Fault processing method and device and storage medium

Abstract

The invention relates to a fault processing method and device and a storage medium. The method is applied to the intelligent terminal comprising a storage device, and comprises the following steps: judging whether the intelligent terminal has a fault or not based on the running state of the intelligent terminal; when it is judged that the intelligent terminal breaks down, whether a storage device in the intelligent terminal breaks down or not is judged based on a fault detection mechanism of the intelligent terminal; when it is judged that the storage device in the intelligent terminal breaks down, historical statistical information of the storage device is updated based on the working frequency point of the storage device; wherein the historical statistical information comprises the working frequency point and the number of times that the storage device breaks down at the working frequency point; determining a selected working frequency point based on historical statistical information of the storage device; and forbidding the selected working frequency point in a to-be-selected working frequency point library of the storage device. By forbidding the selected working frequency point at the user side, the number of times that the intelligent terminal breaks down due to the fact that the storage device breaks down can be effectively reduced, and therefore the hardware replacement cost is reduced.

Description

Technical Field

[0001] The present disclosure relates to the field of computer communications, and in particular to a fault handling method, device and storage medium. Background Art

[0002] With the rapid development of technology today, more and more smart terminals use storage devices. However, storage device failure usually leads to smart terminal failure, and storage device failure is usually located as a hardware problem. Such hardware problems cannot be solved through after-sales repairs, and the smart terminal needs to be returned directly to the R&D team for analysis, resulting in high hardware replacement costs. Summary of the invention

[0003] In order to overcome the problems existing in the related art, the present disclosure provides a fault handling method, device and storage medium to overcome the problem that a storage device failure causes a smart terminal failure, which in turn causes high hardware replacement costs.

[0004] According to a first aspect of an embodiment of the present disclosure, a fault handling method is provided, the method being applied to an intelligent terminal including a storage device, the method comprising:

[0005] Based on the running state of the smart terminal, determining whether the smart terminal fails;

[0006] When determining that the intelligent terminal fails, determining whether a storage device in the intelligent terminal fails based on a fault detection mechanism of the intelligent terminal;

[0007] When determining that a storage device in the smart terminal fails, updating historical statistical information of the storage device based on the operating frequency of the storage device; wherein the historical statistical information includes the operating frequency and the number of times the storage device fails at the operating frequency;

[0008] Determining a selected operating frequency based on historical statistical information of the storage device;

[0009] The selected operating frequency point is disabled in the candidate operating frequency point library of the storage device.

[0010] In some embodiments, when determining that a storage device in the smart terminal fails, updating historical statistical information of the storage device based on the operating frequency of the storage device includes:

[0011] When determining that the storage device fails, if the operating frequency point at which the storage device fails is not in the historical statistical information, adding the operating frequency point to the historical statistical information;

[0012] When determining that the storage device fails, if the operating frequency point at which the storage device fails is in the historical statistical information, the number of times the storage device fails at the operating frequency point is modified in the historical statistical information.

[0013] In some embodiments, determining the selected operating frequency point based on the historical statistical information of the storage device includes:

[0014] Based on historical statistical information of the storage device, an operating frequency point at which the number of failures of the storage device is greater than a preset number is determined as a selected operating frequency point.

[0015] In some embodiments, judging whether the smart terminal fails based on the running state of the smart terminal includes:

[0016] Detecting whether the operation status of the intelligent terminal is abnormal;

[0017] When it is detected that the operation state of the smart terminal is abnormal, obtaining a detection value of the smart terminal based on a fault detection mechanism of the smart terminal;

[0018] Based on the detection value of the smart terminal, it is determined whether the smart terminal fails.

[0019] In some embodiments, when determining that the smart terminal fails, determining whether a storage device in the smart terminal fails based on a fault detection mechanism of the smart terminal includes:

[0020] When determining that the intelligent terminal fails, obtaining fault information of the intelligent terminal based on a fault detection mechanism of the intelligent terminal;

[0021] Based on the fault information of the smart terminal, it is determined whether a storage device in the smart terminal fails.

[0022] In some embodiments, the fault information includes first fault information; and judging whether a storage device in the smart terminal fails based on the fault information of the smart terminal includes:

[0023] Based on the first fault information of the smart terminal, a fault type of the smart terminal is determined.

[0024] In some embodiments, the fault information further includes second fault information; and judging whether the storage device in the smart terminal fails based on the fault information of the smart terminal further includes:

[0025] Based on the second fault information and the fault type of the smart terminal, it is determined whether a storage device in the smart terminal fails.

[0026] According to a second aspect of an embodiment of the present disclosure, a fault handling device is provided, the device comprising:

[0027] A first judgment module is configured to judge whether the smart terminal fails based on the running state of the smart terminal;

[0028] A second judgment module is configured to judge whether a storage device in the smart terminal fails based on a fault detection mechanism of the smart terminal when judging that the smart terminal fails;

[0029] An updating module, configured to update historical statistical information of the storage device based on the working frequency of the storage device when it is determined that the storage device in the intelligent terminal fails; wherein the historical statistical information includes the working frequency and the number of times the storage device fails at the working frequency;

[0030] A determination module configured to determine a selected operating frequency point based on historical statistical information of the storage device;

[0031] A disabling module is configured to disable the selected working frequency point in the working frequency point library to be selected in the storage device.

[0032] In some embodiments, the update module is configured to:

[0033] When determining that the storage device fails, if the operating frequency point at which the storage device fails is not in the historical statistical information, adding the operating frequency point to the historical statistical information;

[0034] When determining that the storage device fails, if the operating frequency point at which the storage device fails is in the historical statistical information, the number of times the storage device fails at the operating frequency point is modified in the historical statistical information.

[0035] In some embodiments, the determining module is configured to:

[0036] Based on historical statistical information of the storage device, an operating frequency point at which the number of failures of the storage device is greater than a preset number is determined as a selected operating frequency point.

[0037] In some embodiments, the first determination module is configured to:

[0038] Detecting whether the operation status of the intelligent terminal is abnormal;

[0039] When it is detected that the operation state of the smart terminal is abnormal, obtaining a detection value of the smart terminal based on a fault detection mechanism of the smart terminal;

[0040] Based on the detection value of the smart terminal, it is determined whether the smart terminal fails.

[0041] In some embodiments, the second determination module is configured to:

[0042] When determining that the intelligent terminal fails, obtaining fault information of the intelligent terminal based on a fault detection mechanism of the intelligent terminal;

[0043] Based on the fault information of the smart terminal, it is determined whether a storage device in the smart terminal fails.

[0044] In some embodiments, the fault information includes first fault information; the second judgment module is configured to:

[0045] Based on the first fault information of the smart terminal, a fault type of the smart terminal is determined.

[0046] In some embodiments, the fault information further includes second fault information; the second judgment module is configured to:

[0047] Based on the second fault information and the fault type of the smart terminal, it is determined whether a storage device in the smart terminal fails.

[0048] According to a third aspect of an embodiment of the present disclosure, a fault handling device is provided, the device comprising:

[0049] processor;

[0050] a memory for storing processor-executable instructions;

[0051] Wherein, the processor is configured to: implement the steps in any one of the fault handling methods in the first aspect when executed.

[0052] According to the fourth aspect of an embodiment of the present disclosure, a non-temporary computer-readable storage medium is provided. When the instructions in the storage medium are executed by a processor in a fault handling device, the fault handling device is enabled to perform the steps in any fault handling method in the first aspect.

[0053] The technical solution provided by the embodiments of the present disclosure may have the following beneficial effects:

[0054] In the disclosed embodiments, it is determined whether a fault occurs in the smart terminal based on the running status of the smart terminal; when it is determined that a fault occurs in the smart terminal, it is determined whether a fault occurs in a storage device in the smart terminal based on the fault detection mechanism of the smart terminal; when it is determined that a fault occurs in the storage device in the smart terminal, historical statistical information of the storage device is updated based on the working frequency of the storage device; wherein the historical statistical information includes the working frequency and the number of times the storage device fails at the working frequency; based on the historical statistical information of the storage device, a selected working frequency is determined; and the selected working frequency is disabled in a library of working frequencies to be selected of the storage device.

[0055] Through the embodiments of the present disclosure, each time a storage device fails, the operating frequency of the storage device at the time of the failure is recorded, and the operating frequency at which the storage device fails more frequently is determined as the selected operating frequency; disabling the selected operating frequency on the user side can effectively reduce the number of failures of the smart terminal due to storage device failures, thereby reducing hardware replacement costs.

[0056] It is to be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the present disclosure. BRIEF DESCRIPTION OF THE DRAWINGS

[0057] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present disclosure and, together with the description, serve to explain the principles of the present disclosure.

[0058] Figure 1 The following is a flow chart of a fault handling method according to an exemplary embodiment. Figure 1 ;

[0059] Figure 2 The following is a flow chart of a fault handling method according to an exemplary embodiment. Figure 2 ;

[0060] Figure 3 is a block diagram of a fault processing device according to an exemplary embodiment;

[0061] Figure 4 The figure is a hardware structure block diagram of a fault handling device according to an exemplary embodiment. DETAILED DESCRIPTION

[0062] Exemplary embodiments will be described in detail herein, examples of which are shown in the accompanying drawings. When the following description refers to the drawings, the same numbers in different drawings represent the same or similar elements unless otherwise indicated. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present disclosure. Instead, they are merely examples of devices and methods consistent with some aspects of the present disclosure as detailed in the appended claims.

[0063] Figure 1 The following is a flow chart of a fault handling method according to an exemplary embodiment. Figure 1 .like Figure 1 As shown, the method is applied to an intelligent terminal including a storage device, and the method mainly includes the following steps:

[0064] In step 101, based on the operating status of the smart terminal, it is determined whether the smart terminal fails;

[0065] In step 102, when it is determined that the intelligent terminal fails, it is determined whether a storage device in the intelligent terminal fails based on a fault detection mechanism of the intelligent terminal;

[0066] In step 103, when it is determined that the storage device in the smart terminal fails, historical statistical information of the storage device is updated based on the operating frequency of the storage device; wherein the historical statistical information includes the operating frequency and the number of times the storage device fails at the operating frequency;

[0067] In step 104, based on the historical statistical information of the storage device, a selected operating frequency is determined;

[0068] In step 105, the selected operating frequency point is disabled in the candidate operating frequency point library of the storage device.

[0069] It should be noted that the fault handling method proposed in the present disclosure can be applied to intelligent terminals, such as mobile terminals or fixed terminals. Among them, mobile terminals can include: mobile phones, tablet computers, laptops, wearable electronic devices and other devices. Fixed terminals can include: desktop computers, smart TVs and vehicle-mounted devices, etc.

[0070] Here, the intelligent terminal includes a storage device, and a failure of the storage device will cause the intelligent terminal to fail. However, when the intelligent terminal fails, it may be due to a failure of the storage device in the intelligent terminal or a failure of other components in the intelligent terminal. Therefore, when the intelligent terminal fails, a fault detection mechanism is needed to determine whether the failure of the intelligent terminal is caused by a failure of the storage device.

[0071] In a specific example, the smart terminal may be a mobile phone, and the storage device may be a double data rate synchronous dynamic random access memory (DDRSDRAM).

[0072] In some embodiments, judging whether the smart terminal fails based on the running state of the smart terminal includes:

[0073] Detecting whether the operation status of the intelligent terminal is abnormal;

[0074] When it is detected that the operation state of the smart terminal is abnormal, obtaining a detection value of the smart terminal based on a fault detection mechanism of the smart terminal;

[0075] Based on the detection value of the smart terminal, it is determined whether the smart terminal fails.

[0076] Normally, the operating status of a smart terminal is normal. On the one hand, the operating status of the operating system running on the smart terminal is normal and can respond promptly to various operations performed by the user on the smart terminal. On the other hand, after detecting the user's startup operation on an application installed on the smart terminal, the application can start normally and run normally.

[0077] However, as the use time of the smart terminal increases, more and more applications are running on the smart terminal. In some embodiments, the storage device in the smart terminal may fail, resulting in an abnormal operation of the smart terminal. In other embodiments, the processor in the smart terminal may not be able to cope with the increasing amount of data to be processed, resulting in an abnormal operation of the smart terminal.

[0078] In the embodiment of the present disclosure, the abnormal operation state of the smart terminal may include: abnormal restart, freezing, etc.

[0079] In some embodiments, if the user makes an operation on the smart terminal and the smart terminal cannot respond to the various operations made by the user in a timely manner, it is determined that the running state of the smart terminal is in a frozen state. For example, the memory usage of the application can be obtained. If the memory usage of the application is lower than the set value, it is determined that the application is in a frozen state. In other words, the running state of the application can be determined based on the memory usage of the application. Taking a game application as an example, if it needs to occupy 5% of the memory in a normal running state, but at a certain moment, the memory usage of the game application is detected to be 1% or even lower than 1%, it is determined that the game application is in a frozen state.

[0080] In other embodiments, if the smart terminal is restarted after the user performs an operation on the smart terminal, it is determined that the operation state of the smart terminal is in an abnormal restart state. The operation performed by the user on the smart terminal is not a restart operation. In other words, the smart terminal is not restarted based on the user's restart operation, which is an abnormal restart.

[0081] In the embodiment of the present disclosure, when it is detected that the operation state of the intelligent terminal is abnormal, it is determined whether the intelligent terminal is faulty. In other words, in the embodiment of the present disclosure, it is necessary to timely sense whether the operation state of the intelligent terminal is abnormal.

[0082] In some embodiments, whether the operating status of the smart terminal is abnormal can be detected in real time, so as to perceive in real time whether the operating status of the smart terminal is abnormal, so that it can be judged in time whether the smart terminal is faulty when the operating status of the smart terminal is abnormal.

[0083] In other embodiments, the operation state of the smart terminal may be detected regularly to see if it is abnormal. Since the operation state of the smart terminal is usually normal, and the abnormal operation state of the smart terminal is an occasional event, the operation state of the smart terminal may be detected regularly to see if it is abnormal, so as to reduce the power consumption of the smart terminal.

[0084] In the disclosed embodiment, the fault detection mechanism of the smart terminal can retain the fault scene and record the detection value and fault information; wherein the detection value can be used to determine whether the smart terminal has a fault; when determining that the smart terminal has a fault, the fault information can be further used to determine whether the smart terminal has a fault due to a fault in the storage device.

[0085] In a specific example, the fault detection mechanism of the smart terminal can be, for example, a kernel panic mechanism. When the kernel error mechanism captures that the value of the kernel panic count is zero, it is determined that the smart terminal has not failed; when the kernel error mechanism captures that the value of the kernel error count is non-zero, it is determined that the smart terminal has failed. More specifically, each time the smart terminal fails, the value of the kernel error count will increase by 1. Similarly, when the kernel error mechanism captures that the value of the kernel error count has not increased, it can be determined that the smart terminal has not failed; when the kernel error mechanism captures that the value of the kernel error count has increased, it can be determined that the smart terminal has failed.

[0086] In some embodiments, when determining that the smart terminal fails, determining whether a storage device in the smart terminal fails based on a fault detection mechanism of the smart terminal includes:

[0087] When determining that the intelligent terminal fails, obtaining fault information of the intelligent terminal based on a fault detection mechanism of the intelligent terminal;

[0088] Based on the fault information of the smart terminal, it is determined whether a storage device in the smart terminal fails.

[0089] In the disclosed embodiment, based on the fault detection mechanism of the smart terminal, the fault information of the smart terminal can be obtained; wherein the fault information includes first fault information and second fault information. The first fault information can be, for example, title text, based on which the fault type of the smart terminal can be determined, for example, it can be determined whether the fault of the smart terminal is a virtual address disorder. The second fault information can be, for example, an error code, based on which it can be further determined whether a storage device in the smart terminal has a fault, for example, it can be determined whether a data bit flip error has occurred in the storage device.

[0090] In some embodiments, the fault information includes first fault information; and judging whether a storage device in the smart terminal fails based on the fault information of the smart terminal includes:

[0091] Based on the first fault information of the smart terminal, a fault type of the smart terminal is determined.

[0092] In the embodiment of the present disclosure, the first fault information can be used to determine the fault type of the smart terminal.

[0093] In some embodiments, the fault information further includes second fault information; and judging whether the storage device in the smart terminal fails based on the fault information of the smart terminal further includes:

[0094] Based on the second fault information and the fault type of the smart terminal, it is determined whether a storage device in the smart terminal fails.

[0095] In the embodiment of the present disclosure, the second fault information and the fault type of the smart terminal can be used to determine whether a storage device in the smart terminal fails.

[0096] As mentioned above, the intelligent terminal includes a storage device, and a failure of the storage device will cause the intelligent terminal to fail. Storage devices, such as DDR SRAM, are prone to data bit flip errors due to their structural particularity. That is, the data stored in the DDR SRAM changes from "0" to "1", or from "1" to "0". Furthermore, after a data bit flip error occurs in the storage device, it may cause virtual address confusion, thereby causing the intelligent terminal to fail.

[0097] However, whether the failure of the smart terminal is caused by a data bit flip error in the storage device needs to be judged through a fault detection mechanism. When a smart terminal fails, the first fault information provided by the fault detection mechanism is used to determine whether the failure of the smart terminal is caused by a virtual address disorder; if so, it is determined that the virtual address disorder causes the failure of the smart terminal, and the second fault information can be used for subsequent judgment process; if not, it is determined that the failure of the smart terminal has nothing to do with the virtual address disorder. When judging that the failure of the smart terminal is caused by the virtual address disorder, the second fault information provided by the fault detection mechanism is used to determine whether the virtual address disorder is caused by a data bit flip error in the storage device; if so, it is determined that the data bit flip error in the storage device causes the virtual address disorder, and then it is determined that the data bit flip error in the storage device causes the failure of the smart terminal; if not, it is determined that the virtual address disorder is unrelated to the data bit flip error in the storage device.

[0098] In some embodiments, when determining that a storage device in the smart terminal fails, updating historical statistical information of the storage device based on the operating frequency of the storage device includes:

[0099] When determining that the storage device fails, if the operating frequency point at which the storage device fails is not in the historical statistical information, adding the operating frequency point to the historical statistical information;

[0100] When determining that the storage device fails, if the operating frequency point at which the storage device fails is in the historical statistical information, the number of times the storage device fails at the operating frequency point is modified in the historical statistical information.

[0101] It should be noted that the operating frequency point refers to the gear of the operating frequency. For example, the frequency range in which the storage device can operate can be divided into several segments at intervals of frequency points, and each frequency point represents a section of the operating frequency range of the storage device, that is, each frequency point represents the operating frequency gear of the storage device. For the storage device, setting the operating frequency point of the storage device indicates that the storage device needs to operate within the operating frequency range corresponding to the operating frequency point.

[0102] In a specific example, the frequency range in which the storage device can operate may be, for example, 100 to 200, and the operable frequency range may be divided into five sections using, for example, five operating frequency points (i.e., 120, 140, 160, 180, and 200), namely, 100 to 120, 120 to 140, 140 to 160, 160 to 180, and 180 to 200. Among them, the operating frequency point 120 may represent the frequency range 100 to 120, the operating frequency point 140 may represent the frequency range 120 to 140, the operating frequency point 160 may represent the frequency range 140 to 160, the operating frequency point 180 may represent the frequency range 160 to 180, and the operating frequency point 200 may represent the frequency range 180 to 200. For the storage device, setting the operating frequency point of the storage device to 180 indicates that the storage device needs to operate in the frequency range 160 to 180. The disclosed embodiments do not specifically limit the frequency range in which the storage device can operate, and different types of storage devices can operate in different frequency ranges. The disclosed embodiments do not specifically limit the number of operating frequency points of the storage device, and the number of corresponding operating frequency points can be obtained according to the specifications of different types of storage devices.

[0103] In the embodiment of the present disclosure, when determining that a storage device in a smart terminal fails, the operating frequency of the storage device when the failure occurs is recorded. This is because whether the storage device fails is closely related to its operating frequency, and the storage device may frequently fail when operating at a certain operating frequency. By disabling these operating frequencies with high failure frequencies on the user side, the number of times that the smart terminal fails due to a storage device failure can be effectively reduced.

[0104] Here, each time it is determined that a storage device in the intelligent terminal fails, the historical statistical information of the storage device is updated; wherein the historical statistical information includes the working frequency and the number of times the storage device fails at the working frequency. For example, the historical statistical information of the storage device can be regarded as a statistical table, which includes two items, namely, the working frequency and the number of times the storage device fails at the corresponding working frequency. When it is determined for the first time that the storage device in the intelligent terminal fails, that is, the working frequency when the storage device fails is not in the statistical table, that is, there is no historical statistical information of the working frequency in the statistical table. At this time, the working frequency when the storage device fails can be recorded in the statistical table, and the number of failures corresponding to the working frequency is set to 1. When it is determined for the second time that a storage device in the smart terminal has failed, if the working frequency of the storage device when the failure occurs is not in the statistical table, that is, there is no historical statistical information of the working frequency in the statistical table, then the working frequency of the storage device when the failure occurs can be recorded in the statistical table, and the number of failures corresponding to the working frequency can be set to 1; if the working frequency of the storage device when the failure occurs is already in the statistical table, that is, the historical statistical information of the working frequency is already in the statistical table, then the statistical information of the working frequency can be modified in the statistical table, that is, the number of failures corresponding to the working frequency can be increased by 1.

[0105] In some embodiments, determining the selected operating frequency point based on the historical statistical information of the storage device includes:

[0106] Based on historical statistical information of the storage device, an operating frequency point at which the number of failures of the storage device is greater than a preset number is determined as a selected operating frequency point.

[0107] In the disclosed embodiment, the historical statistical information includes the operating frequency and the number of times the storage device fails at the corresponding operating frequency. If the number of failures corresponding to a certain operating frequency is greater than a preset number (for example, the preset number is 4), the operating frequency is determined as the selected operating frequency.

[0108] In the disclosed embodiment, the number of failures of the storage device at the selected working frequency is greater than the preset number, that is, the selected working frequency refers to the working frequency at which the probability of failure of the storage device is relatively high. In other words, the storage device may frequently fail at the selected working frequency, thereby causing the smart terminal to frequently fail, thereby affecting the normal use of the smart terminal by the user. The disclosed embodiment does not have any special restrictions on the preset number, and can be flexibly selected according to actual conditions.

[0109] In the embodiment of the present disclosure, the selected working frequency is disabled (or deleted) in the library of working frequencies to be selected of the storage device. In other words, in the subsequent use of the smart terminal, it is prohibited to operate the storage device under the selected frequency. In this way, in the subsequent use of the smart terminal, the storage device has fewer operable working frequencies. Of course, the fault handling method provided by the embodiment of the present disclosure includes two parts, the fault analysis of the smart terminal and the frequency disabling of the storage device. Among them, in the fault analysis of the smart terminal, it is necessary to determine whether the storage device in the smart terminal has failed on the basis of the failure of the smart terminal. In the frequency disabling of the storage device, each time the storage device fails, the working frequency when the storage device fails is recorded, and the working frequency with a higher number of storage device failures is determined as the selected working frequency; by disabling the selected working frequency at the user end, the number of smart terminal failures caused by storage device failures can be effectively reduced, thereby reducing the hardware replacement cost.

[0110] It should be noted that if all the operating frequencies of the storage device are determined as selected operating frequencies, then the storage device has no operable operating frequencies and the hardware of the smart terminal needs to be replaced.

[0111] Figure 2 The following is a flow chart of a fault handling method according to an exemplary embodiment. Figure 2 .like Figure 2 As shown, the method mainly includes the following steps:

[0112] In step 201, the system runs, that is, the intelligent terminal starts running.

[0113] Here, the intelligent terminal includes a storage device.

[0114] In step 202, it is determined whether there is any new detection value; if yes, step 203 is executed; if not, the process returns to step 201.

[0115] Here, when an abnormal restart or freeze of the intelligent terminal is detected, the fault detection mechanism is immediately called to save the fault scene; according to the detection value of the intelligent terminal by the fault detection mechanism, it is judged whether the intelligent terminal has a fault. The fault detection mechanism can be, for example, a kernel error mechanism, and the detection value can be, for example, a kernel error count. When the value of the kernel error count has not increased, it can be judged that the intelligent terminal has not failed; when the value of the kernel error count has increased, it can be judged that the intelligent terminal has failed.

[0116] In step 203, first fault information is captured.

[0117] Here, the fault detection mechanism is used to retain the fault scene and obtain the first fault information, wherein the first fault information can be used to determine the fault type of the smart terminal. For example, according to the first fault information, it can be determined whether the fault type of the smart terminal is virtual address disorder.

[0118] In step 204, it is determined whether the fault type of the intelligent terminal is virtual address disorder; if yes, step 205 is executed; if no, the fault handling method is terminated.

[0119] Here, judging whether the fault type of the intelligent terminal is a virtual address disorder is to further judge whether the virtual address disorder is caused by a data bit flip in the storage device, that is, to judge whether the intelligent terminal fails due to a data bit flip in the storage device. Therefore, when judging that the fault type of the intelligent terminal is a virtual address disorder, the steps of the fault handling method can be continued; when judging that the fault type of the intelligent terminal is not a virtual address disorder, the fault handling method can be terminated.

[0120] In step 205, the second fault information is captured to determine whether a data bit flip occurs in the storage device in the intelligent terminal; if yes, step 206 is executed; if no, the fault handling method is terminated.

[0121] Here, the fault detection mechanism is used to retain the fault scene and obtain the second fault information; wherein the second fault information can be used to determine whether the storage device in the intelligent terminal has a fault. Therefore, when it is determined that the fault type of the intelligent terminal is virtual address confusion, it can be further determined whether the virtual address confusion is caused by data bit flipping in the storage device, that is, whether the virtual address confusion is caused by data bit flipping in the storage device. Therefore, when it is determined that data bit flipping occurs in the storage device, the steps of the fault handling method can be continued; when it is determined that data bit flipping occurs in the storage device, the fault handling method can be terminated.

[0122] In step 206, historical statistical information of the storage device is updated.

[0123] Here, when determining that a storage device in the smart terminal fails, historical statistical information of the storage device is updated based on the operating frequency of the storage device, that is, the operating frequency and the number of times the storage device fails at the corresponding operating frequency are updated.

[0124] In step 207 , it is determined whether the number of failures of the storage device is greater than a preset number; if yes, step 208 is executed; if no, the process returns to step 201 .

[0125] Here, the historical statistical information includes the working frequency and the number of times the storage device fails at the corresponding working frequency. If the number of times the storage device fails at a certain working frequency is greater than the preset number, the working frequency can be determined as the selected working frequency; if the number of times the storage device fails at any working frequency is less than or equal to the preset number, the steps of the fault handling method can continue to be executed.

[0126] In step 208, the selected operating frequency is determined and the selected operating frequency is disabled.

[0127] Here, after the working frequency is determined, the selected working frequency can be deleted from the working frequency library to be selected in the storage device.

[0128] In the disclosed embodiment, each time a storage device fails, the operating frequency at the time of the storage device failure is recorded, and the operating frequency at which the storage device fails more frequently is determined as the selected operating frequency; disabling the selected operating frequency on the user side can effectively reduce the number of smart terminal failures caused by storage device failures, thereby reducing hardware replacement costs.

[0129] Figure 3 FIG. 1 is a block diagram of a fault handling device according to an exemplary embodiment. Figure 3 As shown, the fault handling device 300 mainly includes:

[0130] A first judgment module 301 is configured to judge whether the smart terminal fails based on the running state of the smart terminal;

[0131] The second judgment module 302 is configured to judge whether a storage device in the smart terminal fails based on a fault detection mechanism of the smart terminal when judging that the smart terminal fails;

[0132] The updating module 303 is configured to update the historical statistical information of the storage device based on the working frequency of the storage device when it is determined that the storage device in the intelligent terminal fails; wherein the historical statistical information includes the working frequency and the number of times the storage device fails at the working frequency;

[0133] A determination module 304, configured to determine a selected operating frequency point based on historical statistical information of the storage device;

[0134] The disabling module 305 is configured to disable the selected working frequency point in the working frequency point library to be selected in the storage device.

[0135] In some embodiments, the updating module 303 is configured to:

[0136] When determining that the storage device fails, if the operating frequency point at which the storage device fails is not in the historical statistical information, adding the operating frequency point to the historical statistical information;

[0137] When determining that the storage device fails, if the operating frequency point at which the storage device fails is in the historical statistical information, the number of times the storage device fails at the operating frequency point is modified in the historical statistical information.

[0138] In some embodiments, the determination module 304 is configured to:

[0139] Based on historical statistical information of the storage device, an operating frequency point at which the number of failures of the storage device is greater than a preset number is determined as a selected operating frequency point.

[0140] In some embodiments, the first determination module 301 is configured to:

[0141] Detecting whether the operation status of the intelligent terminal is abnormal;

[0142] When it is detected that the operation state of the smart terminal is abnormal, obtaining a detection value of the smart terminal based on a fault detection mechanism of the smart terminal;

[0143] Based on the detection value of the smart terminal, it is determined whether the smart terminal fails.

[0144] In some embodiments, the second determination module 302 is configured to:

[0145] When determining that the intelligent terminal fails, obtaining fault information of the intelligent terminal based on a fault detection mechanism of the intelligent terminal;

[0146] Based on the fault information of the smart terminal, it is determined whether a storage device in the smart terminal fails.

[0147] In some embodiments, the fault information includes first fault information; the second judgment module 302 is configured to:

[0148] Based on the first fault information of the smart terminal, a fault type of the smart terminal is determined.

[0149] In some embodiments, the fault information further includes second fault information; the second judgment module 302 is configured to:

[0150] Based on the second fault information and the fault type of the smart terminal, it is determined whether a storage device in the smart terminal fails.

[0151] Figure 48 is a hardware structure block diagram of a fault handling device according to an exemplary embodiment. For example, the device 800 may be a mobile phone, a mobile computer, or the like.

[0152] Reference Figure 4 , the device 800 may include one or more of the following components: a processing component 802 , a memory 804 , a power component 806 , a multimedia component 808 , an audio component 810 , an input / output (I / O) interface 812 , a sensor component 814 , and a communication component 816 .

[0153] The processing component 802 generally controls the overall operation of the device 800, such as operations associated with display, phone calls, data communications, camera operations, and recording operations. The processing component 802 may include one or more processors 820 to execute instructions to complete all or part of the steps of the above-mentioned method. In addition, the processing component 802 may include one or more modules to facilitate the interaction between the processing component 802 and other components. For example, the processing component 802 may include a multimedia module to facilitate the interaction between the multimedia component 808 and the processing component 802.

[0154] The memory 804 is configured to store various types of data to support operations on the device 800. Examples of such data include instructions for any application or method operating on the device 800, contact data, phone book data, messages, pictures, videos, etc. The memory 804 can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic disk or optical disk.

[0155] The power supply component 806 provides power to the various components of the device 800. The power supply component 806 may include a power management system, one or more power supplies, and other components associated with generating, managing, and distributing power for the device 800.

[0156] The multimedia component 808 includes a screen that provides an output interface between the device 800 and the user. In some embodiments, the screen may include a liquid crystal display (LCD) and a touch panel (TP). If the screen includes a touch panel, the screen may be implemented as a touch screen to receive input signals from the user. The touch panel includes one or more touch sensors to sense touch, slide, and gestures on the touch panel. The touch sensor may not only sense the boundaries of the touch or slide action, but also detect the duration and pressure associated with the touch or slide operation. In some embodiments, the multimedia component 808 includes a front camera and / or a rear camera. When the device 800 is in an operating mode, such as a shooting mode or a video mode, the front camera and / or the rear camera may receive external multimedia data. Each front camera and rear camera may be a fixed optical lens system or have a focal length and optical zoom capability.

[0157] The audio component 810 is configured to output and / or input audio signals. For example, the audio component 810 includes a microphone (MIC), and when the device 800 is in an operating mode, such as a call mode, a recording mode, and a speech recognition mode, the microphone is configured to receive an external audio signal. The received audio signal can be further stored in the memory 804 or sent via the communication component 816. In some embodiments, the audio component 810 also includes a speaker for outputting audio signals.

[0158] I / O interface 812 provides an interface between processing component 802 and peripheral interface modules, such as keyboards, click wheels, buttons, etc. These buttons may include but are not limited to: a home button, a volume button, a start button, and a lock button.

[0159] The sensor assembly 814 includes one or more sensors for providing various aspects of the status assessment of the device 800. For example, the sensor assembly 814 can detect the open / closed state of the device 800, the relative positioning of components, such as the display and keypad of the device 800, and the sensor assembly 814 can also detect the position change of the device 800 or a component of the device 800, the presence or absence of user contact with the device 800, the orientation or acceleration / deceleration of the device 800, and the temperature change of the device 800. The sensor assembly 814 may include a proximity sensor configured to detect the presence of a nearby object without any physical contact. The sensor assembly 814 may also include an optical sensor, such as a CMOS or CCD image sensor, for use in imaging applications. In some embodiments, the sensor assembly 814 may also include an accelerometer, a gyroscope sensor, a magnetic sensor, a pressure sensor, or a temperature sensor.

[0160] The communication component 816 is configured to facilitate wired or wireless communication between the device 800 and other devices. The device 800 can access a wireless network based on a communication standard, such as WiFi, 4G or 5G, or a combination thereof. In an exemplary embodiment, the communication component 816 receives a broadcast signal or broadcast-related information from an external broadcast management system via a broadcast channel. In an exemplary embodiment, the communication component 816 also includes a near field communication (NFC) module to facilitate short-range communication. For example, the NFC module can be implemented based on radio frequency identification (RFID) technology, infrared data association (IrDA) technology, ultra-wideband (UWB) technology, Bluetooth (BT) technology and other technologies.

[0161] In an exemplary embodiment, the apparatus 800 may be implemented by one or more application specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field programmable gate arrays (FPGAs), controllers, microcontrollers, microprocessors or other electronic components to perform the above method.

[0162] In an exemplary embodiment, a non-transitory computer-readable storage medium including instructions is also provided, such as a memory 804 including instructions, and the instructions can be executed by the processor 820 of the device 800 to perform the above method. For example, the non-transitory computer-readable storage medium can be a ROM, a random access memory (RAM), a CD-ROM, a magnetic tape, a floppy disk, an optical data storage device, etc.

[0163] A non-transitory computer-readable storage medium, when instructions in the storage medium are executed by a processor of a fault processing device, enables the fault processing device to perform a fault processing method, the method comprising:

[0164] Based on the running state of the smart terminal, determining whether the smart terminal fails;

[0165] When determining that the intelligent terminal fails, determining whether a storage device in the intelligent terminal fails based on a fault detection mechanism of the intelligent terminal;

[0166] When determining that a storage device in the smart terminal fails, updating historical statistical information of the storage device based on the operating frequency of the storage device; wherein the historical statistical information includes the operating frequency and the number of times the storage device fails at the operating frequency;

[0167] Determining a selected operating frequency based on historical statistical information of the storage device;

[0168] The selected operating frequency point is disabled in the candidate operating frequency point library of the storage device.

[0169] Those skilled in the art will readily appreciate other embodiments of the present disclosure after considering the specification and practicing the invention disclosed herein. The present disclosure is intended to cover any variations, uses or adaptations of the present disclosure that follow the general principles of the present disclosure and include common knowledge or customary techniques in the art that are not disclosed in the present disclosure. The description and examples are to be considered exemplary only, and the true scope and spirit of the present disclosure are indicated by the following claims.

[0170] It should be understood that the present disclosure is not limited to the exact structures that have been described above and shown in the drawings, and that various modifications and changes may be made without departing from the scope thereof. The scope of the present disclosure is limited only by the appended claims.

Claims

1. A fault handling method, characterized in that: The method is applied to an intelligent terminal including a storage device, and the method includes: Based on the running state of the smart terminal, determining whether the smart terminal fails; When determining that the intelligent terminal fails, determining whether a storage device in the intelligent terminal fails based on a fault detection mechanism of the intelligent terminal; When determining that a storage device in the smart terminal fails, updating historical statistical information of the storage device based on the operating frequency of the storage device; wherein the historical statistical information includes the operating frequency and the number of times the storage device fails at the operating frequency; Determining a selected operating frequency based on historical statistical information of the storage device; The selected operating frequency point is disabled in the candidate operating frequency point library of the storage device.

2. The fault handling method according to claim 1, characterized in that: When determining that a storage device in the intelligent terminal fails, updating historical statistical information of the storage device based on the working frequency of the storage device includes: When determining that the storage device fails, if the operating frequency point at which the storage device fails is not in the historical statistical information, adding the operating frequency point to the historical statistical information; When determining that the storage device fails, if the operating frequency point at which the storage device fails is in the historical statistical information, the number of times the storage device fails at the operating frequency point is modified in the historical statistical information.

3. The fault handling method according to claim 1, characterized in that: The determining of the selected operating frequency point based on the historical statistical information of the storage device includes: Based on historical statistical information of the storage device, an operating frequency point at which the number of failures of the storage device is greater than a preset number is determined as a selected operating frequency point.

4. The fault handling method according to claim 1, characterized in that: The determining whether the intelligent terminal fails based on the running state of the intelligent terminal includes: Detecting whether the operation status of the intelligent terminal is abnormal; When it is detected that the operation state of the smart terminal is abnormal, obtaining a detection value of the smart terminal based on a fault detection mechanism of the smart terminal; Based on the detection value of the smart terminal, it is determined whether the smart terminal fails.

5. The fault handling method according to claim 4, characterized in that: When determining that the intelligent terminal fails, determining whether a storage device in the intelligent terminal fails based on a fault detection mechanism of the intelligent terminal includes: When determining that the intelligent terminal fails, obtaining fault information of the intelligent terminal based on a fault detection mechanism of the intelligent terminal; Based on the fault information of the smart terminal, it is determined whether a storage device in the smart terminal fails.

6. The fault handling method according to claim 5, characterized in that: The fault information includes first fault information; and judging whether a storage device in the smart terminal fails based on the fault information of the smart terminal includes: Based on the first fault information of the smart terminal, a fault type of the smart terminal is determined.

7. The fault handling method according to claim 6, characterized in that: The fault information further includes second fault information; and judging whether the storage device in the smart terminal fails based on the fault information of the smart terminal further includes: Based on the second fault information and the fault type of the smart terminal, it is determined whether a storage device in the smart terminal fails.

8. A fault handling device, characterized in that: The device comprises: A first judgment module is configured to judge whether the smart terminal fails based on the running state of the smart terminal; A second judgment module is configured to judge whether a storage device in the smart terminal fails based on a fault detection mechanism of the smart terminal when judging that the smart terminal fails; An updating module, configured to update historical statistical information of the storage device based on the working frequency of the storage device when it is determined that the storage device in the intelligent terminal fails; wherein the historical statistical information includes the working frequency and the number of times the storage device fails at the working frequency; A determination module configured to determine a selected operating frequency point based on historical statistical information of the storage device; A disabling module is configured to disable the selected working frequency point in the working frequency point library to be selected in the storage device.

9. A fault handling device, characterized in that: The device comprises: processor; a memory for storing processor-executable instructions; The processor is configured to: implement the steps in the fault handling method according to any one of claims 1 to 7 when executed.

10. A non-transitory computer-readable storage medium, characterized in that: When the instructions in the storage medium are executed by a processor in a fault processing device, the fault processing device is enabled to execute the steps in the fault processing method as claimed in any one of claims 1 to 7.

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