Chip pin coplanarity detection device
By designing a chip pin detection device including detection lens, microscope and adjustment components, the problems of low detection accuracy and long time in the prior art are solved, and efficient and accurate chip pin detection is achieved.
Patent Information
- Application Number
- CN202411986514.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-31
- Publication Date
- 2025-04-15
AI Technical Summary
The prior art lacks effective measurement methods to detect the lifting of gull airfoil and J-type chip pins, resulting in low detection accuracy and long time.
A detection device for chip pin coplanarity is designed, including a support base plate, a detection table, a positioning baffle, an adjustment assembly and a microscope. By combining the detection lens and the microscope, high-precision detection and observation of the chip pins can be achieved. The adjustment component realizes uniform movement of the microscope through the linkage of the driven gear bar and the driving gear, and supports batch detection.
It improves the efficiency and accuracy of chip pin detection, shortens the detection time, and enhances the convenience and working efficiency of the device.
Smart Images
Figure CN119826736A_ABST
Abstract
Description
Technical Field
[0001] The invention relates to the technical field of chip coplanarity detection, and in particular to a device for detecting the coplanarity of chip pins. Background Art
[0002] Due to quality control requirements, chips must be 100% screened, but the pins of gull-wing and J-type chips may be deformed and lifted during the screening process. After reflow soldering, some pins of gull-wing and J-type chips may be poorly soldered, which is manifested as some pins lifting off the pad and cold soldering. Cold soldering refers to insufficient soldering strength, which can be removed with tweezers.
[0003] Currently, there is no good measurement method for the lifted pins of gull-wing and J-shaped chips. Most of them are observed after the chip has problems, and then the problem points of the chip pins are found out by combining the troubleshooting analysis in the debugging stage, and then the problem positions can be repaired, which is time-consuming and not very accurate. Summary of the invention
[0004] The main purpose of the present invention is to provide a device for detecting the coplanarity of chip pins, which can effectively solve the problems in the background technology.
[0005] To achieve the above object, the technical solution adopted by the present invention is: A chip pin coplanarity detection device comprises a supporting base plate and a detection platform, characterized in that: it also comprises a positioning baffle, an adjustment component and a microscope; the detection platform is a rectangular parallelepiped structure, and the detection platform is horizontally placed on the board surface of the supporting base plate; the top surface of the detection platform is horizontal and is provided with a detection lens with high flatness, the mirror surface of the detection lens faces upward, the back of the detection lens is in contact with the top surface of the detection platform, and the area of the detection lens is larger than the projection area of the chip as a whole; the positioning baffle is arranged on one side of the detection platform, and the adjustment component is arranged on the other side of the detection platform; The positioning baffle is placed on one side of the detection lens, and the side of the positioning baffle is perpendicular to the detection lens; The adjustment component comprises a horizontal slide rail and a slider, a microscope is arranged on the slider via a connecting piece, and the lens of the microscope is aligned with the detection lens.
[0006] Furthermore, the positioning baffle includes a vertical longitudinal plate and a horizontal transverse plate, the longitudinal plate is vertically fixed on the plate surface of the supporting bottom plate, and the transverse plate is placed on one side of the detection lens. The height of the transverse plate is higher than the height of the detection lens, and the side of the transverse plate is perpendicular to the detection lens.
[0007] Furthermore, the adjustment component includes a horizontally placed connecting cross plate and a sliding block, a cavity is opened in the middle of the sliding block, a sliding groove is provided below the sliding block, the cavity and the sliding groove are connected to each other; the connecting cross plate passes through the sliding grooves; the sliding block can move horizontally on the connecting cross plate; the sliding block is fixed to the microscope through a connecting piece.
[0008] Furthermore, a driven gear bar is laid on the connecting cross plate, a cavity is set in the middle of the sliding block, a driving gear is set in the cavity through a linkage rod, and the driving gear can rotate in the cavity with the linkage rod as the axis; the connecting cross plate laid with the sliding driven gear bar passes through the cavity of the sliding block; the driven gear bar is meshed below the driving gear.
[0009] Furthermore, a rotating handle is provided at one end of the linkage rod.
[0010] Furthermore, symmetrical support seats are respectively arranged at the two ends below the connecting transverse plate, and the bottom of the support seats is fixed to the supporting bottom plate by bolts. A spacing is left between the connecting transverse plate and the supporting bottom plate.
[0011] Furthermore, the slider of the adjustment component is connected to the microscope via a microscope connecting component; an adjustment rod is arranged in the middle of the microscope connecting component, a rotating handle is arranged at one end of the adjustment rod, and the microscope is mounted on the other end of the adjustment rod via a bracket.
[0012] Furthermore, anti-skid support feet are installed at the bottom of the supporting base plate.
[0013] Compared with the prior art, the present invention has the following beneficial effects: 1. The detection table and detection lens are provided to facilitate the detection of chip pins, and the chip pins on the detection lens are observed through the provided microscope to improve the detection efficiency, and the adjustment of the microscope is achieved through the provided adjustment lever to improve the convenience of using the device; 2. The microscope position can be moved by means of the provided adjustment component. By rotating the handle, the linkage rod drives the active gear to rotate, so that the active gear drives the sliding block to slide along the driven gear bar and the connecting cross plate, thereby realizing the uniform speed movement of the microscope, which is convenient for batch detection and observation of chip pins by the microscope and improves work efficiency. BRIEF DESCRIPTION OF THE DRAWINGS
[0014] Figure 1 It is a schematic diagram of the overall structure of the device of the present invention; Figure 2 It is a schematic structural diagram of the overall bottom of the device of the present invention; Figure 3 It is a structural schematic diagram of the detection platform of the present invention; Figure 4 It is a schematic diagram of the structure of the regulating component of the present invention.
[0015] In the figure: 1. Support base plate; 2. Anti-skid support feet; 3. Test table; 4. Test lens; 5. Positioning baffle; 6. Microscope; 7. Microscope connecting assembly; 8. Adjustment lever; 9. Rotating handle; 10. Adjustment assembly; 11. Support seat; 12. Connecting cross plate; 13. Sliding block; 14. Sliding groove; 15. Cavity; 16. Driving gear; 17. Driven gear bar; 18. Linkage rod; 19. Rotating handle. DETAILED DESCRIPTION
[0016] In order to make the technical means, creative features, objectives and effects achieved by the present invention easy to understand, the present invention is further explained below in conjunction with specific implementation methods.
[0017] In the present invention, the chip mainly refers to a gull-wing type and a J-type chip.
[0018] Embodiment 1 See also Figure 1 , Figure 2 , Figure 3 As shown, the detection device for the coplanarity of chip pins includes a supporting base plate 1, a detection platform 3, a positioning baffle 5 and an adjustment component 10. The detection platform 3 is a rectangular parallelepiped structure. The detection platform 3 is horizontally placed on the board surface of the supporting base plate 1. The top surface of the detection platform 3 is horizontal and is provided with a detection lens 4 with high flatness. The mirror surface of the detection lens 4 faces upward, and the back of the detection lens 4 is in contact with the top surface of the detection platform 3. The positioning baffle 5 is arranged on the board surface of the supporting base plate 1 on one side of the detection platform 3, and the adjustment component 10 is arranged on the board surface of the supporting floor 1 on the other side of the detection platform 3. The bottom of the supporting base plate 1 is installed with an anti-slip support foot 2.
[0019] It should be noted that when detecting the chip pins, the entire chip will be placed on the detection lens 4, so the area of the detection lens 4 is larger than the projection area of the entire chip.
[0020] The positioning baffle 5 includes a vertical longitudinal plate and a horizontal transverse plate. The longitudinal plate is vertically fixed on the plate surface of the supporting base plate 1, and the transverse plate is placed on one side of the detection lens 4. The height of the transverse plate is higher than the height of the detection lens 4, and the side of the transverse plate is perpendicular to the detection lens 4. The purpose of this arrangement is that when the chip is placed on the detection lens 4, the side without the pin can be against the side of the transverse plate, which plays a role in positioning and limiting.
[0021] The adjustment component 10 includes a horizontal slide rail and a slider, and a microscope 6 is provided on the slider through a connector. The lens of the microscope 6 is aligned with the detection lens 4. The microscope 6 can move horizontally on the slide rail along with the slider, that is, the lens of the microscope 6 can move horizontally to observe the chip placed on the detection lens 4. The microscope 6 is connected to an external machine. When the chip is placed on the detection lens 4, the microscope 6 aligned with the detection lens 4 transmits the chip pins and the imaging of the pins on the mirror surface to the external machine, and the external machine can obtain twice the degree of pin warping through imaging. Article 4.1.4 of GJB3243-98 "Requirements for Surface Installation of Electronic Components" clearly requires that "the coplanarity error of the leads of components should not be greater than 0.1mm", so if the degree of warping is more than 0.2mm, the coplanarity of the pins is judged to be unqualified.
[0022] Embodiment 2 is based on embodiment 1.
[0023] like Figure 1 and Figure 4 As shown, the adjustment assembly 10 includes a horizontally placed connecting horizontal plate 12 and a sliding block 13. A cavity 15 is provided in the middle of the sliding block 13, and a sliding groove 14 is provided below the sliding block 13. The cavity 15 and the sliding groove 14 are connected to each other. The connecting horizontal plate 12 passes through the sliding grooves 14. The sliding block 13 can move horizontally on the connecting horizontal plate 12. The sliding block 13 is fixed with a microscope 6 through a connecting member.
[0024] Embodiment 3 is based on embodiment 2.
[0025] like Figure 1 , Figure 2 and Figure 4 As shown, the adjustment assembly 10 includes a horizontally placed connecting cross plate 12 and a sliding block 13. A driven gear bar 17 is laid on the connecting cross plate 12. A cavity 15 is provided in the middle of the sliding block 13, and a driving gear 16 is provided in the cavity 15 through a linkage rod 18. The driving gear 16 can rotate in the cavity 15 with the linkage rod 18 as an axis. The connecting cross plate 12 on which the sliding driven gear bar 17 is laid passes through the cavity 15 of the sliding block 13. The driven gear bar 17 is meshed below the driving gear 16. A rotating handle 19 is provided at one end of the linkage rod 18. Operating the rotating handle 19 can make the driving gear 16 drive the sliding block 13 to move horizontally on the driven gear bar 17. The sliding block 13 is fixed with a microscope 6 through a connecting piece. The position of the microscope 6 is moved by the provided adjustment component 10. By rotating the handle 19, the linkage rod 18 drives the driving gear 16 to rotate, so that the driving gear 16 drives the sliding block 13 to slide along the driven gear bar 17 and the connecting cross plate 12, thereby realizing the uniform speed movement of the microscope 6, thereby facilitating the batch detection and observation of chip pins by the microscope 6 and improving work efficiency.
[0026] Embodiment 4 is based on embodiment 2.
[0027] like Figure 4 As shown, symmetrical support seats 11 are respectively provided at both ends below the connecting transverse plate 12, and the bottom of the support seat 11 is fixed to the supporting bottom plate 1 by bolts. A spacing is left between the connecting transverse plate 12 and the supporting bottom plate 1.
[0028] Embodiment 5 is based on embodiment 1.
[0029] like Figure 4 As shown, the slide block of the adjustment component 10 is connected to the microscope 6 through the microscope connection component 7. An adjustment rod 8 is arranged in the middle of the microscope connection component 7, and a rotating handle 9 is arranged at one end of the adjustment rod 8, and the microscope 6 is mounted on the other end of the adjustment rod 8 through a bracket. The rotating handle 9 can drive the adjustment rod 8 to drive the microscope 6 to adjust the lens angle. The rotating handle 9 is arranged adjacent to the rotating handle 19.
[0030] It should be noted that the present invention is a gull-wing type and J-type chip coplanarity detection device. When in use, the chip to be detected is prevented from being on the detection lens 4, so that the detection lens 4 can irradiate the pins on the chip, and the projection of the chip and the chip pins is projected on the detection lens 4. The chip pins are penetrated and detected by the set microscope 6. At the same time, the rotating handle 19 is rotated to drive the rotating handle 19 to drive the linkage rod 18 and the driving gear 16 to rotate. The driving gear 16 rotates inside the sliding block 13, and the driving gear 16 and the driven gear bar 17 are meshed with each other, so that the driving gear 16 drives the sliding block 13 to move above the driven gear bar 17. The bottom of the driven gear bar 17 is fixedly connected with a connecting cross plate 12, and the sliding block 13 is sleeved on the outside of the connecting cross plate 12, so that the sliding block 13 drives the microscope 6 to move at a uniform speed during the movement, so that the microscope 6 can realize batch detection of chip pins, improve the working efficiency of the device, and when the pin height is unqualified, the staff uses an anti-static correction tool to correct the pin.
Claims
1. A device for detecting the coplanarity of chip pins, comprising a supporting base plate (1) and a detection platform (3), characterized in that: It also includes a positioning baffle (5), an adjustment component (10) and a microscope; the detection platform (3) is a rectangular parallelepiped structure, and the detection platform (3) is horizontally placed on the board surface of the supporting bottom plate (1); the top surface of the detection platform (3) is horizontal and is provided with a detection lens (4) with high flatness, the mirror surface of the detection lens (4) faces upward, the back surface of the detection lens (4) is in contact with the top surface of the detection platform (3), and the area of the detection lens (4) is larger than the projection area of the chip as a whole; the positioning baffle (5) is arranged on one side of the detection platform (3), and the adjustment component (10) is arranged on the other side of the detection platform (3); The positioning baffle (5) is placed on one side of the detection lens (4), and the side surface of the positioning baffle (5) is perpendicular to the detection lens (4); The adjustment component (10) comprises a horizontal slide rail and a slider, a microscope (6) being arranged on the slider via a connecting piece, and a lens of the microscope (6) is aligned with the detection lens (4).
2. A chip pin coplanarity detection device as claimed in claim 1, characterized in that: The positioning baffle (5) comprises a vertical longitudinal plate and a horizontal transverse plate, the longitudinal plate being vertically fixed on the plate surface of the supporting base plate (1), the transverse plate being placed on one side of the detection lens (4), the height of the transverse plate being higher than the height of the detection lens (4), and the side surface of the transverse plate being perpendicular to the detection lens (4).
3. A chip pin coplanarity detection device as claimed in claim 1, characterized in that: The adjustment assembly (10) comprises a horizontally placed connecting transverse plate (12) and a sliding block (13); a cavity (15) is provided in the middle of the sliding block (13); a sliding groove (14) is provided below the sliding block (13); the cavity (15) and the sliding groove (14) are communicated with each other; the connecting transverse plate (12) passes through the sliding grooves (14); the sliding block (13) can move horizontally on the connecting transverse plate (12); and the sliding block (13) is fixed with a microscope (6) via a connecting member.
4. A chip pin coplanarity detection device as claimed in claim 3, characterized in that: A driven gear bar (17) is laid on the connecting transverse plate (12); a cavity (15) is provided in the middle of the sliding block (13); a driving gear (16) is provided in the cavity (15) via a linkage rod (18); the driving gear (16) can rotate in the cavity (15) with the linkage rod (18) as an axis; the connecting transverse plate (12) on which the sliding driven gear bar (17) is laid passes through the cavity (15) of the sliding block (13); and the driven gear bar (17) is meshed with the lower part of the driving gear (16).
5. A chip pin coplanarity detection device as claimed in claim 4, characterized in that: A rotating handle (19) is provided at one end of the linkage rod (18).
6. A chip pin coplanarity detection device as claimed in claim 3, characterized in that: Symmetrical support seats (11) are respectively provided at the two ends below the connecting transverse plate (12); the bottom of the support seat (11) is fixed to the supporting bottom plate (1) by bolts; and a distance is left between the connecting transverse plate (12) and the supporting bottom plate (1).
7. A chip pin coplanarity detection device as claimed in claim 1, characterized in that: The slide block of the adjustment component (10) is connected to the microscope (6) via the microscope connection component (7); an adjustment rotating rod (8) is arranged in the middle of the microscope connection component (7), and a rotating handle (9) is arranged at one end of the adjustment rotating rod (8); the microscope (6) is mounted on the other end of the adjustment rotating rod (8) via a bracket.
8. A chip pin coplanarity detection device as claimed in claim 1, characterized in that: Anti-skid support feet (2) are installed at the bottom of the supporting base plate (1).