Crystal oscillator frequency offset test method, device, equipment and medium

Abstract

The invention discloses a crystal oscillator frequency offset test method, device and equipment and a medium, and the method comprises the steps: obtaining a waveform image detected by a detector if input crystal oscillator specification information is received; determining a reference frequency corresponding to the crystal oscillator specification information according to a preset frequency determination rule and the waveform image; performing deviation analysis on the waveform image and the reference frequency according to a preset deviation analysis rule to obtain a corresponding deviation analysis result; and judging whether the deviation analysis result accords with the crystal oscillator specification information or not to obtain a corresponding frequency deviation test result. According to the test method, the waveform image and the reference frequency can be analyzed by obtaining the waveform image and combining the specification information of the crystal oscillator to obtain the deviation analysis result, so that the test result of whether the frequency deviation exists or not is accurately obtained, and the accuracy of testing the crystal oscillator in the circuit board is greatly improved.

Description

Technical Field

[0001] The present invention relates to the field of intelligent testing technology, and in particular to a crystal oscillator frequency deviation testing method, device, equipment and medium. Background Art

[0002] Crystal oscillators are commonly used components in circuit boards. In order to ensure that the circuit boards can work stably, the frequency deviation of the crystal oscillators needs to be measured before the circuit boards leave the factory. There are several common crystal oscillator frequency deviation test methods in current technical methods, such as frequency meter method, oscilloscope detection method and spectrum analyzer method. However, the accuracy of the instruments used for measurement in the frequency meter method and oscilloscope detection method is low; the spectrum analyzer can meet the requirements of high-precision crystal oscillator testing, but its price is relatively high, and it is impossible to measure the crystal oscillator at low cost. Therefore, the technical methods used for crystal oscillator measurement in the prior art have the problem of low measurement accuracy. Summary of the invention

[0003] The embodiments of the present invention provide a crystal oscillator frequency deviation testing method, device, equipment and medium, aiming to solve the problem of low measurement accuracy existing in the technical methods used for crystal oscillator measurement in the prior art.

[0004] In a first aspect, an embodiment of the present invention provides a crystal oscillator frequency deviation test method, wherein the test method is applied to a test terminal, the test terminal is connected to a detector for communication to achieve data information transmission, the probe of the detector is close to the crystal oscillator to be tested to perform a frequency deviation test on the crystal oscillator to be tested, and the test method includes: If the input crystal oscillator specification information is received, a waveform image detected by the detector is obtained; Determine a reference frequency corresponding to the crystal oscillator specification information according to a preset frequency determination rule and the waveform image; Performing deviation analysis on the waveform image and the reference frequency according to a preset deviation analysis rule to obtain a corresponding deviation analysis result; It is judged whether the deviation analysis result conforms to the crystal oscillator specification information to obtain a corresponding frequency deviation test result.

[0005] In a second aspect, an embodiment of the present application further provides a crystal oscillator frequency deviation test device, wherein the test device is configured in a test terminal, the test terminal is communicatively connected with a detector to realize the transmission of data information, the probe of the detector is close to the crystal oscillator to be tested to perform a frequency deviation test on the crystal oscillator to be tested, and the test device includes: A waveform image acquisition unit, configured to acquire a waveform image detected by the detector upon receiving input crystal oscillator specification information; A reference frequency acquisition unit, used to determine a reference frequency corresponding to the crystal oscillator specification information according to a preset frequency determination rule and the waveform image; A deviation analysis result acquisition unit, used to perform deviation analysis on the waveform image and the reference frequency according to a preset deviation analysis rule to obtain a corresponding deviation analysis result; The frequency deviation test result acquisition unit is used to determine whether the deviation analysis result conforms to the crystal oscillator specification information, and obtain a corresponding frequency deviation test result.

[0006] In a third aspect, an embodiment of the present application further provides a computer device, the computer device comprising a processor, a communication interface, a memory and a communication bus, wherein the processor, the communication interface and the memory communicate with each other via the communication bus; Memory, used to store computer programs; The processor is used to implement the crystal oscillator frequency deviation testing method as described in the first aspect above when executing the program stored in the memory.

[0007] In a fourth aspect, an embodiment of the present application further provides a computer-readable storage medium having a computer program stored thereon, wherein when the computer program is executed by a processor, the steps of the crystal oscillator frequency deviation testing method as described in the first aspect are implemented.

[0008] The embodiment of the present invention provides a crystal oscillator frequency deviation test method, device, equipment and medium, the method comprising: if the input crystal oscillator specification information is received, obtaining the waveform image detected by the detector; determining the reference frequency corresponding to the crystal oscillator specification information according to the preset frequency determination rule and the waveform image; performing deviation analysis on the waveform image and the reference frequency according to the preset deviation analysis rule to obtain the corresponding deviation analysis result; judging whether the deviation analysis result conforms to the crystal oscillator specification information to obtain the corresponding frequency deviation test result. The above-mentioned test method can obtain the waveform image and analyze the waveform image and the reference frequency in combination with the crystal oscillator specification information to obtain the deviation analysis result, thereby accurately obtaining the test result of whether there is a frequency deviation, which greatly improves the accuracy of testing the crystal oscillator in the circuit board. BRIEF DESCRIPTION OF THE DRAWINGS

[0009] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other accompanying drawings can be obtained based on these accompanying drawings without paying any creative work.

[0010] Figure 1 A method flow chart of a crystal oscillator frequency deviation testing method provided by an embodiment of the present invention; Figure 2 A schematic diagram of an application scenario of the crystal oscillator frequency deviation testing method provided by an embodiment of the present invention; Figure 3 An application effect diagram of the crystal oscillator frequency deviation testing method provided by an embodiment of the present invention; Figure 4 A schematic block diagram of a crystal oscillator frequency deviation testing device provided by an embodiment of the present invention; Figure 5 A schematic block diagram of a computer device provided in an embodiment of the present invention. DETAILED DESCRIPTION

[0011] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0012] It should be understood that when used in this specification and the appended claims, the terms "include" and "comprises" indicate the presence of described features, integers, steps, operations, elements and / or components, but do not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components and / or combinations thereof.

[0013] It should also be understood that the terms used in the present specification are only for the purpose of describing specific embodiments and are not intended to limit the present invention. As used in the present specification and the appended claims, unless the context clearly indicates otherwise, the singular forms "a", "an" and "the" are intended to include plural forms.

[0014] It should be further understood that the term "and / or" used in the present description and the appended claims refers to and includes any and all possible combinations of one or more of the associated listed items.

[0015] See also Figure 1 , as shown in the figure, the embodiment of the present application discloses a crystal oscillator frequency deviation testing method; Figure 2 As shown, the method is applied to a test terminal 10, the test terminal 10 is connected to a detector 20 for communication to achieve data information transmission, and the probe of the detector 20 is close to the crystal oscillator to be tested to perform a frequency deviation test on the crystal oscillator to be tested. Figure 3As shown, the probe of the detector 20 is composed of a coupling coil 21 and a transmission line. The coupling coil 21 is connected to the detector 20 through a connecting line. The crystal oscillator 31 to be tested is set on the circuit board 30. The coupling coil 21 surrounds the outer side of the crystal oscillator 31 to be tested. The transmission line is a radio frequency coaxial line, and the end of the transmission line without an SMA terminal surrounds the coupling coil 21. The coupling coil 21 is used to transmit AC signals. When an AC current passes through a coil (called a primary coil), it will generate a changing electromagnetic field. This electromagnetic field will induce a current in another nearby coil (called a secondary coil), thereby realizing signal transmission. The coupling coil 21 can detect the change of the magnetic field in the crystal oscillator based on electromagnetic induction and obtain a corresponding detection signal. The detection signal is transmitted to the detector 20 for analysis to obtain a waveform image, and the waveform image is transmitted to the test terminal 10 for test analysis. Among them, the detector 20 can be a CMW500 comprehensive tester, which is an instrument specifically used to measure radio frequency. It has ultra-high precision measurement results for frequency, and its lowest measurable frequency is 70MHz. The test terminal 10 may be a terminal device with data receiving and processing functions, such as a desktop computer, a laptop computer, a tablet computer or a mobile phone. Figure 1 As shown, the method includes steps S110 to S140.

[0016] S110: If the input crystal oscillator specification information is received, a waveform image detected by the detector is obtained.

[0017] If the input crystal oscillator specification information is received, the waveform image detected by the detector is obtained. The test terminal can receive the crystal oscillator specification information input by the user, and the crystal oscillator specification information is used to record the specific information of the crystal oscillator model and specifications. The crystal oscillator specification information includes information such as the crystal oscillator type, rated frequency, and frequency tolerance range. For example, the crystal oscillator type can be a passive type, the rated frequency can be 25MHz, and the frequency tolerance range can be ±10PPM. The test terminal can correspondingly obtain the waveform image detected by the detector.

[0018] The waveform image detected by the detector contains multiple harmonic frequencies. The intervals between adjacent harmonic frequencies in the waveform image are equal, and the amplitude of the harmonic frequency decreases as the frequency increases. According to the analysis principle of French mathematician Fourier (M. Fourier), any repeated waveform can be decomposed into a sine wave component containing the fundamental frequency (main frequency) and a series of harmonics that are multiples of the fundamental frequency. The formula is as follows: V(t)=V1sin(ωt)+V2 sin(2ωt)+V3 sin(3ωt) +........; where V(t) represents the voltage value at time t, V1 represents the fundamental voltage value, ω represents the angular frequency of the fundamental wave, and V2, V3,......., etc. represent the values ​​of each harmonic voltage.

[0019] S120, determining a reference frequency corresponding to the crystal oscillator specification information according to a preset frequency determination rule and the waveform image.

[0020] The reference frequency corresponding to the crystal oscillator specification information is determined according to the preset frequency determination rule and the waveform image. The reference frequency corresponding to the crystal oscillator specification information is further determined according to the frequency determination rule and the obtained waveform image. The reference frequency is an integer multiple of the rated frequency in the crystal oscillator specification information. However, since there are multiple integer multiple frequency values ​​of the rated frequency, it is necessary to determine one of the frequency values ​​as the reference frequency.

[0021] In a specific embodiment, step S120 includes the steps of: calculating a corresponding plurality of alternative frequencies according to the rated frequency in the crystal oscillator specification information and the multiplication factor set in the frequency determination rule; and obtaining an alternative frequency closest to the main frequency in the waveform image from the plurality of alternative frequencies as a reference frequency.

[0022] Specifically, the rated frequency in the crystal oscillator specification information can be obtained and calculated with the multiplication factor set in the frequency determination rule, and the rated frequency can be multiplied by each multiplication factor to obtain the corresponding multiple candidate frequencies. The multiplication factor can be set to 1, 2, 3, ..., 10.

[0023] Furthermore, the frequency differences between the candidate frequencies and the main frequency in the waveform image are compared, and an candidate frequency closest to the main frequency is selected as the reference frequency according to the frequency difference, that is, an candidate frequency with the smallest frequency difference with the main frequency is selected as the reference frequency.

[0024] In a specific embodiment, before obtaining an alternative frequency closest to the main frequency in the waveform image from the multiple alternative frequencies as a reference frequency, it also includes: obtaining the amplitude of each harmonic frequency in the waveform image; and determining a harmonic frequency with the largest amplitude as the main frequency of the waveform image.

[0025] Specifically, since the waveform image contains multiple harmonic frequencies, the amplitude of each harmonic frequency in the waveform image can be obtained respectively. The amplitude of the harmonic frequency is also the harmonic intensity of the corresponding harmonic frequency. The larger the amplitude, the higher the harmonic intensity. The harmonic frequency with the largest amplitude is determined as the corresponding main frequency.

[0026] In a specific embodiment, before determining the harmonic frequency with the largest amplitude as the main frequency of the waveform image, it also includes: calculating the amplitude attenuation coefficient between adjacent harmonic frequencies; judging whether each of the amplitude attenuation coefficients is within a preset reference interval; if each of the amplitude attenuation coefficients is within the reference interval, executing the step of determining the harmonic frequency with the largest amplitude as the main frequency of the waveform image; if any of the amplitude attenuation coefficients is not within the reference interval, generating a prompt message of waveform abnormality.

[0027] Furthermore, in order to improve the detection accuracy, the amplitude attenuation coefficient between adjacent harmonic frequencies in the waveform image can be calculated; that is, the amplitude of the previous harmonic frequency is divided by the amplitude of the next harmonic frequency, and the obtained ratio is the corresponding amplitude attenuation coefficient. Then, each group of two adjacent harmonic frequencies can be calculated to obtain an amplitude attenuation coefficient. Furthermore, it is determined whether each amplitude attenuation coefficient is within the preset reference interval. Since the attenuation process is nonlinear, the reference interval corresponding to each different amplitude attenuation coefficient can be calculated based on the harmonic frequency corresponding to the amplitude attenuation coefficient. Specifically, the reference interval can be expressed as [0.75R i , 1.2 R i ], where R i is the reference attenuation coefficient, and its calculation process can be expressed by formula (1): (1); Wherein, i is the serial number of the reference attenuation coefficient (the value of i is an integer between 1 and 10). For example, the serial number of the reference attenuation coefficient corresponding to the first harmonic frequency and the second harmonic frequency is 1, and one reference attenuation coefficient corresponds to one amplitude attenuation coefficient. The above calculation formula can be used to determine the reference attenuation coefficient corresponding to each amplitude attenuation coefficient, and the corresponding reference interval can be determined based on the reference attenuation coefficient; then each amplitude attenuation coefficient corresponds to a reference interval.

[0028] It is further determined whether each amplitude attenuation coefficient is within the corresponding reference interval. If they are all within the corresponding reference, the step of obtaining the main frequency of the waveform image is executed; if any amplitude attenuation coefficient is not within the corresponding reference interval, it is determined that the current waveform image is abnormal, and a waveform abnormality prompt message can be generated to prompt the current tester.

[0029] In a specific embodiment, before calculating the amplitude attenuation coefficient between adjacent harmonic frequencies, it also includes: judging whether the amplitude of the harmonic frequency with the largest amplitude is greater than a preset amplitude threshold; if the amplitude of the harmonic frequency with the largest amplitude is greater than the amplitude threshold, executing the step of calculating the amplitude attenuation coefficient between adjacent harmonic frequencies; if the amplitude of the harmonic frequency with the largest amplitude is not greater than the amplitude threshold, generating a prompt message that the wave signal is weak.

[0030] Furthermore, in order to improve the accuracy of the detection, it is also possible to determine whether the amplitude of the harmonic frequency with the largest amplitude is greater than the preset amplitude threshold. If it is greater, it indicates that the amplitude of the harmonic frequency meets the test requirements and the signal strength of the current harmonic frequency is strong. If it is not greater, it indicates that the signal strength of the harmonic frequency is weak, which may lead to inaccurate test results, that is, it indicates that the amplitude of the harmonic frequency does not meet the test requirements. If it is greater than the amplitude threshold, the subsequent steps of calculating the amplitude attenuation coefficient are executed; if it is not greater than the amplitude threshold, a prompt message of weak wave signal can be generated to prompt the tester.

[0031] S130. Perform deviation analysis on the waveform image and the reference frequency according to preset deviation analysis rules to obtain corresponding deviation analysis results.

[0032] The deviation analysis is performed on the waveform image and the reference frequency according to the preset deviation analysis rule to obtain the corresponding deviation analysis result. Further, the deviation analysis is performed on the waveform image and the reference frequency according to the deviation analysis rule to obtain the deviation analysis result.

[0033] In a specific embodiment, the deviation analysis is performed on the waveform image and the reference frequency according to a preset deviation analysis rule to obtain a corresponding deviation analysis result, including: calculating the frequency deviation value between the main frequency in the waveform image and the reference frequency; calculating the reference frequency and the frequency deviation value by the analytical calculation formula in the deviation analysis rule to obtain a corresponding deviation amplitude as the corresponding deviation analysis result.

[0034] Specifically, the frequency deviation value between the main frequency and the reference frequency in the waveform image can be calculated; the reference frequency and the frequency deviation value can be further calculated using the analytical calculation formula in the deviation analysis rule. The specific calculation formula is shown in formula (2): (2); in, f 0 - f t Indicates the frequency deviation between the main frequency and the reference frequency. f 0 is the main frequency in the waveform image, f t is the reference frequency, s is the magnification, and p is the deviation amplitude.

[0035] For example, s is 10 6 , f 0 is 75000510.454Hz, f t 75MHz (75×106 Hz), the corresponding calculated deviation amplitude is 6.8PPM, where PPM (Parts Per Million) is the unit of accuracy. The obtained deviation amplitude is taken as the deviation analysis result.

[0036] S140: Determine whether the deviation analysis result meets the crystal oscillator specification information, and obtain a corresponding frequency deviation test result.

[0037] Whether the deviation analysis result meets the crystal oscillator specification information is judged to obtain the corresponding frequency deviation test result. Whether the deviation analysis result meets the crystal oscillator specification information is further judged. If the deviation analysis result meets the crystal oscillator specification information, a frequency deviation test result without frequency deviation is obtained; if the deviation analysis result does not meet the crystal oscillator specification information, a frequency deviation test result with frequency deviation is obtained.

[0038] In a specific embodiment, the determination of whether the deviation analysis result complies with the crystal oscillator specification information to obtain a corresponding frequency deviation test result includes: determining whether the deviation amplitude value in the deviation analysis result is within the frequency tolerance range in the crystal oscillator specification information to determine whether the deviation analysis result complies with the crystal oscillator specification information; if the deviation analysis result complies with the crystal oscillator specification information, obtaining a frequency deviation test result with no frequency deviation; if the deviation analysis result does not comply with the crystal oscillator specification information, obtaining a frequency deviation test result with frequency deviation.

[0039] Specifically, it can be determined whether the deviation amplitude value is within the frequency tolerance range. For example, if the frequency tolerance range in the crystal oscillator specification information is ±10PPM, the corresponding range interval is [-10PPM, 10PPM]. If the deviation amplitude value is within the frequency tolerance range, it is determined that the deviation analysis result meets the crystal oscillator specification information; if the deviation amplitude value is not within the frequency tolerance range, it is determined that the deviation analysis result does not meet the crystal oscillator specification information. Through the above judgment, the frequency deviation test result of whether there is frequency deviation can be obtained, thereby realizing accurate testing of whether the crystal oscillator to be tested has frequency deviation.

[0040] The high precision and detection depth of CMW500 can accurately measure the frequency deviation of the crystal oscillator. It can also measure the frequency deviation of the crystal oscillator without the need for an expensive spectrum analyzer, greatly reducing the cost of frequency deviation testing of the crystal oscillator.

[0041] The crystal oscillator frequency deviation test method disclosed in the above embodiment includes: if the input crystal oscillator specification information is received, the waveform image detected by the detector is obtained; the reference frequency corresponding to the crystal oscillator specification information is determined according to the preset frequency determination rule and the waveform image; the deviation analysis is performed on the waveform image and the reference frequency according to the preset deviation analysis rule to obtain the corresponding deviation analysis result; whether the deviation analysis result conforms to the crystal oscillator specification information is judged to obtain the corresponding frequency deviation test result. The above test method can obtain the deviation analysis result by acquiring the waveform image and combining the crystal oscillator specification information, analyzing the waveform image and the reference frequency, thereby accurately obtaining the test result of whether there is a frequency deviation, which greatly improves the accuracy of testing the crystal oscillator in the circuit board.

[0042] The embodiment of the present invention also provides a crystal oscillator frequency deviation test device, which can be configured in a test terminal, the test terminal is connected to a detector for communication to achieve data information transmission, the detector probe is close to the crystal oscillator to be tested to perform a frequency deviation test on the crystal oscillator to be tested, and the crystal oscillator frequency deviation test device is used to perform any embodiment of the aforementioned crystal oscillator frequency deviation test method. Specifically, please refer to Figure 4 , Figure 4 A schematic block diagram of a crystal oscillator frequency deviation testing device provided in an embodiment of the present invention.

[0043] like Figure 4 As shown, the crystal oscillator frequency deviation testing device 100 includes a waveform image acquiring unit 110 , a reference frequency acquiring unit 120 , a deviation analysis result acquiring unit 130 and a frequency deviation test result acquiring unit 140 .

[0044] The waveform image acquisition unit 110 is used to acquire the waveform image detected by the detector if the input crystal oscillator specification information is received.

[0045] The reference frequency acquisition unit 120 is used to determine the reference frequency corresponding to the crystal oscillator specification information according to a preset frequency determination rule and the waveform image.

[0046] The deviation analysis result acquisition unit 130 is used to perform deviation analysis on the waveform image and the reference frequency according to a preset deviation analysis rule to obtain a corresponding deviation analysis result.

[0047] The frequency deviation test result acquisition unit 140 is used to determine whether the deviation analysis result meets the crystal oscillator specification information, and obtain a corresponding frequency deviation test result.

[0048] The crystal oscillator frequency deviation test device provided in the embodiment of the present invention applies the above-mentioned crystal oscillator frequency deviation test method. If the input crystal oscillator specification information is received, the waveform image detected by the detector is obtained; the reference frequency corresponding to the crystal oscillator specification information is determined according to the preset frequency determination rule and the waveform image; the waveform image and the reference frequency are subjected to deviation analysis according to the preset deviation analysis rule to obtain the corresponding deviation analysis result; whether the deviation analysis result conforms to the crystal oscillator specification information is judged to obtain the corresponding frequency deviation test result. The above-mentioned test method can obtain the deviation analysis result by acquiring the waveform image and combining the crystal oscillator specification information, analyzing the waveform image and the reference frequency, thereby accurately obtaining the test result of whether there is a frequency deviation, which greatly improves the accuracy of testing the crystal oscillator in the circuit board.

[0049] The above-mentioned crystal oscillator frequency deviation testing device can be implemented in the form of a computer program, and the computer program can be run on a computer device.

[0050] See also Figure 5 , Figure 5 1 is a schematic block diagram of a computer device provided by an embodiment of the present invention. The computer device may be a test terminal for executing a crystal oscillator frequency deviation test method to test and analyze whether a crystal oscillator has a frequency deviation.

[0051] See also Figure 5 The computer device 500 includes a processor 502 , a memory and a communication interface 505 connected via a communication bus 501 , wherein the memory may include a storage medium 503 and an internal memory 504 .

[0052] The storage medium 503 can store an operating system 5031 and a computer program 5032. When the computer program 5032 is executed, the processor 502 can execute a crystal oscillator frequency deviation test method, wherein the storage medium 503 can be a volatile storage medium or a non-volatile storage medium.

[0053] The processor 502 is used to provide computing and control capabilities to support the operation of the entire computer device 500 .

[0054] The internal memory 504 provides an environment for the operation of the computer program 5032 in the storage medium 503. When the computer program 5032 is executed by the processor 502, the processor 502 can execute the crystal oscillator frequency deviation test method.

[0055] The communication interface 505 is used for network communication, such as providing data information transmission, etc. Those skilled in the art will appreciate that Figure 5The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present invention, and does not constitute a limitation on the computer device 500 to which the solution of the present invention is applied. The specific computer device 500 may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0056] The processor 502 is used to run a computer program 5032 stored in the memory to implement the corresponding functions in the above-mentioned crystal oscillator frequency deviation testing method.

[0057] Those skilled in the art will understand that Figure 5 The embodiments of the computer device shown in the figure do not constitute a limitation on the specific composition of the computer device. In other embodiments, the computer device may include more or fewer components than shown in the figure, or combine certain components, or arrange the components differently. For example, in some embodiments, the computer device may only include a memory and a processor. In such embodiments, the structure and function of the memory and the processor are the same as those of the embodiment of the present invention. Figure 5 The embodiments shown are consistent and will not be described again here.

[0058] It should be understood that in the embodiment of the present invention, the processor 502 may be a central processing unit (CPU), and the processor 502 may also be other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. Among them, the general-purpose processor may be a microprocessor or the processor may also be any conventional processor, etc.

[0059] In another embodiment of the present invention, a computer-readable storage medium is provided. The computer-readable storage medium may be a volatile or non-volatile computer-readable storage medium. The computer-readable storage medium stores a computer program, wherein when the computer program is executed by a processor, the steps included in the above-mentioned crystal oscillator frequency deviation test method are implemented.

[0060] Those skilled in the art can clearly understand that, for the convenience and simplicity of description, the specific working process of the above-described equipment, devices and units can refer to the corresponding process in the aforementioned method embodiment, and will not be repeated here. Those of ordinary skill in the art can appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented with electronic hardware, computer software or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the composition and steps of each example have been generally described in the above description according to the function. Whether these functions are executed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to exceed the scope of the present invention.

[0061] In the several embodiments provided by the present invention, it should be understood that the disclosed equipment, devices and methods can be implemented in other ways. For example, the device embodiments described above are only schematic. For example, the division of the units is only a logical function division. There may be other division methods in actual implementation. Units with the same function may also be combined into one unit. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. In addition, the mutual coupling or direct coupling or communication connection shown or discussed may be an indirect coupling or communication connection through some interfaces, devices or units, or may be an electrical, mechanical or other form of connection.

[0062] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the embodiments of the present invention.

[0063] In addition, each functional unit in each embodiment of the present invention may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0064] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention is essentially or the part that contributes to the prior art, or all or part of the technical solution can be embodied in the form of a software product, and the computer software product is stored in a computer-readable storage medium, including a number of instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present invention. The aforementioned computer-readable storage medium includes: various media that can store program codes, such as a USB flash drive, a mobile hard disk, a read-only memory (ROM, Read-Only Memory), a magnetic disk or an optical disk.

[0065] The above is only a specific embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can easily think of various equivalent modifications or replacements within the technical scope disclosed by the present invention, and these modifications or replacements should be included in the protection scope of the present invention. Therefore, the protection scope of the present invention shall be based on the protection scope of the claims.

Claims

1. A crystal oscillator frequency deviation test method, the test method is applied to a test terminal, the test terminal is connected to a detector for communication to achieve data information transmission, the probe of the detector is close to the crystal oscillator to be tested to perform a frequency deviation test on the crystal oscillator to be tested, characterized in that: The test method includes: If the input crystal oscillator specification information is received, a waveform image detected by the detector is obtained; Determine a reference frequency corresponding to the crystal oscillator specification information according to a preset frequency determination rule and the waveform image; Performing deviation analysis on the waveform image and the reference frequency according to a preset deviation analysis rule to obtain a corresponding deviation analysis result; It is judged whether the deviation analysis result conforms to the crystal oscillator specification information to obtain a corresponding frequency deviation test result.

2. The crystal oscillator frequency deviation testing method according to claim 1, characterized in that: The step of determining a reference frequency corresponding to the crystal oscillator specification information according to a preset frequency determination rule and the waveform image includes: Calculate the corresponding multiple candidate frequencies according to the rated frequency in the crystal oscillator specification information and the multiplication factor set in the frequency determination rule; An alternative frequency closest to the main frequency in the waveform image is obtained from the multiple alternative frequencies as a reference frequency.

3. The crystal oscillator frequency deviation testing method according to claim 2, characterized in that: Before acquiring an alternative frequency closest to the main frequency in the waveform image from the plurality of alternative frequencies as a reference frequency, the method further includes: Obtaining the amplitude of each harmonic frequency in the waveform image; A harmonic frequency with the largest amplitude is determined as the main frequency of the waveform image.

4. The crystal oscillator frequency deviation testing method according to claim 3, characterized in that: Before determining a harmonic frequency with the largest amplitude as the main frequency of the waveform image, the method further includes: Calculate the amplitude attenuation coefficient between adjacent harmonic frequencies; Determining whether each of the amplitude attenuation coefficients is within a preset reference interval; If all the amplitude attenuation coefficients are within the reference interval, the step of determining a harmonic frequency with the largest amplitude as the main frequency of the waveform image is performed; If any of the amplitude attenuation coefficients is not within the reference interval, a prompt message indicating waveform abnormality is generated.

5. The crystal oscillator frequency deviation testing method according to claim 4, characterized in that: Before calculating the amplitude attenuation coefficient between adjacent harmonic frequencies, the method further includes: Determine whether the amplitude of a harmonic frequency with the largest amplitude is greater than a preset amplitude threshold; If the amplitude of the harmonic frequency with the largest amplitude is greater than the amplitude threshold, the step of calculating the amplitude attenuation coefficient between adjacent harmonic frequencies is performed; If the amplitude of the harmonic frequency with the largest amplitude is not greater than the amplitude threshold, a prompt message indicating that the harmonic signal is weak is generated.

6. The crystal oscillator frequency deviation testing method according to any one of claims 2 to 4, characterized in that: The performing deviation analysis on the waveform image and the reference frequency according to the preset deviation analysis rule to obtain the corresponding deviation analysis result includes: Calculating a frequency deviation value between a main frequency in the waveform image and the reference frequency; The reference frequency and the frequency deviation value are calculated by the analytical calculation formula in the deviation analysis rule to obtain a corresponding deviation amplitude as a corresponding deviation analysis result.

7. The crystal oscillator frequency deviation testing method according to any one of claims 2 to 4, characterized in that: The determining whether the deviation analysis result meets the crystal oscillator specification information to obtain the corresponding frequency deviation test result includes: Determining whether the deviation amplitude value in the deviation analysis result is within the frequency tolerance range in the crystal oscillator specification information to determine whether the deviation analysis result complies with the crystal oscillator specification information; If the deviation analysis result meets the crystal oscillator specification information, a frequency deviation test result with no frequency deviation is obtained; If the deviation analysis result does not meet the crystal oscillator specification information, a frequency deviation test result with frequency deviation is obtained.

8. A crystal oscillator frequency deviation test device, characterized in that: The test device is configured in a test terminal, the test terminal is connected to a detector for communication to achieve data information transmission, a probe of the detector is close to a crystal oscillator to be tested to perform a frequency deviation test on the crystal oscillator to be tested, and the test device includes: A waveform image acquisition unit, configured to acquire a waveform image detected by the detector upon receiving input crystal oscillator specification information; A reference frequency acquisition unit, used to determine a reference frequency corresponding to the crystal oscillator specification information according to a preset frequency determination rule and the waveform image; A deviation analysis result acquisition unit, used to perform deviation analysis on the waveform image and the reference frequency according to a preset deviation analysis rule to obtain a corresponding deviation analysis result; The frequency deviation test result acquisition unit is used to determine whether the deviation analysis result conforms to the crystal oscillator specification information, and obtain a corresponding frequency deviation test result.

9. A computer device, characterized in that: The computer device includes a processor, a communication interface, a memory and a communication bus, wherein the processor, the communication interface and the memory communicate with each other via the communication bus; Memory, used to store computer programs; A processor, for implementing the crystal oscillator frequency deviation testing method according to any one of claims 1 to 7 when executing a program stored in a memory.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the crystal oscillator frequency deviation testing method according to any one of claims 1 to 7 are implemented.

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