Arrangement method for temperature measurement points of new energy box-type substation
By using infrared thermal imagers and temperature sensors in new energy box substations to determine the target temperature measurement area and final layout method, the problems of poor heat dissipation and complex temperature rise experiments of box substations are solved, and more accurate temperature detection and simplified experimental operations are achieved.
Patent Information
- Application Number
- CN202411893429.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-20
- Publication Date
- 2025-04-04
- Estimated Expiration
- 2044-12-20
AI Technical Summary
In the long-term operation of the new energy box substation, due to its compact internal structure, the heat dissipation effect is poor, which affects the temperature detection results and increases the operation complexity of the temperature rise experiment.
An infrared thermal imager is used to determine the target temperature measurement area and reference temperature values, set the temperature measurement points according to different arrangement methods, and obtain at least three average temperature values through temperature sensor detection to determine the final arrangement method of the temperature sensor.
The impact of the temperature measurement point arrangement on the detection results is reduced, the operation complexity of the temperature rise experiment is simplified, and the accuracy of temperature measurement is improved.
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Figure CN119756589A_ABST
Abstract
Description
Technical Field
[0001] The present application belongs to the technical field of substations, and specifically relates to a method for arranging temperature measurement points in a new energy box-type substation. Background Art
[0002] New energy box-type substations will continuously generate heat during long-term operation, but due to the compact internal structure of the box-type substation, the heat dissipation effect of the substation is adversely affected. In order to ensure that the box-type substation can operate safely and stably for a long time, the box-type substation needs to undergo a temperature rise test before leaving the factory to conduct quality inspections on various components in the box-type substation. During the temperature rise test, multiple temperature measurement points are arranged around the components in the box-type substation, and temperature sensors are set at the temperature measurement points for temperature measurement to detect whether the temperature of each component during the temperature rise test can meet the quality requirements. When conducting a temperature rise test, the arrangement of the temperature measurement points will affect the temperature detection results and the operational complexity of the temperature rise test. At present, there is a lack of research on the arrangement of temperature measurement points. Summary of the invention
[0003] The present application aims to provide a method for arranging temperature measurement points in a new energy box-type substation, thereby reducing the influence of the arrangement of temperature measurement points on the temperature detection results and reducing the operational complexity of the temperature rise experiment.
[0004] In order to solve the above technical problems, this application is implemented as follows: The embodiment of the present application proposes a method for arranging temperature measurement points in a new energy box-type substation, including: using an infrared thermal imager to detect a piece to be tested to determine a target temperature measurement area and a corresponding reference temperature value; Determine the arrangement of temperature measurement points in the target temperature measurement area; Based on different arrangement modes, a temperature sensor is used to detect the temperature measurement points to obtain at least three average temperature values of the target temperature measurement area; The final arrangement of the temperature sensors is determined according to at least three of the average temperature values and the reference temperature value.
[0005] Optionally, based on different arrangement modes, using temperature sensors to detect the temperature measurement points to obtain at least three average temperature values of the target temperature measurement area includes: Based on each arrangement mode, a temperature sensor is arranged at the temperature measurement point, and an average temperature value of the target temperature measurement area is detected and obtained; Based on at least three different arrangements, at least three average temperature values are detected and obtained.
[0006] Optionally, the step of arranging the temperature sensor at the temperature measurement point based on each arrangement mode, and detecting and obtaining the average temperature value of the target temperature measurement area includes: Based on each of the arrangement modes, at least one of the temperature sensors is arranged at each of the temperature measurement points; Detecting the temperature measurement point using the temperature sensor to obtain the measured temperature of the temperature measurement point; Based on the measured temperature, an average temperature value corresponding to the arrangement is calculated.
[0007] Optionally, two temperature sensors are arranged at each temperature measurement point, one of the temperature sensors is a first temperature sensor, and the other temperature sensor is a second temperature sensor; and arranging at least one temperature sensor at each temperature measurement point includes: The first temperature sensor and the second temperature sensor are arranged at the temperature measurement point, and the first temperature sensor is in contact with the object to be measured, and there is a gap between the second temperature sensor and the object to be measured.
[0008] Optionally, the detecting the temperature measurement point by using a temperature sensor to obtain the measured temperature of the corresponding temperature measurement point includes: Using the first temperature sensor to detect and obtain a first temperature, and using the second temperature sensor to detect and obtain a second temperature; The measured temperature is calculated based on the first temperature and the second temperature.
[0009] Optionally, the calculating the measured temperature based on the first temperature and the second temperature includes: determining a preset correction factor; The measured temperature is calculated based on the first temperature, the second temperature and the preset correction coefficient.
[0010] Optionally, the calculating the measured temperature based on the first temperature, the second temperature and the preset correction coefficient includes: The measured temperature is calculated based on the formula T=αT1-T2; wherein α is the preset correction coefficient, T1 is the first temperature, T2 is the second temperature, and T is the measured temperature.
[0011] Optionally, determining the preset correction coefficient includes: Selecting a target temperature measurement point on the object to be tested; Using an infrared thermal imager to detect the target temperature measurement point to obtain a third temperature; Arrange a third temperature sensor and a fourth temperature sensor at the target temperature measurement point, so that the third temperature sensor is in contact with the object to be measured, and there is a gap between the fourth temperature sensor and the object to be measured; Using the third temperature sensor to detect and obtain a fourth temperature, and using the fourth temperature sensor to detect and obtain a fifth temperature; The preset correction coefficient is determined based on the third temperature, the fourth temperature and the fifth temperature.
[0012] Optionally, determining the preset correction coefficient based on the third temperature, the fourth temperature, and the fifth temperature includes: Based on the formula α=(K+K2) / K1, the preset correction coefficient is calculated; Wherein, α represents a preset correction coefficient, K represents the third temperature, K1 represents the fourth temperature, and K2 represents the fifth temperature.
[0013] Optionally, determining a final arrangement of the temperature sensors according to at least three of the average temperature values and the reference temperature value includes: Determining the difference between each of the average temperature values and the reference temperature value; A final arrangement is determined based on the difference and the number of temperature measurement points included in the arrangement.
[0014] In an embodiment of the present application, an infrared thermal imager is used to determine a target temperature measurement area of the test piece and a corresponding reference temperature value; temperature measurement points with different arrangements are set in the target temperature measurement area; based on different arrangements, temperature sensors are used to detect the temperature measurement points to obtain at least three average temperature values of the target temperature measurement area; based on the at least three average temperature values and the reference temperature value, a final arrangement of the temperature sensors is determined, thereby ensuring the accuracy of the temperature measurement results of the test piece while simplifying the arrangement of the temperature measurement points.
[0015] Additional aspects and advantages of the present application will be given in part in the description below, and in part will become apparent from the description below, or will be learned through the practice of the present application. BRIEF DESCRIPTION OF THE DRAWINGS
[0016] The above and / or additional aspects and advantages of the present application will become apparent and easily understood from the description of the embodiments in conjunction with the following drawings, in which: Figure 1 It is a flow chart of a method for arranging temperature measurement points in a new energy box-type substation according to an embodiment of the present application; Figure 2 It is a schematic diagram of a new energy box-type substation in an embodiment of the present application; Figure 3is a schematic diagram of the internal structure of the low-pressure chamber and the high-pressure chamber in an embodiment of the present application; Figure 4 is a flow chart of a method for confirming a preset correction coefficient in an embodiment of the present application; Figure 5 It is a schematic diagram of the local structure of the low-pressure chamber in the embodiment of the present application; Figure 6 It is a schematic top view of the local structure of the low-pressure chamber in the embodiment of the present application.
[0017] Reference numerals: 200: low voltage room; 210: frame circuit breaker; 220: partition; 230: flexible connector; 231: flexible connector b phase; 240: molded case circuit breaker; 250: main bus; 260-current transformer; 300: transformer room; 400: high voltage room. DETAILED DESCRIPTION
[0018] The embodiments of the present application will be described in detail below, and examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present application, and should not be construed as limitations on the present application. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in the field without making creative work are within the scope of protection of the present application.
[0019] The term "first" or "second" in the specification and claims of this application may include one or more of the features explicitly or implicitly. In the description of this application, unless otherwise specified, "plurality" means two or more. In addition, "and / or" in the specification and claims means at least one of the connected objects, and the character " / " generally means that the objects connected before and after are in an "or" relationship.
[0020] In the description of the present application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.
[0021] In the description of this application, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.
[0022] Before explaining the arrangement method of the temperature measurement points of the new energy box-type substation in the embodiment of the present application, the application scenario of the arrangement method of the temperature measurement points of the new energy box-type substation is specifically described: New energy box-type substation is a high-voltage switchgear, such as Figure 2 As shown, it includes a low-voltage chamber 200, a transformer chamber 300 and a high-voltage chamber 400. Since the chambers inside the box-type substation are compactly laid out, it has the advantages of small size and small footprint. However, during the long-term operation of the box-type substation, the internal components will continue to generate heat. The compact structural design makes it impossible for the heat inside the box-type substation to be quickly and effectively dissipated. Whether this heat will affect the normal operation of each component in the box-type substation is an important factor in the safe and stable operation of the box-type substation. Therefore, safety performance testing is required before the box-type substation is put into operation, among which the conventional safety performance testing method includes temperature rise experiment.
[0023] The temperature rise test simulates the temperature conditions during the actual operation of the box-type substation system, verifies whether the temperature rise of each component inside the box-type substation meets the temperature rise limit requirements, and then determines whether the internal structural design of the substation is reasonable and whether the quality of each component is qualified.
[0024] Specifically, it is necessary to set a plurality of temperature measurement points around the piece to be tested, set a temperature sensor at the temperature measurement point, and measure the temperature of the temperature measurement point by the temperature sensor to detect whether the temperature of the piece to be tested can meet the temperature limit. However, at the beginning of the current temperature rise experiment, it is necessary to arrange dense temperature measurement points to obtain accurate measurement temperature. However, arranging dense temperature measurement points will not only make the measurement process complicated, but also increase the experimental cost. To this end, the present application provides a method for arranging temperature measurement points of a new energy box-type substation, which can not only reduce the complexity of the measurement process, bring convenience to experimental operators, but also reduce the experimental cost.
[0025] In conjunction with the accompanying drawings, a method for arranging temperature measurement points of a new energy box-type substation provided by an embodiment of the present application is described in detail below through specific embodiments and application scenarios.
[0026] like Figure 1As shown, according to some embodiments of the present application, a method for arranging temperature measurement points of a new energy box-type substation includes the following steps: Step 110: Use an infrared thermal imager to detect the object to be tested to determine a target temperature measurement area and a corresponding reference temperature value.
[0027] Step 120: determine the arrangement of the temperature measurement points in the target temperature measurement area.
[0028] Step 130: Based on different arrangement modes, a temperature sensor is used to detect the temperature measurement points to obtain at least three average temperature values of the target temperature measurement area.
[0029] Step 140: Determine a final arrangement of the temperature sensors according to at least three of the average temperature values and the reference temperature value.
[0030] According to some embodiments of the present application, an infrared thermal imager is used to detect the object to be tested, and a target temperature measurement area and a corresponding reference temperature value are determined; the arrangement of temperature measurement points in the target temperature measurement area is determined; based on different arrangement methods, a temperature sensor is used to detect the temperature measurement points to obtain at least three average temperature values of the target temperature measurement area; based on at least three average temperature values and the reference temperature value, the final arrangement of the temperature sensor is determined. This arrangement method can not only accurately obtain the temperature of the object to be tested, but also reduce the complexity of the operation of the temperature rise experiment.
[0031] Specifically, the arrangement of the temperature measurement points includes: the number of temperature measurement points arranged in the target temperature measurement area, and the arrangement structure of multiple temperature measurement points in the target temperature measurement area. For example, M rows and N columns of arranged temperature measurement points can be set in the target temperature measurement area, the number of temperature measurement points is M×N, and the temperature measurement points are arranged in a rectangular array.
[0032] Furthermore, by changing the number of rows and / or columns of the temperature measurement points, and changing the spacing between two adjacent temperature measurement points, a variety of different arrangements can be obtained. It is understandable that the spacing between each temperature measurement point can be flexibly adjusted according to actual measurement requirements, and this embodiment does not limit it.
[0033] In another embodiment, the arrangement structure of the temperature measurement points arranged in the target temperature measurement area can be a rectangular array, a circular array, a ring array, a hexagonal array, etc. It can be understood that the specific arrangement structure of the temperature measurement points can be adjusted according to actual needs, and this embodiment does not limit it.
[0034] In addition, the interval distance between two adjacent temperature measurement points may be equal or unequal, and the specific interval distance may be flexibly adjusted according to actual needs, and the embodiments of the present application do not limit it.
[0035] Specifically, the temperature measurement points are arranged in the target temperature measurement area in M rows and N columns as a first arrangement method, a temperature sensor is set at each temperature measurement point to detect M×N temperature measurement points, and the temperature value of each temperature measurement point is obtained, and the average temperature value of the M×N temperature values is used as the first average temperature value of the temperature measurement points in the target temperature measurement area.
[0036] Furthermore, the temperature measurement points in the target temperature measurement area are reduced by one row and one column, that is, M-1 rows and N-1 columns of temperature measurement points are set in the target temperature measurement area as the second arrangement of the temperature measurement points, and each temperature measurement point is detected, and the second average temperature value is obtained in the same way. Similarly, the number of temperature measurement points is further reduced as the third arrangement of the temperature measurement points to obtain a third average temperature value. Optionally, based on different arrangements, a temperature sensor is used to detect the temperature measurement points to obtain at least three average temperature values of the target temperature measurement area, including arranging the temperature sensor at the temperature measurement point based on each arrangement, and detecting and obtaining the average temperature value of the target temperature measurement area; based on at least three different arrangements, detecting and obtaining at least three average temperature values.
[0037] In an embodiment of the present application, at least three different arrangements of temperature measurement points in the target temperature measurement area are determined. Based on the first arrangement, temperature sensors are arranged at the temperature measurement points, and the temperatures of the temperature measurement points are detected by the temperature sensors. The average temperature value of the target temperature measurement area is calculated based on the measurement results. Similarly, the average temperature value of the target temperature measurement area based on the second arrangement can be obtained, and finally at least three average temperature values of the target temperature measurement area are obtained.
[0038] Optionally, based on each arrangement mode, the temperature sensors are arranged at the temperature measurement points, and the average temperature value of the target temperature measurement area is detected and obtained, including arranging at least one temperature sensor at each temperature measurement point based on each arrangement mode; detecting the temperature measurement points using the temperature sensors to obtain the measured temperatures of the temperature measurement points; and calculating the average temperature value corresponding to the arrangement mode based on the measured temperatures.
[0039] In an embodiment of the present application, at least one temperature sensor is arranged at each temperature measurement point to detect the temperature measurement point using the temperature sensor, and then multiple measurement temperatures can be detected by the temperature sensors at multiple measurement points, and the average value of the multiple measurement temperatures is calculated as the final measurement temperature of the temperature measurement point, which can effectively improve the accuracy and reliability of the measurement results of the temperature measurement points.
[0040] Optionally, two temperature sensors are arranged at each temperature measurement point, one of which is a first temperature sensor and the other is a second temperature sensor; arranging at least one temperature sensor at each temperature measurement point includes: arranging the first temperature sensor and the second temperature sensor at the temperature measurement point, and making the first temperature sensor contact with the piece to be measured, with a gap between the second temperature sensor and the piece to be measured.
[0041] In the embodiment of the present application, two temperature sensors are arranged at each temperature measurement point, wherein the probe of one temperature sensor is in contact with the surface of the object to be measured, and is used to measure the surface temperature of the object to be measured, and the measured temperature is used as the first temperature, and the probe of the other temperature sensor has a gap with the surface of the object to be measured, and is used to measure the temperature of the environment near the surface of the object to be measured, and the measured temperature is used as the second temperature. By using two temperature sensors to detect the temperature of the temperature measurement point at the same time, the error caused by the measurement of a single temperature sensor can be reduced, and the accuracy of the temperature measurement value of the temperature measurement point can be improved.
[0042] Specifically, the probe of the first temperature sensor can be pasted on the surface of the object to be tested to detect the temperature of the surface of the object to be tested, and the second temperature sensor can be fixedly connected to the first temperature sensor, and a gap is left between the probe of the second temperature sensor and the surface of the object to be tested to detect the temperature of the environment near the surface of the object to be tested; the specific connection method of the first temperature sensor and the second temperature sensor can be flexibly adjusted, and this embodiment does not limit it.
[0043] Optionally, the temperature measurement point is detected by a temperature sensor to obtain the measured temperature of the corresponding temperature measurement point, including obtaining a first temperature by detecting with the first temperature sensor and obtaining a second temperature by detecting with the second temperature sensor; and the measured temperature is calculated based on the first temperature and the second temperature.
[0044] In an embodiment of the present application, two temperature sensors are arranged at each temperature measurement point, and two temperature measured values can be measured using the two temperature sensors, and then the measured temperature of the corresponding temperature measurement point can be determined by averaging the two temperature measured values. Determining the measured temperature of the temperature measurement point in this way is not only simple and convenient to calculate, but also can improve the accuracy of the measured temperature. It is understandable that when more than two temperature sensors are selected, more than two temperature values can be obtained accordingly, and the weighted average of the two or more temperature values can be calculated, and the weighted average is used as the measured temperature of the temperature measurement point. The specific calculation method of the measured temperature can be flexibly selected according to actual needs, and this embodiment does not limit it.
[0045] Optionally, the calculating the measured temperature based on the first temperature and the second temperature includes determining a preset correction coefficient; and the calculating the measured temperature based on the first temperature, the second temperature and the preset correction coefficient.
[0046] In the embodiment of the present application, by correcting the first temperature and the second temperature with a preset correction coefficient, the error in the temperature sensor measurement process can be reduced, the accuracy of the temperature values measured at the temperature measurement points can be improved, and the reliability of the temperature measurement point arrangement method can be improved.
[0047] Optionally, the measured temperature is calculated based on the first temperature, the second temperature and the preset correction coefficient, including calculating the measured temperature based on the formula T=αT1-T2; wherein α is the preset correction coefficient, T1 is the first temperature, T2 is the second temperature, and T is the measured temperature.
[0048] In the embodiment of the present application, the measured temperature is calculated based on the formula T=αT1-T2, which can improve the accuracy of the correction process of the first temperature and the second temperature value, and then improve the accuracy of obtaining the measured temperature, thereby reducing the measurement error of the temperature sensor and making the measurement result more accurate and reliable.
[0049] Alternatively, if Figure 4 As shown, the step of determining the preset correction coefficient includes the following steps: Step 510: Select a target temperature measurement point on the object to be tested.
[0050] Step 520: Use an infrared thermal imager to detect the target temperature measurement point to obtain a third temperature.
[0051] Step 530: Arrange the third temperature sensor and the fourth temperature sensor at the target temperature measurement point, so that the third temperature sensor is in contact with the device to be measured, and there is a gap between the fourth temperature sensor and the device to be measured.
[0052] Step 540: Utilize the third temperature sensor to detect and obtain a fourth temperature, and utilize the fourth temperature sensor to detect and obtain a fifth temperature.
[0053] Step 550: Determine the preset correction coefficient based on the third temperature, the fourth temperature and the fifth temperature.
[0054] In an embodiment of the present application, the preset correction coefficient corresponding to each component in the box-type substation can be obtained through the above steps. When correcting the measured temperature of the target temperature measurement area, the corresponding preset correction coefficient can be selected according to the different target temperature measurement areas, which can improve the accuracy of the measured temperature; in addition, the preset correction coefficient provides a unified temperature correction standard for temperature rise experimental tests of box-type substations with the same structure.
[0055] Specifically, an infrared thermal imager is used to perform temperature detection on a target temperature measurement point. During the detection, for the safety of the operators, it is necessary to turn off the power of the box-type substation so that the box-type substation temporarily stops operating. After the power of the box-type substation is turned off, the cabinet door of the substation is immediately opened to perform a temperature test on the target temperature measurement point to obtain the temperature of the target temperature measurement point.
[0056] In addition, in order to improve the accuracy of the measurement results, the temperature measurement of the target temperature measurement point needs to be repeated at least three times. After the first temperature measurement of the target temperature measurement point is completed by the infrared imager, the power is turned on to restart the box-type substation, and after a period of stable operation, the power is turned off again to measure the target temperature measurement point for the second time. Repeat the above steps until at least three measurement values are obtained, and the average value of at least three measurement values is taken as the third temperature.
[0057] The third temperature sensor is set on the piece to be tested so as to contact the piece to be tested, and then the fourth temperature can be measured by the third temperature sensor. The fourth temperature sensor is connected to the third temperature sensor, and there is a gap between the third temperature sensor and the piece to be tested, which is used to detect the ambient temperature near the piece to be tested, and then the fifth temperature can be measured by the fourth temperature sensor. It should be noted that the third temperature sensor and the fourth temperature sensor can be placed inside the box-type substation, and the temperature of the target temperature measurement point can be monitored in real time during the operation of the box-type substation.
[0058] It can be understood that, corresponding to the third temperature, the temperature measurement of the target temperature measurement point using the third temperature sensor and the fourth temperature sensor also needs to be repeated at least three times to obtain at least three measurement values, and the at least three measurement values are averaged to serve as the fourth temperature and the fifth temperature.
[0059] Optionally, determining the preset correction coefficient based on the third temperature, the fourth temperature and the fifth temperature includes: calculating the preset correction coefficient based on the formula α=(K+K2) / K1; wherein α represents the preset correction coefficient, K represents the third temperature, K1 represents the fourth temperature, and K2 represents the fifth temperature.
[0060] In the embodiment of the present application, the temperature of the target temperature measurement point is detected multiple times by an infrared thermal imager, a third temperature sensor, and a fourth temperature sensor, and multiple temperature values are obtained accordingly. The multiple temperature values are averaged to finally obtain the third temperature, the fourth temperature, and the fifth temperature. The third temperature, the fourth temperature, and the fifth temperature are substituted into the formula α=(K+K2) / K1 to calculate the preset correction coefficient, so that the preset correction coefficient obtained is highly accurate, thereby improving the reliability of the temperature rise test results.
[0061] Optionally, determining the final arrangement of the temperature sensors based on at least three of the average temperature values and the reference temperature value includes: determining the difference between each of the average temperature values and the reference temperature value; and determining the final arrangement based on the difference and the number of temperature measurement points included in the arrangement.
[0062] In an embodiment of the present application, the difference between each of the average temperature values and the reference temperature value is calculated, and by comparing the difference sizes corresponding to different arrangements and the number of temperature measurement points included in the arrangement corresponding to the difference, an arrangement with a smaller difference and a smaller number of temperature measurement points is selected as the final arrangement. This not only ensures the accuracy of the temperature measured in the target temperature measurement area, but also reduces the number of temperature measurement points required to be arranged in the temperature rise experiment, thereby reducing the operational complexity of the temperature rise experiment, thereby reducing the workload of the experimenter; at the same time, it also reduces the experimental cost of the temperature rise experiment.
[0063] The following is a detailed explanation of the arrangement method of temperature measurement points of a new energy box-type substation provided by the present application through a specific embodiment. Figure 3 As shown, the low voltage room 200 in the box-type substation includes a frame circuit breaker 210, a flexible connector 230, a molded case circuit breaker 240, a main bus 250 and a current transformer 260. One end of the flexible connector 230 is connected to the frame circuit breaker 210, and the other end is connected to the current transformer 260. One end of the main bus 250 is connected to the frame circuit breaker 210, and the other end is connected to the current transformer 260. The molded case circuit breaker 240 is connected to the frame circuit breaker 210. Figure 5 and Figure 6As shown, the flexible connector 230 includes a flexible connector a phase, a flexible connector b phase 231 and a flexible connector c phase arranged in sequence, and a partition 220 is installed between two adjacent phases, and the partition 220 is connected to the frame circuit breaker 210.
[0064] Since the partition 220 blocks the air circulation near the soft connection b phase 231, the temperature there is relatively high. Therefore, the soft connection b phase 231 is used as an example of the device to be tested. When the device to be tested is other devices, the same can be applied and will not be repeated here.
[0065] The temperature of the soft connection b phase 231 is detected by an infrared thermal imager to obtain a temperature distribution diagram corresponding to the soft connection b phase 231. Different colors on the temperature distribution diagram represent the temperature. The area with the highest temperature in the temperature distribution diagram is selected by analysis, and the position of the area corresponding to the soft connection b phase 231 is used as the target temperature measurement area, and the corresponding temperature is used as the reference temperature value. It can be seen from the temperature distribution diagram corresponding to the soft connection b phase 231 that the temperature of the soft connection b phase 231 is the highest at 2cm-6cm away from the frame circuit breaker 210. Figure 5 Therefore, the X area is taken as the target temperature measurement area, and the corresponding temperature of 92°C is taken as the reference temperature value.
[0066] In the X region, 20 temperature measurement points are evenly arranged in 5 rows and 4 columns as the first arrangement of the temperature measurement points. The temperature sensor is used to detect the 20 temperature measurement points, and the first average temperature value is 92.2°C. In the X region, 12 temperature measurement points are evenly arranged in 4 rows and 3 columns as the second arrangement of the temperature measurement points. The temperature sensor is used to detect the 12 temperature measurement points, and the second average temperature value is 92.1°C. In the X region, 6 temperature measurement points are evenly arranged in 3 rows and 2 columns as the third arrangement of the temperature measurement points. The temperature sensor is used to detect the 6 temperature measurement points, and the third average temperature value is 89.6°C.
[0067] The reference temperature values of other components inside the box-type substation and the average temperature values corresponding to each arrangement method can also be obtained through the above steps, and the specific data are shown in Table 1. Among them, different arrangements of temperature measurement points can be flexibly adjusted according to needs.
[0068] Table 1
[0069] It can be seen from Table 1 that the reference temperature of the X region is 92.3°C, the first average temperature is 92.2°C, the difference ΔT1 is 0.1°C, the second average temperature is 92.1°C, the difference ΔT2 is 0.2°C, and the third average temperature is 89.6°C, the difference ΔT3 is 2.7°C. It can be seen from the three differences ΔT that the difference ΔT2 of the second average temperature is not only relatively small, but also the number of temperature measurement points included in the corresponding arrangement is small. Therefore, the second arrangement corresponding to the second average temperature is selected as the final arrangement of the temperature sensor.
[0070] The following describes in detail the method for determining the preset correction coefficient in the present application by taking the preset temperature measurement point on the soft connection b phase 231 as the target detection point as an example.
[0071] The temperature of the soft connection b phase 231 is detected by using an infrared thermal imager, and the third temperature K of the soft connection b phase 231 is 91.2°C. The fourth temperature K1 of the soft connection b phase 231 is 79.7°C obtained by the third temperature sensor. The fifth temperature K2 of the soft connection b phase 231 is 67.5°C obtained by the fourth temperature sensor. The preset correction coefficient α of the soft connection b phase 231 is calculated to be 1.99 by the formula α=(K+K2) / K1.
[0072] Similarly, the preset correction coefficient α of the preset temperature measurement points on other devices inside the box-type substation can also be obtained. The specific data is shown in Table 2 below: Table 2
[0073] It can be seen from Table 2 that the value range of the preset correction coefficient α of the preset temperature measurement point on each device in the box-type substation is between 1.7 and 2.1. The box-type substation also includes other devices in addition to the devices shown in Table 2. The temperature of these devices is relatively low, and the preset correction coefficient α can be selected in the range of 1.7 to 2.1. For example, the preset correction coefficient α can be 2. It should be noted that when correcting the measured temperature of the target temperature measurement area, the corresponding preset correction coefficient can be selected according to the different target temperature measurement areas, which can further improve the accuracy of the measured temperature.
[0074] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "illustrative embodiments", "examples", "specific examples", or "some examples" means that the specific features, structures, materials, or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described may be combined in any one or more embodiments or examples in a suitable manner.
[0075] Although the embodiments of the present application have been shown and described, those skilled in the art will appreciate that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present application, and that the scope of the present application is defined by the claims and their equivalents.
Claims
1. A method for arranging temperature measurement points in a new energy box-type substation, characterized in that: include: Use an infrared thermal imager to detect the test piece to determine the target temperature measurement area and the corresponding reference temperature value; Determine the arrangement of temperature measurement points in the target temperature measurement area; Based on different arrangement modes, a temperature sensor is used to detect the temperature measurement points to obtain at least three average temperature values of the target temperature measurement area; The final arrangement of the temperature sensors is determined according to at least three of the average temperature values and the reference temperature value.
2. The arrangement method according to claim 1, characterized in that: The method of using a temperature sensor to detect the temperature measurement points based on different arrangement modes to obtain at least three average temperature values of the target temperature measurement area includes: Based on each arrangement mode, a temperature sensor is arranged at the temperature measurement point, and an average temperature value of the target temperature measurement area is detected and obtained; Based on at least three different arrangements, at least three average temperature values are detected and obtained.
3. The arrangement method according to claim 2, characterized in that: The method of arranging the temperature sensor at the temperature measurement point based on each arrangement mode and detecting and obtaining the average temperature value of the target temperature measurement area includes: Based on each of the arrangement modes, at least one of the temperature sensors is arranged at each of the temperature measurement points; Detecting the temperature measurement point using the temperature sensor to obtain the measured temperature of the temperature measurement point; Based on the measured temperature, an average temperature value corresponding to the arrangement is calculated.
4. The arrangement method according to claim 3, characterized in that: Two temperature sensors are arranged at each temperature measurement point, wherein one of the temperature sensors is a first temperature sensor and the other temperature sensor is a second temperature sensor; Arranging at least one temperature sensor at each temperature measurement point comprises: The first temperature sensor and the second temperature sensor are arranged at the temperature measurement point, and the first temperature sensor is in contact with the object to be measured, and there is a gap between the second temperature sensor and the object to be measured.
5. The arrangement method according to claim 4, characterized in that: The detecting the temperature measurement point by using a temperature sensor to obtain the measured temperature of the corresponding temperature measurement point includes: Using the first temperature sensor to detect and obtain a first temperature, and using the second temperature sensor to detect and obtain a second temperature; The measured temperature is calculated based on the first temperature and the second temperature.
6. The arrangement method according to claim 5, characterized in that: The calculating the measured temperature based on the first temperature and the second temperature includes: determining a preset correction factor; The measured temperature is calculated based on the first temperature, the second temperature and the preset correction coefficient.
7. The arrangement method according to claim 6, characterized in that: The calculating the measured temperature based on the first temperature, the second temperature and the preset correction coefficient includes: The measured temperature is calculated based on the formula T=αT1-T2; wherein α is the preset correction coefficient, T1 is the first temperature, T2 is the second temperature, and T is the measured temperature.
8. The arrangement method according to claim 6, characterized in that: Determining the preset correction coefficient includes: Selecting a target temperature measurement point on the object to be tested; Using an infrared thermal imager to detect the target temperature measurement point to obtain a third temperature; Arrange a third temperature sensor and a fourth temperature sensor at the target temperature measurement point, so that the third temperature sensor is in contact with the object to be measured, and there is a gap between the fourth temperature sensor and the object to be measured; Using the third temperature sensor to detect and obtain a fourth temperature, and using the fourth temperature sensor to detect and obtain a fifth temperature; The preset correction coefficient is determined based on the third temperature, the fourth temperature and the fifth temperature.
9. The arrangement method according to claim 8, characterized in that: The determining the preset correction coefficient based on the third temperature, the fourth temperature and the fifth temperature includes: Based on the formula α=(K+K2) / K1, the preset correction coefficient is calculated; Wherein, α represents a preset correction coefficient, K represents the third temperature, K1 represents the fourth temperature, and K2 represents the fifth temperature.
10. The arrangement method according to any one of claims 1 to 9, characterized in that: The determining of a final arrangement of the temperature sensors according to at least three of the average temperature values and the reference temperature value comprises: Determining the difference between each of the average temperature values and the reference temperature value; A final arrangement is determined based on the difference and the number of temperature measurement points included in the arrangement.
Citation Information
Patent Citations
Method for determining the surface temperature of a component and measuring device for carrying out the method
DE102023123698A1
Power semiconductor module arrangement comprising a temperature sensor
EP3926679A1
Temperature sensor and temperature distribution measuring device
JP2010121979A
System and method for hudging and controlling abnormal statre of power distribution facility
KR102272834B1
Method, apparatus, and program for controlling temperature within a heating system
US20060173646A1