Single board function test system and method and clamp board
By introducing a fixture board into the single board functional test system, the up and down state of the measured single board is controlled, which solves the problem of inefficient testing caused by frequent up and down power on the server motherboard, and achieves more efficient single board functional testing.
Patent Information
- Application Number
- CN202411924163.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-24
- Publication Date
- 2025-04-04
AI Technical Summary
During the single board function test, the server motherboard needs to frequently power up and down and enter the system, resulting in inefficient testing.
A fixture board is designed to control the up and down state of the measured board by connecting it with the power interface between the server motherboard and the measured board, thereby avoiding repeated power-on and shutdown operations on the server motherboard.
It improves the efficiency of single-board functional testing, reduces testing time, and avoids equipment damage and data loss caused by frequent plug-ins and unplugging.
Smart Images
Figure CN119758037A_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the technical field of single board function testing, and in particular to a single board function testing system, method and fixture board. Background Art
[0002] During the production of boards, board function tests are performed to ensure quality, reliability and availability. During the test, the server motherboard must be powered on and off and re-entered into the system before testing each board. For large-scale batch testing, most of the time is wasted in the waiting process of powering on and off the server motherboard and entering the system, and the efficiency of board function testing is low. Summary of the invention
[0003] In view of this, the present application provides a single board functional testing system, method and fixture board to improve the efficiency of single board functional testing.
[0004] The technical solutions provided by this application are as follows:
[0005] According to an embodiment of the first aspect of the present application, a single-board function test system is provided, the single-board function test system at least comprising: a server mainboard, a single board to be tested, and a fixture board; the fixture board is connected to a power interface of the server mainboard through a first power interface, and is connected to a power interface of the single board to be tested through a second power interface; and the fixture board further comprises an interface connected to a tested interface of the single board to be tested, and an interface connected to a detection interface on the server mainboard adapted to the tested interface;
[0006] The fixture board is used to output the power signal from the server mainboard received by the first power interface to the tested board through the second power interface when it is turned on, and control the tested interface of the tested board to power on;
[0007] The fixture board is used to cut off the power signal received by the first power interface from the server mainboard when being closed, and control the tested interface of the tested board to power off.
[0008] Optionally, the fixture board further comprises: a first logic device, a transistor controller and a transistor;
[0009] The first logic device is used to output a first level signal to the transistor controller when the fixture board is turned on, so that the transistor controller controls the transistor to be turned on based on the first level signal, so as to output the power signal from the server mainboard received by the first power interface to the tested board through the second power interface.
[0010] Optionally, the fixture board further comprises: a first logic device, a transistor controller and a transistor;
[0011] The first logic device is used to output a second level signal to the transistor controller when the fixture board is closed, so that the transistor controller controls the transistor to be disconnected based on the second level signal, thereby cutting off the power signal received by the first power interface from the server mainboard.
[0012] Optionally, the fixture board further includes: an analog switch and a second logic device, wherein the analog switch is connected to the tested interface of the tested board;
[0013] The analog switch is used to control the tested interface of the tested board to power on through the third level signal output by the second logic device when the fixture board is turned on;
[0014] Wherein, when the fixture board is turned on, the second logic device outputs the third level signal to the analog switch.
[0015] Optionally, the fixture board further includes: an analog switch, the analog switch being connected to the tested interface of the tested board;
[0016] The analog switch is used to control the tested interface of the tested board to power off when the fixture board is closed.
[0017] Optionally, the first power interface includes at least one power pin, the at least one power pin includes a voltage divider pin, and the voltage divider pin is connected to a detection interface on the server mainboard adapted to the interface under test;
[0018] The voltage-dividing pin is used to control the detection interface on the server mainboard adapted to the interface under test to maintain a high level.
[0019] Optionally, the fixture plate further comprises: a first indicator light and / or a second indicator light;
[0020] The first indicator light is used to light up when the fixture plate is opened to indicate that the fixture plate is in an opened working state; and is used to extinguish when the fixture plate is closed to indicate that the fixture plate is in a closed state;
[0021] The second indicator light is used to light up when the tested interface of the tested board is at a high level, to indicate that the tested interface of the tested board is in a powered-on state; and to turn off when the tested interface of the tested board is at a low level, to indicate that the tested interface of the tested board is in a powered-off state.
[0022] According to an embodiment of the second aspect of the present application, a single board function test method is proposed, which is applied to a single board function test system, wherein the single board function test system at least includes: a server mainboard, a single board to be tested, and a fixture board; the fixture board is connected to a power interface of the server mainboard through a first power interface, and is connected to a power interface of the single board to be tested through a second power interface; and the fixture board also includes an interface connected to a tested interface of the single board to be tested, and an interface connected to a detection interface on the server mainboard adapted to the tested interface; the method includes:
[0023] When the fixture board is turned on, the power signal from the server mainboard received by the first power interface is output to the tested board through the second power interface, and the tested interface of the tested board is controlled to be powered on;
[0024] When the fixture board is closed, the power signal received by the first power interface from the server mainboard is cut off, and the tested interface of the tested board is controlled to be powered off.
[0025] Optionally, the fixture board further includes: a first logic device, a transistor controller and a transistor; and the method further includes:
[0026] When the fixture board is turned on, the first logic device outputs a first level signal to the transistor controller, so that the transistor controller controls the transistor to be turned on based on the first level signal, so as to output the power signal from the server mainboard received by the first power interface to the tested board through the second power interface;
[0027] When the fixture board is closed, the first logic device outputs a second level signal to the transistor controller, so that the transistor controller controls the transistor to be disconnected based on the second level signal, thereby cutting off the power signal from the server mainboard received by the first power interface.
[0028] Optionally, the fixture board further includes: an analog switch and a second logic device, wherein the analog switch is connected to the tested interface of the tested board; the method further includes:
[0029] When the fixture board is turned on, the analog switch controls the tested interface of the tested board to be powered on through the third level signal output by the second logic device; wherein, when the fixture board is turned on, the second logic device outputs the third level signal to the analog switch;
[0030] When the fixture board is closed, the analog switch controls the tested interface of the tested board to power off.
[0031] According to an embodiment of the third aspect of the present application, a fixture board is provided, the fixture board is applied to a single board function test system, the single board function test system further comprising: a server mainboard and a single board to be tested;
[0032] The fixture board is connected to the power interface of the server mainboard through a first power interface, and is connected to the power interface of the tested board through a second power interface; and the fixture board also includes an interface connected to the tested interface of the tested board, and an interface connected to a detection interface on the server mainboard adapted to the tested interface;
[0033] The fixture plate is used for:
[0034] When turned on, the power signal from the server mainboard received by the first power interface is output to the tested board through the second power interface, and the tested interface of the tested board is controlled to be powered on; and, when turned off, the power signal from the server mainboard received by the first power interface is cut off, and the tested interface of the tested board is controlled to be powered off.
[0035] As can be seen from the above technical solutions, the present application deploys a fixture board between the single board under test and the server mainboard, so that when the fixture board is turned on, the first power interface connected to the power interface of the server mainboard outputs the power signal from the server mainboard to the single board under test through the second power interface connected to the power interface of the single board under test, and controls the tested interface of the single board under test to power on; when the fixture board is closed, the power signal from the server mainboard received by the first power interface is cut off, and the tested interface of the single board under test is controlled to power off. The single board under test can be replaced without repeatedly turning on and off the server mainboard to perform large-scale single board function tests, thereby improving the efficiency of single board function tests. BRIEF DESCRIPTION OF THE DRAWINGS
[0036] The accompanying drawings, which are incorporated in and constitute a part of the specification, illustrate embodiments consistent with the present application and, together with the description, serve to explain the principles of the present application.
[0037] Figure 1 A schematic diagram of a current board function test scenario provided in an embodiment of the present application;
[0038] Figure 2 A schematic diagram of a scenario of performing a single board function test through a fixture board provided in an embodiment of the present application;
[0039] Figure 3 A schematic diagram of the structure of a single board function test system provided in an embodiment of the present application;
[0040] Figure 4A flow chart of a single board function testing method provided in an embodiment of the present application;
[0041] Figure 5 A circuit diagram for implementing a single-board functional testing system provided in an embodiment of the present application. DETAILED DESCRIPTION
[0042] In order to enable those skilled in the art to better understand the technical solutions provided by the embodiments of the present application and to make the above-mentioned purposes, features and advantages of the embodiments of the present application more obvious and understandable, the technical solutions in the embodiments of the present application are further described in detail below in conjunction with the accompanying drawings.
[0043] During the production of boards, board function tests are performed to ensure the reliability and availability of board quality. During the board function test, each server motherboard must be powered on and off and the system must be entered again. In large-scale batch testing, most of the time is wasted in the process of powering on and off the server motherboard and waiting for the system to enter.
[0044] Please refer to Figure 1 , Figure 1 A schematic diagram of the current single board function test scenario provided in an embodiment of the present application.
[0045] like Figure 1 As shown, the tested board is connected to the interface on the server mainboard through a cable. During the single-board function test, the server mainboard must be powered on and off again for each test. In this case, if the tested board or cable is directly and violently plugged in, it is easy to generate impact current to damage the tested board or the server mainboard. The power supply of the tested board is detected to be abnormal, causing the whole machine to lose power, and the test cannot be carried out smoothly. It may also cause data loss, equipment damage, system crash and other problems.
[0046] In addition, a predictive hot-swap method is also proposed in the related art, that is, hot-swap is controlled through a system management tool. However, this method requires additional hardware and software requirements for each board under test, and also requires additional management tools and command issuance, which greatly increases costs.
[0047] Based on this, the present application provides a single board function testing system to achieve replacement of the single board under test without repeatedly powering on and off the server mainboard.
[0048] Please refer to Figure 2 , Figure 2 A schematic diagram of a scenario for performing single-board functional testing through a fixture board provided in an embodiment of the present application.
[0049] like Figure 2As shown, the present application deploys a fixture board between the tested board and the server mainboard, so that when the server mainboard remains powered on, the power-on and power-off conditions of the tested board can be controlled by opening and closing the fixture board.
[0050] As an embodiment, the tested interface of the tested board can be selected according to the actual situation. Figure 2 In the example, the interface under test is a low-speed interface. In actual applications, the interface under test can be one or more, and this application does not impose any restrictions on this.
[0051] Specifically, please refer to Figure 3 , Figure 3 A schematic diagram of the structure of a single-board functional testing system provided in an embodiment of the present application.
[0052] like Figure 3 As shown, the single board function test system includes:
[0053] A server mainboard 31, a tested single board 32, and a fixture board 33; the fixture board 33 is connected to the power interface 311 of the server mainboard 31 through a first power interface 331, and is connected to the power interface 321 of the tested single board 32 through a second power interface 335; and, the fixture board 33 also includes an interface 334 connected to the tested interface 322 of the tested single board 32, and an interface 332 connected to the detection interface 312 on the server mainboard 31 that is adapted to the tested interface 322.
[0054] The fixture board 33 is used to output the power signal from the server mainboard 31 received by the first power interface 331 to the tested board 32 through the second power interface 335 when it is turned on, and control the tested interface 322 of the tested board 32 to power on;
[0055] The fixture board 33 is used to cut off the power signal received by the first power interface 331 from the server mainboard 31 when being closed, and control the tested interface 322 of the tested board 32 to power off.
[0056] In this embodiment, the fixture plate 33 can be opened or closed. When the fixture plate 33 is opened, the power interface 311 of the server mainboard 31 connected to the first power interface 331 on the fixture plate 33 and the power interface 321 of the tested board 32 connected to the second power interface 335 on the fixture plate 33 will be turned on. At this time, the power interface 321 of the tested board 32 can be powered by the power interface 311 of the server mainboard 31. At the same time, the interface 334 connecting the fixture plate 33 and the tested interface 322 of the tested board 32 will also be powered on, indicating that the function of the tested board 32 can be tested at this time.
[0057] When the fixture plate 33 is closed, the connection between the power interface 311 of the server mainboard 31 connected to the first power interface 331 on the fixture plate 33 and the power interface 321 of the tested board 32 connected to the second power interface 335 on the fixture plate 33 will be cut off. At the same time, the interface 334 connecting the fixture plate 33 and the tested interface 322 of the tested board 32 will also be powered off, indicating that the functional test of the tested board 32 has been completed at this time, the tested board 32 can be replaced, and the functional test of the next tested board 32 can be carried out.
[0058] In this embodiment, the opening and closing of the clamp plate 33 can be achieved by a physical switch, and this application does not limit this.
[0059] Specifically, the fixture board 33 may further include a first logic device, a transistor controller and a transistor;
[0060] The first logic device is used to output a first level signal to the transistor controller when the fixture board 33 is turned on, so that the transistor controller controls the transistor to turn on based on the first level signal, so as to output the power signal from the server mainboard 31 received by the first power interface 331 to the tested board 32 through the second power interface 335.
[0061] In this embodiment, the connection between the first power interface 331 and the second power interface 335 can be controlled by turning on or off the transistor. When the fixture board 33 is turned on, the first logic device outputs a first level signal to the transistor controller, and the transistor controller controls the transistor to turn on based on the first level signal, so that the second power interface 335 outputs the power signal from the server mainboard 31 received by the first power interface 331 to the tested board 32.
[0062] As an embodiment, the first level signal is a high level, and the first logic device may be an AND gate, one of the inputs of which is maintained at a high level, and the other input is at a high level when the fixture board 33 is turned on; the transistor may be a triode or a field effect transistor, and when the fixture board 33 is turned on, a high level is output to the transistor controller through the first logic device, so that the transistor controller controls the triode or field effect transistor to turn on.
[0063] Exemplarily, the first logic device is used to output a second level signal to the transistor controller when the fixture board 33 is closed, so that the transistor controller controls the transistor to disconnect based on the second level signal, thereby cutting off the power signal from the server mainboard 31 received by the first power interface 331.
[0064] As an embodiment, the second level signal is a low level, the first logic device may be an AND gate, one of the inputs of the AND gate maintains a high level, and the other input is a low level when the fixture plate 33 is closed; the transistor may be a triode or a field effect transistor, and when the fixture plate 33 is closed, a low level is output to the transistor controller through the first logic device, so that the transistor controller controls the triode or field effect transistor to disconnect.
[0065] In this embodiment, the fixture board 33 may further include: an analog switch and a second logic device, the analog switch being connected to the tested interface 322 of the tested single board 32;
[0066] The analog switch is used to control the tested interface 322 of the tested single board 32 to power on through the third level signal output by the second logic device when the fixture board 33 is turned on;
[0067] When the fixture plate 33 is turned on, the second logic device outputs a third level signal to the analog switch.
[0068] The analog switch is used to control the tested interface 322 of the tested single board 32 to power off when the fixture board 33 is closed.
[0069] In this embodiment, the power on and off status of the tested interface 322 of the tested board 32 can be controlled by an analog switch deployed in the fixture board 33 .
[0070] In this embodiment, the analog switch can have two gears. When the analog switch is opened to the first gear, the third level signal output by the second logic device is received, and the power-on status of the tested interface 322 of the tested board 32 is controlled according to the third level signal; when the analog switch is opened to the second gear, the power-off status of the tested interface 322 of the tested board 32 is controlled.
[0071] The position of the analog switch is controlled by whether the clamp plate 33 is opened or closed. When the clamp plate 33 is opened, the analog switch is opened to the first position, and when the clamp plate 33 is closed, the analog switch is opened to the second position.
[0072] As an embodiment, the second logic device may be an AND gate, which is used to receive a control signal returned by the transistor controller for controlling the transistor to be turned on or off, and output a third level signal to the analog switch according to the control signal. Exemplarily, when the fixture board 33 is opened, the control signal returned by the transistor controller for controlling the transistor to be turned on or off is a high level, and the third level signal output to the analog switch is also a high level.
[0073] In this embodiment, the first power interface 331 includes at least one power pin, and the at least one power pin includes a voltage dividing pin, and the voltage dividing pin is connected to the detection interface 312 on the server mainboard 31 that is adapted to the tested interface 322 .
[0074] The voltage-dividing pin is used to control the detection interface 312 on the server mainboard 31 that is adapted to the tested interface 322 to maintain a high level.
[0075] It should be noted that the detection interface 312 of the server mainboard 31 detects whether a high-level indication signal returned by the tested board 32 is received, and an alarm is issued if the indication signal is not received.
[0076] In this embodiment, the first power interface 331 may include one or more power pins. Among the power pins included in the first power interface 331, at least one power pin serves as a voltage divider pin, and the pin is connected to the detection interface 312 on the server mainboard 31 that is adapted to the tested interface 322. In this way, a high-level indication signal can be directly returned to the detection interface 312 of the server mainboard 31 through the voltage divider pin, so that the server mainboard 31 will not issue an alarm during the process of replacing the tested single board 32.
[0077] As an embodiment, the voltage divider pin can be used as the first input of the above-mentioned first logic device. When the server mainboard 31 is turned on, the first input maintains a high level to ensure that the first logic device outputs a high level when the fixture board 33 is turned on, so as to turn on the transistor through the transistor controller; when the server mainboard 31 is turned off, the first input is a low level. At this time, the single-board function detection system is not in the single-board function detection state. Even when the fixture board 33 is turned on, the first logic device can only output a low level to reduce energy consumption.
[0078] In this embodiment, the fixture plate 33 may further include: a first indicator light and / or a second indicator light;
[0079] The first indicator light is used to light up when the clamp plate 33 is turned on to indicate that the clamp plate 33 is in the turned-on working state; and is used to extinguish when the clamp plate 33 is turned off to indicate that the clamp plate 33 is in the turned-off state;
[0080] The second indicator light is used to light up when the tested interface 322 of the tested board 32 is at a high level, to indicate that the tested interface 322 of the tested board 32 is in a powered-on state; and to go out when the tested interface 322 of the tested board 32 is at a low level, to indicate that the tested interface 322 of the tested board 32 is in a powered-off state.
[0081] In this embodiment, in order to enable the staff to intuitively determine whether the board to be tested can be replaced at present, a first indicator light and / or a second indicator light may be disposed in the fixture plate 33 .
[0082] The first indicator light may be used to reflect whether the fixture plate 33 is in an open state or a closed state, and the second indicator light may be used to reflect whether the tested interface 322 of the tested board 32 is in a powered-on state or a powered-off state.
[0083] This concludes Figure 3 Description of the single board functional test system.
[0084] In this embodiment, the description is made by taking the case where the number of the tested interface is one. In fact, the tested board may include multiple tested interfaces. This situation is similar to the solution described in this embodiment and will not be described in detail here.
[0085] The present application deploys a fixture board between the single board under test and the server mainboard, so that when the fixture board is turned on, the power signal from the server mainboard received by the first power interface connected to the power interface of the server mainboard is output to the single board under test through the second power interface connected to the power interface of the single board under test, and the tested interface of the single board under test is controlled to be powered on; when the fixture board is closed, the power signal from the server mainboard received by the first power interface is cut off, and the tested interface of the single board under test is controlled to be powered off. The single board under test can be replaced without repeatedly turning on and off the server mainboard to perform large-scale single board function tests, thereby improving the efficiency of single board function tests.
[0086] Please refer to Figure 4 , Figure 4 A flow chart of a single board functional testing method provided in an embodiment of the present application.
[0087] In this embodiment, the method is applied to Figure 3 The single-board functional testing system shown in the figure comprises at least: a server mainboard, a single board to be tested, and a fixture board; the fixture board is connected to the power interface of the server mainboard via a first power interface, and is connected to the power interface of the single board to be tested via a second power interface; and the fixture board also comprises an interface connected to the tested interface of the single board to be tested, and an interface connected to a detection interface on the server mainboard that is adapted to the tested interface.
[0088] like Figure 4 As shown, the method may include the following steps:
[0089] Step 401, when the fixture board is turned on, the power signal from the server mainboard received by the first power interface is output to the tested board through the second power interface, and the tested interface of the tested board is controlled to be powered on.
[0090] Step 402: When the fixture board is closed, the power signal received by the first power interface from the server mainboard is cut off, and the tested interface of the tested board is controlled to be powered off.
[0091] As an embodiment, the fixture board may further include: a first logic device, a transistor controller, and a transistor; the above method may further include:
[0092] When the fixture board is turned on, the first logic device outputs a first level signal to the transistor controller, so that the transistor controller controls the transistor to be turned on based on the first level signal, so as to output the power signal from the server mainboard received by the first power interface to the tested board through the second power interface;
[0093] When the fixture board is closed, the first logic device outputs a second level signal to the transistor controller, so that the transistor controller controls the transistor to be disconnected based on the second level signal, thereby cutting off the power signal from the server mainboard received by the first power interface.
[0094] As an embodiment, the fixture board may further include: an analog switch and a second logic device, wherein the analog switch is connected to a tested interface of the tested board; the above method may further include:
[0095] When the fixture board is turned on, the analog switch controls the tested interface of the tested board to be powered on through the third level signal output by the second logic device; wherein, when the fixture board is turned on, the second logic device outputs the third level signal to the analog switch;
[0096] When the fixture board is closed, the analog switch controls the tested interface of the tested board to power off.
[0097] As an embodiment, the first power interface includes at least one power pin, and the at least one power pin includes a voltage dividing pin, and the voltage dividing pin is connected to a detection interface on the server mainboard adapted to the interface under test;
[0098] The voltage-dividing pin controls the detection interface on the server mainboard adapted to the interface under test to maintain a high level.
[0099] As an embodiment, the fixture plate further includes: a first indicator light and / or a second indicator light;
[0100] The first indicator light is on when the clamp plate is turned on to indicate that the clamp plate is turned on for operation; and is off when the clamp plate is turned off to indicate that the clamp plate is turned off;
[0101] The second indicator light is used to light up when the tested interface of the tested board is at a high level to indicate that the tested interface of the tested board is in a powered-on state; and to go out when the tested interface of the tested board is at a low level to indicate that the tested interface of the tested board is in a powered-off state.
[0102] In this embodiment, the specific process of the single board function test method has been described above. Figure 3 This has been described in the introduction of the single board functional test system and will not be repeated here.
[0103] This concludes Figure 4 Description of the flow chart of the single board functional testing method.
[0104] In addition, the present application also proposes a fixture board, which is applied to a single board function test system, and the single board function test system also includes: a server mainboard and a single board to be tested;
[0105] The fixture board is connected to the power interface of the server mainboard through the first power interface, and is connected to the power interface of the tested board through the second power interface; and the fixture board also includes an interface connected to the tested interface of the tested board, and an interface connected to the detection interface on the server mainboard adapted to the tested interface;
[0106] Fixture plates are used for:
[0107] When it is turned on, the power signal from the server mainboard received by the first power interface is output to the tested board through the second power interface, and the tested interface of the tested board is controlled to be powered on; and, when it is turned off, the power signal from the server mainboard received by the first power interface is cut off, and the tested interface of the tested board is controlled to be powered off.
[0108] In this embodiment, the fixture plate can perform Figure 4 The method performed by the fixture board, the structure and function of the fixture board have been described in detail in the above single board functional test system, and will not be repeated here.
[0109] The single board function testing system provided by the present application is described below through a specific embodiment.
[0110] Please refer to Figure 5 , Figure 5 A circuit diagram for implementing a single-board functional testing system provided in an embodiment of the present application.
[0111] like Figure 5 As shown in the figure, taking the number of tested interfaces as one as an example, a fixture board is deployed between the server mainboard and the tested board. Figure 5The figure mainly shows the internal circuit diagram of the fixture board. There are physical switches and indicator lights on the fixture board. The physical switch 505 is used to control the fixture board to be turned on or off, wherein the red indicator light 520 is used to indicate whether the physical switch 505 is turned on (i.e., whether the fixture board is turned on), and the green indicator light 521 is used to indicate whether the tested interface of the tested board is powered on.
[0112] In this embodiment, the mainboard end refers to the server mainboard, the backplane end refers to the tested board, the PWR_IN interface 501 refers to the first power interface connected to the power interface of the server mainboard, and the PWR_OUT interface 503 refers to the second power interface connected to the power interface of the tested board; the AUX_IN interface 502 refers to the interface connected to the detection interface of the server mainboard, and the AUX_OUT interface 504 refers to the interface connected to the tested interface of the tested board.
[0113] In this embodiment, the first power interface PWR_IN (501) includes three pins, namely P12V (515), P5V (516) and P3V3_STBY (517), wherein the P5V pin 516 is used as a voltage divider pin.
[0114] In this embodiment, the fixture plate is controlled to be opened or closed by a physical switch 505 .
[0115] When the physical switch 505 is turned on, the fixture board is turned on, the circuit 506 on the physical switch side is grounded, and the output is low level, which is converted to high level after passing through a NOT gate 507. When the physical switch 505 is in the ON state:
[0116] The SW_ON signal output by the NOT gate 507 is at a high level, and the high level output by the voltage divider pin P5V (516) is used as the input of the first logic device AND gate 508, and the output PWR_ON signal is also at a high level.
[0117] The PWR_ON signal passes through the delay device 509 and is sent to the transistor controllers 510 and 514 corresponding to the P12V pin 515 and the P5V pin 516, and the transistor 513 corresponding to the P3V3_STBY pin 517, so that the transistor controllers 510 and 514 control the transistors 511 and 512 to be turned on based on the PWR_ON signal, that is, the P12V, P5V and P3V3_STBY power supplies are transmitted from the server mainboard to the board under test, thereby realizing the conduction of the power supply.
[0118] At the same time, when the SW_ON signal is at a high level, the analog switch 519 switches to the B2 channel, and the second logic device AND gate 522 receives the transistor enable signals P12V_PG and P5V_PG returned by the two transistor controllers 510 and 514, and outputs a high level to the analog switch, that is, the PWR_PG signal is at a high level, and the enable signal BP_PWR_ON for powering on the board under test is also synchronously pulled high to ensure that the board under test is powered on.
[0119] MB_AUX_PG (518) is used as a PG signal transmitted back to the mainboard. It is divided by the voltage divider pin P5V (516) and always maintains a high level. Therefore, the process of plugging and unplugging the cable will not cause the mainboard to alarm.
[0120] At this time, the red indicator light 520 is on, indicating that the physical switch 505 is in the ON state; the green indicator light 521 is on, indicating that the tested board is powered on normally.
[0121] In this embodiment, when the physical switch 505 is closed, the fixture plate is closed, and the circuit 506 on the physical switch side outputs a high level, which is converted to a low level after passing through a NOT gate 507. When the physical switch 505 is in the OFF state:
[0122] The SW_ON signal output by the NOT gate is a low level signal, and the high level signal output by the voltage divider pin P5V (516) is used as the input of the first logic device AND gate 508, and the output PWR_ON signal is a low level signal.
[0123] PWR_ON is sent to the transistor controllers 510 and 514 corresponding to the P12V pin 515 and the P5V pin 516, and the transistor 513 corresponding to P3V3_STBY after passing through the delay device 509, so that the transistor controllers 510 and 514 control the transistors 511 and 512 to be disconnected based on the PWR_ON signal, and directly control the transistor 513 to be disconnected, that is, the transmission path of the P12V, P5V and P3V3_STBY power supplies from the server mainboard to the board under test is cut off, so that the power supply is disconnected.
[0124] At the same time, when the SW_ON signal is at a low level, the analog switch 519 switches to the B1 channel, and the enable signal BP_PWR_ON for powering on the tested board is at a low level, and the tested board is powered off. At this time, the power cord of the tested board can be unplugged to replace the tested board.
[0125] Similarly, MB_AUX_PG (518) is a PG signal transmitted back to the mainboard. It is divided by the voltage divider pin P5V (516) and always maintains a high level. Therefore, the process of plugging and unplugging the cable will not cause the mainboard to alarm.
[0126] At this time, the red indicator light 520 is off, indicating that the physical switch 505 is in the OFF state; the green indicator light 521 is off, indicating that the tested board is powered off, and the backplane segment cable can be replaced and plugged in, and the tested board can be replaced.
[0127] In this embodiment, the tested board is not affected by the impact current during the hot insertion process, is not affected by the discharge during the removal process, the device is not damaged, and the timing during the power on and off process can meet the requirements, and the server mainboard will not have any errors or alarm prompts.
[0128] This concludes Figure 5 Description of the embodiments in .
[0129] The above are only preferred embodiments of the present application and are not intended to limit the present application. For those skilled in the art, the present application may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the scope of protection of the present application.
Claims
1. A single board function test system, characterized in that: The single board function test system at least comprises: a server mainboard, a single board to be tested, and a fixture board; The fixture board is connected to the power interface of the server mainboard through a first power interface, and is connected to the power interface of the tested board through a second power interface; and the fixture board also includes an interface connected to the tested interface of the tested board, and an interface connected to a detection interface on the server mainboard adapted to the tested interface; The fixture board is used to output the power signal from the server mainboard received by the first power interface to the tested board through the second power interface when it is turned on, and control the tested interface of the tested board to power on; The fixture board is used to cut off the power signal received by the first power interface from the server mainboard when being closed, and control the tested interface of the tested board to power off.
2. The system according to claim 1, characterized in that The fixture board also includes: a first logic device, a transistor controller and a transistor; The first logic device is used to output a first level signal to the transistor controller when the fixture board is turned on, so that the transistor controller controls the transistor to be turned on based on the first level signal, so as to output the power signal from the server mainboard received by the first power interface to the tested board through the second power interface.
3. The system according to claim 1, characterized in that The fixture board also includes: a first logic device, a transistor controller and a transistor; The first logic device is used to output a second level signal to the transistor controller when the fixture board is closed, so that the transistor controller controls the transistor to be disconnected based on the second level signal, thereby cutting off the power signal received by the first power interface from the server mainboard.
4. The system according to claim 1, characterized in that The fixture board further comprises: an analog switch and a second logic device, wherein the analog switch is connected to the tested interface of the tested board; The analog switch is used to control the tested interface of the tested board to power on through the third level signal output by the second logic device when the fixture board is turned on; Wherein, when the fixture board is turned on, the second logic device outputs the third level signal to the analog switch.
5. The system according to claim 1, characterized in that The fixture board further comprises: an analog switch connected to the tested interface of the tested board; The analog switch is used to control the tested interface of the tested board to power off when the fixture board is closed.
6. The system according to any one of claims 1 to 5, characterized in that: The first power interface includes at least one power pin, the at least one power pin includes a voltage divider pin, and the voltage divider pin is connected to a detection interface on the server mainboard adapted to the interface under test; The voltage-dividing pin is used to control the detection interface on the server mainboard adapted to the interface under test to maintain a high level.
7. The system according to claim 1, characterized in that The fixture plate further comprises: a first indicator light and / or a second indicator light; The first indicator light is used to light up when the fixture plate is opened to indicate that the fixture plate is in an opened working state; and is used to extinguish when the fixture plate is closed to indicate that the fixture plate is in a closed state; The second indicator light is used to light up when the tested interface of the tested board is at a high level, to indicate that the tested interface of the tested board is in a powered-on state; and to turn off when the tested interface of the tested board is at a low level, to indicate that the tested interface of the tested board is in a powered-off state.
8. A single board function testing method, characterized in that: The method is applied to a single-board function test system, which at least includes: a server mainboard, a single board to be tested, and a fixture board; the fixture board is connected to a power interface of the server mainboard through a first power interface, and is connected to a power interface of the single board to be tested through a second power interface; and the fixture board also includes an interface connected to a tested interface of the single board to be tested, and an interface connected to a detection interface on the server mainboard adapted to the tested interface; the method includes: When the fixture board is turned on, the power signal from the server mainboard received by the first power interface is output to the tested board through the second power interface, and the tested interface of the tested board is controlled to be powered on; When the fixture board is closed, the power signal received by the first power interface from the server mainboard is cut off, and the tested interface of the tested board is controlled to be powered off.
9. The method according to claim 8, characterized in that The fixture board further includes: a first logic device, a transistor controller and a transistor; the method further includes: When the fixture board is turned on, the first logic device outputs a first level signal to the transistor controller, so that the transistor controller controls the transistor to be turned on based on the first level signal, so as to output the power signal from the server mainboard received by the first power interface to the tested board through the second power interface; When the fixture board is closed, the first logic device outputs a second level signal to the transistor controller, so that the transistor controller controls the transistor to be disconnected based on the second level signal, thereby cutting off the power signal from the server mainboard received by the first power interface; And / or, the fixture board further includes: an analog switch and a second logic device, the analog switch is connected to the tested interface of the tested board; the method further includes: When the fixture board is turned on, the analog switch controls the tested interface of the tested board to be powered on through the third level signal output by the second logic device; wherein, when the fixture board is turned on, the second logic device outputs the third level signal to the analog switch; When the fixture board is closed, the analog switch controls the tested interface of the tested board to power off.
10. A fixture plate, characterized in that: The fixture board is applied to a single board function test system, and the single board function test system further comprises: a server mainboard and a single board to be tested; The fixture board is connected to the power interface of the server mainboard through a first power interface, and is connected to the power interface of the tested board through a second power interface; and the fixture board also includes an interface connected to the tested interface of the tested board, and an interface connected to a detection interface on the server mainboard adapted to the tested interface; The fixture plate is used for: When turned on, the power signal from the server mainboard received by the first power interface is output to the tested board through the second power interface, and the tested interface of the tested board is controlled to be powered on; and, when turned off, the power signal from the server mainboard received by the first power interface is cut off, and the tested interface of the tested board is controlled to be powered off.