Aging test method and device for high-frequency generator and storage medium

Abstract

The invention provides an aging test method and device for a high-frequency generator and a storage medium, and relates to the technical field of breathing machine testing.The aging test method for the high-frequency generator comprises the steps that firstly, the high-frequency generator to be tested is controlled to operate in a first frequency mode and a second frequency mode respectively, and an initial working current value is recorded; alternative switching operation of the two frequency modes is achieved in a linear frequency gradual change mode, the relative deviation proportion of the working current value and the corresponding initial value in each mode is monitored in real time, and if the deviation of any mode exceeds a set threshold value, it is judged that aging fails; otherwise, circularly executing frequency switching, current monitoring and deviation calculation processes until the failure standard is reached. According to the invention, the performance of the high-frequency generator can be subjected to an accurate aging test.

Description

Technical Field

[0001] The present invention relates to the technical field of ventilator testing, and in particular to an aging testing method, equipment and storage medium for a high frequency generator. Background Art

[0002] The high-frequency generator is the core component of the high-frequency ventilator. It drives the diaphragm in the closed cavity to move in both directions through the reciprocating motion of the motion shaft, thereby generating a high-frequency oscillating airflow. When the high-frequency ventilator is operating normally, the high-frequency generator outputs an oscillating airflow of air-oxygen mixed gas to ensure that the basic functions of the ventilator are realized.

[0003] During use, the output performance parameters of the ventilator need to change according to the operator's settings, so the high-frequency generator needs to adjust the frequency or amplitude accordingly to meet the accuracy and stability of the ventilator output. However, as the ventilator is used for a longer time, the output performance of the high-frequency generator may gradually decrease. In order to ensure the stability of the ventilator over a period of time, the performance aging test of the high-frequency generator is particularly important. Summary of the invention

[0004] The problem solved by the present invention is how to perform accurate aging test on the performance of a high-frequency generator.

[0005] In order to solve the above problems, the present invention provides an aging test method, equipment and storage medium for a high frequency generator.

[0006] In a first aspect, the present invention provides an aging test method for a high frequency generator, comprising: Step S11, controlling the high-frequency generator to be tested to operate in a first frequency mode, and recording an initial operating current value of the high-frequency generator to be tested in the first frequency mode; Step S12, controlling the high-frequency generator to be tested to operate in a second frequency mode, and recording an initial operating current value of the high-frequency generator to be tested in the second frequency mode; Step S13, controlling the high-frequency generator to be tested to switch between the first frequency mode and the second frequency mode alternately, wherein the switching between the first frequency mode and the second frequency mode is completed by linear frequency gradient; Step S14, monitoring the real-time working current value of the high-frequency generator to be tested in the first frequency mode and the second frequency mode during the switching operation, and calculating the relative deviation ratio between the real-time working current value and the initial working current value in the corresponding mode; Step S15: when the relative deviation ratio in any mode exceeds a threshold value, the high-frequency generator is determined to be aged and failed, and the total operating time of the high-frequency generator to be tested is recorded; Step S16: If the relative deviation ratios in both the first frequency mode and the second frequency mode do not exceed the threshold, return to execute step S13, and perform the aging determination in step S15 after each loop until it is determined that the high-frequency generator has aged and failed.

[0007] Optionally, the frequency range of the first frequency mode is from 0.4 Hz to 2 Hz, the frequency range of the second frequency mode is from 3 Hz to 20 Hz, and when switching between the first frequency mode and the second frequency mode, the frequency transition difference corresponding to each mode switch is at least 2.5 Hz.

[0008] Optionally, the threshold is a dynamic threshold, and the dynamic threshold is updated according to the number of loop tests according to the following formula; When N ≤ the first test number, the dynamic threshold is T1; When the first test number < N ≤ the second test number, the dynamic threshold is T2; When N > the second test number, the dynamic threshold is T3; where N is the number of loop tests, and T1 is the initially set threshold.

[0009] Optionally, the calculation formula for T2 is: ; The calculation formula for T3 is: ; where e represents the natural constant.

[0010] Optionally, step S11 specifically includes: randomly selecting a first number of different first sub-frequency points in the first frequency mode, controlling the high-frequency generator under test to operate in sequence according to each of the first sub-frequency points, where the high-frequency generator under test is controlled to continuously operate at each of the first sub-frequency points for at least a preset duration, recording the current measurement values of the high-frequency generator under test at each of the first sub-frequency points, and calculating the arithmetic mean of the current measurement values corresponding to each of the first sub-frequency points as the initial working current value of the first frequency mode; Step S12 specifically includes: equally spacing and selecting a second number of different second sub-frequency points in the second frequency mode, controlling the high-frequency generator under test to operate in sequence according to each of the second sub-frequency points, where the high-frequency generator under test is controlled to continuously operate at each of the second sub-frequency points for at least the preset duration, recording the current measurement values of the high-frequency generator under test at each of the second sub-frequency points, and after removing the maximum and minimum values of all the current measurement values corresponding to the second sub-frequency points, taking the average of the remaining current measurement values corresponding to the sub-frequency points as the initial working current value of the second frequency mode.

[0011] Optionally, step S14 further includes: synchronously monitoring the temperature rise rate of the high-frequency generator to be tested, and starting the accelerated aging determination when the following conditions are met; in the accelerated aging determination, the aging determination threshold is 80% of the threshold; ; in, represents the rate of temperature rise, represents the absolute difference between the real-time working current value and the initial working current value of the corresponding mode, Indicates the initial operating current value in the first frequency mode or the second frequency mode.

[0012] Optionally, in the process of returning to execute step S13, the corresponding current deviation ratio is extracted each time a preset number of cycles are completed, the current deviation ratios of the preset number of times constitute an independent sliding window, and the mean and standard deviation of the current deviation ratios in each sliding window are calculated in sequence. When M consecutive sliding windows satisfy the following formula, and M is greater than or equal to 2, it is determined that an irreversible aging trend occurs, and an aging failure determination is triggered; ,and ; in, represents the mean value of the current deviation ratio in the nth sliding window, represents the mean value of the current deviation ratio in the n+1th sliding window, represents the standard deviation of the current deviation ratio in the n-1th sliding window, It represents the standard deviation of the current deviation ratio in the nth sliding window.

[0013] In a second aspect, the present invention provides an aging test system for a high frequency generator, comprising: A first frequency mode control module, used to control the high-frequency generator to be tested to operate in a first frequency mode, and record an initial operating current value of the high-frequency generator to be tested in the first frequency mode; A second frequency mode control module, used for controlling the high frequency generator to be tested to operate in a second frequency mode, and recording an initial operating current value of the high frequency generator to be tested in the second frequency mode; A switching module, used for controlling the high-frequency generator to be tested to switch between the first frequency mode and the second frequency mode alternately, wherein the switching between the first frequency mode and the second frequency mode is completed by linear frequency gradient; A monitoring and calculation module, used for monitoring the real-time working current value of the high-frequency generator to be tested in the first frequency mode and the second frequency mode during the switching operation, and calculating the relative deviation ratio between the real-time working current value and the initial working current value in the corresponding mode; A determination module, configured to determine that the high-frequency generator is aged and failed when the relative deviation ratio in any mode exceeds a threshold value, and record the total operating time of the high-frequency generator to be tested; The cyclic determination module returns to sequentially execute the switching module, the monitoring and calculation module, and the determination module until it is determined that the high-frequency generator is aged and failed if the relative deviation ratios in the first frequency mode and the second frequency mode do not exceed the threshold value.

[0014] In a third aspect, the present invention provides an electronic device, including a memory and a processor; The memory is used to store computer programs; The processor is used to implement any one of the above-mentioned aging test methods for a high-frequency generator when executing the computer program.

[0015] In a fourth aspect, the present invention provides a computer-readable storage medium having a computer program stored thereon. When the computer program is executed by a processor, any one of the above-mentioned aging test methods for a high-frequency generator is implemented.

[0016] Compared with the prior art, the beneficial effects of the present invention are as follows: by respectively obtaining the initial working current values ​​in the first frequency mode and the second frequency mode, and using the first frequency mode and the second frequency mode to switch alternately for operation, the dynamic working state of the high-frequency generator in the actual clinical use of the high-frequency ventilator is simulated, overcoming the limitation of the traditional single-mode test being out of touch with the real scene, so that the aging evaluation result of the high-frequency generator is highly correlated with the actual service life; real-time monitoring of the working current in the first frequency mode and the second frequency mode and calculating the relative deviation ratio, directly correlating the mechanical wear and electrical performance degradation of the high-frequency generator by quantifying the current offset, establishing a highly sensitive aging judgment standard, and significantly improving the aging test accuracy compared to the prior art that relies on the judgment experience of a single absolute current value; the cyclic test mechanism based on threshold judgment can continuously capture the aging trend during the gradual attenuation of the performance of the high-frequency generator, solve the problems of over-testing and under-testing caused by the fixed test cycle in the prior art, and fully cover the monitoring requirements of the performance attenuation of the high-frequency generator throughout its life cycle while ensuring the test efficiency. The present invention can perform accurate aging tests on the performance of the high-frequency generator. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 A schematic flow chart of an aging test method for a high frequency generator provided in an embodiment of the present invention; Figure 2 A schematic structural diagram of an aging test system for a high frequency generator provided by an embodiment of the present invention; Figure 3 A schematic diagram of the structure of an electronic device provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0018] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and easy to understand, the specific embodiments of the present invention are described in detail below in conjunction with the accompanying drawings. Although certain embodiments of the present invention are shown in the accompanying drawings, it should be understood that the present invention can be implemented in various forms and should not be interpreted as being limited to the embodiments described herein. On the contrary, these embodiments are provided to provide a more thorough and complete understanding of the present invention. It should be understood that the drawings and embodiments of the present invention are only for exemplary purposes and are not intended to limit the scope of protection of the present invention.

[0019] It should be understood that the various steps described in the method embodiments of the present invention may be performed in different orders and / or in parallel. In addition, the method embodiments may include additional steps and / or omit the steps shown. The scope of the present invention is not limited in this respect.

[0020] The term "including" and its variations used in this document are open inclusions, that is, "including but not limited to"; the term "based on" means "based at least in part on"; the term "one embodiment" means "at least one embodiment"; the term "another embodiment" means "at least one other embodiment"; the term "some embodiments" means "at least some embodiments"; the term "optionally" means "optional embodiments". The relevant definitions of other terms will be given in the following description. It should be noted that the concepts of "first", "second", etc. mentioned in the present invention are only used to distinguish different devices, modules or units, and are not used to limit the order or interdependence of the functions performed by these devices, modules or units.

[0021] It should be noted that the modifications of "one" and "plurality" mentioned in the present invention are illustrative rather than restrictive, and those skilled in the art should understand that, unless otherwise clearly indicated in the context, it should be understood as "one or more".

[0022] The names of the messages or information exchanged between multiple devices in the embodiments of the present invention are only used for illustrative purposes, and are not used to limit the scope of these messages or information.

[0023] As a key medical device for providing respiratory support for critically ill patients, high-frequency ventilators mainly use high-frequency oscillation technology to quickly output aerosolized air-oxygen mixed gas to ensure effective ventilation of the patient's lungs. The core power component of the high-frequency ventilator is a high-frequency generator, which consists of three parts: the motion shaft as a driving unit, using the principle of electromagnetic induction to achieve hundreds of reciprocating motions per minute; the closed cavity as a pressure vessel, filled with inert gas to avoid oxidation corrosion; the flexible diaphragm as an energy conversion medium, converting the mechanical energy of the motion shaft into the vibration energy of the airflow. When the high-frequency generator is in working state, the motion shaft drives the flexible diaphragm to perform periodic displacement at a preset vibration frequency, so that an alternating pressure field is formed inside the closed cavity, and finally a stable output of high-frequency oscillating airflow in the range of 5 to 20 Hz is achieved. In order to meet the needs of different clinical scenarios, such as the differential treatment of adult respiratory distress syndrome and neonatal pulmonary hypoplasia, the operator needs to adjust the amplitude and frequency parameters of the output airflow in real time through the ventilator control interface, which places strict requirements on the dynamic response accuracy and multi-modal compatibility of the high-frequency generator.

[0024] It should be pointed out that as a key component that is in a high-load operation state for a long time, the internal mechanical structure and electronic components of the high-frequency generator will cause performance degradation due to material fatigue and electrochemical aging. The existing aging test system generally adopts a steady-state simulation detection method, that is, the device is continuously operated in a single constant frequency mode and the current and temperature parameters are recorded. This method has two major technical defects: First, in medical clinical practice, high-frequency ventilators need to switch between low-frequency ventilation mode and high-frequency oscillation mode in real time according to the changes in the patient's airway resistance, and the fixed frequency working conditions in traditional tests cannot reproduce the dynamic load fluctuation characteristics in actual use, resulting in the aging evaluation results deviating from the actual service life; second, the existing technology relies on the failure judgment mechanism of the absolute current threshold. For example, if the working current is set to exceed the rated value by 15%, the device is judged to be failed. However, in actual operation, the instantaneous current spikes generated by the high-frequency generator in the start-stop stage or the mode switching moment will trigger false alarms, making the test results lack engineering reference. The above problems seriously restrict the performance stability verification accuracy of high-frequency ventilators in long-term use, and an aging test method that can simulate dynamic working scenes and has anti-interference capabilities is urgently needed.

[0025] Reference Figure 1 The present invention provides an aging test method for a high frequency generator, comprising: Step S11, controlling the high-frequency generator to be tested to operate in a first frequency mode, and recording an initial operating current value of the high-frequency generator to be tested in the first frequency mode.

[0026] Specifically, the high-frequency generator to be tested can be fixed on a standard test fixture, connected to a control module and a data acquisition unit, and controlled to operate in a first frequency mode. The first frequency mode can be a low-frequency mode, and the low-frequency band mode covers the clinically commonly used low-frequency ventilation range (0.5Hz-2.0Hz).

[0027] The initial operating current value in the first frequency mode refers to the calibrated current value measured under specific test conditions in the first frequency mode when the high frequency generator is in a new, unaged state and running stably, which serves as a subsequent aging judgment reference value.

[0028] Step S12: Control the high-frequency generator to be tested to operate in a second frequency mode, and record an initial operating current value of the high-frequency generator to be tested in the second frequency mode.

[0029] Specifically, the control signal of the first frequency mode is turned off, and the high-frequency generator to be tested is controlled to operate in the second frequency mode through the digital isolator. The second frequency mode can be a high-frequency frequency mode, and the high-frequency frequency mode covers the commonly used high-frequency ventilation range in clinical practice (3Hz-20Hz).

[0030] The initial operating current value in the second frequency mode refers to the calibrated current value measured under specific test conditions in the second frequency mode when the high-frequency generator is in a new, unaged state and is running stably, which serves as a subsequent aging judgment reference value.

[0031] Step S13: controlling the high-frequency generator to be tested to switch between the first frequency mode and the second frequency mode alternately, wherein the switching between the first frequency mode and the second frequency mode is completed by linear frequency gradient.

[0032] Specifically, when switching from the first frequency mode to the second frequency mode, starting from the minimum frequency in the first frequency mode, the frequency is increased by The rate of change continues until the maximum frequency in the second frequency mode is reached, where refers to the rate of change of frequency, Indicates the frequency change time, The adjustable parameter can be set to 0.5 seconds to 3 seconds. The process of switching from the second frequency mode to the first frequency mode is opposite to the process of switching from the first frequency mode to the second frequency mode, which will not be described in detail here.

[0033] Step S14: monitoring the real-time operating current value of the high-frequency generator under test in the first frequency mode and the second frequency mode during the switching operation, and calculating the relative deviation ratio between the real-time operating current value and the initial operating current value in the corresponding mode.

[0034] Specifically, when any mode is activated, the initial working current value in the mode is retrieved, and the current relative deviation ratio is calculated. The calculation formula for the current relative deviation ratio is: ; in, represents the absolute difference between the real-time working current value and the initial working current value of the corresponding mode, Indicates the initial operating current value in the corresponding mode in step S11 or step S12.

[0035] Step S15: When the relative deviation ratio in any mode exceeds a threshold value, it is determined that the high-frequency generator is aged and failed, and the total operating time of the high-frequency generator to be tested is recorded.

[0036] The threshold here can be flexibly adjusted according to the actual application needs, and can be a preset value or a dynamic threshold, thereby improving the accuracy of the high-frequency generator aging assessment. The total operating time can be used to characterize the performance of the high-frequency generator in the aging test.

[0037] Step S16: If the relative deviation ratios in the first frequency mode and the second frequency mode do not exceed the threshold, return to execute step S13 until it is determined that the high-frequency generator is aged and failed.

[0038] Compared with the prior art, the beneficial effects of the present invention are as follows: by respectively obtaining the initial working current values ​​in the first frequency mode and the second frequency mode, and using the first frequency mode and the second frequency mode to switch alternately for operation, the dynamic working state of the high-frequency generator in the actual clinical use of the high-frequency ventilator is simulated, overcoming the limitation of the traditional single-mode test being out of touch with the real scene, so that the aging evaluation result of the high-frequency generator is highly correlated with the actual service life; real-time monitoring of the working current in the first frequency mode and the second frequency mode and calculating the relative deviation ratio, directly correlating the mechanical wear and electrical performance degradation of the high-frequency generator by quantifying the current offset, establishing a highly sensitive aging judgment standard, and significantly improving the aging test accuracy compared to the prior art that relies on the judgment experience of a single absolute current value; the cyclic test mechanism based on threshold judgment can continuously capture the aging trend during the gradual attenuation of the performance of the high-frequency generator, solve the problems of over-testing and under-testing caused by the fixed test cycle in the prior art, and fully cover the monitoring requirements of the performance attenuation of the high-frequency generator throughout its life cycle while ensuring the test efficiency. The present invention can perform accurate aging tests on the performance of the high-frequency generator.

[0039] In this embodiment, the frequency range of the first frequency mode is from 0.4 Hz to 2 Hz, the frequency range of the second frequency mode is from 3 Hz to 20 Hz, and when switching between the first frequency mode and the second frequency mode, the frequency transition difference corresponding to each mode switch is at least 2.5 Hz.

[0040] Specifically, the first frequency mode is configured as 0.4 Hz - 2 Hz, which is used to cover the clinical extremely low frequency to the conventional breathing frequency (for example, for neonatal ventilation), and the second frequency mode is set as 3 Hz - 20 Hz, which is used to meet the requirements of high-frequency oscillatory ventilation (HFOV). When it is necessary to switch from the first frequency mode to the second frequency mode, the control system will force a check on the difference between the target frequency and the current frequency. For example, if it is currently running at 2 Hz (the upper limit of the first mode), when switching, it is necessary to directly jump to a frequency point above 4.5 Hz, and the frequency in the range of 3 Hz - 4.5 Hz cannot be selected, so as to ensure that the frequency difference ≥ 2.5 Hz. To meet the constraint, the hardware design adopts a two-stage phase-locked loop circuit, which triggers a frequency buffering mechanism when detecting that the frequency difference is insufficient, first forcibly increases the frequency to the intermediate transition point (such as 4.5 Hz), stays for 30 milliseconds and then switches to the target frequency. This embodiment can not only avoid the risk of mechanical resonance in the frequency overlap area, but also reduce the influence of electromagnetic interference on the control signal through frequency difference buffering.

[0041] In this embodiment, the threshold is a dynamic threshold, and the dynamic threshold is updated according to the number of cyclic tests according to the following formula; When N ≤ the first number of tests, the dynamic threshold is T1; When the first number of tests < N ≤ the second number of tests, the dynamic threshold is T2; When N > the second number of tests, the dynamic threshold is T3; Wherein, N is the number of cyclic tests, and T1 is the initially set threshold.

[0042] This embodiment solves the problem of unreasonable threshold setting in the aging test of the high-frequency generator by introducing a dynamic threshold. Specifically, the dynamic threshold can be updated according to the number of cyclic tests, which is divided into three stages: the initial stage, the intermediate stage, and the later stage. The initial set threshold T1 is adopted in the initial stage; the updated threshold T2 is adopted in the intermediate stage; the further updated threshold T3 is adopted in the later stage. For example: the first number of tests can be 50 times, the second number of tests can be 200 times, and the number of tests refers to the number of cyclic tests. Each complete round of the first frequency mode and the second frequency mode is regarded as achieving one test number. This embodiment improves the aging test accuracy of the high-frequency generator by refining the threshold setting in different stages according to the aging characteristics of the high-frequency generator in different periods.

[0043] Optionally, the calculation formula of T2 is: ; The calculation formula of T3 is: ; Here, e represents a natural constant.

[0044] Specifically, in the initial stage of the aging test, since the performance is in a stable period, a fixed threshold can be set for aging judgment; when the aging test is in the middle stage, the preset formula can be used to adapt to progressive aging; when the aging test is in the late stage, the coefficient attenuation formula can be used to set the threshold.

[0045] In this embodiment, step S11 specifically includes: randomly selecting a first number of different first sub-frequency points in the first frequency mode, controlling the high-frequency generator to be tested to operate according to each of the first sub-frequency points in turn, wherein the high-frequency generator to be tested is controlled to continuously operate for at least a preset time at each of the first sub-frequency points, recording the current measurement value of the high-frequency generator to be tested at each of the first sub-frequency points, and calculating the arithmetic mean of the current measurement values ​​corresponding to each of the first sub-frequency points as the initial working current value of the first frequency mode; Step S12 specifically includes: selecting a second number of different second sub-frequency points at equal intervals in the second frequency mode, controlling the high-frequency generator to be tested to operate in turn according to each of the second sub-frequency points, wherein the high-frequency generator to be tested is controlled to continuously operate for at least the preset time length according to each of the second sub-frequency points, recording the current measurement value of the high-frequency generator to be tested at each of the second sub-frequency points, and after eliminating the maximum value and the minimum value of the current measurement values ​​corresponding to all the second sub-frequency points, taking the average value of the current measurement values ​​corresponding to the remaining sub-frequency points as the initial working current value of the second frequency mode.

[0046] Specifically, in the low-frequency calibration (first frequency mode), three non-continuous frequency points (such as 0.6Hz, 1.3Hz, and 1.9Hz) are selected from the range of 0.4Hz-2Hz through a pseudo-random algorithm. After each frequency point runs for 10 seconds, the transient data of the first 2 seconds can be filtered out, and the current average value of the last 8 seconds is collected. Finally, the arithmetic mean of the three is taken as the initial working current value of the first frequency mode; the high-frequency calibration (second frequency mode) adopts equal-interval sampling: 3Hz-20Hz is divided into 4 sub-intervals (such as 3-7Hz, 7-11Hz, 11-15Hz, and 15-20Hz), and the central frequency point of each interval (5Hz, 9Hz, 13Hz, and 17.5Hz) and the upper limit of 20Hz constitute 5 test points. After running for 15 seconds each, the maximum and minimum values ​​are eliminated, and the average of the remaining 3 test points is used as the initial working current value of the second frequency mode. The multi-frequency coverage of this embodiment can ensure that the calibration results reflect the characteristics of the entire frequency band, and the extreme value elimination strategy eliminates the influence of occasional electromagnetic interference, thereby improving the accuracy of the high-frequency generator aging test.

[0047] In this embodiment, step S14 further includes: synchronously monitoring the temperature rise rate of the high-frequency generator to be tested, and starting the accelerated aging determination when the following conditions are met; in the accelerated aging determination, the aging determination threshold is 80% of the threshold; ; in, It is the rate of temperature rise, represents the absolute difference between the real-time working current value and the initial working current value of the corresponding mode, represents the initial operating current value in the first frequency mode or the second frequency mode, The unit is degrees Celsius per second.

[0048] Specifically, at the moment of frequency mode switching, the temperature rise rate and the current current deviation ratio are collected synchronously, wherein the temperature rise rate can be calculated by the SMD NTC thermistor (sampling rate 10Hz) to calculate the temperature rise value per second. If the above conditions are met, the accelerated aging judgment mode is activated. The dual condition triggering of this embodiment can avoid the misjudgment of aging caused by a single parameter judgment and increase the timeliness of the aging judgment.

[0049] In this embodiment, in the process of returning to execute the step S13, the corresponding current deviation ratio is extracted each time a preset number of cycles are completed, and the current deviation ratio of the preset number of times constitutes an independent sliding window, and the mean and standard deviation of the current deviation ratio in each sliding window are calculated in sequence. When M consecutive sliding windows satisfy the following formula, and M is greater than or equal to 2, it is determined that an irreversible aging trend occurs, and the aging failure determination is triggered; ,and ; in, represents the mean value of the current deviation ratio in the nth sliding window, represents the mean value of the current deviation ratio in the n+1th sliding window, represents the standard deviation of the current deviation ratio in the n-1th sliding window, It represents the standard deviation of the current deviation ratio in the nth sliding window.

[0050] This embodiment uses the window analysis method to identify the irreversible aging trend of the high-frequency generator, and can predict the end of the life of the high-frequency generator in advance compared to the traditional threshold method, providing data support for the preventive maintenance of the high-frequency generator.

[0051] Reference Figure 2 The present invention provides an aging test system for a high frequency generator, comprising: A first frequency mode control module 21, used to control the high frequency generator to be tested to operate in a first frequency mode, and record an initial operating current value of the high frequency generator to be tested in the first frequency mode; A second frequency mode control module 22, used to control the high frequency generator to be tested to operate in a second frequency mode, and record an initial operating current value of the high frequency generator to be tested in the second frequency mode; A switching module 23, used for controlling the high-frequency generator to be tested to switch between the first frequency mode and the second frequency mode alternately, wherein the switching between the first frequency mode and the second frequency mode is completed by linear frequency gradient; A monitoring and calculation module 24 is used to monitor the real-time working current value of the high-frequency generator to be tested in the first frequency mode and the second frequency mode during the switching operation, and calculate the relative deviation ratio between the real-time working current value and the initial working current value in the corresponding mode; A determination module 25, configured to determine that the high-frequency generator is aged and failed when the relative deviation ratio in any mode exceeds a threshold value, and record the total operating time of the high-frequency generator to be tested; The cyclic determination module 26 returns to sequentially execute the switching module 23, the monitoring and calculation module 24 and the determination module 25, if the relative deviation ratios in the first frequency mode and the second frequency mode do not exceed the threshold value, until it is determined that the high-frequency generator is aged and failed.

[0052] Reference Figure 3 , the present invention provides an electronic device 30, including a memory and a processor; The memory is used to store computer programs; The processor is used to implement any one of the above-mentioned aging test methods for a high-frequency generator when executing the computer program.

[0053] In a fourth aspect, the present invention provides a computer-readable storage medium having a computer program stored thereon. When the computer program is executed by a processor, any one of the above-mentioned aging test methods for a high-frequency generator is implemented.

[0054] The present invention provides an electronic device 30, comprising a memory 31 and a processor 32; The memory 31 is used to store computer programs; The processor 32 is used to implement the above-mentioned aging test method for the high-frequency generator when executing the computer program.

[0055] In other words, an electronic device 30 includes a memory 31 and a processor 32 coupled to the memory 31; the memory 31 is configured to store a computer program; and the processor 32 is configured to perform the following operations when executing the computer program: Step S11, controlling the high-frequency generator to be tested to operate in a first frequency mode, and recording an initial operating current value of the high-frequency generator to be tested in the first frequency mode; Step S12, controlling the high-frequency generator to be tested to operate in a second frequency mode, and recording an initial operating current value of the high-frequency generator to be tested in the second frequency mode; Step S13, controlling the high-frequency generator to be tested to switch between the first frequency mode and the second frequency mode alternately, wherein the switching between the first frequency mode and the second frequency mode is completed by linear frequency gradient; Step S14, monitoring the real-time working current value of the high-frequency generator to be tested in the first frequency mode and the second frequency mode during the switching operation, and calculating the relative deviation ratio between the real-time working current value and the initial working current value in the corresponding mode; Step S15: when the relative deviation ratio in any mode exceeds a threshold value, the high-frequency generator is determined to be aged and failed, and the total operating time of the high-frequency generator to be tested is recorded; Step S16: If the relative deviation ratios in the first frequency mode and the second frequency mode do not exceed the threshold, return to execute step S13 until it is determined that the high-frequency generator is aged and failed.

[0056] The present invention provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the above-mentioned aging test method for a high-frequency generator is implemented.

[0057] In other words, a non-volatile computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the processor performs the following operations: Step S11, controlling the high-frequency generator to be tested to operate in a first frequency mode, and recording an initial operating current value of the high-frequency generator to be tested in the first frequency mode; Step S12, controlling the high-frequency generator to be tested to operate in a second frequency mode, and recording an initial operating current value of the high-frequency generator to be tested in the second frequency mode; Step S13, controlling the high-frequency generator to be tested to switch between the first frequency mode and the second frequency mode alternately, wherein the switching between the first frequency mode and the second frequency mode is completed by linear frequency gradient; Step S14, monitoring the real-time working current value of the high-frequency generator to be tested in the first frequency mode and the second frequency mode during the switching operation, and calculating the relative deviation ratio between the real-time working current value and the initial working current value in the corresponding mode; Step S15: when the relative deviation ratio in any mode exceeds a threshold, it is determined that the high frequency generator is aged and failed; Step S16: If the relative deviation ratios in the first frequency mode and the second frequency mode do not exceed the threshold, return to execute step S13 until it is determined that the high-frequency generator is aged and failed.

[0058] An electronic device 30 that can be used as a server or client of the present invention will now be described, which is an example of a hardware device that can be applied to various aspects of the present invention. The electronic device 30 is intended to represent various forms of digital electronic computer devices, such as laptop computers, desktop computers, workbenches, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device 30 can also represent various forms of mobile devices, such as personal digital processing, cellular phones, smart phones, wearable devices, and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely examples and are not intended to limit the implementation of the present invention described and / or required herein.

[0059] The electronic device 30 includes a computing unit, which can perform various appropriate actions and processes according to a computer program stored in a read-only memory (ROM) or a computer program loaded from a storage unit into a random access memory (RAM). In the RAM, various programs and data required for the operation of the device can also be stored. The computing unit, ROM, and RAM are connected to each other via a bus. An input / output (I / O) interface is also connected to the bus.

[0060] A person of ordinary skill in the art can understand that all or part of the processes in the above-mentioned embodiment method can be implemented by instructing the relevant hardware through a computer program, and the program can be stored in a computer-readable storage medium. When the program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, the storage medium can be a disk, an optical disk, a read-only memory (ROM) or a random access memory (RAM), etc. In the present application, the unit described as a separate component may or may not be physically separated, and the component displayed as a unit may or may not be a physical unit, that is, it may be located in one place, or it may be distributed on multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the embodiment of the present invention. In addition, each functional unit in each embodiment of the present invention can be integrated in a processing unit, or each unit can exist physically separately, or two or more units can be integrated in one unit. The above-mentioned integrated unit can be implemented in the form of hardware or in the form of a software functional unit.

[0061] Although the present invention is disclosed as above, the protection scope of the present invention is not limited thereto. Those skilled in the art may make various changes and modifications without departing from the spirit and scope of the present invention, and these changes and modifications will fall within the protection scope of the present invention.

Claims

1. A high frequency generator aging test method, characterized in that: Including: Step S11: Control the high-frequency generator under test to operate in the first frequency mode, and record the initial operating current value of the high-frequency generator under test in the first frequency mode; Step S12: Control the high-frequency generator under test to operate in the second frequency mode, and record the initial operating current value of the high-frequency generator under test in the second frequency mode; Step S13: Control the high-frequency generator under test to alternately switch and operate between the first frequency mode and the second frequency mode, wherein the switch between the first frequency mode and the second frequency mode is completed through linear frequency gradient; Step S14: Monitor the real-time operating current values of the high-frequency generator under test in the first frequency mode and the second frequency mode during the switching operation, and calculate the relative deviation ratio of the real-time operating current value to the initial operating current value in the corresponding mode; Step S15: When the relative deviation ratio in any mode exceeds the threshold, it is determined that the high-frequency generator is aging and fails, and record the total operating time of the high-frequency generator under test; Step S16: If the relative deviation ratios in the first frequency mode and the second frequency mode do not exceed the threshold, return to execute Step S13 until it is determined that the high-frequency generator is aging and fails.

2. The aging test method of the high frequency generator according to claim 1, characterized in that: The frequency range of the first frequency mode is from 0.4 Hz to 2 Hz, the frequency range of the second frequency mode is from 3 Hz to 20 Hz, and when switching between the first frequency mode and the second frequency mode, the frequency transition difference corresponding to each mode switch is at least 2.5 Hz.

3. The aging test method of the high frequency generator according to claim 1, characterized in that: The threshold is a dynamic threshold, and the dynamic threshold is updated according to the number of cycle tests according to the following formula: When N ≤ the first test number, the dynamic threshold is T1; When the first test number < N ≤ the second test number, the dynamic threshold is T2; When N > the second test number, the dynamic threshold is T3; Wherein, N is the number of cycle tests, and T1 is the initially set threshold.

4. The aging test method of the high frequency generator according to claim 3, characterized in that: The calculation formula of T2 is: ； The calculation formula of T3 is: ； Wherein, e represents the natural constant.

5. The aging test method of a high frequency generator according to claim 1, characterized in that: Step S11 specifically includes: randomly select a first number of different first sub-frequency points in the first frequency mode, control the high-frequency generator under test to operate in sequence according to each of the first sub-frequency points, wherein control the high-frequency generator to continuously operate at each of the first sub-frequency points for at least a preset duration, record the current measurement values of the high-frequency generator under test at each of the first sub-frequency points, and calculate the arithmetic mean of the current measurement values corresponding to each of the first sub-frequency points as the initial operating current value of the first frequency mode; Step S12 specifically includes: selecting a second number of different second sub-frequency points at equal intervals in the second frequency mode, controlling the high-frequency generator to be tested to operate in turn according to each of the second sub-frequency points, wherein the high-frequency generator to be tested is controlled to continuously operate for at least the preset time length according to each of the second sub-frequency points, recording the current measurement value of the high-frequency generator to be tested at each of the second sub-frequency points, and after eliminating the maximum value and the minimum value of the current measurement values ​​corresponding to all the second sub-frequency points, taking the average value of the current measurement values ​​corresponding to the remaining sub-frequency points as the initial working current value of the second frequency mode.

6. The aging test method of a high frequency generator according to claim 1, characterized in that: Step S14 also includes: synchronously monitoring the temperature rise rate of the high-frequency generator to be tested, and starting the accelerated aging determination when the following conditions are met; in the accelerated aging determination, the aging determination threshold is 80% of the threshold; ； in, represents the rate of temperature rise, represents the absolute difference between the real-time working current value and the initial working current value of the corresponding mode, Indicates the initial operating current value in the first frequency mode or the second frequency mode.

7. The aging test method of a high frequency generator according to claim 1, characterized in that: In the process of returning to execute the step S13, the corresponding current deviation ratio is extracted every time a preset number of cycles are completed, and the current deviation ratio of the preset number of times is formed into an independent sliding window, and the mean and standard deviation of the current deviation ratio in each sliding window are calculated in sequence. When M consecutive sliding windows satisfy the following formula, and M is greater than or equal to 2, it is determined that an irreversible aging trend occurs, and an aging failure determination is triggered; ,and ; in, represents the mean value of the current deviation ratio in the nth sliding window, represents the mean value of the current deviation ratio in the n+1th sliding window, represents the standard deviation of the current deviation ratio in the n-1th sliding window, It represents the standard deviation of the current deviation ratio in the nth sliding window.

8. An aging test system for a high frequency generator, characterized in that: include: A first frequency mode control module, used to control the high-frequency generator to be tested to operate in a first frequency mode, and record an initial operating current value of the high-frequency generator to be tested in the first frequency mode; A second frequency mode control module, used for controlling the high frequency generator to be tested to operate in a second frequency mode, and recording an initial operating current value of the high frequency generator to be tested in the second frequency mode; A switching module, used for controlling the high-frequency generator to be tested to switch between the first frequency mode and the second frequency mode alternately, wherein the switching between the first frequency mode and the second frequency mode is completed by linear frequency gradient; A monitoring and calculation module, used for monitoring the real-time working current value of the high-frequency generator to be tested in the first frequency mode and the second frequency mode during the switching operation, and calculating the relative deviation ratio between the real-time working current value and the initial working current value in the corresponding mode; A determination module, configured to determine that the high-frequency generator is aged and failed when the relative deviation ratio in any mode exceeds a threshold value, and record the total operating time of the high-frequency generator to be tested; The cyclic determination module returns to sequentially execute the switching module, the monitoring and calculation module, and the determination module until it is determined that the high-frequency generator is aged and failed if the relative deviation ratios in the first frequency mode and the second frequency mode do not exceed the threshold value.

9. An electronic device, characterized in that: including memory and processor; The memory is used to store computer programs; The processor is used to implement the aging test method for the high frequency generator according to any one of claims 1 to 7 when executing the computer program.

10. A computer-readable storage medium, characterized in that: The storage medium stores a computer program, and when the computer program is executed by the processor, the aging test method for the high-frequency generator according to any one of claims 1 to 7 is implemented.

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