Multi-temperature and multi-frequency-point measurement method for unattended to-be-measured material

Abstract

The invention discloses a multi-temperature and multi-frequency-point measurement method for an unattended to-be-measured material, relates to the technical field of material measurement, and solves the problem that in the actual processing process, when the same frequency point is singly used for signal measurement, the measurement precision error is large. According to the invention, through innovative in-depth analysis of the scattered signal waves, the optimal frequency points at different environment temperatures can be accurately identified according to the law characteristics presented by the scattered signal waves when the density of the medium in the material is uniform and stable; compared with a traditional measurement mode of fixed frequency points or blind test frequency points, the method for selecting the frequency points based on the self characteristic feedback of the material greatly improves the pertinence of measurement, so that the subsequent acquisition of S parameter data is more accurate, and a solid foundation is provided for accurate analysis of the electromagnetic performance of the material.

Description

Technical Field

[0001] The invention relates to the technical field of material measurement, and in particular to an unattended multi-temperature and multi-frequency point measurement method for a material to be measured. Background Art

[0002] By setting up basic information such as multiple temperatures and multiple frequency points that need to be measured through the host computer software, the system control software will automatically control the high and low temperature environment through high and low temperature controllers to heat up, cool down, and maintain the temperature. After the sensor determines that the ambient temperature is stable, the microwave millimeter wave electronic measuring instrument is controlled to collect S parameter data, and the electromagnetic parameters of the material to be tested are obtained by inversion calculation and automatically saved. The overall multi-temperature and multi-frequency measurement does not require manual operation, realizing unattended automated testing.

[0003] The patent application with the publication number CN115639767A discloses a monitoring method for an unattended automatic test system, which includes: a two-level alarm mechanism, namely, an onboard watchdog alarm and an independent timer alarm; the unattended automatic test system establishes a communication connection with the alarm device to realize data transmission; the unattended automatic test system sends a start command through a communication cable, and the alarm device starts working; if the alarm device receives the wrong serial number for three consecutive times or does not receive the serial number, the onboard watchdog alarms and sends an alarm signal; if the alarm device does not receive a reset signal within 1 hour, the independent timer alarms and sends an alarm signal. The present invention can realize the monitoring system operation status when the automatic test system is running and unattended, and alarms when the automatic test system fails. The automatic test system receives the alarm signal, cuts off the external power supply, and ensures the safety of the product being tested.

[0004] When measuring the frequency of the material to be tested, the different parameter data associated with different frequency intensities are generally determined based on the corresponding multi-point temperature data. However, in the actual measurement process, due to the different properties of different materials, the optimal frequency intensities used by some materials will be different. Therefore, in the actual processing process, when the same frequency point is used for signal measurement, it will cause a large measurement accuracy error, and the frequency measurement accuracy of the material cannot be effectively guaranteed. Summary of the invention

[0005] In view of the shortcomings of the prior art, the present invention provides an unattended multi-temperature and multi-frequency measurement method for the material to be tested, which solves the problem of large measurement accuracy errors when using a single frequency point for signal measurement in the actual processing process.

[0006] To achieve the above objectives, the present invention is implemented by the following technical solutions: a method for unattended multi-temperature and multi-frequency measurement of a material to be tested, comprising the following steps:

[0007] Step 1: After the material to be tested is placed and fixed, multi-frequency point measurement is preferably performed at the same ambient temperature. Based on the preset multi-frequency point interval, the frequency point signal wave of the relevant frequency point is generated. Then, based on the scattered signal wave received during the measurement process, the regular band existing in the scattered signal wave is confirmed. The specific sub-steps are as follows:

[0008] S11, the tested temperature is preferentially adjusted to the initial ambient temperature, wherein the initial ambient temperature is the preset temperature. After the initial ambient temperature is set, a microwave millimeter wave electronic instrument is used to generate frequency signal waves with different frequency intensities, and the corresponding frequency signal waves are used to measure the material to be tested, confirm the scattered signal waves, and receive different scattered signal waves associated with the different frequency signal waves;

[0009] S12, performing regular segment analysis on different scattered signal waves: starting from the initial point of the scattered signal wave, confirming the subsequent peak points, the waveform trend of the front end of the peak point rises, and the waveform trend of the rear end falls, and the waveform segment between adjacent peak points is marked as a related band;

[0010] Starting from the first group of confirmed related bands, perform horizontal translation to identify whether there are completely overlapping related bands in the future. If so, mark this related band as a regular band. If not, start from the second group of related bands and confirm the regular bands in the future. Repeat this process until a regular band is determined. If no completely overlapping related bands are confirmed, mark this scattered signal wave as an irregular wave.

[0011] Step 2: For the scattered signal wave without a regular band, confirm the frequency signal wave associated with the scattered signal wave, and adjust the wave velocity of the frequency signal wave by controlling the microwave millimeter wave electronic instrument to change the wavelength of the frequency signal wave. Based on the comprehensive performance of the wavelength of the frequency signal wave and the wavelength of the scattered signal wave, lock the synchronization band in the scattered signal wave, and determine the characteristic value associated with the scattered signal wave based on the synchronization band. The specific method is as follows:

[0012] S21, confirm the frequency signal wave associated with the scattered signal wave, keep the frequency strength of the frequency signal wave unchanged, and gradually increase its wave speed, increasing one unit wave speed per unit time, wherein the unit time and the unit wave speed are both preset values, which are prepared in advance by relevant operators based on experience, and based on the real-time changing wave speed, confirm the real-time changing wavelength of the frequency signal wave, wherein the wavelength = wave speed ÷ frequency strength;

[0013] Confirm the increasing period associated with the gradual increase of the wave velocity, and mark the scattered signal wave associated with the increasing period as the wave to be processed;

[0014] S22, based on the coordinate system of the wave to be processed, generate a set of parallel lines parallel to the horizontal coordinate axis, and gradually translate the parallel lines from bottom to top, and record the waveform points located on the rising trend segment during the translation process, and each different translation process generates a series of waveform points parallel to the horizontal coordinate axis;

[0015] S23, processing the plurality of groups of waveform points generated by the single group translation process: based on the waveform points recorded in sequence, confirming the adjacent waveform points and synchronously confirming the wavelengths between the adjacent waveform points, and sequentially sorting the confirmed wavelengths according to the waveform points that appear in sequence, identifying the increase value of the latter group of wavelengths compared to the former group of wavelengths in the adjacent wavelengths, calibrating the adjacent wavelengths with the same increase value as the standard wavelength, otherwise, no calibration is performed;

[0016] S24, the other translation processes are processed in the same manner to determine the standard waveform points, and based on the several groups of standard waveform points determined in the wave to be processed, the waveform segments generated between the continuous standard waveform points are calibrated as synchronization bands;

[0017] S25, confirming the line length ratio of the synchronization band in the wave to be processed, calibrating the line length of the synchronization band as L1, calibrating the line length of the wave to be processed as L2, using: line length ratio = L1 ÷ L2 to confirm the line length ratio of the synchronization band, and using the confirmed line length ratio as the characteristic value associated with the scattered signal wave;

[0018] Step 3: For scattered signal waves with regular bands or synchronous bands, the optimal frequency point belonging to this ambient temperature is selected from scattered signal waves associated with frequency signal waves with different frequency strengths based on the regular performance of several scattered signal waves. The specific sub-steps are:

[0019] S31. Under the same ambient temperature, different scattered signal waves associated with signal waves at different frequencies are extracted, and then the band proportions of the corresponding scattered signal waves are identified from the different scattered signal waves:

[0020] For a single group of scattered signal waves, first determine the regular band length in this single group of scattered signal waves and mark it as L i , where i represents different scattered signal waves, and then the overall waveform length of a single group of scattered signal waves is confirmed and calibrated as Z i ;

[0021] Adopt B i =L i ÷Z i Confirm the band proportion B in the corresponding scattered signal wave i ;

[0022] S32. Confirm different proportion values ​​B associated with different scattered signal wavesi Or characteristic value, from several proportion values ​​B i or characteristic values, selecting the scattered signal wave associated with the maximum value, and determining the frequency point signal wave associated with the scattered signal wave, and taking the frequency point associated with the frequency point signal wave as the optimal frequency point of the ambient temperature;

[0023] Step 4: gradually increase the ambient temperature, and use the same method from step 1 to step 3 for different ambient temperatures to determine the optimal frequency points associated with different ambient temperatures;

[0024] Based on the optimal frequency points associated with different ambient temperatures, the ambient temperature of the material to be tested is adjusted starting from the lowest ambient temperature, so that the ambient temperature is adjusted from the lowest value to the highest value, and a frequency signal corresponding to the optimal frequency point is emitted to the material to be tested through a microwave millimeter wave electronic instrument, and the scattered signal generated by the interaction between the frequency signal and the material to be tested is received, and the captured scattered signal is converted into a digital signal, and then based on the different digital signals associated with different ambient temperatures, several groups of digital signals are sorted and displayed.

[0025] The present invention provides an unattended multi-temperature and multi-frequency measurement method for a material to be tested. Compared with the prior art, it has the following beneficial effects:

[0026] The present invention can accurately identify the optimal frequency under different ambient temperatures by innovatively and deeply analyzing the scattered signal wave and according to the regular characteristics of the scattered signal wave when the density of the medium inside the material is uniform and stable. Compared with the traditional measurement method of fixed frequency or blindly testing the frequency, this method of selecting the frequency based on the feedback of the material's own characteristics greatly improves the pertinence of the measurement, making the subsequent S parameter data collection more accurate, and providing a solid foundation for the accurate analysis of the electromagnetic properties of the material.

[0027] By gradually increasing the ambient temperature in an orderly manner and repeating the confirmation and data collection process of the optimal frequency at each temperature node, the electromagnetic response changes of the material to be tested under different thermal conditions can be systematically obtained. The S parameter data at different temperatures are combined, just like drawing a comprehensive electromagnetic "portrait" for the material. Whether it is material R&D personnel exploring the influence of temperature on the electromagnetic properties of new materials, or electronic engineers evaluating the transmission and reflection characteristics of materials for microwave and millimeter wave signals in a complex operating temperature range, it can provide detailed and reliable data support, which will effectively promote technological innovation and product optimization in related fields. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] Figure 1 It is a schematic diagram of the process of the present invention. DETAILED DESCRIPTION

[0029] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0030] See also Figure 1 The present application provides an unattended multi-temperature and multi-frequency measurement method for a material to be tested. The instrument first transmits microwave and millimeter wave signals of a specific frequency to a measuring fixture containing the material to be tested. These signals interact with the material to be tested to generate scattered signals. The instrument captures these scattered signals through its high-precision receiving antenna and uses a built-in analog-to-digital converter to convert the analog scattered signals into digital signals. After a series of complex pre-processing operations such as signal conditioning, filtering, and amplification, S parameter data that can accurately characterize the electromagnetic properties of the material is finally obtained, including the following steps:

[0031] Step 1: After the material to be tested is placed and fixed, multi-frequency point measurement is preferably performed at the same ambient temperature. Based on the preset multi-frequency point interval, a frequency point signal wave of the relevant frequency point is generated, and then based on the scattered signal wave received during the measurement process, the regular band existing in the scattered signal wave is confirmed. Specifically, when the medium density in the specified area inside the material to be tested is relatively uniform and relatively stable, when the frequency point signal wave is input, the generated scattered signal wave will also be returned in a regular form. Frequency point signal waves of different intensities can make the corresponding scattered signal wave return in different regular forms. When the regular form segment returned by the corresponding scattered signal wave is at the maximum, it means that the frequency point associated with the corresponding temperature is the optimal frequency point. This frequency point can be directly used for subsequent measurement to fully guarantee the numerical accuracy of the corresponding material to be tested.

[0032] The specific sub-steps for confirming the regular waveform in the scattered signal wave are as follows:

[0033] S11. The tested temperature is preferentially adjusted to the initial ambient temperature, and the initial ambient temperature is a preset temperature, which is set by relevant operators based on experience. After the initial ambient temperature is set, a microwave millimeter wave electronic instrument is used to generate frequency signal waves with different frequency intensities, and the frequency intensities of the frequency signal waves are generally 10 GHz, 15 GHz, 20 GHz, 25 GHz, and 30 GHz. The corresponding frequency signal waves are used to measure the material to be tested, confirm the scattered signal waves, and receive different scattered signal waves associated with different frequency signal waves;

[0034] S12, performing regular segment analysis on different scattered signal waves: starting from the initial point of the scattered signal wave, confirming the subsequent peak points, the waveform trend of the front end of the peak point rises, and the waveform trend of the rear end falls, and the waveform segment between adjacent peak points is marked as a related band;

[0035] Starting from the first group of confirmed related bands, perform horizontal translation to identify whether there are completely overlapping related bands in the future. If so, mark this related band as a regular band. If not, start from the second group of related bands and confirm the regular bands in the future. Repeat this process until a regular band is determined. If no completely overlapping related bands are confirmed, mark this scattered signal wave as an irregular wave.

[0036] Specifically, after the scattered signal wave is generated, the corresponding waveform segment can be confirmed from the peak points. If there is a corresponding regular waveform, starting from the first regular waveform, the subsequent regular waveforms can be confirmed by gradually shifting backwards. Similarly, it can be confirmed whether the scattered signal wave has a regular waveform segment. The frequency point with a regular waveform segment can be used to confirm the optimal frequency point. The frequency point without a regular waveform segment needs to be readjusted and optimized to confirm the optimal frequency point.

[0037] Step 2: for the scattered signal wave without a regular band, confirm the frequency signal wave associated with the scattered signal wave, and adjust the wave velocity of the frequency signal wave by controlling the microwave millimeter wave electronic instrument to change the wavelength of the frequency signal wave, lock the synchronization band in the scattered signal wave based on the comprehensive performance of the wavelength of the frequency signal wave and the wavelength of the scattered signal wave, and determine the characteristic value associated with the scattered signal wave based on the synchronization band;

[0038] The specific method of locking the synchronization band in this scattered signal wave is:

[0039] S21, confirm the frequency signal wave associated with the scattered signal wave, keep the frequency strength of the frequency signal wave unchanged, increase its wave speed gradually, increase one unit wave speed per unit time, the unit time and unit wave speed are preset values, which are prepared by relevant operators in advance based on experience, and confirm the real-time changing wavelength of the frequency signal wave based on the real-time changing wave speed, the wavelength = wave speed ÷ frequency strength (because the wave speed gradually increases, the wavelength is also in a state of gradually increasing, showing a positive and gradual increasing trend, increasing one unit wave speed per unit time, the frequency strength remains unchanged, so one wavelength is synchronously added per unit time, and gradually added from front to back);

[0040] Confirm the increasing period associated with the gradual increase of the wave velocity, and mark the scattered signal wave associated with the increasing period as the wave to be processed;

[0041] S22, based on the coordinate system of the wave to be processed, generate a set of parallel lines parallel to the horizontal coordinate axis, and gradually translate the parallel lines from bottom to top, and record the waveform points located on the rising trend segment during the translation process, and each different translation process generates a series of waveform points parallel to the horizontal coordinate axis;

[0042] S23, processing several groups of waveform points generated by the single group translation process: based on the waveform points recorded in sequence, confirm the adjacent waveform points and synchronously confirm the wavelengths between the adjacent waveform points (the wavelength is the horizontal and vertical lengths between the waveform points), and sort the confirmed wavelengths in sequence according to the waveform points that appear in sequence, identify the increase value of the latter group of wavelengths compared with the previous group of wavelengths in the adjacent wavelengths, and calibrate the adjacent wavelengths with the same increase value (that is, the two groups of wavelengths before and after) as standard wavelengths, otherwise, no calibration is performed. For example, the wavelengths to be confirmed are: 1, 2, 3, 4, 5.1, 6, 7, then the increase value between the adjacent wavelengths is 1, 1, 1.1, 0.9, 1, then the adjacent wavelengths with the same increase value are 1-2, 2-3, 3-4, 6-7, then the determined wavelengths 1, 2, 3, 4, 6, 7 will all be calibrated as standard wavelengths, among which the corresponding 5.1 does not belong to the determined standard wavelengths, and the waveform points associated with the standard wavelengths are calibrated as standard waveform points;

[0043] S24, the other translation processes are processed in the same manner to determine the standard waveform points, and based on the several groups of standard waveform points determined in the wave to be processed, the waveform segments generated between the continuous standard waveform points are calibrated as synchronization bands;

[0044] S25, confirming the line length ratio of the synchronization band in the wave to be processed, calibrating the line length of the synchronization band as L1, calibrating the line length of the wave to be processed as L2, using: line length ratio = L1 ÷ L2 to confirm the line length ratio of the synchronization band, and using the confirmed line length ratio as the characteristic value associated with the scattered signal wave;

[0045] Step 3: For scattered signal waves with regular bands or synchronous bands, the optimal frequency point belonging to the ambient temperature is selected from scattered signal waves associated with frequency signal waves with different frequency strengths based on the regular performance of the scattered signal waves. The specific sub-steps of selecting the optimal frequency point of the ambient temperature are:

[0046] S31. Under the same ambient temperature, different scattered signal waves associated with signal waves at different frequencies are extracted, and then the band proportions of the corresponding scattered signal waves are identified from the different scattered signal waves:

[0047] For a single group of scattered signal waves, first determine the regular band length in this single group of scattered signal waves and mark it as Li , where i represents different scattered signal waves, and then the overall waveform segment length of a single group of scattered signal waves is confirmed and calibrated as Z i ;

[0048] Adopt B i =L i ÷Z i Confirm the band proportion B in the corresponding scattered signal wave i ;

[0049] S32. Confirm different proportion values ​​B associated with different scattered signal waves i Or characteristic value, from several proportion values ​​B i or characteristic values, selecting the scattered signal wave associated with the maximum value, and determining the frequency point signal wave associated with the scattered signal wave, and taking the frequency point associated with the frequency point signal wave as the optimal frequency point of the ambient temperature;

[0050] Specifically, in the actual processing process, signal waves with different frequency intensities have different scattered waves, and different scattered waves have different regular manifestations. Therefore, based on the comprehensive manifestation of the regularity of the corresponding scattered waves, a group of scattered waves with the strongest regularity can be selected. When measuring S parameters, such scattered waves can achieve the most accurate test state without too many error values ​​(the error value is caused by the irregular segment). Therefore, in subsequent measurements, this optimal frequency point is used for testing at this ambient temperature to achieve the best test processing effect.

[0051] Step 4: gradually increase the ambient temperature in sequence. For different ambient temperatures, use the same method from step 1 to step 3 to confirm the optimal frequency points associated with different ambient temperatures. Specifically, when the ambient temperature is gradually increased, the ambient temperature increased per unit time is a preset value, which is prepared in advance by relevant personnel based on experience, and the initial temperature and terminal temperature of the ambient temperature are preset values. For each different ambient temperature, the optimal frequency point will be confirmed to facilitate the subsequent measurement of the S parameter data of the material to be tested.

[0052] Step 5. Based on the optimal frequency points associated with different ambient temperatures, the ambient temperature of the material to be tested is adjusted from the lowest ambient temperature to the highest value, and the frequency signal corresponding to the optimal frequency point is transmitted to the material to be tested through a microwave millimeter wave electronic instrument, and the scattered signal generated by the interaction between the frequency signal and the material to be tested is received, and the captured scattered signal is converted into a digital signal, and then based on the different digital signals associated with different ambient temperatures, several groups of digital signals are sorted and displayed to complete the test process of the material to be tested.

[0053] Specifically, during the test of the corresponding material to be tested, the reflected scattered wave is determined by the transmitted frequency signal wave, and then the determined scattered wave is specifically analyzed by digital signal to confirm the correlation coefficients such as reflection coefficient and transmission coefficient, so that the relevant characteristics of the material to be tested can be identified and confirmed from such correlation coefficients. Under the corresponding ambient temperature, the optimal frequency point is used for testing, which can effectively improve the specific test effect.

[0054] Some of the data in the above formulas are dimensionless and numerically calculated. Meanwhile, the contents not described in detail in this specification belong to the prior art known to those skilled in the art.

[0055] The above embodiments are only used to illustrate the technical method of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical method of the present invention may be modified or replaced by equivalents without departing from the spirit and scope of the technical method of the present invention.

Claims

1. A method for unattended multi-temperature and multi-frequency measurement of a material to be tested, characterized in that: The following steps are involved: Step 1: After the material to be tested is placed and fixed, multi-frequency point measurement is preferably performed at the same ambient temperature. Based on the preset multi-frequency point interval, the frequency point signal wave of the relevant frequency point is generated, and then based on the scattered signal wave received during the measurement process, the regular band existing in the scattered signal wave is confirmed; Step 2: for the scattered signal wave without a regular band, confirm the frequency signal wave associated with the scattered signal wave, and adjust the wave velocity of the frequency signal wave by controlling the microwave millimeter wave electronic instrument to change the wavelength of the frequency signal wave, lock the synchronization band in the scattered signal wave based on the comprehensive performance of the wavelength of the frequency signal wave and the wavelength of the scattered signal wave, and determine the characteristic value associated with the scattered signal wave based on the synchronization band; Step 3: For scattered signal waves with regular bands or synchronous bands, the optimal frequency point belonging to the ambient temperature is selected from scattered signal waves associated with frequency signal waves with different frequency strengths based on the regular performance of the scattered signal waves; Step 4: gradually increase the ambient temperature, and use the same method as steps 1 to 3 for different ambient temperatures to confirm the optimal frequency points associated with different ambient temperatures.

2. The unattended multi-temperature and multi-frequency measurement method for a material to be tested according to claim 1, characterized in that: In the step 1, the specific sub-steps for confirming the regular waveform existing in the scattered signal wave are: S11, the tested temperature is preferentially adjusted to the initial ambient temperature, wherein the initial ambient temperature is the preset temperature. After the initial ambient temperature is set, a microwave millimeter wave electronic instrument is used to generate frequency signal waves with different frequency intensities, and the corresponding frequency signal waves are used to measure the material to be tested, confirm the scattered signal waves, and receive different scattered signal waves associated with the different frequency signal waves; S12, performing regular segment analysis on different scattered signal waves: starting from the initial point of the scattered signal wave, confirming the subsequent peak points, the waveform trend of the front end of the peak point rises, and the waveform trend of the rear end falls, and the waveform segment between adjacent peak points is marked as a related band; Starting from the first confirmed group of associated bands, perform horizontal translation to identify whether there are completely overlapping associated bands in the future. If so, mark this associated band as a regular band. If not, start from the second group of associated bands and confirm the regular bands in the future, and so on, until the regular bands are determined and stop.

3. The unattended multi-temperature and multi-frequency measurement method for a material to be tested according to claim 2, characterized in that: In the step S12, if no completely overlapping associated wavebands are identified, the scattered signal wave is marked as an irregular wave.

4. The unattended multi-temperature and multi-frequency measurement method for a material to be tested according to claim 1, characterized in that: In step 2, the specific method of locking the synchronization band in the scattered signal wave is: S21, confirm the frequency signal wave associated with the scattered signal wave, keep the frequency strength of the frequency signal wave unchanged, and gradually increase its wave speed, increasing one unit wave speed per unit time, wherein the unit time and the unit wave speed are both preset values, which are prepared in advance by relevant operators based on experience, and based on the real-time changing wave speed, confirm the real-time changing wavelength of the frequency signal wave, wherein the wavelength = wave speed ÷ frequency strength; Confirm the increasing period associated with the gradual increase of the wave velocity, and mark the scattered signal wave associated with the increasing period as the wave to be processed; S22, based on the coordinate system of the wave to be processed, generate a set of parallel lines parallel to the horizontal coordinate axis, and gradually translate the parallel lines from bottom to top, and record the waveform points located on the rising trend segment during the translation process, and each different translation process generates a series of waveform points parallel to the horizontal coordinate axis; S23, processing the plurality of groups of waveform points generated by the single group translation process: based on the waveform points recorded in sequence, confirming the adjacent waveform points and synchronously confirming the wavelengths between the adjacent waveform points, and sequentially sorting the confirmed wavelengths according to the waveform points that appear in sequence, identifying the increase value of the latter group of wavelengths compared to the former group of wavelengths in the adjacent wavelengths, calibrating the adjacent wavelengths with the same increase value as the standard wavelength, otherwise, no calibration is performed; S24, the other translation processes are processed in the same manner to determine the standard waveform points, and based on the several groups of standard waveform points determined in the wave to be processed, the waveform segments generated between the continuous standard waveform points are calibrated as synchronization bands; S25. Confirm the line length ratio of the synchronization band in the wave to be processed, calibrate the line length of the synchronization band as L1, calibrate the line length of the wave to be processed as L2, and use: line length ratio = L1 ÷ L2 to confirm the line length ratio of the synchronization band, and use the confirmed line length ratio as the characteristic value associated with the scattered signal wave.

5. The unattended multi-temperature and multi-frequency measurement method for a material to be tested according to claim 1, characterized in that: In step 3, the specific sub-steps for selecting the optimal frequency point of the ambient temperature are: S31. Under the same ambient temperature, different scattered signal waves associated with signal waves at different frequencies are extracted, and then the band proportions of the corresponding scattered signal waves are identified from the different scattered signal waves: For a single group of scattered signal waves, first determine the regular band length in this single group of scattered signal waves and mark it as L i , where i represents different scattered signal waves, and then the overall waveform length of a single group of scattered signal waves is confirmed and calibrated as Z i ; Adopt B i =L i ÷Z i Confirm the band proportion B in the corresponding scattered signal wave i ; S32. Confirm different proportion values ​​B associated with different scattered signal waves i Or characteristic value, from several proportion values ​​B i Or in the characteristic value, select the scattered signal wave associated with the maximum value, and determine the frequency point signal wave associated with the scattered signal wave, and use the frequency point associated with the frequency point signal wave as the optimal frequency point of the ambient temperature.

6. The unattended multi-temperature and multi-frequency measurement method for a material to be tested according to claim 5, characterized in that: Also includes: Based on the optimal frequency points associated with different ambient temperatures, the ambient temperature of the material to be tested is adjusted starting from the lowest ambient temperature, so that the ambient temperature is adjusted from the lowest value to the highest value, and a frequency signal corresponding to the optimal frequency point is emitted to the material to be tested through a microwave millimeter wave electronic instrument, and the scattered signal generated by the interaction between the frequency signal and the material to be tested is received, and the captured scattered signal is converted into a digital signal, and then based on the different digital signals associated with different ambient temperatures, several groups of digital signals are sorted and displayed.

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