High-voltage tuning capacitor test system and test method

Abstract

The invention provides a high-voltage tuning capacitor test system and test method.The high-voltage tuning capacitor test system comprises an excitation source subsystem and a detection control subsystem, and the excitation source subsystem comprises a small-signal excitation source, a power amplification device and a resonance network; the detection control subsystem comprises an industrial personal computer, a control unit and a regional infrared temperature measuring device; the small signal excitation source is connected with one end of the power amplification equipment; the other end of the power amplification equipment is connected with the resonance network; the resonance network comprises a test capacitor sample piece; one end of the control unit is connected with the industrial personal computer and the other end is connected with the resonance network; the regional infrared temperature measuring device is connected with the industrial personal computer; and the detection control subsystem is connected with and controls the excitation source subsystem through the control unit. According to the technical scheme, the working conditions of the tuning capacitor under rated current and withstand voltage indexes can be simulated, whether the performance of the capacitor meets the working index requirement of a low-frequency emitter system or not is detected, and the capacitor detection efficiency is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of capacitor testing, and in particular to a high-voltage tuning capacitor testing system and testing method. Background Art

[0002] At present, high-voltage withstand voltage test instruments can only provide high-voltage test conditions under power frequency 50HZ, DC or pulse working mode, and cannot test the electrical performance of high-voltage resonant capacitors under high-frequency and high-voltage working conditions above 10KHz. At the same time, dedicated linear current correction circuit (LCR) test instruments generally use AC resonance method to accurately measure the capacitance of capacitors within a certain frequency range by providing low-voltage small signal excitation signals, but they cannot test the stability of tuning capacitors when they are loaded with high-frequency and high voltage for a long time. Summary of the invention

[0003] In view of this, the present invention aims to solve the problem that it is impossible to test the electrical performance of the high-voltage resonant capacitor under high-frequency and high-voltage conditions and to determine the stability of the corresponding tuning capacitor.

[0004] Specifically, the present invention is achieved through the following technical solutions:

[0005] A first aspect of the present invention provides a high voltage tuning capacitor testing system.

[0006] A second aspect of the present invention provides a testing method.

[0007] To achieve the above-mentioned object, the first aspect of the present invention provides a high-voltage tuning capacitor test system, comprising: an excitation source subsystem and a detection control subsystem, the excitation source subsystem comprising a small signal excitation source, a power amplifier device and a resonant network, and the detection control subsystem comprising an industrial computer, a control unit and a regional infrared temperature measurement device;

[0008] The small signal excitation source provides a high-frequency excitation small signal to the power amplifier device and is connected to one end of the power amplifier device;

[0009] The other end of the power amplifier device is connected to the resonant network to amplify the power of the received high-frequency excitation small signal;

[0010] The resonant network includes a test capacitor sample;

[0011] One end of the control unit is connected to the industrial computer, and the other end of the control unit is connected to the resonant network;

[0012] The regional infrared temperature measuring device is connected to the industrial computer to detect the shell temperature of the test capacitor sample;

[0013] The detection control subsystem is connected to and controls the excitation source subsystem through the control unit.

[0014] In some technical solutions, optionally, the excitation source subsystem also includes: a DC power supply device, which is connected to the power amplifier device and is used to convert the three-phase AC power supply into DC power required by the power amplifier device.

[0015] In some technical solutions, optionally, the excitation source subsystem also includes: a filter matching device, one end of the filter matching device is connected to the power amplifier device, and the other end of the filter matching device is connected to the resonant network, and the filter matching device enables the DC power supply device and the power amplifier device to maintain maximum power output under different operating frequency conditions.

[0016] In some technical solutions, optionally, the resonant network also includes: an adjustable inductor and a fixed inductor; the adjustable inductor and the fixed inductor are connected in series; one end of the adjustable inductor is connected to a filter matching device, and the other end of the adjustable inductor is connected to one end of the fixed inductor; the other end of the fixed inductor is connected to a test capacitor sample.

[0017] In some technical solutions, optionally, the excitation source subsystem further includes: a test load, one end of the test load is connected to the test capacitor sample, and the other end of the test load is connected to the filter matching device.

[0018] In some technical solutions, optionally, the detection and control subsystem also includes: a detection device, one end of the detection device is connected to the industrial computer, and the other end of the detection device is connected to the filter matching device and the resonant network; the detection device is used to determine the voltage, current and impedance at the circuit nodes in the excitation source subsystem, and transmit the determined data corresponding to the voltage, current and impedance to the industrial computer.

[0019] In some technical schemes, optionally, the detection and control subsystem also includes: a switch, which is a carrier of test instructions transmitted by the industrial computer, and the industrial computer transmits the test instructions to the control unit, the detection device and the regional infrared temperature measuring device through the switch; the control unit is connected to the industrial computer through the switch; the detection device is connected to the industrial computer through the switch; and the regional infrared temperature measuring device is connected to the industrial computer through the switch.

[0020] The second aspect of the present invention provides a testing method for the high-voltage tuning capacitor testing system proposed in the first aspect. The high-voltage tuning capacitor system includes: an excitation source subsystem and a detection control subsystem. The excitation source subsystem includes a small signal excitation source, a power amplification device and a resonant network. The detection control subsystem includes an industrial computer, a control unit and a regional infrared temperature measuring device. The testing method includes: obtaining a capacitor sample to be tested; connecting the capacitor sample to be tested to the resonant network; determining the initial shell temperature of the capacitor sample to be tested through the regional infrared temperature measuring device; controlling a DC power supply device to gradually increase the corresponding output voltage through the output instructions of the industrial computer to determine the first shell temperature of the capacitor sample to be tested; determining the impedance parameter of the capacitor sample to be tested corresponding to the first shell temperature according to the detection device; and determining the detection result according to the first shell temperature and the impedance parameter.

[0021] In some technical schemes, optionally, before controlling the DC power supply device to gradually increase the corresponding output voltage through the output instructions of the industrial computer and determining the first shell temperature of the capacitor sample to be tested, it also includes: determining the test operating frequency according to the small signal excitation source; determining the test instructions corresponding to the industrial computer according to the test operating frequency; transmitting the test instructions to the control unit through the switch; and the control unit determining the circuit switch parameters corresponding to the resonant network according to the test instructions.

[0022] In some technical solutions, optionally, before the industrial computer outputs instructions to control the DC power supply device to gradually increase the corresponding output voltage and determine the first shell temperature of the capacitor sample to be tested, it also includes: the control unit controls the DC power supply device to output a low voltage; determines that the filter matching device switches to a quasi-resonant state; and determines that the adjustable inductor switches to a quasi-resonant state.

[0023] In some technical schemes, optionally, the detection result is determined according to the first temperature of the shell and the impedance parameter, including: determining the capacitor shell heating parameter according to the first temperature of the shell and the initial temperature of the shell; determining the system impedance change parameter according to the impedance parameter; determining the shell heating threshold and the system impedance threshold; when the capacitor shell heating parameter is greater than the shell heating threshold, or the system impedance change parameter is greater than the system impedance threshold, determining that the detection result corresponding to the capacitor sample to be tested is the first result, reducing the output voltage of the DC power supply device, and uploading data information corresponding to the first result to the industrial computer; when the capacitor shell heating parameter is less than or equal to the shell heating threshold, and the system impedance change parameter is less than or equal to the system impedance threshold, determining that the detection result corresponding to the capacitor sample to be tested is the second result, and uploading data information corresponding to the second result to the industrial computer.

[0024] The technical solution provided by the present invention brings at least the following beneficial effects:

[0025] The present invention proposes a high-voltage tuning capacitor testing system and testing method, which can simulate the working conditions of the tuning capacitor under rated current and withstand voltage indicators, detect whether the performance of the capacitor meets the working indicator requirements of the low-frequency emitter system, build an excitation source subsystem based on the series resonance method, detect the online voltage, current, impedance and temperature through the detection control subsystem, complete the test of the electrical performance of the tuning capacitor under high-frequency and high-voltage working conditions and the stability of the tuning capacitor when loaded with high-frequency and high-voltage for a long time, reduce the complexity of the tuning capacitor detection, and improve the efficiency of the tuning capacitor detection. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and, together with the description, serve to explain the principles of the invention.

[0027] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or related technical descriptions are briefly introduced below. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.

[0028] Figure 1 A structural schematic block diagram of a high-voltage tuning capacitor testing system provided by an embodiment of the present invention;

[0029] Figure 2 A structural schematic block diagram of a high-voltage tuning capacitor testing system provided by an embodiment of the present invention;

[0030] Figure 3 A topological diagram of a high-voltage tuning capacitor testing system provided by an embodiment of the present invention;

[0031] Figure 4 A schematic diagram of a test method according to an embodiment of the present invention;

[0032] Figure 5 A schematic diagram of a test method according to an embodiment of the present invention;

[0033] Figure 6 A partial flow chart of a testing method provided by an embodiment of the present invention;

[0034] Figure 7 A partial flow chart of a testing method provided by an embodiment of the present invention;

[0035] Figure 8 A partial flow chart of a testing method provided in an embodiment of the present invention.

[0036] in, Figures 1 to 3 The corresponding relationship between the component names and numbers in is as follows:

[0037] 1000: High-voltage tuning capacitor test system; 1100: Excitation source subsystem; 1200: Detection control subsystem; 1102: Small signal excitation source; 1104: DC power supply device; 1106: Resonant network; 1108: Power amplifier device; 1110: Filter matching device; 1112: Test load; 1202: Industrial computer; 1204: Control unit; 1206: Regional infrared temperature measurement device; 1208: Switch; 1210: Detection device ; 2102: voltage detection one; 2104: current detection one; 2106: voltage detection two; 2108: current detection two; L1: adjustable inductor; 2L2: adjustable inductor two; L2: fixed inductor; C0: test capacitor sample; 1L1: adjustable inductor one; 1C1: filter capacitor one; 1CK1: switching switch one; 1C2: filter capacitor two; T1: coupling coil; 2LK1: switching switch two; 3LK1: switching switch three; R1: water-cooled load. DETAILED DESCRIPTION

[0038] In order to make the purpose, technical solution and advantages of the embodiments of the present invention clearer, the technical solution in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0039] See also Figure 1 The first aspect of the present invention provides a high voltage tuning capacitor testing system 1000, comprising:

[0040] The excitation source subsystem 1100 and the detection and control subsystem 1200, the excitation source subsystem 1100 includes a small signal excitation source 1102, a power amplifier device 1108 and a resonant network 1106, and the detection and control subsystem 1200 includes an industrial computer 1202, a control unit 1204 and a regional infrared temperature measuring device 1206; the small signal excitation source 1102 provides a high-frequency excitation small signal for the power amplifier device, and is connected to one end of the power amplifier device 1108; the other end of the power amplifier device 1108 is connected to the resonant network 1106 to amplify the received high-frequency excitation small signal; the resonant network 1106 includes a test capacitor sample C0; one end of the control unit 1204 is connected to the industrial computer 1202, and the other end of the control unit 1204 is connected to the resonant network 1106; the regional infrared temperature measuring device 1206 is connected to the industrial computer 1202, and is used to detect the shell temperature of the test capacitor sample C0; the detection and control subsystem 1200 is connected to and controls the excitation source subsystem 1100 through the control unit 1204.

[0041] According to the high-voltage tuning capacitor test system 1000 provided by the present invention, an adjustable high-power high-frequency high-voltage excitation source test system is built based on the series resonance method, and an online voltage, current, impedance and temperature detection method is used to test the electrical performance and high-frequency high-voltage durability of the tuning capacitor. Among them, the small signal excitation source 1102 is connected to the power amplifier device 1108, and the high-frequency excitation small signal generated by the small signal excitation source 1102 is power amplified by the power amplifier device 1108 to simulate the high-frequency and high-voltage working conditions, and the temperature of the test capacitor sample C0 is monitored in real time through the regional infrared temperature measurement device 1206 to determine the shell temperature change of the test capacitor sample C0. The shell temperature change and the change data of the excitation source subsystem 1100 corresponding to the shell temperature change are uploaded to the industrial computer 1202 for analysis to determine whether the test capacitor sample C0 meets the electrical performance requirements under the high-frequency and high-voltage working conditions. The industrial computer 1202 can control the excitation source subsystem 1100 through the control unit 1204, thereby adjusting the operating frequency and test voltage of the high-voltage tuning capacitor test system 1000. The industrial computer 1202 is an execution carrier of the test method and the test program.

[0042] It can be understood that the industrial computer 1202 can centrally control and detect the excitation source subsystem 1100 and the detection control subsystem 1200, thereby improving the automation level of the high-voltage tuned capacitor test system 1000; the regional infrared temperature measurement device 1206 can be used to perform a non-contact regional temperature measurement method on the test capacitor sample C0 to improve the safety during the test; and the small signal excitation source 1102 and the power amplifier device 1108 can continuously adjust the high-frequency working conditions to improve the test range and test efficiency of the test system.

[0043] In some embodiments, optionally, Figure 2 As shown, the excitation source subsystem 1100 also includes: a DC power supply device 1104, which is connected to a power amplifier device 1108, and the DC power supply device 1104 is used to convert three-phase AC power supply into DC power required by the power amplifier device 1108.

[0044] In this embodiment, the DC power supply device 1104 is used as the main power input device of the high-power high-frequency high-voltage excitation source, and is used to convert the three-phase AC power supply into the DC power required by the power amplifier device. It is connected to the three-phase mains power and the power amplifier device to provide a high-voltage working condition for the excitation source subsystem. The DC power supply device 1104 is connected to the control unit 1204 and is centrally controlled by the industrial computer 1202.

[0045] In some embodiments, Figure 2As shown, optionally, the excitation source subsystem 1100 also includes: a filter matching device 1110, one end of the filter matching device 1110 is connected to the power amplifier device 1108, and the other end of the filter matching device 1110 is connected to the resonant network 1106, and the filter matching device 1110 enables the DC power supply device 1104 and the power amplifier device 1108 to maintain maximum power output under different operating frequency conditions.

[0046] In this embodiment, one end of the filter matching device 1110 is connected to the power amplifier device 1108, and the other end is connected to the resonant network 1106. It is a filter and impedance matching device, and serves as a matching adjustment device for harmonic suppression and output characteristic impedance in the high-voltage tuning capacitor test system 1000. The filter matching device 1110 enables the DC power supply device 1104 and the power amplifier device 1108 to maintain maximum power output under different operating frequency conditions. Figure 3 As shown, the filtering and impedance matching device (i.e., filtering and matching device 1110) is composed of an adjustable inductor 1L1, a filter capacitor 1C1, a filter capacitor 1C2, a switching switch 1CK1, and a coupling coil T1, wherein the first end of the adjustable inductor 1L1 is connected to the power amplifier device 1108, the second end of the adjustable inductor 1L1 is connected to the first end of the filter capacitor 1C1, the first end of the filter capacitor 1C1 is also connected to the first end of the switching switch 1CK1, the second end of the switching switch 1CK1 is connected to the filter capacitor 1C2, and the filter capacitor 1C2 is connected to the primary coil end of the coupling coil T1 after being connected to the filter capacitor 1C1. The industrial computer 1202 adjusts the inductance of the coupling coil T1 and the adjustable inductor 1L1 so that the impedance of the high-voltage tuning capacitor test system is within the target range preset by the system, thereby enabling the DC power supply device 1104 and the power amplifier device 1108 to maintain the maximum power output at different operating frequencies.

[0047] Among them, the industrial computer 1202 adjusts the inductance of the coupling coil T1 and the adjustable inductor 1L1, including: the industrial computer 1202 sends a forward or reverse fine-tuning instruction to the local rotating platform driver of the coupling coil T1, controls the rotation of the coil rotor of the coupling coil T1, thereby changing the coupling coefficient of the coupling coil T1, and thereby adjusting the inductance of the coupling coil T1 and 1L1.

[0048] In some embodiments, optionally, the resonant network 1106 also includes: an adjustable inductor L1 and a fixed inductor L2; the adjustable inductor L1 and the fixed inductor L2 are connected in series; one end of the adjustable inductor L1 is connected to the filter matching device 1110, and the other end of the adjustable inductor L1 is connected to one end of the fixed inductor L2; the other end of the fixed inductor L2 is connected to the test capacitor sample C0.

[0049] In this embodiment, the resonant network 1106 coordinates the inductance through the adjustable inductor L1 and the fixed inductor L2 and the coupling coil T1 in the filter matching device 1110, so that the impedance of the high-voltage tuning capacitor test system 1000 is within the target range preset by the system. At the same time, a mounting slot corresponding to the test capacitor sample C0 is set in the resonant network 1106, and the operator can set the test capacitor sample C0 in the mounting slot in the resonant network 1106. Figure 3 As shown, the resonant network 1106 also includes an adjustable inductor 2L2, a switching switch 2LK1 and a switching switch 3LK1. The industrial computer 1202 outputs control instructions to adjust the switching states of the switching switch 2LK1 and the switching switch 3LK1 through the control unit 1204, so as to adjust the inductance of the coupling coil T1.

[0050] In some embodiments, optionally, the excitation source subsystem 1100 further includes: a test load 1112 , one end of the test load 1112 is connected to the test capacitor sample C0 , and the other end of the test load 1112 is connected to the filter matching device 1110 .

[0051] In this embodiment, the test load 1112 is connected between the filter matching device 1110 and the resonant network 1106. The test load 1112 serves as an energy dissipation device for the high-power, high-frequency, and high-voltage excitation source system to improve the stability of the high-voltage tuning capacitor test system. The test load 1112 is generally a resistor, such as a 1Ω water-cooled load R1.

[0052] In some embodiments, optionally, the detection and control subsystem 1200 also includes: a detection device 1210, one end of the detection device 1210 is connected to the industrial computer 1202, and the other end of the detection device 1210 is connected to the filter matching device 1110 and the resonant network 1106; the detection device 1210 is used to determine the voltage, current and impedance at the circuit nodes in the excitation source subsystem 1100, and transmit the determined data corresponding to the voltage, current and impedance to the industrial computer 1202.

[0053] In this embodiment, the industrial computer 1202 detects the impedance parameters in the excitation source subsystem, namely, the voltage, current and impedance at the circuit nodes, in real time through the detection device 1210, and transmits the data corresponding to the voltage, current and impedance to the industrial computer 1202. Specifically, Figure 3As shown, the detection device 1210 includes a voltage detection 1 2102, a current detection 1 2104, a voltage detection 2106 and a current detection 2108, wherein the voltage detection 1 2102 is connected in parallel between the current detection 1 2104 and the ground line of the power amplifier device 1108, and is used to detect the voltage across the power amplifier device 1108; the current detection 1 2104 is connected between the power amplifier device 1108 and the filter matching device 1110, and is used to detect the current on the main line (i.e., the power amplifier device 1108 and the filter matching device 1110); the voltage detection 2 2106 is connected in parallel across the test capacitor sample C0, and is used to detect the voltage across the test capacitor sample C0; and the current detection 2 2108 is connected to one end of the test capacitor sample C0 and is grounded, and is used to detect the current of the test capacitor sample C0. The detection device 1210 detects the voltage and current of the circuit nodes of the power amplifier device 1108 and the test capacitor sample C0 in real time, calculates the corresponding impedance according to the voltage and current, and transmits the corresponding impedance data to the industrial computer 1202 through the switch 1208.

[0054] In some embodiments, optionally, the detection control subsystem 1200 also includes: a switch 1208, which is a carrier of the test instructions transmitted by the industrial computer 1202, and the industrial computer 1202 transmits the test instructions to the control unit 1204, the detection device 1210 and the regional infrared temperature measuring device 1206 through the switch 1208; the control unit 1204 is connected to the industrial computer 1202 through the switch 1208; the detection device 1210 is connected to the industrial computer 1202 through the switch 1208; the regional infrared temperature measuring device 1206 is connected to the industrial computer 1202 through the switch 1208.

[0055] In this embodiment, the switch 1208 is a carrier for forwarding instruction status data of the test system, which is connected to the control unit 1204, the detection device 1210, the regional infrared temperature measuring device 1206 and the industrial computer 1202, and is used to transmit the data collected by the detection device 1210 and the regional infrared temperature measuring device 1206 to the industrial computer 1202, and convert the instructions in the test system in the industrial computer 1202 into corresponding status data and transmit them to the control unit 1204. The method for converting instructions into corresponding status data adopts Ethernet, for example: standard Ethernet communication (Modbus Transmission Control Protocol, Modbus TCP) protocol.

[0056] It can be understood that by centrally processing data through the switch 1208, the data processing rate of the industrial computer 1202 is increased, thereby improving the test efficiency of the tuning capacitor test.

[0057] In a specific embodiment, the present invention provides a test system and method that can simulate the working conditions of a tuning capacitor under rated current and withstand voltage indicators to determine whether the performance of the capacitor meets the working indicator requirements of a low-frequency transmitter system. The system builds an adjustable high-power, high-frequency, and high-voltage excitation source test system (i.e., a high-voltage tuning capacitor test system) based on a series resonance method, and uses online voltage, current, impedance, and temperature detection methods to perform electrical performance and high-frequency and high-voltage durability tests on the tuning capacitor; the high-power, high-frequency, and high-voltage excitation source system includes: a DC power supply device, a small signal excitation source, a power amplifier, a filter / impedance matching device, a resonant network (including an adjustable inductor, a fixed inductor), and a high-frequency and high-voltage endurance test device. Inductor and test capacitor samples) and test resistive load; the DC power supply device is used as the main power input device of the high-power, high-frequency, and high-voltage excitation source, which is used to convert the three-phase AC power supply into the DC power required by the power amplifier device, and is connected to the three-phase mains and the power amplifier device; the small signal excitation source is a high-frequency small signal generating device, which provides a high-frequency excitation small signal for the power amplifier device; the power amplifier device is used as a high-power, high-frequency, and high-voltage excitation source The high-power, high-frequency excitation signal generating device is used to power amplify the received high-frequency excitation small signal, and is connected to the DC power supply device, the small signal excitation source, and the filtering / impedance matching device; the filtering / impedance matching device is used as a harmonic suppression and output characteristic impedance matching device. The device is equipped with an adjustment device to enable the front-stage DC power supply device and the power amplifier device to maintain the maximum power output under different working frequency conditions. It is connected to the power amplifier device and the resonant network; the resonant network is mainly composed of an adjustable inductor, a fixed inductor and a test capacitor sample to achieve a quasi-resonant state under different working frequencies, and simulate the actual situation of the test capacitor sample when the low-frequency transmitter is working. It is connected to the filtering / impedance matching device and the test load; the test load is an energy dissipation device of the high-power high-frequency and high-voltage excitation source system, which is connected to the resonant network; the detection and control system includes an industrial computer, a switch, a control unit, a voltage and current / impedance detection device and a regional infrared temperature measurement device; the industrial computer is the test The execution carrier of the program is connected to the DC power supply device and the resonant network in the high-power, high-frequency, and high-voltage excitation source system through the switch and the control unit. The communication control data of the adjustable inductance coil in the DC power supply device and the resonant network is transmitted to the test program of the industrial computer through the control unit, and the command of the test program is transmitted to the DC power supply device and the resonant network through the control unit; the switch is the carrier for forwarding instruction status data of the test system, and is connected to the control unit, the voltage, current / impedance detection device, the regional infrared temperature measurement device, and the industrial computer; the control unit is the control core of the high-power, high-frequency, and high-voltage excitation source system, and is connected to the DC power supply device, the resonant network, and the switch in the high-power, high-frequency, and high-voltage excitation source system;The voltage, current / impedance detection device is the execution unit of the detection control system, which is used for voltage and current detection and impedance calculation and analysis at the specified circuit nodes in the high-power, high-frequency, and high-voltage excitation source system, and uploads the processed data to the industrial computer through the switch. It is connected to the filter / impedance matching equipment, the tuning network, and the switch in the high-power, high-frequency, and high-voltage excitation source system; the regional infrared temperature measurement device is the execution unit for online measurement of the temperature change of the capacitor sample shell. It uses a wireless infrared temperature measurement device to achieve non-contact real-time temperature measurement, and it realizes screen and data transmission between the industrial computer through the switch. ;

[0058] like Figure 5 As shown, the second aspect of the present invention provides a testing method for the high-voltage tuning capacitor testing system proposed in the first aspect, the high-voltage tuning capacitor system includes: an excitation source subsystem and a detection control subsystem, the excitation source subsystem includes a small signal excitation source, a power amplifier device and a resonant network, the detection control subsystem includes an industrial computer, a control unit and a regional infrared temperature measuring device, and the testing method includes:

[0059] Step S100: obtaining a capacitor sample to be tested;

[0060] Step S102: Connecting the capacitor sample to be tested to the resonant network;

[0061] Step S104: determining the initial temperature of the shell of the capacitor sample to be tested by a regional infrared temperature measuring device;

[0062] Step S106: Controlling the DC power supply device to gradually increase the corresponding output voltage through the industrial computer output command to determine the first shell temperature of the capacitor sample to be tested;

[0063] Step S108: determining the impedance parameter of the capacitor sample to be tested corresponding to the first temperature of the shell according to the detection device;

[0064] Step S109: determining a detection result according to the first temperature of the shell and the impedance parameter.

[0065] According to the test method proposed in the present invention, a high-voltage tuning capacitor test system is used to test the performance of the capacitor sample to be tested, and the working conditions of the capacitor under the rated current and withstand voltage indicators are simulated to test and verify the main electrical performance of the high-voltage tuning capacitor sample (i.e., the capacitor sample to be tested), so as to determine whether the capacitor meets the selection requirements of the low-frequency transmitter. Specifically, firstly, a high-voltage tuning capacitor sample to be tested is obtained as the capacitor sample to be tested, and the operator connects the capacitor sample to be tested to the resonant network in the excitation source subsystem. The resonant network is a test network including an adjustable inductor and a fixed inductor built based on the series resonance method. After the capacitor sample to be tested is connected to the corresponding position in the circuit network, the high-voltage tuning capacitor test system starts to power on, and the temperature of the capacitor sample to be tested at this time is measured by the regional infrared temperature measuring device as the initial temperature of the shell. The regional infrared temperature measuring device uses wireless infrared temperature measurement to realize non-contact real-time temperature measurement, and uploads the collected temperature data to the industrial computer through the switch in the detection control subsystem. The high-voltage tuning capacitor test system includes the parameters of electronic components preset by the operator. When the industrial computer receives the data corresponding to the initial temperature of the shell transmitted by the switch, it starts to determine the control command for increasing the voltage, and transmits the control command for increasing the voltage to the DC power supply device in the excitation source subsystem through the control unit. The voltage at both ends of the test capacitor sample is gradually increased, resulting in the continuous increase in the shell temperature of the test capacitor sample, and the impedance in the system will also change accordingly. The shell temperature corresponding to the test capacitor sample is determined in real time by the regional infrared temperature measuring device in the detection control subsystem, which is the first shell temperature; the impedance parameter corresponding to the first shell temperature in the excitation source subsystem is detected by the detection device in the detection control subsystem. The impedance parameters collected by the detection device and the first shell temperature collected by the regional infrared temperature measuring device are uploaded to the industrial computer through the switch. The industrial computer determines whether the temperature corresponding to the capacitor shell and the impedance value corresponding to the excitation source subsystem have a sudden change during the voltage rise process through the temperature change threshold and the impedance change threshold, thereby determining the detection result. When the temperature change and the impedance parameter change are both less than the corresponding change thresholds, the test capacitor sample meets the selection requirements and passes the performance test. The test results are uploaded to the industrial computer, and the output voltage of the DC power supply device is reduced to the system shutdown state; otherwise, the test capacitor sample does not meet the selection requirements, the results of failing the performance test are uploaded to the industrial computer, and the output voltage of the DC power supply device is reduced to the system shutdown state.

[0066] Among them, when the voltage across the test capacitor sample reaches the rated working voltage, the shell temperature of the test capacitor sample and the system impedance parameters corresponding to the excitation source subsystem do not change suddenly, that is, the change parameters are all less than the corresponding change threshold, the system still needs to be kept running under the rated voltage condition of the test capacitor sample for a period of time, such as stable operation for more than 2 hours, and the changes in the capacitor shell temperature and the system impedance are recorded in real time through the regional infrared temperature measuring device and the detection device. When no sudden change occurs during the continuous stable operation stage, and the maximum shell temperature of the test capacitor sample does not exceed the nominal maximum operating temperature of the capacitor, it is determined that the test capacitor sample has passed the performance test, otherwise, the test capacitor sample has not passed the performance test.

[0067] It can be understood that the testing method proposed in the present invention can improve the degree of automation of tuning capacitor sample testing, adopt a non-contact regional temperature measurement method, and have high safety; and can perform high-frequency and high-voltage durability performance tests on tuning capacitor samples, thereby improving the testing efficiency of tuning capacitors.

[0068] In some embodiments, optionally, Figure 6 As shown, before the industrial computer outputs instructions to control the DC power supply device to gradually increase the corresponding output voltage and determine the first shell temperature of the capacitor sample to be tested, it also includes:

[0069] Step S1030: determining the test operating frequency according to the small signal excitation source;

[0070] Step S1031: determining a test instruction corresponding to the industrial computer according to the test working frequency;

[0071] Step S1032: The test instruction is transmitted to the control unit via the switch;

[0072] Step S1033: the control unit determines the circuit switch parameters corresponding to the resonant network according to the test instruction.

[0073] In this embodiment, before performing a high-frequency and high-voltage test on the test capacitor sample, the test operating frequency corresponding to the test capacitor sample parameters should also be determined according to the preset parameters in the high-voltage tuned capacitor test system, for example, set within the frequency range of 10KHz, 20KHz, 50KHz or 100KHz, and the control instructions corresponding to the operating frequency are transmitted to the control unit through the switch. The control unit determines the closed state of at least one switch in the detection device through the control instructions transmitted from the switch, and determines the system operating frequency as the corresponding test operating frequency through the closed state of the switch.

[0074] It can be understood that by setting an adjustable preset test operating frequency, the safety during the test is improved, the damage to the test capacitor sample is reduced, and the test cost is reduced.

[0075] In some embodiments, optionally, Figure 7 As shown, before the industrial computer outputs instructions to control the DC power supply device to gradually increase the corresponding output voltage and determine the first shell temperature of the capacitor sample to be tested, it also includes:

[0076] Step S1034: the control unit controls the DC power supply device to output a low voltage;

[0077] Step S1035: Determine whether the filter matching device is switched to a quasi-resonant state;

[0078] Step S1036: Determine whether the adjustable inductor is switched to a quasi-resonant state.

[0079] In this embodiment, before the high-frequency and high-voltage test is performed on the test capacitor sample, the control unit should also determine that the DC power supply device in the excitation source subsystem is in a low-voltage state, that is, the output voltage is set to 20V. And determine whether the filter matching device is in a quasi-resonant state, that is, whether the impedance in the excitation source subsystem is within a preset target range. It is necessary to adjust the inductance of the coupling coil in the adjustable inductor and the filter matching device so that the impedance in the excitation source subsystem reaches the preset target range before transmitting the quasi-resonant state instruction to the upper computer (i.e., the industrial computer) and starting to increase the output voltage of the DC power supply device to gradually increase the voltage across the capacitor.

[0080] It can be understood that before conducting high-frequency and high-voltage testing, the impedance and operating frequency in the high-voltage tuned capacitor test system are determined to reduce the impact of other variables in the system on the test capacitor sample and improve the accuracy and safety of the test.

[0081] In some embodiments, optionally, Figure 8 As shown, determining the detection result according to the first temperature of the shell and the impedance parameter includes:

[0082] Step S1092: determining a capacitor housing temperature rise parameter according to the first housing temperature and the housing initial temperature;

[0083] Step S1094: determining a system impedance change parameter according to the impedance parameter;

[0084] Step S1096: determining a shell temperature rise threshold and a system impedance threshold;

[0085] Step S1098: when the capacitor housing temperature rise parameter is greater than the housing temperature rise threshold, or the system impedance change parameter is greater than the system impedance threshold, determining that the detection result corresponding to the capacitor sample to be tested is the first result, reducing the output voltage of the DC power supply device, and uploading data information corresponding to the first result to the industrial computer;

[0086] Step S1099: When the capacitor shell temperature rise parameter is less than or equal to the shell temperature rise threshold, and the system impedance change parameter is less than or equal to the system impedance threshold, determine that the detection result of the capacitor sample to be tested is the second result, and upload data information corresponding to the second result to the industrial computer.

[0087] In this embodiment, the shell temperature of the test capacitor sample, i.e., the first shell temperature, is detected in real time by a regional infrared temperature measuring device, and the temperature change of the test capacitor sample is determined by determining the difference between the first shell temperature and the initial shell temperature; the impedance parameter is determined by detecting the detection device in the control subsystem (i.e., the voltage detection device and the current detection device in the circuit), and the impedance change is determined according to the impedance parameter corresponding to the initial shell temperature and the impedance parameter corresponding to the first shell temperature. The temperature change and the impedance change are analyzed according to the shell temperature rise threshold and the system impedance threshold preset by the operator in the high-voltage tuning capacitor test system to determine whether the test capacitor sample meets the performance test requirements.

[0088] Specifically, during the process of testing the voltage increase at both ends of the capacitor sample, when the capacitor shell temperature rise parameter (i.e., temperature change) is greater than the shell temperature rise threshold, or the system impedance change parameter (i.e., impedance change) is greater than the system impedance threshold, it means that under the high-voltage and high-frequency working conditions, the abnormal operation of the capacitor causes the capacitor temperature to suddenly change, or the impedance of the excitation source subsystem suddenly changes, that is, the capacitor fails the test under the high-voltage and high-frequency conditions and fails to meet the performance test requirements. The control unit sends data information of the first result (i.e., failure to pass the performance test) to the industrial computer, reduces the output voltage of the DC power supply device to 0V, and the high-voltage tuning capacitor test system reaches the shutdown state; during the process of testing the voltage increase at both ends of the capacitor sample, the capacitor shell temperature rise parameter and the system impedance change parameter When both are less than or equal to the corresponding change threshold, it means that the test capacitor sample works normally under the high voltage and high frequency condition. The system still needs to be kept running under the rated voltage condition of the test capacitor sample for a period of time, such as stable operation for more than 2 hours. The temperature change of the capacitor shell and the system impedance are recorded in real time by the regional infrared temperature measuring device and the detection device. When no sudden change occurs during the continuous stable operation stage and the maximum shell temperature of the test capacitor sample does not exceed the nominal maximum operating temperature of the capacitor, it is determined that the test capacitor sample has passed the performance test. The control unit sends data information of the second result (i.e., passing the performance test) to the industrial computer, reduces the output voltage of the DC power supply device to 0V, and the high-voltage tuning capacitor test system reaches the shutdown state.

[0089] Among them, when it is determined that the test capacitor sample works normally under high voltage and high frequency conditions, during the subsequent rated voltage condition operation time, if the capacitor shell temperature rise parameter (i.e., temperature change) is greater than the shell temperature rise threshold, or the system impedance change parameter (i.e., impedance change) is greater than the system impedance threshold, it also means that the test capacitor sample is unqualified. That is, if the test capacitor sample works abnormally during the subsequent continuous and stable operation stage, it is also the first result (failed the performance test), and the data information of the first result is sent to the industrial computer through the control unit, the output voltage of the DC power supply device is reduced to 0V, and the high-voltage tuning capacitor test system reaches the shutdown state.

[0090] In a specific embodiment, optionally, the topological schematic diagram of the high-voltage tuning capacitor test system proposed by the present invention is as follows: Figure 3 As shown, the power amplifier device 1108 adopts a class D power amplifier, and the main circuit structure is an H-bridge inverter circuit; the filtering / impedance matching device (filter matching device 1110) is composed of an adjustable inductor 1L1, a filter capacitor 1C1 and a filter capacitor 2 1C2 in the filter capacitor group, a switching switch 1CK1 and a coupling coil T1; the resonant network 1106 is composed of an adjustable inductor L1, an adjustable inductor 2L2, a fixed inductor L2, a switching switch 2LK1, a switching switch 3LK1 and a test capacitor sample C0; the test load is composed of a 1Ω water-cooled load R1; the detection device 1210 is composed of a voltage detection 1 2102, a current detection 1 2104, a voltage detection 2106 and a current detection 2108.

[0091] In this embodiment, a series resonant network 1106 composed of an adjustable inductor L1, an adjustable inductor 2L2, a fixed inductor L2, a switching switch 2LK1, a switching switch 3LK1 and a test capacitor sample C0 is proposed. Through the multi-speed switching switch and the adjustable inductor, the resonant network 1106 can be in a quasi-resonant state at different operating frequencies within a frequency range corresponding to operating frequencies such as 10kHz, 15kHz, 25kHz, 30kHz, 40kHz, 55kHz, 65kHz, 75kHz, 85kHz and 100kHz.

[0092] In this embodiment, a specific implementation circuit of a filter / impedance matching device (filter matching device 1110) is proposed. The filter circuit mainly uses a low-pass filter with a variable cutoff frequency composed of an adjustable inductor and a variable capacitor realized by a switching switch, which meets the requirements of the test system's operating frequency range of 10kHz to 100kHz. In the embodiment, the impedance matching function is achieved by changing the coupling coefficient between the primary and secondary of the coupling coil T1.

[0093] Specifically, the power amplifier device 1108 is connected to one end of the current detection 2104, and the other end of the current detection 2104 is connected to one end of the adjustable inductor 1L1; a voltage detection 2102 is connected in parallel between the ground wire of the power amplifier device 1108 and the current detection 2104; the other end of the adjustable inductor 1L1 is connected to the first end of the filter capacitor 1C1; the first end of the filter capacitor 1C1 is also connected to the first end of the switching switch 1CK1, and the second end of the switching switch 1CK1 is connected to the first end of the filter capacitor 1C2, and the second end of the filter capacitor 1C2 is connected to the first end of the filter capacitor 1C2. Connect the second end of the filter capacitor 1C1; the second end of the filter capacitor 1C1 is connected to the primary end of the coupling coil T1, and the secondary end of the coupling coil T1 is connected to the adjustable inductor L1; the adjustable inductor L1 and the adjustable inductor 2L2, the fixed inductor L2, the test capacitor sample C0, the current detection 2108 and the water-cooled load R1 are connected in series and grounded, the two ends of the adjustable inductor 2L2 are connected in parallel with the switching switch 2LK1, the two ends of the fixed inductor L2 are connected in parallel with the switching switch 3LK1, and the two ends of the test capacitor sample C0 are connected in parallel with the voltage detection 2106.

[0094] In addition, the test method flow chart corresponding to this embodiment is as follows Figure 4 As shown, the following steps are included:

[0095] Step S4000: System self-check, record the initial temperature of the capacitor sample housing;

[0096] Step S4002: the small signal excitation source sets the operating frequency and presets the states of the switches 1CK1, 2LK1 and 3LK1;

[0097] Step S4004: the output voltage of the DC power supply device is set to 20V;

[0098] Step S4006: Whether the voltage and current phases are within the target range;

[0099] When the voltage and current phases are within the target range, step S4008: whether the impedance is within the target range;

[0100] When the impedance is within the target range, step S4009: adjusting the inductance of the coupling coils T1 and L1;

[0101] When the voltage and current phases are not within the target range, step S40010: adjust the inductance of 1L1, L1 or 2L2;

[0102] Step S40012: Reporting to the upper computer that the system tuning is complete;

[0103] Step S40014: increasing the output voltage of the DC power supply device, and gradually increasing the voltage across the capacitor;

[0104] Step S40016: During the process of increasing the voltage across the capacitor, it is observed that the temperature rise of the capacitor housing and the system impedance do not change suddenly and work normally;

[0105] When the temperature rise of the capacitor housing and the system impedance do not change suddenly and the operation is normal, step S4018: increasing the voltage across the capacitor to the rated working voltage, and observing the temperature rise of the capacitor housing and the system impedance state in real time;

[0106] When the temperature rise of the capacitor housing and the system impedance suddenly change and the operation is abnormal, step S4020: the capacitor is abnormal, the output voltage of the DC power supply device is reduced to 0V, and the device is shut down;

[0107] Step S4022: Reporting "failed the performance test" to the upper computer;

[0108] Step S4024: Continue to run stably for more than 2 hours, observe that the temperature rise of the capacitor shell and the system impedance do not change suddenly, and the maximum temperature of the shell does not exceed the standard and the operation is normal;

[0109] After running stably for more than 2 hours, observe that there is no sudden change in the temperature rise of the capacitor shell and the system impedance, and the maximum temperature of the shell does not exceed the standard. If the operation is normal, step S4026: record the temperature rise of the capacitor shell and the system impedance status, and report "passed the performance test" to the upper computer;

[0110] Step S4028: reducing the output voltage of the DC power supply device to 0V and shutting down;

[0111] After continuous stable operation for more than 2 hours, if the temperature rise of the capacitor housing and the system impedance are observed to be sudden, the maximum temperature of the housing exceeds the standard, and the operation is abnormal, step S4030: the capacitor is abnormal, the output voltage of the DC power supply device is reduced to 0V, and the machine is shut down;

[0112] Step S4032: Report “failed the performance test” to the upper computer.

[0113] Optionally, the steps of the test method may also include:

[0114] a) Power on the system, complete self-test, and record the initial temperature of the capacitor sample housing to be tested;

[0115] b) The test operating frequency is set by a small signal excitation source, and the control unit presets the states of the switches 1CK1, 2LK1 and 3LK1 according to the set program;

[0116] c) The control unit controls the DC power supply device to output a low voltage of 20V;

[0117] d) detecting whether the phase of voltage 1 / current 1 is within the target range by means of a voltage / current / impedance detection device;

[0118] e) If the voltage and current phases are not within the target range, adjust the inductance of 1L1, L1 or 2L2;

[0119] f) When the voltage and current phases are within the target range, the voltage and current / impedance detection device is used to detect whether the impedance is within the target range;

[0120] g) If the impedance is not within the target range, adjust the inductance of the coupling coil T1 and the adjustable inductor L1;

[0121] h) Repeat steps d) to g) until the voltage, current phase and impedance are within the target range, and report to the upper computer (i.e., industrial computer) that the system tuning is complete;

[0122] i) Gradually increase the output voltage of the DC power supply device, and the voltage across the capacitor gradually increases. During this process, if the temperature rise of the capacitor shell and the sudden change of system impedance are observed, it means that the capacitor is working abnormally, and the output of the DC power supply device is reduced to 0V, and the upper computer is reported as "failed the test";

[0123] j) If the capacitor case temperature rise and system impedance do not change suddenly during the process of increasing the voltage across the capacitor to the rated working voltage, the system shall be kept in stable operation for more than 2 hours under the capacitor rated voltage condition, and the capacitor case temperature rise and system impedance status shall be continuously observed and recorded;

[0124] k) During the continuous and stable operation stage, the host computer records the temperature rise of the capacitor shell and the system impedance state. If there is no sudden change and the maximum temperature of the capacitor shell does not exceed the nominal maximum operating temperature of the capacitor, it reports "passed the performance test" to the host computer; otherwise, it reports "failed the performance test" to the host computer.

[0125] l) Reduce the output voltage of the DC power supply device to 0V and shut down the system.

[0126] Although this specification includes many specific implementation details, these should not be interpreted as limiting the scope of any invention or the scope of protection claimed, but are mainly used to describe the features of the specific embodiments of specific inventions. Certain features described in multiple embodiments in this specification may also be implemented in combination in a single embodiment. On the other hand, the various features described in a single embodiment may also be implemented separately in multiple embodiments or in any suitable sub-combination. In addition, although the features may work as above in certain combinations and even initially claim protection, one or more features from the claimed combination may be removed from the combination in some cases, and the claimed combination may point to a sub-combination or a variation of a sub-combination.

[0127] Similarly, although operations are depicted in a particular order in the accompanying drawings, this should not be understood as requiring that these operations be performed in the particular order shown or performed sequentially, or requiring that all illustrated operations be performed to achieve the desired results. In some cases, multitasking and parallel processing may be advantageous. In addition, the separation of various system modules and components in the above-described embodiments should not be understood as requiring such separation in all embodiments, and it should be understood that the described program components and systems can generally be integrated together in a single software product, or packaged into multiple software products.

[0128] Thus, specific embodiments of the subject matter have been described. Other embodiments are within the scope of the appended claims. In some cases, the actions recited in the claims can be performed in a different order and still achieve the desired results. In addition, the processes depicted in the drawings do not necessarily require the particular order or sequential order shown to achieve the desired results. In some implementations, multitasking and parallel processing may be advantageous.

[0129] It should be noted that, in this article, relational terms such as "first" and "second" are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise a ..." do not exclude the existence of other identical elements in the process, method, article or device including the elements.

[0130] The foregoing is merely a specific embodiment of the present invention, which enables those skilled in the art to understand or implement the present invention. Various modifications to these embodiments will be apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention will not be limited to the embodiments shown herein, but rather to the widest scope consistent with the principles and novel features claimed herein.

Claims

1. A high voltage tuning capacitor test system, characterized in that: include: An excitation source subsystem and a detection and control subsystem, wherein the excitation source subsystem includes a small signal excitation source, a power amplifier device and a resonant network, and the detection and control subsystem includes an industrial computer, a control unit and a regional infrared temperature measurement device; The small signal excitation source provides a high-frequency small excitation signal to the power amplifier device and is connected to one end of the power amplifier device; The other end of the power amplifier device is connected to the resonant network to amplify the power of the received high-frequency excitation small signal; The resonant network includes a test capacitor sample; One end of the control unit is connected to the industrial computer, and the other end of the control unit is connected to the resonant network; The regional infrared temperature measuring device is connected to the industrial computer and is used to detect the shell temperature of the test capacitor sample; The detection control subsystem is connected to and controls the excitation source subsystem through the control unit.

2. The high voltage tuning capacitor test system according to claim 1, characterized in that: The excitation source subsystem also includes: A DC power supply device is connected to the power amplifying device, and is used to convert three-phase AC power supply into DC power required by the power amplifying device.

3. The high voltage tuning capacitor test system according to claim 2, characterized in that: The excitation source subsystem also includes: A filter matching device, one end of which is connected to the power amplifier device, and the other end of which is connected to the resonant network, wherein the filter matching device enables the DC power supply device and the power amplifier device to maintain maximum power output under different operating frequency conditions.

4. The high voltage tuning capacitor test system according to claim 3, characterized in that: The resonant network also includes: an adjustable inductor and a fixed inductor; The adjustable inductor and the fixed inductor are connected in series; One end of the adjustable inductor is connected to the filter matching device, and the other end of the adjustable inductor is connected to one end of the fixed inductor; The other end of the fixed inductor is connected to the test capacitor sample.

5. The high voltage tuning capacitor test system according to claim 4, characterized in that: The excitation source subsystem further includes: A test load, one end of which is connected to the test capacitor sample, and the other end of which is connected to the filter matching device.

6. The high voltage tuning capacitor test system according to claim 5, characterized in that: The detection and control subsystem further includes: A detection device, one end of which is connected to the industrial computer, and the other end of which is connected to the filter matching device and the resonant network; The detection device is used to determine the voltage, current and impedance at the circuit nodes in the excitation source subsystem, and transmit the determined data corresponding to the voltage, current and impedance to the industrial computer.

7. The high voltage tuning capacitor test system according to claim 6, characterized in that: The detection and control subsystem further includes: A switch, the switch is a carrier of the test instructions transmitted by the industrial computer, and the industrial computer transmits the test instructions to the control unit, the detection device and the regional infrared temperature measurement device through the switch; The control unit is connected to the industrial computer via the switch; The detection device is connected to the industrial computer via the switch; The regional infrared temperature measuring device is connected to the industrial computer through the switch.

8. A testing method, characterized in that: A high-voltage tuning capacitor test system for use in any one of claims 1 to 7, the high-voltage tuning capacitor test system comprising: an excitation source subsystem and a detection control subsystem, the excitation source subsystem comprising a small signal excitation source, a power amplifier device and a resonant network, the detection control subsystem comprising an industrial computer, a control unit and a regional infrared temperature measurement device, the test method comprising: Obtain a capacitor sample to be tested; Connecting the capacitor sample to be tested to the resonant network; Determine the initial temperature of the shell of the capacitor sample to be tested by the regional infrared temperature measuring device; The industrial computer outputs instructions to control the DC power supply device to gradually increase the corresponding output voltage, thereby determining a first shell temperature of the capacitor sample to be tested; Determine the impedance parameter of the capacitor sample to be tested corresponding to the first temperature of the shell according to the detection device; A detection result is determined according to the first temperature of the housing and the impedance parameter.

9. The testing method according to claim 8, characterized in that: Before the industrial computer outputs instructions to control the DC power supply device to gradually increase the corresponding output voltage and determine the first shell temperature of the capacitor sample to be tested, the method further includes: Determining the test operating frequency according to the small signal excitation source; Determine a test instruction corresponding to the industrial computer according to the test operating frequency; The test instruction is transmitted to the control unit via a switch; The control unit determines the circuit switch parameters corresponding to the resonant network according to the test instruction.

10. The testing method according to claim 9, characterized in that: Before the industrial computer outputs instructions to control the DC power supply device to gradually increase the corresponding output voltage and determine the first shell temperature of the capacitor sample to be tested, the method further includes: The control unit controls the DC power supply device to output a low voltage; Determine that the filter matching device switches to a quasi-resonant state; Make sure the adjustable inductor switches to a quasi-resonant state.

11. The testing method according to claim 8, characterized in that: The determining of the detection result according to the first temperature of the housing and the impedance parameter comprises: Determine a capacitor housing temperature rise parameter according to the housing first temperature and the housing initial temperature; Determining a system impedance change parameter according to the impedance parameter; Determine the shell temperature rise threshold and system impedance threshold; When the capacitor housing temperature rise parameter is greater than the housing temperature rise threshold, or the system impedance change parameter is greater than the system impedance threshold, determining that the detection result corresponding to the capacitor sample to be tested is a first result, reducing the output voltage of the DC power supply device, and uploading data information corresponding to the first result to the industrial computer; When the capacitor shell temperature rise parameter is less than or equal to the shell temperature rise threshold, and the system impedance change parameter is less than or equal to the system impedance threshold, the detection result corresponding to the capacitor sample to be tested is determined to be a second result, and data information corresponding to the second result is uploaded to the industrial computer.

Images