Dynamic aging method and system for Ethernet switch

Abstract

The invention relates to a dynamic aging method and system for an Ethernet switch, and aims to solve the technical problem of lack of a dynamic aging scheme for the Ethernet switch. The method comprises the steps of determining the maximum power consumption of a circuit, determining a port loopback path according to the power consumption, configuring a loopback control path table and a VLAN port control table, and inputting data to carry out an aging test. The system comprises a data acquisition module, a loopback path determination module, a configuration module and a test module. According to the scheme, the environment temperature, the packaging thermal resistance, the chip junction temperature and the circuit power consumption are comprehensively considered, the proper loopback path is selected, the broadcast frame is sequentially and circularly forwarded at each port, the test efficiency and accuracy are improved, the stability and reliability of the Ethernet switch are ensured, and the technical blank in the field of dynamic aging of the Ethernet switch is filled.

Description

Technical Field

[0001] The invention relates to the field of integrated circuit design and testing, and in particular to a dynamic aging method and system for an Ethernet switch. Background Art

[0002] Burn-in experiments are a key step in the production process of integrated circuits (ICs). Their purpose is to accelerate the exposure and screening of devices with potential defects or unstable performance by operating and monitoring ICs for a long time under stress conditions such as high temperature and high voltage, so as to avoid these defects causing early failures during the use of ICs. Therefore, burn-in experiments are crucial to improving the factory quality of ICs, extending their service life, and ensuring their stability and reliability in practical applications.

[0003] Early burn-in experiments were mostly static burn-in, which mainly observed the performance changes under static conditions by simply powering on and heating the IC in a high-temperature environment. However, with the increasing complexity of IC functions and the continuous improvement of performance requirements, static burn-in gradually exposed its limitations and could not fully test the functions and performance of ICs. Therefore, dynamic burn-in under normal working conditions of ICs came into being. By applying actual operating frequencies and interface rates, and simulating the working conditions of ICs in actual applications, it can more comprehensively test the functions and performance of ICs.

[0004] Existing dynamic aging methods may not fully cover all functions and performance indicators of ICs when simulating actual application working conditions, resulting in some potential defects and problems not being discovered. On some other types of ICs, such as PCIe switching circuits and memories, there are already some relatively mature and uniformly usable dynamic aging solutions, but in terms of dynamic aging of Ethernet switches, there is currently a lack of a unified and efficient solution.

[0005] In order to solve the gap in dynamic aging of Ethernet switches, a dynamic aging solution for Ethernet switches is urgently needed. Summary of the invention

[0006] The object of the present invention is to provide a method and system for dynamic aging of an Ethernet switch, so as to overcome the deficiency of the prior art that there is a lack of a dynamic aging solution for an Ethernet switch.

[0007] In order to achieve the above object, the present invention adopts the following technical solution: A dynamic aging method for an Ethernet switch, comprising: Determine the maximum power consumption of the circuit; Determine the loopback path of each port according to the maximum power consumption of the circuit; Configure the loopback control path table and VLAN port control table according to the loopback path; Input data for burn-in testing.

[0008] Determine the maximum power consumption of the circuit, including: Obtain the aging environment temperature, package thermal resistance and chip junction temperature; The maximum power consumption of the circuit is determined based on the aging ambient temperature, package thermal resistance and chip junction temperature. The chip junction temperature is equal to the sum of the product of package thermal resistance and circuit power consumption and the ambient temperature.

[0009] Determine the loopback path for each port based on the maximum power consumption of the circuit, including: Measure the circuit power consumption of each port under different loopback paths; Select a loopback path whose circuit power consumption is within the maximum power consumption of the circuit; give priority to the PMA layer loopback, followed by the PCS layer loopback, and finally the MAC layer loopback.

[0010] Configure the loopback control path table and VLAN port control table according to the loopback path, including: Configure the loopback path of each port through EEPROM and register management module; Configure the VLAN port control table to ensure that broadcast frames are forwarded in a cyclic manner on each port and forwarded only once.

[0011] Input data for burn-in testing, including: Inject broadcast frames into the switch through the input port; Detect output data frames through output ports; Compare the input broadcast frame with the output data frame to confirm the data transmission result.

[0012] A dynamic aging system for an Ethernet switch, comprising: A data acquisition module, used to determine the maximum power consumption of the circuit; A loop path determination module, used to determine the loop path of each port according to the maximum power consumption of the circuit; A configuration module, used for configuring a loopback control path table and a VLAN port control table according to the loopback path; Test module, used to input data for burn-in testing.

[0013] Data acquisition module, including: Reading module, used to obtain the aging environment temperature, package thermal resistance and chip junction temperature; The calculation module is used to calculate the maximum power consumption of the circuit.

[0014] The loop path determination module includes: Circuit power consumption test module, used to measure the circuit power consumption of each port under different loopback paths; A determination module is used to select a loopback path whose circuit power consumption is within the maximum power consumption of the circuit; the PMA layer loopback is given priority, followed by the PCS layer loopback, and finally the MAC layer loopback.

[0015] The configuration modules include: A loopback path configuration module, including an EEPROM and a register management module, is used to configure the loopback path of each port; The VLAN port configuration module is used to configure the VLAN port control table to ensure that the broadcast frame is forwarded cyclically in each port in turn and only forwarded once.

[0016] The test modules include: Test port, used for input and output of test data; The monitoring module is used to monitor the data output by the test port and compare and confirm it with the input data.

[0017] Compared with the prior art, the present invention has the following beneficial technical effects: A dynamic burn-in method for Ethernet switches is designed to comprehensively test the functions and performance of Ethernet switches to ensure their stability and reliability in practical applications. The method calculates the maximum power consumption of the circuit by obtaining parameters such as the burn-in environment temperature, package thermal resistance, and chip junction temperature to ensure that the power consumption during the test is within a safe range. According to the calculated maximum power consumption of the circuit, the loopback path of each port is determined, and the PMA layer loopback is preferred, followed by the PCS layer loopback, and finally the MAC layer loopback to maximize the test coverage. According to the selected loopback path, the loopback control path table and the VLAN port control table are configured, and the EEPROM and register management module are used for configuration to ensure that the broadcast frame is forwarded in a loop at each port in turn and only forwarded once. The broadcast frame is injected into the switch through the input port, and the output data frame is detected through the output port. The input and output data frames are compared to confirm the data transmission results and complete the burn-in test. This method can improve the test efficiency and accuracy while simulating the actual working scene, effectively screen out devices with potential defects, and extend the service life of the Ethernet switch.

[0018] A dynamic aging system for Ethernet switches is composed of multiple key modules to achieve efficient dynamic aging test of Ethernet switches. The system includes a data acquisition module for determining the maximum power consumption of the circuit, and the reading module obtains the aging environment temperature, the package thermal resistance and the chip junction temperature, and the calculation module calculates the maximum power consumption of the circuit. The loopback path determination module determines the loopback path of each port according to the maximum power consumption of the circuit, and the circuit power consumption under different loopback paths is measured by the circuit power consumption test module, and the determination module selects the appropriate loopback path. The configuration module configures the loopback control path table and the VLAN port control table according to the loopback path, wherein the loopback path configuration module uses the EEPROM and the register management module for configuration, and the VLAN port configuration module ensures the correct forwarding of the broadcast frame. The test module is responsible for inputting data for aging test, including the test port for data input and output, and the monitoring module is used to monitor the output data and compare and confirm with the input data. A comprehensive dynamic aging test of the Ethernet switch is achieved, which has a high engineering application value. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 The figure is a schematic diagram of a dynamic aging method for an Ethernet switch according to an embodiment of the present invention.

[0020] Figure 2 The figure is a schematic diagram of a dynamic aging system for an Ethernet switch according to an embodiment of the present invention.

[0021] Figure 3 The figure is a schematic diagram of the structure of a dynamic aging system for an Ethernet switch according to an embodiment of the present invention.

[0022] Figure 4 The present invention is a schematic diagram of a data flow forwarding process of a dynamic aging system of an Ethernet switch in an embodiment of the present invention. DETAILED DESCRIPTION

[0023] Burn-in experiments are a key step in the production process of integrated circuits (ICs). Their purpose is to accelerate the exposure and screening of devices with potential defects or unstable performance by operating and monitoring ICs for a long time under stress conditions such as high temperature and high voltage, so as to avoid these defects causing early failures during the use of ICs. Therefore, burn-in experiments are crucial to improving the factory quality of ICs, extending their service life, and ensuring their stability and reliability in practical applications.

[0024] Early burn-in experiments were mostly static burn-in, which mainly observed the performance changes under static conditions by simply powering on and heating the IC in a high-temperature environment. However, with the increasing complexity of IC functions and the continuous improvement of performance requirements, static burn-in gradually exposed its limitations and could not fully test the functions and performance of ICs. Therefore, dynamic burn-in under normal working conditions of ICs came into being. By applying actual operating frequencies and interface rates, and simulating the working conditions of ICs in actual applications, it can more comprehensively test the functions and performance of ICs.

[0025] Existing dynamic aging methods may not fully cover all functions and performance indicators of ICs when simulating actual application working conditions, resulting in some potential defects and problems not being discovered. On some other types of ICs, such as PCIe switching circuits and memories, there are already some relatively mature and uniformly usable dynamic aging solutions, but in terms of dynamic aging of Ethernet switches, there is currently a lack of a unified and efficient solution.

[0026] In order to address the gap in dynamic aging of Ethernet switches, the present application proposes a dynamic aging scheme for Ethernet switches. The scheme, under the conditions of comprehensive consideration of aging environment temperature, chip junction temperature, package thermal resistance and circuit power consumption, proposes three loopback level selections for data streams during the aging process, namely MAC layer, PCS layer and PMA layer, and the loopback paths of each port are independent of each other; by configuring the data stream VLAN port control table, the broadcast frame is automatically forwarded in a loop at each port of the switch in sequence, and the effect of forwarding only once is achieved; by injecting broadcast frames from the IMP port input path and monitoring the output frames from the output path, the intuitiveness and accuracy of data monitoring are achieved.

[0027] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0028] The specific implementation of the present application provides an Ethernet switch dynamic aging system, referring to Figure 2 As shown, the system includes: A data acquisition module, used to determine the maximum power consumption of the circuit; A loop path determination module, used to determine the loop path of each port according to the maximum power consumption of the circuit; A configuration module, used for configuring a loopback control path table and a VLAN port control table according to the loopback path; Test module, used to input data for burn-in testing.

[0029] The data acquisition module includes: Reading module, used to obtain the aging environment temperature, package thermal resistance and chip junction temperature; The calculation module is used to calculate the maximum power consumption of the circuit.

[0030] The data acquisition module also includes a circuit power consumption test module.

[0031] The loop path determination module includes: Circuit power consumption test module, used to measure the circuit power consumption of each port under different loopback paths; A determination module is used to select a loopback path whose circuit power consumption is within the maximum power consumption of the circuit; the PMA layer loopback is given priority, followed by the PCS layer loopback, and finally the MAC layer loopback.

[0032] The configuration modules include: A loopback path configuration module, including an EEPROM and a register management module, is used to configure the loopback path of each port; The VLAN port configuration module is used to configure the VLAN port control table to ensure that the broadcast frame is forwarded cyclically in each port in turn and only forwarded once.

[0033] The test modules include: Test port, used for input and output of test data; The monitoring module is used to monitor the data output by the test port and compare and confirm it with the input data.

[0034] Specifically, refer to Figure 3 The following is a specific implementation of the system, including the following modules: The serdes module is used for encoding and decoding, carrier sensing, link monitoring, digital adaptive equalization, noise cancellation, crosstalk elimination, high-speed ADC, clock recovery / generation, baseline drift correction, multi-mode transmission DAC, automatic negotiation, etc., to transmit data between the transmission line and the mac module. It is divided into pcs_tx, pcs_rx, pma_tx, pma_rx, pcs_tx and pma_tx are connected, and pcs_rx and pma_rx are connected. This module can realize the pcs layer loopback, that is, pcs_tx to pcs_rx, refer to Figure 4 As shown in line b, this module can also realize the PMA layer loopback, that is, pma_tx to pma_rx, refer to Figure 4 As shown in line c.

[0035] The mac module is used to implement two functions. The first function is data encapsulation and decapsulation. It encapsulates the data to be sent from the data cache module into a data frame that complies with the IEEE802.3 standard and sends it to the transceiver module. It extracts valid data from the data frame received by the transceiver module and writes it to the data cache module. The second function is media access control, including media allocation and contention processing. The CSMA / CD protocol is the most important part to implement this function. It is divided into mac_tx and mac_rx. mac_tx is connected to pcs_tx, and mac_rx is connected to pcs_rx. This module can realize mac layer loopback, that is, mac_tx to mac_rx. Refer to Figure 4 As shown in line a.

[0036] The frame buffer control module is used to buffer the data frames received by the MAC module and the data frames to be sent. It adopts asynchronous FIFO implementation, and the access control logic of the two ports is completely independent.

[0037] The address management module is used to find out the forwarding port vector according to the destination MAC address and output it to the VLAN management module for forwarding port filtering. In this invention, the input frame is a broadcast frame, so the address management gives the VLAN management module information that all ports are forwarded.

[0038] The VLAN management module is used to implement filtering query on the VLAN table and determine the data forwarding output port according to the query result. In this specific implementation, the control of the VLAN table is as follows: Summary of the port-based VLAN control table addresses:

[0039] Port control table (addr: 00h-011h)

[0040] Configure the IMP port control table to 0001h, the port 0 control table to 0002h, the port 1 control table to 0004h, the port 2 control table to 0008h, the port 3 control table to 0010h, the port 4 control table to 0020h, the port 5 control table to 0040h, the port 6 control table to 0080h, and the port 7 control table to 0100h. The above configurations implement that after the broadcast frame is input from the IMP, it is first forwarded to port 0, then forwarded to port 1 after looping back through port 0, then forwarded to port 2 after looping back through port 1, then forwarded to port 3 after looping back through port 2, then forwarded to port 4 after looping back through port 3, then forwarded to port 4 after looping back through port 4, then forwarded to port 5 after looping back through port 5, then forwarded to port 6 after looping back through port 6, then forwarded to port 7 after looping back through port 7, and then forwarded to port IMP after looping back through port 7. Monitor the data frames in the output path of the IMP. Figure 4 The dashed line shows the line.

[0041] The register management module is used to configure the control table and loopback path according to the loader in the external EEPROM. The control table is the VLAN port control table; the loopback path is divided into MAC layer loopback, PCS layer loopback and PMA layer loopback, and the loopback path of each port is independent of each other.

[0042] For the coverage of the aging modules, the PMA layer loopback covers the most modules, followed by the PCS layer loopback, and the MAC layer loopback covers the least modules. Therefore, the priority of the three loopback levels is PMA layer loopback, PCS layer loopback, and MAC layer loopback from high to low.

[0043] For the dynamic power consumption of the circuit, the PMA layer loopback power consumption is the largest, the PCS layer loopback power consumption is the second largest, and the MAC layer loopback power consumption is the smallest.

[0044] Therefore, the selection of the loop path needs to comprehensively consider the aging environment temperature, chip junction temperature, package thermal resistance and circuit power consumption, specifically: Package thermal resistance × circuit power consumption + ambient temperature ≤ chip junction temperature Among them, the package thermal resistance is about 10. It should be noted that the package thermal resistance values ​​in different switching circuits are different. The aging environment temperature is 125°C, and the chip junction temperature is 175°C. Therefore, the circuit power consumption needs to be less than 5W. Under this condition, the loopback path is determined, and the loopback paths of each port are independent of each other.

[0045] The clock unit module is used to multiply the 25MHz frequency of the external crystal oscillator input to generate the system working clock.

[0046] Among them, the functions of the data acquisition module can be realized by the serdes module, mac module, register management module and external measurement equipment. The external measurement equipment includes temperature sensors and thermal resistance testers, which are used to measure the aging environment temperature and package thermal resistance. The serdes module is responsible for transmitting data under different loop paths (mac layer, pcs layer, pma layer) and measuring power consumption. The mac module implements data encapsulation and decapsulation, manages data transmission in the mac layer, and measures power consumption under the loop path of the mac layer. The register management module has a built-in method for calculating the maximum power consumption of the circuit. After reading the measured power consumption data, the maximum power consumption of the circuit is calculated and output.

[0047] The function of the loop path determination module can be realized by the serdes module, the mac module, and the register management module. The register management module selects a loop path with power consumption within a safe range according to the calculated maximum power consumption of the circuit. The serdes module and the mac module provide power consumption data under different loop paths for selecting the loop path.

[0048] The configuration module function can be realized through the register management module, EEPROM, and VLAN management module. The register management module configures the loop control path table and VLAN port control table of each port according to the selected loop path. The EEPROM stores the configuration data. The VLAN management module ensures that the broadcast frame is forwarded once in a loop at each port according to the VLAN port control table, and is forwarded only once.

[0049] The implementation of the test module function involves the IMP port, serdes module, mac module, frame buffer control module, address management module, and VLAN management module. The IMP port injects broadcast frames and monitors the output data frames to ensure the accuracy and integrity of data transmission. The serdes module transmits data under the configured loopback path to ensure the correct transmission of data at the physical layer. The mac module handles the encapsulation and decapsulation of data, manages the transmission of data at the link layer, and ensures the correct processing of data at the mac layer. The frame buffer control module provides temporary storage of data frames to ensure the smoothness of data during processing and avoid data loss and congestion. The address management module searches for the forwarding port vector based on the destination MAC address to ensure that the broadcast frame is correctly forwarded to all ports. The VLAN management module controls the forwarding path of the broadcast frame based on the configured VLAN port control table to ensure that data is transmitted along the predetermined path.

[0050] In the specific implementation of the present application, the serdes module is a transceiver module, and for an n-port switch chip, the number thereof is n, and it corresponds one-to-one with the mac module, and mainly realizes data transmission between the transmission line and the mac module.

[0051] The mac module is a logical link layer module. For a switch chip with n ports, the number is n+1, where n corresponds to the serdes module one by one and 1 is the IMP port. It mainly implements data encapsulation and decapsulation and media access control.

[0052] The number of frame buffer control modules is 1, which mainly realizes the buffering of received data frames and data frames to be sent.

[0053] The number of address management modules is 1, and the main implementation is to find out the forwarding port vector according to the destination MAC address. For the present invention, the destination MAC address is a broadcast frame, so the forwarding port vector given is forwarding for all ports.

[0054] The number of VLAN management modules is 1. It mainly implements filtering, querying and management of the VLAN table.

[0055] The number of register modules is 1. Implement the configuration of the control table and loop path.

[0056] The number of clock units is 1. It realizes frequency multiplication of the external crystal oscillator input frequency of 25MHz to generate the system working clock.

[0057] Another specific implementation of the present application provides a dynamic aging method for an Ethernet switch, referring to Figure 1 As shown, including: S101, obtaining the aging environment temperature, package thermal resistance, and circuit power consumption, and calculating the maximum power consumption of the circuit; S102, determining a loopback path of each port according to the maximum power consumption of the circuit; S103, configuring a loop control path table and a VLAN port control table according to the loop path; S104, input data for aging test.

[0058] Specifically, S101, the aging environment temperature, package thermal resistance, and circuit power consumption are obtained, and the maximum power consumption of the circuit is calculated. The aging environment temperature and package thermal resistance are tested and obtained through external measuring equipment, including temperature sensors and thermal resistance testers, and then the chip junction temperature data is obtained.

[0059] The maximum power consumption of the circuit is calculated through the above-mentioned aging ambient temperature, package thermal resistance and chip junction temperature to ensure that the circuit power consumption is within a safe range and to avoid damage caused by overheating. The chip junction temperature is equal to the product of the package thermal resistance and the circuit power consumption plus the ambient temperature.

[0060] S102, determine the loopback path of each port according to the maximum power consumption of the circuit. The purpose is to select a suitable loopback path to ensure that the circuit power consumption is within a safe range while maximizing the test coverage. By comparing the circuit power consumption under different loopback paths, the PMA layer loopback is preferred, followed by the PCS layer loopback, and finally the MAC layer loopback. This not only ensures the safety of the test, but also optimizes the test conditions to make it more in line with the actual working scenario and improves the test efficiency.

[0061] S103, configure the loop control path table and VLAN port control table according to the loop path. By configuring the loop path and VLAN port control table of each port, ensure that the data stream is transmitted along the predetermined path. Use EEPROM and register management module to configure the loop control path table, and ensure that the broadcast frame is forwarded in a loop at each port in turn and only forwarded once. This realizes the automation and precise control of data transmission, reduces manual intervention, improves the accuracy and reliability of the test, ensures that each port is fully tested, and improves the comprehensiveness of the test.

[0062] S104, input data for burn-in test. Start burn-in test, inject test data, monitor output data frames, and ensure the accuracy and integrity of data transmission. Inject broadcast frames into the switch through the IMP input port. Monitor output data frames through the IMP output port. Check whether the output data frames are consistent with the input data frames to ensure that there are no errors in data transmission. Verify the accuracy and integrity of data transmission and complete the burn-in test.

[0063] The present invention can be used in dynamic aging screening schemes for Ethernet switching chips in the fields of Ethernet switches, network servers, computer data storage systems, etc. By selecting different loopback levels for each port, the internal temperature of the chip is controlled below the junction temperature, while the coverage of the aging module is guaranteed to the maximum extent, and it has high engineering application value.

[0064] The above shows and describes the basic principles, main features and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited by the above embodiments. The above embodiments and descriptions are only preferred examples of the present invention and are not intended to limit the present invention. Without departing from the spirit and scope of the present invention, the present invention may have various changes and improvements, which fall within the scope of the present invention. The scope of protection of the present invention is defined by the attached claims and their equivalents.

Claims

1. A dynamic aging method for an Ethernet switch, characterized in that: include: Determine the maximum power consumption of the circuit; Determine the loopback path of each port according to the maximum power consumption of the circuit; Configure the loopback control path table and VLAN port control table according to the loopback path; Input data for burn-in testing.

2. The method for dynamic aging of an Ethernet switch according to claim 1, characterized in that: The determining the maximum power consumption of the circuit comprises: Obtain the aging environment temperature, package thermal resistance and chip junction temperature; The maximum power consumption of the circuit is determined according to the aging ambient temperature, the package thermal resistance and the chip junction temperature, wherein the chip junction temperature is equal to the sum of the product of the package thermal resistance and the circuit power consumption and the ambient temperature.

3. The method for dynamic aging of an Ethernet switch according to claim 1, characterized in that: The step of determining the loopback path of each port according to the maximum power consumption of the circuit includes: Measure the circuit power consumption of each port under different loopback paths; Select a loopback path whose circuit power consumption is within the maximum power consumption of the circuit; give priority to the PMA layer loopback, followed by the PCS layer loopback, and finally the MAC layer loopback.

4. The method for dynamic aging of an Ethernet switch according to claim 1, characterized in that: The configuring of the loopback control path table and the VLAN port control table according to the loopback path includes: Configure the loopback path of each port through EEPROM and register management module; Configure the VLAN port control table to ensure that broadcast frames are forwarded in a cyclic manner on each port and forwarded only once.

5. The method for dynamic aging of an Ethernet switch according to claim 1, characterized in that: The input data undergoes a burn-in test, including: Inject broadcast frames into the switch through the input port; Detect output data frames through output ports; Compare the input broadcast frame with the output data frame to confirm the data transmission result.

6. A dynamic aging system for Ethernet switches, characterized in that: include: A data acquisition module, used to determine the maximum power consumption of the circuit; A loop path determination module, used to determine the loop path of each port according to the maximum power consumption of the circuit; A configuration module, used for configuring a loopback control path table and a VLAN port control table according to the loopback path; Test module, used to input data for burn-in testing.

7. The Ethernet switch dynamic aging system according to claim 6, characterized in that: The data acquisition module comprises: Reading module, used to obtain the aging environment temperature, package thermal resistance and chip junction temperature; The calculation module is used to calculate the maximum power consumption of the circuit.

8. The Ethernet switch dynamic aging system according to claim 6, characterized in that: The loop path determination module comprises: Circuit power consumption test module, used to measure the circuit power consumption of each port under different loopback paths; A determination module is used to select a loopback path whose circuit power consumption is within the maximum power consumption of the circuit; the PMA layer loopback is given priority, followed by the PCS layer loopback, and finally the MAC layer loopback.

9. The Ethernet switch dynamic aging system according to claim 6, characterized in that: The configuration module includes: A loopback path configuration module, including an EEPROM and a register management module, is used to configure the loopback path of each port; The VLAN port configuration module is used to configure the VLAN port control table to ensure that the broadcast frame is forwarded cyclically in each port in turn and only forwarded once.

10. The Ethernet switch dynamic aging system according to claim 6, characterized in that: The test module includes: Test port, used for input and output of test data; The monitoring module is used to monitor the data output by the test port and compare and confirm it with the input data.

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