Server test system, method and device, storage medium and electronic equipment

Abstract

The invention discloses a server test system, method and device, a storage medium and electronic equipment, the server test system comprises test equipment and a remote terminal, the test equipment comprises an adapter and a photoelectric converter, and a to-be-tested server comprises a component interface, a processor and an indicating lamp; the photoelectric converter is used for collecting a reference light signal sent by the indicator lamp; converting the reference optical signal into a corresponding reference electric signal, and transmitting the reference electric signal to a processor; the remote terminal is used for positioning a target server component accessed through the adapter from the server to be tested; sending a state switching instruction and a lighting test instruction corresponding to the target server component to a processor; by adopting the technical scheme, the problems of low lighting test efficiency of the server component and the like in related technologies are solved, and the technical effect of improving the lighting test efficiency of the server component is further achieved.

Description

Technical Field

[0001] The embodiments of the present application relate to the field of computers, and in particular, to a server testing system, method and device, storage medium and electronic device. Background Art

[0002] Server components, such as server hard disks, usually reflect their status through light emitting diode (LED) indicators. When the server hard disk is in different operating states, the LED indicator can show different colors or different flashing modes. For example, green / blue / red are generally used to indicate common operating states. Green is always on for normal operation of the server hard disk, green flashes for reading and writing, blue indicates that the server hard disk is being located, and red indicates that the server hard disk is in an error or abnormal state. With the increasing complexity of server configurations and the substantial increase in the number of hard disks, ensuring that the LED indicator of each server hard disk can accurately display its operating status has become a key link in improving the overall performance of the server and user experience.

[0003] In the prior art, the test to verify whether the LED indicator light of the server hard disk can accurately display its operating status, that is, the server hard disk lighting test, mainly relies on manual operation. The tester needs to be at the server site, manually issue test instructions and observe the display results of the corresponding LED indicator light of the server hard disk with the naked eye to determine whether the operating status of the server hard disk matches the display results of the corresponding LED indicator light. When faced with multiple server hard disks, the test cycle of the existing test method is long because each server hard disk needs to be tested separately. In addition, the concentration of the tester decreases during long-term repetitive operations, increasing the risk of misjudgment. This problem is particularly prominent when it is necessary to test multiple lighting states. In addition, manual testing is difficult to achieve continuous and large-scale testing operations, which limits its application in production lines and large-scale server environments.

[0004] With regard to the problems in the related technologies such as low efficiency of lighting test of server components, no effective solution has been proposed yet. Summary of the invention

[0005] The embodiments of the present application provide a server testing system, method and device, storage medium and electronic device to at least solve the problem of low efficiency of lighting test of server components in the related art.

[0006] According to an embodiment of the present application, a server testing system is provided, including:

[0007] A test device and a remote terminal, wherein the test device comprises: an adapter and a photoelectric converter, and the server to be tested comprises: a component interface, a processor and an indicator light, wherein the adapter is used to connect the server component to the component interface, the photoelectric converter is used to connect to the processor, the indicator light emits an optical signal to indicate the current operating state of the corresponding server component, and communication is established between the remote terminal and the server to be tested;

[0008] The photoelectric converter is used to collect the reference light signal emitted by the indicator light; convert the reference light signal into a corresponding reference electrical signal, and transmit the reference electrical signal to the processor;

[0009] The remote terminal is used to locate the target server component connected through the adapter from the server to be tested; send the state switching instruction and the lighting test instruction corresponding to the target server component to the processor, wherein the state switching instruction is used to control the processor to switch the target server component to the target operating state, and the lighting test instruction is used to control the processor to receive the reference electrical signal sent by the photoelectric converter and generate a lighting test result based on the matching relationship between the reference electrical signal and the target operating state; and obtain the lighting test result sent by the processor.

[0010] Optionally, the remote terminal is also used to generate a target correspondence between the operating status of the server component and the electrical signal; and send the target correspondence to the processor, wherein the light-on test instruction is used to control the processor to find the target electrical signal corresponding to the target operating status from the target correspondence, and detect whether the target electrical signal is consistent with the reference electrical signal, and generate a test failure result when it is detected that the target electrical signal is inconsistent with the reference electrical signal, and generate a test success result when it is detected that the target electrical signal is consistent with the reference electrical signal, wherein the test failure result is used to indicate that the indicator light on the server to be tested is operating abnormally, and the test success result is used to indicate that the indicator light on the server to be tested is operating normally, and the light-on test result includes the test failure result or the test success result.

[0011] The server to be tested further includes: a baseboard management controller, and the photoelectric converter is connected to the processor via the baseboard management controller:

[0012] The photoelectric converter is used to transmit the reference electrical signal to the baseboard management controller, wherein the baseboard management controller allows access by the processor, and the processor is used to obtain the reference electrical signal sent by the photoelectric converter from the baseboard management controller.

[0013] Optionally, the server to be tested includes: N of the component interfaces, and the adapter includes: N server connectors and N component connectors, where N is an integer greater than or equal to 1;

[0014] Each of the server connectors is used to connect to one of the N component interfaces;

[0015] Each of the component connectors is used to connect a server component.

[0016] Optionally, the server to be tested includes: N indicator lights corresponding to the N component interfaces one by one, each indicator light emits a light signal to indicate the current operating state of the server component connected to the corresponding component interface, and the photoelectric converter includes: N monochrome photoelectric sensor groups corresponding to the N indicator lights, each monochrome photoelectric sensor group includes one or more monochrome photoelectric sensors;

[0017] The i-th monochromatic photoelectric sensor group among the N monochromatic photoelectric sensor groups is used to collect the i-th reference light signal emitted by the i-th indicator light among the N indicator lights; convert the i-th reference light signal into a corresponding i-th reference electrical signal, and transmit the i-th reference electrical signal to the processor, wherein each monochromatic photoelectric sensor in the i-th monochromatic photoelectric sensor group is configured to collect the corresponding monochromatic light signal emitted by the i-th indicator light; convert the monochromatic light signal into a corresponding candidate electrical signal, and the reference electrical signal includes the candidate electrical signal.

[0018] According to a second embodiment of the embodiments of the present application, a server testing method is provided, including:

[0019] Locating a target server component connected through an adapter from the server to be tested, wherein the server to be tested comprises: a component interface, a processor and an indicator light, the adapter is used to connect the server component to the component interface, and the indicator light emits an optical signal to indicate the current operating status of the corresponding server component;

[0020] Controlling the processor to switch the target server component to a target operating state;

[0021] Control the processor to receive a reference electrical signal sent by the photoelectric converter and generate a lighting test result according to a matching relationship between the reference electrical signal and the target operating state, wherein the photoelectric converter is configured to collect a reference optical signal emitted by the indicator light; convert the reference optical signal into a corresponding reference electrical signal, and transmit the reference electrical signal to the processor;

[0022] Obtain the lighting test result sent by the processor.

[0023] Optionally, the controlling the processor to receive the reference electrical signal sent by the photoelectric converter and generating a lighting test result according to a matching relationship between the reference electrical signal and the target operating state includes:

[0024] generating a target correspondence between the operating status of the server component and the electrical signal;

[0025] sending the target correspondence to the processor;

[0026] Controlling the processor to find out the target electrical signal corresponding to the target operating state from the target corresponding relationship;

[0027] Detecting whether the target electrical signal is consistent with the reference electrical signal;

[0028] In the case where it is detected that the target electrical signal is inconsistent with the reference electrical signal, a test failure result is generated, wherein the test failure result is used to indicate that the indicator light on the server to be tested is operating abnormally, and the lighting test result includes the test failure result;

[0029] When it is detected that the target electrical signal is consistent with the reference electrical signal, a test success result is generated, and the test success result is used to indicate that the indicator light on the server to be tested is operating normally; the lighting test result includes the test success result.

[0030] According to a third embodiment of the embodiments of the present application, a server testing device is also provided, including:

[0031] A positioning module, used to locate a target server component connected through an adapter from a server to be tested, wherein the server to be tested comprises: a component interface, a processor and an indicator light, the adapter is used to connect the server component to the component interface, and the indicator light emits an optical signal to indicate the current operating status of the corresponding server component;

[0032] A first control module, configured to control the processor to switch the target server component to a target operating state;

[0033] A second control module is used to control the processor to receive a reference electrical signal sent by a photoelectric converter and generate a lighting test result according to a matching relationship between the reference electrical signal and the target operating state, wherein the photoelectric converter is configured to collect a reference light signal emitted by the indicator light; convert the reference light signal into a corresponding reference electrical signal, and transmit the reference electrical signal to the processor;

[0034] An acquisition module is used to acquire the lighting test result sent by the processor.

[0035] According to a fourth embodiment of the present application, a computer program product is further provided, including a computer program, wherein the computer program is executed by a processor to execute the steps in any of the above method embodiments.

[0036] According to a fifth embodiment of the present application, a computer-readable storage medium is further provided, wherein a computer program is stored in the computer-readable storage medium, wherein the computer program is configured to execute the steps of any one of the above method embodiments when run.

[0037] According to a sixth embodiment of the present application, there is further provided an electronic device, including a memory and a processor, wherein the memory stores a computer program, and the processor is configured to run the computer program to execute the steps in any one of the above method embodiments.

[0038] In an embodiment of the present application, a server testing system is proposed, including: a testing device and a remote terminal, wherein the testing device includes: an adapter and a photoelectric converter, the server to be tested includes: a component interface, a processor and an indicator light, the adapter can connect the server component to the component interface, the photoelectric converter can be connected to the processor, the indicator light emits a light signal that can indicate the current operating state of the corresponding server component, and communication is established between the remote terminal and the server to be tested; the photoelectric converter can collect the reference light signal emitted by the indicator light, and then convert the collected reference light signal into a corresponding reference electrical signal, and then transmit the reference electrical signal to the processor; the remote terminal can locate the target server component connected through the adapter from the server to be tested, and then send the state switching instruction and the lighting test instruction corresponding to the target server component to the processor, wherein the state switching instruction can control the processor to switch the target server component to the target operating state, and the lighting test instruction can control the processor to receive the reference electrical signal sent by the photoelectric converter. And generate a lighting test result based on the matching relationship between the reference electrical signal and the target operating state; finally, obtain the lighting test result sent by the processor, that is, the adapter in the test equipment connects the component interface of the server to be tested and the server component, and the photoelectric converter in the test equipment can convert the optical signal emitted by the indicator light corresponding to the server component into an electrical signal, and control the processor in the server to be tested to switch the target server component to the target operating state through the remote terminal in the test system, and at the same time control the processor in the server to be tested to generate a lighting test result based on the electrical signal sent by the photoelectric converter in the test equipment and the matching relationship between the electrical signal and the target operating state, and the remote terminal can remotely receive the lighting test result of the server to be tested, avoiding the long test cycle and cumbersome test procedures in the prior art that require manual issuance of test instructions and judgment of whether the indicator light is correctly displayed. The above technical solution is adopted to solve the problems of low efficiency of lighting test of server components in related technologies, and achieve the technical effect of improving the efficiency of lighting test of server components. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] Figure 1 It is a structural block diagram of a server test system in the prior art;

[0040] Figure 2 is a structural block diagram of a server testing system according to an embodiment of the present application;

[0041] Figure 3 is a structural block diagram of another server test system according to an embodiment of the present application;

[0042] Figure 4 is an exemplary diagram of a component connector side of a test device according to an embodiment of the present application;

[0043] Figure 5is an example diagram of a server connector side of a test device according to an embodiment of the present application;

[0044] Figure 6 is a diagram showing an example of the working structure of a server test system when performing a lighting test according to an embodiment of the present application;

[0045] Figure 7 is a structural example diagram of a photoelectric converter in a test device according to an embodiment of the present application;

[0046] Figure 8 It is a hardware structure block diagram of a computer device of a server test system according to an embodiment of the present application;

[0047] Fig. 9 is a flow chart of a server testing method according to an embodiment of the present application;

[0048] Fig.10 It is a schematic diagram of a method flow for lighting test on server hardware according to an embodiment of the present application;

[0049] Fig.11 is a structural block diagram of a server testing device according to an embodiment of the present application;

[0050] Fig.12 is a schematic diagram of an electronic device according to an embodiment of the present application. DETAILED DESCRIPTION

[0051] The embodiments of the present application will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0052] It should be noted that the terms "first", "second", etc. in the specification and claims of this application and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence.

[0053] The present application proposes a server testing system. Before describing the optional embodiments of the present application, in order to better understand the inventive concept of the present application and the creativity of the solution, the related technologies are first described: Figure 1 It is a structural block diagram of a server test system in the prior art, such as Figure 1 As shown, for a server to be tested, an indicator light is deployed on the server to indicate the operating status of the server hard disk. The existing server hard disk lighting test solution requires the tester to connect the server hard disk with the hard disk interface on the server to be tested at the server to be tested site, manually send test instructions to put the server hard disk in different operating states and visually observe the display results of the indicator light on the server to be tested, and judge whether the lighting function of the server to be tested is normal based on the matching between the operating status of the server hard disk and the display results of the indicator light.

[0054] In this embodiment, a server test system is provided, comprising: a test device and a remote terminal, the test device comprising: an adapter and a photoelectric converter, the server to be tested comprising: a component interface, a processor and an indicator light, the adapter is used to connect the server component to the component interface, the photoelectric converter is used to connect to the processor, the indicator light emits an optical signal to indicate the current operating state of the corresponding server component, and communication is established between the remote terminal and the server to be tested; the photoelectric converter is used to collect the reference optical signal emitted by the indicator light; convert the reference optical signal into a corresponding reference electrical signal, and transmit the reference electrical signal to the processor; the remote terminal is used to locate the target server component connected through the adapter from the server to be tested; send a state switching instruction and a lighting test instruction corresponding to the target server component to the processor, wherein the state switching instruction is used to control the processor to switch the target server component to a target operating state, and the lighting test instruction is used to control the processor to receive the reference electrical signal sent by the photoelectric converter and generate a lighting test result according to the matching relationship between the reference electrical signal and the target operating state; and obtain the lighting test result sent by the processor.

[0055] Optionally, in this embodiment, Figure 2 is a structural block diagram of a server test system according to an embodiment of the present application, such as Figure 2 As shown, the server test system includes a test device and a remote terminal. The test device may be, but is not limited to, a test fixture that proximally connects the server and server components (including but not limited to the server hard disk), including a hard disk test fixture. The remote terminal may be, but is not limited to, a terminal device that can establish communication with the server to be tested, including a personal computer and a smart phone, etc. The terminal device can locate the target server component (server hard disk) that is connected to the server to be tested through an adapter through the server to be tested, and send the state switching instructions and lighting test instructions corresponding to the server hard disk to the processor on the server to be tested (which may be a central processing unit (CPU)), and can also obtain the lighting test results sent by the processor for the tester to view.

[0056] Optionally, in this embodiment, if Figure 2As shown, the test equipment is deployed with an adapter and an optoelectronic adapter. The adapter can be, but is not limited to, a hardware component used to connect a server component (such as a server hard disk) to a component interface (hard disk interface). The optoelectronic converter can collect a reference optical signal of an indicator light on the server to be tested. The reference optical signal can be, but is not limited to, the display result of the indicator light under the current operating state of the server component, including the current indicator light color and flashing mode.

[0057] Optionally, in this embodiment, if Figure 2 As shown, the remote terminal implements a light-on test on the server to be tested by sending a state switching instruction and a light-on test instruction corresponding to the server hard disk to the processor on the server to be tested, wherein the state switching instruction can control the processor to switch the server hard disk to a target operating state (one of all the states to be tested of the server component). For example, in the case where the server component is a server hard disk, the target operating state can be one of a variety of states to be tested, such as normal operation, positioning state, error or abnormality, and reconstruction state; the light-on test instruction can control the processor to receive a reference electrical signal sent by the photoelectric converter in the test equipment and generate a light-on test result based on the matching relationship between the reference electrical signal and the target operating state, and then the processor sends the light-on test result to the remote terminal.

[0058] As an optional scheme, the remote terminal is also used to generate a target correspondence between the operating status of the server component and the electrical signal; and send the target correspondence to the processor, wherein the light-on test instruction is used to control the processor to find the target electrical signal corresponding to the target operating status from the target correspondence, and detect whether the target electrical signal is consistent with the reference electrical signal, and generate a test failure result when it is detected that the target electrical signal is inconsistent with the reference electrical signal, and generate a test success result when it is detected that the target electrical signal is consistent with the reference electrical signal, wherein the test failure result is used to indicate that the indicator light on the server to be tested is operating abnormally, and the test success result is used to indicate that the indicator light on the server to be tested is operating normally, and the light-on test result includes the test failure result or the test success result.

[0059] Optionally, in this embodiment, the processor generates a lighting test result in the following manner: first, the processor receives a target correspondence sent by a remote terminal, wherein the target correspondence is generated by the remote terminal and can indicate the correspondence between the operating state of the server component and the electrical signal; then, after receiving the state switching instruction and the lighting test instruction corresponding to the target server component sent by the remote terminal, the processor finds out the target electrical signal corresponding to the target operating state from the target correspondence, detects whether the target electrical signal is consistent with the reference electrical signal, and generates a test failure result when it is detected that the target electrical signal is inconsistent with the reference electrical signal, indicating that the indicator light on the server to be tested is operating abnormally; generates a test success result when it is detected that the target electrical signal is consistent with the reference electrical signal, indicating that the indicator light on the server to be tested is operating normally; finally, the lighting test result is sent to the remote terminal, wherein the lighting test result may include but is not limited to a test failure result or a test success result.

[0060] Optionally, in this embodiment, if the server component is a server hard disk, the corresponding running state to be tested includes: normal operation, positioning state, error or abnormality, and reconstruction state, and ideally, when the server hard disk is in the normal operation state, the server indicator light should be green and the corresponding electrical signal is signal_Green_Long; when the server hard disk is in the locate state, the server indicator light should be blue and the corresponding electrical signal is signal_Blue; when the server hard disk is in the error state or abnormality state, the server indicator light should be red and the corresponding electrical signal is signal_Red; when the server hard disk is in the rebuild state, the server indicator light should be purple and the corresponding electrical signal is signal_Purple, etc. The remote terminal establishes a corresponding relationship according to the running state to be tested of the server hard disk and the ideal electrical signal conditions under different running states: the normal operation state corresponds to the electrical signal signal_Green_Long, the positioning state corresponds to the electrical signal signal_Blue, the error or abnormal state corresponds to the electrical signal signal_Red, the reconstruction state corresponds to the electrical signal signal_Purple, etc.

[0061] As an optional solution, the server to be tested also includes: a baseboard management controller, the photoelectric converter is connected to the processor through the baseboard management controller: the photoelectric converter is used to transmit the reference electrical signal to the baseboard management controller, wherein the baseboard management controller allows access to the processor, and the processor is used to obtain the reference electrical signal sent by the photoelectric converter from the baseboard management controller.

[0062] Optionally, in this embodiment, Figure 3 is a structural block diagram of another server test system according to an embodiment of the present application, such as Figure 3 As shown, the server to be tested also includes a baseboard management controller (Baseboard Management Controller, BMC). The photoelectric converter in the test equipment can transmit the reference electrical signal to the BMC. At the same time, the BMC is connected to the processor, that is, the photoelectric converter is connected to the processor through the BMC, and the processor can obtain the reference electrical signal sent by the photoelectric converter through the BMC.

[0063] As an optional solution, the server to be tested includes: N component interfaces, and the adapter includes: N server connectors and N component connectors, wherein N is an integer greater than or equal to 1; each of the server connectors is used to connect to one of the N component interfaces; and each of the component connectors is used to connect to a server component.

[0064] Optionally, in this embodiment, the adapter includes N server connectors and N component connectors, the N server connectors can be connected to N component interfaces of the server to be tested, and the N component connectors can be connected to N server components. Assume that the server component is a server hard disk. Figure 4 is an example diagram of a component connector side of a test device according to an embodiment of the present application, such as Figure 4 As shown, four component connectors are deployed on the component connector side of the test equipment, namely SLOT 0 to 3. The component connectors may be, but are not limited to, SFF-8639RECEP TACLE gold fingers, U.2 interfaces, and E1.S interfaces, etc. Figure 5 is an example diagram of a server connector side of a test device according to an embodiment of the present application, such as Figure 5 As shown, four server connectors FG 0 to 3 are deployed on the server connector side (also called the server backplane side) of the test equipment. The server connector can be, but is not limited to, SFF-8639 PLUG gold fingers. The connection length of the gold fingers of the component connector and the server connector should not be too long to avoid affecting the high-speed signal quality of the hard disk.

[0065] Optionally, in this embodiment, the interface layouts on the server connector side and the component connector side of the test device are the same, and the layout of the interface is consistent with the layout of the component interface on the server to be tested. At the same time, the layout of the interface on both sides of the test device can also be adjusted according to the layout of the component interface of the server to be tested to accommodate a variety of server types. In this embodiment, the connection length setting of the test device and the server component interface and the server hard disk connection is based on the premise that it does not affect the data transmission efficiency of the server hard disk.

[0066] Optionally, in this embodiment, Figure 6 FIG. 1 is a diagram showing an example of a working structure of a server test system when performing a lighting test according to an embodiment of the present application. Figure 6 As shown, the server to be tested includes 4 component interfaces (hard disk interfaces 0 to 3), and the adapter includes 4 server connectors (server connectors 0 to 3) and 4 component connectors (component connectors 0 to 3). Each server connector can be connected to a component interface, for example, the server connector 1 of the adapter is connected to the hard disk interface 1 of the server to be tested; each component connector can be connected to a server component, for example, the component connector 1 of the adapter is connected to the server hard disk 1.

[0067] As an optional solution, the server to be tested includes: N indicator lights corresponding one-to-one to the N component interfaces, each indicator light emitting a light signal for indicating the current operating status of the server component connected to the corresponding component interface, and the photoelectric converter includes: N monochrome photoelectric sensor groups corresponding to the N indicator lights, each monochrome photoelectric sensor group including one or more monochrome photoelectric sensors; the i-th monochrome photoelectric sensor group among the N monochrome photoelectric sensor groups, for collecting the i-th reference light signal emitted by the i-th indicator light among the N indicator lights; converting the i-th reference light signal into the corresponding i-th reference electrical signal, and transmitting the i-th reference electrical signal to the processor, wherein each monochrome photoelectric sensor in the i-th monochrome photoelectric sensor group is configured to collect the corresponding monochrome light signal emitted by the i-th indicator light; converting the monochrome light signal into the corresponding candidate electrical signal, and the reference electrical signal includes the candidate electrical signal.

[0068] Optionally, in this embodiment, if Figure 6 As shown, four indicator lights LED 0 to 3 corresponding to four hard disk interfaces (component interfaces) are deployed on the server to be tested. The light signal emitted by each indicator light can indicate the current operating status of the server hard disk (server component) connected to the corresponding hard disk interface, that is, the display result (light signal) of LED 0 can indicate the current operating status of the server hard disk 0 connected to the hard disk interface 0 through the adapter.

[0069] Optionally, in this embodiment, the photoelectric converter includes N monochrome photoelectric sensor groups corresponding to the N indicator lights on the server to be tested, the monochrome photoelectric sensor groups include one or more monochrome photoelectric sensors, and each monochrome photoelectric sensor is preset to detect light signals of a specific wavelength. For example, three monochrome photoelectric sensors can be set as a group to detect monochromatic light signals of green, blue and red, respectively. Figure 7 is a structural example diagram of a photoelectric converter in a test device according to an embodiment of the present application, such as Figure 7As shown, the photoelectric converter includes four monochromatic photoelectric sensor groups corresponding to indicator LEDs 0 to 3, wherein the monochromatic photoelectric sensor groups obtain power from the interface of the server component under test through a low dropout regulator (LDO), and each monochromatic photoelectric sensor group includes three monochromatic photoelectric sensors, which are respectively configured to collect monochromatic light signals of three colors: green, blue, and red. Each monochromatic photoelectric sensor group can collect the light signal emitted by the corresponding indicator, that is, the photoelectric converter can collect the light signal emitted by the first indicator (LED 0) through the first monochromatic photoelectric sensor group (monochromatic photoelectric sensors 0 to 2), and determine it as a reference light signal (light signal 0), and then convert the reference light signal into a reference electrical signal (electrical signal 0) and transmit it to the processor of the server under test.

[0070] Optionally, in this embodiment, the photoelectric converter converts the reference light signal into a reference electrical signal in the following manner, but is not limited to: for multiple monochrome photosensors in a monochrome photosensor group, the output of each monochrome photosensor may be open-drain output or push-pull output. If it is open-drain output, when the monochrome photosensor detects the corresponding monochrome light signal, the monochrome photosensor will pull the signal up to 3.3V through an external resistor, indicating that the corresponding monochrome light is on, and the electrical signal is "1". On the contrary, if the corresponding monochrome light signal is not detected, the monochrome photosensor will not output, and the level logic remains at 0, indicating that the corresponding monochrome light is not on. Figure 7 As shown, assuming that the first indicator light (LED 0) displays blue light, the reference light signal collected by the first group of monochrome photoelectric sensors (monochrome photoelectric sensors 0-2) is blue, wherein the output signal of the monochrome photoelectric sensor 0 that does not detect green light is "0" (candidate electrical signal), the output signal of the monochrome photoelectric sensor 1 that detects blue light is "1" (candidate electrical signal), and the output signal of the monochrome photoelectric sensor 2 that does not detect red light is "0" (candidate electrical signal). According to the candidate electrical signals of multiple monochrome photoelectric sensors, the reference electrical signal of the first group of monochrome photoelectric sensors is "010".

[0071] Optionally, in this embodiment, the photoelectric converter converts the reference optical signal into a reference electrical signal in the following manner: a collection period is set for the electrical signal. Assuming that the BMC continuously collects the electrical signal of each monochrome photoelectric sensor group within each 10-second period, for example, assuming that the second indicator light (LED 1) displays a flashing green light, the second group of monochrome photoelectric sensor groups (monochrome photoelectric sensors 3 to 5) collects the candidate electrical signal of the second indicator light (LED 1) within 10 seconds as a signal sequence. According to the candidate electrical signals of multiple monochrome photoelectric sensors, the output electrical signal sequence of the first group of monochrome photoelectric sensor groups is obtained as "100 000 100 000......", wherein "1" indicates that the corresponding monochrome photoelectric sensor detects green light, and "0" indicates that it is not detected. Correspondingly, the electrical signal of the green light that is always on corresponds to the output electrical signal sequence "100 100 100100......". By establishing a one-to-one correspondence between multiple electrical signal sequences and multiple server component operating state types, the test system can also be applied to server components with complex lighting types (multiple operating state types).

[0072] Optionally, in this embodiment, the way in which the baseboard management controller obtains the reference electrical signal may be but is not limited to: after the photoelectric converter sends the reference electrical signal through the IO expansion device (Input / Output Expansion), the reference electrical signal is obtained by reading the IO expansion device register through I2C (Inter-Integrated Circuit), where the IO expansion device may be PCA9555.

[0073] The method embodiments provided in the embodiments of the present application can be executed in a server device or a similar computing device. Taking running on a server device as an example, Figure 8 1 is a hardware structure block diagram of a computer device of a server test system according to an embodiment of the present application. Figure 8 As shown, the server device may include one or more ( Figure 8 Only one is shown in the figure) a processor 802 (the processor 802 may include but is not limited to a processing device such as a microprocessor MCU or a programmable logic device FPGA) and a memory 804 for storing data, wherein the server device may also include a transmission device 806 and an input / output device 808 for communication functions. A person skilled in the art will understand that Figure 8 The structure shown is only for illustration and does not limit the structure of the above server device. Figure 8 More or fewer components as shown, or with Figure 8 Different configurations shown.

[0074] The memory 804 can be used to store computer programs, for example, software programs and modules of application software, such as the computer program corresponding to the test system of the server in the embodiment of the present application. The processor 802 executes various functional applications and data processing by running the computer program stored in the memory 804, that is, to implement the above method. The memory 804 may include a high-speed random access memory, and may also include a non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some instances, the memory 804 may further include a memory remotely arranged relative to the processor 802, and these remote memories may be connected to the server device via a network. Examples of the above-mentioned network include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

[0075] The transmission device 806 is used to receive or send data via a network. The specific example of the above network may include a wireless network provided by a communication provider of the server device. In one example, the transmission device 806 includes a network adapter (Network Interface Controller, referred to as NIC), which can be connected to other network devices through a base station so as to communicate with the Internet. In one example, the transmission device 806 can be a radio frequency (RF) module, which is used to communicate with the Internet wirelessly.

[0076] In this embodiment, a server testing method is also provided. Fig. 9 is a flow chart of a server testing method according to an embodiment of the present application, such as Fig. 9 As shown, the process includes the following steps:

[0077] Step S12, locating a target server component connected through an adapter from the server to be tested, wherein the server to be tested includes: a component interface, a processor, and an indicator light, the adapter is used to connect the server component to the component interface, and the indicator light emits a light signal to indicate the current operating status of the corresponding server component;

[0078] Step S14, controlling the processor to switch the target server component to a target operating state;

[0079] Step S16, controlling the processor to receive a reference electrical signal sent by the photoelectric converter and to generate a lighting test result according to a matching relationship between the reference electrical signal and the target operating state, wherein the photoelectric converter is configured to collect a reference optical signal emitted by the indicator light; convert the reference optical signal into a corresponding reference electrical signal, and transmit the reference electrical signal to the processor;

[0080] Step S18, obtaining the lighting test result sent by the processor.

[0081] Optionally, in this embodiment, the server to be tested includes a component interface, a processor and an indicator light, such as Figure 3 As shown, the server component can be a server hard disk, and the component interface can be a hard disk interface. The way of performing the lighting test through the server test system can be but is not limited to: first, the remote terminal in the test system locates the target server component connected to the server to be tested through the adapter through the server to be tested, including other components such as the server hard disk, and it is assumed that the first server hard disk (server hard disk 0) is located; then the control processor switches the operating state of the target server component to the target operating state, such as switching the operating state of the server hard disk 0 to the positioning state, and at the same time, the indicator LED0 corresponding to the server hard disk interface 0 to be tested to which the server hard disk 0 is connected through the converter will display the reference optical signal (reference optical signal 0) in the current operating state, the photoelectric converter in the test equipment detects the reference optical signal 0 and converts it into a reference electrical signal (reference electrical signal 0), and sends the reference electrical signal 0 to the processor of the server to be tested; then the control processor receives the reference electrical signal 0, and determines the matching between the reference electrical signal 0 and the target operating state (positioning state) based on the target corresponding relationship; finally, the lighting test result is generated according to the matching situation and sent to the remote terminal.

[0082] As an optional solution, controlling the processor to receive the reference electrical signal sent by the photoelectric converter and generating a lighting test result according to a matching relationship between the reference electrical signal and the target operating state includes:

[0083] S21, generating a target correspondence relationship between the operating status of the server component and the electrical signal;

[0084] S22, sending the target correspondence relationship to the processor;

[0085] S23, controlling the processor to find out the target electrical signal corresponding to the target operating state from the target corresponding relationship;

[0086] S24, detecting whether the target electrical signal is consistent with the reference electrical signal;

[0087] S25, generating a test failure result when it is detected that the target electrical signal is inconsistent with the reference electrical signal, wherein the test failure result is used to indicate that the indicator light on the server to be tested is operating abnormally, and the lighting test result includes the test failure result;

[0088] S26, when it is detected that the target electrical signal is consistent with the reference electrical signal, generating a test success result, wherein the test success result is used to indicate that the indicator light on the server to be tested is operating normally; the lighting test result includes the test success result.

[0089] Optionally, in this embodiment, the manner in which the remote terminal controls the processor to generate a lighting test result based on the matching relationship between the reference electrical signal and the target operating state has been described in the above introduction to the remote terminal in the test system and will not be repeated here.

[0090] Optionally, in this embodiment, in order to better understand the process of the testing method of the above-mentioned server, the testing method process of the above-mentioned server is described below in combination with an optional embodiment, but it is not used to limit the technical solution of the embodiment of the present application.

[0091] In this embodiment, a server testing method is provided. Fig.10 is a schematic diagram of a method flow for lighting a server hardware according to an embodiment of the present application, such as Fig.10 As shown, it mainly includes the following steps:

[0092] Step 1: Connect the test fixture and the server to be tested. Connect the server connector side of the test fixture (test equipment) to the server hard disk interface (server component interface), and the component connector side to the hard disk of the server to be tested. Connect the output signal of the test fixture (can be connected through a cable) to the baseboard management controller BMC of the server to be tested, and ensure that the BMC can read the output signal of the photoelectric converter in the test equipment;

[0093] Step 2: The processor executes the test script. After the server to be tested is powered on and enters the operating system, the tester or the automated test system executes the lighting test script in the processor. The script is responsible for the logic control and instruction call of the entire lighting test process. The test script is not limited to the programming language and can be Python, Shell, etc.

[0094] Step 3: Enter test parameters. The tester enters the range and operation status type of the server hard disk to be tested. The number of server hard disks to be tested can be one or more, where the operation status type can be specified as normal operation, positioning status, error or abnormality, rebuilding status, or status types of multiple server hard disks.

[0095] Step 4: Execute the lighting operation. The test script in the processor sends the corresponding lighting instruction (state switching instruction) to the server hard disk according to the server hard disk range and operating status type entered by the tester to control the server hard disk to switch to the target operating state (one of the operating status types), and the corresponding indicator light will also update the display status.

[0096] Step 5: Get the photoelectric sensor signal. After the server hard disk receives the status switching command and the indicator light updates the display status, the test script sends a command through the BMC to read the electrical signal of the monochrome photoelectric sensor group corresponding to the server hard disk position in the test fixture.

[0097] Step 6: Determine the test results. Compare the electrical signal sent by the monochrome photoelectric sensor group with the target operating state in step 4 to determine whether the indicator light responds correctly to the command. If the electrical signal matches the electrical signal corresponding to the expected target operating state, the lighting test result is marked as pass; if it does not match, it is marked as fail. After determining the lighting status of a server hard disk, the test script can automatically issue a command to turn off the indicator light to avoid interference in subsequent testing processes.

[0098] Step 7: Comprehensive test. The test script will continue to test other lighting types (other operating status types) of the server hard disk until all lighting types (operating status types) are tested. After that, continue to perform the same test on the next server hard disk until all lighting types (operating status types) of all server hard disks to be tested are tested.

[0099] Step 8: Generate a test report. After the test script completes the lighting test of all server hard disks, it will generate a detailed lighting test report in a preset format based on the test results of each server hard disk. The report will record the lighting type (operating status type) test results of each server hard disk, pass or fail, and may include fault analysis and suggestions to facilitate quick abnormal situations.

[0100] Through this process, the server hard disk lighting test can be automated and standardized, greatly improving the efficiency and accuracy of the test, while reducing manual participation and avoiding misjudgment caused by visual fatigue.

[0101] Through the description of the above implementation methods, those skilled in the art can clearly understand that the method according to the above embodiment can be implemented by means of software plus a necessary general hardware platform, and of course by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art, can be embodied in the form of a software product, which is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk), and includes a number of instructions for a terminal device (which can be a mobile phone, computer, server, or network device, etc.) to execute the methods described in each embodiment of the present application.

[0102] In this embodiment, a testing device for a server is also provided, which is used to implement the above-mentioned embodiments and preferred implementation modes, and the descriptions that have been made will not be repeated. As used below, the term "module" can implement a combination of software and / or hardware of a predetermined function. Although the devices described in the following embodiments are preferably implemented in software, the implementation of hardware, or a combination of software and hardware, is also possible and conceivable.

[0103] Fig.11 is a structural block diagram of a server testing device according to an embodiment of the present application; Fig.11 As shown, including:

[0104] The positioning module 1102 is used to locate the target server component connected through the adapter from the server to be tested, wherein the server to be tested includes: a component interface, a processor and an indicator light, the adapter is used to connect the server component to the component interface, and the indicator light emits a light signal to indicate the current operating status of the corresponding server component;

[0105] A first control module 1104, configured to control the processor to switch the target server component to a target operating state;

[0106] The second control module 1106 is used to control the processor to receive the reference electrical signal sent by the photoelectric converter and generate a lighting test result according to the matching relationship between the reference electrical signal and the target operating state, wherein the photoelectric converter is configured to collect the reference light signal emitted by the indicator light; convert the reference light signal into a corresponding reference electrical signal, and transmit the reference electrical signal to the processor;

[0107] The acquisition module 1108 is used to acquire the lighting test result sent by the processor.

[0108] In an exemplary embodiment, the second control module comprises:

[0109] A first generating unit, configured to generate a target correspondence between an operating state of a server component and an electrical signal;

[0110] A sending unit, configured to send the target correspondence relationship to the processor;

[0111] A control unit, configured to control the processor to find out a target electrical signal corresponding to the target operating state from the target corresponding relationship;

[0112] A detection unit, used to detect whether the target electrical signal is consistent with the reference electrical signal;

[0113] A second generating unit is used to generate a test failure result when it is detected that the target electrical signal is inconsistent with the reference electrical signal, wherein the test failure result is used to indicate that the indicator light on the server to be tested is operating abnormally, and the lighting test result includes the test failure result;

[0114] The third generating unit is used to generate a test success result when it is detected that the target electrical signal is consistent with the reference electrical signal, and the test success result is used to indicate that the indicator light on the server to be tested is operating normally; the lighting test result includes the test success result.

[0115] It should be noted that the above modules can be implemented by software or hardware. For the latter, it can be implemented in the following ways, but not limited to: the above modules are all located in the same processor; or the above modules are located in different processors in any combination.

[0116] An embodiment of the present application also provides a computer program product, including a computer program, which, when executed by a processor, implements the steps of the method described in each embodiment of the present application; the computer program product also includes a non-volatile computer-readable storage medium, which stores the computer program, and when executed by a processor, implements the steps of the method described in each embodiment of the present application.

[0117] An embodiment of the present application further provides a computer-readable storage medium, in which a computer program is stored, wherein the computer program is configured to execute the steps of any of the above method embodiments when running.

[0118] In an exemplary embodiment, the computer-readable storage medium may include, but is not limited to, various media that can store computer programs, such as a USB flash drive, a read-only memory (ROM), a random access memory (RAM), a mobile hard disk, a magnetic disk or an optical disk.

[0119] An embodiment of the present application further provides an electronic device, Fig.12 is a schematic diagram of an electronic device according to an embodiment of the present application, such as Fig.12 As shown, the electronic device includes a memory and a processor, the memory stores a computer program, and the processor is configured to run the computer program to execute the steps in any one of the above method embodiments.

[0120] In an exemplary embodiment, the electronic device may further include a transmission device and an input / output device, wherein the transmission device is connected to the processor, and the input / output device is connected to the processor.

[0121] For specific examples in this embodiment, reference may be made to the examples described in the above embodiments and exemplary implementation modes, and this embodiment will not be described in detail herein.

[0122] Obviously, those skilled in the art should understand that the above modules or steps of the present application can be implemented by a general computing device, they can be concentrated on a single computing device, or distributed on a network composed of multiple computing devices, they can be implemented by a program code executable by a computing device, so that they can be stored in a storage device and executed by the computing device, and in some cases, the steps shown or described can be executed in a different order from that herein, or they can be made into individual integrated circuit modules, or multiple modules or steps therein can be made into a single integrated circuit module for implementation. Thus, the present application is not limited to any specific combination of hardware and software.

[0123] The above description is only the preferred embodiment of the present application and is not intended to limit the present application. For those skilled in the art, the present application may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the principles of the present application shall be included in the protection scope of the present application.

Claims

1. A server testing system, characterized in that: include: A test device and a remote terminal, wherein the test device comprises: an adapter and a photoelectric converter, and the server to be tested comprises: a component interface, a processor and an indicator light, wherein the adapter is used to connect the server component to the component interface, the photoelectric converter is used to connect to the processor, the indicator light emits an optical signal to indicate the current operating state of the corresponding server component, and communication is established between the remote terminal and the server to be tested; The photoelectric converter is used to collect the reference light signal emitted by the indicator light; convert the reference light signal into a corresponding reference electrical signal, and transmit the reference electrical signal to the processor; The remote terminal is used to locate the target server component connected through the adapter from the server to be tested; send the state switching instruction and the lighting test instruction corresponding to the target server component to the processor, wherein the state switching instruction is used to control the processor to switch the target server component to the target operating state, and the lighting test instruction is used to control the processor to receive the reference electrical signal sent by the photoelectric converter and generate a lighting test result based on the matching relationship between the reference electrical signal and the target operating state; and obtain the lighting test result sent by the processor.

2. The system according to claim 1, characterized in that The remote terminal is also used to generate a target correspondence between the operating status of the server component and the electrical signal; and send the target correspondence to the processor, wherein the lighting test instruction is used to control the processor to find the target electrical signal corresponding to the target operating status from the target correspondence, and detect whether the target electrical signal is consistent with the reference electrical signal. When it is detected that the target electrical signal is inconsistent with the reference electrical signal, a test failure result is generated; and when it is detected that the target electrical signal is consistent with the reference electrical signal, a test success result is generated, wherein the test failure result is used to indicate that the indicator light on the server to be tested is operating abnormally, and the test success result is used to indicate that the indicator light on the server to be tested is operating normally, and the lighting test result includes the test failure result or the test success result.

3. The system according to claim 1, characterized in that The server to be tested further includes: a baseboard management controller, and the photoelectric converter is connected to the processor via the baseboard management controller: The photoelectric converter is used to transmit the reference electrical signal to the baseboard management controller, wherein the baseboard management controller allows access by the processor, and the processor is used to obtain the reference electrical signal sent by the photoelectric converter from the baseboard management controller.

4. The system according to claim 1, characterized in that The server to be tested includes: N component interfaces, and the adapter includes: N server connectors and N component connectors, wherein N is an integer greater than or equal to 1; Each of the server connectors is used to connect to one of the N component interfaces; Each of the component connectors is used to connect a server component.

5. The system according to claim 4, characterized in that The server to be tested comprises: N indicator lights corresponding to the N component interfaces one by one, each indicator light emits a light signal to indicate the current operating state of the server component connected to the corresponding component interface, and the photoelectric converter comprises: N monochrome photoelectric sensor groups corresponding to the N indicator lights, each monochrome photoelectric sensor group comprises one or more monochrome photoelectric sensors; The i-th monochromatic photoelectric sensor group among the N monochromatic photoelectric sensor groups is used to collect the i-th reference light signal emitted by the i-th indicator light among the N indicator lights; convert the i-th reference light signal into a corresponding i-th reference electrical signal, and transmit the i-th reference electrical signal to the processor, wherein each monochromatic photoelectric sensor in the i-th monochromatic photoelectric sensor group is configured to collect the corresponding monochromatic light signal emitted by the i-th indicator light; convert the monochromatic light signal into a corresponding candidate electrical signal, and the reference electrical signal includes the candidate electrical signal.

6. A server testing method, characterized in that: include: Locating a target server component connected through an adapter from the server to be tested, wherein the server to be tested comprises: a component interface, a processor and an indicator light, the adapter is used to connect the server component to the component interface, and the indicator light emits an optical signal to indicate the current operating status of the corresponding server component; Controlling the processor to switch the target server component to a target operating state; Control the processor to receive a reference electrical signal sent by the photoelectric converter and generate a lighting test result according to a matching relationship between the reference electrical signal and the target operating state, wherein the photoelectric converter is configured to collect a reference optical signal emitted by the indicator light; convert the reference optical signal into a corresponding reference electrical signal, and transmit the reference electrical signal to the processor; Obtain the lighting test result sent by the processor.

7. The method according to claim 6, characterized in that The controlling the processor to receive the reference electrical signal sent by the photoelectric converter and to generate a lighting test result according to a matching relationship between the reference electrical signal and the target operating state includes: generating a target correspondence between the operating status of the server component and the electrical signal; sending the target correspondence to the processor; Controlling the processor to find out the target electrical signal corresponding to the target operating state from the target corresponding relationship; Detecting whether the target electrical signal is consistent with the reference electrical signal; In the case where it is detected that the target electrical signal is inconsistent with the reference electrical signal, a test failure result is generated, wherein the test failure result is used to indicate that the indicator light on the server to be tested is operating abnormally, and the lighting test result includes the test failure result; When it is detected that the target electrical signal is consistent with the reference electrical signal, a test success result is generated, and the test success result is used to indicate that the indicator light on the server to be tested is operating normally; the lighting test result includes the test success result.

8. A server testing device, characterized in that: include: A positioning module, used to locate a target server component connected through an adapter from a server to be tested, wherein the server to be tested comprises: a component interface, a processor and an indicator light, the adapter is used to connect the server component to the component interface, and the indicator light emits an optical signal to indicate the current operating status of the corresponding server component; A first control module, configured to control the processor to switch the target server component to a target operating state; A second control module is used to control the processor to receive a reference electrical signal sent by a photoelectric converter and generate a lighting test result according to a matching relationship between the reference electrical signal and the target operating state, wherein the photoelectric converter is configured to collect a reference light signal emitted by the indicator light; convert the reference light signal into a corresponding reference electrical signal, and transmit the reference electrical signal to the processor; An acquisition module is used to acquire the lighting test result sent by the processor.

9. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, wherein the computer program implements the steps of the method described in any one of claims 6 to 7 when executed by a processor.

10. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the steps of the method described in any one of claims 6 to 7 are implemented.

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