A multi-head gas analysis device
By designing a multi-head gas analysis device in an infrared gas analyzer, using gas pressure-controlled gas paths and dust filtering components, the problem of infrared gas analyzer being susceptible to background interference is solved, and efficient and accurate gas detection is achieved.
Patent Information
- Application Number
- CN202510293772.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-13
- Publication Date
- 2025-06-27
- Estimated Expiration
- 2045-03-13
AI Technical Summary
Existing infrared gas analyzers are susceptible to background interference, especially cross-interference between dust particles and gas samples, resulting in a decrease in detection accuracy.
A multi-head gas analysis device is designed, including a sampling joint body and a sampling tank body, and a gas pressure-controlled gas passage establishment mechanism is adopted, and a dust filter assembly is installed at the top of the sampling tube to filter the dust particles in the gas sample through the filter tube and the filter cartridge.
It effectively improves the number and detection efficiency of samples to be tested, ensures the continuous detection accuracy of multiple groups of gas samples to be tested, and prevents the impact of dust particles and gas samples residues on detection.
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Figure CN119779984B_ABST
Abstract
Description
Technical Field
[0001] The invention relates to the technical field of infrared gas analyzers, in particular to a multi-head gas analysis device. Background Art
[0002] As an early online analysis technology, infrared gas analyzer has been widely used in chemical, steel, metallurgy, biochemistry, cement, biochemistry and other industries. The wide application of infrared analyzer has made it develop rapidly and is well received by users. Although infrared analyzer has many advantages, once the gas is interfered by the background, it will affect the detection effect of infrared analyzer.
[0003] Specifically, there are two main factors that make infrared gas analyzers susceptible to background interference. First, since the gas it detects usually includes a certain amount of dust particles, after long-term use, some dust particles will adhere to the light emitting surface of the light transmitter and the light receiving surface of the light receiver of the existing infrared gas analyzer. Undoubtedly, these dust particles will have a certain impact on the intensity of the transmitted light or scattered light, the pulse frequency, etc., thereby reducing the detection accuracy of the components in the gas and the content of each component. Second, when different gas samples need to be detected, there is cross-interference between different detection gases, mainly because the gas sample detected last time is still residual in the cavity, which will lead to inaccurate measurement results.
[0004] Therefore, in view of this, the existing structural deficiencies are studied and improved, and a multi-head gas analysis device is proposed. Summary of the invention
[0005] The object of the present invention is to provide a multi-head gas analysis device to solve the problems raised in the above background technology.
[0006] To achieve the above-mentioned purpose, the present invention provides the following technical solutions: a multi-head gas analysis device, including a sampling connector body, the sampling connector body including a sampling tube, a threaded opening, a double-headed connecting pipe, an upper steel ball and an upper spring, a threaded opening is opened at the bottom end of the sampling tube, and a double-headed connecting pipe is arranged in the channel at the top of the threaded opening, and a limiting pin is fixed integrally on the outer edge of the top of the double-headed connecting pipe, an upper steel ball is built into the sampling tube, and an upper spring is elastically connected to the top of the upper steel ball, the end of the upper spring facing away from the upper steel ball is clamped with the boss on the inner wall of the sampling tube, and under the elastic force of the upper spring, the upper steel ball and the conical surface of the inner wall of the sampling tube are squeezed and sealed.
[0007] Furthermore, the top of the sampling tube is connected to a dust filter assembly, and the dust filter assembly includes a filter tube and a guide block. The filter tube is vertically connected to the top of the sampling tube, and a guide block is protruding and fixed on the inner wall of one side of the filter tube.
[0008] Further, the dust filtering component further includes an outer sleeve pipe, the inner wall of the other side of the filtering pipe is embedded with the outer sleeve pipe, and the outer sleeve pipe is arranged obliquely to the axis of the filtering pipe.
[0009] Further, the dust filtering component further includes a filter cartridge and a rotating handle. The outer sleeve pipe is internally provided with a filter cartridge having a hollow structure, and a rotating handle that is threadedly fastened to the outer sleeve pipe is fixed to the tail of the filter cartridge.
[0010] Further, the bottom of the sampling pipe is externally connected to a sampling tank body. The sampling tank body includes a tank body and a screw thread interface. The outer edge of the top opening of the tank body is provided with a screw thread interface, and the tank body is threadedly fastened to the threaded port at the bottom end of the sampling pipe through the screw thread interface at the top end.
[0011] Further, the sampling tank body further includes a sampling chamber, a lower steel ball and a lower spring. A sampling chamber having a "T" - shaped structure is formed inside the tank body, and a lower steel ball is arranged in the top space of the "T" - shaped structure of the sampling chamber. The bottom of the lower steel ball is elastically connected to a lower spring, and the spring constant of the lower spring is less than that of the upper spring.
[0012] Further, the sampling tank body further includes a gas source interface and a magnetic adsorption orifice plate. The side surface of the bottom of the tank body is communicated with the gas source interface, and a magnetic adsorption orifice plate fixed to the bottom end of the "T" - shaped structure of the sampling chamber is arranged at the inner top end of the gas source interface.
[0013] Further, the sampling tank body further includes a guide rod and a piston plate. A guide rod is fixedly connected to the top of the magnetic adsorption orifice plate, and the guide rod bends from the intersection of the "T" - shaped structure and is fixed to the side wall of the sampling chamber. A piston plate is slidably sleeved outside the guide rod. The piston plate is in close fit with the narrow part at the bottom end of the "T" - shaped structure of the sampling chamber, and the piston plate is movably fitted with the wide part at the top end of the "T" - shaped structure of the sampling chamber.
[0014] Further, the sampling joint body is arranged side - by - side in multiple heads at the side end of the infrared gas analyzer, and a protruding outer edge is fixed to the top of the side end of the infrared gas analyzer. Several independent pipelines that connect the sampling pipe and the internal cavity of the infrared gas analyzer are arranged inside the edge.
[0015] Further, a display screen is arranged on one side of the front of the infrared gas analyzer, and function keys are arranged on the other side of the front of the infrared gas analyzer. An exhaust window is opened at the top of the back of the infrared gas analyzer, and a high - pressure gas tank is snap - fixed to the bottom end of the back of the infrared gas analyzer. The output end of the high - pressure gas tank is communicated with a connecting pipe through a valve body, and the connecting pipe is selectively connected to the corresponding tank body through the gas source interface.
[0016] The present invention provides a multi - head gas analysis device, having the following beneficial effects;
[0017] 1. During the use of the present invention, through the structural arrangement of arranging multiple groups of sampling joint bodies side by side on the side edge of the infrared gas analyzer, the sampling requirements of multiple groups of sampling tank bodies can be met, effectively improving the number of samples to be detected and the detection efficiency. And through the establishment of the gas passage from the sampling tank body to the sampling pipe by air pressure control, before detection, due to the structural design that the elastic coefficient of the lower spring is less than that of the upper spring in the present application, the passage from the top of the sampling tank body to the inside of the sampling pipe has not been established yet. Therefore, at this time, multiple groups of sampling tank bodies are still in a state to be detected. When detecting, the pressure in the wide space at the top of the "T" - shaped structure of the sampling chamber rises until it is greater than the elastic force exerted by the upper spring on the upper steel ball. At this time, the bottom passage of the sampling pipe is opened, and the gas sample in the sampling tank body can enter the internal cavity of the infrared gas analyzer through the sampling pipe for gas analysis. It can ensure that the gas samples to be detected in multiple sampling tank bodies can complete sequential detection and make the gas samples in the sampling chamber be evenly and thoroughly discharged into the infrared gas analyzer for detection. And because the gas samples to be detected in the sampling chamber are isolated from the introduced high - pressure gas by the piston plate, the detection accuracy of the gas samples to be detected can be guaranteed;
[0018] 2. During the use of the present invention, when the gas sample to be detected is introduced into the sampling pipe from the corresponding sampling tank body and before entering the internal cavity of the infrared gas analyzer, a filter pipe is connected at the top of the sampling pipe in the present application. The entering gas sample is guided by the guide block into the filter cartridge embedded in the side wall of the filter pipe to filter the dust particles mixed in the gas sample. The filter cartridge is threadedly connected to the outer opening of the outer sleeve through the rotating handle at the tail, which is convenient for cleaning and replacement, effectively preventing the dust particles mixed in the gas sample from entering the internal cavity of the infrared gas analyzer and polluting the light emitter, thereby reducing the detection accuracy. When the gas samples to be detected in the sampling chamber are exhausted, the piston plate flips at the bent part of the guide rod, and the introduced high - pressure gas enters the wide space at the top of the "T" - shaped structure of the sampling chamber and enters the internal cavity of the infrared gas analyzer through the gas passage between the sampling tank body and the sampling pipe. Under the positive pressure, the gas samples that have completed detection before are exhausted from the internal of the infrared gas analyzer, preventing the influence of the residual gas samples on subsequent detections and further ensuring the continuous detection accuracy of multiple groups of gas samples to be detected. BRIEF DESCRIPTION OF THE DRAWINGS
[0019] Figure 1 is the front - view structural schematic diagram of the whole device of the present invention;
[0020] Figure 2 is the rear - view structural schematic diagram of the whole device of the present invention;
[0021] Figure 3 is the external structural schematic diagram of the sampling joint body and the sampling tank body of the present invention;
[0022] Figure 4 This is a schematic diagram of the internal structure of the sampling joint body and the sampling tank body of the present invention;
[0023] Figure 5 This is a schematic diagram of the structure of the sampling joint body of the present invention;
[0024] Figure 6 This is a schematic diagram of the structure of the dust filtering component of the present invention;
[0025] Figure 7 This is a schematic diagram of the structure of the sampling tank body of the present invention.
[0026] In the figure: 1. Sampling joint body; 101. Sampling pipe; 102. Threaded port; 103. Double-headed connecting pipe; 104. Upper steel ball; 105. Upper spring; 2. Dust filtering component; 201. Filter pipe; 202. Flow guiding block; 203. Outer sleeve; 204. Filter cartridge; 205. Rotating handle; 3. Sampling tank body; 301. Tank body; 302. Threaded interface; 303. Sampling chamber; 304. Lower steel ball; 305. Lower spring; 306. Gas source interface; 307. Magnetic suction orifice plate; 308. Guide rod; 309. Piston plate; 4. Infrared gas analyzer; 5. Edge; 6. Display screen; 7. Function key; 8. Exhaust window; 9. High-pressure gas tank; 10. Connecting pipe. Specific embodiments
[0027] The following further describes in detail the embodiments of the present invention in conjunction with the accompanying drawings and examples. The following examples are used to illustrate the present invention, but cannot be used to limit the scope of the present invention
[0028] Please refer to Figures 1 to 7, the present invention provides a technical solution: a multi-head gas analysis device, including a sampling joint body 1. The sampling joint body 1 includes a sampling tube 101, a threaded port 102, a double-headed connecting pipe 103, an upper steel ball 104 and an upper spring 105. The bottom end of the sampling tube 101 is provided with a threaded port 102, and a double-headed connecting pipe 103 is arranged in the top channel of the threaded port 102. And a limit pin is integrally fixed on the outer edge of the top end of the double-headed connecting pipe 103. An upper steel ball 104 is arranged inside the sampling tube 101, and an upper spring 105 is elastically connected to the top of the upper steel ball 104. One end of the upper spring 105 away from the upper steel ball 104 is clamped with the inner wall boss of the sampling tube 101. And under the elastic force of the upper spring 105, the upper steel ball 104 is squeezed and sealed with the inner wall conical surface of the sampling tube 101. The bottom of the sampling tube 101 is externally connected to a sampling tank body 3. The sampling tank body 3 includes a tank body 301 and a threaded interface 302. The outer edge of the top opening of the tank body 301 is provided with a threaded interface 302. And the tank body 301 is threadedly fastened to the threaded port 102 at the bottom end of the sampling tube 101 through the threaded interface 302 at the top end. The sampling tank body 3 further includes a sampling chamber 303, a lower steel ball 304 and a lower spring 305. A sampling chamber 303 in a "T" shape is opened inside the tank body 301. And a lower steel ball 304 is arranged in the top space of the "T" shape of the sampling chamber 303. A lower spring 305 is elastically connected to the bottom of the lower steel ball 304. And the elastic coefficient of the lower spring 305 is less than that of the upper spring 105. The sampling tank body 3 further includes a gas source interface 306 and a magnetic suction orifice plate 307. The bottom side of the tank body 301 is communicated with a gas source interface 306. And a magnetic suction orifice plate 307 fixed to the bottom end of the "T" shape of the sampling chamber 303 is arranged at the top end inside the gas source interface 306. The sampling tank body 3 further includes a guide rod 308 and a piston plate 309. A guide rod 308 is fixedly connected to the top of the magnetic suction orifice plate 307. And the guide rod 308 is bent from the intersection of the "T" shape and fixed to the side wall of the sampling chamber 303. A piston plate 309 is slidably sleeved outside the guide rod 308. And the piston plate 309 is closely matched with the narrow part at the bottom end of the "T" shape of the sampling chamber 303. And the piston plate 309 is movably matched with the wide part at the top end of the "T" shape of the sampling chamber 303;
[0029] The specific operation is as follows: multiple groups of gas samples to be tested are stored in the corresponding sampling tank body 3, and under the elastic force of the lower spring 305, the lower steel ball 304 is tightly fitted with the conical surface of the inner wall of the top of the sampling cavity 303 to achieve sealing, so as to ensure the airtightness of the sampling tank body 3 after sampling is completed. Before testing, the tank body 301 is threadedly fastened with the threaded port 102 at the bottom of the sampling tube 101 through the screw thread interface 302 at the top to achieve connection. During this process, the double-headed pipe 103 in the middle of the threaded port 102 overcomes the elastic force of the lower spring 305 and squeezes the lower steel ball 304 to open the sampling cavity 30 3, however, due to the structural design that the elastic coefficient of the lower spring 305 of the present application is smaller than that of the upper spring 105, the passage from the top of the sampling tank body 3 to the inside of the sampling tube 101 has not been established at this time, so at this time, the multiple groups of sampling tank bodies 3 are still in a waiting state. During the inspection, when it is necessary to sample and inspect the gas samples in the corresponding sampling tank bodies 3, the user inserts the connecting tube 10 at the output end of the high-pressure gas tank 9 onto the gas source interface 306 on the bottom side of the corresponding sampling tank body 3, opens the valve to allow the high-pressure gas to enter from the space below the magnetic suction orifice plate 307, and Under the action of pressure, the piston plate 309 and the narrow channel at the bottom of the "T"-shaped structure of the sampling chamber 303 are lifted up. The lifting process of the piston plate 309 is guided and limited by the "L"-shaped structure guide rod 308 to prevent the piston plate 309 from impacting the lower spring 305 during the lifting process. At this time, the pressure in the wide space at the top of the "T"-shaped structure of the sampling chamber 303 rises until it is greater than the elastic force applied by the upper spring 105 to the upper steel ball 104. At this time, the bottom passage of the sampling tube 101 is opened, and the gas sample in the sampling tank body 3 can enter the inner part of the infrared gas analyzer 4 through the sampling tube 101. The gas analysis is performed in the inner cavity of the sampling chamber 303. When the gas to be detected in the sampling chamber 303 is exhausted, the piston plate 309 is turned over at the bend of the guide rod 308, and the high-pressure gas enters the wide space at the top of the "T"-shaped structure of the sampling chamber 303, and enters the inner cavity of the infrared gas analyzer 4 through the gas passage between the sampling tank body 3 and the sampling tube 101. Under the action of positive pressure, the gas sample that has been tested before is exhausted from the inside of the infrared gas analyzer 4, preventing the residual gas sample from affecting the subsequent detection, and further ensuring the continuous detection accuracy of multiple groups of gas samples to be detected;
[0030] See also Figures 5 to 6, the top of the sampling tube 101 is connected to a dust filtering component 2. The dust filtering component 2 includes a filtering tube 201 and a diversion block 202. The filtering tube 201 is vertically connected to the top end of the sampling tube 101, and a diversion block 202 is convexly fixed on the inner wall of one side of the filtering tube 201. The dust filtering component 2 further includes an outer sleeve tube 203. The outer sleeve tube 203 is embedded in the inner wall of the other side of the filtering tube 201, and the outer sleeve tube 203 is arranged obliquely to the axis of the filtering tube 201. The dust filtering component 2 further includes a filter cartridge 204 and a rotary handle 205. The outer sleeve tube 203 is internally provided with a filter cartridge 204 having a hollow structure, and a rotary handle 205 which is threadedly fastened to the outer sleeve tube 203 is fixed to the tail of the filter cartridge 204;
[0031] The specific operation is as follows. When the gas sample to be detected is introduced into the sampling tube 101 from the corresponding sampling tank body 3, before entering the internal cavity of the infrared gas analyzer 4, in this application, a filtering tube 201 is connected to the top end of the sampling tube 101. The entering gas sample is guided by the diversion block 202 into the filter cartridge 204 embedded in the side wall of the filtering tube 201, and the dust particles mixed in the gas sample are filtered. The filter cartridge 204 is threadedly connected to the outer opening of the outer sleeve tube 203 through the rotary handle 205 at the tail, which is convenient for cleaning and replacement, effectively avoiding the dust particles mixed in the gas sample from entering the internal cavity of the infrared gas analyzer 4 and causing pollution to the light emitter, thereby reducing the detection accuracy;
[0032] Please refer to Figures 1 to 2 , the sampling joint body 1 is arranged in multiple rows side by side at the side end of the infrared gas analyzer 4, and an edge 5 with a protruding outer edge is fixed to the top of the side end of the infrared gas analyzer 4. And several independent pipelines connecting the sampling tube 101 and the internal cavity of the infrared gas analyzer 4 are arranged inside the edge 5. A display screen 6 is arranged on one side of the front of the infrared gas analyzer 4, and function keys 7 are arranged on the other side of the front of the infrared gas analyzer 4. An exhaust window 8 is opened at the top end of the back of the infrared gas analyzer 4, and a high-pressure gas tank 9 is snap-fixed to the bottom end of the back of the infrared gas analyzer 4. The output end of the high-pressure gas tank 9 is connected to a connecting pipe 10 through a valve body, and the connecting pipe 10 is selectively connected to the corresponding tank body 301 through a gas source interface 306;
[0033] The specific operation is as follows. Through the structural arrangement of arranging multiple groups of sampling joint bodies 1 side by side on the edge 5 at the side end of the infrared gas analyzer 4 in this application, the sampling requirements of multiple groups of sampling tank bodies 3 can be met, effectively improving the number of samples to be detected and the detection efficiency. And by establishing the gas passage from the sampling tank body 3 to the sampling tube 101 through air pressure control, it can ensure that the gas samples to be detected in multiple sampling tank bodies 3 can complete sequential detection and make the gas samples in the sampling chamber 303 be evenly and thoroughly discharged into the internal part of the infrared gas analyzer 4 for detection. And since the gas sample to be detected in the sampling chamber 303 is isolated from the introduced high-pressure gas by the piston plate 309, the detection accuracy of the gas sample to be detected can be ensured;
[0034] It is worth adding that the model of the infrared gas analyzer 4 used in this application is JC-3017HF, and the detection method and principle of this type of infrared gas analyzer 4 are adopted in this application. Specifically, it is as follows: Infrared rays are used as the light source, and the concentration of the gas is detected by measuring the absorption amount of the infrared light by the gas. The instrument contains two independent light sources, which respectively generate two beams of infrared rays. These rays become rays with a frequency of 5 Hz after passing through the modulator. One beam of rays passes through the measured gas chamber (measurement chamber), and the other passes through the background gas chamber (reference chamber). When the concentration of the measured gas changes, the amount of infrared light absorbed in the measurement chamber will change, while the amount of light in the reference chamber remains unchanged. By detecting the difference in the amount of light between the two chambers, the concentration of the gas can be calculated. In addition, for the existing technologies that are already mature and widely used, this application does not elaborate.
[0035] In summary, when using the multi-head gas analysis device, multiple groups of gas samples to be tested are stored in the corresponding sampling tank body 3, and under the elastic force of the lower spring 305, the lower steel ball 304 is tightly fitted with the conical surface of the inner wall of the top of the sampling cavity 303 to achieve sealing, so as to ensure the airtightness of the sampling tank body 3 after sampling is completed. Before testing, the tank body 301 is threadedly fastened with the threaded port 102 at the bottom of the sampling tube 101 through the screw thread interface 302 at the top to achieve connection. During this process, the double-headed pipe 103 in the middle of the threaded port 102 overcomes the elastic force of the lower spring 305 and squeezes the lower steel ball 304 to open the gas passage at the top of the sampling cavity 303. However, due to the structural design that the elastic coefficient of the lower spring 305 of the present application is smaller than that of the upper spring 105, so that at this time, the sampling The passage from the top of the sample tank body 3 to the inside of the sampling tube 101 has not been established yet, so at this time, multiple groups of sampling tank bodies 3 are still in a waiting state. During the inspection, when it is necessary to sample and inspect the gas sample in the corresponding sampling tank body 3, the user inserts the connecting tube 10 at the output end of the high-pressure gas tank 9 onto the gas source interface 306 on the bottom side of the corresponding sampling tank body 3, opens the valve to allow high-pressure gas to enter from the space below the magnetic perforated plate 307, and under the action of air pressure, lifts the piston plate 309 in the narrow channel at the bottom end of the "T"-shaped structure of the sampling chamber 303. The lifting process of the piston plate 309 is guided and restricted by the "L"-shaped structure guide rod 308, so as to prevent the piston plate 309 from impacting the lower spring 305 during the lifting process. At this time, the "T"-shaped sampling chamber 303 The pressure in the wide space at the top of the structure rises until it is greater than the elastic force applied by the upper spring 105 to the upper steel ball 104. At this time, the bottom passage of the sampling tube 101 is opened, and the gas sample in the sampling tank body 3 can enter the internal cavity of the infrared gas analyzer 4 through the sampling tube 101 for gas analysis. The present application can meet the sampling needs of multiple groups of sampling tank bodies 3 by arranging multiple groups of sampling connector bodies 1 side by side on the side edge 5 of the infrared gas analyzer 4, effectively improve the number of samples to be tested and the detection efficiency, and control the establishment of the gas passage from the sampling tank body 3 to the sampling tube 101 by air pressure, so as to ensure that the gas samples to be tested in multiple sampling tank bodies 3 can complete sequential detection and make the gas samples in the sampling cavity 303 The gas sample to be detected is evenly and thoroughly discharged into the infrared gas analyzer 4 to complete the detection, and because the gas sample to be detected in the sampling chamber 303 is isolated from the introduced high-pressure gas by the piston plate 309, the detection accuracy of the gas sample to be detected can be guaranteed. When the gas sample to be detected is passed into the sampling tube 101 from the corresponding sampling tank body 3, before entering the internal cavity of the infrared gas analyzer 4, the present application connects a filter tube 201 at the top of the sampling tube 101, and the entering gas sample is guided by the guide block 202 to enter the filter cartridge 204 embedded in the side wall of the filter tube 201 to filter the mixed dust particles in the gas sample. The filter cartridge 204 is threadedly connected to the outer opening of the outer sleeve 203 through the rotary handle 205 at the tail, which is convenient for cleaning and replacement.Effectively avoid dust particles mixed in the gas sample from entering the internal cavity of the infrared gas analyzer 4 and contaminating the light emitter, which may lead to a decrease in detection accuracy. When the gas to be detected in the sampling chamber 303 is exhausted, the piston plate 309 flips at the bent part of the guide rod 308, and the introduced high-pressure gas enters the broad space at the top of the "T" - shaped structure of the sampling chamber 303, and then enters the internal cavity of the infrared gas analyzer 4 through the gas passage between the sampling tank body 3 and the sampling pipe 101. Under the action of positive pressure, the gas sample that has completed the detection is exhausted from the inside of the infrared gas analyzer 4, preventing the influence of the residual gas sample on subsequent detections and further ensuring the continuous detection accuracy of multiple groups of gas samples to be detected.
[0036] The embodiments of the present invention are given for purposes of illustration and description, and are not exhaustive or limit the invention to the disclosed form. Many modifications and variations are obvious to those of ordinary skill in the art. The embodiments are chosen and described in order to better illustrate the principles of the invention and its practical application, and to enable those of ordinary skill in the art to understand the invention so as to design various implementations with various modifications suitable for specific purposes.
Claims
1. A multi-head gas analysis device, comprising a sampling connector body, characterized in that: The sampling connector body comprises a sampling tube, a threaded opening, a double-ended connecting pipe, an upper steel ball and an upper spring. A threaded opening is provided at the bottom end of the sampling tube, and a double-ended connecting pipe is arranged in a channel at the top of the threaded opening, and a limiting pin is fixed integrally on the outer edge of the top end of the double-ended connecting pipe. An upper steel ball is arranged inside the sampling tube, and an upper spring is elastically connected to the top of the upper steel ball. The end of the upper spring facing away from the upper steel ball is snap-fitted with a boss on the inner wall of the sampling tube, and under the elastic force of the upper spring, the upper steel ball is squeezed and sealed with a conical surface on the inner wall of the sampling tube. A sampling tank body is externally connected to the bottom of the sampling tube, and the sampling tank body comprises a tank body and a screw thread interface. A screw thread interface is provided on the outer edge of the top opening of the tank body, and the tank body is threadedly fastened with the threaded opening at the bottom end of the sampling tube through the screw thread interface at the top. The sampling tank body also comprises a sampling cavity, a lower steel ball and a lower spring. A sampling cavity in a "T" shape is provided in the part, and a lower steel ball is arranged in the top space of the "T" shape structure of the sampling cavity, the bottom of the lower steel ball is elastically connected to a lower spring, and the elastic coefficient of the lower spring is smaller than that of the upper spring, the sampling tank body also includes an air source interface and a magnetic orifice plate, the bottom side of the tank body is connected to the air source interface, and the top of the inner side of the air source interface is provided with a magnetic orifice plate fixed to the bottom end of the "T" shape structure of the sampling cavity, the sampling tank body also includes a guide rod and a piston plate, the top of the magnetic orifice plate is fixedly connected to the guide rod, and the guide rod is bent from the intersection of the "T" shape structure and fixed to the side wall of the sampling cavity, the piston plate is slidably sleeved on the outside of the guide rod, and the piston plate is tightly matched with the narrow part of the bottom end of the "T" shape structure of the sampling cavity, and the piston plate is flexibly matched with the wide part of the top end of the "T" shape structure of the sampling cavity.
2. A multi-head gas analysis device according to claim 1, characterized in that: The top of the sampling tube is connected to a dust filter assembly, which includes a filter tube and a guide block. The filter tube is vertically connected to the top of the sampling tube, and a guide block is protruded and fixed on the inner wall of one side of the filter tube.
3. A multi-head gas analysis device according to claim 2, characterized in that: The dust filter assembly also includes an outer sleeve, and the inner wall on the other side of the filter tube is embedded with an outer sleeve, and the outer sleeve is arranged obliquely to the axis of the filter tube.
4. A multi-head gas analysis device according to claim 3, characterized in that: The dust filtering assembly also includes a filter cartridge and a rotary handle. The outer sleeve is provided with a filter cartridge with a hollow structure, and a rotary handle is fixed to the rear of the filter cartridge and is threadedly fastened to the outer sleeve.
5. A multi-head gas analysis device according to claim 4, characterized in that: The sampling connector bodies are arranged side by side at the side of the infrared gas analyzer, and a rim with a protruding outer edge is fixed on the top of the side of the infrared gas analyzer, and several independent pipelines connecting the sampling tube and the internal cavity of the infrared gas analyzer are arranged in the rim.
6. A multi-head gas analysis device according to claim 5, characterized in that: A display screen is provided on one side of the front of the infrared gas analyzer, and function keys are arranged on the other side of the front of the infrared gas analyzer. An exhaust window is provided on the top of the back of the infrared gas analyzer, and a high-pressure gas tank is fixed with a buckle at the bottom of the back of the infrared gas analyzer. The output end of the high-pressure gas tank is connected to a connecting pipe through a valve body, and the connecting pipe is selectively connected to the corresponding tank body through a gas source interface.
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