An automatic measurement and storage system for electronic components

Abstract

The present invention relates to the field of electronic component measurement technology, and provides an electronic component automated measurement and storage system, including: a feature recognition module, the feature recognition module is used to quickly identify the category of the electronic component being detected, and send a permission to allow detection, perform screening detection, and uniformly perform detection work on the same type of electronic components; a comparison and judgment module, the comparison and judgment module is used to judge the detected electronic components, detect whether the electrical value and surface packaging of the electronic components are qualified, and output the detection data. Through automated electronic component measurement, the measurement speed is greatly improved, and through the unified measurement of a single category of screening type, in conjunction with the exclusion process of different categories, the error in the measurement process is reduced, and the detection process that meets the category batch is re-formulated according to the data results in the measurement process, further improving the accuracy and speed of data collection.

Description

Technical Field

[0001] The invention relates to the technical field of electronic component measurement, and in particular to an electronic component automatic measurement and storage system. Background Art

[0002] Electronic components are the basic components of electronic systems. They play different roles in circuits to achieve specific functions. Common electronic components include resistors, capacitors, inductors, diodes and other components. Among them, the measurement of electronic components is the process of determining whether the quality of electronic components is qualified during the production process of electronic components. At the same time, the measurement results need to be stored, so as to innovate and modify new production technologies based on historical production data to make production technologies more perfect. Existing electronic component measurements mostly rely on manual labor, resulting in huge manpower consumption, while the accuracy of automated measurement lacks a certain degree of precision. If the accuracy is adjusted, the measurement time will be consumed, resulting in defects in the automated electronic component measurement work. After the measurement data is entered into the storage system, it lacks efficiency and data accuracy. Therefore, an electronic component automated measurement and storage system is needed. Summary of the invention

[0003] In view of the shortcomings of the prior art, the purpose of the present invention is to propose an automated measurement and storage system for electronic components, which solves the problem that the existing automated measurement of electronic components is immature, resulting in a lack of efficiency and accuracy of the data generated by the measurement after entering the storage system.

[0004] To achieve the above-mentioned object, the present invention adopts the following technical scheme: an electronic component automatic measurement and storage system, comprising: a feature recognition module, a comparison and judgment module, a detection template generation module and a data storage module; The feature recognition module is used to quickly identify the type of electronic components being detected, and send a permission to allow detection, and perform screening detection, so as to uniformly detect electronic components of the same type; The comparison and judgment module is used to judge the electronic components being tested, detect whether the electrical value and surface packaging of the electronic components are qualified, and output the test data; The detection template generation module is used to receive the detection data output by the comparison and judgment module, generate a temporary detection standard, import it into the sample template framework connected to the detection template generation module, formulate the detection process through the sample template framework, and quickly perform the detection work of the same batch; The data storage module is used to store the detection data output by the comparison and judgment module, organize, encrypt, save and backup, and can generate a report reflecting the quality of the production batch through the data report generation module; The feature recognition module and the comparison and judgment module are electrically connected to a measuring instrument to receive images and electrical value data transmitted by the measuring instrument.

[0005] The feature recognition module includes an identification category switching unit, a heterogeneous identification unit, a contour determination unit and a detection permission protocol which are electrically connected to each other. The identification category switching unit is used to set the measurement target, and during the measurement process, category determination is performed in turn by the heterogeneous identification unit and the contour determination unit. Only when the determination is successful can the detection permission protocol be activated to perform automated measurement of electronic components.

[0006] The comparison and judgment module includes a surface defect capturing unit, a surface defect comparison unit, an electrical value comparison unit, an electrical value review unit and a data integration unit which are electrically connected to each other. The surface defect capturing unit is used to quickly capture defects on the surface of the electronic component package, and compare them with the defect tolerance standard through the surface defect comparison unit to determine whether they are qualified. The electrical value comparison unit is used to compare the collected electrical values ​​with the normal electrical standard values, and after the comparison is completed, the electrical value review unit conducts a review and comparison, and the compared data is packaged and output by the data integration unit.

[0007] The detection template generation module includes a standard detection template unit, a calibration unit and a temporary detection unit that are electrically connected to each other. The standard detection template unit stores qualified standard data. The data output by the data integration unit is combined with the qualified standard data to generate a temporary detection standard for this detection through the temporary detection standard unit, and the calibration unit performs calibration adjustment.

[0008] The data storage module includes a detection record storage unit, a record consolidation unit, a cloud storage synchronization unit and a data encryption unit which are electrically connected to each other. The detection record storage unit is used to receive data output by the data integration unit, and the data is sorted by the record consolidation unit, backed up in the cloud through the cloud storage synchronization unit, and encrypted by the data encryption unit.

[0009] The report generated by the data report generation module includes a bar chart, a pie chart, and a line chart, which are used to reflect the qualified status, qualified ratio, and qualified stability of each batch of electronic components.

[0010] The present invention also provides a storage method based on the above-mentioned electronic component automatic measurement and storage system, comprising the following steps: Step 1: Import qualified standard data into the test template generation module as original reference data; Step 2: Screen the electronic components and measure them in batches using a measuring instrument; Step 3: The feature recognition module first obtains the image of a single electronic component sent by the measuring instrument, performs recognition and judgment, and issues a test permit if the image meets the characteristics of the electronic components of the same batch, and performs the electronic component test; otherwise, the electronic component is removed and the measurement of the next electronic component is quickly performed; Step 4: Activate the comparison and judgment module according to the detection permission, and receive the image data and electrical value data sent by the measuring instrument; Step 5: The image data and the electrical value data are compared and tested according to the qualified standard data provided by the detection template generation module to the sample template framework, and the test results are sent to the detection template generation module for processing and the data storage module for storage; Step 6: When the test template generation module accumulates X test results, a temporary test standard for the batch of electronic components is constructed based on the qualified standard data and the X test results, and the temporary test standard is transferred to the sample template framework to formulate a test process that fits the batch of electronic components. While meeting the qualified standard data, the test data can be quickly identified and collected. Step 7: After the measurement work is completed, the data in the data storage module is used to generate a report through the data report generation module to reflect the quality of each batch of electronic components.

[0011] The specific steps of identification and determination in step 3 are: S1. Switch and set the batch of electronic components as the target through the identification category switching unit, and enter the characteristics; S2, according to the input electronic component image, the different category recognition unit and the contour determination unit are sequentially used to determine the category, and the determination content is the features and the shape contour; S3. Determine whether the detection permission protocol is activated successfully.

[0012] The specific steps of the comparative detection in step 5 are: S1. Input the electronic component images and electrical value data, classify the electronic components, and perform multiple batches of inspections according to the types; S2. Using a surface defect capturing unit, quickly capturing defects on the packaging surface of the electronic component in the electronic component image, and then using a surface defect comparison unit to compare the defects with the defect tolerance standard to determine whether the defects are qualified; S3. Compare the collected electrical values ​​with the normal electrical standard values ​​using the electrical value comparison unit. The comparison is performed by input current. After the preliminary comparison is passed, the electrical value review unit switches to different input currents for review and comparison.

[0013] The specific steps for constructing the temporary testing standard in step 6 are: S1. According to the X test results provided by the data integration unit, classify and sort the test results to obtain the initial standard range; S2, taking the initial standard range as the reference and using the calibration unit to adjust it according to the qualified standard data in the standard test template unit, and generating the qualified range (P1, P2); S3. Set the image defect degree and electrical value of subsequent electronic component measurements to be within the range of (P1, P2), which is considered qualified.

[0014] The beneficial effects of the present invention are: 1. The measurement speed is greatly improved through automated electronic component measurement. The error in the measurement process is reduced through unified measurement of a single category by screening type and the exclusion process of different categories. The inspection process that meets the batch of this category is re-established based on the data results during the measurement process, which further improves the accuracy and speed of data collection. 2. On the basis of automatically comparing the electrical value qualification of electronic components, a review mechanism is further added to ensure more accurate test results. This intelligent quality control reduces errors in the test process, improves fault tolerance, and reduces the risk of misjudgment in automated measurement. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 A diagram of an electronic component automated measurement and storage system of the present invention; Figure 2 A schematic diagram of a detection template generation module system of the present invention; Figure 3 It is a schematic diagram of the comparison and judgment module system of the present invention; Figure 4 It is a schematic diagram of the feature recognition module system of the present invention; Figure 5 It is a schematic diagram of the data storage module system of the present invention. DETAILED DESCRIPTION

[0016] The technical solution of the present invention will be described clearly and completely below in conjunction with the drawings of this specification. It should be noted that the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0017] like Figure 1 As shown: an electronic component automatic measurement and storage system, including: a feature recognition module, a comparison and judgment module, a detection template generation module and a data storage module; the feature recognition module and the comparison and judgment module are electrically connected to a measuring instrument to receive images and electrical value data transmitted by the measuring instrument, and the data report generation module generates reports including bar charts, pie charts, and line charts to reflect the qualified status, qualified proportion and qualified stability of each batch of electronic components.

[0018] like Figure 4 As shown: the feature recognition module is used to quickly identify the category of the electronic component being detected, and send a permission to allow detection, and perform screening detection, so as to uniformly detect the same type of electronic components. The feature recognition module is composed of an identification category switching unit, a heterogeneous identification unit, a contour judgment unit and a detection permission protocol that are electrically connected to each other. The identification category switching unit is used to set the measurement target, and during the measurement process, the category is judged in turn by the heterogeneous identification unit and the contour judgment unit. Only when the judgment is successful can the detection permission protocol be activated to perform automated measurement of the electronic components.

[0019] like Figure 3 As shown: the comparison and judgment module is used to judge the detected electronic components, detect whether the electrical values ​​and surface packaging of the electronic components are qualified, and output the detection data. The comparison and judgment module is composed of a surface defect capture unit, a surface defect comparison unit, an electrical value comparison unit, an electrical value review unit and a data integration unit which are electrically connected to each other. The surface defect capture unit is used to quickly capture defects on the surface of the electronic component package, and compare them with the defect allowable standard through the surface defect comparison unit to determine whether they are qualified. The electrical value comparison unit is used to compare the collected electrical values ​​with the normal electrical standard values, and after the comparison is completed, the electrical value review unit conducts a review and comparison, and the compared data is packaged and output by the data integration unit.

[0020] like Figure 2 As shown: the detection template generation module is used to receive the detection data output by the comparison and judgment module, generate a temporary detection standard, import it into the sample template framework connected to the detection template generation module, formulate the detection process through the sample template framework, and quickly carry out the detection work of the same batch. The detection template generation module is composed of a standard detection template unit, a calibration unit and a temporary detection unit that are electrically connected to each other. The standard detection template unit stores qualified standard information. The data output by the data integration unit is combined with the qualified standard information to generate a temporary detection standard for this detection through the temporary detection standard unit, and the calibration unit performs calibration adjustment.

[0021] like Figure 5 As shown: the data storage module is used to store the detection data output by the comparison and judgment module, organize, encrypt, save and back up, and can generate a report reflecting the quality status of the production batch through the data report generation module. The data storage module is composed of a detection record storage unit, a record consolidation unit, a cloud storage synchronization unit and a data encryption unit that are electrically connected to each other. The detection record storage unit is used to receive the data output by the data integration unit, and the record consolidation unit organizes the data, performs cloud synchronization and backup through the cloud storage synchronization unit, and encrypts it by the data encryption unit.

[0022] An electronic component automated measurement and storage method is implemented based on the electronic component automated measurement and storage system provided above, and includes the following steps: Step 1: Import qualified standard data into the test template generation module as original reference data; Step 2: Screen the electronic components and measure them in batches using a measuring instrument; Step 3: The feature recognition module first obtains the image of a single electronic component sent by the measuring instrument, performs recognition and judgment, and issues a detection permit if it meets the characteristics of the electronic components of the same batch, and performs electronic component detection. Otherwise, the electronic component is removed and the measurement of the next electronic component is quickly performed. The specific steps of recognition and judgment are as follows: S1. Switch and set the batch of electronic components as the target through the identification category switching unit, and enter the characteristics; S2, according to the input electronic component image, the different category recognition unit and the contour determination unit are sequentially used to determine the category, and the determination content is the features and the shape contour; S3. Determine whether the detection permission protocol is activated successfully.

[0023] Step 4: Activate the comparison and judgment module according to the detection permission, and receive the image data and electrical value data sent by the measuring instrument; Step 5: The image data and electrical value data are compared and tested according to the qualified standard data provided by the detection template generation module to the sample template framework, and the test results are sent to the detection template generation module for processing and the data storage module for storage. The specific steps of the comparison test are as follows: S1. Input the electronic component images and electrical value data, classify the electronic components, and perform multiple batches of inspections according to the types; S2. Using a surface defect capturing unit, quickly capturing defects on the packaging surface of the electronic component in the electronic component image, and then using a surface defect comparison unit to compare the defects with the defect tolerance standard to determine whether the defects are qualified; S3. Compare the collected electrical values ​​with the normal electrical standard values ​​using the electrical value comparison unit. The comparison is performed by input current. After the preliminary comparison is passed, the electrical value review unit switches to different input currents for review and comparison.

[0024] Step 6: When the test template generation module accumulates X test results, a temporary test standard for the batch of electronic components is constructed based on the qualified standard data and the X test results, and transferred to the sample template framework to formulate a test process that fits the batch of electronic components. While meeting the qualified standard data, rapid identification and collection of measurement data are achieved. The specific steps for constructing the temporary test standard are as follows: S1. According to the X test results provided by the data integration unit, classify and sort the test results to obtain the initial standard range; S2, taking the initial standard range as the reference and using the calibration unit to adjust it according to the qualified standard data in the standard test template unit, and generating the qualified range (P1, P2); S3. The image defect degree and electrical value of subsequent electronic component measurements are set to be within the range of (P1, P2), which is considered qualified; Step 7: After the measurement work is completed, the data in the data storage module is used to generate a report through the data report generation module to reflect the quality of each batch of electronic components.

[0025] This method greatly improves the measurement speed through automated electronic component measurement, reduces errors in the measurement process through screening-type unified measurement of a single category and a heterogeneous category exclusion process, and reformulates the inspection process that conforms to the category batch based on the data results during the measurement process, further improving accuracy and the speed of data collection.

[0026] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

[0027] Parts of the present invention not described in detail are prior art.

Claims

1. An electronic component automated measurement and storage system, comprising: Feature recognition module, comparison and judgment module, detection template generation module and data storage module; its characteristics are: The feature recognition module is used to quickly identify the type of electronic components being detected, and send a permission to allow detection, and perform screening detection, so as to uniformly detect electronic components of the same type; The comparison and judgment module is used to judge the electronic components being tested, detect whether the electrical value and surface packaging of the electronic components are qualified, and output the test data; The detection template generation module is used to receive the detection data output by the comparison and judgment module, generate a temporary detection standard, import it into the sample template framework connected to the detection template generation module, formulate the detection process through the sample template framework, and quickly perform the detection work of the same batch; The data storage module is used to store the detection data output by the comparison and judgment module, organize, encrypt, save and backup, and can generate a report reflecting the quality of the production batch through the data report generation module; The feature recognition module and the comparison and judgment module are electrically connected to a measuring instrument to receive images and electrical value data transmitted by the measuring instrument.

2. The electronic component automatic measurement and storage system according to claim 1, characterized in that: The feature recognition module includes an identification category switching unit, a heterogeneous identification unit, a contour determination unit and a detection permission protocol which are electrically connected to each other. The identification category switching unit is used to set the measurement target, and during the measurement process, category determination is performed in turn by the heterogeneous identification unit and the contour determination unit. Only when the determination is successful can the detection permission protocol be activated to perform automated measurement of electronic components.

3. The electronic component automatic measurement and storage system according to claim 1, characterized in that: The comparison and judgment module includes a surface defect capturing unit, a surface defect comparison unit, an electrical value comparison unit, an electrical value review unit and a data integration unit which are electrically connected to each other. The surface defect capturing unit is used to quickly capture defects on the surface of the electronic component package, and compare them with the defect tolerance standard through the surface defect comparison unit to determine whether they are qualified. The electrical value comparison unit is used to compare the collected electrical values ​​with the normal electrical standard values, and after the comparison is completed, the electrical value review unit conducts a review and comparison, and the compared data is packaged and output by the data integration unit.

4. The electronic component automatic measurement and storage system according to claim 1, characterized in that: The detection template generation module includes a standard detection template unit, a calibration unit and a temporary detection unit that are electrically connected to each other. The standard detection template unit stores qualified standard data. The data output by the data integration unit is combined with the qualified standard data to generate a temporary detection standard for this detection through the temporary detection standard unit, and the calibration unit performs calibration adjustment.

5. The electronic component automatic measurement and storage system according to claim 1, characterized in that: The data storage module includes a detection record storage unit, a record consolidation unit, a cloud storage synchronization unit and a data encryption unit which are electrically connected to each other. The detection record storage unit is used to receive data output by the data integration unit, and the data is sorted by the record consolidation unit, backed up in the cloud through the cloud storage synchronization unit, and encrypted by the data encryption unit.

6. The electronic component automatic measurement and storage system according to claim 1, characterized in that: The report generated by the data report generation module includes a bar chart, a pie chart, and a line chart, which are used to reflect the qualified status, qualified ratio, and qualified stability of each batch of electronic components.

7. A storage method of an electronic component automated measurement storage system according to any one of claims 1 to 6, comprising the following steps: Step 1: Import qualified standard data into the test template generation module as original reference data; Step 2: Screen the electronic components and measure them in batches using a measuring instrument; Step 3: The feature recognition module first obtains the image of a single electronic component sent by the measuring instrument, performs recognition and judgment, and issues a test permit if the image meets the characteristics of the electronic components of the same batch, and performs the electronic component test; otherwise, the electronic component is removed and the measurement of the next electronic component is quickly performed; Step 4: Activate the comparison and judgment module according to the detection permission, and receive the image data and electrical value data sent by the measuring instrument; Step 5: The image data and the electrical value data are compared and tested according to the qualified standard data provided by the detection template generation module to the sample template framework, and the test results are sent to the detection template generation module for processing and the data storage module for storage; Step 6: When the test template generation module accumulates X test results, a temporary test standard for the batch of electronic components is constructed based on the qualified standard data and the X test results, and the temporary test standard is transferred to the sample template framework to formulate a test process that fits the batch of electronic components. While meeting the qualified standard data, the test data can be quickly identified and collected. Step 7: After the measurement work is completed, the data in the data storage module is used to generate a report through the data report generation module to reflect the quality of each batch of electronic components.

8. The storage method of the electronic component automatic measurement storage system according to claim 7, characterized in that: The specific steps of identification and determination in step 3 are: S1. Switch and set the batch of electronic components as the target through the identification category switching unit, and enter the characteristics; S2, according to the input electronic component image, the different category recognition unit and the contour determination unit are sequentially used to determine the category, and the determination content is the features and the shape contour; S3. Determine whether the detection permission protocol is activated successfully.

9. The storage method of the electronic component automatic measurement storage system according to claim 7, characterized in that: The specific steps of the comparative detection in step 5 are: S1. Input the electronic component images and electrical value data, classify the electronic components, and perform multiple batches of inspections according to the types; S2. Using a surface defect capturing unit, quickly capturing defects on the packaging surface of the electronic component in the electronic component image, and then using a surface defect comparison unit to compare the defects with the defect tolerance standard to determine whether the defects are qualified; S3. Compare the collected electrical values ​​with the normal electrical standard values ​​using the electrical value comparison unit. The comparison is performed by input current. After the preliminary comparison is passed, the electrical value review unit switches to different input currents for review and comparison.

10. The storage method of the electronic component automatic measurement storage system according to claim 7, characterized in that: The specific steps for constructing the temporary testing standard in step 6 are: S1. According to the X test results provided by the data integration unit, classify and sort the test results to obtain the initial standard range; S2, taking the initial standard range as the reference and using the calibration unit to adjust it according to the qualified standard data in the standard test template unit, and generating the qualified range (P1, P2); S3. Set the image defect degree and electrical value of subsequent electronic component measurements to be within the range of (P1, P2), which is considered qualified.

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