Full-automatic test system and method compatible with irradiation tests of multiple types of components

Abstract

The invention relates to a full-automatic test system and method compatible with multi-type component irradiation tests, and the system comprises an irradiation main control board, an irradiation test board and an irradiation load board which are disposed in an irradiation room and are connected through a cable, and an electronic load, a programmable power supply, an upper computer and a digital oscilloscope which are disposed in a test preparation room. The system can compatibly support the irradiation test of the total dose effect and the single event effect, is suitable for the rapid assessment demand of multiple types of COTS components on a large scale, and can meet the urgent demand of the commercial spaceflight field for the evaluation of the radiation resistance of the COTS components.

Description

Technical Field

[0001] The present application relates to the field of radiation testing technology, and in particular to a fully automatic testing system and method that is compatible with radiation testing of multiple types of components. Background Art

[0002] Components in space will be affected by space radiation particles, and radiation effects such as total ionizing dose (TID) and single event effects (SEE) will occur, causing performance degradation or even failure of components, and ultimately leading to satellite malfunction or loss of connection. With the rapid development of commercial aerospace, Commercial Off-The-Shelf (COTS) components have been widely used in satellite design due to their excellent performance, low cost, and short delivery cycle. However, COTS components usually lack sufficient radiation data, so they must be fully tested for radiation resistance before being used in satellites.

[0003] Traditional irradiation assessment methods usually design dedicated irradiation test circuits for specific components, and rely on multiple power supplies, desktop multimeters and other equipment during the test to support the simultaneous assessment of multiple devices. This method has the following shortcomings: First, it is inefficient: in the face of the assessment needs of large quantities and multiple types of components, it is necessary to design different test circuits for each device and perform complex wiring configurations, which seriously slows down the assessment progress. Second, it has a single function: traditional methods usually only test a single irradiation effect (such as TID or SEE) and lack the ability to support multiple irradiation effect assessments in the same system. Third, equipment redundancy: a large number of external devices need to be carried during the test, which increases the complexity of the system and the difficulty of operation.

[0004] Therefore, there is an urgent need for an efficient and integrated radiation test system that is compatible with radiation tests that support total dose effects and single particle effects, and can adapt to the rapid assessment needs of large quantities and multiple types of components, so as to meet the urgent needs of the commercial aerospace field for the evaluation of the radiation resistance of COTS components. Summary of the invention

[0005] Based on this, it is necessary to provide a fully automatic testing system and method that is compatible with radiation testing of multiple types of components to address the above technical issues.

[0006] A fully automatic test system compatible with irradiation tests of multiple types of components, the system comprising: an irradiation main control board, an irradiation test board and an irradiation load board placed in an irradiation room and connected by cables, and an electronic load, a programmable power supply and a host computer placed in a test preparation room;

[0007] Among them, when conducting the total dose irradiation assessment test, the irradiation test board and the irradiation load board are fixed on the platform facing the irradiation source, and the irradiation main control board is covered with lead blocks to shield the total dose irradiation effect; when conducting the single particle irradiation assessment test, the irradiation test board and the irradiation load board are fixed on the three-dimensional mobile platform, the irradiation main control board is directly placed next to the three-dimensional mobile platform, and the components stored on the irradiation test board are moved to the beam outlet of the irradiation source through the three-dimensional mobile platform;

[0008] The irradiation main control board is connected to the host computer and the program-controlled power supply respectively, and is used to control the output voltage of the program-controlled power supply to adaptively convert and output the voltage required for irradiation assessment tests of different types of components according to the control instructions received from the host computer, and collect the data of each component in real time and feed it back to the host computer;

[0009] The irradiation test board is used to store various types of components and configure the test circuits of different types of components according to the requirements of the irradiation test;

[0010] The irradiation load board and electronic load are used to provide resistance loads for various types of components to conduct irradiation tests under full load, half load or no load during and before and after the irradiation test.

[0011] The host computer is used to adjust the component test parameter configuration, control the test process and display the test results in the whole process of the irradiation assessment test;

[0012] The system also includes a digital oscilloscope placed in the test preparation room, which is connected to the output ports of each component on the irradiation test board and the host computer respectively. It is used to detect and identify the single-particle transient changes, single-particle functional interruptions and single-particle burning self-recording of each component in the single-particle irradiation assessment test and feed back to the host computer.

[0013] Furthermore, the irradiation main control board is connected to the host computer through a network cable or a 422 communication line, and is connected to the programmable power supply through an independent cable; the irradiation main control board is composed of an FPGA, a storage module, a voltage conversion module, a clock module, a crystal oscillator module, and a voltage and current monitoring module;

[0014] Among them, FPGA is used to control the voltage conversion module to perform voltage adaptive conversion according to the control instructions received from the host computer;

[0015] The storage module is used to store the component data collected in real time;

[0016] The voltage conversion module is used to adaptively convert the output voltage of the received programmable power supply into the voltage required for the irradiation assessment test of different types of components according to the control instructions;

[0017] The clock module and crystal oscillator module are both connected to the irradiation test board, and are used to provide timing signals and high-stability frequency sources for each component on the irradiation test board according to the test requirements, so as to ensure that the irradiation assessment tests of each component are carried out synchronously;

[0018] The voltage and current monitoring module is connected to the irradiation test board and is used to monitor the output voltage and current of each component in real time during the irradiation assessment test.

[0019] Furthermore, the host computer is connected to the programmable power supply via a network cable. The host computer reads the programmable power supply information to perform real-time monitoring of the input voltage, output voltage and output current of each component, and cuts off the power supply of the corresponding component when it detects that the output current exceeds a preset threshold.

[0020] Furthermore, when the radiation assessment test is performed on the same group of components, the radiation load board and the electronic load provide a resistance load with the same resistance value. At the beginning of the radiation assessment test, the electronic load in the system is replaced by the radiation load board; after the radiation assessment test, the radiation load board in the system is replaced by the electronic load.

[0021] Furthermore, the host computer is specifically used for: before the irradiation assessment test, automatically configuring and adjusting the test parameters of different types of components according to the test requirements, and opening the corresponding channels for the irradiation assessment test; during the irradiation assessment test, controlling the test process in real time, and automatically collecting test data for data analysis; after the irradiation assessment test, judging the radiation resistance of different types of components and presenting them visually through test data playback and comparative analysis of data before and after the irradiation assessment test.

[0022] Furthermore, when conducting a total dose irradiation assessment test, the host computer configures the test parameters of different types of components according to the requirements of the total dose irradiation assessment test, and opens the channels corresponding to all components on the irradiation test board to conduct the total dose irradiation assessment test; when conducting a single particle irradiation assessment test, the host computer configures the test parameters of different types of components according to the requirements of the single particle irradiation assessment test, and opens the channels corresponding to the assessment components currently selected on the irradiation test board to participate in this round of single particle irradiation assessment test to conduct the single particle irradiation assessment test.

[0023] A fully automatic testing method compatible with irradiation tests of multiple types of components, the method is based on the above-mentioned fully automatic testing system compatible with irradiation tests of multiple types of components to perform a total dose irradiation assessment test, comprising the following steps:

[0024] Step 1: Use a host computer to test different types of components under different resistance conditions to obtain component data before irradiation;

[0025] Step 2: Replace the electronic load with an irradiation load board and prepare for total dose irradiation assessment tests of different types of components at full load, half load or no load;

[0026] Step 3, setting up the test environment, specifically including: placing the irradiation main control board, irradiation test board and irradiation load board in the irradiation room, fixing the irradiation test board and irradiation load board on a platform facing the irradiation source, and covering the irradiation main control board with lead blocks to shield the influence of total dose irradiation; placing the electronic load, programmable power supply and host computer in the test preparation room;

[0027] Step 4: Before the total dose irradiation assessment test, configure the test parameters of different types of components according to the total dose irradiation assessment test requirements, and open the channels corresponding to all components on the irradiation test board to perform the total dose irradiation assessment test;

[0028] Step 5: During the total dose irradiation assessment test, the host computer controls the test process in real time and automatically collects test data for data analysis;

[0029] Step 6: After the total dose irradiation assessment test, the irradiated load board is replaced with an electronic load, and different types of components are retested under different resistance conditions through the host computer to obtain the component data after irradiation;

[0030] Step 7, determine whether the total dose irradiation assessment test of all components is completed. If not, replace a new irradiation test board to store a new group of components, and return to step 1 to perform a pre-irradiation test of the new group of components until the total dose irradiation assessment test of all components is completed;

[0031] Step 8: Replay the test data of all components through the host computer, compare and analyze the data before and after the total dose irradiation assessment test, obtain the total dose radiation resistance of all components and present it visually.

[0032] A fully automatic testing method compatible with irradiation tests of multiple types of components, the method is based on the above-mentioned fully automatic testing system compatible with irradiation tests of multiple types of components to perform a single particle irradiation assessment test, comprising the following steps:

[0033] S1, depackaging components;

[0034] S2, using the host computer to test different types of components under different resistance conditions to obtain component data before irradiation;

[0035] S3, replace the electronic load with an irradiation load board, and prepare to conduct single particle irradiation assessment tests of different types of components under full load, half load or no load;

[0036] S4, setting up the test environment, specifically including: placing the irradiation main control board, irradiation test board and irradiation load board in the irradiation room, fixing the irradiation test board and irradiation load board on the three-dimensional mobile platform, and placing the irradiation main control board directly next to the three-dimensional mobile platform; placing the electronic load, programmable power supply, host computer and digital oscilloscope in the test preparation room;

[0037] S5, select some components in the irradiation test board as assessment components to participate in this round of single particle irradiation assessment test;

[0038] S6, before the single particle irradiation assessment test, configure the test parameters of the assessment components according to the single particle irradiation assessment test requirements, open the channels corresponding to the assessment components to perform the single particle irradiation assessment test, and at the same time move the assessment components on the irradiation test board to the beam outlet of the irradiation source through the three-dimensional mobile platform;

[0039] S7, during the single particle irradiation assessment test, the host computer controls the test process in real time, automatically collects test data for data analysis, and uses a digital oscilloscope to detect and identify the single particle transient changes, single particle function interruptions, and single particle burnouts of each component and record them automatically and feed them back to the host computer;

[0040] S8, judging whether the single particle irradiation assessment test of all components is completed. If not, returning to S5 to reselect new assessment components for test parameter configuration, opening the channel corresponding to the new assessment components for single particle irradiation assessment test, and moving the new assessment components to the beam outlet of the irradiation source through the three-dimensional mobile platform until the single particle irradiation assessment test of all components is completed;

[0041] S9, through the host computer, the test data of all components are played back, and the data before and after the single particle irradiation assessment test are compared and analyzed to obtain the single particle radiation resistance of all components and present it visually.

[0042] The above-mentioned fully automatic testing system and method compatible with radiation testing of multiple types of components have the following beneficial effects compared with the prior art:

[0043] 1. This application can meet the needs of rapid assessment of the radiation resistance of large-scale and multi-type COTS components by targeted configuration of assessment circuits for multiple different types of stored COTS components and adaptive conversion output of the voltage required for the assessment, thereby greatly improving the efficiency of radiation assessment of components.

[0044] 2. This application uses the host computer to configure the parameters of the corresponding devices and open the channels according to the requirements of the assessment test of different irradiation effects, so as to realize the irradiation assessment test compatible with the total dose effect and the single particle effect in the same system, thereby improving the test efficiency and the versatility of the system. In addition, by moving the three-dimensional mobile platform, the assessment components participating in each round of the single particle irradiation assessment test are moved to the beam outlet of the irradiation source, so that the single particle irradiation assessment test of multiple types of components can be carried out simultaneously.

[0045] 3. The present application utilizes highly integrated panels to perform irradiation control, testing, and load provision respectively, without the need to carry a large amount of test equipment. During the irradiation test, the irradiation load board is used to replace the electronic load, which can ensure that all panels can be placed in the irradiation room, reducing the complexity of the system structure and the difficulty of operation. BRIEF DESCRIPTION OF THE DRAWINGS

[0046] Figure 1 It is a structural schematic diagram of a fully automatic testing system compatible with radiation tests of multiple types of components in one embodiment;

[0047] Figure 2 A schematic diagram of a total dose irradiation test flow in one embodiment;

[0048] Figure 3 The figure is a schematic diagram of the process of a single particle irradiation assessment test in one embodiment. DETAILED DESCRIPTION

[0049] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0050] In one embodiment, Figure 1 As shown, a fully automatic test system compatible with irradiation tests of multiple types of components is provided, the system comprising: an irradiation main control board, an irradiation test board and an irradiation load board placed in the irradiation room and connected by cables, and an electronic load, a programmable power supply and a host computer placed in the test preparation room.

[0051] Among them, when conducting a total dose irradiation assessment test, the irradiation test board and the irradiation load board are fixed on a platform facing the irradiation source, and the irradiation main control board is covered with lead blocks to shield the influence of the total dose irradiation; when conducting a single particle irradiation assessment test, the irradiation test board and the irradiation load board are fixed on a three-dimensional mobile platform, the irradiation main control board is placed directly next to the three-dimensional mobile platform, and the components stored on the irradiation test board are moved to the beam outlet of the irradiation source through the three-dimensional mobile platform. The particle beam intensity distribution near the beam outlet is usually relatively uniform. Moving the irradiation test board to the beam outlet through the three-dimensional mobile platform can ensure that the irradiation doses received by various areas on the surface of multiple types of assessment components on the test board that participate in each round of single particle irradiation assessment tests and have similar layouts are consistent, so that single particle irradiation assessment tests of multiple types of components can be carried out simultaneously.

[0052] The irradiation main control board is connected to the host computer and the programmable power supply respectively. It is used to control the output voltage of the programmable power supply to adaptively convert the output voltage into the voltage required for irradiation assessment tests of different types of components according to the control instructions received from the host computer, and collect data of each component in real time and feed it back to the host computer.

[0053] The irradiation test board is used to store various types of components and configure the test circuits of different types of components according to the requirements of the irradiation test. Figure 1 As shown, the irradiation test board contains various types of COTS components such as MOS tubes (metal oxide semiconductor field effect transistors), LDOs (low dropout linear regulators), DC / DCs (direct current-to-direct current converters), phase-locked loops, and ADC / DACs (analog-to-digital / digital-to-analog converters).

[0054] The irradiation load board and electronic load are used to provide resistive loads for various types of components to conduct irradiation tests under full load, half load or no load during and before and after the irradiation assessment test.

[0055] The host computer is used to adjust the component test parameter configuration, control the test process and display the test results in the entire process of the irradiation assessment test.

[0056] The system also includes a digital oscilloscope placed in the test preparation room. The digital oscilloscope is connected to the output ports of each component on the irradiation test board through cables, and is connected to the host computer through a network cable. It is used to detect and identify single-particle transient changes, single-particle functional interruptions, and single-particle burning self-recording of each component in the single-particle irradiation assessment test and feed back to the host computer.

[0057] Furthermore, the irradiation main control board is connected to the host computer through a network cable or a 422 communication line, and is connected to the programmable power supply through an independent cable; the irradiation main control board is composed of an FPGA (field programmable gate array), a storage module, a voltage conversion module, a clock module, a crystal oscillator module and a voltage and current monitoring module.

[0058] Among them, FPGA is used to receive the host computer control instructions according to the network port or 422 communication port on the irradiation main control board, and control the voltage conversion module to perform voltage adaptive conversion according to the received host computer control instructions.

[0059] The storage module is used to store component data collected in real time.

[0060] The voltage conversion module is used to adaptively convert the output voltage of the programmable power supply received through the voltage input port on the irradiation main control board into the voltage required for irradiation assessment tests of different types of components according to control instructions, and output it to the corresponding components on the irradiation test board connected through DB-100 through the voltage output port on the irradiation main control board.

[0061] The clock module and crystal oscillator module are both connected to the irradiation test board. According to the test requirements, they provide timing signals and high-stability frequency sources to various components on the irradiation test board through the clock output port and crystal oscillator output port on the irradiation main control board respectively, ensuring that the irradiation assessment tests of various components are carried out synchronously.

[0062] The voltage and current monitoring module is connected to the irradiation test board through the output voltage and current monitoring port on the irradiation main control board, and is used to monitor the output voltage and current of each component in real time during the irradiation assessment test.

[0063] Furthermore, the host computer is connected to the programmable power supply via a network cable. The host computer reads the programmable power supply information to conduct real-time monitoring of the input voltage, output voltage and output current of each component, and automatically cuts off the power supply of the corresponding component when it detects that the output current exceeds the preset threshold, ensuring that it will not affect the radiation assessment test of other channels, thereby improving the safety of radiation assessment tests of multiple types of components.

[0064] Furthermore, when the same group of components are subjected to irradiation assessment tests, the irradiation load board and the electronic load provide a resistance load of the same resistance value. At the beginning of the irradiation assessment test, the electronic load in the system is replaced with the irradiation load board; after the irradiation assessment test, the irradiation load board in the system is replaced with the electronic load. Compared with the electronic load, the irradiation load board is made of low-irradiation sensitive materials, so that it can replace the electronic load in the irradiation room during the irradiation assessment test. While providing load conditions of various resistance values ​​for various types of components, it ensures that its own performance is not affected by irradiation, reduces the test system's dependence on external equipment, simplifies the system structure and improves system reliability.

[0065] Furthermore, the host computer is specifically used for: before the irradiation assessment test, automatically configuring and adjusting the test parameters of different types of components according to the test requirements, and opening the corresponding channels for the irradiation assessment test; during the irradiation assessment test, controlling the test process in real time, and automatically collecting test data for data analysis; after the irradiation assessment test, through the playback of test data and comparative analysis of data before and after the irradiation assessment test, judging the radiation resistance of different types of components (including parameter drift, device failure, etc.) and presenting them visually, such as drawing curve graphs of important parameters of components before and after irradiation and curve graphs of changes of important parameters over time during irradiation.

[0066] Furthermore, when conducting a total dose irradiation assessment test, the host computer configures the test parameters of different types of components according to the total dose irradiation assessment test requirements, and opens the channels corresponding to all components on the irradiation test board for the total dose irradiation assessment test; when conducting a single particle irradiation assessment test, the host computer configures the test parameters of different types of components according to the single particle irradiation assessment test requirements, and opens the channels corresponding to the assessment components currently selected to participate in this round of single particle irradiation assessment test on the irradiation test board for the single particle irradiation assessment test. Among them, the test parameters that need to be configured for the total dose irradiation assessment test and the single particle irradiation assessment test are the same.

[0067] In one embodiment, a fully automatic testing method compatible with irradiation tests of multiple types of components is provided. When the method performs a total dose irradiation assessment test based on the above-mentioned fully automatic testing system compatible with irradiation tests of multiple types of components, as shown in FIG. Figure 2 As shown, the following steps are included:

[0068] Step 1, pre-irradiation testing.

[0069] Connect the host computer and the irradiation main control board through a 20-meter network cable or 422 communication cable, connect the programmable power supply and the irradiation main control board through an independent cable of about 20 meters, and connect the irradiation main control board and the irradiation test board through a DB-100 cable. After connecting the electronic load through the cable, use the host computer to test different types of components under different resistance conditions to obtain the component data before irradiation.

[0070] Step 2, replace the irradiation load board.

[0071] Replace the electronic load with an irradiation load board and prepare to conduct total dose irradiation assessment tests on different types of components at full load, half load or no load.

[0072] Step 3: Set up the test environment.

[0073] Place the irradiation main control board, irradiation test board and irradiation load board in the irradiation room, fix the irradiation test board and irradiation load board on a platform facing the irradiation source, and cover the irradiation main control board with lead blocks to shield the influence of total dose irradiation; place the programmable power supply and host computer connected by network cable in the test preparation room, and place the electronic load connected to the irradiation test board by cable.

[0074] Step 4: Configure device parameters.

[0075] Before the total dose irradiation assessment test, configure the test parameters of different types of components according to the total dose irradiation assessment test requirements, and open the channels corresponding to all components on the irradiation test board to carry out the total dose irradiation assessment test.

[0076] Step 5: Total dose irradiation assessment test.

[0077] During the total dose irradiation assessment test, the host computer controls the test process in real time and automatically collects test data for data analysis. Specifically, the host computer reads the important parameters of all components in real time and automatically generates curves, as well as reads the programmable power supply information, and monitors the input voltage, output voltage and output current of all components in real time; it also sets thresholds in advance, and automatically shuts off the power supply of the corresponding components when the output current exceeds the threshold, ensuring that it will not affect the irradiation assessment test of other channels.

[0078] Step 6, replace the electronic load and test after irradiation.

[0079] After the total dose irradiation assessment test, the irradiation load board is replaced with an electronic load, and different types of components are retested under different resistance conditions through the host computer to obtain the component data after irradiation.

[0080] Step 7: Determine whether all assessments have been completed?

[0081] Determine whether the total dose irradiation assessment test of all components is completed. If not, replace the new irradiation test board to store a new group of components, and return to step 1 to perform pre-irradiation testing of the new group of components until the total dose irradiation assessment test of all components is completed.

[0082] Step 8: Data playback and comparative data analysis.

[0083] Through the host computer, the test data of all components are played back, and the data before and after the total dose irradiation assessment test are compared and analyzed to obtain the total dose radiation resistance of all components and present it visually, including drawing curves of important parameters of components before and after total dose irradiation and curves of important parameters changing with time during total dose irradiation.

[0084] In one embodiment, a fully automatic testing method compatible with irradiation tests of multiple types of components is provided. When the method performs a single particle irradiation assessment test based on the above-mentioned fully automatic testing system compatible with irradiation tests of multiple types of components, such as Figure 3 As shown, the following steps are included:

[0085] S1, depackaging the components.

[0086] Since heavy particles have a short range and cannot penetrate the packaging materials of components, the components need to be decapsulated before the single particle irradiation test for heavy particles. This step is not required if the proton single particle irradiation test is performed.

[0087] S2, pre-irradiation test.

[0088] Connect the host computer and the irradiation main control board through a 20-meter network cable or 422 communication cable, connect the programmable power supply and the irradiation main control board through an independent cable of about 20 meters, and connect the irradiation main control board and the irradiation test board through a DB-100 cable. After connecting the electronic load through the cable, use the host computer to test different types of components under different resistance conditions to obtain the component data before irradiation.

[0089] S3, replace the irradiation load plate.

[0090] Replace the electronic load with an irradiation load board and prepare for single particle irradiation assessment tests of different types of components under full load, half load or no load;

[0091] S4, set up the experimental environment.

[0092] Place the irradiation main control board, irradiation test board and irradiation load board in the irradiation room, fix the irradiation test board and irradiation load board on the three-dimensional mobile platform, and place the irradiation main control board directly next to the three-dimensional mobile platform; place a programmable power supply, a host computer and a digital oscilloscope connected by a network cable in the test preparation room, where the digital oscilloscope is connected to the output ports of each component on the irradiation test board through cables, and place an electronic load connected to the irradiation test board through cables.

[0093] S5, select the components to be tested.

[0094] Some components in the irradiation test board are selected as assessment components to participate in this round of single-particle irradiation assessment test, and the currently selected assessment components are powered by the upper computer-controlled programmable power supply and the irradiation main control board, while other components are not powered for the time being.

[0095] S6, configure device parameters.

[0096] Before the single-particle irradiation assessment test, the test parameters of the assessment components are configured according to the requirements of the single-particle irradiation assessment test, and the channels corresponding to the assessment components are opened for the single-particle irradiation assessment test. At the same time, the assessment components on the irradiation test board are moved to the beam outlet of the irradiation source through the three-dimensional mobile platform. At this time, the assessment components are placed as close as possible during the layout, so that single-particle irradiation assessment tests of multiple assessment components can be carried out at the same time, which greatly improves the assessment test efficiency while ensuring the reliability of the single-particle irradiation assessment test.

[0097] S7, single particle irradiation assessment test.

[0098] During the single-particle irradiation assessment test, the host computer controls the test process in real time, automatically collects test data for data analysis, and uses a digital oscilloscope to detect and identify the single-particle transient changes, single-particle functional interruptions, and single-particle burnout self-recording of each component and feed it back to the host computer. Specifically, the host computer reads the important parameters of all components in real time and automatically generates curves, as well as reads the programmable power supply information, and monitors the input voltage, output voltage, and output current of all components in real time. At the same time, the host computer identifies single-particle transients, single-particle functional interruptions, or single-particle burnout self-recording through a digital oscilloscope; the host computer also sets thresholds in advance, and automatically shuts off the power supply of the corresponding components when the output current exceeds the threshold, etc., to ensure that it will not affect the irradiation assessment test of other channels.

[0099] S8, determine whether all assessments have been completed?

[0100] Determine whether the single particle irradiation assessment test of all components is completed. If not, return to S5 to reselect new assessment components for test parameter configuration, open the channel corresponding to the new assessment component for single particle irradiation assessment test, and move the new assessment component to the beam outlet of the irradiation source through the three-dimensional mobile platform until the single particle irradiation assessment test of all components is completed;

[0101] S9, through the host computer, the test data of all components are played back, and the data before and after the single-particle irradiation assessment test are compared and analyzed to obtain the single-particle radiation resistance of all components and present it visually, including drawing a curve chart of the important parameters changing with time during the single-particle irradiation process.

[0102] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0103] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. A fully automatic testing system compatible with radiation tests of multiple types of components, characterized in that: The system comprises: an irradiation main control board, an irradiation test board and an irradiation load board placed in the irradiation room and connected by cables, and an electronic load, a programmable power supply and a host computer placed in the test preparation room; Wherein, when conducting the total dose irradiation assessment test, the irradiation test board and the irradiation load board are fixed on a platform facing the irradiation source, and the irradiation main control board is covered with lead blocks to shield the influence of the total dose irradiation; when conducting the single particle irradiation assessment test, the irradiation test board and the irradiation load board are fixed on a three-dimensional mobile platform, the irradiation main control board is directly placed next to the three-dimensional mobile platform, and the components stored on the irradiation test board are moved to the beam outlet of the irradiation source through the three-dimensional mobile platform; The irradiation main control board is connected to the host computer and the programmable power supply respectively, and is used to control the output voltage of the programmable power supply to adaptively convert and output the voltage required for irradiation assessment tests of different types of components according to the control instructions received from the host computer, and collect data of each component in real time and feed it back to the host computer; The radiation test board is used to store multiple types of components and configure the assessment circuits of different types of components according to the requirements of the radiation assessment test; The irradiation load board and the electronic load are used to provide resistance loads for various types of components to perform irradiation tests under full load, half load or no load during and before and after the irradiation test. The host computer is used to sequentially adjust component test parameter configuration, control the test process, and display the test results in the entire process of the irradiation assessment test; The system also includes a digital oscilloscope placed in the test preparation room, which is respectively connected to the output ports of each component on the irradiation test board and the host computer, and is used to detect and identify the single-particle transient changes, single-particle function interruptions and single-particle burning self-recording of each component in the single-particle irradiation assessment test and feed back to the host computer.

2. A fully automatic testing system compatible with radiation tests of multiple types of components according to claim 1, characterized in that: The irradiation main control board is connected to the host computer through a network cable or a 422 communication line, and is connected to the programmable power supply through an independent cable; the irradiation main control board is composed of an FPGA, a storage module, a voltage conversion module, a clock module, a crystal oscillator module, and a voltage and current monitoring module; Wherein, the FPGA is used to control the voltage conversion module to perform voltage adaptive conversion according to the received host computer control instruction; The storage module is used to store component data collected in real time; The voltage conversion module is used to adaptively convert the received output voltage of the programmable power supply into the voltage required for the radiation assessment test of different types of components according to the control instructions; The clock module and the crystal oscillator module are both connected to the irradiation test board, and are used to provide timing signals and high-stability frequency sources for each component on the irradiation test board according to the test requirements, so as to ensure that the irradiation assessment tests of each component are carried out synchronously; The voltage and current monitoring module is connected to the radiation test board and is used to monitor the output voltage and current of each component in real time during the radiation assessment test.

3. A fully automatic testing system compatible with radiation tests of multiple types of components according to claim 2, characterized in that: The host computer is connected to the programmable power supply via a network cable. The host computer monitors the input voltage, output voltage and output current of each component in real time by reading the programmable power supply information, and cuts off the power supply of the corresponding component when the output current exceeds a preset threshold.

4. The fully automatic testing system compatible with radiation tests of multiple types of components according to claim 1 is characterized in that: When the radiation assessment test is performed on the same group of components, the radiation load board and the electronic load provide a resistance load with the same resistance value. At the beginning of the radiation assessment test, the electronic load in the system is replaced by the radiation load board; after the radiation assessment test, the radiation load board in the system is replaced by the electronic load.

5. The fully automatic testing system compatible with radiation tests of multiple types of components according to claim 1 is characterized in that: The host computer is specifically used for: Before the irradiation assessment test, the test parameters of different types of components are automatically configured and adjusted according to the test requirements, and the corresponding channels are opened for irradiation assessment tests; during the irradiation assessment test, the test process is controlled in real time, and the test data is automatically collected for data analysis; after the irradiation assessment test, the radiation resistance of different types of components is judged and visualized through test data playback and comparative analysis of data before and after the irradiation assessment test.

6. A fully automatic testing system compatible with radiation tests of multiple types of components according to claim 5, characterized in that: When conducting a total dose irradiation assessment test, the host computer configures the test parameters of different types of components according to the requirements of the total dose irradiation assessment test, and opens the channels corresponding to all components on the irradiation test board to conduct the total dose irradiation assessment test; when conducting a single particle irradiation assessment test, the host computer configures the test parameters of different types of components according to the requirements of the single particle irradiation assessment test, and opens the channels corresponding to the assessment components currently selected on the irradiation test board to participate in this round of single particle irradiation assessment test to conduct the single particle irradiation assessment test.

7. A fully automatic testing method compatible with radiation tests of multiple types of components, characterized in that: The method, based on a fully automatic test system compatible with irradiation tests of multiple types of components as described in any one of claims 1 to 6, comprises the following steps when conducting a total dose irradiation assessment test: Step 1: Use a host computer to test different types of components under different resistance conditions to obtain component data before irradiation; Step 2: Replace the electronic load with an irradiation load board and prepare for total dose irradiation assessment tests of different types of components at full load, half load or no load; Step 3, setting up the test environment, specifically including: placing the irradiation main control board, irradiation test board and irradiation load board in the irradiation room, fixing the irradiation test board and irradiation load board on a platform facing the irradiation source, and covering the irradiation main control board with lead blocks to shield the influence of total dose irradiation; placing the electronic load, programmable power supply and host computer in the test preparation room; Step 4: Before the total dose irradiation assessment test, configure the test parameters of different types of components according to the total dose irradiation assessment test requirements, and open the channels corresponding to all components on the irradiation test board to perform the total dose irradiation assessment test; Step 5: During the total dose irradiation assessment test, the host computer controls the test process in real time and automatically collects test data for data analysis; Step 6: After the total dose irradiation assessment test, the irradiated load board is replaced with an electronic load, and different types of components are retested under different resistance conditions through the host computer to obtain the component data after irradiation; Step 7, determine whether the total dose irradiation assessment test of all components is completed. If not, replace a new irradiation test board to store a new group of components, and return to step 1 to perform a pre-irradiation test of the new group of components until the total dose irradiation assessment test of all components is completed; Step 8: Replay the test data of all components through the host computer, compare and analyze the data before and after the total dose irradiation assessment test, obtain the total dose radiation resistance of all components and present it visually.

8. A fully automatic testing method compatible with radiation tests of multiple types of components, characterized in that: The method, based on a fully automatic test system compatible with radiation tests of multiple types of components as described in any one of claims 1 to 6, comprises the following steps when performing a single particle radiation assessment test: S1, depackaging components; S2, using the host computer to test different types of components under different resistance conditions to obtain component data before irradiation; S3, replace the electronic load with an irradiation load board, and prepare to conduct single particle irradiation assessment tests of different types of components under full load, half load or no load; S4, setting up the test environment, specifically including: placing the irradiation main control board, irradiation test board and irradiation load board in the irradiation room, fixing the irradiation test board and irradiation load board on the three-dimensional mobile platform, and placing the irradiation main control board directly next to the three-dimensional mobile platform; placing the electronic load, programmable power supply, host computer and digital oscilloscope in the test preparation room; S5, select some components in the irradiation test board as assessment components to participate in this round of single particle irradiation assessment test; S6, before the single particle irradiation assessment test, configure the test parameters of the assessment components according to the single particle irradiation assessment test requirements, open the channels corresponding to the assessment components to perform the single particle irradiation assessment test, and at the same time move the assessment components on the irradiation test board to the beam outlet of the irradiation source through the three-dimensional mobile platform; S7, during the single particle irradiation assessment test, the host computer controls the test process in real time, automatically collects test data for data analysis, and uses a digital oscilloscope to detect and identify the single particle transient changes, single particle function interruptions, and single particle burnouts of each component and record them automatically and feed them back to the host computer; S8, judging whether the single particle irradiation assessment test of all components is completed. If not, returning to S5 to reselect new assessment components for test parameter configuration, opening the channel corresponding to the new assessment components for single particle irradiation assessment test, and moving the new assessment components to the beam outlet of the irradiation source through the three-dimensional mobile platform until the single particle irradiation assessment test of all components is completed; S9, through the host computer, the test data of all components are played back, and the data before and after the single particle irradiation assessment test are compared and analyzed to obtain the single particle radiation resistance of all components and present it visually.

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