A quality monitoring method for pure film production line

Abstract

The present invention relates to the field of image processing technology, and more specifically, to a quality monitoring method for a pure adhesive film production line, the method comprising: obtaining an illumination intensity matrix of a target area, calculating the maximum sampling times of a selected monitoring area based on the number of moving position points of any position point in the target area when a new illumination intensity matrix is ​​collected next time, and continuously collecting the illumination intensity matrix corresponding to the monitoring area until the sampling times are equal to the maximum sampling times, determining the light intensity index of the corresponding position point according to the average illumination intensity of each position point in the monitoring area under all sampling times, thereby obtaining an illumination index matrix, and performing quality monitoring on the monitoring area according to the comparison result of the abnormal index and a preset threshold value. The present invention can accurately monitor the unevenness of the thickness of the adhesive film during the production process of the adhesive film, and realize accurate monitoring of the quality of the adhesive film.

Description

Technical Field

[0001] The present invention relates to the field of image processing technology, and more specifically, to a quality monitoring method for a pure adhesive film production line. Background Art

[0002] Pure adhesive film is often used in many fields such as electronic products, optical equipment, and packaging materials. In these applications, the quality of the adhesive film is directly related to the performance and reliability of the final product. For example, in optical display equipment, the transparency, optical transmittance, and uniformity of the adhesive film will significantly affect the display effect and service life; in the packaging field, the thickness uniformity and mechanical strength of the adhesive film are crucial to its protective effect. Therefore, ensuring that the adhesive film has consistent quality standards during the production process, especially maintaining the uniformity of the thickness of the adhesive film, is the basis for improving product quality and enhancing market competitiveness.

[0003] The thickness uniformity of the film is one of the key indicators for evaluating its quality. The unevenness of the film thickness not only affects its physical properties, such as tensile strength, elasticity and durability, but may also cause the film to fail in practical applications. For example, too thin a thickness in certain areas may cause the film to break easily or lose its protective function, while too much thickness may cause the film to fail to achieve the desired effect in a specific application. Therefore, quality monitoring during the film production process, especially the monitoring of the uniformity of the film thickness, plays a vital role.

[0004] However, in the prior art, film quality monitoring mainly relies on the measurement of light intensity. The traditional light intensity matrix acquisition technology is to use a light source emitter to vertically illuminate the surface of the film and measure the intensity of the reflected light to evaluate the quality of the film. The advantage of this method is that it can quickly obtain a large amount of light data, thereby reflecting the approximate quality of the film surface. However, the light intensity matrix acquisition method has certain limitations in practical applications, especially when dealing with wrinkles or folds that may appear on the surface of the film. The presence of wrinkles or folds will change the morphology of the film surface, resulting in deviations in the reflection data of the light intensity. The obtained light intensity data may not accurately reflect the actual quality of the film, thereby affecting the accuracy of the quality assessment. Summary of the invention

[0005] In order to solve the problem that the unevenness of the film thickness cannot be accurately measured, resulting in low accuracy of the quality assessment result, the present invention provides a quality monitoring method for a pure film production line. The method comprises: During the transmission of the adhesive film, the light intensity matrix received when the light source emitter vertically irradiates the target area in the adhesive film is obtained; Determine the number of moving position points of any position point in the target area when a new light intensity matrix is ​​collected next time, select a monitoring area from a position in the target area away from the film transmission direction, obtain the number of column vectors of the light intensity matrix corresponding to the remaining area, and calculate the maximum sampling number of the monitoring area, which is the largest integer less than the ratio of the number of column vectors and the number of moving position points; Continuously collect the light intensity matrix corresponding to the monitoring area until the sampling number is equal to the maximum sampling number, take the ratio of the mean light intensity of any position point in the monitoring area under all sampling times to the preset standard light intensity as the light intensity index of the position point, and obtain the light intensity index matrix; Calculate the anomaly index of the monitoring area : ; , are the minimum and maximum values ​​in the light intensity index matrix respectively; is the entropy of the light intensity index matrix; It is an absolute value symbol; the quality of the monitoring area is monitored based on the comparison result between the abnormal index and the preset threshold.

[0006] The present invention can eliminate the influence of wrinkles or bends in the adhesive film on thickness monitoring by calculating the light intensity index matrix corresponding to the monitoring area, thereby accurately evaluating the light intensity at each position in the monitoring area, providing an accurate data basis for evaluating the thickness distribution of the adhesive film in the monitoring area, and further realizing accurate monitoring of the adhesive film quality.

[0007] Preferably, the number of moving position points of any position point in the target area when a new light intensity matrix is ​​collected next time satisfies the following relationship: ; In the formula, The number of moving positions of any position point in the target area when a new light intensity matrix is ​​collected next time; is the transmission speed of the film; is the sampling frequency of the light intensity matrix; is the length of the light source emitter; is the number of column vectors in the illumination intensity matrix corresponding to the target area; The round-up symbol.

[0008] The present invention provides a data basis for subsequent calculation of the maximum number of sampling times of the monitoring area by calculating the number of moving position points of any position point in the target area when a new light intensity matrix is ​​collected next time.

[0009] Preferably, the length of the monitoring area is half the length of the target area.

[0010] The present invention can not only ensure the amount of data of the light intensity matrix corresponding to the monitored area, but also ensure that the size of the film area monitored each time is at a high level, thereby ensuring the accuracy and efficiency of film quality monitoring.

[0011] Preferably, the maximum number of sampling times of the monitoring area satisfies the following relationship: ; In the formula, is the maximum number of sampling times in the monitoring area; is the number of column vectors in the illumination intensity matrix corresponding to the target area; The number of moving positions of any position point in the target area when a new light intensity matrix is ​​collected next time; is the sampling times; is a positive integer sign; A function that returns the maximum value.

[0012] Preferably, the light intensity index of any point in the monitoring area satisfies the following relationship: ; In the formula, The horizontal coordinate is , the vertical axis is The light intensity index of the location point; The number of moving positions of any position point in the target area when a new light intensity matrix is ​​collected next time; The sampling order for the monitoring area; is the maximum number of sampling times in the monitoring area; is the preset standard light intensity; wherein the transmission direction of the film is the positive direction of the horizontal axis.

[0013] The present invention eliminates the influence of wrinkles or bends on the acquired light intensity when the monitoring area appears, so that the light intensity of each position point in the monitoring area can be accurately measured to provide an accurate data basis for subsequent evaluation of the uniformity of the thickness of the film in the monitoring area.

[0014] Preferably, the entropy of the light intensity index matrix satisfies the following relationship: ; In the formula, is the entropy of the light intensity index matrix; The value in the light intensity index matrix is The proportion of is an exponential function with the natural number 2 as base; is the length of the light emitter.

[0015] Preferably, quality monitoring of the monitoring area is performed based on the comparison result between the abnormality index and the preset threshold, including: Obtaining a preset threshold value, if the abnormal index of the monitoring area is greater than the threshold value, it is determined that the quality of the film in the monitoring area does not meet the standard; If the abnormality index of the monitoring area is less than or equal to the threshold, it is determined that the quality of the film in the monitoring area meets the standard.

[0016] The present invention can realize accurate monitoring of the quality of the adhesive film.

[0017] Preferably, the number of row and column vectors in the illumination intensity matrix corresponding to the target area corresponds to the dimension of the light source arrangement in the light source emitter.

[0018] Preferably, the step length between adjacent position points in the target area is the interval length between adjacent light sources in the light source emitter.

[0019] Preferably, during the transmission of the adhesive film, the horizontal coordinate of each position point in the monitoring area will gradually increase along the transmission direction, while the vertical coordinate remains unchanged.

[0020] The present invention has the following effects: 1. The present invention can accurately measure the light intensity of each position point in the monitoring area by calculating the light intensity index matrix corresponding to the monitoring area, thereby providing an accurate data basis for subsequent evaluation of the quality of the adhesive film in the monitoring area.

[0021] 2. The present invention calculates the abnormal index of the monitoring area by integrating various data, thereby ensuring the accuracy of the calculation results, thereby being able to accurately measure the unevenness of the film thickness in the monitoring area and achieve precise monitoring of the film quality in the monitoring area. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] By reading the following detailed description with reference to the accompanying drawings, the above and other objects, features and advantages of the exemplary embodiments of the present invention will become readily understood. In the accompanying drawings, several embodiments of the present invention are shown in an exemplary and non-limiting manner, and the same or corresponding reference numerals represent the same or corresponding parts, wherein: Figure 1 The present invention is a flowchart of a method for monitoring the quality of a pure adhesive film production line according to an embodiment of the present invention.

[0023] Figure 2 It is a schematic diagram of the placement of the light source transmitter and the receiver when obtaining the light intensity matrix in an embodiment of the present invention. DETAILED DESCRIPTION

[0024] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present invention.

[0025] The specific embodiments of the present invention are described in detail below with reference to the accompanying drawings.

[0026] Reference Figure 1 , a quality monitoring method for a pure adhesive film production line, comprising steps S1 to S5, specifically as follows: S1: During the transmission of the adhesive film, the light intensity matrix received when the light source emitter vertically irradiates the target area in the adhesive film is obtained.

[0027] It should be noted that, when films of different thicknesses are exposed to light, the light intensity images received by the receiver are inconsistent, that is, the light transmittance of thicker films is low, and the light intensity received is relatively small, while the light transmittance of thinner films is high, and the corresponding light intensity is relatively large. Therefore, the present invention can evaluate the uniformity of film thickness and thus evaluate the quality of the film by analyzing based on the light intensity matrix.

[0028] Specifically, refer to Figure 2 As shown, a light source transmitter can be placed below the film transmission device and between the two rollers, and the position is fixed to irradiate the film vertically, and a receiver is placed on the other side to receive the light intensity after the light source irradiates the corresponding position of the film vertically, and obtain the light intensity matrix of the target area irradiated by the light source transmitter. Among them, the target area is the film area irradiated by the light source transmitter, and the light intensity matrix refers to the two-dimensional matrix composed of the light intensity of each position received by the receiver when the light source transmitter irradiates the target area.

[0029] In an exemplary embodiment of the present invention, the number of row and column vectors in the illumination intensity matrix corresponding to the target area corresponds to the dimension of the arrangement of light sources in the light source emitter.

[0030] For example, if the light sources in the light source emitter are arranged in 3 (rows) × 4 (columns), then the number of row vectors of the light intensity matrix corresponding to the target area is 3, and the number of column vectors is 4.

[0031] S2: Determine the number of moving position points of any position point in the target area when a new light intensity matrix is ​​collected next time.

[0032] In an exemplary embodiment of the present invention, the position point refers to the coordinate position of the corresponding film area in the target area irradiated by the light source emitter. It should be noted that the step length between adjacent position points is the interval length between adjacent light sources in the light source emitter.

[0033] Specifically, the number of moving position points of any position point in the target area when a new light intensity matrix is ​​collected next time satisfies the following relationship: ; In the formula, The number of moving positions of any position point in the target area when a new light intensity matrix is ​​collected next time; is the transmission speed of the film; is the sampling frequency of the light intensity matrix; is the length of the light source emitter; is the number of column vectors in the illumination intensity matrix corresponding to the target area; The round-up symbol.

[0034] in, Reflects the sampling interval of the light intensity matrix; It reflects the displacement of any position point in the target area when a new light intensity matrix is ​​collected next time; It reflects the proportion of the displacement in the length of the light source emitter. This value is multiplied by the number of column vectors in the light intensity matrix corresponding to the target area, which can reflect the number of position points corresponding to the displacement, thereby obtaining the number of moved position points of the position point when a new light intensity matrix is ​​collected next time.

[0035] It should be noted that by calculating the number of moving position points of any position point in the target area when a new light intensity matrix is ​​collected next time, it is easy to find the moving position of each position point in the target area when the light intensity matrix is ​​continuously collected, thereby providing a data basis for subsequent evaluation of the quality of the film.

[0036] S3: Select a monitoring area from a position in the target area away from the film transmission direction, obtain the number of column vectors of the light intensity matrix corresponding to the remaining area, and calculate the maximum sampling number of the monitoring area. The maximum sampling number is the largest integer less than the ratio of the number of column vectors to the number of moving position points.

[0037] It should be noted that during the acquisition of the light intensity matrix, the tension on the film may cause the film to curl, resulting in changes in the thickness of the film. Therefore, the present invention continuously monitors the light intensity of each position point in the monitoring area to ensure the accuracy of the determined light intensity.

[0038] In an exemplary embodiment of the present invention, the length of the monitoring area is half the length of the target area.

[0039] Optionally, when the left side of the target area is close to the transmission direction of the film, the right half of the target area is used as the monitoring area, so that the light intensity matrix corresponding to the monitoring area can be continuously collected during the transmission of the film to accurately evaluate the unevenness of the film in the monitoring area. It should be noted that selecting half of the target area as the monitoring area can ensure the sampling times of the light intensity matrix corresponding to the monitoring area while covering the film area to be monitored to a large extent, thereby ensuring the accuracy and efficiency of film quality monitoring.

[0040] In another embodiment, the length of the selected monitoring area may also be less than or greater than half of the length of the target area.

[0041] Furthermore, after the monitoring area is determined, the maximum sampling times of the monitoring area can be calculated. Specifically, the maximum sampling times of the monitoring area satisfies the following relationship: ; In the formula, is the maximum number of sampling times in the monitoring area; is the number of column vectors in the illumination intensity matrix corresponding to the target area; The number of moving positions of any position point in the target area when a new light intensity matrix is ​​collected next time; is the sampling times; is a positive integer symbol, indicating The positive integer part of ; A function that returns the maximum value.

[0042] in, It reflects the number of column vectors of the light intensity matrix corresponding to the area in the target area except the monitoring area; It reflects the number of times the light intensity matrix corresponding to the monitoring area can be collected; it should be noted that due to The value of may not be an integer, so the present invention uses the largest positive integer less than this value as the maximum sampling number of the monitoring area, so that the corresponding light intensity matrix in the monitoring area can be collected multiple times in succession to continuously monitor the light intensity of each position point in the monitoring area.

[0043] S4: Continuously collect the light intensity matrix corresponding to the monitoring area until the sampling number is equal to the maximum sampling number, and take the ratio of the mean light intensity of any position point in the monitoring area under all sampling times to the preset standard light intensity as the light intensity index of the position point, and obtain the light intensity index matrix.

[0044] In an exemplary embodiment of the present invention, the light intensity index refers to a parameter used to measure the light intensity level of any position point in the monitoring area under continuous multiple sampling. For example, when the light intensity of any position point in the monitoring area is relatively large under continuous multiple sampling, it means that the light transmittance of the position point is relatively high, and the thickness of the corresponding adhesive film area at the position point is relatively thin; conversely, it means that the light transmittance of the position point is relatively low, and the thickness of the corresponding adhesive film area at the position point is relatively thick. Therefore, the uniformity of the thickness of the adhesive film area at each position point in the monitoring area can be measured according to the light intensity index of each position point in the monitoring area, so as to realize the quality monitoring of the monitoring area.

[0045] Specifically, the light intensity index of any point in the monitoring area satisfies the following relationship: ; In the formula, The horizontal coordinate is , the vertical axis is The light intensity index of the location point; The number of moving positions of any position point in the target area when a new light intensity matrix is ​​collected next time; The sampling order for the monitoring area; is the maximum number of sampling times in the monitoring area; The preset standard light intensity is used as The reference value of the value, It can be set according to specific circumstances. There is no special limitation on the value of ; wherein the transmission direction of the film is the positive direction of the horizontal axis.

[0046] It should be noted that, since the present invention defines the transmission direction of the film as the positive direction of the horizontal coordinate of the position point, during the transmission of the film, the horizontal coordinate of each position point in the monitoring area will gradually increase with the transmission direction, while the vertical coordinate remains unchanged.

[0047] Furthermore, the calculation formula of the light intensity index can be used to calculate the light intensity index of each position point in the monitoring area, thereby obtaining a light intensity index matrix corresponding to the monitoring area.

[0048] S5: Calculate the abnormality index of the monitoring area to perform quality monitoring on the monitoring area according to the comparison result between the abnormality index and the preset threshold value.

[0049] In an exemplary embodiment of the present invention, the abnormality index refers to data that measures the quality of the adhesive film in the monitoring area. For example, when the thickness of the adhesive film in the monitoring area is uneven, it means that the quality of the adhesive film in the monitoring area is poor, and the corresponding abnormality index of the monitoring area is relatively large; conversely, the abnormality index of the monitoring area is relatively small, so that the quality of the adhesive film in the monitoring area can be monitored by comparing the abnormality index of the monitoring area with the preset threshold.

[0050] Specifically, the abnormal index of the monitoring area satisfies the following relationship: ; In the formula, is the abnormal index of the monitoring area; , are the minimum and maximum values ​​in the light intensity index matrix respectively; is the entropy of the light intensity index matrix; is the absolute value symbol.

[0051] in, It reflects the ratio of the minimum and maximum values ​​in the light intensity index matrix. The smaller the value, the larger the difference in the data in the light intensity index matrix, which further indicates that the uniformity of the film thickness in the monitoring area is poor, and the corresponding abnormal index of the monitoring area is relatively large.

[0052] It reflects the degree of disorder of the light intensity index matrix. The larger the value is, the more disordered the difference of film thickness in the monitoring area is. There may be alternation of thin and thick film. This indicates that the quality of the film in the monitoring area is poor, and the corresponding abnormal index of the monitoring area is relatively large.

[0053] in, ; The value in the light intensity index matrix is The proportion of is an exponential function with the natural number 2 as base; It should be noted that the entropy calculation process is a prior art and will not be described in detail in this embodiment.

[0054] In an exemplary embodiment of the present invention, the quality monitoring of the monitoring area can be achieved by the following steps: A preset threshold is obtained. If the abnormality index of the monitoring area is greater than the threshold, it is determined that the quality of the film in the monitoring area does not meet the standard; if the abnormality index of the monitoring area is less than or equal to the threshold, it is determined that the quality of the film in the monitoring area meets the standard.

[0055] Optionally, the threshold value can be set to 0.3. When the abnormality index of the monitoring area is less than or equal to 0.3, it means that the thickness of the film in the monitoring area is relatively uniform, and the quality of the film in the monitoring area is judged to meet the standards; when the abnormality index of the monitoring area is greater than 0.3, it means that the uniformity of the film thickness in the monitoring area is poor, and the quality of the film in the monitoring area is judged to be abnormal, that is, it does not meet the standards, and an alarm is issued or other methods are used to remind relevant staff that there are quality problems with the film thickness in the monitoring area to ensure the quality of the produced film.

[0056] In the description of this specification, "plurality" or "several" means at least two, such as two, three or more, etc., unless otherwise clearly and specifically defined.

[0057] Although this specification has shown and described a number of embodiments of the present invention, it will be apparent to those skilled in the art that such embodiments are provided by way of example only. Those skilled in the art will conceive of many modifications, changes and alternatives without departing from the ideas and spirit of the present invention. It should be understood that in the practice of the present invention, various alternatives to the embodiments of the present invention described herein may be employed.

Claims

1. A quality monitoring method for a pure film production line, characterized in that: include: During the transmission of the adhesive film, the light intensity matrix received when the light source emitter vertically irradiates the target area in the adhesive film is obtained; Determine the number of moving position points of any position point in the target area when a new light intensity matrix is ​​collected next time, select a monitoring area from a position in the target area away from the film transmission direction, obtain the number of column vectors of the light intensity matrix corresponding to the remaining area, and calculate the maximum sampling number of the monitoring area, where the maximum sampling number is the largest integer less than the ratio of the number of column vectors to the number of moving position points; Continuously collect the light intensity matrix corresponding to the monitoring area until the sampling number is equal to the maximum sampling number, take the ratio of the mean light intensity of any position point in the monitoring area under all sampling times to the preset standard light intensity as the light intensity index of the position point, and obtain the light intensity index matrix; Calculate the anomaly index of the monitoring area : ; , are the minimum and maximum values ​​in the light intensity index matrix respectively; is the entropy of the light intensity index matrix; It is an absolute value symbol; the quality of the monitoring area is monitored based on the comparison result between the abnormal index and the preset threshold.

2. A quality monitoring method for a pure adhesive film production line according to claim 1, characterized in that: The number of moving position points of any position point in the target area when a new light intensity matrix is ​​collected next time satisfies the following relationship: ； In the formula, The number of moving positions of any position point in the target area when a new light intensity matrix is ​​collected next time; is the transmission speed of the film; is the sampling frequency of the light intensity matrix; is the length of the light source emitter; is the number of column vectors in the illumination intensity matrix corresponding to the target area; The round-up symbol.

3. The quality monitoring method for a pure adhesive film production line according to claim 1, characterized in that: The length of the monitoring area is half the length of the target area.

4. A quality monitoring method for a pure adhesive film production line according to claim 3, characterized in that: The maximum sampling times of the monitoring area satisfies the following relationship: ； In the formula, is the maximum number of sampling times in the monitoring area; is the number of column vectors in the illumination intensity matrix corresponding to the target area; The number of moving positions of any position point in the target area when a new light intensity matrix is ​​collected next time; is the sampling times; is a positive integer sign; A function that returns the maximum value.

5. A quality monitoring method for a pure adhesive film production line according to claim 4, characterized in that: The light intensity index at any point in the monitoring area satisfies the following relationship: ； In the formula, The horizontal coordinate is , the vertical axis is The light intensity index of the location point; The number of moving positions of any position point in the target area when a new light intensity matrix is ​​collected next time; The sampling order for the monitoring area; is the maximum number of sampling times in the monitoring area; is the preset standard light intensity; wherein the transmission direction of the film is the positive direction of the horizontal axis.

6. A quality monitoring method for a pure adhesive film production line according to claim 1, characterized in that: The entropy of the light intensity index matrix satisfies the following relationship: ； In the formula, is the entropy of the light intensity index matrix; The value in the light intensity index matrix is The proportion of is an exponential function with the natural number 2 as base; is the length of the light emitter.

7. The quality monitoring method for a pure adhesive film production line according to claim 1, characterized in that: The quality monitoring of the monitoring area according to the comparison result of the abnormal index and the preset threshold value includes: Obtaining a preset threshold value, and if the abnormality index of the monitoring area is greater than the threshold value, determining that the quality of the film in the monitoring area does not meet the standard; If the abnormality index of the monitoring area is less than or equal to the threshold, it is determined that the quality of the film in the monitoring area meets the standard.

8. The quality monitoring method for a pure adhesive film production line according to claim 1, characterized in that: The number of row and column vectors in the light intensity matrix corresponding to the target area corresponds to the dimension of the light source arrangement in the light emitter.

9. The quality monitoring method for a pure adhesive film production line according to claim 1, characterized in that: The step length between adjacent position points in the target area is the interval length between adjacent light sources in the light source emitter.

10. The quality monitoring method for a pure adhesive film production line according to claim 1, characterized in that: During the transmission of the film, the horizontal coordinate of each position point in the monitoring area will gradually increase along the transmission direction, while the vertical coordinate remains unchanged.

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