Chip testing equipment that is easy to pick up and place

Abstract

The present invention relates to the field of chip testing, and in particular to a chip testing device that is easy to pick up and place, including a square punch head and a circuit adapter. In the independent chip testing device that is easy to pick up and place, the independent chip on the carrier is transferred to the bottom of the circuit adapter for testing, and the square punch head and the blown protective gas together form a double layer of protection. When ignition occurs, the electromagnet will immediately bounce the circuit adapter upward away from the independent chip, and at the same time, the square punch head cooperates with the supporting grid to press the ignited independent chip downward from the carrier, so that the ignited independent chip falls downward into the waste soaking box for soaking and extinguishing. The disadvantages of the prior art that, when testing multiple independent chips on the carrier, the independent chips being tested on the carrier ignite, resulting in a large area of ​​independent chips being damaged and forced to be scrapped, and there is a safety hazard of causing fire.

Description

Technical Field

[0001] The present invention relates to the field of chip testing, and in particular to a chip testing device which is convenient for taking and placing. Background Art

[0002] In the process of testing multiple independent chips arrayed on the entire carrier board, it is necessary to transfer the independent chip carrier board to the bottom of the test host, press down the circuit adapter of the test host one by one and electrically connect it to each independent chip, so that the test host and the independent chip form a complete test circuit system through the circuit adapter to perform circuit testing. At the same time, the test host applies a high-power load to the independent chip to test whether the independent chip can withstand the high-power load in a fault state. When an independent chip suddenly ignites during the test because it cannot withstand the high-power load, not only will the independent chip be burned, but the ignition of the independent chip will also endanger other independent chips around the carrier board, thereby causing a large area of ​​independent chips to be damaged and forced to be scrapped, resulting in a large number of independent chips. In addition, the ignition of the independent chip on the carrier board also poses a safety hazard of causing fire, threatening the safety of property equipment and the lives of staff. Summary of the invention

[0003] In order to overcome the disadvantages that independent chips tested on a carrier board may catch fire, resulting in large areas of independent chips being damaged and forced to be scrapped, and there is a potential safety hazard of causing fire, the present invention provides a chip testing device that is easy to take and place.

[0004] The present invention discloses a chip testing device which is easy to take and place, comprising a conveyor machine, a supporting grid, an electric lifting push rod, a hollow plate, a multi-axis moving component, a square punch head, a circuit adapter, a limit rod, a reset spring, an electromagnet, an iron block and a gas conveying component; the conveyor machine is fixedly connected to the supporting grid; the conveyor machine is installed with an electric lifting push rod; the telescopic end of the electric lifting push rod is fixedly connected to the hollow plate; the multi-axis moving component is connected to the hollow plate; the multi-axis moving component is connected to the square punch head; the limit rod is fixedly connected to the square punch head; the limit rod is slidably connected to the circuit adapter, and the circuit adapter is sleeved in the square punch head; the circuit adapter and the limit rod are fixedly connected with a reset spring; the square punch head is installed with an electromagnet; the circuit adapter is installed with an iron block corresponding to the electromagnet; the hollow plate is installed with a gas conveying component for conveying protective gas.

[0005] Furthermore, a waste soaking box aligned with the supporting grid is placed below the conveyor bed.

[0006] Furthermore, the hollow board is made of fire-resistant and flame-retardant rubber board material.

[0007] Furthermore, the multi-axis moving component includes an electric longitudinal slider, an electric transverse slider and an electric lift; an electric longitudinal slider is installed on the hollow plate; the longitudinal sliding component of the electric longitudinal slider is installed with an electric transverse slider and an electric transverse slider; the transverse slider component of the electric transverse slider is installed with an electric lift; the vertical slider component of the electric lift is fixed with an interface stamping head.

[0008] Furthermore, the circuit adapter is equipped with a fan for conveying air flow downward.

[0009] Furthermore, the circuit adapter is provided with an air inlet passage connected to the air inlet end of the fan.

[0010] Furthermore, the gas delivery component includes a fixed rod, a partition and an air supply duct; two fixed rods are provided on the hollow plate; a number of partitions are fixedly connected between the two fixed rods; an air supply channel structure is provided on each partition; a ventilation channel structure is provided on the fixed rod, which is respectively connected to the air supply channel structures on each partition; the partition is provided with a jet channel structure connected to the air supply channel structure; the fixed rod is connected to an air supply duct connected to the ventilation channel structure of the fixed rod.

[0011] Furthermore, the fixing rod is slidably connected to the hollow plate; a spring is fixedly connected between the fixing rod and the hollow plate to extend and retract.

[0012] Furthermore, the partition is configured as a downwardly contracted pointed cone structure.

[0013] Furthermore, the air supply duct uses a one-way air duct, and the one-way air duct is fixedly connected to the horizontal electric control slide rail component of the electric horizontal slider; the one-way air duct is provided with no less than two air outlet channel structures connected to the air supply channel structure on the adjacent partition.

[0014] The present invention provides an independent chip testing device that is easy to pick up and place. The conveyor machine is provided with a supporting grid, and a square punch head and a circuit adapter are installed through a multi-axis moving component. The independent chips on the carrier are sequentially conveyed to the bottom of the circuit adapter for testing. At the same time, the square punch head will form a fence around the independent chip, and the gas delivery component will blow protective gas around the tested independent chip. When an independent chip suddenly ignites during the test, the electromagnet will immediately bounce the circuit adapter upward away from the independent chip, and at the same time, the square punch head cooperates with the supporting grid to remove the independent chip that has ignited from the carrier. The board is punched downward to separate, allowing the ignited independent chip to fall downward into the waste soaking box for soaking and extinguishing. During this process, the protective gas and the enclosure formed by the mouth-shaped punching head will provide protection for the independent chips around the carrier board, so that the independent chips around the carrier board are not easily affected by the ignited independent chip and damaged. The entire placement operation steps are simple and intelligent, and are suitable for testing batches of independent chips. The disadvantages of the prior art that when testing multiple independent chips on the carrier board, the independent chips being tested on the carrier board ignite, resulting in a large area of ​​independent chips being damaged and forced to be scrapped, and there is a safety hazard of causing fire. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 A perspective view for describing the present invention according to an embodiment;

[0016] Figure 2 A top view of a carrier conveying state of the present invention is described according to an embodiment;

[0017] Figure 3 A top view of a support grid frame of the present invention is described according to an embodiment;

[0018] Figure 4 A perspective view of a multi-axis moving assembly of the present invention is described according to an embodiment;

[0019] Figure 5 A three-dimensional diagram of a one-way air duct according to an embodiment of the present invention is described;

[0020] Figure 6 A three-dimensional diagram of a punch head and a circuit adapter according to an embodiment of the present invention is described;

[0021] Figure 7 An exploded view of a punch head and a circuit adapter of the present invention is described according to an embodiment;

[0022] Figure 8 A perspective view of a partition board according to an embodiment of the present invention is described;

[0023] Fig. 9 The cross-sectional view of the fixing rod, the partition plate and the one-way air duct of the present invention is described according to an embodiment.

[0024] The figure marks of the embodiments of the present invention are as follows: 11-transfer machine tool, 12-support grid, 13-waste soaking box, 21-electric lifting push rod, 22-hollow plate, 23-electric longitudinal slider, 24-electric transverse slider, 25-electric lifter, 31-mouth punch head, 32-circuit adapter, 3201-air inlet channel, 33-limit rod, 34-reset spring, 35-electromagnet, 36-iron block, 37-fan, 41-fixing rod, 4101-ventilation channel, 42-partition, 4201-air supply channel, 4202-jet channel, 43-spring telescopic rod, 5-one-way air duct, 501-air outlet channel, 6-carrier plate, 61-independent chip, 601-dividing groove. DETAILED DESCRIPTION

[0025] Embodiments of the present invention are described in detail below with reference to the accompanying drawings.

[0026] Example 1

[0027] A chip testing device that is easy to pick and place, such as Figure 1-Figure 7 As shown, it includes a conveyor machine 11, a support grid 12, a waste soaking box 13, an electric lifting push rod 21, a hollow plate 22, a multi-axis moving component, a mouth-shaped punch head 31, a circuit adapter 32, a limit rod 33, a reset spring 34, an electromagnet 35, an iron block 36, a fan 37 and a gas conveying component; the middle part of the conveyor machine 11 is fixedly connected with the support grid 12; a waste soaking box 13 aligned with the support grid 12 is placed below the conveyor machine 11, and the waste soaking box 13 is filled with flame-retardant soaking liquid; four electric lifting push rods 21 are installed on the conveyor machine 11; a hollow plate 22 is fixedly connected between the telescopic ends of the four electric lifting push rods 21, and the hollow plate 22 uses a fire-proof and flame-retardant rubber plate material to prevent the hollow plate 22 from crushing the independent chip 61 on the surface of the carrier plate 6 after the hollow plate 22 is close to the carrier plate 6 downward; A multi-axis moving component is connected to the hollow plate 22; a mouth-shaped punch head 31 is connected to the multi-axis moving component; four limit rods 33 are fixedly connected to the mouth-shaped punch head 31; a circuit adapter 32 is slidably connected between the four limit rods 33, and the circuit adapter 32 is sleeved in the mouth-shaped punch head 31; a reset spring 34 is fixedly connected between the circuit adapter 32 and the four limit rods 33, and the reset spring 34 is sleeved on the outer surface of the limit rod 33; a gas conveying component for conveying protective gas is installed on the hollow plate 22; four electromagnets 35 are installed on the mouth-shaped punch head 31; iron blocks 36 corresponding to the number and position of the electromagnets 35 are installed on the circuit adapter 32; a fan 37 for conveying airflow downward is installed in the middle of the circuit adapter 32; an air inlet channel 3201 connected to the air inlet end of the fan 37 is opened on the circuit adapter 32.

[0028] like Figure 4As shown, the multi-axis moving assembly includes an electric longitudinal slider 23, an electric transverse slider 24 and an electric lifter 25; the electric longitudinal slider 23 is installed on the hollow plate 22, and the electric longitudinal slider 23 consists of two longitudinal electric-controlled slide rail components and two longitudinal slider components sliding on the two longitudinal electric-controlled slide rail components respectively; an electric transverse slider 24 is installed between the two longitudinal sliding components of the electric longitudinal slider 23, and the electric transverse slider 24 consists of a transverse electric-controlled slide rail component and a transverse slider component sliding on the transverse electric-controlled slide rail component; an electric lifter 25 is installed on the transverse slider component of the electric transverse slider 24, and the electric lifter 25 consists of a vertical electric-controlled slide rail component and a vertical slider component sliding on the vertical electric-controlled slide rail component; the vertical slider component of the electric lifter 25 is fixed with an interface stamping head 31.

[0029] The following are the chip circuit testing working steps of a chip testing device that is easy to pick up and place according to the present invention.

[0030] After the staff places the carrier 6 on the conveyor 11, the circuit adapter 32 is connected to the test host, and the gas delivery component is connected to the protective gas delivery equipment. Thereafter, the conveyor 11 sequentially transfers the independent chips 61 on the carrier 6 to the alignment multi-axis moving component. At the same time, the electric longitudinal slider 23, the electric transverse slider 24, and the electric lift 25 on the multi-axis moving component cooperate to respectively drive the mouth-shaped punch head 31 and the circuit adapter 32 to perform movement and adjustment work in the X-axis direction, the Y-axis direction, and the Z-axis direction, until the mouth-shaped punch head 31 and the circuit adapter 32 are aligned with the independent chip 61 currently to be tested on the carrier 6 in the vertical direction. Then, the electric lift push rod 21 drives the hollow plate 22 and the mouth-shaped punch head 31 and the circuit adapter 32 on the multi-axis moving component to move downward close to the carrier 6. At the same time, the electromagnet 35 Block 36 generates electromagnetic attraction to pull the circuit adapter 32 downward along the limit rod 33. At the same time, the circuit adapter 32 drives the reset spring 34 to compress downward, allowing the adapter at the bottom of the circuit adapter 32 to move downward to be flush with the bottom of the "mouth" punch head 31, until the adapter at the bottom of the circuit adapter 32 is tightly pressed downward against the aligned independent chip 61. At this time, the "mouth" punch head 31 surrounds the independent chip 61 to form a barrier, and the external test host forms a complete test circuit with the independent chip 61 through the circuit adapter 32, and performs circuit testing on the independent chip 61. At the same time, the external protective gas delivery equipment delivers protective gas to the area around the independent chip 61 through the gas delivery component, so that the protective gas cooperates with the barrier formed by the "mouth" punch head 31 to provide double-layer safety protection for the circuit testing of the independent chip 61.

[0031] The following are the first aid steps for chip ignition of a chip testing device that is easy to pick up and place according to the present invention.

[0032] During the process of the external test host performing circuit testing on the independent chip 61 through the circuit adapter 32, when the independent chip 61 suddenly ignites due to being unable to withstand the high power load, the ignited independent chip 61 will automatically disconnect the circuit formed with the test host, and at the same time, the electromagnet 35 will disconnect the electromagnetic attraction generated by the iron block 36 at the first time point, allowing the compressed reset spring 34 to drive the circuit adapter 32 to bounce upward away from the ignited independent chip 61, and at the same time, the fan 37 sucks the surrounding protective gas through the air inlet channel 3201 of the circuit adapter 32, and the fan 37 sprays the sucked protective gas downward onto the ignited independent chip 61. The ignition phenomenon on the independent chip 61 is weakened, and the adapter at the bottom of the circuit adapter 32 is provided with isolation protection. Then the electric lift 25 drives the mouth-shaped punch head 31 to punch the ignited independent chip 61 downward, and the ignited independent chip 61 is punched out from the carrier 6. The ignited independent chip 61 is detached downward and falls into the flame retardant immersion liquid in the waste immersion box 13 for extinguishing treatment. In this process, the protective gas and the enclosure formed by the mouth-shaped punch head 31 will provide protection for the independent chips 61 around the carrier 6, so that the independent chips 61 around the carrier 6 are not easily affected by the ignited independent chip 61 and damaged.

[0033] The present invention provides a chip testing device that is easy to pick up and place. After the carrier plate 6 is conveniently placed on the conveyor bed 11, it can actively identify the independent chip 61 that has ignited and detach it and take it away. The entire picking and placing operation steps are simple and intelligent, and it is suitable for testing batches of independent chips 61.

[0034] Example 2

[0035] On the basis of Example 1, Figure 1-Figure 9 As shown, the gas delivery assembly of this embodiment includes a fixed rod 41, a partition 42, a spring extension and an air supply duct; two left and right fixed rods 41 are slidably connected to the hollow plate 22; two spring extensions are fixedly connected between the two fixed rods 41 and the hollow plate 22; a number of partitions 42 are commonly fixedly connected between the two fixed rods 41; an air supply channel 4201 structure is provided on each partition 42; ventilation channel 4101 structures are provided on the two fixed rods 41, which are respectively connected to the air supply channel 4201 structures on each partition 42; a number of jet channel 4202 structures connected to the air supply channel 4201 structure are provided at the lower end of each partition 42; an air supply duct with a ventilation channel 4101 structure connected to the fixed rod 41 is connected to each of the two fixed rods 41; the lower end of each partition 42 is set as a downward-conical structure, which reduces the contact area between the lower end of the partition 42 and the surface of the carrier plate 6.

[0036] When the electric lifting push rod 21 drives the hollow plate 22 downward to approach the carrier plate 6, the hollow plate 22 drives the partitions 42 on the fixing rod 41 downward to press against the surface of the carrier plate 6, so that the independent chips 61 adjacent to each front and rear sides of the surface of the carrier plate 6 are separated by the partitions 42. At the same time, the partitions 42 are blocked by the carrier plate 6 and push the fixing rod 41 upward. The fixing rod 41 drives the spring to expand and contract and stretch upward to generate a reverse deformation elastic force. The expansion and contraction of the spring drives the partition 42 downward to press against the surface of the carrier plate 6 under the action of the deformation elastic force, thereby improving the isolation effect of the partition 42 on the independent chips 61 adjacent to the front and rear sides of the surface of the carrier plate 6, and further improving the isolation effect of the independent chips 61 burned on the surface of the carrier plate 6 under the cooperative protection of the partition 42 and the mouth-shaped punch head 31.

[0037] After the air supply pipeline is externally connected to the protective gas delivery device, the external protective gas delivery device delivers protective gas to the ventilation channel 4101 structure of the fixed rod 41 through the air supply pipeline. The protective gas then enters the air supply channel 4201 structure of the partition 42 and is ejected outward through each jet channel 4202 structure, so that the independent chip 61 burned on the surface of the carrier board 6 can be shielded by the protective gas to reduce the probability of combustion.

[0038] Example 3

[0039] On the basis of Example 2, Figure 1-Figure 9 As shown, the two air supply ducts of this embodiment both use one-way air ducts 5, and the two one-way air ducts 5 are fixedly connected to the horizontal electric-controlled slide rail component of the electric horizontal slider 24; the bottom of the two one-way air ducts 5 are respectively provided with two air outlet channel 501 structures connected to the air supply channel 4201 structure on the adjacent partition 42.

[0040] When the electric longitudinal slider 23 drives the electric transverse slider 24 to move in the front-to-back direction, the electric transverse slider 24 drives the one-way air duct 5 to move synchronously in the front-to-back direction. When the electric longitudinal slider 23 drives the punch head 31 and the circuit adapter 32 to align with any row of independent chips 61 on the carrier board 6, the electric longitudinal slider 23 also drives the two air outlet channels 501 structures of the one-way air duct 5 to align with the air supply channel 4201 structures of the adjacent partitions 42 on the front and back sides of the independent chip 61 respectively. After the one-way air duct 5 is externally connected to a protective gas delivery device, the external protective gas delivery device only delivers protective gas to the air supply channel 4201 structures of the adjacent partitions 42 on the front and back sides of the independent chip 61 through the one-way air duct 5, so that the protective gas is only ejected outward from the jet channel 4202 structures of the adjacent partitions 42 on the front and back sides of the independent chip 61, and protective gas is provided to the area surrounding the independent chip 61 alone, thereby greatly reducing the amount of protective gas used and reducing the cost of using protective gas.

[0041] The above embodiments are only for illustrating the technical concept and features of the present invention, and their purpose is to enable people familiar with the technology to understand the content of the present invention and implement it accordingly, and they cannot be used to limit the protection scope of the present invention. Any equivalent changes or modifications made according to the spirit of the present invention should be included in the protection scope of the present invention.

Claims

1. A chip testing device that is easy to pick up and place, comprising: a transfer machine tool (11); The conveyor bed (11) is fixedly connected to a supporting grid (12); an electric lifting push rod (21) is installed on the conveyor bed (11); a hollow plate (22) is fixedly connected to the telescopic end of the electric lifting push rod (21); and a multi-axis moving component is connected to the hollow plate (22); It is characterized in that Also includes a punch head (31) with a mouth shape; The multi-axis moving component is connected to a square punch head (31); a limit rod (33) is fixedly connected to the square punch head (31); the limit rod (33) is slidably connected to a circuit adapter (32), and the circuit adapter (32) is sleeved in the square punch head (31); a return spring (34) is fixedly connected to the circuit adapter (32) and the limit rod (33); an electromagnet (35) is installed on the square punch head (31); an iron block (36) corresponding to the electromagnet (35) is installed on the circuit adapter (32); and a gas conveying component for conveying protective gas is installed on the hollow plate (22).

2. The chip testing device that is easy to pick up and place according to claim 1, characterized in that: A waste soaking box (13) aligned with the supporting grid (12) is placed below the conveyor bed (11).

3. The chip testing device that is easy to pick up and place according to claim 1, characterized in that: The hollow plate (22) is made of fire-resistant and flame-retardant rubber plate material.

4. The chip testing device that is easy to pick up and place according to claim 1, characterized in that: The multi-axis moving assembly comprises an electric longitudinal slider (23), an electric transverse slider (24) and an electric lifter (25); the electric longitudinal slider (23) is mounted on the hollow plate (22); the electric longitudinal slider (23) is composed of two longitudinal electric control slide rail components and two longitudinal slider components sliding on the two longitudinal electric control slide rail components respectively; an electric transverse slider (24) is mounted between the two longitudinal slide components of the electric longitudinal slider (23); the electric lifter (25) is mounted on the transverse slider component of the electric transverse slider (24); and the vertical slider component of the electric lifter (25) is fixed with an interface stamping head (31).

5. The chip testing device that is easy to pick up and place according to claim 1, characterized in that: The circuit adapter (32) is equipped with a fan (37) for conveying air flow downward.

6. The chip testing device that is easy to pick up and place according to claim 5, characterized in that: The circuit adapter (32) is provided with an air inlet passage (3201) connected to the air inlet end of the fan (37).

7. A chip testing device that is easy to pick up and place according to any one of claims 1 to 6, characterized in that: The gas delivery assembly comprises a fixed rod (41), a partition (42) and an air delivery duct; two fixed rods (41) are provided on the hollow plate (22); a plurality of partitions (42) are fixedly connected between the two fixed rods (41); an air delivery channel (4201) structure is provided on each partition (42); a ventilation channel (4101) structure respectively connected to the air delivery channel (4201) structure on each partition (42) is provided on the fixed rod (41); an air jet channel (4202) structure connected to the air delivery channel (4201) structure is provided on the partition (42); and an air delivery duct connected to the ventilation channel (4101) structure of the fixed rod (41) is connected to the fixed rod (41).

8. The chip testing device that is easy to pick up and place according to claim 7, characterized in that: The fixing rod (41) is slidably connected to the hollow plate (22); a spring is fixedly connected between the fixing rod (41) and the hollow plate (22) to extend and retract.

9. The chip testing device that is easy to pick up and place according to claim 8, characterized in that: The partition (42) is configured as a pointed cone structure that contracts downward.

10. The chip testing device that is easy to pick up and place according to claim 7, characterized in that: The air delivery duct uses a one-way air duct (5), and the one-way air duct (5) is fixedly connected to the horizontal electric control slide rail component of the electric horizontal slide block (24); the one-way air duct (5) is provided with no less than two air outlet channel (501) structures connected to the air delivery channel (4201) structures on the adjacent partition plate (42).

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