includes: Generate a correction task prompt according to the test point position, the test setting parameters and the information of the second database, and input the correction task prompt into the pre-trained model so that the pre-trained model outputs the corrected test point position and the corrected test setting parameters according to the second reference historical signal test case in the second database; Generating a signal test case of the target board according to the test point position and the test setting parameters includes: The signal test case is generated according to the corrected test point position and the corrected test setting parameters.

8. A signal test case generating device, characterized in that: include: An acquisition unit, used for acquiring a board design file of a target board; An identification unit, used for identifying the board design file and obtaining task parameters; The task parameters include at least component location information, component connection information, and signal flow information between components; A determination unit, used to determine the test point location and test setting parameters according to the task parameters; A generating unit is used to generate a signal test case of the target board according to the test point position and the test setting parameters.

9. A signal test case generating device, characterized in that: include: Memory for storing computer programs; A processor is used to execute the computer program, and when the computer program is executed by the processor, the steps of the signal test case generation method according to any one of claims 1 to 7 are implemented.

10. A non-volatile storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the signal test case generation method according to any one of claims 1 to 7 are implemented.

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