Microwave source testing device, system and method

Abstract

The invention provides a microwave source testing device, system and method. The microwave source testing device comprises a microwave device adaptation module and a testing device mother board. The microwave device adaptation module is connected with the test device mother board through a connector; the microwave device adaptation module is used for adapting to different packaged to-be-tested microwave devices and connecting the different packaged to-be-tested microwave devices to the microwave source testing device; and the test device mother board is used for receiving a microwave source test parameter template corresponding to the packaging structure and the interface type of the microwave device to be tested, performing working parameter adaptation on the microwave device to be tested according to the microwave source test parameter template, and outputting a microwave signal generated by the microwave device to be tested so as to test the microwave signal. To-be-tested microwave devices with different packaging structures are quickly connected to the microwave source testing device through a simple structure; rapid testing of the to-be-tested microwave device is realized, the difficulty in assembling, debugging and testing the device is reduced, and the testing efficiency is improved.

Description

Technical Field

[0001] The invention relates to the field of microwave source testing, and in particular to a microwave source testing device, system and testing method thereof. Background Art

[0002] The CPT atomic clock is a miniature atomic clock. Due to its unique technical characteristics, it does not need to use the microwave cavity required by traditional atomic clocks. Therefore, the volume and power consumption of the CPT atomic clock can be smaller and lower than other types of atomic clocks, and can even reach the true "chip-level" volume and power consumption standards. This feature makes it possible to further promote the application of CPT atomic clocks in small volume and low power consumption scenarios and to develop chip-level atomic clock products. Therefore, the CPT atomic clock has always been one of the research hotspots of miniaturized atomic clocks.

[0003] At present, there are many manufacturers at home and abroad developing and producing CPT atomic clock microwave devices. However, the microwave devices produced by each manufacturer are not exactly the same in terms of microwave output power, device packaging form and communication control interface. Therefore, when testing different microwave devices, it is necessary to design different dedicated circuits and write different device drive control programs, etc. The testing process is complicated and inefficient. Summary of the invention

[0004] The purpose of the present invention is to provide a microwave source testing device, system and testing method thereof, which can adapt to different microwave devices, conveniently test and verify various microwave devices, simplify the testing process and improve the testing efficiency.

[0005] To achieve the above object, the present invention provides the following solutions:

[0006] A microwave source testing device, comprising: a microwave device adaption module and a testing device motherboard;

[0007] The microwave device adaptation module is connected to the motherboard of the test device through a connector; the microwave device adaptation module is used to adapt to microwave devices to be tested with different packages, and connect the microwave devices to be tested with different packages to the microwave source test device; the motherboard of the test device is used to receive a microwave source test parameter template corresponding to the packaging structure and interface type of the microwave device to be tested, adapt the working parameters of the microwave device to be tested according to the microwave source test parameter template, and output the microwave signal generated by the microwave device to be tested to test the microwave signal.

[0008] Optionally, the microwave device adaptation module includes a microwave device fixture and a fixture adapter board;

[0009] The microwave device fixture is used to adapt to the microwave devices to be tested in different packages, and connect the microwave devices to be tested in different packages to the fixture adapter board;

[0010] The fixture adapter board is connected to the testing device motherboard via a connector.

[0011] Optionally, the test device motherboard includes a microwave impedance power adjustment circuit, a microwave device interface circuit and a controller;

[0012] The controller is used to receive the microwave source test parameter template and perform working parameter adaptation on the microwave device to be tested according to the microwave source test parameter template;

[0013] The microwave impedance power adjustment circuit is used to adjust the microwave impedance power of the microwave signal generated by the microwave device to be tested, and output the adjusted microwave signal;

[0014] The microwave device interface circuit is used to adapt to the interfaces of the different microwave devices to be tested.

[0015] The present invention also provides a microwave source testing system, comprising a host computer, a testing device and the microwave source testing device;

[0016] The host computer is connected to the microwave source testing device via a communication cable;

[0017] The microwave source test device is connected to the test equipment via a microwave cable;

[0018] The host computer is preset with microwave source test parameter templates corresponding to microwave devices to be tested in different packages, and sends the corresponding microwave source test parameter templates to the microwave source test device according to the packaging structure and interface type of the microwave device to be tested;

[0019] The microwave source test device is used to adapt the working parameters of the microwave device to be tested according to the microwave source test parameter template corresponding to the packaging structure and interface type of the microwave device to be tested, and output the microwave signal generated by the microwave device to be tested to the test equipment;

[0020] The test equipment is used to test the microwave signal, thereby obtaining the test result of the microwave device to be tested. Optionally, the host computer is installed with display control software, and the display control software is used to configure the parameters of the microwave devices to be tested in different packages, and obtain the microwave source test parameter template corresponding to the microwave devices to be tested in different packages;

[0021] The parameter configuration includes working mode, output signal frequency and output signal power.

[0022] Optionally, the display and control software is also used to monitor the power consumption of the microwave device under test, the frequency of the current output microwave signal, the power of the current output microwave signal and the working mode of the microwave device under test, and display the monitoring results.

[0023] Optionally, the microwave source test system further comprises a microwave connector, and the microwave signal is transmitted to the test equipment via the microwave connector;

[0024] The testing equipment comprises a spectrum analyzer and a phase noise analyzer. The spectrum analyzer is used to test the frequency of the microwave signal; the phase noise analyzer is used to test the phase noise of the microwave signal.

[0025] Optionally, the testing equipment also includes a CPT atomic clock physics system, the microwave signal is transmitted to the CPT atomic clock physics system through the microwave cable, and the CPT atomic clock physics system is used to test whether the microwave signal generated by the microwave device to be tested is compatible with the CPT atomic clock physics system.

[0026] Optionally, the display and control software is also used to read Doppler absorption and CPT light enhancement phenomenon data generated in the CPT atomic clock physical system and synchronously display the data waveform.

[0027] The present invention also provides a method for testing a microwave device using the microwave source test system, the method comprising:

[0028] Receiving a microwave source test parameter template corresponding to the packaging structure and interface type of the microwave device to be tested from a host computer; the microwave device to be tested is connected to the microwave source test system through a microwave source test device;

[0029] Adapting the working parameters of the microwave device to be tested according to a microwave source test parameter template corresponding to the packaging structure and interface type of the microwave device to be tested;

[0030] The microwave signal generated by the microwave device to be tested is output to a test device for testing to obtain a test result.

[0031] According to the specific embodiments provided by the present invention, the present invention discloses the following technical effects:

[0032] The microwave source test device proposed in the present invention adapts to microwave devices to be tested with different packages through a microwave device adaptation module, and quickly connects microwave devices to be tested with different packaging structures through a simple structure to realize rapid testing of the microwave devices to be tested. Under the premise of ensuring accurate and reliable test results, the difficulty of device assembly, debugging and testing is reduced and the test efficiency is improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0034] Figure 1 A schematic diagram of the structure of a microwave source testing device provided in an embodiment of the present invention;

[0035] Figure 2 A schematic diagram of the structure of a microwave source testing system provided by an embodiment of the present invention;

[0036] Figure 3 A schematic diagram of the structure of a CPT atomic clock microwave source test system provided by an embodiment of the present invention;

[0037] Figure 4 A waveform diagram of the Doppler absorption phenomenon generated after microwaves are input into a CPT physical system provided in an embodiment of the present invention;

[0038] Figure 5 A waveform diagram of the CPT quantum light enhancement phenomenon generated by a microwave signal provided in an embodiment of the present invention;

[0039] Figure 6 A flow chart of a method for testing a microwave device provided in an embodiment of the present invention. DETAILED DESCRIPTION

[0040] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0041] The purpose of the present invention is to provide a microwave source testing device, system and testing method thereof, which can adapt to different microwave devices, conveniently test and verify various microwave devices, simplify the testing process and improve the testing efficiency.

[0042] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and easy to understand, the present invention is further described in detail below with reference to the accompanying drawings and specific embodiments.

[0043] Figure 1 A schematic diagram of the structure of a microwave source testing device provided in an embodiment of the present invention is shown in FIG. Figure 1As shown, the microwave source test device provided by the present invention includes: a microwave device adaptation module 1 and a test device motherboard 2; the microwave device adaptation module 1 is connected to the test device motherboard 2 through a connector; the microwave device adaptation module 1 is used to adapt to microwave devices to be tested in different packages, and connect the microwave devices to be tested in different packages to the microwave source test device; the test device motherboard 2 is used to receive a microwave source test parameter template corresponding to the package structure and interface type of the microwave device to be tested, adapt the working parameters of the microwave device to be tested according to the microwave source test parameter template, and output the microwave signal generated by the microwave device to be tested to test the microwave signal.

[0044] The microwave device adaptation module 1 includes a microwave device fixture and a fixture adapter board; the microwave device fixture is used to adapt the microwave devices to be tested in different packages and connect the microwave devices to be tested in different packages to the fixture adapter board; the fixture adapter board is connected to the test device motherboard 2 through a connector.

[0045] The test device motherboard 2 includes a microwave impedance power adjustment circuit, a microwave device interface circuit and a controller; the controller is used to receive the microwave source test parameter template and adapt the working parameters of the microwave device to be tested according to the microwave source test parameter template; the microwave impedance power adjustment circuit is used to adjust the microwave impedance power of the microwave signal generated by the microwave device to be tested, and output the adjusted microwave signal; the microwave device interface circuit is used to adapt the interfaces of different microwave devices to be tested.

[0046] Figure 2 A schematic diagram of the structure of a microwave source test system provided by an embodiment of the present invention is shown in FIG. Figure 2 As shown, the microwave source test system includes: a host computer 3, a test device 4 and the microwave source test device as described above; the host computer 3 is connected to the microwave source test device through a communication cable; the microwave source test device is connected to the test device 4 through a microwave cable;

[0047] The host computer 3 is preset with microwave source test parameter templates corresponding to microwave devices to be tested in different packages, and sends the corresponding microwave source test parameter templates to the microwave source test device according to the packaging structure and interface type of the microwave device to be tested;

[0048] The microwave source test device is used to adapt the working parameters of the microwave device to be tested according to the microwave source test parameter template corresponding to the packaging structure and interface type of the microwave device to be tested, and output the microwave signal generated by the microwave device to the test equipment 4;

[0049] The testing device 4 is used to test the microwave signal, so as to obtain the test result of the microwave device to be tested.

[0050] The host computer 3 is installed with display and control software, which is used to configure parameters of the microwave devices to be tested in different packages to obtain microwave source test parameter templates corresponding to the microwave devices to be tested in different packages; the parameter configuration includes working mode, output signal frequency and output signal power.

[0051] The display and control software is also used to monitor the power consumption of the microwave device to be tested, the frequency of the current output microwave signal, the power of the current output microwave signal and the working mode of the microwave device to be tested, and display the monitoring results.

[0052] The microwave source test system also includes a microwave connector, and the microwave signal is transmitted to the test equipment 4 via the microwave connector; the test equipment 4 includes a spectrum analyzer and a phase noise analyzer, and the spectrum analyzer is used to test the frequency of the microwave signal; the phase noise analyzer is used to test the phase noise of the microwave signal.

[0053] The test equipment 4 also includes a CPT atomic clock physical system. The microwave signal is transmitted to the CPT atomic clock physical system through the microwave cable. The CPT atomic clock physical system is used to test whether the microwave signal generated by the microwave device to be tested is compatible with the CPT atomic clock physical system.

[0054] The display and control software is also used to read the Doppler absorption and CPT light enhancement phenomenon data generated in the CPT atomic clock physical system and synchronously display the data waveform.

[0055] The basic working process of the microwave source test system is as follows: use corresponding package adapter boards for different microwave devices, and connect them to the universal test device motherboard 2 through connectors; use the host computer display and control software to set and adjust the working mode, output signal frequency, output signal power and other parameters of different microwave devices to form corresponding microwave source test parameter templates; according to the selected different microwave source devices, use the corresponding parameter setting template, and download the working parameters to the controller of the test device to achieve the working parameter adaptation of the microwave device; after the software and hardware working status is correctly set, the microwave source device can be tested quickly.

[0056] In one embodiment, the microwave source test system includes: a microwave device fixture, a fixture adapter board, a test device motherboard 2, a microwave connector and a microwave cable, and a host computer display and control software. The test device motherboard 2 includes a microwave impedance power adjustment circuit, a microwave device interface circuit, and a controller.

[0057] When testing microwave source devices with different structural packaging forms, first install the device on the device adapter board according to the different packaging. The device is connected through a fixture and does not need to be soldered. The microwave device adapter board is connected to the test device motherboard 2 through a connector. According to the working characteristics of the microwave device and the interface signal characteristics, parameter configuration and communication testing are performed on the host computer 3. The generated microwave signal is output after passing through the impedance power adjustment circuit. The signal can be connected to the spectrum analyzer, phase noise analyzer and other testing equipment 4 through the microwave connector and cable, and the frequency, phase noise and other technical parameters of the output microwave signal can be tested. Figure 3 , Figure 4 and Figure 5 As shown in the figure, microwave signals can also be connected to the physical system of the CPT atomic clock through cables to observe the adaptation of microwave signals to the CPT physical system. If it is necessary to adjust the modulation mode, output power and other working parameters of the microwave signal, the relevant parameters can be adjusted through the host computer software. In this way, the best adaptation parameters between the microwave signal and the CPT physical system can be found repeatedly.

[0058] This system can quickly and reliably connect different microwave devices to the system, quickly adapt and control the device operation by selecting a variety of preset device configuration parameter templates, and realize convenient and flexible device loading, communication and control, simplifying the original complex process of testing such devices, which requires designing special circuits, electrical assembly, writing device drive control programs, impedance power adjustment, etc., and improving efficiency. It has good advantages in flexibility and cost.

[0059] The microwave source test device proposed in the present invention adapts to microwave devices to be tested with different packages through a microwave device adaptation module 1, and quickly connects microwave devices to be tested with different packaging structures to the microwave source test device through a simple structure; and presets microwave source test parameter templates corresponding to microwave devices to be tested with different packages in a host computer 3 of a microwave source test system, and quickly selects a suitable microwave source test parameter template according to the packaging structure of the microwave device to be tested, thereby realizing rapid testing of the microwave device to be tested, reducing the difficulty of device assembly, debugging, and testing, and improving test efficiency while ensuring that the test results are accurate and reliable.

[0060] The present invention also provides a method for testing a microwave device using the microwave source testing system. Figure 6 A flowchart of a method for testing a microwave device provided by an embodiment of the present invention, such as Figure 6 As shown, the method includes:

[0061] S101: receiving a microwave source test parameter template corresponding to the package structure and interface type of the microwave device to be tested from the host computer 3; the microwave device to be tested is connected to the microwave source test system through a microwave source test device;

[0062] S102: adapting the working parameters of the microwave device to be tested according to a microwave source test parameter template corresponding to the packaging structure and interface type of the microwave device to be tested;

[0063] S103: Outputting the microwave signal generated by the microwave device to be tested to the testing device 4 for testing to obtain a test result.

[0064] In one embodiment, the microwave device is tested using the microwave source test system. First, the microwave device is connected to the fixture adapter board through the corresponding fixture, in order to ensure that the microwave device can have a reliable circuit connection state and a firm structural state. Then the fixture adapter board is connected to the test device motherboard 2 through a connector. After that, the communication cable between the motherboard and the host computer 3 is connected, the host computer microwave device test display and control software is opened, and the motherboard power is turned on. According to the communication interface type of the microwave device, the corresponding interface form is selected in the host computer display and control software, the device operating parameter template in the display and control software is opened, and the device is configured after the current device operating parameters are filled in as needed. The display and control software can also set and adjust the microwave output impedance and power of the test device. The signal can be connected to the signal test equipment or the CPT atomic clock physics system through the microwave connector and the microwave cable to perform the signal index performance evaluation test.

[0065] The host computer display and control software monitors and displays the power consumption of microwave devices, the frequency and power of the current microwave signal output, the device working mode and other related information. If the microwave signal is connected to the CPT atomic clock, the host computer software can read the Doppler absorption and CPT light enhancement phenomenon data generated in the atomic clock and synchronously display the data waveform. The strength of such quantum physical phenomena can intuitively reflect the quality of the adaptation of the measured microwave source and the CPT atomic clock physical system, and can be used as a reference for microwave signal adaptability evaluation and subsequent improvement.

[0066] The present invention provides a fast and flexible microwave source test device, system and test method thereof. By compiling computer host display control software, a configuration template for working parameters of different microwave devices is formed, and a device fixture adapter board and a test motherboard are used to quickly adapt to different packaged microwave devices. Under the premise of ensuring accurate and reliable test results, the difficulty of device assembly, debugging and testing is reduced, and the test efficiency is improved.

[0067] The microwave source testing device, system and testing method provided by the present invention can be applied to the applicability of microwave sources in CPT atomic clocks and the testing of microwave signal technical indicators, and can quickly and accurately evaluate the quality and performance of microwave sources. It has high practical value for optimizing and improving the performance of microwave sources and their application in CPT atomic clocks, optimizing the overall design of CPT atomic clocks, and improving the performance of the overall machine.

[0068] The convenient and reliable CPT atomic clock microwave source test system provided by the present invention can be adapted to various types of microwave devices. It can use general microwave signal test equipment to test various relevant indicators of microwave signals, and it can also connect the signal to the CPT physical system to observe the interaction between the microwave signal and the physical system, and evaluate the compatibility of the microwave signal and the physical system, which can be used as a reference for further improving the microwave source. It has high practical value for optimizing the quality and performance of microwave sources and optimizing the overall design of CPT atomic clocks.

[0069] The various embodiments in this specification are described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The same or similar parts between the various embodiments can be referenced to each other.

[0070] The principles and implementation methods of the present invention are described in this article using specific examples. The description of the above embodiments is only used to help understand the method and core idea of ​​the present invention. At the same time, for those skilled in the art, according to the idea of ​​the present invention, there will be changes in the specific implementation methods and application scope. In summary, the content of this specification should not be understood as limiting the present invention.

Claims

1. A microwave source testing device, characterized in that: include: Microwave device adapter modules and test equipment motherboards; The microwave device adaptation module is connected to the motherboard of the test device through a connector; the microwave device adaptation module is used to adapt to microwave devices to be tested in different packages, and connect the microwave devices to be tested in different packages to the microwave source test device; The test device motherboard is used to receive a microwave source test parameter template corresponding to the packaging structure and interface type of the microwave device to be tested, adapt the working parameters of the microwave device to be tested according to the microwave source test parameter template, and output the microwave signal generated by the microwave device to be tested to test the microwave signal.

2. The microwave source testing device according to claim 1, characterized in that: The microwave device adaptation module includes a microwave device fixture and a fixture adaptation sub-board; The microwave device fixture is used to adapt to the microwave devices to be tested in different packages, and connect the microwave devices to be tested in different packages to the fixture adapter board; The fixture adapter board is connected to the testing device motherboard via a connector.

3. The microwave source testing device according to claim 1, characterized in that: The test device motherboard includes a microwave impedance power adjustment circuit, a microwave device interface circuit and a controller; The controller is used to receive the microwave source test parameter template and adapt the working parameters of the microwave device to be tested according to the microwave source test parameter template; The microwave impedance power adjustment circuit is used to adjust the microwave impedance power of the microwave signal generated by the microwave device to be tested, and output the adjusted microwave signal; The microwave device interface circuit is used to adapt to the interfaces of the different microwave devices to be tested.

4. A microwave source testing system, characterized in that: It comprises a host computer, a test device and a microwave source test device as claimed in any one of claims 1 to 3; The host computer is connected to the microwave source testing device via a communication cable; The microwave source test device is connected to the test equipment via a microwave cable; The host computer is preset with microwave source test parameter templates corresponding to microwave devices to be tested in different packages, and sends the corresponding microwave source test parameter templates to the microwave source test device according to the packaging structure and interface type of the microwave device to be tested; The microwave source test device is used to adapt the working parameters of the microwave device to be tested according to the microwave source test parameter template corresponding to the packaging structure and interface type of the microwave device to be tested, and output the microwave signal generated by the microwave device to be tested to the test equipment; The testing device is used to test the microwave signal, so as to obtain the test result of the microwave device to be tested.

5. The microwave source testing system according to claim 4, characterized in that: The host computer is installed with display and control software, and the display and control software is used to configure parameters of the microwave devices to be tested in different packages, and obtain microwave source test parameter templates corresponding to the microwave devices to be tested in different packages; The parameter configuration includes working mode, output signal frequency and output signal power.

6. The microwave source testing system according to claim 5, characterized in that: The display and control software is also used to monitor the power consumption of the microwave device to be tested, the frequency of the current output microwave signal, the power of the current output microwave signal and the working mode of the microwave device to be tested, and display the monitoring results.

7. The microwave source testing system according to claim 4, characterized in that: The microwave source test system further comprises a microwave connector, through which the microwave signal is transmitted to the test equipment; The testing equipment comprises a spectrum analyzer and a phase noise analyzer. The spectrum analyzer is used to test the frequency of the microwave signal; the phase noise analyzer is used to test the phase noise of the microwave signal.

8. The microwave source testing system according to claim 4, characterized in that: The testing equipment also includes a CPT atomic clock physics system. The microwave signal is transmitted to the CPT atomic clock physics system through the microwave cable. The CPT atomic clock physics system is used to test whether the microwave signal generated by the microwave device to be tested is compatible with the CPT atomic clock physics system.

9. The microwave source testing system according to claim 8, characterized in that: The display and control software is also used to read the Doppler absorption and CPT light enhancement phenomenon data generated in the CPT atomic clock physical system and synchronously display the data waveform.

10. A method for testing a microwave device using the microwave source test system according to any one of claims 4 to 9, characterized in that: The method comprises: Receiving a microwave source test parameter template corresponding to the packaging structure and interface type of the microwave device to be tested from a host computer; the microwave device to be tested is connected to the microwave source test system through a microwave source test device; Adapting the working parameters of the microwave device to be tested according to a microwave source test parameter template corresponding to the packaging structure and interface type of the microwave device to be tested; The microwave signal generated by the microwave device to be tested is output to a test device for testing to obtain a test result.

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