A method, device and storage medium for establishing an optical solution database

Abstract

The present application provides a method, device and storage medium for establishing an optical solution database, the method comprising: the technical solution provided by the present application can obtain an optical solution data set, extract light source features and state features of the optical solution data set, and generate standard optical information data; create regional data based on the standard optical information data, group defect information data into corresponding regions, generate defect topology information of the region, and determine the defect topology information of the standard optical information data. The present application can create an optical solution database that matches each defect, provide reference data on optical solutions for specific defect detection requirements in new circuit boards, and improve the implementation efficiency of optical solutions for each new circuit board.

Description

Technical Field

[0001] The present application relates to the field of data processing technology, and in particular to a method, device and storage medium for establishing an optical solution database. Background Art

[0002] As the core component of electronic products, the quality of printed circuit boards (PCBs) is directly related to the performance and life of the products. In order to ensure that the circuit boards can work stably in various complex environments, all aspects of the circuit boards must be strictly inspected. In the use of visual inspection technology to detect defects in the appearance of PCBs, the optical solution is the cornerstone of obtaining PCB images. Through reasonable optical design, such as selecting a suitable light source combination, the tiny components and fine lines on the PCB can be illuminated to ensure that various details on the PCB surface can be clearly captured, so that the camera can generate high-quality images. The appropriate optical solution helps to highlight different target features on the PCB and enhance the ability to identify PCB defects.

[0003] However, the inventors found that there is a lack of corresponding standard libraries for various defects on various circuit boards. When there is a need to detect new circuit boards, it is often necessary to start research from scratch and confirm the final optical solution by trial and error. This process causes waste of resources, and the corresponding repetitive work increases the time for the final confirmation of the optical solution. The efficiency is relatively low and is not conducive to the development of various types of boards and product lines. At the same time, it also creates a certain amount of stocking pressure on the supply chain. Summary of the invention

[0004] In view of this, the present application provides a method, device and storage medium for establishing an optical solution database to solve the technical problem in the prior art that the confirmation of optical solutions for new circuit board detection needs is time-consuming and inefficient.

[0005] In a first aspect, the present application provides a method for establishing an optical scheme database, the method comprising:

[0006] Acquire an optical scheme data set, extract light source features and state features from the optical scheme data set, and generate standard optical information data;

[0007] Regional data is created based on standard optical information data, defect information data is grouped into corresponding regions, defect topology information of the regions is generated, and defect topology information of the standard optical information data is determined.

[0008] Preferably, the method for establishing the optical solution database further comprises: acquiring a defect data set, performing data preprocessing on the defect data set, and generating standard defect information data.

[0009] Preferably, extracting light source features and state features from the optical solution data set includes:

[0010] Extracting attribute features of each light source based on the light source details in the optical solution data set;

[0011] Based on the light source adjustable state details in the optical solution data set, light source subset state features are extracted.

[0012] Preferably, the standard optical information data includes details of the state of the light source subset and details of the properties of each light source in the subset.

[0013] Preferably, the creating the regional data based on the standard optical information data comprises:

[0014] The current product information is determined based on the standard optical information data, and the target area data is created according to the corresponding area on the product.

[0015] Preferably, the step of aggregating the defect information data to corresponding regions and generating topological information of regional defects includes:

[0016] According to the area information of the defect, the defect information data is collected into the corresponding target area, wherein the defect information includes the area information;

[0017] The multi-attribute features of defects are fused, and the fused features of defects are connected through regional information topology to generate regional defect topology information.

[0018] Preferably, the step of determining the defect topology information of the standard optical information data comprises:

[0019] The topological information of the standard optical information data and the regional information data is determined, and the defect topological information of the standard optical information data is determined in combination with the defect topological information of the region.

[0020] In a second aspect, the present application provides a device for establishing an optical scheme database, the device comprising:

[0021] A format module is used to obtain an optical scheme data set, extract light source features and state features from the optical scheme data set, and generate standard optical information data;

[0022] The topology module creates regional data based on the standard optical information data, groups the defect information data into corresponding regions, generates defect topology information of the regions, and determines the defect topology information of the standard optical information data.

[0023] In a third aspect, the present application provides a computer device, comprising: a memory and a processor, wherein the memory and the processor are communicatively connected to each other, the memory stores computer instructions, and the processor implements the method for establishing an optical solution database described in the first aspect by executing the computer instructions.

[0024] In a fourth aspect, the present application provides a computer-readable storage medium, wherein the computer-readable storage medium stores computer instructions, and when the computer instructions are executed by a processor, the method for establishing an optical solution database described in the first aspect is implemented.

[0025] The optical scheme database establishment method, device and storage medium provided in this application have at least the following beneficial effects:

[0026] The technical solution provided by the present application can extract the light source features from the optical solution data set, and can deeply understand the various properties of the light source, such as color, intensity, spectral distribution, etc. This helps to accurately evaluate the performance of the light source in different aspects, and provides a strong basis for the selection and optimization of the light source. For example, when it is necessary to detect defects with high color rendering, a suitable light source can be selected based on the extracted light source features to ensure the true restoration of the defect color. Extracting state features to generate standard optical information data can effectively reflect the coordination of the light source. By analyzing these data, the deficiencies in the solution can be found, and the optical solution can be adjusted and optimized in a targeted manner. The standard optical information data provides a rich reference basis for the design of subsequent new optical solutions, and improves the performance and landing efficiency of the new optical solution. Based on the standard optical information data, regional data is created, and the defect information data is grouped into the corresponding area, which can achieve accurate matching of defects and optical information. This helps to quickly determine feasible optical information based on the defects to be detected, and provides a clear direction for the optical solution. The entire process effectively integrates and manages the optical solution data, light source feature data, state feature data, and defect information data. This enables the originally scattered data resources to be centrally processed and analyzed, providing a comprehensive and unified data platform to facilitate data query, sharing and utilization. The standard optical information data, regional data and defect topology information obtained after processing and analysis provide decision makers with a wealth of decision support basis. Through in-depth analysis of these data, more scientific and reasonable optical solutions and inspection plans can be formulated. The processing and analysis process of the optical solution data set has accumulated a lot of knowledge and experience about optical solutions and defect detection. This knowledge and experience can be sorted and recorded to form knowledge assets, provide reference for subsequent projects and research, and promote the inheritance and development of technology in the field of optical inspection technology. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] In order to more clearly illustrate the specific implementation methods of the present application or the technical solutions in the prior art, the following is a brief introduction to the drawings required for use in the specific implementation methods or the prior art descriptions. Obviously, the drawings described below are some implementation methods of the present application. For ordinary technicians in this field, other drawings can also be obtained based on these drawings without creative work. It should be noted that the drawings described below are schematic and should not be understood as any limitation to the present application. In the drawings:

[0028] Figure 1 A schematic diagram showing a method for establishing an optical solution database in one embodiment of the present application is shown;

[0029] Figure 2 A schematic diagram showing a topological structure in one embodiment of the present application is shown;

[0030] Figure 3 A schematic diagram of a device for establishing an optical solution database in one embodiment of the present application is shown;

[0031] Figure 4 A schematic diagram of a computer device in one embodiment of the present application is shown. DETAILED DESCRIPTION

[0032] In order to make the purpose, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present application.

[0033] In the description of the present application, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc., indicating the orientation or positional relationship, are based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the present application. In addition, the terms "first", "second", and "third" are used for descriptive purposes only, and cannot be understood as indicating or implying relative importance.

[0034] In the description of this application, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, it can also be the internal connection of two components, it can be a wireless connection, or it can be a wired connection. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0035] In addition, the technical features involved in the different embodiments of the present application described below can be combined with each other as long as they do not conflict with each other.

[0036] Although the processes described below include multiple operations that appear in a specific order, it should be clearly understood that these processes may also include more or fewer operations, and these operations may be performed sequentially or in parallel.

[0037] Example 1

[0038] The method for establishing an optical solution database provided in the present application can be applied to the application scenario of optical solution digitization for visual inspection of circuit boards. It should be noted that in this usage scenario, a complete set of optical solutions is generally set up for the detection needs of visual defects in the appearance of a circuit board material. In simple terms, for example, for the detection needs of defects in different areas, or different types of defects, multiple different types of light sources will be set up, and different combinations of light sources will be used to illuminate the circuit board, so that the collected image can smoothly detect the corresponding defects. When there is a need to detect a new circuit board, the optical solution that can detect this specific defect requirement can be matched from the existing optical library according to the requirements of each defect to be detected. In view of this, the present application aims to create an optical solution database that matches each defect through the method of establishing an optical solution database, and provide reference data on optical solutions for specific defect detection needs in new circuit boards.

[0039] See also Figure 1 , a method for establishing an optical solution database provided in one embodiment of the present application may include the following steps.

[0040] S101, acquiring an optical solution data set, extracting light source features and state features from the optical solution data set, and generating standard optical information data.

[0041] In this embodiment, extracting light source features and state features from the optical solution data set includes: extracting attribute features of each light source based on the light source details in the optical solution data set; extracting light source subset state features based on the light source adjustable state details in the optical solution data set. The standard optical information data includes light source subset state details and attribute details of each light source in the subset.

[0042] Specifically, the optical scheme data set can be understood as a complete set of optical schemes for a circuit board material. The extraction of light source features is mainly based on the optical details in the complete set of optical schemes, and the attribute features of each light source are extracted. For example, the light source details in the complete set of optical schemes include five light sources, namely, a coaxial light source, two light sources on the left, and two light sources on the right. That is, the attribute features of these five light sources are extracted, and the attribute features include center distance, height, angle, brightness, etc. The extraction of state features is mainly based on the adjustable state details of the light source in the complete set of optical schemes. For example, the adjustable state details of the light source in the complete set of optical schemes include seven states, namely: 1. The coaxial light source is lit alone; 2. The two light sources on the left are lit at the same time; 3. The two light sources on the right are lit at the same time; 4. The two light sources on the left and the coaxial light source are lit at the same time; 5. The two light sources on the right and the coaxial light source are lit at the same time; 6. The two light sources on the left and the two light sources on the right are lit at the same time; 7. The two light sources on the left, the two light sources on the right, and the coaxial light source are lit at the same time. Each standard optical information generated includes a state detail of a light source subset and the attribute details of each light source in this light source subset. For example: coaxial light source alone on + property details of coaxial light source. Another example: two light sources on the left are on at the same time + property details of the first light source on the left + property details of the second light source on the left.

[0043] S102, creating regional data based on standard optical information data, grouping defect information data into corresponding regions, generating defect topology information of the regions, and determining defect topology information of the standard optical information data.

[0044] In this embodiment, creating the region data based on the standard optical information data includes determining the current product information based on the standard optical information data, and creating the target region data according to the corresponding region on the product.

[0045] Specifically, create regional data, that is, create a corresponding regional information based on a standard optical information, and this regional information is used to indicate the detection area corresponding to the standard optical information, or to indicate the range of detectable defects corresponding to the standard optical information. Collect defect information data into corresponding areas, generate defect topology information of the area, that is, classify and collect all defect information on a circuit board. For example, see Figure 2As shown, based on the standard optical information of "coaxial light source single light + property details of coaxial light source", a corresponding first area is created, and all defects that can be detected on the circuit board using this standard light source are grouped into this first area, and topological information corresponding to defects covered by the first area is generated. Based on the standard optical information of "two light sources on the left are bright at the same time + property details of the first light source on the left + property details of the second light source on the left", a corresponding second area is created, and all defects that can be detected on the circuit board using this standard light source are grouped into this second area, and topological information corresponding to defects covered by the second area is generated. It is determined that the defect topological information of "coaxial light source single light + property details of coaxial light source" is the topological information corresponding to defects covered by the first area; it is determined that the defect topological information of "first light source on the left + second light source on the left are bright at the same time + property details of the first light source on the left + property details of the second light source on the left" is the topological information corresponding to defects covered by the second area. Similarly, the defect topological information of all standard optical information is determined, and then the creation of optical information and defect topological database is realized for the optical scheme of a circuit board.

[0046] In this embodiment, when there is a need to detect a new circuit board, the corresponding standard optical information can be found from the defect topology information of the determined standard optical information data according to the specific defect requirements, so that the corresponding standard optical information is used as the basic optical solution of the new circuit board, and there is no need to design the optical solution from scratch. Providing reference optical information for existing defect detection needs avoids repeated verification and confirmation, reduces resource waste, and alleviates supply chain stocking pressure. It speeds up the implementation time of the final optical solution and further improves the verification and confirmation efficiency of the optical solution.

[0047] In this embodiment, by extracting light source features from the optical solution data set, it is possible to gain an in-depth understanding of the various properties of the light source, such as color, intensity, spectral distribution, etc. This helps to accurately evaluate the performance of light sources in different aspects, and provides a strong basis for the selection and optimization of light sources. For example, when it is necessary to detect defects with high color rendering, a suitable light source can be selected based on the extracted light source features to ensure the true restoration of the defect color. Standard optical information data generated by extracting state features can effectively reflect the coordination of light sources. By analyzing these data, the deficiencies in the solution can be found, and the optical solution can be adjusted and optimized in a targeted manner. The standard optical information data provides a rich reference basis for the design of subsequent new optical solutions, thereby improving the performance and implementation efficiency of new optical solutions.

[0048] In this embodiment, regional data is created based on standard optical information data, and defect information data is grouped into corresponding regions, so that accurate matching of defects and optical information can be achieved. This helps to quickly determine feasible optical information based on the defects to be detected, and provides a clear direction for the optical solution. The entire process effectively integrates and manages the optical solution data, light source feature data, state feature data, and defect information data. This enables the originally scattered data resources to be centrally processed and analyzed, providing a comprehensive and unified data platform to facilitate data query, sharing, and utilization. The standard optical information data, regional data, and defect topology information obtained after processing and analysis provide decision makers with a wealth of decision support basis. Through in-depth analysis of these data, more scientific and reasonable optical solutions and detection plans can be formulated. The processing and analysis process of the optical solution data set has accumulated a lot of knowledge and experience about optical solutions and defect detection. This knowledge and experience can be sorted and recorded to form knowledge assets, provide references for subsequent projects and research, and promote the inheritance and development of technology in the field of optical detection technology.

[0049] Preferably, the method for establishing the optical solution database further comprises: acquiring a defect data set, performing data preprocessing on the defect data set, and generating standard defect information data.

[0050] In this embodiment, a piece of standard defect information mainly includes the defect ID, the area information to which the defect belongs, the priority information of the defect, the color attribute of the defect, the shape attribute of the defect, and the like.

[0051] In this embodiment, the standard defect information data reflects the defect problems that can be detected by the existing optical solution in actual application, and this information is an important basis for evaluating the effectiveness of the optical solution. When facing the detection requirements of new circuit boards in the future, the same defects only need to be matched to the corresponding defect detection requirements on the new circuit boards, and the corresponding standard optical information can be matched from the created optical solution database, without having to design the optical solution from scratch, avoiding repeated verification and confirmation, and further improving the verification and confirmation efficiency of the optical solution.

[0052] Preferably, the step of aggregating the defect information data to corresponding regions and generating topological information of regional defects includes:

[0053] According to the area information of the defect, the defect information data is collected into the corresponding target area, wherein the defect information includes the area information;

[0054] The multi-attribute features of defects are fused, and the fused features of defects are connected through regional information topology to generate regional defect topology information.

[0055] The defect topology information of the determined standard optical information data includes:

[0056] The topological information of the standard optical information data and the regional information data is determined, and the defect topological information of the standard optical information data is determined in combination with the defect topological information of the region.

[0057] In this embodiment, the data is grouped into the corresponding target area according to the information of the area to which the defect belongs, so that the defect distribution of each area can be clearly understood. This helps to accurately locate the defect area, group the defects into areas, avoid the inability to effectively locate the corresponding standard optical information due to the confusion of defect grouping, and clearly understand the defect situation covered by each standard optical information. Clearly understand the belonging of the standard optical information corresponding to each defect, so that the corresponding standard optical information can be quickly and accurately located according to the defect information. Avoid the situation where the basic optical information cannot be confirmed due to inaccurate matching of standard optical information based on defect information, and improve the reliability and efficiency of confirming standard optical information based on defects. Fusion of the multi-dimensional attribute features of the defect can integrate information from multiple dimensions into a comprehensive feature. This fused feature more comprehensively reflects the nature of the defect. Integrate information from multiple dimensions into a comprehensive feature to describe the defect, and avoid mismatching of overlapping attribute features. For example, a new defect has multiple attributes such as surface roughness and color parameters that are the same, and there are similar but different attributes in the database. If they are not integrated into a comprehensive feature, when searching based on this new defect, the corresponding standard optical information may be matched, but the matched standard optical information cannot actually effectively detect this new defect. The wrong matching information will seriously affect the feasibility of the overall optical solution, causing situations such as rework and waste of resources, which will seriously affect the efficiency of the implementation of the optical solution. If it is integrated into a comprehensive feature, when searching based on this new defect, the corresponding standard optical information will not be matched. For this new defect, the corresponding optical solution needs to be redesigned and verified, which effectively prevents the above situation from occurring and further improves the verification and confirmation efficiency of the optical solution.

[0058] Example 2

[0059] This embodiment provides an apparatus for establishing an optical solution database, which is described by applying the method for establishing an optical solution database provided in the above embodiment 1. Figure 3 As shown, an optical scheme database establishment device provided in one embodiment of the present application may include the following multiple modules.

[0060] A format module is used to obtain an optical scheme data set, extract light source features and state features from the optical scheme data set, and generate standard optical information data;

[0061] The topology module creates regional data based on the standard optical information data, groups the defect information data into corresponding regions, generates defect topology information of the regions, and determines the defect topology information of the standard optical information data.

[0062] The optical solution database establishment device provided in the embodiment of the present application can be applied to the optical solution database establishment method provided in the above-mentioned embodiment 1. For relevant details, refer to the above-mentioned method embodiment. The implementation principle and technical effect are similar and will not be repeated here.

[0063] It should be noted that: when the optical solution database establishment device provided in the embodiments of the present application establishes the optical solution database, only the division of the above-mentioned functional modules / functional units is used as an example. In practical applications, the above-mentioned function allocation can be completed by different functional modules / functional units as needed, that is, the internal structure of the optical solution database establishment device is divided into different functional modules / functional units to complete all or part of the functions described above. In addition, the implementation method of the optical solution database establishment method provided in the above-mentioned method embodiment 1 and the implementation method of the optical solution database establishment device provided in this embodiment 2 belong to the same concept. The specific implementation process of the optical solution database establishment device provided in this embodiment 2 is detailed in the above-mentioned method embodiment 1, and will not be repeated here.

[0064] Example 3

[0065] See also Figure 4 As shown, one embodiment of the present application also provides a computer device, which can be a computer device such as a desktop computer, a laptop computer, a handheld computer, and a cloud server. The computer device can include, but is not limited to, a processor and a memory. The processor and the memory are connected via a bus or other means.

[0066] The processor may be a central processing unit (CPU). The processor may also be other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, graphics processing units (GPU), embedded neural network processors (NPU) or other dedicated deep learning coprocessors, discrete gate or transistor logic devices, discrete hardware components and other chips, or a combination of the above chips.

[0067] As a non-transitory computer-readable storage medium, the memory can be used to store non-transitory software programs, non-transitory computer executable programs and modules, such as program instructions / modules corresponding to the methods in the above-mentioned embodiments of the present application. The processor executes various functional applications and data processing of the processor by running the non-transitory software programs, instructions and modules stored in the memory, that is, implementing the methods in the above-mentioned method embodiments.

[0068] The memory may include a program storage area and a data storage area, wherein the program storage area may store an operating system, an application required for at least one function; the data storage area may store data created by the processor, etc. In addition, the memory may include a high-speed random access memory, and may also include a non-transitory memory, such as at least one disk storage device, a flash memory device, or other non-transitory solid-state storage device. In some embodiments, the memory may optionally include a memory remotely disposed relative to the processor, and these remote memories may be connected to the processor via a network. Examples of the above-mentioned network include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

[0069] One embodiment of the present application further provides a computer-readable storage medium, wherein the computer-readable storage medium is used to store a computer program. When the computer program is executed by a processor, the method in the above method embodiment is implemented.

[0070] Those skilled in the art can understand that the implementation of all or part of the processes in the above-mentioned implementation methods of the present application can be completed by instructing the relevant hardware through a computer program, and the program can be stored in a computer-readable storage medium, and when the program is executed, it can include the processes of the implementation methods of the above-mentioned methods. Among them, the storage medium can be a disk, an optical disk, a read-only memory (ROM), a random access memory (RAM), a flash memory, a hard disk (HDD) or a solid-state drive (SSD), etc.; the storage medium can also include a combination of the above-mentioned types of memory.

[0071] The technical features of the above embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0072] Although the embodiments of the present application are described in conjunction with the accompanying drawings, they cannot be understood as limiting the scope of the patent application. It should be pointed out that for ordinary technicians in this field, other different forms of changes or modifications can be made on the basis of the above description without departing from the concept of the present application. It is not necessary and impossible to list all the embodiments here. The obvious changes or modifications derived from this are still within the scope of protection created by the present application. Therefore, the scope of protection of the patent application shall be based on the attached claims.

Claims

1. A method for establishing an optical solution database, characterized in that: The method comprises: Acquire an optical scheme data set, extract light source features and state features from the optical scheme data set, and generate standard optical information data; Regional data is created based on standard optical information data, defect information data is grouped into corresponding regions, defect topology information of the regions is generated, and defect topology information of the standard optical information data is determined.

2. The method for establishing an optical solution database according to claim 1, characterized in that: Also includes: A defect data set is obtained, and data preprocessing is performed on the defect data set to generate standard defect information data.

3. The method for establishing an optical solution database according to claim 1, characterized in that: The extracting of light source features and state features from the optical scheme data set includes: Extracting attribute features of each light source based on the light source details in the optical solution data set; Based on the light source adjustable state details in the optical solution data set, light source subset state features are extracted.

4. The method for establishing an optical solution database according to claim 3, characterized in that: The standard optical information data includes the state details of the light source subset and the property details of each light source in the subset.

5. The method for establishing an optical solution database according to claim 1, characterized in that: The step of creating the regional data based on the standard optical information data comprises: The current product information is determined based on the standard optical information data, and the target area data is created according to the corresponding area on the product.

6. The method for establishing an optical solution database according to claim 1, characterized in that: The step of grouping the defect information data into corresponding regions and generating topological information of regional defects includes: According to the area information of the defect, the defect information data is collected into the corresponding target area, wherein the defect information includes the area information; The multi-attribute features of defects are fused, and the fused features of defects are connected through regional information topology to generate regional defect topology information.

7. The method for establishing an optical solution database according to claim 1, characterized in that: The defect topology information of the determined standard optical information data includes: The topological information of the standard optical information data and the regional information data is determined, and the defect topological information of the standard optical information data is determined in combination with the defect topological information of the region.

8. A device for establishing an optical solution database, characterized in that: include: A format module is used to obtain an optical scheme data set, extract light source features and state features from the optical scheme data set, and generate standard optical information data; The topology module creates regional data based on the standard optical information data, groups the defect information data into corresponding regions, generates defect topology information of the regions, and determines the defect topology information of the standard optical information data.

9. A computer device, characterized in that: include: A memory and a processor, wherein the memory and the processor are communicatively connected to each other, the memory stores computer instructions, and the processor implements the method for establishing an optical solution database as described in any one of claims 1 to 7 by executing the computer instructions.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer instructions, and when the computer instructions are executed by a processor, the method for establishing an optical solution database according to any one of claims 1 to 7 is implemented.

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