High-frequency ripple recognition method and device, electronic equipment and storage medium

Abstract

The embodiment of the invention discloses a high-frequency ripple recognition method and device, electronic equipment and a storage medium, and the method comprises the steps: sampling the current of a target loop, and obtaining the current of the target loop at each sampling moment in a first period; and determining a high-frequency ripple recognition result of the target loop in the first period based on the current at each sampling moment. By adopting the embodiment of the invention, when the loop current has the high-frequency ripples, the current in the loop of the vehicle can be sampled, and whether the high-frequency ripples are generated in the loop is determined based on the sampled current, so that the control precision of the vehicle is improved.

Description

Technical Field

[0001] The present invention relates to the field of vehicle control technology, and in particular to a high-frequency ripple recognition method, device, electronic equipment and storage medium. Background Art

[0002] With the development of science and technology, people have higher and higher requirements for transportation convenience. Especially with the promotion and use of new energy vehicles in recent years, it has become a demand for people to have more stable working conditions for transportation.

[0003] However, some circuits of the vehicle will generate high-frequency ripples during operation. At present, for the circuits in the vehicle that generate high-frequency ripples, only some filters are designed in these circuits to filter out the high-frequency ripples. However, with the aging of the components in the circuit or the control of the load power on or off by the high-voltage power switch components, high-frequency ripples will still be generated in the circuit, which will affect some functions of the vehicle, such as affecting the online evaluation of the battery state of charge (SOC) under dynamic conditions and other battery management system status evaluation functions related to voltage and current synchronization, thereby affecting the control accuracy of the vehicle.

[0004] Therefore, currently, the circuit for the vehicle only uses a filter to filter out the high-frequency ripple in the circuit as much as possible, but cannot detect whether the circuit of the vehicle generates high-frequency ripple, thereby affecting the control accuracy of the vehicle. Summary of the invention

[0005] In order to solve the above-mentioned problems existing in the prior art, an embodiment of the present invention provides a high-frequency ripple identification method, device, electronic device and storage medium, which samples the current in the vehicle's circuit and determines whether high-frequency ripple is generated in the circuit based on the sampled current to improve the control accuracy of the vehicle.

[0006] In a first aspect, an embodiment of the present invention provides a high-frequency ripple identification method, comprising:

[0007] Sampling the current of the target circuit to obtain the current of the target circuit at each sampling moment in the first cycle;

[0008] Based on the current at each sampling moment, a high-frequency ripple identification result of the target loop within the first cycle is determined.

[0009] In a second aspect, an embodiment of the present invention provides a high-frequency ripple recognition device, including an acquisition unit and a processing unit;

[0010] The acquisition unit is used to sample the current of the target circuit to obtain the current of the target circuit at each sampling moment in the first cycle;

[0011] The processing unit is used to determine the high-frequency ripple identification result of the target circuit within the first cycle based on the current at each sampling moment.

[0012] In a third aspect, an embodiment of the present invention provides an electronic device, including:

[0013] A processor and a memory, wherein the processor is connected to the memory, the memory is used to store a computer program, and the processor is used to execute the computer program stored in the memory, so that the electronic device executes the method as described in the first aspect.

[0014] In a fourth aspect, an embodiment of the present invention provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and the computer program is executed by a processor to implement the method as described in the first aspect.

[0015] In a fifth aspect, an embodiment of the present application provides a computer program product, which includes a non-transitory computer-readable storage medium storing a computer program, and the computer is operable to cause the computer to execute the method described in the first aspect.

[0016] Implementing the embodiments of the present application has the following beneficial effects:

[0017] In the implementation mode of the present application, the current of the target circuit is first sampled to obtain the current of the target circuit at each sampling moment in the first cycle, and then, based on the current at each sampling moment, the high-frequency ripple identification result of the target circuit in the first cycle is determined. Thus, by sampling the current in the circuit of the vehicle, it is possible to determine whether high-frequency ripple is generated in the circuit based on the sampled current, so as to improve the control accuracy of the vehicle. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the background technology, the drawings required for use in the embodiments of the present invention or the background technology will be described below.

[0019] Figure 1 A schematic diagram of a flow chart of a high-frequency ripple identification method provided in an embodiment of the present application;

[0020] Figure 2 A schematic flow chart of a high-frequency ripple identification method based on a shunt provided in an embodiment of the present application;

[0021] Figure 3 A schematic diagram of a flow chart of a method for calculating the total number of current inflection points provided in an embodiment of the present application;

[0022] Figure 4 A schematic diagram of a flow chart of a current inflection point determination method provided in an embodiment of the present application;

[0023] Figure 5 A schematic diagram of a flow chart of a high-frequency ripple identification method based on a Hall sensor provided in an embodiment of the present application;

[0024] Figure 6 A schematic diagram of a flow chart of a method for calculating a first total amplitude of current fluctuations provided in an embodiment of the present application;

[0025] Figure 7 A schematic diagram of a flow chart of a method for calculating a second total amplitude of current fluctuation provided in an embodiment of the present application;

[0026] Figure 8 A schematic flow chart of a high-frequency ripple identification method based on a shunt and a Hall sensor provided in an embodiment of the present application;

[0027] Fig. 9 A schematic diagram of a process for identifying a high-frequency ripple condition of a vehicle based on a shunt sampling current signal provided in an embodiment of the present application;

[0028] Fig.10 A schematic diagram of a process for waveform recognition based on Hall current sensor sampling provided in an embodiment of the present application;

[0029] Fig.11 A schematic diagram of a flow chart of a waveform recognition strategy provided in an embodiment of the present application;

[0030] Fig.12 A block diagram of the functional modules of a high-frequency ripple identification device provided in an embodiment of the present application;

[0031] Fig.13 A schematic diagram of the structure of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0032] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0033] The terms "first", "second", "third" and "fourth" etc. in the specification and claims of the present application and the drawings are used to distinguish different objects, rather than to describe a specific order. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or modules is not limited to the listed steps or modules, but optionally includes steps or modules that are not listed, or optionally includes other steps or modules inherent to these processes, methods, products or devices.

[0034] Reference to "embodiments" herein means that a particular feature, result, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0035] See also Figure 1 , Figure 1 A schematic diagram of a high-frequency ripple identification method provided in an embodiment of the present application. Figure 1 As shown, the method includes but is not limited to the following steps:

[0036] S101: Sampling the current of the target circuit to obtain the current of the target circuit at each sampling moment in the first cycle.

[0037] The target circuit is the high-frequency power circuit on the vehicle. The high-frequency power circuit includes: a high-frequency transformer circuit, a high-voltage frequency conversion circuit, or a high-frequency power switch conversion circuit, etc. In addition, due to the control of load power on / off by high-voltage power switching devices, such as insulated gate bipolar transistors (IGBTs) and field effect transistors, the high-frequency ripple of the vehicle's high-voltage power circuit will be generated, and its frequency is roughly distributed in the range of 10 to 150kHz.

[0038] Specifically, the first period is pre-set, for example, the first period is 400ms, 500ms, 1000ms, etc. In the present application, the first period of 500ms is mainly used as an example for description.

[0039] S102: Determine a high-frequency ripple identification result of the target circuit in the first cycle based on the current at each sampling moment.

[0040] The high-frequency ripple identification result includes the presence of the high-frequency ripple or the absence of the high-frequency ripple.

[0041] It should be noted that the present application uses the first cycle as a time period to detect whether the target circuit has high-frequency ripples in this time period. Therefore, after the vehicle is started, when the time reaches the first cycle, it will detect whether the target circuit has high-frequency ripples in the first first cycle; then, it will continue to detect whether the target circuit has high-frequency ripples in the second first cycle, and so on.

[0042] Specifically, due to the differences in sampling devices, the sampling times may also be different. In the embodiments of the present application, sampling is performed using a shunt, a Hall sensor, or a combination of the two.

[0043] Furthermore, if high-frequency ripple exists in the target circuit within the first cycle, the target function of the vehicle is disabled, wherein the target function is the function on the vehicle affected by the high-frequency ripple, including but not limited to the consistency detection function of battery current and voltage, the online battery internal resistance calculation function and the power distribution function of the vehicle; if no high-frequency ripple exists in the target circuit within the first cycle, the target function is enabled.

[0044] For example, when the battery input or output power is stable, due to the presence of high-frequency ripple, the current will fluctuate at a certain amplitude and frequency, and the battery voltage will also fluctuate at a certain amplitude and frequency. The battery system voltage and current sampling cannot be absolutely synchronized. Therefore, the battery system status evaluation function related to voltage and current synchronization performed by the prior art solution will be affected. This will cause calculation errors, which will affect the accuracy of the battery system status evaluation, further affect the vehicle control, and affect the emission indicators and driving experience. Therefore, for example, if there is high-frequency ripple in the target loop in the first cycle, the vehicle's battery current and voltage consistency detection function is disabled after the first cycle.

[0045] Exemplarily, since the system calculates the battery internal resistance through pulse current, when there is high-frequency ripple, the system will mistakenly identify the high-frequency ripple as pulse current, resulting in an error in the calculation of the battery internal resistance. Therefore, exemplarily, if there is high-frequency ripple in the target circuit within the first cycle, the online battery internal resistance calculation function of the vehicle is disabled after the first cycle.

[0046] Exemplarily, the output power allocated to the vehicle's engine is dynamically allocated, mainly depending on the output power of the vehicle's battery. For example, if a total of 10kw of power is currently required to be output, and the battery currently outputs 8kw, then the power output of the engine needs to be set to 2kw. Since there are high-frequency ripples in the first cycle, the output current of the battery will jump frequently, and the output power of the battery will also jump frequently. For example, the output is 8kw at the last moment and 4kw at the next moment. If the power is still allocated to the engine in the above-mentioned power allocation method, the output power of the engine also needs to be adjusted frequently, so that the vehicle continues to shake, thereby affecting the control accuracy of the vehicle and the user's riding experience. Therefore, if high-frequency ripples are detected in the first cycle, it can be prohibited to dynamically allocate power to the vehicle's engine. For example, a rated power can be assigned to the engine at this time, and so on.

[0047] It should be noted that the above-mentioned sampling of the current of the target circuit is achieved through a sensor. However, since the sampling frequencies of different sensors are different, the sampling times of different sensors in the first cycle are also different. For the convenience of description, this application mainly uses the use of a shunt and / or a Hall sensor to sample the current of the target circuit as an example. For the sake of distinction, in this application, the sampling frequency of the shunt is referred to as the first sampling frequency, the various sampling moments of the shunt in the first cycle are referred to as the first sampling moments, the sampling frequency of the Hall sensor is referred to as the second sampling frequency, and the various sampling moments of the Hall sensor in the first cycle are referred to as the second sampling moments.

[0048] Optional, see Figure 2 , Figure 2 A schematic diagram of a flow chart of a high-frequency ripple identification method based on a shunt provided in an embodiment of the present application. Figure 2 As shown, the method includes but is not limited to the following steps:

[0049] S201: Determine the total number of current inflection points occurring in a first cycle based on the current at each first sampling moment, where the first sampling moment is a moment at which the current of a target loop is sampled at a first sampling frequency in the first cycle.

[0050] Specifically, the first sampling moment and the first sampling frequency are obtained based on a sensor that samples the current of the target loop. In the embodiment of the present application, the loop current is sampled through a shunt.

[0051] Furthermore, the shunt can sample the fast instantaneous current of the loop, and the sampling frequency and the sampling average update frequency of the shunt are both 50Hz, that is, the shunt can identify the current change waveform less than 50Hz. In the embodiment of the present application, the first sampling frequency is 50Hz, and the period of the first sampling moment is 20ms.

[0052] Specifically, see Figure 3 , Figure 3 A flow chart of a method for calculating the total number of current inflection points provided in an embodiment of the present application. Figure 3 As shown, the method includes but is not limited to the following steps:

[0053] S301: Based on I_shunt_i, I_shunt_i-1 and I_shunt_i-2, determine whether there is a current inflection point at the i-th first sampling moment, where I_shunt_i, I_shunt_i-1 and I_shunt_i-2 are the current at the i-th first sampling moment, the current at the i-1-th first sampling moment and the current at the i-2-th first sampling moment, respectively, and the value of i is an integer from 3 to N, and N is the total number of first sampling moments in the first period.

[0054] Specifically, starting from the third first sampling moment in the first cycle, whether there is a current inflection point at the i-th first sampling moment is calculated by using the current at the i-th first sampling moment, the current at the i-1-th first sampling moment, and the current at the i-2-th first sampling moment.

[0055] Exemplarily, at the third first sampling moment in the first cycle, it is calculated whether there is a current inflection point at the third first sampling moment by using three currents: the current at the third first sampling moment, the current at the second first sampling moment, and the current at the first first sampling moment.

[0056] Furthermore, it is also necessary to identify the amplitude of the ripple while identifying the current frequency, so that normal noise can be effectively distinguished from the ripple caused by the load. Due to the hardware characteristics, the filter cutoff frequency of the fast instantaneous current signal of the shunt is relatively high, and the maximum amplitude of the current change can be sampled more accurately.

[0057] Specifically, see Figure 4 , Figure 4 A flow chart of a current inflection point determination method provided in an embodiment of the present application.

[0058] like Figure 4 As shown, the method includes but is not limited to the following steps:

[0059] S401: If the product of the first difference and the second difference is less than zero, and the absolute value of the first difference is greater than a third threshold and / or the absolute value of the second difference is greater than the third threshold, it is determined that there is a current inflection point at the i-th first sampling moment.

[0060] The first difference is the difference between I_shunt_i and I_shunt_i-1, and the second difference is the difference between I_shunt_i-1 and I_shunt_i-2.

[0061] Specifically, the product of the first difference and the second difference is less than zero, which physically means that the current change direction from the i-2th first sampling moment to the i-1th first sampling moment is opposite to that from the i-1th first sampling moment to the i-th first sampling moment, and there is a current change inflection point, which is a basic characteristic of circuit ripple change.

[0062] Specifically, after calculating whether there is a current inflection point at the i-th first sampling moment by using the current at the i-th first sampling moment, the current at the i-1th first sampling moment, and the current at the i-2th first sampling moment, a judgment on the change in current amplitude is added to distinguish noise from ripple. In the embodiment of the present application, the change in current amplitude is judged by the third threshold, the first difference, and the second difference, wherein the third threshold is pre-set, for example, the third threshold is 1A, 2A, 5A, and so on. The present application is mainly described by taking the third threshold of 5A as an example.

[0063] Exemplarily, if it is to be determined whether there is a current inflection point at the third first sampling moment, the product between the first difference and the second difference needs to be less than zero, and the absolute value of at least one of the first difference and the second difference needs to be greater than a third threshold, wherein the first difference is the current at the third first sampling moment minus the current at the second first sampling moment, and the second difference is the current at the second first sampling moment minus the current at the first first sampling moment.

[0064] S402: If the product of the first difference and the second difference is greater than or equal to zero, or the absolute value of the first difference and the absolute value of the second difference are both less than or equal to a third threshold, it is determined that there is no current inflection point at the i-th first sampling moment.

[0065] Exemplarily, when the first difference is the current at the third first sampling moment minus the current at the second first sampling moment, and the second difference is the current at the second first sampling moment minus the current at the first first sampling moment, if the product of the first difference and the second difference is greater than or equal to zero, or the absolute value of the first difference and the absolute value of the second difference are both less than or equal to the third threshold, it is determined that there is no current inflection point at the third first sampling moment.

[0066] S302: Determine the total number of current inflection points occurring in a first cycle based on a first sampling time at which a current inflection point exists.

[0067] Specifically, if there is a current inflection point at the i-th first sampling moment, the total number of current inflection points appearing in the first cycle is counted plus 1. The total number of current inflection points appearing in the first cycle is the sum of the current inflection points at all first sampling moments in the first cycle.

[0068] S202: If the total number is greater than or equal to the first threshold, determine that the target loop has high-frequency ripples in the first cycle.

[0069] Specifically, the first threshold is preset, for example, the first threshold is 50, 100, 200, etc. Only when the total number of current inflection points appearing in the first cycle is greater than or equal to the first threshold, it is determined that the target loop has high-frequency ripple in the first cycle.

[0070] S203: If the total number is less than the first threshold, determine that the target loop does not have high-frequency ripples in the first cycle.

[0071] Specifically, when the total number of current inflection points appearing in the first cycle is less than the first threshold, it is determined that the target loop does not have high-frequency ripple in the first cycle.

[0072] Optional, see Figure 5 , Figure 5 The following is a flow chart of a method for identifying high-frequency ripple based on a Hall sensor provided in an embodiment of the present application. Figure 5 As shown, the method includes but is not limited to the following steps:

[0073] S501: Determine a first total amplitude of current fluctuations in a first cycle based on the current at each second sampling moment, wherein the second sampling moment is a moment at which the current of a target loop is sampled at a second sampling frequency in the first cycle.

[0074] Specifically, the second sampling moment and the second sampling frequency can be adjusted according to different sampling devices. In the embodiment of the present application, the loop current is sampled by a Hall sensor.

[0075] Furthermore, the Hall sensor can sample the fast average current of the loop, with a sampling frequency of 1kHz and a sampling average update frequency of 50Hz. Therefore, the Hall sensor can observe the current change waveform less than 1kHz and can identify the current ripple signal in the frequency range of 50 to 1000Hz. In the embodiment of the present application, the second sampling frequency is 1kHz, and the period of the second sampling moment is 1ms.

[0076] Furthermore, due to the hardware characteristics of the Hall current sensor, there will be nonlinear errors during sampling, and the sampling points will fluctuate back and forth on both sides of the center line, and the fluctuations will produce inflection points. Therefore, the absolute change is used to identify whether there is high-frequency ripple, that is, the first total amplitude of the current fluctuation in the first cycle in the embodiment of the present application is used to identify whether there is high-frequency ripple. When the current changes rapidly in the form of ripple, the absolute value of the change will be relatively large, which can distinguish between non-ripple or low-frequency ripple.

[0077] Specifically, see Figure 6 , Figure 6 A flow chart of a method for calculating the first total amplitude of current fluctuations provided in an embodiment of the present application. Figure 6 As shown, the method includes but is not limited to the following steps:

[0078] S601: Divide a first period into multiple second periods.

[0079] Specifically, since the sampling frequency of the Hall sensor is very fast, if sampling is performed at the second sampling frequency and some recognition algorithms of changing characteristics are executed, the operation resources consumed by the controller will be relatively high, making the load rate of the microcontroller unit (MCU) relatively high. Therefore, the embodiment of the present application adopts an algorithm for sampling at the second sampling frequency and performing a waveform recognition once in the second period to optimize the system operation efficiency.

[0080] Specifically, the second period is shorter than the first period, and the second period is pre-set, for example, the second period is 10ms, 20ms, 50ms, etc. In the embodiment of the present application, the second period mainly adopts 20 sampling periods of Hall signals, that is, 20ms as a period for example.

[0081] S602: Determine a second total amplitude of current fluctuation in each second cycle based on the current at each second sampling moment in each second cycle.

[0082] Specifically, see Figure 7 , Figure 7 A flow chart of a method for calculating the second total amplitude of current fluctuations provided in an embodiment of the present application. Figure 7 As shown, the method includes but is not limited to the following steps:

[0083] S701: Obtain an absolute value of a third difference between currents at any two adjacent second sampling moments in each second cycle.

[0084] Exemplarily, if the currents at four second sampling moments are sampled in each second cycle, then the absolute values ​​of three third differences need to be calculated in each second cycle, that is, the difference between the current at the fourth second sampling moment and the current at the third second sampling moment in each second cycle and the absolute value is calculated, the difference between the current at the third second sampling moment and the current at the second second sampling moment in each second cycle and the absolute value is taken, and the difference between the current at the second second sampling moment and the current at the first second sampling moment in each second cycle and the absolute value is taken.

[0085] S702: Obtain an absolute value of a fourth difference between the current at a start second sampling time and the current at an end second sampling time of each second cycle.

[0086] Exemplarily, if the currents at four second sampling moments are sampled in each second cycle, then the absolute value of the fourth difference in each second cycle is calculated, that is, the difference between the current at the fourth second sampling moment and the current at the first second sampling moment in each second cycle is calculated and the absolute value is taken.

[0087] S703: Determine a second total amplitude of current fluctuation in each second period based on the absolute value of the third difference between the currents at any two adjacent second sampling moments and the absolute value of the fourth difference.

[0088] Specifically, the second total amplitude of the current fluctuation in each second period is: the sum of the absolute values ​​of the third difference of the currents at any two adjacent second sampling moments in each second period minus the absolute value of the fourth difference in each second period.

[0089] Exemplarily, if the currents at four second sampling moments are sampled in each second cycle, then the second total amplitude of the current fluctuation within each second cycle is: the absolute value of the difference between the current at the fourth second sampling moment and the current at the third second sampling moment in each second cycle, plus the absolute value of the difference between the current at the third second sampling moment and the current at the second second sampling moment, plus the absolute value of the difference between the current at the second second sampling moment and the current at the first second sampling moment, minus the absolute value of the difference between the current at the fourth second sampling moment and the current at the first second sampling moment.

[0090] S603: Determine a first total amplitude of the current fluctuation in the first cycle based on the second total amplitude of the current fluctuation in each second cycle.

[0091] Specifically, the first total amplitude of the current fluctuation in the first cycle is the sum of the second total amplitudes of the current fluctuation in each second cycle.

[0092] S502: If the first total amplitude is greater than or equal to the second threshold, it is determined that a high-frequency ripple exists in the target loop within the first cycle.

[0093] Specifically, the second threshold is preset, for example, the second threshold is 20, 30, 100, etc. Only when the first total amplitude of the current fluctuation in the first cycle is greater than or equal to the second threshold, it is determined that the target loop has high-frequency ripple in the first cycle.

[0094] S503: If the first total amplitude is less than the second threshold, it is determined that no high-frequency ripple exists in the target loop within the first cycle.

[0095] Specifically, when the first total amplitude of the current fluctuation in the first cycle is less than the second threshold, it is determined that the target loop does not have high-frequency ripple in the first cycle.

[0096] In the embodiment of the present application, it is necessary to obtain the original current sampling signal based on the capabilities and configuration of the hardware system. Next, a high-frequency ripple identification method based on a shunt and a Hall sensor will be introduced.

[0097] The fast instantaneous current signal of the shunt has a sampling frequency of 50Hz, which can identify current waveforms with a frequency less than 50Hz. Since the vehicle requires the current signal update frequency to be 50Hz, it means that the 50Hz ripple signal does not need to be identified. Therefore, the waveform recognition based on the fast instantaneous current signal of the shunt does not meet expectations. Therefore, it is necessary to use the higher frequency Hall sensor sampling signal that the hardware system can provide for recognition.

[0098] The sampling frequency of the Hall sensor is 1kHz. Therefore, the signal can observe the current change waveform less than 1kHz and can identify the current ripple signal in the frequency range of 50 to 1000Hz, which meets expectations.

[0099] When identifying the frequency, it is also necessary to identify the amplitude of the ripple, so that normal noise can be effectively distinguished from ripple caused by the load. Due to the difference in hardware characteristics, the filter cutoff frequency of the fast instantaneous current signal of the shunt is relatively high, and the maximum amplitude of the current change can be sampled more accurately. However, due to its relatively low cutoff frequency, the Hall sensor will sample the current signal after filtering and attenuation. Therefore, it is impossible to accurately sample the maximum amplitude of the current change and cannot accurately distinguish normal noise from ripple.

[0100] Based on the system requirements and hardware system limitations described above, the fast instantaneous current signal of the shunt can meet the recognition of the ripple amplitude, but lacks in meeting the recognition of the ripple frequency, while the current signal sampled by the Hall sensor can meet the recognition of the ripple frequency, but lacks in meeting the recognition of the ripple amplitude. Therefore, in order to meet the system requirements, the present invention uses two signals to jointly identify the high-frequency ripple working conditions of the whole vehicle.

[0101] Optional, see Figure 8 , Figure 8 The present invention provides a flow chart of a high-frequency ripple identification method based on a shunt and a Hall sensor. Figure 8 As shown, the method includes but is not limited to the following steps:

[0102] S801: Determine the total number of current inflection points occurring in a first cycle based on the current at each first sampling moment, where the first sampling moment is a moment at which the current of a target loop is sampled at a first sampling frequency in the first cycle.

[0103] Specifically, the method for calculating the total number of current inflection points is as described in steps S301 and S302 ; the method for determining the current inflection points is as described in steps S401 and S402 .

[0104] S802: Determine a first total amplitude of current fluctuations within a first cycle based on the current at each second sampling moment, where the second sampling moment is a moment at which the current of the target loop is sampled within the first cycle at a second sampling frequency.

[0105] Specifically, the method for calculating the first total amplitude of current fluctuation is as described in steps S601 , S602 and S603 ; the method for calculating the second total amplitude of current fluctuation is as described in steps S701 , S702 and S703 .

[0106] Optionally, the first sampling frequency is less than the second sampling frequency.

[0107] S803: If the total number is greater than or equal to the first threshold, and the first total amplitude is greater than or equal to the second threshold, it is determined that the target loop has high-frequency ripples in the first cycle.

[0108] Specifically, the first threshold and the second threshold are preset, for example, the first threshold is 50, 100, 200, and the second threshold is 20, 30, 100, etc. Only when the total number of current inflection points appearing in the first cycle is greater than or equal to the first threshold, and the first total amplitude of the current fluctuation in the first cycle is greater than or equal to the second threshold, is it determined that the target circuit has high-frequency ripple in the first cycle.

[0109] S804: If the total number is less than the first threshold, or the first total amplitude is less than the second threshold, it is determined that there is no high-frequency ripple in the target loop within the first cycle.

[0110] In one possible embodiment, see Fig. 9 , Fig. 9 A schematic diagram of a process for identifying a vehicle high-frequency ripple condition based on a shunt sampling current signal provided in an embodiment of the present application. Fig. 9As shown, the method includes but is not limited to the following steps:

[0111] S901: Obtain the shunt current signal I_shunt(i) at a sampling period, where i is the number of periods (i=1...).

[0112] Specifically, an instantaneous current signal based on shunt sampling is acquired based on a hardware system, and a shunt current signal sampling is obtained at a frequency of 50 Hz.

[0113] S902: Starting from the third cycle, obtain I_shunt(i-2), I_shunt(i-1) and I_shunt(i) in each cycle.

[0114] Specifically, taking the shunt sampling period as the period, which is 20ms in this embodiment, a shunt sampling signal will be obtained in each period. Starting from the third period, each period will record the shunt sampling signals corresponding to the current period, the previous period, and the previous two periods, I_shunt(i-2), I_shunt(i-1), and I_shunt(i).

[0115] S903: Starting from the third cycle, obtain in each cycle: Diffa = I_shunt(i-1)-I_shunt(i-2); Diffb = I_shunt(i)-I_shunt(i-1).

[0116] Specifically, starting from the third cycle, the difference between the current cycle shunt sampling signal and the previous cycle shunt sampling signal is calculated in each cycle and recorded as Diffa, and the difference between the previous cycle shunt sampling signal and the previous two cycles shunt sampling signal is recorded as Diffb.

[0117] S904: From the third cycle, judge in each cycle that (Diffa*Diffb<0&&(|Diffa|>Amp_Thd|||Diffb|>Amp_Thd))==1 (Amp_Thd is the fluctuation amplitude threshold).

[0118] Specifically, starting from the third cycle, it is determined once in each cycle whether the following condition is satisfied: Diffa*Diffb<0 and (|Diffa|>Amp_Thd|||Diffb|>Amp_Thd))==1.

[0119] Among them, Amp_Thd is the threshold value of the current change fluctuation amplitude, and in this embodiment, the value is 5A. Diffa*Diffb<0, the physical meaning represented by this conditional statement is that the current change direction from the previous two cycles to the previous cycle is opposite to the current change direction from the previous cycle to the current cycle, and there is a current change inflection point, which is the basic feature of the circuit ripple telephone. (|Diffa|>Amp_Thd|||Diffb|>Amp_Thd))==1, the physical meaning represented by it is that the amplitude of the current ripple change is greater than Amp_Thd, in order to distinguish between noise and ripple.

[0120] If the judgment condition of step S904 is met, execute S905: increase the number of waveform inflection points Num_inflection points by 1.

[0121] Specifically, according to the result of identification in S904, if it is identified that there is an inflection point in the current change, and the change amplitude is greater than a set threshold, then the current change inflection point count is increased by 1.

[0122] If the judgment condition of step S904 is not met, execute S906: the number of waveform inflection points Num_inflectionpoints remains unchanged.

[0123] Specifically, according to the result of identification in S904, if no current change inflection point that meets the change amplitude requirement is identified, the current change inflection point count remains unchanged.

[0124] Furthermore, the current change inflection point count will be used in the subsequent waveform recognition strategy.

[0125] See next Fig.10 , Fig.10 A schematic diagram of a process for waveform recognition based on Hall current sensor sampling provided in an embodiment of the present application. Fig.10 As shown, the method includes but is not limited to the following steps:

[0126] S1001: Obtain the AD value corresponding to the Hall current signal in a sampling period: ADvalue_Ihall(j), where j is the number of periods (j=1...).

[0127] Specifically, an ADC conversion value of a current signal sampled by a Hall sensor is obtained based on a hardware system. The sampling frequency of the Hall sensor is 1 kHz, that is, an AD value of a Hall current signal is obtained every 1 ms.

[0128] S1002: Obtain an array ADvalue_Ihall[j] of Hall signal sampling AD values ​​every 20 Hall sampling cycles, where j=1, ..., 20.

[0129] Specifically, an AD value corresponding to the Hall current signal is obtained every 1 ms, and then a 20-dimensional Hall current signal AD value data is obtained with a sampling period of 20 Hall signals, that is, a period of 20 ms, and recorded as ADvalue_Ihall[j], j=1,...,20.

[0130] S1003: Obtain the sum of the absolute values ​​of the ADvalue_Ihall changes every 20 Hall sampling cycles:

[0131]

[0132] Specifically, with a sampling period of 20 Hall signals, that is, 20 ms as a period, the sum of the absolute values ​​of the AD value differences of all adjacent Hall current sampling signals within 20 ms is obtained; then, the absolute value of the difference between the 20th current signal AD value and the first current signal AD value is subtracted.

[0133] Furthermore, due to the characteristics of the Hall current sensor, the sampling point will fluctuate back and forth on both sides of the center line, and the fluctuation will produce an inflection point. Therefore, the absolute change is used for identification. When the current changes rapidly in the form of ripple, the absolute value of the change will be relatively large, which can distinguish non-ripple or low-frequency ripple.

[0134] At the same time, since the sampling period of the Hall current signal is very high, if it is converted into a current signal at a period of 1ms and some recognition algorithms of changing characteristics are executed, the controller's operating resource consumption will be relatively high, making the MCU load rate relatively high. Therefore, an algorithm that only records the AD value every 1ms and performs waveform recognition every 20ms is adopted to optimize the system operation efficiency.

[0135] S1004: every 20 Hall sampling cycles, the Hall current sampling AD value change AbsADvalueChange within the current 20 Hall sampling cycles is accumulated:

[0136] ADvalueChange_sum=ADvalueChange_sum_last+AbsADvalueChange.

[0137] Specifically, with a period of 20 ms, the sum of the absolute values ​​of the AD value changes of the current signal obtained every 20 ms is accumulated for use in the subsequent waveform recognition strategy.

[0138] See next Fig.11 , Fig.11 A schematic diagram of a waveform recognition strategy provided in an embodiment of the present application. Fig.11 As shown, the method includes but is not limited to the following steps:

[0139] S1101: every 25 shunt sampling cycles, obtain: the number of waveform inflection points Num_inflection points and ADvalueChange_sum.

[0140] Specifically, with a certain period, 25 shunt sampling periods adopted in this embodiment, that is, 500ms as a period, the number of waveform inflection points Num_inflection points obtained from processes S901 to S906 and the absolute value sum ADvalueChange_sum of the change in the AD value of the Hall current sensor current signal obtained from processes S1001 to S1004 are obtained.

[0141] S1102: Determine every 25 shunt sampling cycles: Num_inflectionpoints≥Inflection_thd and ADvalueChange_sum≥Change_sum_thd.

[0142] Specifically, the working condition of the vehicle ripple is determined based on the conditions of Num_inflectionpoints≥Inflection_thd and ADvalueChange_sum≥Change_sum_thd at every 25 shunt sampling cycles of 500ms. In the above two threshold determination embodiments, the thresholds are obtained through test data.

[0143] Specifically, Inflection_thd is a threshold value based on the number of inflection points of change identified by the shunt within 500 ms, and Change_sum_thd is a threshold value based on the sum of the absolute values ​​of the changes in the AD values ​​of the Hall sensor current signals within 500 ms.

[0144] If the condition of step S1102 is met, then S1103 is executed: identifying the operating condition where high-frequency ripple exists in the whole vehicle, and shutting down the functions related to the synchronization of voltage and current.

[0145] Specifically, according to the recognition result of S1102, if it is judged to be true, it is determined that the vehicle has a high-frequency ripple working condition. Further, the functions related to the synchronization of voltage and current are prohibited.

[0146] If the condition of step S1102 is not met, then S1104 is executed: the vehicle is identified as being in a non-high-frequency ripple operating condition, and the functions related to voltage and current synchronization operate normally.

[0147] Specifically, according to the recognition result of S1102, if it is judged to be false, it is determined that the vehicle is in a non-high-frequency ripple operating condition. Further, the functions related to voltage and current synchronization are enabled.

[0148] In summary, in the high-frequency ripple identification method provided by the present invention, the current of the target loop is first sampled to obtain the current of the target loop at each sampling moment in the first cycle, and then, based on the current at each sampling moment, the high-frequency ripple identification result of the target loop in the first cycle is determined. Thus, by sampling the loop current of the target loop at different frequencies based on a shunt, based on a Hall sensor, and a combination of the two, the current sampled at multiple sampling moments in the first cycle is obtained, and then based on the different hardware characteristics of the shunt and the Hall sensor, the current sampled at multiple sampling moments is identified with corresponding strategies, and the current in the vehicle loop can be sampled, and whether high-frequency ripple is generated in the loop can be determined based on the sampled current, so as to improve the control accuracy of the vehicle.

[0149] The method of the embodiment of the present invention is described in detail above, and the device of the embodiment of the present invention is provided below.

[0150] See also Fig.12 , Fig.12 A functional module block diagram of a high-frequency ripple identification device provided in an embodiment of the present application. The high-frequency ripple identification device 1200 includes an acquisition unit 1201 and a processing unit 1202, wherein:

[0151] An acquisition unit 1201 is used to sample the current of the target circuit to obtain the current of the target circuit at each sampling moment in the first cycle;

[0152] The processing unit 1202 is used to determine the high-frequency ripple identification result of the target circuit in the first cycle based on the current at each sampling moment.

[0153] In some possible embodiments, in determining the high-frequency ripple identification result of the target circuit in the first cycle based on the current at each sampling moment, the processing unit 1202 is specifically configured to:

[0154] Determine the total number of current inflection points occurring in a first cycle based on the current at each first sampling moment, wherein the first sampling moment is a moment at which the current of the target loop is sampled in the first cycle at a first sampling frequency;

[0155] If the total number is greater than or equal to the first threshold, it is determined that the target loop has high-frequency ripples in the first cycle;

[0156] If the total number is less than the first threshold, it is determined that the target loop does not have high-frequency ripples in the first cycle.

[0157] In some possible embodiments, in determining the high-frequency ripple identification result of the target circuit in the first cycle based on the current at each sampling moment, the processing unit 1202 is specifically configured to:

[0158] Determine a first total amplitude of current fluctuations in the first cycle based on the current at each second sampling moment, the second sampling moment being a moment at which the current of the target loop is sampled in the first cycle at a second sampling frequency;

[0159] If the first total amplitude is greater than or equal to the second threshold, it is determined that the target loop has a high-frequency ripple in the first cycle;

[0160] If the first total amplitude is less than the second threshold, it is determined that no high-frequency ripple exists in the target loop within the first cycle.

[0161] In some possible embodiments, in determining the high-frequency ripple identification result of the target circuit in the first cycle based on the current at each sampling moment, the processing unit 1202 is specifically configured to:

[0162] Determine the total number of current inflection points occurring in a first cycle based on the current at each first sampling moment, wherein the first sampling moment is a moment at which the current of the target loop is sampled in the first cycle at a first sampling frequency;

[0163] Determine a first total amplitude of current fluctuations in the first cycle based on the current at each second sampling moment, the second sampling moment being a moment at which the current of the target loop is sampled in the first cycle at a second sampling frequency;

[0164] If the total number is greater than or equal to the first threshold, and the first total amplitude is greater than or equal to the second threshold, it is determined that the target loop has high-frequency ripples in the first cycle;

[0165] If the total number is smaller than the first threshold, or the first total amplitude is smaller than the second threshold, it is determined that no high-frequency ripple exists in the target loop within the first cycle.

[0166] In some possible embodiments, in determining the total number of current inflection points occurring in the first cycle based on the current at each first sampling moment, the processing unit 1202 is specifically configured to:

[0167] Based on I_shunt_i, I_shunt_i-1 and I_shunt_i-2, determine whether there is a current inflection point at the i-th first sampling moment, where I_shunt_i, I_shunt_i-1 and I_shunt_i-2 are the current at the i-th first sampling moment, the current at the i-1-th first sampling moment and the current at the i-2-th first sampling moment, respectively, and the value of i is an integer from 3 to N, and N is the total number of first sampling moments in the first cycle;

[0168] Based on the first sampling time at which the current inflection point exists, the total number of the current inflection points occurring in the first cycle is determined.

[0169] In some possible embodiments, in terms of determining whether there is a current inflection point at the i-th first sampling moment based on I_shunt_i, I_shunt_i-1, and I_shunt_i-2, the processing unit 1202 is specifically configured to:

[0170] If the product of the first difference and the second difference is less than zero, and the absolute value of the first difference is greater than the third threshold value and / or the absolute value of the second difference is greater than the third threshold value, it is determined that there is a current inflection point at the i-th first sampling moment;

[0171] If the product of the first difference and the second difference is greater than or equal to zero, or the absolute value of the first difference and the absolute value of the second difference are both less than or equal to the third threshold, it is determined that there is no current inflection point at the i-th first sampling moment;

[0172] The first difference is the difference between I_shunt_i and I_shunt_i-1, and the second difference is the difference between I_shunt_i-1 and I_shunt_i-2.

[0173] In some possible embodiments, in determining a first total amplitude of current fluctuations in a first cycle based on the current at each second sampling moment, the processing unit 1202 is specifically configured to:

[0174] dividing the first period into a plurality of second periods;

[0175] Determine a second total amplitude of current fluctuation in each second cycle based on the current at each second sampling moment in each second cycle;

[0176] Based on the second total magnitude of the current fluctuations in each second period, a first total magnitude of the current fluctuations in the first period is determined.

[0177] In some possible embodiments, in determining the second total amplitude of the current fluctuation in each second cycle based on the current at each second sampling moment in each second cycle, the processing unit 1202 is specifically configured to:

[0178] Obtaining an absolute value of a third difference between the currents at any two adjacent second sampling moments in each second cycle;

[0179] Obtaining an absolute value of a fourth difference between the current at a starting second sampling moment and the current at an ending second sampling moment of each second cycle;

[0180] The second total amplitude of the current fluctuation in each second period is determined based on the absolute value of the third difference between the currents at any two adjacent second sampling moments and the absolute value of the fourth difference.

[0181] In some possible embodiments, after determining the high-frequency ripple identification result of the target circuit in the first cycle based on the current at each sampling moment, the processing unit 1202 is specifically configured to:

[0182] If the target circuit has high-frequency ripples in the first cycle, disabling a target function of the vehicle, wherein the target function is a function on the vehicle that is affected by the high-frequency ripples;

[0183] If the target circuit does not have high frequency ripple in the first cycle, the target function is enabled.

[0184] See also Fig.13 , Fig.13 This is a schematic diagram of the structure of an electronic device provided in an embodiment of the present application. Fig.13 As shown, the electronic device 1300 includes a transceiver 1301, a processor 1302 and a memory 1303. They are connected via a bus 1304. The memory 1303 is used to store computer programs and data, and can transmit the data stored in the memory 1303 to the processor 1302. The electronic device can be the above-mentioned high-frequency ripple recognition device, and the processor 1302 can be the above-mentioned acquisition unit 1201 and processing unit 1202.

[0185] The processor 1302 is used to read the computer program in the memory 1303 and perform the following operations:

[0186] Sampling the current of the target circuit to obtain the current of the target circuit at each sampling moment in the first cycle;

[0187] Based on the current at each sampling moment, the high-frequency ripple identification result of the target loop in the first cycle is determined.

[0188] In some possible embodiments, in terms of determining the high-frequency ripple identification result of the target circuit in the first cycle based on the current at each sampling moment, the processor 1302 is specifically configured to perform the following operations:

[0189] Determine the total number of current inflection points occurring in a first cycle based on the current at each first sampling moment, wherein the first sampling moment is a moment at which the current of the target loop is sampled in the first cycle at a first sampling frequency;

[0190] If the total number is greater than or equal to the first threshold, it is determined that the target loop has high-frequency ripples in the first cycle;

[0191] If the total number is less than the first threshold, it is determined that the target loop does not have high-frequency ripples in the first cycle.

[0192] In some possible embodiments, in terms of determining the high-frequency ripple identification result of the target circuit in the first cycle based on the current at each sampling moment, the processor 1302 is specifically configured to perform the following operations:

[0193] Determine a first total amplitude of current fluctuations in the first cycle based on the current at each second sampling moment, the second sampling moment being a moment at which the current of the target loop is sampled in the first cycle at a second sampling frequency;

[0194] If the first total amplitude is greater than or equal to the second threshold, it is determined that the target loop has a high-frequency ripple in the first cycle;

[0195] If the first total amplitude is less than the second threshold, it is determined that no high-frequency ripple exists in the target loop within the first cycle.

[0196] In some possible embodiments, in terms of determining the high-frequency ripple identification result of the target circuit in the first cycle based on the current at each sampling moment, the processor 1302 is specifically configured to perform the following operations:

[0197] Determine the total number of current inflection points occurring in a first cycle based on the current at each first sampling moment, wherein the first sampling moment is a moment at which the current of the target loop is sampled in the first cycle at a first sampling frequency;

[0198] Determine a first total amplitude of current fluctuations in the first cycle based on the current at each second sampling moment, the second sampling moment being a moment at which the current of the target loop is sampled in the first cycle at a second sampling frequency;

[0199] If the total number is greater than or equal to the first threshold, and the first total amplitude is greater than or equal to the second threshold, it is determined that the target loop has high-frequency ripples in the first cycle;

[0200] If the total number is smaller than the first threshold, or the first total amplitude is smaller than the second threshold, it is determined that no high-frequency ripple exists in the target loop within the first cycle.

[0201] In some possible embodiments, in terms of determining the total number of current inflection points occurring in the first cycle based on the current at each first sampling moment, the processor 1302 is specifically configured to perform the following operations:

[0202] Based on I_shunt_i, I_shunt_i-1 and I_shunt_i-2, determine whether there is a current inflection point at the i-th first sampling moment, where I_shunt_i, I_shunt_i-1 and I_shunt_i-2 are the current at the i-th first sampling moment, the current at the i-1-th first sampling moment and the current at the i-2-th first sampling moment, respectively, and the value of i is an integer from 3 to N, and N is the total number of first sampling moments in the first cycle;

[0203] Based on the first sampling time at which the current inflection point exists, the total number of the current inflection points occurring in the first cycle is determined.

[0204] In some possible embodiments, in terms of determining whether there is a current inflection point at the i-th first sampling moment based on I_shunt_i, I_shunt_i-1, and I_shunt_i-2, the processor 1302 is specifically configured to perform the following operations:

[0205] If the product of the first difference and the second difference is less than zero, and the absolute value of the first difference is greater than the third threshold value and / or the absolute value of the second difference is greater than the third threshold value, it is determined that there is a current inflection point at the i-th first sampling moment;

[0206] If the product of the first difference and the second difference is greater than or equal to zero, or the absolute value of the first difference and the absolute value of the second difference are both less than or equal to the third threshold, it is determined that there is no current inflection point at the i-th first sampling moment;

[0207] The first difference is the difference between I_shunt_i and I_shunt_i-1, and the second difference is the difference between I_shunt_i-1 and I_shunt_i-2.

[0208] In some possible embodiments, in determining the first total amplitude of the current fluctuation within the first cycle based on the current at each second sampling moment, the processor 1302 is specifically configured to perform the following operations:

[0209] dividing the first period into a plurality of second periods;

[0210] Determine a second total amplitude of current fluctuation in each second cycle based on the current at each second sampling moment in each second cycle;

[0211] Based on the second total magnitude of the current fluctuations in each second period, a first total magnitude of the current fluctuations in the first period is determined.

[0212] In some possible embodiments, in determining the second total amplitude of the current fluctuation in each second cycle based on the current at each second sampling moment in each second cycle, the processor 1302 is specifically configured to perform the following operations:

[0213] Obtaining an absolute value of a third difference between the currents at any two adjacent second sampling moments in each second cycle;

[0214] Obtaining an absolute value of a fourth difference between the current at a starting second sampling moment and the current at an ending second sampling moment of each second cycle;

[0215] The second total amplitude of the current fluctuation in each second period is determined based on the absolute value of the third difference between the currents at any two adjacent second sampling moments and the absolute value of the fourth difference.

[0216] In some possible embodiments, after determining the high-frequency ripple identification result of the target circuit in the first cycle based on the current at each sampling moment, the processor 1302 is specifically configured to perform the following operations:

[0217] If the target circuit has high-frequency ripples in the first cycle, disabling a target function of the vehicle, wherein the target function is a function on the vehicle that is affected by the high-frequency ripples;

[0218] If the target circuit does not have high frequency ripple in the first cycle, the target function is enabled.

[0219] In some possible embodiments, the present application also provides a vehicle, which may include the high-frequency ripple recognition device described in any of the above embodiments or the electronic device described in any of the above embodiments, which will not be described here.

[0220] It should be understood that the high-frequency ripple identification device of the present application may be a vehicle-mounted terminal, wherein the vehicle-mounted terminal may be a domain controller of the vehicle, and so on.

[0221] An embodiment of the present application also provides a computer-readable storage medium, which stores a computer program. The computer program is executed by a processor to implement part or all of the steps of any high-frequency ripple identification implementation method recorded in the above method embodiments.

[0222] An embodiment of the present application also provides a computer program product, which includes a non-transitory computer-readable storage medium storing a computer program, and the computer program is operable to cause a computer to execute part or all of the steps of any one of the high-frequency ripple identification implementation methods recorded in the above method embodiments.

[0223] It should be noted that, for the aforementioned method embodiments, for the sake of simplicity, they are all expressed as a series of action combinations, but those skilled in the art should be aware that the present application is not limited by the described order of actions, because according to the present application, certain steps can be performed in other orders or simultaneously. Secondly, those skilled in the art should also be aware that the embodiments described in the specification are all optional embodiments, and the actions and modules involved are not necessarily required by the present application.

[0224] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0225] In the several embodiments provided in the present application, it should be understood that the disclosed device can be implemented in other ways. For example, the device embodiments described above are only schematic, such as the division of the modules, which is only a logical function division. There may be other division methods in actual implementation, such as multiple modules or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, and the indirect coupling or communication connection of the device or module can be electrical or other forms.

[0226] The modules described as separate components may or may not be physically separated, and the components shown as modules may or may not be physical modules, that is, they may be located in one place or distributed on multiple network modules. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0227] In addition, each functional module in each embodiment of the present application can be integrated into a processing module, or each module can exist physically separately, or two or more modules can be integrated into one module. The above integrated modules can be implemented in the form of hardware or software program modules.

[0228] If the integrated module is implemented in the form of a software program module and sold or used as an independent product, it can be stored in a computer-readable memory. Based on this understanding, the technical solution of the present application, in essence, or the part that contributes to the prior art or all or part of the technical solution can be embodied in the form of a software product, which is stored in a memory and includes several instructions for a computer device (which can be a personal computer, a server or a network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present application. The aforementioned memory includes: U disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), mobile hard disk, disk or optical disk and other media that can store program codes.

[0229] A person skilled in the art can understand that all or part of the steps in the various methods of the above embodiments can be completed by instructing related hardware through a program, and the program can be stored in a computer-readable memory, and the memory can include: a flash drive, a read-only memory (English: Read-Only Memory, abbreviated as: ROM), a random access memory (English: Random Access Memory, abbreviated as: RAM), a magnetic disk or an optical disk, etc.

[0230] The embodiments of the present application are introduced in detail above. Specific examples are used in this article to illustrate the principles and implementation methods of the present application. The description of the above embodiments is only used to help understand the method and core idea of ​​the present application. At the same time, for general technical personnel in this field, according to the idea of ​​the present application, there will be changes in the specific implementation method and application scope. In summary, the content of this specification should not be understood as a limitation on the present application.

Claims

1. A high-frequency ripple identification method, characterized in that: include: Sampling the current of the target circuit to obtain the current of the target circuit at each sampling moment in the first cycle; Based on the current at each sampling moment, a high-frequency ripple identification result of the target loop within the first cycle is determined.

2. The method according to claim 1, characterized in that The step of determining the high-frequency ripple identification result of the target circuit within the first cycle based on the current at each sampling moment includes: Determine a total number of current inflection points occurring in the first cycle based on the current at each first sampling moment, wherein the first sampling moment is a moment at which the current of the target loop is sampled at a first sampling frequency in the first cycle; If the total number is greater than or equal to a first threshold, determining that the target loop has high-frequency ripples in the first cycle; If the total number is less than the first threshold, it is determined that the target loop does not have high-frequency ripples in the first cycle.

3. The method according to claim 1, characterized in that The step of determining the high-frequency ripple identification result of the target circuit within the first cycle based on the current at each sampling moment includes: Determining a first total amplitude of current fluctuations within the first cycle based on the current at each second sampling moment, wherein the second sampling moment is a moment at which the current of the target loop is sampled within the first cycle at a second sampling frequency; If the first total amplitude is greater than or equal to a second threshold, it is determined that the target loop has a high-frequency ripple within the first period; If the first total amplitude is less than the second threshold, it is determined that no high-frequency ripple exists in the target loop during the first cycle.

4. The method according to claim 1, characterized in that The step of determining the high-frequency ripple identification result of the target circuit within the first cycle based on the current at each sampling moment includes: Determine a total number of current inflection points occurring in the first cycle based on the current at each first sampling moment, wherein the first sampling moment is a moment at which the current of the target loop is sampled at a first sampling frequency in the first cycle; Determining a first total amplitude of current fluctuations within the first cycle based on the current at each second sampling moment, wherein the second sampling moment is a moment at which the current of the target loop is sampled within the first cycle at a second sampling frequency; If the total number is greater than or equal to a first threshold, and the first total amplitude is greater than or equal to a second threshold, it is determined that the target loop has a high-frequency ripple in the first period; If the total number is smaller than the first threshold, or the first total amplitude is smaller than the second threshold, it is determined that the target loop does not have high-frequency ripples in the first cycle.

5. The method according to any one of claims 2 to 4, characterized in that: The determining, based on the current at each first sampling moment, the total number of current inflection points occurring in the first cycle comprises: Based on I_shunt_i, I_shunt_i-1 and I_shunt_i-2, determine whether there is a current inflection point at the i-th first sampling moment, wherein I_shunt_i, I_shunt_i-1 and I_shunt_i-2 are respectively the current at the i-th first sampling moment, the current at the i-1-th first sampling moment and the current at the i-2-th first sampling moment, the value of i is an integer from 3 to N, and N is the total number of first sampling moments in the first period; Based on a first sampling time at which a current inflection point exists, a total number of current inflection points occurring in the first cycle is determined.

6. The method according to claim 5, characterized in that The determining whether there is a current inflection point at the i-th first sampling moment based on I_shunt_i, I_shunt_i-1 and I_shunt_i-2 includes: If the product of the first difference and the second difference is less than zero, and the absolute value of the first difference is greater than the third threshold value and / or the absolute value of the second difference is greater than the third threshold value, it is determined that there is a current inflection point at the i-th first sampling moment; If the product of the first difference and the second difference is greater than or equal to zero, or the absolute value of the first difference and the absolute value of the second difference are both less than or equal to the third threshold, it is determined that there is no current inflection point at the i-th first sampling moment; The first difference is the difference between the I_shunt_i and the I_shunt_i-1, and the second difference is the difference between the I_shunt_i-1 and the I_shunt_i-2.

7. The method according to any one of claims 3 to 6, characterized in that: The determining, based on the current at each second sampling moment, a first total amplitude of the current fluctuation within the first cycle comprises: dividing the first period into a plurality of second periods; Determine a second total amplitude of current fluctuation in each second cycle based on the current at each second sampling moment in each second cycle; Based on the second total amplitude of the current fluctuations in each second period, a first total amplitude of the current fluctuations in the first period is determined.

8. The method according to claim 7, characterized in that The determining, based on the current at each second sampling moment in each second cycle, a second total amplitude of the current fluctuation in each second cycle comprises: Obtaining an absolute value of a third difference between the currents at any two adjacent second sampling moments in each second cycle; Obtaining an absolute value of a fourth difference between the current at a starting second sampling moment and the current at an ending second sampling moment of each second cycle; The second total amplitude of the current fluctuation in each second period is determined based on the absolute value of the third difference between the currents at any two adjacent second sampling moments and the absolute value of the fourth difference.

9. The method according to any one of claims 1 to 8, characterized in that: The target circuit is a high-frequency power circuit on a vehicle.

10. The method according to claim 9, characterized in that The high-frequency power circuit includes: a high-frequency transformer circuit, a high-voltage frequency conversion circuit, or a high-frequency power switch conversion circuit.

11. The method according to claim 9 or 10, characterized in that The method further comprises: If the target circuit has high-frequency ripples in the first period, disabling a target function of the vehicle, wherein the target function is a function of the vehicle that is affected by the high-frequency ripples; If the target loop does not have high-frequency ripples in the first period, the target function is enabled.

12. A high-frequency ripple identification device, characterized in that: The high-frequency ripple recognition device includes an acquisition unit and a processing unit; The acquisition unit is used to sample the current of the target circuit to obtain the current of the target circuit at each sampling moment in the first cycle; The processing unit is used to determine the high-frequency ripple identification result of the target circuit within the first cycle based on the current at each sampling moment.

13. An electronic device, characterized in that: include: A processor and a memory, wherein the processor is connected to the memory, the memory is used to store a computer program, and the processor is used to execute the computer program stored in the memory, so that the electronic device executes the method according to any one of claims 1 to 11.

14. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and the computer program is executed by a processor to implement the method according to any one of claims 1 to 11.

15. A vehicle, characterized in that: The vehicle comprises the apparatus according to claim 12 or the electronic device according to claim 13.

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