Data analysis method and system for chip-assisted test system

Abstract

The present invention discloses a data analysis method and system for a chip-assisted test system, the method comprising the following steps: analyzing and calculating the raw data obtained by the chip-assisted test system test to obtain the analysis value of the preprocessed raw data, and comparing it with the corresponding preset range, judging whether the analysis value of the preprocessed raw data is within the corresponding preset range, if not, importing the analysis value of the preprocessed raw data into a preset database, and finding out from the database a program that runs the analysis value of the preprocessed raw data within the corresponding preset range, and comparing it with the analysis value of the preprocessed raw data to find out the problem of the unqualified chip under test. The present invention solves the problem that the traditional data analysis method of the chip-assisted test system is limited to judging whether the chip is qualified, but cannot find out the problem when the chip is unqualified and provide a solution in time.

Description

Technical Field

[0001] The present invention relates to the technical field of data processing of a chip-assisted test system, and in particular to a data analysis method and system of a chip-assisted test system. Background Art

[0002] With the development of the times and the increasing maturity of the semiconductor chip testing field, the chip-assisted test system on the market tests the chip, and then analyzes the data obtained by the chip-assisted test system and forms a chart to meet the intuitive needs of data during production. The data analysis method of the traditional chip-assisted test system is limited to judging whether the chip is qualified, but it is unable to find out the problems when the chip is unqualified and provide solutions in time, resulting in low chip production efficiency. Summary of the invention

[0003] In view of the above-mentioned defects, the present invention proposes a data analysis method and system for a chip-assisted testing system, aiming to solve the problem that the data analysis method of the traditional chip-assisted testing system is limited to judging whether the chip is qualified, but cannot find out the problems existing when the chip is unqualified and provide solutions in time, resulting in low chip production efficiency.

[0004] To achieve this object, the present invention adopts the following technical solutions:

[0005] A data analysis method for a chip-assisted test system comprises the following steps:

[0006] Step S1: obtaining raw data of the chip under test obtained by the chip-assisted test system, and constructing a database;

[0007] Step S2: preprocessing the original data to obtain preprocessed original data;

[0008] Step S3: Analyze and calculate the preprocessed raw data to obtain analysis values ​​of the preprocessed raw data, wherein the analysis values ​​of the preprocessed raw data include the average value, maximum value, minimum value and mode of the preprocessed raw data;

[0009] Step S4: comparing the analysis value of the preprocessed raw data with the corresponding preset range to generate a corresponding comparison curve graph;

[0010] Step S5: According to the corresponding comparison curve chart, determine whether the analysis value of the preprocessed raw data is within the corresponding preset range. If so, it means that the chip under test is qualified; if not, it means that the chip under test is unqualified. The analysis value of the preprocessed raw data is imported into the database, and the program that runs the analysis value of the preprocessed raw data within the corresponding preset range is found from the database, and the program is compared with the analysis value of the preprocessed raw data to find out the problem of the unqualified chip under test, and find the corresponding solution from the database according to the problem of the unqualified chip under test.

[0011] Preferably, step S2 specifically includes the following sub-steps: step S21: removing outliers from the original data to obtain the original data with the outliers removed; step S22: classifying and arranging the original data with the outliers removed to obtain the pre-processed original data.

[0012] Preferably, in step S5, when the analysis value of the preprocessed raw data is not within the corresponding preset range, the analysis value of the preprocessed raw data is imported into a database, a program running with the analysis value of the preprocessed raw data within the corresponding preset range is found from the database, and the program is compared with the analysis value of the preprocessed raw data, and the following steps are also included:

[0013] If the program running on the analysis value of the preprocessed raw data within the corresponding preset range is compared with the analysis value of the preprocessed raw data and no problem of unqualified chip under test is found, then a program running on the same type of data as the analysis value of the preprocessed raw data within the corresponding preset range is found from the database, and the program running on the same type of data as the analysis value of the preprocessed raw data within the corresponding preset range and the program running on the analysis value of the preprocessed raw data within the corresponding preset range are compared with the analysis value of the preprocessed raw data to find the problem of unqualified chip under test.

[0014] Preferably, the method further comprises the following steps: storing the corresponding comparison curve graph in a database.

[0015] Another aspect of the present application provides a data analysis system for a chip-assisted test system, the system comprising:

[0016] An acquisition module is used to acquire the raw data of the chip under test obtained by the chip-assisted test system;

[0017] Building modules, used to build databases;

[0018] A preprocessing module is used to preprocess the original data to obtain the preprocessed original data;

[0019] An analysis and calculation module, used for analyzing and calculating the preprocessed raw data to obtain analysis values ​​of the preprocessed raw data, wherein the analysis values ​​of the preprocessed raw data include an average value, a maximum value, a minimum value and a mode of the preprocessed raw data;

[0020] A first comparison module is used to compare the analysis value of the preprocessed raw data with the corresponding preset range to generate a corresponding comparison curve graph;

[0021] A judgment module is used to judge whether the analysis value of the preprocessed raw data is within the corresponding preset range according to the corresponding comparison curve graph. If so, it means that the chip under test is qualified; if not, it means that the chip under test is unqualified, and the import module is executed, and the first search module is executed, and the second comparison module is executed, and the second search module is executed;

[0022] An import module is used to import the analysis value of the preprocessed raw data into a database;

[0023] A first search module is used to find out from the database the program running in the corresponding preset range of the analysis value of the pre-processed raw data;

[0024] A second comparison module is used to compare the analysis value of the preprocessed raw data with the program running within the corresponding preset range, so as to find out the problem of the unqualified chip under test;

[0025] The second search module is used to find corresponding solutions from the database according to the problems existing in the unqualified chip under test.

[0026] Preferably, the preprocessing module includes: a removal submodule for removing outliers from the original data to obtain the original data with the outliers removed; and a classification and arrangement submodule for classifying and arranging the original data with the outliers removed to obtain the preprocessed original data.

[0027] Preferably, it also includes:

[0028] A third search module is used to find out from the database a program running on the same type of data as the analysis value of the preprocessed original data within a corresponding preset range;

[0029] A third comparison module is used to compare the analysis value of the preprocessed raw data with the analysis value of the preprocessed raw data, so as to find out the problem of the unqualified chip under test;

[0030] In the second comparison module, if the program running the analysis value of the preprocessed original data is within the corresponding preset range and no problem of unqualified chip under test is found by comparing the analysis value of the preprocessed original data, the third search module is executed and the third comparison module is executed.

[0031] Preferably, the storage module is used to store the corresponding comparison curve graph in a database.

[0032] The technical solution provided by the embodiments of the present application may have the following beneficial effects:

[0033] In this solution, the raw data obtained by testing the chip under test in the chip-assisted test system are sorted, and the sorted raw data are analyzed in a targeted manner to obtain the average value, maximum value, minimum value and mode of the sorted raw data, and to determine whether these data exceed the corresponding preset range to determine whether the chip under test is qualified. If the chip under test is unqualified, the problem of the unqualified chip under test is analyzed based on the specific situation of exceeding the preset range and combined with the data in the database, and specific solutions are found in time. Compared with the traditional data analysis method that is limited to judging whether the chip is qualified, but cannot find out the problems when the chip is unqualified and provide solutions in time, it can effectively improve the production efficiency of the chip. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] Figure 1 The invention is a flow chart of steps of a data analysis method of a chip-assisted test system. DETAILED DESCRIPTION

[0035] The embodiments of the present invention are described in detail below, and examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals represent the same or similar elements or elements having the same or similar functions from beginning to end. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be understood as limiting the present invention.

[0036] A data analysis method for a chip-assisted test system comprises the following steps:

[0037] Step S1: obtaining raw data of the chip under test obtained by the chip-assisted test system, and constructing a database;

[0038] Step S2: preprocessing the original data to obtain preprocessed original data;

[0039] Step S3: Analyze and calculate the preprocessed raw data to obtain analysis values ​​of the preprocessed raw data, wherein the analysis values ​​of the preprocessed raw data include the average value, maximum value, minimum value and mode of the preprocessed raw data;

[0040] Step S4: comparing the analysis value of the preprocessed raw data with the corresponding preset range to generate a corresponding comparison curve graph;

[0041] Step S5: According to the corresponding comparison curve chart, determine whether the analysis value of the preprocessed raw data is within the corresponding preset range. If so, it means that the chip under test is qualified; if not, it means that the chip under test is unqualified. The analysis value of the preprocessed raw data is imported into the database, and the program that runs the analysis value of the preprocessed raw data within the corresponding preset range is found from the database, and the program is compared with the analysis value of the preprocessed raw data to find out the problem of the unqualified chip under test, and find the corresponding solution from the database according to the problem of the unqualified chip under test.

[0042] A data analysis method for a chip-assisted test system of the present invention, such as Figure 1As shown, the first step is to obtain the raw data obtained by the chip under test in the chip-assisted test system test, and to build a database. In this embodiment, the raw data obtained by the chip under test in the chip-assisted test system test includes the output voltage value and output current value of one or more chips under test at different test times under different input voltage values. The construction of the database is conducive to storing and managing the analysis values ​​of the raw data obtained by the chip under test in the chip-assisted test system test, the program running within the corresponding preset range, the corresponding solution to the problem of the unqualified chip under test, etc. The second step is to pre-process the raw data to obtain the pre-processed raw data. In this embodiment, the raw data is pre-processed to ensure the accuracy and consistency of the raw data. The third step is to analyze and calculate the pre-processed raw data to obtain the analysis value of the pre-processed raw data, wherein the analysis value of the pre-processed raw data includes the average value, maximum value, minimum value and mode of the pre-processed raw data. In this embodiment, the pre-processed raw data is analyzed and calculated, specifically, the average value of the pre-processed raw data is calculated, and the maximum value, minimum value and mode in the pre-processed raw data are found. This is conducive to subsequent comparison based on these values ​​with the corresponding preset range. The fourth step is to compare the analysis value of the preprocessed original data with the corresponding preset range to generate a corresponding comparison curve graph. In one embodiment, when the analysis value of the preprocessed original data is the maximum value of the output current of the tested chip in 10 tests under the input voltage condition of 1V to 5V, and a tested chip is tested 10 times, assuming that the preset range corresponding to the maximum value of the output current of the tested chip in the 10 tests is 1A to 2A, a comparison curve graph of the maximum value of the output current of the tested chip in the 10 tests and the corresponding preset range is formed, which can intuitively display the change in the maximum value of the output current of the tested chip in the 10 tests.The fifth step is to determine whether the analysis value of the preprocessed raw data is within the corresponding preset range according to the corresponding comparison curve graph. If so, it means that the chip under test is qualified; if not, it means that the chip under test is unqualified. The analysis value of the preprocessed raw data is imported into the database, and the program running the analysis value of the preprocessed raw data within the corresponding preset range is found from the database, and the program is compared with the analysis value of the preprocessed raw data to find the problem of the unqualified chip under test, and find the corresponding solution from the database according to the problem of the unqualified chip under test. In one embodiment, a comparison curve graph of the maximum value of the output current of the chip under test in 10 tests and the corresponding preset range is taken as an example. When the maximum value of the output current of the chip under test in 10 tests is not within the corresponding preset range, the maximum value of the output current of the chip under test in the 10 tests is imported into the database, and the programs that run when the maximum value of the output current of the chip under test in the 10 tests is within the corresponding preset range are found in the database, and these programs are compared with the maximum value of the output current of the chip under test in the 10 tests one by one, so as to find out the reason why the maximum value of the output current of the chip under test in the 10 tests is not within the corresponding preset range, that is, the problem of the unqualified chip under test, for example, in one of the tests, the test voltage input to the chip under test is too high, resulting in the maximum value of the output current of the chip under test in the test not being within the preset range. In order to solve the above problem, a corresponding solution can be found in the database, that is, reducing the test voltage input to the chip under test.

[0043] In this solution, the raw data obtained by testing the chip under test in the chip-assisted test system are sorted, and the sorted raw data are analyzed in a targeted manner to obtain the average value, maximum value, minimum value and mode of the sorted raw data, and to determine whether these data exceed the corresponding preset range to determine whether the chip under test is qualified. If the chip under test is unqualified, the problem of the unqualified chip under test is analyzed based on the specific situation of exceeding the preset range and combined with the data in the database, and specific solutions are found in time. Compared with the traditional data analysis method that is limited to judging whether the chip is qualified, but cannot find out the problems when the chip is unqualified and provide solutions in time, it can effectively improve the production efficiency of the chip.

[0044] Preferably, in step S2, the following sub-steps are specifically included: step S21: removing the outliers in the original data to obtain the original data with the outliers removed; step S22: classifying and sorting the original data with the outliers removed to obtain the pre-processed original data. In this embodiment, in step S21, if there is no numerical change in the chip under test after adjusting the input voltage, the numerical value of the chip under test is an outlier. In step S22, the original data with the outliers removed is classified and sorted, specifically, the original data with the outliers removed is classified into an output current category and an output voltage category, etc.

[0045] Preferably, in step S5, when the analysis value of the preprocessed raw data is not within the corresponding preset range, the analysis value of the preprocessed raw data is imported into a database, a program running with the analysis value of the preprocessed raw data within the corresponding preset range is found from the database, and the program is compared with the analysis value of the preprocessed raw data, and the following steps are also included:

[0046] If the program running on the analysis value of the preprocessed raw data within the corresponding preset range is compared with the analysis value of the preprocessed raw data and no problem of unqualified chip under test is found, then a program running on the same type of data as the analysis value of the preprocessed raw data within the corresponding preset range is found from the database, and the program running on the same type of data as the analysis value of the preprocessed raw data within the corresponding preset range and the program running on the analysis value of the preprocessed raw data within the corresponding preset range are compared with the analysis value of the preprocessed raw data to find the problem of unqualified chip under test.

[0047] In this embodiment, after comparing the program running within the corresponding preset range with the analysis value of the preprocessed raw data, it is found that the reason why the tested chip is unqualified cannot be found. Since the database stores the program running within the corresponding preset range with the analysis value of the preprocessed raw data, the program running within the corresponding preset range with the analysis value of the preprocessed raw data can be found in the database. The program running within the corresponding preset range with the analysis value of the preprocessed raw data is combined with the analysis value of the preprocessed raw data to ensure that the reason why the tested chip is unqualified can be found.

[0048] Preferably, the method further comprises the following steps: storing the corresponding comparison curve graph in a database. In this embodiment, storing the comparison curve graph in a database is conducive to the centralized management of all graphic data, and is convenient for users to quickly retrieve and analyze graphic data as needed.

[0049] Another aspect of the present application provides a data analysis system for a chip-assisted test system, the system comprising:

[0050] An acquisition module is used to acquire the raw data of the chip under test obtained by the chip-assisted test system;

[0051] Building modules, used to build databases;

[0052] A preprocessing module is used to preprocess the original data to obtain the preprocessed original data;

[0053] An analysis and calculation module, used for analyzing and calculating the preprocessed raw data to obtain analysis values ​​of the preprocessed raw data, wherein the analysis values ​​of the preprocessed raw data include an average value, a maximum value, a minimum value and a mode of the preprocessed raw data;

[0054] A first comparison module is used to compare the analysis value of the preprocessed raw data with the corresponding preset range to generate a corresponding comparison curve graph;

[0055] A judgment module is used to judge whether the analysis value of the preprocessed raw data is within the corresponding preset range according to the corresponding comparison curve graph. If so, it means that the chip under test is qualified; if not, it means that the chip under test is unqualified, and the import module is executed, and the first search module is executed, and the second comparison module is executed, and the second search module is executed;

[0056] An import module is used to import the analysis value of the preprocessed raw data into a database;

[0057] A first search module is used to find out from the database the program running in the corresponding preset range of the analysis value of the pre-processed raw data;

[0058] A second comparison module is used to compare the analysis value of the preprocessed raw data with the program running within the corresponding preset range, so as to find out the problem of the unqualified chip under test;

[0059] The second search module is used to find corresponding solutions from the database according to the problems existing in the unqualified chip under test.

[0060] A data analysis system of a chip-assisted test system in the present scheme realizes the analysis of the original data obtained from the test of the chip under test in the chip-assisted test system through the mutual cooperation of an acquisition module, a construction module, a preprocessing module, an analysis and calculation module, a first comparison module, a judgment module, an import module, a first search module, a second comparison module and a second search module.

[0061] In this solution, the raw data obtained by testing the chip under test in the chip-assisted test system are sorted, and the sorted raw data are analyzed in a targeted manner to obtain the average value, maximum value, minimum value and mode of the sorted raw data, and to determine whether these data exceed the corresponding preset range to determine whether the chip under test is qualified. If the chip under test is unqualified, the problem of the unqualified chip under test is analyzed based on the specific situation of exceeding the preset range and combined with the data in the database, and specific solutions are found in time. Compared with the traditional data analysis method that is limited to judging whether the chip is qualified, but cannot find out the problems when the chip is unqualified and provide solutions in time, it can effectively improve the production efficiency of the chip.

[0062] Preferably, the preprocessing module includes: a removal submodule, which is used to remove outliers from the original data to obtain the original data with the outliers removed; and a classification and arrangement submodule, which is used to classify and arrange the original data with the outliers removed to obtain the preprocessed original data. In this embodiment, in the removal submodule, if there is no numerical change in the chip under test after adjusting the input voltage, then the numerical value of the chip under test is an outlier. In the classification and arrangement submodule, the original data with the outliers removed is classified and arranged, specifically, the original data with the outliers removed is divided into a category of output current and a category of output voltage, etc.

[0063] Preferably, it also includes:

[0064] A third search module is used to find out from the database a program running on the same type of data as the analysis value of the preprocessed original data within a corresponding preset range;

[0065] A third comparison module is used to compare the analysis value of the preprocessed raw data with the analysis value of the preprocessed raw data, so as to find out the problem of the unqualified chip under test;

[0066] In the second comparison module, if the program running the analysis value of the preprocessed original data is within the corresponding preset range and no problem of unqualified chip under test is found by comparing the analysis value of the preprocessed original data, the third search module is executed and the third comparison module is executed.

[0067] In this embodiment, if the reason why the tested chip fails to meet the standards cannot be found during the execution of the second comparison module, the third search module and the third comparison module are continued to be executed to ensure that the reason why the tested chip fails to meet the standards can be found.

[0068] Preferably, it further comprises: a storage module for storing the corresponding comparison curve graph in a database. In this embodiment, the storage module is provided to facilitate centralized management of all graphic data, and facilitate users to quickly retrieve and analyze graphic data as needed.

[0069] In addition, each functional unit in each embodiment of the present invention may be integrated into a processing module, or each unit may exist physically separately, or two or more units may be integrated into one module. The above-mentioned integrated module may be implemented in the form of hardware or in the form of a software functional module. If the integrated module is implemented in the form of a software functional module and sold or used as an independent product, it may also be stored in a computer-readable storage medium.

[0070] Although the embodiments of the present invention have been shown and described above, it is to be understood that the above embodiments are exemplary and are not to be construed as limitations of the present invention. A person skilled in the art may change, modify, replace and vary the above embodiments within the scope of the present invention.

Claims

1. A data analysis method for a chip-assisted test system, characterized in that: The following steps are involved: Step S1: obtaining raw data of the chip under test obtained by the chip-assisted test system, and constructing a database; Step S2: preprocessing the original data to obtain preprocessed original data; Step S3: Analyze and calculate the preprocessed raw data to obtain analysis values ​​of the preprocessed raw data, wherein the analysis values ​​of the preprocessed raw data include the average value, maximum value, minimum value and mode of the preprocessed raw data; Step S4: comparing the analysis value of the preprocessed raw data with the corresponding preset range to generate a corresponding comparison curve graph; Step S5: According to the corresponding comparison curve chart, determine whether the analysis value of the preprocessed raw data is within the corresponding preset range. If so, it means that the chip under test is qualified; if not, it means that the chip under test is unqualified. The analysis value of the preprocessed raw data is imported into the database, and the program that runs the analysis value of the preprocessed raw data within the corresponding preset range is found from the database, and the program is compared with the analysis value of the preprocessed raw data to find out the problem of the unqualified chip under test, and find the corresponding solution from the database according to the problem of the unqualified chip under test.

2. The data analysis method of a chip-assisted test system according to claim 1, characterized in that: In step S2, the following sub-steps are specifically included: Step S21: removing outliers from the original data to obtain the original data without outliers; Step S22: Classify and sort the original data with outliers removed to obtain pre-processed original data.

3. The data analysis method of a chip-assisted test system according to claim 1, characterized in that: In step S5, when the analysis value of the preprocessed raw data is not within the corresponding preset range, the analysis value of the preprocessed raw data is imported into the database, and a program running with the analysis value of the preprocessed raw data within the corresponding preset range is found from the database, and the program is compared with the analysis value of the preprocessed raw data, and the following steps are also included: If the program running on the analysis value of the preprocessed raw data within the corresponding preset range is compared with the analysis value of the preprocessed raw data and no problem of unqualified chip under test is found, then a program running on the same type of data as the analysis value of the preprocessed raw data within the corresponding preset range is found from the database, and the program running on the same type of data as the analysis value of the preprocessed raw data within the corresponding preset range and the program running on the analysis value of the preprocessed raw data within the corresponding preset range are compared with the analysis value of the preprocessed raw data to find the problem of unqualified chip under test.

4. The data analysis method of a chip-assisted test system according to claim 1, characterized in that: The following steps are also included: The corresponding comparison curve diagram is stored in the database.

5. A data analysis system for a chip-assisted test system, characterized in that: Using the data analysis method of the chip-assisted test system according to any one of claims 1 to 4, the system comprises: An acquisition module is used to acquire the raw data of the chip under test obtained by the chip-assisted test system; Building modules, used to build databases; A preprocessing module is used to preprocess the original data to obtain the preprocessed original data; An analysis and calculation module, used for analyzing and calculating the preprocessed raw data to obtain analysis values ​​of the preprocessed raw data, wherein the analysis values ​​of the preprocessed raw data include an average value, a maximum value, a minimum value and a mode of the preprocessed raw data; A first comparison module is used to compare the analysis value of the preprocessed raw data with the corresponding preset range to generate a corresponding comparison curve graph; A judgment module is used to judge whether the analysis value of the preprocessed raw data is within the corresponding preset range according to the corresponding comparison curve graph. If so, it means that the chip under test is qualified; if not, it means that the chip under test is unqualified, and the import module is executed, and the first search module is executed, and the second comparison module is executed, and the second search module is executed; An import module is used to import the analysis value of the preprocessed raw data into a database; A first search module is used to find out from the database the program running in the corresponding preset range of the analysis value of the pre-processed raw data; A second comparison module is used to compare the analysis value of the preprocessed raw data with the program running within the corresponding preset range, so as to find out the problem of the unqualified chip under test; The second search module is used to find corresponding solutions from the database according to the problems existing in the unqualified chip under test.

6. The data analysis system of a chip-assisted test system according to claim 5, characterized in that: The preprocessing module comprises: A removal submodule is used to remove outliers from the original data to obtain the original data without outliers; The classification and sorting submodule is used to classify and sort the original data after removing outliers to obtain the preprocessed original data.

7. The data analysis system of a chip-assisted test system according to claim 5, characterized in that: Also includes: A third search module is used to find out from the database a program running on the same type of data as the analysis value of the preprocessed original data within a corresponding preset range; A third comparison module is used to compare the analysis value of the preprocessed raw data with the analysis value of the preprocessed raw data, so as to find out the problem of the unqualified chip under test; In the second comparison module, if the program running the analysis value of the preprocessed original data is within the corresponding preset range and no problem of unqualified chip under test is found by comparing the analysis value of the preprocessed original data, the third search module is executed and the third comparison module is executed.

8. The data analysis system of a chip-assisted test system according to claim 5, characterized in that: Also includes: The storage module is used to store the corresponding comparison curve diagram in a database.

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