Fault simulation device, system and method for single event upset

Abstract

The invention discloses a fault simulation device, system and method for single event upset. The fault simulation device comprises a fault injection module, a software uploading module, a fault diagnosis module and a fault recovery module. The fault injection module is used for generating a problem code package in which a single-particle event occurs; the software uploading module uploads the problem code package to an upper computer; the fault diagnosis module receives a response packet generated by the upper computer and judges a fault type; and the fault recovery module sends a reset instruction to the upper computer according to the fault type so as to recover the original code of the upper computer. According to the fault simulation device, system and method for single event upset, single event upset can be simulated and various faults can be verified by applying a fault injection technology on the ground, so that the stability and safety of a spacecraft during in-orbit operation are ensured, potential faults caused by single event upset are effectively predicted and prevented, and the fault simulation efficiency is improved. And the failure of the key application due to single event upset when the spacecraft operates in orbit is avoided.

Description

Technical Field

[0001] The present invention relates to the field of aerospace electromechanical control, and in particular to a fault simulation device, system and method for single particle upset. Background Art

[0002] When a spacecraft is operating in space, it will be bombarded by a large number of cosmic rays and high-energy charged particles. These cosmic rays and high-energy particles may penetrate the protective layer of the spacecraft and then bombard the electronic components inside it, causing single-particle upset events. When a bit flip occurs in a storage unit, it may change the configuration of the microelectronic circuit, which in turn affects the normal function of the spacecraft, and even causes the spacecraft to fail to work properly. Many key systems on spacecraft, such as control and communication, rely on highly reliable electronic systems and equipment. However, single-particle upsets may cause these systems to work abnormally, calculation results to be wrong, or even system crashes, which will have a serious impact on the safety and mission completion of the spacecraft. In addition, single-particle upsets may also have a long-term impact on the life and reliability of the spacecraft. Therefore, it is necessary to consider the impact of single-particle upsets on spacecraft during the design stage of the spacecraft, and a fault simulation system and fault simulation detection method for single-particle upsets are needed. Summary of the invention

[0003] The object of the present invention is to provide a fault simulation system and a fault simulation detection method for single particle upset.

[0004] To achieve the above object, the present invention provides a fault simulation device for single particle upset, the fault simulation device is electrically connected to a host computer, and the fault simulation device comprises:

[0005] A fault injection module is used to generate problematic code packages where single-particle events occur;

[0006] A software injection module is electrically connected to the fault injection module and the host computer respectively, and the software injection module injects the problem code package into the host computer;

[0007] A fault diagnosis module, electrically connected to the host computer, for receiving a response packet generated by the host computer executing the problem code packet, and determining the fault type according to the response packet;

[0008] A fault recovery module is electrically connected to the fault diagnosis module and the host computer, and is used to send a reset instruction to the host computer according to the fault type to restore the original code of the host computer.

[0009] Optionally, the fault simulation device further comprises a user interaction module, and the user interaction module is used to interact with a user so that the user can input fault simulation information or display the fault type to the user.

[0010] Optionally, the input fault simulation information includes an occurrence mode of a single particle event, and the occurrence mode includes an occurrence position, an occurrence depth, and an occurrence number.

[0011] Optionally, the fault simulation device further comprises a fault log module, and the fault log module is used to store the fault type and corresponding problem code bit information.

[0012] Optionally, the fault diagnosis module checks the packet header, packet length, checksum, and important service parameters in the response packet to determine the fault type.

[0013] The present invention also provides a fault simulation system for single-particle upset, the fault simulation system comprising:

[0014] Host computer;

[0015] As mentioned above, the fault simulation device is electrically connected to the host computer, and is used to inject the generated problem code package into the host computer, and receive the response package generated by the host computer executing the problem code package, determine the fault type according to the response package, and send a reset instruction to the host computer according to the fault type to restore the original code of the host computer.

[0016] Optionally, the host computer includes a first memory for storing the master code and a second memory for storing the running code, and the fault simulation device includes a fault recovery module, which is used to copy the master code in the first memory of the host computer to the second memory according to the fault type to replace the running code.

[0017] Optionally, the host computer includes a communication serial port, and the host computer communicates with the fault simulation device through the communication serial port.

[0018] The present invention also provides a fault simulation detection method for single-particle upset, the fault simulation detection method is used in the fault simulation system as described above, and the fault simulation detection method comprises:

[0019] S10, the fault injection module generates a problem code package for a single particle event according to the fault simulation information;

[0020] S20, the software uploading module uploads the problem code package to the host computer;

[0021] S30, the host computer executes the problem code package and generates a response package;

[0022] S40, the fault diagnosis module receives the response packet and determines the fault type according to the response packet;

[0023] S50. The fault recovery module sends a reset instruction to the host computer according to the fault type to restore the original code of the host computer.

[0024] Optionally, before step S10, the method further includes step S01, wherein a user inputs fault simulation information through an interactive module and transmits the information to a fault injection module, wherein the fault simulation information includes an occurrence mode of a single particle event, and the occurrence mode includes an occurrence position, an occurrence depth, and an occurrence number.

[0025] In summary, compared with the prior art, the fault simulation device, system and method for single event upset provided by the present invention have the following beneficial effects:

[0026] The fault simulation device, system and method for single particle flip of the present invention can use fault injection technology to simulate single particle flip on the ground, so as to verify the influence of various single particle flip faults on the host computer software, verify various faults on the ground, and ensure the stability and safety of the spacecraft during on-orbit operation.

[0027] The fault simulation device of the present invention can verify the impact of single-particle flips on the upper computer software, can effectively help predict and prevent potential faults caused by single-particle flips, and avoid the failure of key applications due to single-particle flips when the spacecraft is in orbit. At the same time, by verifying the impact of single-particle flips on the software, it is possible to have a deeper understanding of the vulnerable links of the software, and optimize the software design based on this information, improve the resistance to single-particle flips, and effectively evaluate the fault tolerance of the software. In addition, for single-particle flip protection of spacecraft, compared with the reinforcement design at the hardware level, the software protection strategy is more flexible and comprehensive, and the use of software does not require customized hardware, does not take up additional physical space, and has a higher cost-effectiveness. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] Figure 1 It is a structural schematic diagram of the fault simulation device of the present invention.

[0029] Figure 2 The figure is an overall flow chart of the fault simulation detection method for single-particle upset of the present invention.

[0030] Figure 3 The figure is a schematic diagram of a specific process of the fault simulation detection method for single-particle upset of the present invention. DETAILED DESCRIPTION

[0031] The following will be combined with the attached embodiment of the present invention Figure 1 ~Attached Figure 2 , the technical solutions, structural features, objectives achieved and effects in the embodiments of the present invention are described in detail.

[0032] It should be noted that the drawings are in a very simplified form and use non-precise proportions. They are only used to conveniently and clearly assist in explaining the embodiments of the present invention, and are not used to limit the conditions for the implementation of the present invention. Therefore, they have no substantive technical significance. Any structural modification, change in proportional relationship or adjustment of size, without affecting the effects and purposes that can be achieved by the present invention, should still fall within the scope of the technical content disclosed by the present invention.

[0033] It should be noted that, in the present invention, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only the elements explicitly listed, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device.

[0034] The invention provides a fault simulation device for single particle flipping. The fault simulation device is electrically connected to a host computer and comprises a fault injection module, a software injection module, a fault diagnosis module and a fault recovery module.

[0035] After the fault simulation device determines the single particle event fault injected into the host computer, the fault injection module is used to generate a problem code package for the occurrence of the single particle event according to the determined single particle event. The software injection module is electrically connected to the fault injection module and the host computer respectively. Among them, the fault injection module performs an overturning operation on the bit that needs to be flipped according to relevant settings, and generates instructions that can be used for software injection.

[0036] After receiving the generated problem code package, the software upload module uploads the problem code package to the host computer for execution. The software upload module can write the software to the location where the problem code of the tested software is located on the SDRAM, and only replace the code near the overturned position, but not replace the code at other locations that have not changed, so that the host computer runs the software after the fault is injected.

[0037] After receiving the problem code package, the host computer will generate a response package. The fault diagnosis module is electrically connected to the host computer, and is used to receive the response package generated by the host computer executing the problem code package, and determine the fault type according to the response package. Among them, the fault diagnosis module checks the packet header, packet length, checksum, and important business parameters in the response packet to determine the fault type.

[0038] The fault recovery module is electrically connected to the fault diagnosis module and the host computer. The fault recovery module is used to send a reset instruction to the host computer according to the fault type to restore the original code of the host computer.

[0039] As a preferred embodiment, the fault simulation device further includes a user interaction module, and the user interaction module is used to interact with the user so that the user can input fault simulation information or display the fault type to the user.

[0040] The input fault simulation information includes the occurrence mode of the single particle event, and the occurrence mode includes the occurrence position, occurrence depth and occurrence number. The user interaction module can also display the fault type to the user. In this embodiment, the fault simulation information is input through the user interaction module, so that the fault simulation device of the present invention can support random overturning and specified position overturning, allowing multiple bits to flip at the same time, thereby improving the applicability of the fault simulation device of the present invention.

[0041] The fault simulation device of the present invention inputs fault simulation information through a user interaction module, supports random flipping and designated position flipping, and allows multiple bits to flip simultaneously, so that the simulation effect of single particle flipping is more comprehensive.

[0042] As a preferred embodiment, the fault simulation device further includes a fault log module, which is used to store the fault type and the corresponding problem code bit information. Through the fault log module, the generated fault type and the corresponding problem code bit information are stored in the log for subsequent data analysis.

[0043] The present invention discloses a fault simulation system for single particle flipping. The fault simulation system comprises a host computer and a fault simulation device as described above. The fault simulation device is electrically connected to the host computer and is used to inject a generated problem code package into the host computer, and receive a response package generated by the host computer executing the problem code package, determine the fault type according to the response package, and send a reset instruction to the host computer according to the fault type to restore the original code of the host computer.

[0044] The host computer includes a first memory for storing the master code and a second memory for storing the running code. The fault simulation device includes a fault recovery module, which is used to copy the master code in the first memory of the host computer to the second memory according to the fault type to replace the running code.

[0045] In the present invention, the first memory can be FLASH (flash memory). FLASH is a non-volatile memory. Even in the event of a power outage, the data stored therein will not be lost. Therefore, in this embodiment, FLASH is used to store the master code so that the master code can be preserved for a long time. When the fault simulation device is powered on again after being powered off, the master code can still exist in the FLASH waiting to be moved to the second memory for operation.

[0046] The second memory may be SDRAM (Synchronous Dynamic Random Access Memory), which works synchronously with the system clock and can read and write data at a very high speed. Therefore, when the program is running, the parent code in the first memory is transferred to SDRAM for high-speed execution.

[0047] In addition, the host computer includes a communication serial port, and the host computer communicates with the fault simulation device through the communication serial port. The generated problem code package is injected into the host computer through the serial port, and copied to the location of the problem code in the SDRAM of the tested software, so that the host computer runs on the problem software. Then, according to the response package returned by the host computer, the fault is automatically identified and the result is analyzed. After the fault identification is completed, the tested software can be restored. Through the unsupervised single-particle upset fault simulation device and the fault simulation system, fully automatic fault simulation and impact analysis can be achieved without destroying the software and hardware, which is of great significance to optimizing software design and improving the ability to resist single-particle upset.

[0048] The fault simulation system for single particle upset of the present invention can inject single particle upset fault into the host computer through the serial port, and supports automatic identification and recovery of the fault impact, can verify the impact of the single particle upset on the detected system, and evaluate the ability of the software to resist single particle events; more importantly, it will not cause damage to the software and hardware of the host computer in the fault simulation system, and does not need to perform adaptive modification on the host computer. It has extremely strong universality and unsupervised testing throughout the process, and can independently complete the entire process from testing to analysis, which is of great significance to the research on resistance to single particle upset in the aerospace field.

[0049] In addition, the fault recovery module sends a reset command to the host computer through the serial port to restore the original code of the host computer. And the functions and software in the host computer SDRAM can be reset through the serial port. Specifically, the fault recovery module can move the parent code stored in the FLASH of the host computer to the SDRAM, overwrite the problem code, and make the host computer run on the software before it was overturned.

[0050] like Figure 2 and Figure 3 As shown, the present invention also provides a fault simulation detection method for single-particle upset, the fault simulation detection method is used in the fault simulation system as described above, and the fault simulation detection method includes:

[0051] S10, the fault injection module generates a problem code package of a single particle event according to the fault simulation information. Specifically, the fault injection module performs a flip operation on the corresponding code bit according to the fault simulation information (such as flipping mode and code position) to generate instructions that can be used for software injection.

[0052] S20, the software upload module uploads the problem code package to the host computer, and copies it to the location of the problem code of the detected software on the SDRAM, so that the host computer runs on the problem software.

[0053] S30, the host computer executes the problem code package and generates a response package.

[0054] S40, the fault diagnosis module receives the response packet and determines the fault type based on the response packet. Specifically, the response packet containing business information sent back by the host computer is received through the serial port, and the packet header, packet length, checksum and important business parameters of the response packet are checked to automatically determine the fault type. If a fault exists, the fault type and fault frequency are displayed in real time through the user interaction module, and the fault type and corresponding problem code bit information are recorded in the fault log module and enter S50; if no fault exists, enter S50 directly.

[0055] S50, the fault recovery module sends a reset command to the host computer through the serial port according to the fault type to restore the original code of the host computer. Specifically, the parent software of the host computer is moved from FLASH to the startup address on SDRAM to restore the host computer to the original running state.

[0056] As a preferred embodiment, before step S10, it also includes step S01, the user inputs fault simulation information through the interactive module and transmits it to the fault injection module, the fault simulation information includes the occurrence mode of the single particle event, and the occurrence mode includes the occurrence position, occurrence depth and occurrence number. After S50, S20-S50 can be repeatedly executed to reach the set occurrence number.

[0057] Although the content of the present invention has been described in detail through the above preferred embodiments, it should be appreciated that the above description should not be considered as a limitation of the present invention. After reading the above content, it will be apparent to those skilled in the art that various modifications and substitutions of the present invention will occur. Therefore, the protection scope of the present invention should be limited by the appended claims.

Claims

1. A fault simulation device for single event upset, characterized in that: The fault simulation device is electrically connected to the host computer, and the fault simulation device includes: A fault injection module is used to generate problematic code packages where single-particle events occur; A software injection module is electrically connected to the fault injection module and the host computer respectively, and the software injection module injects the problem code package into the host computer; A fault diagnosis module, electrically connected to the host computer, for receiving a response packet generated by the host computer executing the problem code packet, and determining the fault type according to the response packet; A fault recovery module is electrically connected to the fault diagnosis module and the host computer, and is used to send a reset instruction to the host computer according to the fault type to restore the original code of the host computer.

2. The fault simulation device according to claim 1, characterized in that: The fault simulation device further comprises a user interaction module, and the user interaction module is used to interact with a user so that the user can input fault simulation information or display the fault type to the user.

3. The fault simulation device according to claim 2, characterized in that: The input fault simulation information includes the occurrence mode of the single particle event, and the occurrence mode includes the occurrence position, occurrence depth and occurrence times.

4. The fault simulation device according to claim 1, characterized in that: The fault simulation device further comprises a fault log module, and the fault log module is used to store the fault type and the corresponding problem code bit information.

5. The fault simulation device according to claim 1, characterized in that: The fault diagnosis module checks the packet header, packet length, checksum, and important service parameters in the response packet to determine the fault type.

6. A fault simulation system for single event upset, characterized in that: The fault simulation system comprises: Host computer; The fault simulation device as described in any one of claims 1 to 5, wherein the fault simulation device is electrically connected to the host computer, and is used to inject the generated problem code package into the host computer, and receive a response package generated by the host computer executing the problem code package, determine the fault type according to the response package, and send a reset instruction to the host computer according to the fault type to restore the original code of the host computer.

7. The fault simulation system according to claim 6, characterized in that: The host computer includes a first memory for storing the master code and a second memory for storing the running code. The fault simulation device includes a fault recovery module. The fault recovery module is used to copy the master code in the first memory of the host computer to the second memory according to the fault type to replace the running code.

8. The fault simulation system according to claim 6, characterized in that: The host computer comprises a communication serial port, and the host computer communicates with the fault simulation device through the communication serial port.

9. A fault simulation detection method for single event upset, characterized in that: The fault simulation detection method is used in the fault simulation system according to any one of claims 6 to 8, and the fault simulation detection method comprises: S10, the fault injection module generates a problem code package for a single particle event according to the fault simulation information; S20, the software uploading module uploads the problem code package to the host computer; S30, the host computer executes the problem code package and generates a response package; S40, the fault diagnosis module receives the response packet and determines the fault type according to the response packet; S50. The fault recovery module sends a reset instruction to the host computer according to the fault type to restore the original code of the host computer.

10. The fault simulation detection method according to claim 9, characterized in that: Before step S10, the method further includes step S01, wherein a user inputs fault simulation information through an interactive module and transmits the information to a fault injection module, wherein the fault simulation information includes an occurrence mode of a single particle event, and the occurrence mode includes an occurrence position, an occurrence depth, and an occurrence number.

Images