Detection device for computer circuit board

By designing a computer circuit board detection device containing multiple detection units, comprehensive inspection of circuit boards is achieved, the problem of single functions of existing detection devices is solved, and the accuracy and reliability of detection are significantly improved.

CN119881605AInactive Publication Date: 2025-04-25XIAN JIAOTONG UNIV CITY COLLEGE
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Patent Information

Application Number
CN202510290820.7
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-03-12
Publication Date
2025-04-25
Estimated Expiration
Not applicable · inactive patent

AI Technical Summary

Technical Problem

The existing computer circuit board detection device has a single function and cannot conduct comprehensive and comprehensive inspection of circuit boards, making it difficult to meet the growing production demand and quality standards.

Method used

A detection device including a plate chain conveyor, a material transfer unit, a switching unit, a visual camera, a probe testing unit and a material separation unit is designed. Through the mutual cooperation of these components, an organic combination of electrical performance detection and appearance detection of the circuit board is realized.

Benefits of technology

The comprehensive inspection of circuit boards is achieved, which significantly improves the accuracy and reliability of detection, and reduces the interference of external dust on the detection area, and can adapt to the clamping of circuit boards of different sizes.

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Abstract

The invention relates to the technical field of computer circuit board detection, and discloses a computer circuit board detection device which comprises a plate chain conveyor used for conveying computer circuit boards one by one, and a supporting stand is arranged on one side of the plate chain conveyor; the device further comprises a material moving unit installed on the supporting frame table, a detection table is arranged at the discharging end of the plate chain conveyor, a switching unit is arranged above the detection table, a visual camera and a probe testing unit are installed on the switching unit, and the switching unit is used for sequentially moving the visual camera and the probe testing unit to the position over the detection table for detection. Electrical performance detection and appearance detection can be organically combined, comprehensive detection of the circuit board is achieved, the detection accuracy and reliability are remarkably improved, meanwhile, a detection part is optimized during detection, interference of external dust on the detection part is reduced, and in addition, the detection table clamping unit can adapt to clamping work of circuit boards of different sizes.
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Description

Technical Field

[0001] The invention relates to the technical field of computer circuit board detection, in particular to a detection device for a computer circuit board. Background Art

[0002] In today's digital age, the rapid development of computer technology has led to the widespread use of computer circuit boards in various electronic devices, from smart phones, tablets to high-performance servers. The quality of circuit boards is directly related to the performance and stability of the equipment. With the continuous advancement of electronic technology, the integration of circuit boards is getting higher and higher, the wiring density is increasing, and the size is getting smaller and smaller, which puts higher requirements on the detection technology of circuit boards.

[0003] At present, the common computer circuit board inspection methods mainly include manual visual inspection, flying probe test and automatic optical inspection (AOI). Manual visual inspection is the most traditional method. The inspector observes the appearance of the circuit board with the naked eye to check whether there are short circuits, open circuits, poor soldering and other problems. The advantages of this method are low cost and simple equipment, which is suitable for small batch production and simple circuit board inspection. However, its disadvantages are also very obvious. The inspection efficiency is low, it is easily affected by the subjective factors of the inspector, and the probability of missed inspection and misjudgment is high, which cannot meet the needs of large-scale production.

[0004] Flying probe testing is a method of measuring electrical performance by contacting the probe with the test point on the circuit board. It can detect parameters such as the conductivity and insulation of the circuit board and has high detection accuracy. Automatic optical inspection (AOI) uses optical principles to collect and analyze images of the circuit board and detects the appearance defects of the circuit board by comparing with the standard image. Although the above two methods can detect circuit boards, the existing computer circuit board detection device can only use any one of them for detection, that is, it can only detect electrical performance or appearance detection, and the function is relatively single. It can often only detect a certain performance of the circuit board, and cannot perform comprehensive and integrated detection of the circuit board, which makes it difficult to meet the growing production needs and quality standards. Summary of the invention

[0005] The purpose of the present invention is to provide a detection device for computer circuit boards to solve the problem in the above background technology that only one layer of pipe can be clamped during pipe transportation, resulting in low transportation efficiency.

[0006] To achieve the above-mentioned purpose, the present invention provides the following technical solutions: a detection device for computer circuit boards, comprising a plate chain conveyor for conveying computer circuit boards one by one, a support frame being provided on one side of the plate chain conveyor; and further comprising: a material moving unit installed on the support frame, a detection platform being provided at the discharge end of the plate chain conveyor, a switching unit being provided above the detection platform, a visual camera and a probe test unit being installed on the switching unit, the switching unit being used to move the visual camera and the probe test unit to the top of the detection platform for detection in turn, a material dividing unit being provided on a side of the detection platform away from the plate chain conveyor, and a clamping unit being provided on the detection platform; a camera dustproof unit for dust removal of the visual camera being installed on one side of the switching unit, a probe cleaning unit being installed on the probe test unit, and being used to achieve synchronous cleaning of array probes with the aid of the movement of the probe test unit.

[0007] Preferably, the material moving unit includes a material moving cylinder, a shift fixing plate, an L-shaped connecting plate, a material grabbing assembly, a connecting rod, a first slider and a first guide rail. The material moving cylinder is installed on the inner side of the top of the supporting frame. Two L-shaped connecting plates are provided. The bottom of the L-shaped connecting plate is slidably connected to the first guide rail through the first slider. The first guide rail is fixed to the top of the supporting frame. The telescopic end of the material moving cylinder is fixedly connected to one of the L-shaped connecting plates through the shift fixing plate. The two L-shaped connecting plates are fixedly connected by the connecting rod. One end of the material grabbing assembly is fixedly connected to the L-shaped connecting plate.

[0008] Preferably, the material grabbing assembly includes a fixed frame, a first driving cylinder, a clamping frame, a first rack, a first gear, a second rack, a first gripper fixing seat, a material moving gripper and a second gripper fixing seat, the fixed frame is fixedly connected to the L-shaped connecting plate, the first driving cylinder is fixed to the inner side of the fixed frame, the clamping frame is fixedly connected to the end of the fixed frame, the first rack is fixed to the telescopic end of the first driving cylinder, the first rack and the second rack are transmission-connected by the first gear, the first gear is rotatably connected to the clamping frame by a bearing, the first rack and the second rack are both slidably connected to the clamping frame, the first gripper fixing seat is fixed to one end of the first rack, the second gripper fixing seat is fixed to one end of the second rack, a material moving gripper is fixed on the same side of the first gripper fixing seat and the second gripper fixing seat, and a clamping groove is provided at the end of the material moving gripper.

[0009] Preferably, the switching unit includes a second driving cylinder, a second guide rail, a movable plate, a second slider, a cylinder support frame, a guide rail connecting plate, a camera fixing plate and a probe assembly fixing plate, the second driving cylinder is fixedly connected to the guide rail connecting plate via the cylinder support frame, the telescopic end of the second driving cylinder is fixedly connected to the top of the movable plate, the camera fixing plate and the probe assembly fixing plate are respectively fixed at both ends of the movable plate, the second guide rail is fixed to the top of the guide rail connecting plate, the distal ends of the guide rail connecting plate are fixed to the detection table and the support frame, the bottom of the movable plate is slidably connected to the second guide rail via the second slider, the visual camera is fixed to the bottom of the camera fixing plate, and the probe testing unit is installed at the bottom of the probe assembly fixing plate.

[0010] Preferably, the probe testing unit includes a lifting cylinder, a lifting plate, a probe fixing plate and a buffer air column, the lifting cylinder is fixed to the bottom of the probe assembly fixing plate, the lifting plate is fixedly connected to the telescopic end of the lifting cylinder, the top of the probe fixing plate is connected to the lifting plate through four buffer air columns, a probe array is distributed at the bottom of the probe fixing plate, the probe cleaning unit is arranged on one side of the lifting plate, and the input end of the camera dustproof unit is fixed to the top of the lifting plate.

[0011] Preferably, the camera dustproof unit includes a linkage plate, a third rack, a third gear, a linkage shaft, a fourth gear, a fourth rack, a first brush connecting plate and a camera dust brush, the bottom end of the linkage plate is fixed to the lifting plate, the third rack is fixed to the top of the linkage plate, the third gear is meshingly connected with the third rack, the third gear and the fourth gear are respectively fixedly sleeved on both ends of the linkage shaft, the linkage shaft is rotatably connected to the movable plate through a bearing seat, the fourth gear is meshingly connected with the fourth rack, the top of the first brush connecting plate is fixedly connected to the fourth rack through a connecting column, the camera dust brush is fixedly connected to the first brush connecting plate, and the upper side of the brush surface of the camera dust brush is higher than the bottom surface of the lens of the visual camera.

[0012] Preferably, the probe cleaning unit includes a cylindrical cam rod, a fifth gear, a slide seat, a second brush connecting plate, a probe cleaning brush, a third slider, a third guide rail, a guide frame and teeth. Both sides of the cylindrical cam rod are rotatably connected to the lifting plate through bearing seats, both ends of the cylindrical cam rod are fixedly sleeved with the fifth gear, the slide seat is sleeved on the outside of the cylindrical cam rod, one side of the slide seat is fixedly connected to the probe cleaning brush through the second brush connecting plate, the third slider is fixed to the bottom of the slide seat, the third guide rail is fixed to the lifting plate and slidably connected to the third slider, the top of the guide frame is fixedly connected to the movable plate, and the teeth are evenly distributed on one side of the bottom of the guide frame and meshingly connected with the fifth gear.

[0013] Preferably, the material dividing unit includes a material dividing frame, a material dividing conveyor, a first material dividing chute, a second material dividing chute, a material dividing baffle and a rotary cylinder. The material dividing conveyor is installed on one side of the material dividing frame. The first material dividing chute and the second material dividing chute are both inclined. The first material dividing chute and the second material dividing chute are connected by a partition. The tops of the first material dividing chute and the second material dividing chute are both connected to one side of the material dividing conveyor. One end of the partition is rotatably connected to the material dividing baffle. The rotary cylinder is fixedly installed at the bottom of the first material dividing chute and its output end is fixedly connected to the material dividing baffle.

[0014] Preferably, the clamping unit includes a left clamping cylinder, a left clamping plate, a right clamping cylinder, a right clamping plate and a material table, the left clamping cylinder and the right clamping cylinder are symmetrically distributed on both sides of the detection table, the left clamping plate is fixedly connected to the telescopic end of the left clamping cylinder, the right clamping plate is fixedly connected to the telescopic end of the right clamping cylinder, a groove is provided on the top of the detection table, and the material table is arranged at the center of the groove.

[0015] Preferably, a slide groove is provided on the fourth rack, a slide column is slidably connected in the slide groove, a fixed block is fixed at one end of the slide column, and the slide column is fixed to the top of the movable plate through the fixed plate.

[0016] Compared with the prior art, the present invention has the following beneficial effects: The present invention can organically combine electrical performance detection and appearance detection through the cooperation of the designed material transfer unit, switching unit, visual camera, probe test unit and material dividing unit, realize comprehensive detection of circuit boards, significantly improve the accuracy and reliability of detection, and optimize the detection part during detection to reduce the interference of external dust. In addition, the clamping unit of the detection table can adapt to the clamping work of circuit boards of different sizes. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1It is a schematic diagram of the overall structure of the present invention; Figure 2 This is a schematic diagram of the state when the material transfer unit of the present invention transfers the circuit board; Figure 3 It is a structural schematic diagram of the material transfer unit of the present invention; Figure 4 It is a structural schematic diagram of the material grabbing assembly of the present invention; Figure 5 It is a structural schematic diagram of the switching unit of the present invention; Figure 6 is a side view of the switching unit of the present invention; Figure 7 It is a schematic diagram of the structure of the probe test unit and the camera dustproof unit of the present invention; Figure 8 It is a structural schematic diagram of the probe cleaning unit of the present invention; Fig. 9 is a side view of the probe cleaning unit of the present invention; Fig.10 It is a structural schematic diagram of the material distribution unit of the present invention; Fig.11 It is a side view of the material distribution unit of the present invention; Fig.12 It is a structural schematic diagram of the clamping unit of the present invention; Fig.13 It is a schematic diagram of the partial structure of the dust-proof unit of the camera of the present invention.

[0018] In the figure: 1, plate chain conveyor; 2, support frame; 3, material transfer unit; 31, material transfer cylinder; 32, shift fixing plate; 33, L-shaped connecting plate; 34, material grabbing assembly; 341, fixing frame; 342, first driving cylinder; 343, gripping frame; 344, first rack; 345, first gear; 346, second rack; 347, first gripper fixing seat; 348, material transfer gripper; 349, second gripper fixing seat; 3410, clamping groove; 35. Connecting rod; 36. First slider; 37. First guide rail; 4. Test bench; 41. Groove; 5. Switching unit; 51. Second driving cylinder; 52. Second guide rail; 53. Moving plate; 54. Second slider; 55. Cylinder support frame; 56. Guide rail connecting plate; 57. Camera fixing plate; 58. Probe assembly fixing plate; 6. Visual camera; 7. Probe test unit; 71. Lifting cylinder; 72. Lifting plate; 73. Probe fixing plate; 74. Buffer gas column; 8, material distribution unit; 81, material distribution frame; 82, material distribution conveyor; 83, first material distribution slide; 84, second material distribution slide; 85, material distribution baffle; 86, rotary cylinder; 9, clamping unit; 91, left clamping cylinder; 92, left clamping plate; 93, right clamping cylinder; 94, right clamping plate; 95, material table; 10, camera dustproof unit; 101, linkage plate; 102, third rack; 103, third gear; 104, linkage shaft; 10 5. Fourth gear; 106. Fourth rack; 1061. Slide groove; 1062. Slide column; 1063. Fixed block; 107. First brush connecting plate; 108. Camera dust brush; 11. Probe cleaning unit; 111. Cylindrical cam rod; 112. Fifth gear; 113. Slide seat; 114. Second brush connecting plate; 115. Probe cleaning brush; 116. Third slider; 117. Third guide rail; 118. Guide frame; 119. Gear. DETAILED DESCRIPTION

[0019] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0020] Example 1: Please refer to Figure 1 , Figure 2 and Figure 6 , a computer circuit board detection device shown in the figure includes a plate chain conveyor 1 for conveying computer circuit boards one by one, a support frame 2 is provided on one side of the plate chain conveyor 1, and computer circuit boards can be conveyed in batches through the plate chain conveyor 1 to achieve a large-scale detection effect; It also includes: a material moving unit 3 installed on the support frame 2, a detection platform 4 is provided at the discharge end of the plate chain conveyor 1, a switching unit 5 is provided above the detection platform 4, a visual camera 6 and a probe test unit 7 are installed on the switching unit 5, and the switching unit 5 is used to sequentially move the visual camera 6 and the probe test unit 7 to the top of the detection platform 4 for detection, a material dividing unit 8 is provided on the side of the detection platform 4 away from the plate chain conveyor 1, and a clamping unit 9 is also provided on the detection platform 4; The process of testing the circuit board: during the test, the computer circuit board is conveyed to the discharge end by the plate chain conveyor 1, and then the material moving unit 3 clamps the circuit board and transfers it to the test table 4 for placement. The visual camera 6 performs appearance defect detection on the circuit board at this time, and then the switching unit 5 is used to move the visual camera 6 to one side to allow the probe test unit 7 to move directly above the circuit board. The conductivity, insulation and other parameters of the circuit board are detected by the probe test unit 7. After the test, the probe test unit 7 is reset, and then the circuit board is clamped and transferred to the material distribution unit 8 by the material moving unit 3. At this time, the next circuit board is automatically positioned on the test table 4, thereby achieving the effect of fully automatic loading and unloading, and the test process is relatively continuous, and the circuit board can be tested uninterruptedly, which has the effect of organically combining electrical performance testing and appearance testing, realizing comprehensive testing of the circuit board, and significantly improving the accuracy and reliability of the test; A camera dustproof unit 10 is installed on one side of the switching unit 5 for removing dust from the visual camera 6. A probe cleaning unit 11 is installed on the probe testing unit 7, which is used to achieve synchronous cleaning of the array probes with the help of the movement of the probe testing unit 7. Such a design can optimize the detection site during detection and reduce the interference of external dust.

[0021] It should be noted that the testing platform 4 is made of high-strength aluminum alloy, and its surface is anodized, which not only ensures the flatness of the platform, but also has excellent wear resistance.

[0022] For further information, see Figure 3 The material moving unit 3 includes a material moving cylinder 31, a shift fixing plate 32, an L-shaped connecting plate 33, a material grabbing assembly 34, a connecting rod 35, a first slider 36 and a first guide rail 37. The material moving cylinder 31 is installed on the top inner side of the supporting frame 2. Two L-shaped connecting plates 33 are provided. The bottom of the L-shaped connecting plate 33 is slidably connected to the first guide rail 37 through the first slider 36. The first guide rail 37 is fixed to the top of the supporting frame 2. The telescopic end of the material moving cylinder 31 is fixedly connected to one of the L-shaped connecting plates 33 through the shift fixing plate 32. The two L-shaped connecting plates 33 are fixedly connected by a connecting rod 35. One end of the material grabbing assembly 34 is fixedly connected to the L-shaped connecting plate 33.

[0023] The principle of transferring the circuit board by the material transfer unit 3 is as follows: when the circuit board stays at the discharge end of the plate chain conveyor 1, the piston rod of the material transfer cylinder 31 extends to move the grabbing assembly 34 on one side to the two sides of the circuit board, while the grabbing assembly 34 on the other side just stays on the inspection table 4. If there is a circuit board on the inspection table 4, the two groups of grabbing assemblies 34 work together to load and unload the circuit board synchronously.

[0024] For further information, see Figure 4 The material grabbing assembly 34 includes a fixed frame 341, a first driving cylinder 342, a gripping frame 343, a first rack 344, a first gear 345, a second rack 346, a first gripper fixing seat 347, a material transfer gripper 348 and a second gripper fixing seat 349. The fixed frame 341 is fixedly connected to the L-shaped connecting plate 33, the first driving cylinder 342 is fixed to the inner side of the fixed frame 341, the gripping frame 343 is fixedly connected to the end of the fixed frame 341, the first rack 344 is fixed to the telescopic end of the first driving cylinder 342, and the first rack 344 The first gear 345 is transmission connected to the second rack 346, the first gear 345 is rotationally connected to the clamping frame 343 through a bearing, the first rack 344 and the second rack 346 are both slidingly connected to the clamping frame 343, the first gripper fixing seat 347 is fixed to one end of the first rack 344, the second gripper fixing seat 349 is fixed to one end of the second rack 346, and a material moving gripper 348 is fixed on the same side of the first gripper fixing seat 347 and the second gripper fixing seat 349, and a clamping groove 3410 is provided at the end of the material moving gripper 348.

[0025] The principle of the material grabbing assembly 34 clamping the circuit board is: the material moving cylinder 31 moves the material moving gripper 348 to the discharge end of the plate chain conveyor 1, and then the first driving cylinder 342 drives the first rack 344 to move, and the first rack 344 drives the first gear 345 to rotate, and then drives the second rack 346 to move, which will drive the first rack 344 and the second rack 346 to move closer to each other, and then drive the two material moving grippers 348 to move closer to each other, so that the clamping grooves 3410 on both sides clamp the side walls of the circuit board.

[0026] For further information, see Figure 5The switching unit 5 includes a second driving cylinder 51, a second guide rail 52, a movable plate 53, a second slider 54, a cylinder support frame 55, a guide rail connecting plate 56, a camera fixing plate 57 and a probe assembly fixing plate 58. The second driving cylinder 51 is fixedly connected to the guide rail connecting plate 56 through the cylinder support frame 55, the telescopic end of the second driving cylinder 51 is fixedly connected to the top of the movable plate 53, the camera fixing plate 57 and the probe assembly fixing plate 58 are respectively fixed at both ends of the movable plate 53, the second guide rail 52 is fixed to the top of the guide rail connecting plate 56, and the distal ends of the guide rail connecting plate 56 are fixed to the detection platform 4 and the support frame 2. The bottom of the movable plate 53 is slidably connected to the second guide rail 52 through the second slider 54, the visual camera 6 is fixed to the bottom of the camera fixing plate 57, and the probe testing unit 7 is installed at the bottom of the probe assembly fixing plate 58.

[0027] The principle of the switching unit 5 driving the visual camera 6 and the probe test unit 7 to switch between the two operations is as follows: first, the visual camera 6 takes photos to detect appearance defects on the circuit board. After the detection, the telescopic end of the second driving cylinder 51 is shortened and drives the movable plate 53 to move to one side, thereby driving the visual camera 6 to shift to one side, and the probe test unit 7 moves to the top of the circuit board. After that, the conductivity, insulation and other parameters of the circuit board are tested by the probe test unit 7. In this way, the circuit board will complete electrical performance detection and complete defect detection at the same time under the same device.

[0028] It should be noted that the visual camera 6 used in this solution uses an image acquisition system to capture all-round images of the circuit board, and uses image processing algorithms to detect the appearance of the circuit board, including the size, shape, location and shape of solder joints, and circuit integrity of the circuit board.

[0029] For further information, see Figure 7 The probe testing unit 7 includes a lifting cylinder 71, a lifting plate 72, a probe fixing plate 73 and a buffer air column 74. The lifting cylinder 71 is fixed to the bottom of the probe assembly fixing plate 58. The lifting plate 72 is fixedly connected to the telescopic end of the lifting cylinder 71. The top of the probe fixing plate 73 is connected to the lifting plate 72 through four buffer air columns 74. A probe array is distributed at the bottom of the probe fixing plate 73. The probe cleaning unit 11 is arranged on one side of the lifting plate 72. The input end of the camera dustproof unit 10 is fixed to the top of the lifting plate 72.

[0030] The principle of electrical performance testing of the circuit board: the lifting plate 72 is driven downward by the lifting cylinder 71, and the probe fixing plate 73 is driven downward. Since a high-precision probe array is provided below the probe fixing plate 73, these probes and the lifting plate 72 are connected by a buffer gas column 74, which has a certain elasticity. During testing, the downward moving probe can accurately contact the solder joints and circuits on the circuit board. At the same time, the elastic material can ensure stable contact to avoid damage to the circuit board. The detection probe establishes contact with the solder joints and circuits on the circuit board, and applies specific voltage and current signals to the circuit board, thereby detecting the electrical performance parameters of the circuit board such as conductivity, insulation and resistance.

[0031] For further information, see Fig.10 and Fig.11 The material distribution unit 8 includes a material distribution frame 81, a material distribution conveyor 82, a first material distribution chute 83, a second material distribution chute 84, a material distribution baffle 85 and a rotary cylinder 86. The material distribution conveyor 82 is installed on one side of the material distribution frame 81. The first material distribution chute 83 and the second material distribution chute 84 are both inclined. The first material distribution chute 83 and the second material distribution chute 84 are connected by a partition. The tops of the first material distribution chute 83 and the second material distribution chute 84 are both connected to one side of the material distribution conveyor 82. One end of the partition is rotatably connected to the material distribution baffle 85. The rotary cylinder 86 is fixedly installed at the bottom of the first material distribution chute 83 and its output end is fixedly connected to the material distribution baffle 85.

[0032] The principle of sorting the circuit boards is as follows: the gripping assembly 34 transfers the inspected circuit boards to the top of the sorting conveyor 82 and then releases them. The circuit boards fall onto the sorting conveyor 82 and are transported forward. If the circuit boards pass the inspection, the sorting baffle 85 turns to the right, and the qualified circuit boards slide down the first sorting chute 83 for storage. If the circuit boards fail the inspection, the sorting baffle 85 turns to the left, and the unqualified circuit boards slide down the second sorting chute 84 for storage.

[0033] It should be noted that: this solution also has a control system (not shown in the figure). The system uses an advanced industrial computer as the control core and is equipped with independently developed detection software. The system can automatically control the detection process, including the setting of detection parameters, data collection, analysis and processing, and output of results; that is, after the detection is completed, the control system will analyze and process the collected electrical performance data and image data, and compare them with the preset standard parameters to determine whether the circuit board is qualified; if unqualified products are found, the system will automatically record the relevant data, give specific fault information, and then send a signal to the rotary cylinder 86 to control the direction of rotation of the material distribution baffle 85.

[0034] Example 2: Please refer to Figure 7 and Fig.13This embodiment further explains the first embodiment, and the difference lies in that a camera dustproof unit 10 is added to effectively clean the dirt on the outside of the lens of the visual camera 6.

[0035] Specifically, the camera dustproof unit 10 includes a linkage plate 101, a third rack 102, a third gear 103, a linkage shaft 104, a fourth gear 105, a fourth rack 106, a first brush connecting plate 107 and a camera dust brush 108. The bottom end of the linkage plate 101 is fixed to the lifting plate 72, the third rack 102 is fixed to the top of the linkage plate 101, the third gear 103 is meshed with the third rack 102, the third gear 103 and the fourth gear 105 are respectively fixedly sleeved on both ends of the linkage shaft 104, the linkage shaft 104 is rotatably connected to the moving plate 53 through a bearing seat, the fourth gear 105 is meshed with the fourth rack 106, the top of the first brush connecting plate 107 is fixedly connected to the fourth rack 106 through a connecting column, the camera dust brush 108 is fixedly connected to the first brush connecting plate 107, and the upper side of the brush surface of the camera dust brush 108 is higher than the bottom surface of the lens of the visual camera 6.

[0036] Principle of cleaning the camera: when the lifting plate 72 moves downward, it will drive the third rack 102 to move downward, thereby driving the third gear 103, the linkage shaft 104 and the fourth gear 105 to rotate, and the fourth gear 105 drives the fourth rack 106 to move, and then drives the camera dust brush 108 to move through the first brush connecting plate 107. During the electrical test, the linkage can be triggered to automatically maintain the lens of the visual camera 6, and after the electrical test is completed, the lifting plate 72 moves up, and finally drives the camera dust brush 108 to move again, so as to further clean the lens of the visual camera 6 without manual intervention.

[0037] At the same time, it is worth noting that a sliding groove 1061 is opened on the fourth rack 106, and a sliding column 1062 is slidably connected in the sliding groove 1061. A fixed block 1063 is fixed to one end of the sliding column 1062. The sliding column 1062 is fixed to the top of the movable plate 53 through a fixed plate. When the fourth rack 106 moves, the sliding column 1062 will produce relative movement with the fourth rack 106 in the sliding groove 1061, so that the fourth rack 106 will be more stable and reliable when moving.

[0038] Example 3: Please refer to Figure 8 and Fig. 9 This embodiment further illustrates other embodiments, and the difference lies in that a probe cleaning unit 11 is added to effectively clean the probe assembly after the detection is completed.

[0039] Specifically, the probe cleaning unit 11 includes a cylindrical cam rod 111, a fifth gear 112, a slide 113, a second brush connecting plate 114, a probe cleaning brush 115, a third slider 116, a third guide rail 117, a guide frame 118 and teeth 119. Both sides of the cylindrical cam rod 111 are rotatably connected to the lifting plate 72 through bearing seats, both ends of the cylindrical cam rod 111 are fixedly sleeved with the fifth gear 112, the slide 113 is sleeved on the outer side of the cylindrical cam rod 111, one side of the slide 113 is fixedly connected to the probe cleaning brush 115 through the second brush connecting plate 114, the third slider 116 is fixed to the bottom of the slide 113, the third guide rail 117 is fixed on the lifting plate 72 and is slidably connected to the third slider 116, the top of the guide frame 118 is fixedly connected to the movable plate 53, and the teeth 119 are evenly distributed on one side of the bottom of the guide frame 118 and are meshed with the fifth gear 112.

[0040] Principle of cleaning the probe assembly: when the lifting plate 72 moves from top to bottom, the fifth gear 112 will rotate under the action of the teeth 119 of the guide frame 118, and the fifth gear 112 will drive the cylindrical cam rod 111 to rotate, thereby driving the slide 113 to move from one side of the cylindrical cam rod 111 to the other side, driving the probe cleaning brush 115 to move under the probe, and the probe cleaning brush 115 will clean the end of the probe before the probe is tested, so as to keep the probe clean. In addition, when the lifting plate 72 moves from bottom to top, the cylindrical cam rod 111 will drive the slide 113 to move from one side to the other side, and clean the probe again.

[0041] Example 4: Please refer to Fig.12 This embodiment further illustrates other embodiments, the difference being that a clamping unit 9 is added to effectively clamp circuit boards of different sizes.

[0042] Specifically, the clamping unit 9 includes a left clamping cylinder 91, a left clamping plate 92, a right clamping cylinder 93, a right clamping plate 94 and a material table 95. The left clamping cylinder 91 and the right clamping cylinder 93 are symmetrically distributed on both sides of the detection table 4. The left clamping plate 92 is fixedly connected to the telescopic end of the left clamping cylinder 91, and the right clamping plate 94 is fixedly connected to the telescopic end of the right clamping cylinder 93. A groove 41 is opened on the top of the detection table 4, and the material table 95 is arranged at the center position of the groove 41.

[0043] Specifically, the material grabbing assembly 34 places the circuit board on the material table 95 of the inspection table 4, and then starts the left clamping cylinder 91 and the right clamping cylinder 93 at the same time, driving the left clamping plate 92 and the right clamping plate 94 to move closer to each other, and then stably clamp the circuit board after the two clamping plates come into contact with the circuit board. The distance between the two clamping plates can be automatically adjusted to adapt to the clamping operation of circuit boards of different sizes.

[0044] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device.

[0045] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A detection device for a computer circuit board, comprising: A plate chain conveyor (1) for conveying computer circuit boards one by one, wherein a support frame (2) is provided on one side of the plate chain conveyor (1); It is characterized by further comprising: A material transfer unit (3) is installed on the support frame (2); a detection platform (4) is provided at the discharge end of the plate chain conveyor (1); a switching unit (5) is provided above the detection platform (4); a visual camera (6) and a probe test unit (7) are installed on the switching unit (5); the switching unit (5) is used to move the visual camera (6) and the probe test unit (7) in sequence to the top of the detection platform (4) for detection; a material distribution unit (8) is provided on the side of the detection platform (4) away from the plate chain conveyor (1); and a clamping unit (9) is also provided on the detection platform (4); A camera dustproof unit (10) is installed on one side of the switching unit (5) for removing dust from the visual camera (6), and a probe cleaning unit (11) is installed on the probe testing unit (7) for achieving synchronous cleaning of the array probes by means of the movement of the probe testing unit (7).

2. A computer circuit board detection device according to claim 1, characterized in that: The material shifting unit (3) comprises a material shifting cylinder (31), a shifting fixed plate (32), an L-shaped connecting plate (33), a material grabbing assembly (34), a connecting rod (35), a first slider (36) and a first guide rail (37). The material shifting cylinder (31) is mounted on the inner side of the top of the support frame (2). Two L-shaped connecting plates (33) are provided. The bottom of the L-shaped connecting plate (33) is slidably connected to the first guide rail (37) via the first slider (36). The first guide rail (37) is fixed to the top of the support frame (2). The telescopic end of the material shifting cylinder (31) is fixedly connected to one of the L-shaped connecting plates (33) via the shifting fixed plate (32). The two L-shaped connecting plates (33) are fixedly connected via the connecting rod (35). One end of the material grabbing assembly (34) is fixedly connected to the L-shaped connecting plate.

3. A computer circuit board detection device according to claim 2, characterized in that: The material grabbing assembly (34) comprises a fixed frame (341), a first driving cylinder (342), a gripping frame (343), a first rack (344), a first gear (345), a second rack (346), a first gripper fixing seat (347), a material transfer gripper (348) and a second gripper fixing seat (349), wherein the fixed frame (341) is fixedly connected to the L-shaped connecting plate (33), the first driving cylinder (342) is fixed to the inner side of the fixed frame (341), the gripping frame (343) is fixedly connected to the end of the fixed frame (341), the first rack (344) is fixed to the telescopic end of the first driving cylinder (342), the first rack (344) and the The second rack (346) is transmission-connected via the first gear (345); the first gear (345) is rotationally connected to the gripping frame (343) via a bearing; the first rack (344) and the second rack (346) are both slidably connected to the gripping frame (343); the first gripper fixing seat (347) is fixed to one end of the first rack (344); the second gripper fixing seat (349) is fixed to one end of the second rack (346); a material transfer gripper (348) is fixed to the same side of the first gripper fixing seat (347) and the second gripper fixing seat (349); a clamping groove (3410) is provided at the end of the material transfer gripper (348).

4. A computer circuit board detection device according to claim 1, characterized in that: The switching unit (5) comprises a second driving cylinder (51), a second guide rail (52), a moving plate (53), a second slider (54), a cylinder support frame (55), a guide rail connecting plate (56), a camera fixing plate (57) and a probe assembly fixing plate (58); the second driving cylinder (51) is fixedly connected to the guide rail connecting plate (56) via the cylinder support frame (55); the telescopic end of the second driving cylinder (51) is fixedly connected to the top of the moving plate (53); the camera fixing plate (57) and the probe assembly are fixedly connected to each other. The plates (58) are respectively fixed at both ends of the movable plate (53), the second guide rail (52) is fixed on the top of the guide rail connecting plate (56), the distal ends of the guide rail connecting plate (56) are fixed to the detection table (4) and the support frame (2), the bottom of the movable plate (53) is slidably connected to the second guide rail (52) through the second slider (54), the visual camera (6) is fixed to the bottom of the camera fixing plate (57), and the probe test unit (7) is installed at the bottom of the probe assembly fixing plate (58).

5. A computer circuit board detection device according to claim 4, characterized in that: The probe test unit (7) comprises a lifting cylinder (71), a lifting plate (72), a probe fixing plate (73) and a buffer gas column (74); the lifting cylinder (71) is fixed to the bottom of the probe assembly fixing plate (58); the lifting plate (72) is fixedly connected to the telescopic end of the lifting cylinder (71); the top of the probe fixing plate (73) is connected to the lifting plate (72) via four buffer gas columns (74); a probe array is distributed at the bottom of the probe fixing plate (73); the probe cleaning unit (11) is arranged on one side of the lifting plate (72); and the input end of the camera dustproof unit (10) is fixed to the top of the lifting plate (72).

6. A computer circuit board detection device according to claim 5, characterized in that: The camera dustproof unit (10) comprises a linkage plate (101), a third rack (102), a third gear (103), a linkage shaft (104), a fourth gear (105), a fourth rack (106), a first brush connecting plate (107) and a camera dust-sweeping brush (108), wherein the bottom end of the linkage plate (101) is fixed to the lifting plate (72), the third rack (102) is fixed to the top of the linkage plate (101), the third gear (103) is meshedly connected to the third rack (102), and the third gear (103) and the fourth rack (106) are connected to each other. The gears (105) are respectively fixedly sleeved on both ends of the linkage shaft (104); the linkage shaft (104) is rotationally connected to the movable plate (53) via a bearing seat; the fourth gear (105) is meshingly connected to the fourth rack (106); the top of the first brush connecting plate (107) is fixedly connected to the fourth rack (106) via a connecting column; the camera dust-sweeping brush (108) is fixedly connected to the first brush connecting plate (107); and the upper side of the brush surface of the camera dust-sweeping brush (108) is higher than the bottom surface of the lens of the visual camera (6).

7. A computer circuit board detection device according to claim 5, characterized in that: The probe cleaning unit (11) comprises a cylindrical cam rod (111), a fifth gear (112), a slide seat (113), a second brush connecting plate (114), a probe cleaning brush (115), a third slider (116), a third guide rail (117), a guide frame (118) and teeth (119). Both sides of the cylindrical cam rod (111) are rotatably connected to the lifting plate (72) via a bearing seat. Both ends of the cylindrical cam rod (111) are fixedly sleeved with the fifth gear (112). The slide seat (113) is sleeved on the cylindrical cam rod (111). ), one side of the slide seat (113) is fixedly connected to the probe cleaning brush (115) through the second brush connecting plate (114), the third slider (116) is fixed to the bottom of the slide seat (113), the third guide rail (117) is fixed on the lifting plate (72) and is slidably connected to the third slider (116), the top of the guide frame (118) is fixedly connected to the movable plate (53), and the teeth (119) are evenly distributed on one side of the bottom of the guide frame (118) and are meshedly connected to the fifth gear (112).

8. A computer circuit board detection device according to claim 1, characterized in that: The material distribution unit (8) comprises a material distribution frame (81), a material distribution conveyor (82), a first material distribution slide (83), a second material distribution slide (84), a material distribution baffle (85) and a rotary cylinder (86); the material distribution conveyor (82) is installed on one side of the material distribution frame (81); the first material distribution slide (83) and the second material distribution slide (84) are both inclined; the first material distribution slide (83) and the second material distribution slide (84) are connected by a partition; the tops of the first material distribution slide (83) and the second material distribution slide (84) are both connected to one side of the material distribution conveyor (82); one end of the partition is rotatably connected to the material distribution baffle (85); the rotary cylinder (86) is fixedly installed at the bottom of the first material distribution slide (83) and an output end thereof is fixedly connected to the material distribution baffle (85).

9. A computer circuit board detection device according to claim 1, characterized in that: The clamping unit (9) comprises a left clamping cylinder (91), a left clamping plate (92), a right clamping cylinder (93), a right clamping plate (94) and a material table (95); the left clamping cylinder (91) and the right clamping cylinder (93) are symmetrically distributed on both sides of the detection table (4); the left clamping plate (92) is fixedly connected to the telescopic end of the left clamping cylinder (91); the right clamping plate (94) is fixedly connected to the telescopic end of the right clamping cylinder (93); a groove (41) is provided on the top of the detection table (4); and the material table (95) is arranged at the center of the groove (41).

10. A computer circuit board detection device according to claim 6, characterized in that: The fourth rack (106) is provided with a sliding groove (1061), a sliding column (1062) is slidably connected in the sliding groove (1061), a fixing block (1063) is fixed to one end of the sliding column (1062), and the sliding column (1062) is fixed to the top of the movable plate (53) through the fixing plate.