Method for testing reliability and safety of polymorphic password product

Abstract

The invention discloses a method for testing reliability and safety of a polymorphic password product, initial testing and multi-group sub-item testing are carried out on a password product to be tested according to a preset sequence, and the initial testing comprises operation testing, random number comparison detection and safety detection; the multi-component test comprises a constant-pressure high-low temperature test, a variable temperature test, a constant damp-heat test, a low-pressure test, an impact test, an illumination test, a vibration test, a drop test and an aging test; if any one of the initial test and the multiple groups of sub-test does not pass, determining that the password product reliability and security detection does not pass; the beneficial effects of the invention are that the method is suitable for various forms of password products, and can systematically detect the operation correctness, the performance stability, the random number generation compliance and the product safety of the password products through comprehensive detection, so that the method for detecting the reliability of the password products is formed on the whole; the reliability and security of the password product are ensured, and the network security and data security of a network information system and a product using the password product are ensured through the detection.

Description

Technical Field

[0001] The invention relates to the field of cryptographic product testing, and in particular to a reliability and security testing method for a polymorphic cryptographic product. Background Art

[0002] Passwords are the cornerstone of protecting network security and data security. The forms of password products vary greatly. According to the modules, they can be divided into hardware password modules, software password modules, firmware password modules, hybrid software password modules, and hybrid firmware password modules. Specifically, there are server password machines that appear in the form of electronic products, quantum key distribution systems that are a mixture of electronic products and quantum technology, and software and firmware. Now, password products no longer simply appear in the form of electronic products such as server password machines and are placed in an environment with temperature and humidity control. Instead, they appear in multiple forms such as electronic products, quantum technology products, software, firmware, etc., and are widely used in various occasions such as indoors and outdoors, at high temperatures and low temperatures. For example, under conditions such as high temperature and light, the hardware coating that protects sensitive password parameters will be destroyed, leading to security and reliability issues. Product reliability is related to whether the password can be used normally, and is related to the stability and security of the entire network space and data. It has become a content that must be considered in the detection of password products. However, so far, only password products have protection measures under ultra-high temperature and ultra-high voltage conditions. There is no comprehensive, systematic, and universal reliability detection method for password products, especially for password products of various forms. Different from the reliability testing of conventional electrical products which focuses on the safety of electrical appliances, the reliability testing of passwords focuses on different conditions. Even if the password is safe from the electrical perspective, the quality of the password random numbers and the password operation may deviate, resulting in insecure passwords, thus affecting the network and data security of products and systems that use the passwords.

[0003] In view of the deficiencies in the prior art, the present invention proposes a reliability and security testing method and system for a polymorphic cryptographic product. Summary of the invention

[0004] The purpose of the present invention is to overcome the shortcomings of the prior art and provide a reliability and security testing method for multi-form cryptographic products, which is applicable to cryptographic products of various forms and can systematically test the correctness of cryptographic product operations, performance stability, random number generation compliance and product safety through comprehensive testing, thereby forming an overall testing method for the reliability of cryptographic products and ensuring the reliability and security of cryptographic products.

[0005] A reliability and security testing method for a polymorphic cryptographic product, comprising:

[0006] The cryptographic products to be tested are subjected to initial testing and multi-group test in a preset order.

[0007] The initial test includes: operation test, random number comparison test and security test;

[0008] The multi-component tests include: constant pressure high and low temperature test, variable temperature test, constant humidity and heat test, low air pressure test, impact test, light test, vibration test, drop test and aging test;

[0009] If any of the initial test and the multi-component test fails, the reliability and security test of the cryptographic product will fail;

[0010] In the initial testing described,

[0011] The operation detection includes:

[0012] Run the cryptographic product to be tested according to the product manual;

[0013] If it runs normally, enter the password to run the test data;

[0014] If it cannot run normally, the test will be terminated and the output will be that the test failed.

[0015] After inputting the prepared password running test data, grab the output data; compare the output data with the prepared password running test data to determine whether the password calculation is correct;

[0016] If correct, the cryptographic performance is calculated based on the output data;

[0017] If there is an error, the test is terminated and the output is that the test failed;

[0018] Calculate the cryptographic performance based on the output data, and compare the calculated performance with the cryptographic performance;

[0019] If the difference between the computational performance and the cryptographic performance exceeds the permissible range, the output operation test fails;

[0020] If the difference between the computing performance and the cryptographic performance does not exceed the allowable range, the output operation test passes, and a random number comparison test is performed;

[0021] The random number comparison test includes:

[0022] Obtain the random number output by the cryptographic product and perform a random number qualification test on the random number;

[0023] If the test fails, the random number comparison test fails;

[0024] If the test is qualified, the random number comparison test is passed, and the security test is performed;

[0025] The safety test includes:

[0026] Check whether the cryptographic product and its supporting environment have a physical shell;

[0027] If there is a physical shell, detect whether the external physical object can pass through the physical shell of the cryptographic product and directly contact the cryptographic components inside the cryptographic product;

[0028] If the password component can be directly contacted, the security check is terminated and the security check failure is output;

[0029] If not, check the physical enclosure for trace coating, tamper response and zeroing circuits, tamper detection and response envelopes;

[0030] If any of the trace coating, disassembly response and zeroing circuit, disassembly detection and response envelope is true, the output safety test fails;

[0031] The safety test passes if the trace coating, disassembly response and zeroing circuits, disassembly detection and response envelope are each present.

[0032] Furthermore, the constant high and low temperature test includes:

[0033] S201, obtaining an upper limit value and a lower limit value of the working temperature of the cryptographic product to be tested;

[0034] S202, adjusting the ambient temperature of the test environment to an upper limit value or a lower limit value;

[0035] S203, when the ambient temperature is stable, placing the cryptographic product in the test environment and continuously operating it for a first preset time;

[0036] S204, during continuous operation, the cryptographic product is initially tested. If any test item in the initial test fails, the constant high and low temperature test fails;

[0037] S205, placing the password product in a standard environment until the temperature of the password product stabilizes;

[0038] S206, adjusting the ambient temperature of the test environment to above the upper limit or below the lower limit;

[0039] S207, when the ambient temperature is stable, placing the cryptographic product in the test environment and continuously operating it for a first preset time;

[0040] S208. During continuous operation, the cryptographic product is initially tested. If any item in the initial test fails, the constant high and low temperature test fails.

[0041] Further, the variable temperature test includes:

[0042] S211, adjusting the ambient temperature of the test environment to a low temperature, placing the cryptographic product in the test environment for continuous exposure and continuous operation; the low temperature is the lower limit of the working temperature of the cryptographic product to be tested; the continuous operation time is not less than 30 minutes;

[0043] S212, raising the ambient temperature to the upper limit of the working temperature; keeping the cryptographic product to be tested continuously exposed and continuously running; the amplitude of the temperature increase is 10°C / minute or the temperature increase is a fluctuating increase;

[0044] S213, when the ambient temperature rises, the cryptographic product is initially tested. If any test in the initial test fails, the variable temperature test fails;

[0045] S214, placing the cryptographic product in a standard environment until the temperature of the cryptographic product stabilizes;

[0046] S215. Place the cryptographic product in a test environment and lower the ambient temperature to the lower limit of the operating temperature; the temperature reduction amplitude is 10°C / minute or the temperature reduction is a fluctuating reduction;

[0047] S216: The cryptographic product is continuously exposed and continuously operated; the continuous operation time is not less than 30 minutes;

[0048] S217. When the ambient temperature decreases, an initial test is performed on the cryptographic product. If any item in the initial test fails, the variable temperature test fails.

[0049] Furthermore, the constant damp heat test includes:

[0050] S221. Adjust the humidity and temperature of the test environment to the specified humidity and temperature according to the product manual of the cryptographic product to form a hot and humid environment;

[0051] S222. The cryptographic product to be tested is continuously exposed and operated in a hot and humid environment;

[0052] S223. Perform an initial test on the cryptographic product to be tested running in a damp and hot environment. If any test item in the initial test fails, the constant damp and hot test fails.

[0053] Furthermore, the low pressure test includes:

[0054] S231. Adjust the air pressure of the test environment to the minimum working air pressure in the product manual of the cryptographic product;

[0055] S232, placing the cryptographic product to be tested in a test environment; powering on the cryptographic product to be tested, and continuously running it for a specified time;

[0056] S233. Remove the cryptographic product from the test environment and place it under standard atmospheric pressure, or restore the air pressure to standard atmospheric pressure using a testing tool;

[0057] S233, restoring the cryptographic product under standard atmosphere, wherein the restoration time is 1h≦restoration time≦2h;

[0058] S234. Perform an initial test on the cryptographic product to be tested. If any item in the initial test fails, the low pressure test fails.

[0059] Furthermore, the impact test includes:

[0060] S241, applying impacts of preset impact strengths in the directions of three orthogonal axes of the password product to be tested in sequence; applying multiple impacts in the directions of the three orthogonal axes;

[0061] S242. After the impact in the directions of the three orthogonal axes is completed, the cryptographic product is immediately subjected to an initial test. If any item in the initial test fails, the impact test fails.

[0062] Furthermore, the illumination test includes:

[0063] S251. Check whether the light protection film of the password product to be tested is intact:

[0064] If there is any defect, the test fails;

[0065] If it is intact, then test the light intensity;

[0066] S252. Select a standard light source, set different light intensities, and continuously illuminate the hardware password product at a preset angle for a preset time; detect whether there is any color change of the light protection film;

[0067] If the color of the light protection film changes, the output test is unqualified, and the degree and location of the change of the light protection film are recorded;

[0068] If the color of the protective film does not change when exposed to light, perform an initial test;

[0069] S253. Perform an initial test on the cryptographic product. If any item in the initial test fails, the illumination test fails.

[0070] Furthermore, the vibration test includes:

[0071] S261, applying sinusoidal vibration to the password product within a preset vibration time period;

[0072] The axis number and vibration position of the sinusoidal vibration are implemented according to the product manual of the password product;

[0073] The password product is subjected to sinusoidal vibration in the following directions: the password product is subjected to vibration in sequence on three mutually perpendicular sinusoidal vibration axes;

[0074] S262. Conduct vibration durability test on cryptographic products within the specified frequency range;

[0075] The vibration durability test is:

[0076] The frequency sweep endurance test is adopted to sweep the password product for a second preset time by setting a frequency within a preset range, a sweep frequency within a preset range, and an amplitude within a preset range;

[0077] or

[0078] The vibration durability test is:

[0079] A fixed frequency endurance test is adopted, by continuously inputting frequency to the password product at a predetermined frequency and a preset amplitude within a second preset time; the preset frequency is a central resonance frequency or an approximately fixed frequency;

[0080] S263. After completing the sinusoidal vibration and vibration endurance tests, place the cryptographic product in the same test environment as during the initial test;

[0081] S264. Perform an initial test on the cryptographic product to be tested. If any item in the initial test fails, the vibration test fails.

[0082] Furthermore, the drop test includes:

[0083] S271. Perform a surface drop test on the cryptographic product to be tested;

[0084] Place the password product on the test bench so that the bottom surface of the password product forms a preset angle with the test bench, and then let the password product fall freely on the test bench.

[0085] S272. Perform an angle drop test on the cryptographic product to be tested;

[0086] Place the password product in the position of normal use, use wooden stakes or other available equipment to make one corner of the password product present a specified height, and the other corner of the adjacent side present another different specified height. The difference between the two heights should comply with the provisions of the relevant specifications. Raise the password product around the edge between the two corners to a certain height or make the password product form a specified angle with the test table, usually taking the smaller value of the two. Let the password product fall freely on the test table, and the four corners of the password product should be subjected to a drop test.

[0087] S273: Perform a tipping (or pushing down) test on the cryptographic product to be tested

[0088] Place the password product in the position of normal use, tilt it around one bottom edge to guide it into an unstable position, and then let it turn over freely from this position to the adjacent side. A tipping test should be carried out on all four bottom edges.

[0089] S274. Perform a free drop test on the cryptographic product to be tested

[0090] According to the relevant regulations, select the drop height. The test height should be the vertical distance between the lowest position of the password product and the test table. Release the password product to minimize interference and complete the free fall. The free fall process can be repeated to test the password product a specified number of times.

[0091] S275. Perform an initial test on the cryptographic product to be tested. If any item in the initial test fails, the drop test fails.

[0092] Furthermore, the aging test includes:

[0093] Select one of the thermal acceleration factor aging test, comprehensive thermal acceleration factor aging test and Hallberg Peck model aging test to age the cryptographic product under test;

[0094] After aging, the cryptographic product to be tested is subjected to an initial test. If any test in the initial test fails, the aging test fails;

[0095] The thermal acceleration factor aging test includes: aging the cryptographic product to be tested using a heating factor effect, and the expression of the heating factor is:

[0096] AF=exp{(Ea / k)·[(1 / Tu)-(1 / Tt)]};

[0097] Where:

[0098] AF: thermal acceleration factor;

[0099] Ea: activation energy; the value of the activation energy is between 0.3eV and 1.2eV;

[0100] K: Boltzmann constant, its value is 8.617385×10^-5;

[0101] Tu: Temperature value under non-accelerated state under use conditions, in K (Kelvin);

[0102] Tt: Temperature value under accelerated state under test conditions, in K (Kelvin);

[0103] The comprehensive thermal acceleration factor aging test includes: obtaining a second thermal acceleration factor by comprehensively considering temperature and humidity factors, aging the cryptographic product to be tested by the second thermal acceleration factor, and the expression of the second thermal acceleration factor after comprehensively considering temperature and humidity factors is:

[0104] AF2=exp{(Ea / k)·[(1 / Tu)-(1 / Tt)]+(RHt ∧ n-RHu ∧ n)}

[0105] Where:

[0106] AF2: second thermal acceleration factor;

[0107] RHu: Relative humidity value under use conditions (non-accelerated state);

[0108] RHt: Relative humidity value under test conditions (accelerated state);

[0109] n: Humidity acceleration rate constant, this value is usually between 2 and 3, depending on the material and environmental conditions.

[0110] The Hallberg Peck model aging test includes: using the Hallberg Peck model to reconstruct the thermal acceleration factor to obtain a third thermal acceleration factor, aging the product code to be tested, and the expression of the third thermal acceleration factor is:

[0111] AF3=(+(RHt / RHu)3·exp{(Ea / k)·[(1 / Tu)-(1 / Tt)]}

[0112] in:

[0113] AF3: Third thermal acceleration factor.

[0114] The present invention has the following advantages:

[0115] (1) The present invention provides a clear and systematic reliability and security testing method applicable to various types of cryptographic products; the present invention has universal applicability.

[0116] (2) The present invention can detect and select cryptographic products with higher reliability for different environments, such as outdoor high temperature, low temperature and light environment, so as to ensure the long-term stability and security of network space and data. BRIEF DESCRIPTION OF THE DRAWINGS

[0117] Figure 1 It is a diagram of the method steps of the present invention. DETAILED DESCRIPTION

[0118] The present invention is further described below in conjunction with the accompanying drawings, but the protection scope of the present invention is not limited to the following description.

[0119] It should be noted that the directions or positional relationships indicated by "left", "right", etc. are based on the directions or positional relationships shown in the accompanying drawings, or are the directions or positional relationships in which the inventive product is usually placed when in use, or are the directions or positional relationships commonly understood by those skilled in the art. Such terms are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific direction, be constructed and operated in a specific direction, and therefore cannot be understood as a limitation on the present invention.

[0120] It should be noted that, in the absence of conflict, the embodiments of the present invention and the features and technical solutions in the embodiments may be combined with each other.

[0121] like Figure 1 As shown, the present invention proposes a reliability and security testing method for a multi-modal cryptographic product.

[0122] A reliability and security testing method for a polymorphic cryptographic product, comprising:

[0123] The cryptographic products to be tested are subjected to initial testing and multi-group test in a preset order.

[0124] The initial test includes: operation test, random number comparison test and security test;

[0125] The multi-component tests include: constant pressure high and low temperature test, variable temperature test, constant humidity and heat test, low air pressure test, impact test, light test, vibration test, drop test and aging test;

[0126] If any of the initial test and the multi-component test fails, the reliability and security test of the cryptographic product will fail;

[0127] In the initial testing described,

[0128] The operation detection includes:

[0129] Run the cryptographic product to be tested according to the product manual;

[0130] If it runs normally, enter the password to run the test data;

[0131] If it cannot run normally, the test will be terminated and the output will be that the test failed.

[0132] After inputting the prepared password running test data, grab the output data; compare the output data with the prepared password running test data to determine whether the password calculation is correct;

[0133] If correct, the cryptographic performance is calculated based on the output data;

[0134] If there is an error, the test is terminated and the output is that the test failed;

[0135] Calculate the cryptographic performance based on the output data, and compare the calculated performance with the cryptographic performance;

[0136] If the difference between the computational performance and the cryptographic performance exceeds the permissible range, the output operation test fails;

[0137] If the difference between the computing performance and the cryptographic performance does not exceed the allowable range, the output operation test passes, and a random number comparison test is performed;

[0138] The random number comparison test includes:

[0139] Obtain the random numbers output by the cryptographic product and perform a random number qualification test on the random numbers; perform a random number qualification test on the cryptographic product in accordance with the documents GM / T0005 and GM / T 0062;

[0140] If the test fails, the random number comparison test fails;

[0141] If the test is qualified, the random number comparison test is passed, and the security test is performed;

[0142] The safety test includes:

[0143] Check whether the cryptographic product and its supporting environment have a physical shell;

[0144] If there is a physical shell, detect whether the external physical object can pass through the physical shell of the cryptographic product and directly contact the cryptographic components inside the cryptographic product;

[0145] If the password component can be directly contacted, the security check is terminated and the security check failure is output;

[0146] If not, check the physical enclosure for trace coating, tamper response and zeroing circuits, tamper detection and response envelopes;

[0147] If any of the trace coating, disassembly response and zeroing circuit, disassembly detection and response envelope is true, the output safety test fails;

[0148] The safety test passes if the trace coating, disassembly response and zeroing circuits, disassembly detection and response envelope are each present.

[0149] Furthermore, the constant high and low temperature test includes:

[0150] S201, obtaining an upper limit value and a lower limit value of the working temperature of the cryptographic product to be tested;

[0151] S202, adjusting the ambient temperature of the test environment to an upper limit value or a lower limit value;

[0152] S203, when the ambient temperature is stable, placing the cryptographic product in the test environment and continuously operating it for a first preset time;

[0153] S204, during continuous operation, the cryptographic product is initially tested. If any test item in the initial test fails, the constant high and low temperature test fails;

[0154] S205, placing the password product in a standard environment until the temperature of the password product stabilizes;

[0155] S206, adjusting the ambient temperature of the test environment to above the upper limit or below the lower limit;

[0156] S207, when the ambient temperature is stable, placing the cryptographic product in the test environment and continuously operating it for a first preset time;

[0157] S208. During continuous operation, the cryptographic product is initially tested. If any item in the initial test fails, the constant high and low temperature test fails.

[0158] Further, the variable temperature test includes:

[0159] S211, adjusting the ambient temperature of the test environment to a low temperature, placing the cryptographic product in the test environment for continuous exposure and continuous operation; the low temperature is the lower limit of the working temperature of the cryptographic product to be tested; the continuous operation time is not less than 30 minutes;

[0160] S212, raising the ambient temperature to the upper limit of the working temperature; keeping the cryptographic product to be tested continuously exposed and continuously running; the amplitude of the temperature increase is 10°C / minute or the temperature increase is a fluctuating increase;

[0161] S213, when the ambient temperature rises, the cryptographic product is initially tested. If any test in the initial test fails, the variable temperature test fails;

[0162] S214, placing the cryptographic product in a standard environment until the temperature of the cryptographic product stabilizes;

[0163] S215. Place the cryptographic product in a test environment and lower the ambient temperature to the lower limit of the operating temperature; the temperature reduction amplitude is 10°C / minute or the temperature reduction is a fluctuating reduction;

[0164] S216: The cryptographic product is continuously exposed and continuously operated; the continuous operation time is not less than 30 minutes;

[0165] S217. When the ambient temperature decreases, an initial test is performed on the cryptographic product. If any item in the initial test fails, the variable temperature test fails.

[0166] Furthermore, the constant damp heat test includes:

[0167] S221. Adjust the humidity and temperature of the test environment to the specified humidity and temperature according to the product manual of the cryptographic product to form a hot and humid environment;

[0168] S222. The cryptographic product to be tested is continuously exposed and operated in a hot and humid environment;

[0169] S223. Perform an initial test on the cryptographic product to be tested running in a damp and hot environment. If any test item in the initial test fails, the constant damp and hot test fails.

[0170] Furthermore, the low pressure test includes:

[0171] S231. Adjust the air pressure of the test environment to the minimum working air pressure in the product manual of the cryptographic product;

[0172] S232, placing the cryptographic product to be tested in a test environment; powering on the cryptographic product to be tested, and continuously running it for a specified time;

[0173] S233. Remove the cryptographic product from the test environment and place it under standard atmospheric pressure, or restore the air pressure to standard atmospheric pressure using a testing tool;

[0174] S233, restoring the cryptographic product under standard atmosphere, wherein the restoration time is 1h≦restoration time≦2h;

[0175] S234. Perform an initial test on the cryptographic product to be tested. If any item in the initial test fails, the low pressure test fails.

[0176] Furthermore, the impact test includes:

[0177] S241, applying impacts of preset impact strengths in the directions of three orthogonal axes of the password product to be tested in sequence; applying multiple impacts in the directions of the three orthogonal axes;

[0178] S242. After the impact in the directions of the three orthogonal axes is completed, the cryptographic product is immediately subjected to an initial test. If any item in the initial test fails, the impact test fails.

[0179] Furthermore, the illumination test includes:

[0180] S251. Check whether the light protection film of the password product to be tested is intact:

[0181] If there is any defect, the test fails;

[0182] If it is intact, then test the light intensity;

[0183] S252. Select a standard light source, set different light intensities, and continuously illuminate the hardware password product at a preset angle for a preset time; detect whether there is any color change of the light protection film;

[0184] If the color of the light protection film changes, the output test is unqualified, and the degree and location of the change of the light protection film are recorded;

[0185] If the color of the protective film does not change when exposed to light, perform an initial test;

[0186] S253. Perform an initial test on the cryptographic product. If any item in the initial test fails, the illumination test fails.

[0187] Furthermore, the vibration test includes:

[0188] S261, applying sinusoidal vibration to the password product within a preset vibration time period;

[0189] The axis number and vibration position of the sinusoidal vibration are implemented according to the product manual of the password product;

[0190] The password product is subjected to sinusoidal vibration in the following directions: the password product is subjected to vibration in sequence on three mutually perpendicular sinusoidal vibration axes;

[0191] S262. Conduct vibration durability test on cryptographic products within the specified frequency range;

[0192] The vibration durability test is:

[0193] The frequency sweep endurance test is adopted to sweep the password product for a second preset time by setting a frequency within a preset range, a sweep frequency within a preset range, and an amplitude within a preset range;

[0194] or

[0195] The vibration durability test is:

[0196] A fixed frequency endurance test is adopted, by continuously inputting frequency to the password product at a predetermined frequency and a preset amplitude within a second preset time; the preset frequency is a central resonance frequency or an approximately fixed frequency;

[0197] S263. After completing the sinusoidal vibration and vibration endurance tests, place the cryptographic product in the same test environment as during the initial test;

[0198] S264. Perform an initial test on the cryptographic product to be tested. If any item in the initial test fails, the vibration test fails.

[0199] Furthermore, the drop test includes:

[0200] S271. Perform a surface drop test on the cryptographic product to be tested;

[0201] Place the password product on the test bench so that the bottom surface of the password product forms a preset angle with the test bench, and then let the password product fall freely on the test bench.

[0202] S272. Perform an angle drop test on the cryptographic product to be tested;

[0203] Place the password product in the position of normal use, use wooden stakes or other available equipment to make one corner of the password product present a specified height, and the other corner of the adjacent side present another different specified height. The difference between the two heights should comply with the provisions of the relevant specifications. Raise the password product around the edge between the two corners to a certain height or make the password product form a specified angle with the test table, usually taking the smaller value of the two. Let the password product fall freely on the test table, and the four corners of the password product should be subjected to a drop test.

[0204] S273: Perform a tipping (or pushing down) test on the cryptographic product to be tested

[0205] Place the password product in the position of normal use, tilt it around one bottom edge to guide it into an unstable position, and then let it turn over freely from this position to the adjacent side. A tipping test should be carried out on all four bottom edges.

[0206] S274. Perform a free drop test on the cryptographic product to be tested

[0207] According to the relevant regulations, select the drop height. The test height should be the vertical distance between the lowest position of the password product and the test table. Release the password product to minimize interference and complete the free fall. The free fall process can be repeated to test the password product a specified number of times.

[0208] S275. Perform an initial test on the cryptographic product to be tested. If any item in the initial test fails, the drop test fails.

[0209] Furthermore, the aging test includes:

[0210] Select one of the thermal acceleration factor aging test, comprehensive thermal acceleration factor aging test and Hallberg Peck model aging test to age the cryptographic product under test;

[0211] After aging, the cryptographic product to be tested is subjected to an initial test. If any test in the initial test fails, the aging test fails;

[0212] The thermal acceleration factor aging test includes: aging the cryptographic product to be tested using a heating factor effect, and the expression of the heating factor is:

[0213] AF=exp{(Ea / k)·[(1 / Tu)-(1 / Tt)]};

[0214] Where:

[0215] AF: thermal acceleration factor;

[0216] Ea: Activation energy; the value of activation energy is between 0.3eV and 1.2eV. Electronic products usually choose Ea values ​​between 0.6eV and 0.7eV

[0217] K: Boltzmann constant, its value is 8.617385×10^-5;

[0218] Tu: Temperature value under non-accelerated state under use conditions, in K (Kelvin);

[0219] Tt: Temperature value under accelerated state under test conditions, in K (Kelvin);

[0220] The comprehensive thermal acceleration factor aging test includes: obtaining a second thermal acceleration factor by comprehensively considering temperature and humidity factors, aging the cryptographic product to be tested by the second thermal acceleration factor, and the expression of the second thermal acceleration factor after comprehensively considering temperature and humidity factors is:

[0221] AF2=exp{(Ea / k)·[(1 / Tu)-(1 / Tt)]+(RHt ∧ n-RHu ∧ n)}

[0222] Where:

[0223] AF2: second thermal acceleration factor;

[0224] RHu: Relative humidity value under use conditions (non-accelerated state);

[0225] RHt: Relative humidity value under test conditions (accelerated state);

[0226] n: Humidity acceleration rate constant, this value is usually between 2 and 3, depending on the material and environmental conditions.

[0227] The Hallberg Peck model aging test includes: using the Hallberg Peck model to reconstruct the thermal acceleration factor to obtain a third thermal acceleration factor, aging the product code to be tested, and the expression of the third thermal acceleration factor is:

[0228] AF3=(+(RHt / RHu)3·exp{(Ea / k)·[(1 / Tu)-(1 / Tt)]}

[0229] in:

[0230] AF3: Third thermal acceleration factor.

[0231] In some specific embodiments, a heat accelerated factor aging test is selected to age the cryptographic product; a high temperature test of 105°C is required for a certain cryptographic product;

[0232] At this time, the activation energy Ea of the selected product is 0.68;

[0233] According to the product manual of the cryptographic product, the service life requirement for the product is 10 years. Now, 5 cryptographic products of the same model to be tested are obtained; at this time, Tt = 25°C, and the thermal acceleration factor AF can be obtained:

[0234] AF=exp{[0.68 / (8.617385*10^-5)]·{[1 / (273+25)]-[1 / (273+105)]}}

[0235] It can be concluded that AF≈271.9518;

[0236] We also know that its target service life is 10 years; Ltarget = 10y = 10*365*24h = 87600h

[0237] So we can calculate:

[0238] Ltest = Ltarget / AF = 87600 / 271.9518h = 322.1159h ≈ 23h

[0239] Now 5 samples are tested at the same time, and the test duration is:

[0240] L final = 323 / 5h = 65h

[0241] This means that if a customer tests five products at the same time at 105°C for 65 hours and no product failure occurs, it means that the product's service life has met the requirements and the cryptographic product has passed the aging test.

[0242] The above embodiments only express preferred implementation modes, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present invention. It should be pointed out that, for ordinary technicians in this field, several modifications and improvements can be made without departing from the concept of the present invention, and these all belong to the protection scope of the present invention.

Claims

1. A reliability and security testing method for a multi-modal cryptographic product, comprising: The cryptographic products to be tested are subjected to initial testing and multi-group test in a preset order. The initial test includes: operation test, random number comparison test and security test; The multi-component tests include: constant pressure high and low temperature test, variable temperature test, constant humidity and heat test, low air pressure test, impact test, light test, vibration test, drop test and aging test; If any of the initial test and the multi-component test fails, the reliability and security test of the cryptographic product will fail; In the initial testing described, The operation detection includes: Run the cryptographic product to be tested according to the product manual; If it runs normally, enter the password to run the test data; If it cannot run normally, the test will be terminated and the output will be that the test failed. After inputting the prepared password running test data, grab the output data; compare the output data with the prepared password running test data to determine whether the password calculation is correct; If correct, the cryptographic performance is calculated based on the output data; If there is an error, the test is terminated and the output is that the test failed; Calculate the cryptographic performance based on the output data, and compare the calculated performance with the cryptographic performance; If the difference between the computational performance and the cryptographic performance exceeds the permissible range, the output operation test fails; If the difference between the computing performance and the cryptographic performance does not exceed the allowable range, the output operation test passes, and a random number comparison test is performed; The random number comparison test includes: Obtain the random number output by the cryptographic product and perform a random number qualification test on the random number; If the test fails, the random number comparison test fails; If the test is qualified, the random number comparison test is passed, and the security test is performed; The safety test includes: Check whether the cryptographic product and its supporting environment have a physical shell; If there is a physical shell, the trace coating or photosensitive coating is used to detect whether the external physical object can pass through the physical shell of the cryptographic product and directly contact the cryptographic components inside the cryptographic product; If the password component can be directly contacted, the security check is terminated and the security check failure is output; If not, check the physical enclosure for trace coating, tamper response and zeroing circuits, tamper detection and response envelopes; If any of the trace coating, disassembly response and zeroing circuit, disassembly detection and response envelope is true, the output safety test fails; The safety test passes if the trace coating, disassembly response and zeroing circuits, disassembly detection and response envelope are each present.

2. The reliability and security testing method of a polymorphic cryptographic product according to claim 1, characterized in that: The constant high and low temperature test includes: S201, obtaining an upper limit value and a lower limit value of the working temperature of the cryptographic product to be tested; S202, adjusting the ambient temperature of the test environment to an upper limit value or a lower limit value; S203, when the ambient temperature is stable, placing the cryptographic product in the test environment and continuously operating it for a first preset time; S204, during continuous operation, the cryptographic product is initially tested. If any test item in the initial test fails, the constant high and low temperature test fails; S205, placing the password product in a standard environment until the temperature of the password product stabilizes; S206, adjusting the ambient temperature of the test environment to above the upper limit or below the lower limit; S207, when the ambient temperature is stable, placing the cryptographic product in the test environment and continuously operating it for a first preset time; S208. During continuous operation, the cryptographic product is initially tested. If any item in the initial test fails, the constant high and low temperature test fails.

3. The reliability and security testing method of a polymorphic cryptographic product according to claim 1, characterized in that: The variable temperature test includes: S211, adjusting the ambient temperature of the test environment to a low temperature, placing the cryptographic product in the test environment for continuous exposure and continuous operation; the low temperature is the lower limit of the working temperature of the cryptographic product to be tested; the continuous operation time is not less than 30 minutes; S212, raising the ambient temperature to the upper limit of the working temperature; keeping the cryptographic product to be tested continuously exposed and continuously running; the temperature increase amplitude is 10°C / minute or the temperature increase is a fluctuating increase; S213, when the ambient temperature rises, the cryptographic product is initially tested. If any test in the initial test fails, the variable temperature test fails; S214, placing the cryptographic product in a standard environment until the temperature of the cryptographic product stabilizes; S215. Place the cryptographic product in a test environment and lower the ambient temperature to the lower limit of the operating temperature; the temperature reduction amplitude is 10°C / minute or the temperature reduction is a fluctuating reduction; S216: The cryptographic product is continuously exposed and continuously operated; the continuous operation time is not less than 30 minutes; S217. When the ambient temperature decreases, an initial test is performed on the cryptographic product. If any item in the initial test fails, the variable temperature test fails.

4. The reliability and security testing method of a polymorphic cryptographic product according to claim 1, characterized in that: The steady state damp heat test includes: S221. Adjust the humidity and temperature of the test environment to the specified humidity and temperature according to the product manual of the cryptographic product to form a hot and humid environment; S222. The cryptographic product to be tested is continuously exposed and operated in a hot and humid environment; S223. Perform an initial test on the cryptographic product to be tested running in a damp and hot environment. If any test item in the initial test fails, the constant damp and hot test fails.

5. The reliability and security testing method of a polymorphic cryptographic product according to claim 1, characterized in that: The low pressure test includes: S231. Adjust the air pressure of the test environment to the minimum working air pressure in the product manual of the cryptographic product; S232, placing the cryptographic product to be tested in a test environment; powering on the cryptographic product to be tested, and continuously running it for a specified time; S233. Remove the cryptographic product from the test environment and place it under standard atmospheric pressure, or restore the air pressure to standard atmospheric pressure using a testing tool; S233, restoring the cryptographic product under standard atmosphere, wherein the restoration time is 1h≦restoration time≦2h; S234. Perform an initial test on the cryptographic product to be tested. If any item in the initial test fails, the low pressure test fails.

6. The reliability and security testing method of a polymorphic cryptographic product according to claim 1, characterized in that: The impact test includes: S241, applying impacts of preset impact strengths in the directions of three orthogonal axes of the password product to be tested in sequence; applying multiple impacts in the directions of the three orthogonal axes; S242. After the impact in the directions of the three orthogonal axes is completed, the cryptographic product is immediately subjected to an initial test. If any item in the initial test fails, the impact test fails.

7. The reliability and security testing method of a polymorphic cryptographic product according to claim 1, characterized in that: The lighting test includes: S251. Check whether the light protection film of the password product to be tested is intact: If there is any defect, the test fails; If it is intact, then test the light intensity; S252. Select a standard light source, set different light intensities, and continuously illuminate the hardware password product at a preset angle for a preset time; detect whether there is any color change of the light protection film; If the color of the light protection film changes, the output test is unqualified, and the degree and location of the change of the light protection film are recorded; If the color of the protective film does not change when exposed to light, perform an initial test; S253. Perform an initial test on the cryptographic product. If any item in the initial test fails, the illumination test fails.

8. The reliability and security testing method of a polymorphic cryptographic product according to claim 1, characterized in that: The vibration test includes: S261, applying sinusoidal vibration to the password product within a preset vibration time period; The axis number and vibration position of the sinusoidal vibration are implemented according to the product manual of the password product; The password product is subjected to sinusoidal vibration in the following directions: the password product is subjected to vibration in sequence on three mutually perpendicular sinusoidal vibration axes; S262. Conduct vibration durability test on cryptographic products within the specified frequency range; The vibration durability test is: The frequency sweep endurance test is adopted to sweep the password product for a second preset time by setting a frequency within a preset range, a sweep frequency within a preset range, and an amplitude within a preset range; or The vibration durability test is: A fixed frequency endurance test is adopted, by continuously inputting frequency to the password product at a predetermined frequency and a preset amplitude within a second preset time; the preset frequency is a central resonance frequency or an approximately fixed frequency; S263. After completing the sinusoidal vibration and vibration endurance tests, place the cryptographic product in the same test environment as during the initial test; S264. Perform an initial test on the cryptographic product to be tested. If any item in the initial test fails, the vibration test fails.

9. The reliability and security testing method of a polymorphic cryptographic product according to claim 1, characterized in that: The drop test includes: S271. Perform a surface drop test on the cryptographic product to be tested; Place the password product on the test bench so that the bottom surface of the password product forms a preset angle with the test bench, and then let the password product fall freely on the test bench. S272. Perform an angle drop test on the cryptographic product to be tested; Place the password product in the position of normal use, use wooden stakes or other available equipment to make one corner of the password product present a specified height, and the other corner of the adjacent side present another different specified height. The difference between the two heights should comply with the provisions of the relevant specifications. Raise the password product around the edge between the two corners to a certain height or make the password product form a specified angle with the test table, usually taking the smaller value of the two. Let the password product fall freely on the test table, and the four corners of the password product should be subjected to a drop test. S273. Perform a tip-over test on the cryptographic product to be tested Place the password product in the position of normal use, tilt it around one bottom edge to guide it into an unstable position, and then let it turn over freely from this position to the adjacent side. A tipping test should be carried out on all four bottom edges. S274. Perform a free drop test on the cryptographic product to be tested According to the relevant regulations, select the drop height. The test height should be the vertical distance between the lowest position of the password product and the test table. Release the password product to minimize interference and complete the free fall. The free fall process can be repeated to test the password product a specified number of times. S275. Perform an initial test on the cryptographic product to be tested. If any item in the initial test fails, the drop test fails.

10. The reliability and security testing method of a polymorphic cryptographic product according to claim 1, characterized in that: The aging test includes: Select one of the thermal acceleration factor aging test, comprehensive thermal acceleration factor aging test and Hallberg Peck model aging test to age the cryptographic product under test; After aging, the cryptographic product to be tested is subjected to an initial test. If any test in the initial test fails, the aging test fails; The thermal acceleration factor aging test includes: aging the cryptographic product to be tested using a heating factor effect, and the expression of the heating factor is: AF=exp{(Ea / k)·[(1 / Tu)-(1 / Tt)]}; Where: AF: thermal acceleration factor; Ea: activation energy; K: Boltzmann constant, its value is 8.617385×10^-5; Tu: Temperature value under non-accelerated state under use conditions, in K (Kelvin); Tt: Temperature value under accelerated state under test conditions, in K (Kelvin); The comprehensive thermal acceleration factor aging test includes: obtaining a second thermal acceleration factor by comprehensively considering temperature and humidity factors, aging the cryptographic product to be tested by the second thermal acceleration factor, and the expression of the second thermal acceleration factor after comprehensively considering temperature and humidity factors is: AF2=exp{(Ea / k)·[(1 / Tu)-(1 / Tt)]+(RHt ∧ n-RHu ∧ n)} Where: AF2: second thermal acceleration factor; RHu: Relative humidity value under use conditions (non-accelerated state); RHt: Relative humidity value under test conditions (accelerated state); n: humidity acceleration rate constant, between 2 and 3. The Hallberg Peck model aging test includes: using the Hallberg Peck model to reconstruct the thermal acceleration factor to obtain a third thermal acceleration factor, aging the product code to be tested, and the expression of the third thermal acceleration factor is: AF3=(+(RHt / RHu)3·exp{(Ea / k)·[(1 / Tu)-(1 / Tt)]} in: AF3: Third thermal acceleration factor.

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