Memory bank SLT automatic test method and device, equipment and medium

Abstract

The memory bank SLT automatic test method, device and equipment and the medium provided by the embodiment of the invention comprise the following steps: in response to a received test type and test requirement selected by a target object, determining an initial parameter group and initial parameter ranges and initial unit step lengths corresponding to different parameters in the initial parameter group; testing the memory bank group based on each initial sub-parameter group, and determining the error occurrence rate of the memory bank group under each initial sub-parameter group; and according to the relationship between the error occurrence rate of each initial sub-parameter group and a preset error occurrence rate, and the initial parameter range and the initial unit step length corresponding to different parameters in each initial sub-parameter group, adjusting the parameters of each initial sub-parameter group until the error occurrence rate under each initial sub-parameter group meets the preset error occurrence rate. Automatic testing of the memory bank SLT is achieved, manual intervention is remarkably reduced, the parameter optimization process is more autonomous, intelligent and repeatable, and dependence on experience of test engineers is reduced.

Description

Technical Field

[0001] This invention relates to the field of memory module technology and related technical fields, specifically to an automatic SLT testing method, apparatus, device, and medium for memory modules. Background Technology

[0002] With the rapid development of information technology, memory modules (DRAM), as one of the core components of computer systems, are crucial for their performance and stability. To ensure the reliability of memory modules under various operating conditions, a series of rigorous tests are required, among which stability testing (SLT) is an indispensable key step. Traditional memory module SLT testing aims to verify the long-term reliability of memory modules under specific operating conditions, such as specific voltage, frequency, and temperature. During the testing process, a series of key timing parameters need to be adjusted and verified, as these parameters directly affect the read / write timings and stability of the memory.

[0003] In existing technologies, the adjustment and optimization of these parameters typically rely on human experience and trial-and-error methods, or the use of simple scripts based on preset rules. Test engineers need to manually or through scripts modify these parameters according to a preset test procedure and observe the memory's operating status and error logs to determine a relatively stable operating point. For example, engineers might first fix other parameters, then gradually adjust CL, observe changes in the error rate, and then adjust parameters such as tRCD. This approach may be effective in the early stages or when there are fewer parameters, but its limitations become increasingly apparent as memory technology becomes more dense, faster, and more complex with increasing parameter complexity. Furthermore, some manufacturers have also attempted to use simple automated scripts, but these scripts typically only iterate through preset parameter combinations and lack intelligent optimization capabilities. Summary of the Invention

[0004] The embodiments described herein provide an automated SLT testing method, apparatus, device, and medium for memory modules, addressing problems existing in the prior art.

[0005] Firstly, based on the content of this disclosure, an automated SLT testing method for memory modules is provided, including: In response to receiving the test type and test requirements selected by the target object, an initial parameter group is determined, as well as the initial parameter range and initial unit step size corresponding to different parameters in the initial parameter group. The initial parameter group includes multiple initial sub-parameter groups, and the number of parameters included in each initial sub-parameter group is different. The memory module group is tested based on each initial sub-parameter group to determine the error rate of the memory module group under each initial sub-parameter group. The memory module group includes a target number of memory modules, and the memory modules include faulty memory modules and normal memory modules. Based on the relationship between the error rate of each initial sub-parameter group and the preset error rate, the initial parameter range corresponding to different parameters in each initial sub-parameter group, and the initial unit step size, the parameters of each initial sub-parameter group are adjusted until the error rate of each initial sub-parameter group meets the preset error rate.

[0006] In some embodiments of this disclosure, the step of determining an initial parameter set and the initial parameter range and initial unit step size corresponding to different parameters in the initial parameter set in response to receiving the test type and test requirements selected by the target object includes: In response to receiving a test request for a target object selection, the initial parameter range for each parameter is determined based on the test request; Based on the initial parameter range of each parameter, the initial parameters of each parameter are determined, and the initial parameters are arranged and combined to obtain multiple initial sub-parameter groups, wherein the multiple initial sub-parameter groups constitute an initial parameter group; In response to receiving the test type selected by the target object, the adjustment step size corresponding to different parameters in the initial parameter group is determined according to the test type.

[0007] In some embodiments of this disclosure, the step of testing the memory module group based on each initial sub-parameter group to determine the error rate of the memory module group under each initial sub-parameter group includes: The memory module group is tested based on each initial sub-parameter group to obtain the test results of each memory module in the memory module group under each initial sub-parameter group; Based on the test results of each memory module in the memory module group under each initial sub-parameter group, determine the number of memory modules in the memory module group that have errors under each initial sub-parameter group; The error rate of the memory group under each initial sub-parameter group is determined based on the number of memory modules that have erroneous in the memory group under each initial sub-parameter group and the target number of memory modules included in the memory group.

[0008] In some embodiments of this disclosure, adjusting the parameters of each initial sub-parameter group based on the relationship between the error occurrence rate of each initial sub-parameter group and the preset error occurrence rate, the initial parameter range corresponding to different parameters in each initial sub-parameter group, and the initial unit step size includes: Based on the relationship between the error rate of each initial sub-parameter group and the preset error rate, determine the initial range adjustment direction, the initial parameter range adjustment size, the initial unit step adjustment direction, and the initial unit step adjustment size; The initial parameter range is adjusted according to the initial range adjustment direction and the initial parameter range adjustment size, and the initial unit step size is adjusted according to the initial unit step size adjustment direction and the initial unit step size.

[0009] In some embodiments of this disclosure, before adjusting the initial parameter range according to the initial range adjustment direction and the initial parameter range adjustment size, and before adjusting the initial unit step size according to the initial unit step size adjustment direction and the initial unit step size, the method further includes: Based on the relationship between the error rate of each initial sub-parameter group, which includes at least one identical parameter, and the preset error rate, determine the target parameter that needs to be adjusted.

[0010] In some embodiments of this disclosure, determining the initial range adjustment direction, the initial parameter range adjustment size, the initial unit step size adjustment direction, and the initial unit step size adjustment size based on the relationship between the error occurrence rate of each initial sub-parameter group and the preset error occurrence rate includes: Based on the absolute value of the difference between the error occurrence rate of each initial sub-parameter group and the preset error occurrence rate, determine the adjustment size of the initial parameter range and the adjustment size of the initial unit step size; Based on the relationship between the error rate of each initial sub-parameter group and the difference between the preset error rate and the zero value information, the adjustment direction of the initial parameter range and the adjustment direction of the initial unit step size are determined.

[0011] In some embodiments of this disclosure, the step of "until the error occurrence rate under each initial sub-parameter group meets the preset error occurrence rate" further includes: After adjusting the parameters of each initial sub-parameter group, the memory module group is tested based on the adjusted initial sub-parameter groups; Based on the relationship between the error rate of each initial sub-parameter group after adjustment and the preset error rate, the target sub-parameter group is obtained by filtering each initial sub-parameter group.

[0012] Secondly, according to the present disclosure, an automatic SLT testing device for memory modules is provided, comprising: The parameter determination module is used to determine the initial parameter group and the initial parameter range and initial unit step size corresponding to different parameters in the initial parameter group in response to receiving the test type and test requirements selected by the target object. The initial parameter group includes multiple initial sub-parameter groups, and the number of parameters included in each initial sub-parameter group is different. The error occurrence rate determination module is used to test the memory module group based on each initial sub-parameter group and determine the error occurrence rate of the memory module group under each initial sub-parameter group. The memory module group includes a target number of memory modules, and the memory modules include faulty memory modules and normal memory modules. The adjustment module is used to adjust the parameters of each initial sub-parameter group according to the relationship between the error occurrence rate of each initial sub-parameter group and the preset error occurrence rate, the initial parameter range corresponding to different parameters in each initial sub-parameter group, and the initial unit step size, until the error occurrence rate of each initial sub-parameter group meets the preset error occurrence rate.

[0013] Thirdly, according to the present disclosure, a computer device is provided, comprising: One or more processors; Storage device for storing one or more programs. When the one or more programs are executed by the one or more processors, the one or more processors implement the method as described in any of the first aspects.

[0014] Fourthly, according to the present disclosure, a computer-readable storage medium is provided having a computer program stored thereon that, when executed by a processor, implements the methods described in any of the first aspects.

[0015] The memory module SLT automated testing method, apparatus, device, and medium provided in this disclosure first respond to the test type and test requirements selected by the target object, determining an initial parameter group and the initial parameter range and initial unit step size corresponding to different parameters in the initial parameter group; then, testing the memory module group based on each initial sub-parameter group to determine the error rate of the memory module group under each initial sub-parameter group; finally, adjusting the parameters of each initial sub-parameter group according to the relationship between the error rate of each initial sub-parameter group and the preset error rate, and the initial parameter range and initial unit step size corresponding to different parameters in each initial sub-parameter group, until the error rate under each initial sub-parameter group meets the preset error rate. This achieves automated testing of memory module SLT, significantly reducing manual intervention, making the parameter optimization process more autonomous, intelligent, and repeatable, reducing reliance on the experience of test engineers, and directly improving the final performance indicators (such as bandwidth and latency) and long-term stability of memory module products by finding better operating parameters, thereby enhancing the product's market competitiveness.

[0016] The above description is merely an overview of the technical solutions of the embodiments of this application. In order to better understand the technical means of the embodiments of this application and to implement them in accordance with the contents of the specification, and to make the above and other objects, features and advantages of the embodiments of this application more obvious and understandable, specific implementation methods of this application are described below. Attached Figure Description

[0017] To more clearly illustrate the technical solutions of the embodiments of this disclosure, the accompanying drawings of the embodiments will be briefly described below. It should be understood that the drawings described below only relate to some embodiments of this disclosure and are not intended to limit this disclosure, wherein: Figure 1 This is a flowchart illustrating an automated SLT testing method for memory modules provided in an embodiment of this disclosure; Figure 2 This is a schematic diagram of the structure of an automatic SLT testing device for memory modules provided in an embodiment of this disclosure; Figure 3 This is a schematic diagram of the structure of a computer device provided in an embodiment of this disclosure.

[0018] In the accompanying diagram, markers with the same last two digits correspond to the same elements. It should be noted that the elements in the diagram are schematic and not drawn to scale. Detailed Implementation

[0019] To make the objectives, technical solutions, and advantages of the embodiments of this disclosure clearer, the technical solutions of the embodiments of this disclosure will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this disclosure. All other embodiments obtained by those skilled in the art based on the described embodiments of this disclosure without creative effort are also within the scope of protection of this disclosure.

[0020] Unless otherwise defined, all terms used herein (including technical and scientific terms) shall have the same meaning as commonly understood by one of ordinary skill in the art to which this subject matter pertains. It will be further understood that terms such as those defined in commonly used dictionaries shall be interpreted as having the meaning consistent with their meaning in the context of the specification and in the relevant art, and shall not be interpreted in an idealized or overly formal form unless otherwise explicitly defined herein. As used herein, the statement of “connecting” or “coupling” two or more parts together shall mean that these parts are directly joined together or joined through one or more intermediate components.

[0021] The term "embodiment" as used herein means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of the phrase "embodiment" in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0022] In this article, the term "and / or" is merely a description of the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can mean: A exists, A and B exist simultaneously, or B exists. Additionally, the character " / " in this article generally indicates that the preceding and following related objects have an "or" relationship.

[0023] Furthermore, in all embodiments of this disclosure, terms such as “first” and “second” are used only to distinguish one component (or part of a component) from another component (or another part of a component).

[0024] In the description of this application, unless otherwise stated, "multiple" means two or more (including two), and similarly, "multiple groups" means two or more (including two groups).

[0025] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings.

[0026] Based on the problems existing in the prior art, this disclosure provides an automatic SLT testing method for memory modules. Figure 1 This is a flowchart illustrating an automated SLT testing method for memory modules provided in this disclosure. Figure 1 As shown, the specific process of the SLT automatic testing method for memory modules includes: S110. In response to receiving the test type and test requirements selected by the target object, determine the initial parameter group and the initial parameter range and initial unit step size corresponding to different parameters in the initial parameter group.

[0027] The initial parameter set includes multiple initial sub-parameter sets, each containing a different number of parameters.

[0028] The SLT test for memory modules is designed to verify the long-term reliability of memory modules under specific operating conditions, such as specific voltage, frequency, and temperature. During testing, a series of key timing parameters need to be adjusted and verified. These timing parameters directly affect the read / write timing and stability of memory, including but not limited to: CL: Column Address Strobe Latency (CAS Latency), CAS Write Latency (tCWL), Row to Column Delay (tRCD), Row Precharge Time (tRP), Minimum Row Active Time (tRASmin), Refresh Interval (tREFI), Four Activate Window (tFAW), Refresh Cycle Time (tRFC), Second Refresh Cycle Time (tRFC2), Long Row to Row Delay (tRRD_L), Short Row to Row Delay (tRRD_S), Read to Precharge Time (tRTP), and Write Recovery Time (tRTP). RecoveryTime (tWR), Write to Write Delay (Long, tWTR_L), Write to Write Delay (Short, tWTR_S), and Column to Column Delay (Long, tCCD_L).

[0029] The parameter ranges vary depending on the type of chip and the testing requirements for that chip, and all parameter ranges must meet the JEDEC standard.

[0030] Therefore, the memory module SLT automatic testing method provided in this disclosure first responds to the test type and test requirements selected by the target object, and determines the initial parameter group corresponding to the test type and test requirements, as well as the initial parameter range and initial unit step size corresponding to different parameters in the initial parameter group.

[0031] Specifically, in response to receiving the test type and test requirements selected by the target object, the initial parameter set, as well as the initial parameter range and initial unit step size corresponding to different parameters in the initial parameter set, are determined. This includes: in response to receiving the test requirements selected by the target object, determining the initial parameter range of each parameter according to the test requirements; determining the initial parameter of each parameter according to the initial parameter range of each parameter, and arranging and combining the initial parameters to obtain multiple initial sub-parameter sets, wherein the multiple initial sub-parameter sets constitute the initial parameter set; and in response to receiving the test type selected by the target object, determining the adjustment step size corresponding to different parameters in the initial parameter set according to the test type.

[0032] First, the initial parameter range of each parameter in the initial parameter group is determined based on the test requirements. Then, based on the maximum and minimum values ​​in the determined initial parameter range of each parameter, the initial parameter of each parameter is determined. That is, the median value of the maximum and minimum values ​​in the initial parameter range of each parameter is taken as the initial parameter of each parameter. Then, the initial parameters are arranged and combined to obtain multiple initial sub-parameter groups. Finally, based on the test type of the test memory module selected for the target object, the initial unit step size corresponding to each parameter during the test is determined.

[0033] For a specific example, if the target object selects test requirement 1, and test requirement 1 includes parameters 1, 2, 3, and 4, with the initial parameter range for parameter 1 being [X11, X12], parameter 2 being [X21, X22], parameter 3 being [X31, X32], and parameter 4 being [X41, X42], then the initial parameter X1 for parameter 1 is (X11 + X12) / 2, the initial parameter X2 for parameter 2 is (X21 + X22) / 2, and the initial parameter X3 for parameter 3 is (X31 + X32). The initial parameter X4 corresponding to parameter 4 is (X41+X42) / 2. Then, the initial parameters corresponding to each parameter are arranged and combined to obtain multiple initial sub-parameter groups, which are [X1, X2], [X1, X3], [X1, X4], [X2, X3], [X2, X4], [X3, X4], [X1, X2, X3], [X1, X2, X4], [X1, X3, X4], [X2, X3, X4] and [X1, X2, X3, X4]. Finally, according to the test type of the memory module selected for the target object, the initial unit step size corresponding to each parameter during the test is determined.

[0034] In one preferred implementation, the parameters corresponding to different test requirements are different. That is, if the test requirement selected by the target object is test requirement 1, the corresponding parameters include parameter 1, parameter 2, parameter 3 and parameter 4. Then the initial sub-parameter group is obtained by arranging and combining the initial parameters corresponding to parameter 1, parameter 2, parameter 3 and parameter 4 to obtain multiple initial sub-parameter groups corresponding to test requirement 1. If the test requirement selected by the target object is test requirement 2, the corresponding parameters include parameter 1, parameter 3, parameter 4 and parameter 5. Then the initial sub-parameter group is obtained by arranging and combining the initial parameters corresponding to parameter 1, parameter 3, parameter 4 and parameter 5 to obtain multiple initial sub-parameter groups corresponding to test requirement 2.

[0035] S120. Test the memory module group based on each initial sub-parameter group to determine the error rate of the memory module group under each initial sub-parameter group.

[0036] The memory module group includes the target number of memory modules, and the memory modules include faulty memory modules and normal memory modules.

[0037] After obtaining multiple initial parameter groups in step S110, the memory module group is tested based on each initial sub-parameter group to determine the error rate of the memory module group under the corresponding initial sub-parameter group.

[0038] In the specific implementation, the memory module group is tested based on each initial sub-parameter group to determine the error rate of the memory module group under each initial sub-parameter group. This includes: testing the memory module group based on each initial sub-parameter group to obtain the test results of each memory module in the memory module group under each initial sub-parameter group; determining the number of memory modules that have errors in the memory module group under each initial sub-parameter group based on the test results of each memory module in the memory module group under each initial sub-parameter group; and determining the error rate of the memory module group under each initial sub-parameter group based on the number of memory modules that have errors in the memory module group under each initial sub-parameter group and the target number of memory modules in the memory module group.

[0039] The specific implementation process for determining the error rate of a memory module group under each initial sub-parameter group is as follows: By sequentially statistically analyzing the test results of each memory module in the memory module group under a set of initial sub-parameter groups, the quotient of the number of memory modules with errors in the test results and the number of memory modules included in the memory module group is calculated to obtain the error rate of the memory module group under each initial sub-parameter group.

[0040] A preferred implementation method involves performing multiple tests on the memory module group based on the same set of initial sub-parameters, and averaging the results of the multiple tests to obtain the error rate of the memory module group under the initial sub-parameters, thus ensuring the accuracy of the determined error rate.

[0041] S130. Based on the relationship between the error rate of each initial sub-parameter group and the preset error rate, the initial parameter range corresponding to different parameters in each initial sub-parameter group, and the initial unit step size, adjust the parameters of each initial sub-parameter group until the error rate of each initial sub-parameter group meets the preset error rate.

[0042] In the specific implementation, the parameters of each initial sub-parameter group are adjusted according to the relationship between the error occurrence rate of each initial sub-parameter group and the preset error occurrence rate, the initial parameter range corresponding to different parameters in each initial sub-parameter group, and the initial unit step size. This includes: determining the initial range adjustment direction, the initial parameter range adjustment size, the initial unit step size adjustment direction, and the initial unit step size adjustment size based on the relationship between the error occurrence rate of each initial sub-parameter group and the preset error occurrence rate; adjusting the initial parameter range based on the initial range adjustment direction and the initial parameter range adjustment size; and adjusting the initial unit step size based on the initial unit step size adjustment direction and the initial unit step size.

[0043] Specifically, based on the relationship between the error occurrence rate of each initial sub-parameter group and the preset error occurrence rate, the initial range adjustment direction, initial parameter range adjustment size, initial unit step size adjustment direction, and initial unit step size adjustment size are determined. This includes: determining the initial parameter range adjustment size and the initial unit step size adjustment size based on the absolute value information of the difference between the error occurrence rate of each initial sub-parameter group and the preset error occurrence rate; and determining the initial parameter range adjustment direction and the initial unit step size adjustment direction based on the relationship between the difference information and zero value information of the error occurrence rate of each initial sub-parameter group and the preset error occurrence rate.

[0044] Specifically, if the error rate of a certain initial sub-parameter group is greater than the preset error rate, the initial parameter range and initial unit step size of all parameters in that initial sub-parameter group are loosened; if the error rate of a certain initial sub-parameter group is less than the preset error rate, the initial parameter range and initial unit step size of all parameters in that initial sub-parameter group are tightened.

[0045] In the specific implementation, during the adjustment of the initial parameter range and initial unit step size of all parameters in each initial sub-parameter group, the adjustment size of the initial parameter range and the adjustment size of the initial unit step size corresponding to the absolute value of the difference between the error rate of each initial sub-parameter group and the preset error rate can be selected from the database. Then, based on the relationship between the difference between the error rate of each initial sub-parameter group and the preset error rate and the zero value information, the adjustment direction of the initial parameter range and the adjustment direction of the initial unit step size can be determined. In other words, for the first type of parameter, if the difference between the error rate of each initial sub-parameter group and the preset error rate is greater than zero, then the initial parameter range adjustment direction is as follows: the left initial range parameter is adjusted forward, and the right initial range parameter is adjusted backward. The forward adjustment value of the left initial range parameter and the backward adjustment value of the right initial range parameter are determined based on the initial parameter range adjustment size. The initial unit step size adjustment direction is to increase, and the initial unit step size adjustment value is determined based on the initial unit step size adjustment size. For the second type of parameter, if the difference between the error rate of each initial sub-parameter group and the preset error rate is greater than zero, then the initial parameter range adjustment direction is as follows: the left initial range parameter is adjusted backward, and the right initial range parameter is adjusted forward. The forward adjustment value of the left initial range parameter and the backward adjustment value of the right initial range parameter are determined based on the initial parameter range adjustment size. The initial unit step size adjustment direction is to decrease, and the initial unit step size adjustment value is determined based on the initial unit step size adjustment size. For the first type of parameter, if the difference between the error rate of each initial sub-parameter group and the preset error rate is less than zero, then the initial parameter range adjustment direction is as follows: the left initial range parameter is adjusted backward, and the right initial range parameter is adjusted forward. The forward adjustment value of the left initial range parameter and the backward adjustment value of the right initial range parameter are determined based on the initial parameter range adjustment size. The initial unit step size adjustment direction is to decrease, and the initial unit step size adjustment value is determined based on the initial unit step size adjustment size. For the second type of parameter, if the difference between the error rate of each initial sub-parameter group and the preset error rate is less than zero, then the initial parameter range adjustment direction is as follows: the left initial range parameter is adjusted forward, and the right initial range parameter is adjusted backward. The forward adjustment value of the left initial range parameter and the backward adjustment value of the right initial range parameter are determined based on the initial parameter range adjustment size. The initial unit step size adjustment direction is to increase, and the initial unit step size adjustment value is determined based on the initial unit step size adjustment size.

[0046] After adjusting the initial parameter range of each parameter in each initial sub-parameter group, the initial parameters of each parameter in the initial parameter group change.

[0047] It should be noted that, for the first type of parameter, when the error rate of the initial sub-parameter group is greater than the preset error rate, the initial parameter range and the initial unit step size need to be increased. For the second type of parameter, when the error rate of the initial sub-parameter group is greater than the preset error rate, the initial parameter range and the initial unit step size need to be decreased. Similarly, for the first type of parameter, when the error rate of the initial sub-parameter group is less than the preset error rate, the initial parameter range and the initial unit step size need to be decreased. For the second type of parameter, when the error rate of the initial sub-parameter group is less than the preset error rate, the initial parameter range and the initial unit step size need to be increased. This disclosure does not provide specific examples of this.

[0048] In the above embodiments, when the error rate of each initial sub-parameter group does not meet the preset error rate, all parameters in each initial sub-parameter group are modified until the error rate of each initial sub-parameter group meets the preset error rate. In some test scenarios, the error rate of a certain initial sub-parameter group may be affected by a single parameter in each initial sub-parameter group. Therefore, as a preferred implementation method, before adjusting the initial parameter range according to the initial range adjustment direction and the initial parameter range adjustment size, and before adjusting the initial unit step size according to the initial unit step size adjustment direction and the initial unit step size, the method further includes: determining the target parameter to be adjusted based on the relationship between the error rate of each initial sub-parameter group that includes at least one identical parameter and the preset error rate.

[0049] Specifically, the following initial sub-parameter groups [X1, X2], [X1, X3], [X1, X4], [X1, X2, X3], [X1, X2, X4], [X1, X3, X4], and [X1, X2, X3, X4] all include the same parameter X1. By analyzing the relationship between the error occurrence rate of each of the above initial sub-parameter groups and the preset error occurrence rate, the target parameter that needs to be adjusted is determined. Specifically, if the error occurrence rate of the initial sub-parameter group [X1, X2] is greater than the preset error occurrence rate, and the error occurrence rate of the initial sub-parameter group [X1, X3] is less than the preset error occurrence rate, then parameters X2 and X3 can be adjusted to obtain the relationship between the error occurrence rates of the initial sub-parameter groups [X1, X2] and [X1, X3] after parameter adjustment and the preset occurrence rate. In specific implementation methods, various analysis methods such as statistical analysis and machine learning algorithms can be used to analyze each initial sub-parameter group to determine the target parameter that needs to be adjusted.

[0050] In a specific example, the target object inputs the test type and test requirements into the test system, and generates an initial parameter set based on the test type and test requirements. For example, in the initial parameter group, tCL has an initial parameter range of 32-38 and a step size of 1; tCWL has an initial parameter range of 28-36 and a step size of 1; tRCD has an initial parameter range of 28-34 and a step size of 1; tRP has an initial parameter range of 28-34 and a step size of 1; tRASmin has an initial parameter range of 50-70 and a step size of 2; tREFI has an initial parameter range of 4000-9000 and a step size of 100; tFAW has an initial parameter range of 20-40 and a step size of 2; tRFC has an initial parameter range of 550-750 and a step size of 20; tRRD_L has an initial parameter range of 6-12 and a step size of 1; tRRD_S has an initial parameter range of 4-8 and a step size of 1; tRTP has an initial parameter range of 14-22 and a step size of 1; and tWR has an initial parameter range of 30- The initial parameter set is 66, with a step size of 1. Then, the memory module group is tested based on each initial sub-parameter set to determine the error rate under each set. During testing, multiple tests are performed for each initial sub-parameter set, and the average value is taken as the final error rate. The error rate of the memory module group under each initial sub-parameter set is then analyzed, and the parameters in the initial sub-parameter sets are adjusted based on the data analysis results. For example, if the error rate is found to be high in the tCL range of 32-38, the range of tCL is narrowed to 33-37, the step size is adjusted to 0.5, and a genetic algorithm is used for parameter optimization. Based on the adjusted parameter combinations, the testing, analysis, and adjustment process is repeated until the error rate of the memory module group under each initial parameter set meets the preset error rate.

[0051] In the above embodiments, based on the relationship between the error occurrence rate of each initial sub-parameter group and the preset error occurrence rate, the initial parameter range corresponding to different parameters in each initial sub-parameter group, and the initial unit step size, the parameters of each initial sub-parameter group are adjusted. Then, the memory module group is tested based on the adjusted initial sub-parameter groups. Then, based on the relationship between the error occurrence rate of the memory module group under the adjusted initial sub-parameter groups and the preset error occurrence rate, the initial sub-parameter groups are filtered to obtain the target sub-parameter groups. That is, the initial sub-parameter groups whose error occurrence rate meets the preset error occurrence rate are removed, and the remaining initial sub-parameter groups are the target sub-parameter groups. The parameters of each initial sub-parameter group of the target sub-parameter groups are adjusted again, and the memory module group is tested again until the error occurrence rate of all initial sub-parameter groups meets the predicted error occurrence rate, and the automatic SLT test of the memory module ends.

[0052] The automated SLT testing method for memory modules provided in this disclosure first responds to the test type and test requirements selected by the target object, determining an initial parameter group and the initial parameter range and initial unit step size corresponding to different parameters in the initial parameter group. Then, it tests the memory module group based on each initial sub-parameter group to determine the error rate of the memory module group under each initial sub-parameter group. Finally, based on the relationship between the error rate of each initial sub-parameter group and a preset error rate, and the initial parameter range and initial unit step size corresponding to different parameters in each initial sub-parameter group, it adjusts the parameters of each initial sub-parameter group until the error rate under each initial sub-parameter group meets the preset error rate. This achieves automated testing of memory module SLT, significantly reducing manual intervention, making the parameter optimization process more autonomous, intelligent, and repeatable, reducing reliance on the experience of test engineers. Furthermore, by finding better operating parameters, it directly improves the final performance indicators (such as bandwidth and latency) and long-term stability of the memory module product, enhancing the product's market competitiveness.

[0053] Based on the above embodiments, Figure 2 This is a schematic diagram of the structure of an automatic SLT testing device for memory modules provided in an embodiment of this disclosure, as shown below. Figure 2 As shown, the memory module SLT automatic testing device includes: The parameter determination module 210 is used to determine the initial parameter group and the initial parameter range and initial unit step size corresponding to different parameters in the initial parameter group in response to receiving the test type and test requirements selected by the target object. The initial parameter group includes multiple initial sub-parameter groups, and the number of parameters included in each initial sub-parameter group is different. Error rate determination module 220 is used to test the memory module group based on each initial sub-parameter group and determine the error rate of the memory module group under each initial sub-parameter group. The memory module group includes a target number of memory modules, and the memory modules include faulty memory modules and normal memory modules. The adjustment module 230 is used to adjust the parameters of each initial sub-parameter group according to the relationship between the error occurrence rate of each initial sub-parameter group and the preset error occurrence rate, the initial parameter range corresponding to different parameters in each initial sub-parameter group, and the initial unit step size, until the error occurrence rate of each initial sub-parameter group meets the preset error occurrence rate.

[0054] The memory module SLT automated testing device provided in this disclosure first responds to the test type and test requirements selected by the target object, determines the initial parameter group and the initial parameter range and initial unit step size corresponding to different parameters in the initial parameter group; then, it tests the memory module group based on each initial sub-parameter group to determine the error rate of the memory module group under each initial sub-parameter group; finally, it adjusts the parameters of each initial sub-parameter group according to the relationship between the error rate of each initial sub-parameter group and the preset error rate, and the initial parameter range and initial unit step size corresponding to different parameters in each initial sub-parameter group, until the error rate under each initial sub-parameter group meets the preset error rate. This achieves automated testing of memory module SLT, significantly reducing manual intervention, making the parameter optimization process more autonomous, intelligent, and repeatable, reducing reliance on the experience of test engineers, and directly improving the final performance indicators (such as bandwidth and latency) and long-term stability of memory module products by finding better operating parameters, thereby enhancing the product's market competitiveness.

[0055] In a specific implementation, the step of determining an initial parameter set, as well as the initial parameter range and initial unit step size corresponding to different parameters in the initial parameter set, in response to receiving the test type and test requirements selected by the target object, includes: In response to receiving a test request for a target object selection, the initial parameter range for each parameter is determined based on the test request; Based on the initial parameter range of each parameter, the initial parameters of each parameter are determined, and the initial parameters are arranged and combined to obtain multiple initial sub-parameter groups, wherein the multiple initial sub-parameter groups constitute an initial parameter group; In response to receiving the test type selected by the target object, the adjustment step size corresponding to different parameters in the initial parameter group is determined according to the test type.

[0056] In a specific implementation, the step of testing the memory module group based on each initial sub-parameter group to determine the error rate of the memory module group under each initial sub-parameter group includes: The memory module group is tested based on each initial sub-parameter group to obtain the test results of each memory module in the memory module group under each initial sub-parameter group; Based on the test results of each memory module in the memory module group under each initial sub-parameter group, determine the number of memory modules in the memory module group that have errors under each initial sub-parameter group; The error rate of the memory group under each initial sub-parameter group is determined based on the number of memory modules that have erroneous in the memory group under each initial sub-parameter group and the target number of memory modules included in the memory group.

[0057] In a specific implementation, adjusting the parameters of each initial sub-parameter group based on the relationship between the error occurrence rate of each initial sub-parameter group and the preset error occurrence rate, the initial parameter range corresponding to different parameters in each initial sub-parameter group, and the initial unit step size includes: Based on the relationship between the error rate of each initial sub-parameter group and the preset error rate, determine the initial range adjustment direction, the initial parameter range adjustment size, the initial unit step adjustment direction, and the initial unit step adjustment size; The initial parameter range is adjusted according to the initial range adjustment direction and the initial parameter range adjustment size, and the initial unit step size is adjusted according to the initial unit step size adjustment direction and the initial unit step size.

[0058] In a specific implementation, before adjusting the initial parameter range according to the initial range adjustment direction and the initial parameter range adjustment size, and before adjusting the initial unit step size according to the initial unit step size adjustment direction and the initial unit step size, the method further includes: Based on the relationship between the error rate of each initial sub-parameter group, which includes at least one identical parameter, and the preset error rate, determine the target parameter that needs to be adjusted.

[0059] In a specific implementation, determining the initial range adjustment direction, the initial parameter range adjustment size, the initial unit step size adjustment direction, and the initial unit step size adjustment size based on the relationship between the error occurrence rate of each initial sub-parameter group and the preset error occurrence rate includes: Based on the absolute value of the difference between the error occurrence rate of each initial sub-parameter group and the preset error occurrence rate, determine the adjustment size of the initial parameter range and the adjustment size of the initial unit step size; Based on the relationship between the error rate of each initial sub-parameter group and the difference between the preset error rate and the zero value information, the adjustment direction of the initial parameter range and the adjustment direction of the initial unit step size are determined.

[0060] In a specific implementation, the step of "until the error occurrence rate under each initial sub-parameter group meets the preset error occurrence rate" further includes: After adjusting the parameters of each initial sub-parameter group, the memory module group is tested based on the adjusted initial sub-parameter groups; Based on the relationship between the error rate of each initial sub-parameter group after adjustment and the preset error rate, the target sub-parameter group is obtained by filtering each initial sub-parameter group.

[0061] This application also provides a computer device, please refer to the following for details. Figure 3 , Figure 3 This is a basic structural block diagram of the computer device in this embodiment.

[0062] The computer device includes a memory 510 and a processor 520 that are interconnected via a system bus. It should be noted that only a computer device with components 510-520 is shown in the figure; however, it should be understood that it is not required to implement all the shown components, and more or fewer components may be implemented alternatively. Those skilled in the art will understand that the computer device described herein is a device capable of automatically performing numerical calculations and / or information processing according to pre-set or stored instructions, and its hardware includes, but is not limited to, microprocessors, application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), digital signal processors (DSPs), embedded devices, etc.

[0063] Computer devices can include desktop computers, laptops, handheld computers, and cloud servers. These devices allow for human-computer interaction with users through keyboards, mice, remote controls, touchpads, or voice-activated devices.

[0064] The memory 510 includes at least one type of readable storage medium, including non-volatile memory or volatile memory, such as flash memory, hard disk, multimedia card, card-type memory (e.g., SD or DX memory), random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), programmable read-only memory (PROM), magnetic memory, magnetic disk, optical disk, etc. RAM may include static RAM or dynamic RAM. In some embodiments, the memory 510 may be an internal storage unit of a computer device, such as the hard disk or memory of the computer device. In other embodiments, the memory 510 may also be an external storage device of the computer device, such as a plug-in hard disk, smart media card (SMC), secure digital (SD) card, or flash card equipped on the computer device. Of course, the memory 510 may include both internal storage units and external storage devices of the computer device. In this embodiment, the memory 510 is typically used to store the operating system and various application software installed on the computer device, such as the program code of the method described above. In addition, the memory 510 may also be used to temporarily store various types of data that have been output or will be output.

[0065] The processor 520 is typically used to perform the overall operation of a computer device. In this embodiment, the memory 510 is used to store program code or instructions, including computer operation instructions. The processor 520 is used to execute the program code or instructions stored in the memory 510 or to process data, such as program code that runs the methods described above.

[0066] In this article, the bus can be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus, or an Extended Industry Standard Architecture (EISA) bus, etc. This bus system can be divided into address bus, data bus, control bus, etc. For ease of illustration, only one thick line is used to represent it in the diagram, but this does not mean that there is only one bus or one type of bus.

[0067] Another embodiment of this application also provides a computer-readable medium, which may be a computer-readable signal medium or a computer-readable medium. A processor in a computer reads computer-readable program code stored in the computer-readable medium, enabling the processor to execute the functional actions specified in each step or combination of steps in the above method; and to generate means for implementing the functional actions specified in each block or combination of blocks in the block diagram.

[0068] Computer-readable media include, but are not limited to, electronic, magnetic, optical, electromagnetic, infrared memory or semiconductor systems, devices or apparatuses, or any suitable combination thereof, wherein the memory is used to store program code or instructions, the program code including computer operation instructions, and the processor is used to execute the program code or instructions of the above-described methods stored in the memory.

[0069] The definitions of memory and processor can be found in the description of the foregoing computer device embodiments, and will not be repeated here.

[0070] In the several embodiments provided in this application, it should be understood that the disclosed systems, apparatuses, and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of modules or units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between apparatuses or units may be electrical, mechanical, or other forms.

[0071] In the various embodiments of this application, the functional units or modules can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit.

[0072] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) or processor to execute all or part of the steps of the methods of the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0073] Unless otherwise expressly indicated by the context, the singular form of words used herein and in the appended claims includes the plural form, and vice versa. Thus, when referring to the singular, the plural form of the corresponding term is generally included. Similarly, the terms “comprising” and “including” shall be interpreted as including rather than exclusively. Likewise, the terms “including” and “or” shall be interpreted as including unless such interpretation is expressly prohibited herein. Where the term “example” is used herein, particularly when it follows a set of terms, the “example” is merely exemplary and illustrative and should not be considered exclusive or extensive.

[0074] Further aspects and scope of adaptation become apparent from the description provided herein. It should be understood that various aspects of this application may be implemented individually or in combination with one or more other aspects. It should also be understood that the descriptions and specific embodiments herein are for illustrative purposes only and are not intended to limit the scope of this application.

[0075] Several embodiments of this disclosure have been described in detail above. However, it is obvious that those skilled in the art can make various modifications and variations to the embodiments of this disclosure without departing from the spirit and scope of this disclosure. The scope of protection of this disclosure is defined by the appended claims.

Claims

1. An automatic SLT testing method for memory modules, characterized in that, include: In response to receiving the test type and test requirements selected by the target object, an initial parameter group is determined, as well as the initial parameter range and initial unit step size corresponding to different parameters in the initial parameter group. The initial parameter group includes multiple initial sub-parameter groups, and the number of parameters included in each initial sub-parameter group is different. The memory module group is tested based on each initial sub-parameter group to determine the error rate of the memory module group under each initial sub-parameter group. The memory module group includes a target number of memory modules, and the memory modules include faulty memory modules and normal memory modules. Based on the relationship between the error rate of each initial sub-parameter group and the preset error rate, the initial parameter range corresponding to different parameters in each initial sub-parameter group, and the initial unit step size, the parameters of each initial sub-parameter group are adjusted until the error rate of each initial sub-parameter group meets the preset error rate.

2. The method according to claim 1, characterized in that, The step of determining an initial parameter set, as well as the initial parameter range and initial unit step size corresponding to different parameters in the initial parameter set, in response to receiving the test type and test requirements selected by the target object, includes: In response to receiving a test request for a target object selection, the initial parameter range for each parameter is determined based on the test request; Based on the initial parameter range of each parameter, the initial parameters of each parameter are determined, and the initial parameters are arranged and combined to obtain multiple initial sub-parameter groups, wherein the multiple initial sub-parameter groups constitute an initial parameter group; In response to receiving the test type selected by the target object, the adjustment step size corresponding to different parameters in the initial parameter group is determined according to the test type.

3. The method according to claim 1, characterized in that, The process of testing memory modules based on each initial sub-parameter group to determine the error rate of the memory module group under each initial sub-parameter group includes: The memory module group is tested based on each initial sub-parameter group to obtain the test results of each memory module in the memory module group under each initial sub-parameter group; Based on the test results of each memory module in the memory module group under each initial sub-parameter group, determine the number of memory modules in the memory module group that have errors under each initial sub-parameter group; The error rate of the memory group under each initial sub-parameter group is determined based on the number of memory modules that have erroneous in the memory group under each initial sub-parameter group and the target number of memory modules included in the memory group.

4. The method according to claim 1, characterized in that, The adjustment of parameters in each initial sub-parameter group is based on the relationship between the error rate of each initial sub-parameter group and the preset error rate, the initial parameter range corresponding to different parameters in each initial sub-parameter group, and the initial unit step size. This includes: Based on the relationship between the error rate of each initial sub-parameter group and the preset error rate, determine the initial range adjustment direction, the initial parameter range adjustment size, the initial unit step adjustment direction, and the initial unit step adjustment size; The initial parameter range is adjusted according to the initial range adjustment direction and the initial parameter range adjustment size, and the initial unit step size is adjusted according to the initial unit step size adjustment direction and the initial unit step size.

5. The method according to claim 4, characterized in that, Before adjusting the initial parameter range according to the initial range adjustment direction and the initial parameter range adjustment size, and before adjusting the initial unit step size according to the initial unit step size adjustment direction and the initial unit step size, the method further includes: Based on the relationship between the error rate of each initial sub-parameter group, which includes at least one identical parameter, and the preset error rate, determine the target parameter that needs to be adjusted.

6. The method according to claim 4, characterized in that, The step of determining the initial range adjustment direction, initial parameter range adjustment size, initial unit step size adjustment direction, and initial unit step size adjustment size based on the relationship between the error occurrence rate of each initial sub-parameter group and the preset error occurrence rate includes: Based on the absolute value of the difference between the error occurrence rate of each initial sub-parameter group and the preset error occurrence rate, determine the adjustment size of the initial parameter range and the adjustment size of the initial unit step size; Based on the relationship between the error rate of each initial sub-parameter group and the difference between the preset error rate and the zero value information, the adjustment direction of the initial parameter range and the adjustment direction of the initial unit step size are determined.

7. The method according to claim 1, characterized in that, The process of continuing until the error rate under each initial sub-parameter group meets the preset error rate also includes: After adjusting the parameters of each initial sub-parameter group, the memory module group is tested based on the adjusted initial sub-parameter groups; Based on the relationship between the error rate of each initial sub-parameter group after adjustment and the preset error rate, the target sub-parameter group is obtained by filtering each initial sub-parameter group.

8. An automatic SLT testing device for memory modules, characterized in that, include: The parameter determination module is used to determine the initial parameter group and the initial parameter range and initial unit step size corresponding to different parameters in the initial parameter group in response to receiving the test type and test requirements selected by the target object. The initial parameter group includes multiple initial sub-parameter groups, and the number of parameters included in each initial sub-parameter group is different. The error occurrence rate determination module is used to test the memory module group based on each initial sub-parameter group and determine the error occurrence rate of the memory module group under each initial sub-parameter group. The memory module group includes a target number of memory modules, and the memory modules include faulty memory modules and normal memory modules. The adjustment module is used to adjust the parameters of each initial sub-parameter group according to the relationship between the error occurrence rate of each initial sub-parameter group and the preset error occurrence rate, the initial parameter range corresponding to different parameters in each initial sub-parameter group, and the initial unit step size, until the error occurrence rate of each initial sub-parameter group meets the preset error occurrence rate.

9. A computer device, characterized in that, include: One or more processors; Storage device for storing one or more programs. When the one or more programs are executed by the one or more processors, the one or more processors implement the method as described in any one of claims 1 to 7.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the program is executed by the processor, it implements the method as described in any one of claims 1 to 7.

Images