A rapid calibration method and device suitable for analog devices

Abstract

The present invention belongs to the field of device calibration technology and discloses a rapid calibration method and apparatus suitable for analog devices. The method comprises: constructing an initial simulation model corresponding to a reference analog device, and iteratively optimizing the initial simulation model to obtain a standard simulation model; inputting a step signal into the analog device to be calibrated to obtain step response data at any two moments within a first preset time window; obtaining an actual gain speed based on the step response data at any two moments, and determining that the actual gain speed is not within a preset gain speed range, then determining that the analog device to be calibrated is an abnormal device; conversely, inputting the step response data at the several moments into a standard simulation model, and introducing an oscillation frequency equation to obtain a target simulation model corresponding to the analog device to be calibrated; and determining an actual calibration range based on the prediction of the target simulation model. The present invention greatly shortens the time cost of calibration.

Description

Technical Field

[0001] The present invention relates to the technical field of device calibration, and in particular to a rapid calibration method and device suitable for analog devices. Background Art

[0002] Analog devices are a general term for components that use continuously changing analog signals as output signals. Calibration of various analog devices before leaving the factory is the key to ensuring that their output signals are accurate and reliable in actual applications.

[0003] The specific process of calibrating analog devices in the existing technology is: first, a step signal from the self-calibration equipment is obtained as a test signal and input into the analog device to be calibrated; second, the step response of the analog device to be calibrated is detected, and based on the corresponding step response curve, it is judged that when the response output reaches a stable state, the corresponding actual high point value and actual low point value are obtained to determine the actual range; finally, the actual range is compared with the standard range, and the actual range is compensated based on the comparison result to achieve calibration.

[0004] However, in actual calibration, existing calibration methods require waiting for the analog device output to reach a stable state before measuring. Most analog devices, affected by internal characteristics or environmental factors, often require a long time to reach a stable state, especially for high-value outputs. This results in a long calibration cycle. In particular, the time delay caused by waiting for stable values accumulates with the number of calibration attempts during large-scale production calibration or multi-system parallel calibration, significantly increasing the time cost of calibration. Summary of the Invention

[0005] The present invention aims to provide a rapid calibration method and device suitable for analog devices to solve the technical problem of long calibration time in the existing calibration process.

[0006] To achieve the above objectives, the present invention proposes the following technical solutions:

[0007] In a first aspect, the present technical solution provides a rapid calibration method applicable to analog devices, comprising:

[0008] constructing an initial simulation model corresponding to a reference analog device based on the transfer function, and iteratively optimizing the initial simulation model until a difference between a simulated response value of the initial simulation model and an actual response value of the reference analog device is less than a preset difference threshold, thereby obtaining a standard simulation model;

[0009] The reference analog device is a standard device corresponding to the analog device to be calibrated. In the process of building the initial simulation model, the damping ratio, natural frequency, transmission delay and system gain are used as model parameters of the initial simulation model, pulse excitation and step excitation are used as input signals of the initial simulation model, and a Kalman filter algorithm is introduced to preprocess the output signal to obtain the final response signal.

[0010] Inputting a step signal to the analog device to be calibrated obtains step response data at any number of moments within a first preset time window; wherein the first preset time window is a time window starting from the response start moment and in a rising phase;

[0011] Acquiring an actual gain speed based on the step response data at the plurality of moments, and then determining that the actual gain speed is not within a preset gain speed range, determining that the analog device to be calibrated is an abnormal device, and ending calibration of the analog device to be calibrated;

[0012] If it is determined that the actual gain speed is within a preset gain speed range, the step response data at the plurality of moments are input into the standard simulation model, and an oscillation frequency equation is introduced to obtain a target simulation model corresponding to the analog device to be calibrated;

[0013] Based on the target simulation model, the low point occurrence time point and the corresponding low point value, the high point occurrence time point and the corresponding high point value of the analog device to be calibrated are predicted to determine the calibration range.

[0014] Furthermore, the method of predicting the low point occurrence time point and the corresponding low point value, the high point occurrence time point and the corresponding high point value of the analog device to be calibrated based on the target simulation model to determine the calibration range includes:

[0015] When it is determined that the preset verification period has been reached, a number of actual step response data within a second preset time window is obtained based on the analog device to be calibrated, and corresponding predicted step response data is obtained based on the target simulation model; wherein the second preset time window is any time window after the actual response of the analog device to be calibrated is stable;

[0016] When it is determined that the difference between any actual step response data and the corresponding predicted step response data is greater than a preset response difference threshold, the standard simulation model is optimized again.

[0017] Furthermore, the method of constructing an initial simulation model corresponding to a reference analog device based on the transfer function and iteratively optimizing the initial simulation model until the difference between the simulated response value of the initial simulation model and the actual response value of the reference analog device is less than a preset difference threshold to obtain a standard simulation model includes:

[0018] When the reference analog device is a second-order system, the corresponding response equation is:

[0019]

[0020] Where ζ is the damping ratio, wn is the natural frequency, t is the time, and φ = arccos(ζ).

[0021] Furthermore, if it is determined that the actual gain speed is within a preset gain speed range, the step response data at the plurality of moments are input into the standard simulation model, and an oscillation frequency equation is introduced to obtain a target simulation model corresponding to the analog device to be calibrated; including:

[0022] Obtain the step response data at any two moments and substitute them into the response equation to obtain the attenuation signal function of a set of analog devices to be calibrated:

[0023]

[0024] Where, (t1, Y1) is the step response data at an arbitrary time, t1 is the time point, and Y1 is the response value corresponding to the time point t1; (t2, Y2) is the step response data at another arbitrary time, t2 is the time point, and Y2 is the response value corresponding to the time point t2;

[0025] The ratio of the attenuation signal functions of the set of analog devices to be calibrated is solved to eliminate the phase angle, and an intermediate attenuation signal function of the analog device to be calibrated is obtained as follows:

[0026]

[0027] in,

[0028] Introduce the oscillation frequency equation of the analog device to be calibrated in the step response The intermediate attenuation signal function is connected in parallel to obtain the damping ratio and the natural frequency;

[0029] Among them, w d is the oscillation frequency, which is estimated from the peak interval in the step response signal.

[0030] Furthermore, after predicting the low point occurrence time point and the corresponding low point value, the high point occurrence time point and the corresponding high point value of the analog device to be calibrated based on the target simulation model to determine the calibration range:

[0031] If the analog device to be calibrated is an abnormal device, or the determined calibration range exceeds the expected tolerance range, a device fault report is generated and sent to the control end; wherein the device fault report includes: detection time, detection data, device number, and fault type; wherein the fault type includes: output deviation, overshoot, oscillation, and no response;

[0032] If the determined calibration range does not exceed the expected tolerance range, it is compensated.

[0033] In a second aspect, the present technical solution provides a rapid calibration device suitable for analog devices, comprising:

[0034] A first construction module is configured to construct an initial simulation model corresponding to a reference analog device based on a transfer function, and iteratively optimize the initial simulation model until a difference between a simulated response value of the initial simulation model and an actual response value of the reference analog device is less than a preset difference threshold, thereby obtaining a standard simulation model;

[0035] The reference analog device is a standard device corresponding to the analog device to be calibrated. In the process of building the initial simulation model, the damping ratio, natural frequency, transmission delay and system gain are used as model parameters of the initial simulation model, pulse excitation and step excitation are used as input signals of the initial simulation model, and a Kalman filter algorithm is introduced to preprocess the output signal to obtain the final response signal.

[0036] A first acquisition module is configured to input a step signal to the analog device to be calibrated to obtain step response data at a plurality of moments within a first preset time window; wherein the first preset time window is a time window starting from the response start moment and in a rising phase;

[0037] a first judgment module, configured to obtain an actual gain speed based on the step response data at the plurality of moments, and further determine that if the actual gain speed is not within a preset gain speed range, determine that the analog device to be calibrated is an abnormal device, and terminate calibration of the analog device to be calibrated;

[0038] A second construction module is configured to determine if the actual gain speed is within a preset gain speed range, input the step response data at the plurality of moments into the standard simulation model, and introduce an oscillation frequency equation to obtain a target simulation model corresponding to the analog device to be calibrated;

[0039] The calibration prediction module is used to predict the low point occurrence time point and the corresponding low point value, the high point occurrence time point and the corresponding high point value of the analog device to be calibrated based on the target simulation model to determine the calibration range.

[0040] Further, including:

[0041] a second acquisition module, configured to acquire, upon determining that a preset verification period has been reached, a plurality of actual step response data within a second preset time window based on the analog device to be calibrated, and to acquire corresponding predicted step response data based on a target simulation model; wherein the second preset time window is any time window after the actual response of the analog device to be calibrated stabilizes;

[0042] The model updating module is used to re-optimize the standard simulation model when it is determined that the difference between any actual step response data and the corresponding predicted step response data is greater than a preset response difference threshold.

[0043] Further, including:

[0044] A second judgment module is configured to determine if the analog device to be calibrated is an abnormal device or if the determined calibration range exceeds an expected tolerance range, and then generate a device fault report and send it to the control terminal; wherein the device fault report includes: detection time, detection data, device number, and fault type; wherein the fault type includes: output deviation, overshoot, oscillation, and no response;

[0045] The third judgment module is used to judge that the determined calibration range does not exceed the expected tolerance range, and then compensate for it.

[0046] In a third aspect, the present technical solution provides an electronic device comprising at least one processor, wherein the processor is coupled to a memory, wherein a computer program is stored in the memory, and wherein the computer program is configured to execute the method described when executed by the processor.

[0047] In a fourth aspect, the present technical solution provides a computer-readable storage medium on which a computer program is stored, and the computer program implements the method when executed by a computer.

[0048] Beneficial effects:

[0049] It can be seen from the above technical solutions that the technical solution of the present invention provides a fast calibration method applicable to analog devices to solve the technical defect of high time cost in existing calibration methods.

[0050] Considering that existing calibration methods use the actual stable value as the detection target, and obtaining the stable value requires a long stabilization period, which increases the calibration time cost, this technical solution considers calibrating from the perspective of transient response to achieve the calibration goal of improving time efficiency.

[0051] Specifically, first, an initial simulation model corresponding to a reference analog device is constructed based on a transfer function, and the initial simulation model is iteratively optimized until the difference between the simulated response value of the initial simulation model and the actual response value of the reference analog device is less than a preset difference threshold to obtain a standard simulation model. The reference analog device is a standard device corresponding to the analog device to be calibrated. In order to improve the accuracy of the standard simulation model and effectively obtain dynamic characteristics to reduce the time cost of calibration, during the construction of the initial simulation model, the damping ratio, natural frequency, transfer delay, and system gain are used as model parameters of the initial simulation model, and pulse excitation and step excitation are used as input signals of the initial simulation model. A Kalman filter algorithm is introduced to preprocess the output signal to obtain the final response signal.

[0052] Secondly, a step signal is input to the analog device to be calibrated to obtain step response data at several moments within a first preset time window; wherein, the first preset time window is a time window starting from the response start moment and in the rising stage. At this time, the actual data acquisition process will start from the step response, that is, only two data points need to be collected; there is no need to wait for a stable value to appear. Then, in order to further reduce the time cost, the actual gain speed is obtained based on the step response data at the several moments, and then it is determined that the actual gain speed is not within the preset gain speed range, then the analog device to be calibrated is determined to be an abnormal device, and the calibration of the analog device to be calibrated is terminated. At this time, the continued calibration of the abnormal device can be terminated through the intermediate judgment of this step, thereby avoiding invalid time cost consumption.

[0053] Next, if the actual gain speed is determined to be within a preset gain speed range, the step response data at the plurality of time instants is input into the standard simulation model, and an oscillation frequency equation is introduced to obtain a target simulation model corresponding to the analog device to be calibrated. At this point, the time points at which low points occur and the corresponding low point values, as well as the time points at which high points occur and the corresponding high point values, of the analog device to be calibrated are predicted based on the target simulation model to determine a calibration range.

[0054] In summary, this technical solution constructs a standard simulation model to pre-model the dynamic behavior of the calibration system, and by collecting the transient response of the output, analyzes its changing trend within a relatively short time window, and then predicts the final stable output value of the corresponding analog device to be calibrated, without having to wait for the calibration system to be completely stable, thereby achieving the purpose of significantly shortening the time required for calibration.

[0055] It should be appreciated that all combinations of the foregoing concepts, as well as additional concepts described in greater detail below, to the extent such concepts are not mutually inconsistent, can be considered to be part of the inventive subject matter of this disclosure.

[0056] The foregoing and other aspects, embodiments, and features of the present invention will be more fully understood from the following description in conjunction with the accompanying drawings. Other additional aspects of the present invention, such as features and / or beneficial effects of the exemplary embodiments, will become apparent from the following description or through practice of specific embodiments according to the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0057] The accompanying drawings are not intended to be drawn to scale. In the drawings, each identical or nearly identical component shown in various figures may be represented by the same reference numeral. For the sake of clarity, not every component is labeled in every figure. Embodiments of various aspects of the present invention will now be described by way of example and with reference to the accompanying drawings, in which:

[0058] Figure 1 This is a flow chart of the rapid calibration method applicable to analog devices described in this embodiment;

[0059] Figure 2 Flowchart for obtaining target simulation model;

[0060] Figure 3 Flowchart for standard simulation model optimization;

[0061] Figure 4 Flowchart for post-calibration processing;

[0062] Figure 5 This is a structural block diagram of the rapid calibration device for analog devices according to this embodiment;

[0063] Figure 6 This is a structural block diagram of the electronic device described in this embodiment. DETAILED DESCRIPTION

[0064] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings of the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the described embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention. Unless otherwise defined, the technical terms or scientific terms used herein should be the common meanings understood by people with ordinary skills in the field to which the present invention belongs.

[0065] The words “first”, “second” and similar terms used in the specification and claims of this application do not indicate any order, quantity or importance, but are only used to distinguish different components. Similarly, unless the context clearly indicates otherwise, the singular forms of “a”, “an” or “the” and similar words do not indicate a quantitative limitation, but rather indicate the presence of at least one. Words such as “include” or “comprise” mean that the elements or objects appearing before “include” or “comprises” cover the features, wholes, steps, operations, elements and / or components listed after “include” or “comprises”, and do not exclude the existence or addition of one or more other features, wholes, steps, operations, elements, components and / or their collections. “Up”, “down”, “left”, “right” and the like are only used to indicate relative positional relationships. When the absolute position of the described object changes, the relative positional relationship may also change accordingly.

[0066] The goal of calibration is to find the output range of the analog device to be calibrated, including the high point and the low point, that is, the maximum output response value and the minimum output response value. In the traditional analog device calibration output deviation and overshoot, the analog device to be calibrated is usually driven by a step signal, and then the step response of the analog device to be calibrated is stabilized (that is, the response value is close to the stable value) before data acquisition is performed. However, due to internal characteristics or environmental factors (for example, for a second-order system with relatively low damping, due to oscillation and output deviation, overshoot phenomenon, the system needs a certain amount of time to reach a stable state) in the calibration of some analog devices, it may take a long time to stabilize, especially at the output high point. At the same time, this time delay will also accumulate, especially in situations where multiple calibrations are required, thereby greatly increasing the time cost of the overall calibration. Based on this, the present embodiment provides a fast calibration method suitable for analog devices to improve the above-mentioned technical defects.

[0067] The following is a detailed introduction to the rapid calibration method for analog devices according to this embodiment with reference to the accompanying drawings.

[0068] Combine Figure 1 As shown, the method includes the following steps:

[0069] Step S102: construct an initial simulation model corresponding to the reference analog device based on the transfer function, and iteratively optimize the initial simulation model until the difference between the simulation response value of the initial simulation model and the actual response value of the reference analog device is less than a preset difference threshold to obtain a standard simulation model.

[0070] In this embodiment, the reference analog device is a standard device corresponding to the analog device to be calibrated, and the specific modeling software used is MATLAB software.

[0071] During the specific implementation, the focus is on accurately modeling and optimizing the dynamic response from the following aspects:

[0072] During the modeling process, MATLAB is initially used to model the dynamic characteristics, typically using transfer functions or state-space models to describe the response characteristics. The modeling process focuses on key dynamic parameters such as the system's natural frequency, damping ratio, and response speed. These parameters directly affect the step response curve and, in turn, the system's output stability.

[0073] During the parameter tuning process, parameter identification methods such as the frequency response method or the least squares method are used, combined with the actual data of the system, to estimate the parameters in the model, and through repeated simulation, the model parameters are tuned to ensure that the simulation results match the actual measurement data to a certain degree of accuracy (specifically, in this embodiment, the error needs to be less than 5%).

[0074] During the simulation analysis and optimization process, common excitation signals such as step response and impulse response are used to observe the system's response under different excitation conditions, recording dynamic indicators such as system settling time and peak time. "Short response time, small overshoot, and high stability" are used as the criteria for dynamic response model optimization, with particular attention paid to the system's key characteristics during transient response. This allows for accelerated high-point calibration without compromising accuracy.

[0075] Specifically, the following model parameters are of interest: First, the damping ratio and natural frequency, which directly determine response speed and stability and are crucial for the accuracy of gain-speed measurements. Second, the propagation delay and system gain, which affect the system's output amplitude and response speed, can be used to adjust the system's response to approximate realistic dynamic characteristics. To reduce the impact of noise interference on model accuracy, a Kalman filter is used during modeling to filter out noise and eliminate its impact on signal quality.

[0076] As a specific implementation method, considering the universality of the second-order system (that is, higher-order systems can be simplified as second-order systems), the simulation process based on MATLAB software is as follows, taking the second-order system as an example:

[0077] Use MATLAB's Control System Toolbox to create the transfer function:

[0078] % Parameter definition

[0079] w n =1;% natural frequency

[0080] zeta=0.5;%damping ratio

[0081] % Create transfer function

[0082] num=[wn^2];% numerator

[0083] den=[1,2*zeta*wn,wn^2];% denominator

[0084] sys=tf(num,den); %Create transfer function object

[0085] Use the step() function to simulate a step response, or use the lsim() function to simulate the response of an arbitrary input signal.

[0086] a. Step response simulation:

[0087] % Step response simulation

[0088] figure;

[0089] step(sys);

[0090] title('Second-order system step response');

[0091] grid on;

[0092] b. Arbitrary input signal response simulation:

[0093] If you want to use a custom input signal (such as a sine wave or other signal), you can use the lsim() function:

[0094] % time vector

[0095] t=0:0.01:10; % 0 to 10 seconds, step length 0.01 second

[0096] %Custom input signal (such as sine wave)

[0097] input_signal = sin(2*pi*0.5*t); % 0.5Hz sine wave

[0098] %Simulation system response

[0099] figure;

[0100] lsim(sys,input_signal,t);

[0101] title('Response of a Second-Order System to a Sinusoidal Input Signal');

[0102] grid on.

[0103] Specifically, in the graphics window, you can see the response of the second-order system to the input signal. Depending on the damping ratio and natural frequency, the response characteristics of the system will be different. You can adjust wn and zeta values and observe the effect on the response.

[0104] If you need to export the results, you can use the saveas() function to save the graph:

[0105] saveas(gcf,'second_order_response.png').

[0106] Based on the above simulation process, when it is a second-order system, the response equation corresponding to the standard simulation model finally obtained in this embodiment is:

[0107]

[0108] Where ζ is the damping ratio, wn is the natural frequency, t is the time, and φ = arccos(ζ).

[0109] Step S104: input a step signal to the analog device to be calibrated to obtain step response data at any number of moments within a first preset time window.

[0110] In this embodiment, the step signal is automatically generated by an automatic test system controlled by a PLC or LabVIEW to achieve automated calibration. The first preset time window is a time window starting from the response start time and in the rising phase.

[0111] When the analog device to be calibrated is a second-order system, it is only necessary to obtain the step response data at any two moments.

[0112] Step S106: obtaining the actual gain speed based on the step response data at the several moments, and then determining that the actual gain speed is not within the preset gain speed range, determining that the analog device to be calibrated is an abnormal device, and ending the calibration of the analog device to be calibrated.

[0113] At this time, based on step S106 , the abnormal device can be pre-identified by the gain speed, and then the calibration is terminated, thereby avoiding unnecessary time consumption.

[0114] Step S108: If it is determined that the actual gain speed is within a preset gain speed range, the step response data at the plurality of moments are input into the standard simulation model, and an oscillation frequency equation is introduced to obtain a target simulation model corresponding to the analog device to be calibrated.

[0115] As a specific implementation method, Figure 2 As shown in FIG, when the analog device to be calibrated is a second-order system, the corresponding target simulation model acquisition process is:

[0116] Step S1082: Obtain step response data at any two moments, and substitute them into the response equation to obtain a set of attenuation signal functions of the analog devices to be calibrated:

[0117]

[0118] Wherein, (t1, Y1) is the step response data at an arbitrary time, t1 is the time point, and Y1 is the response value corresponding to time point t1; (t2, Y2) is the step response data at another arbitrary time, t2 is the time point, and Y2 is the response value corresponding to time point t2.

[0119] Step S1084: Calculate the ratio of the attenuation signal functions of the set of analog devices to be calibrated to eliminate the phase angle, and obtain an intermediate attenuation signal function of the analog device to be calibrated:

[0120]

[0121] in,

[0122] Step S1086: Introduce the oscillation frequency equation of the analog device to be calibrated in the step response The intermediate attenuation signal function is connected in parallel to obtain the damping ratio and the natural frequency.

[0123] Among them, w d is the oscillation frequency, which is estimated from the peak interval in the step response signal.

[0124] At this time, based on steps S1082 to S1086, the specific values of the parameters in the simulation model corresponding to the analog device to be calibrated can be obtained, thereby realizing the subsequent calibration range prediction. Specifically, continue with the following steps:

[0125] Step S110 : predicting the low point occurrence time point and the corresponding low point value, the high point occurrence time point and the corresponding high point value of the analog device to be calibrated based on the target simulation model to determine the calibration range.

[0126] As a preferred embodiment, in order to further improve the accuracy of the model and improve the accuracy of the obtained prediction calibration range, Figure 3 As shown, before step S110, the following steps are also included:

[0127] Step S1092: When it is determined that the preset verification period has been reached, a number of actual step response data within a second preset time window is obtained based on the analog device to be calibrated, and corresponding predicted step response data is obtained based on the target simulation model.

[0128] In a specific implementation, the second preset time window is any time window after the actual response of the analog device to be calibrated stabilizes.

[0129] Step S1094: When it is determined that the difference between any actual step response data and the corresponding predicted step response data is greater than a preset response difference threshold, the standard simulation model is optimized again.

[0130] At this time, the simulation model will be iteratively optimized based on steps S1092 to S1094, so that the accuracy of the model will be confirmed and optimized during the calibration process, thereby achieving an improvement in prediction accuracy.

[0131] Combine Figure 4 As shown, the following steps are also included to process the calibration results:

[0132] Step S1122: If the analog device to be calibrated is an abnormal device, or the determined calibration range exceeds the expected tolerance range, a device failure report is generated and sent to the control end.

[0133] In a specific implementation, the device fault report includes: detection time, detection data, device number, and fault type. Fault types include: output deviation, overshoot, oscillation, and no response. Output deviation refers to whether the steady-state output value is within the expected tolerance range; overshoot refers to whether the output response is greater than the maximum input value; oscillation refers to the presence of sustained oscillation; and no response refers to no output signal or a slow response.

[0134] Specifically, if the analog device to be calibrated is an abnormal device, step S1122 may be performed after step S106.

[0135] During the device fault report sending process, there will be an audible and visual alarm or interface prompt to facilitate relevant personnel to handle and confirm the abnormality as soon as possible, and the calibration will be terminated to avoid time consumption or damage to the calibration equipment or the analog device to be calibrated due to other reasons.

[0136] Step S1124: If the determined calibration range does not exceed the expected tolerance range, compensation is performed.

[0137] To facilitate traceability of the calibration process and support production decision-making, this embodiment automatically stores the large amount of test data generated in each stage in a local or cloud database for subsequent analysis and fault diagnosis. Specifically, the stored data includes time series data, gain speed, system oscillation count, steady-state value, overshoot amplitude, etc.

[0138] In summary, the method described in this embodiment predicts steady-state values through transient response measurements, avoiding lengthy waits for system output stabilization and significantly shortening calibration time. Furthermore, it automatically detects faults during testing, issuing warnings or automatically aborting the test to prevent further damage. Automatic storage of calibration and production data ensures data traceability and facilitates quality control and equipment maintenance.

[0139] The above program can be executed in a processor or stored in a memory (or computer-readable storage medium). Computer-readable media include permanent and non-permanent, removable and non-removable media that can implement information storage by any method or technology. Information can be computer-readable instructions, data structures, program modules, or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technology, compact disc read-only memory (CD-ROM), digital versatile disc (DVD) or other optical storage, magnetic cassettes, magnetic tape, disk storage or other magnetic storage devices, or any other non-transmission medium that can be used to store information that can be accessed by a computing device. As defined herein, computer-readable media does not include temporary computer-readable media such as modulated data signals and carrier waves.

[0140] These computer programs can also be loaded onto a computer or other programmable data processing device so that a series of operational steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for executing on the computer or other programmable device to implement the process. Figure 1 a process or multiple processes and / or boxes Figure 1 The steps of the functions specified in one or more blocks can be implemented by different modules corresponding to different steps.

[0141] This embodiment also provides a rapid calibration device suitable for analog devices. Figure 5 As shown, the device includes the following functional modules:

[0142] The first construction module is configured to construct an initial simulation model corresponding to a reference analog device based on the transfer function, and iteratively optimize the initial simulation model until the difference between the simulated response value of the initial simulation model and the actual response value of the reference analog device is less than a preset difference threshold to obtain a standard simulation model. The reference analog device is a standard device corresponding to the analog device to be calibrated. During the construction of the initial simulation model, the damping ratio, natural frequency, transfer delay, and system gain are used as model parameters of the initial simulation model, and pulse excitation and step excitation are used as input signals of the initial simulation model. A Kalman filter algorithm is introduced to preprocess the output signal to obtain the final response signal.

[0143] The first acquisition module is used to input a step signal to the analog device to be calibrated to obtain step response data at any two moments within a first preset time window; wherein the first preset time window is a time window that starts at the response start moment and is in a rising phase.

[0144] The first judgment module is used to obtain the actual gain speed based on the step response data at any two moments, and then determine that the actual gain speed is not within a preset gain speed range, then determine that the analog device to be calibrated is an abnormal device, and end the calibration of the analog device to be calibrated.

[0145] The second construction module is used to determine that the actual gain speed is within a preset gain speed range, input the step response data of any two moments into the standard simulation model, and introduce an oscillation frequency equation to obtain a target simulation model corresponding to the analog device to be calibrated.

[0146] The calibration prediction module is used to predict the low point occurrence time point and the corresponding low point value, the high point occurrence time point and the corresponding high point value of the analog device to be calibrated based on the target simulation model to determine the calibration range.

[0147] Since the device is constructed based on the method, it has been described above and will not be repeated here.

[0148] For example, the device further comprises:

[0149] The second acquisition module is used to determine that when a preset verification cycle is reached, obtain a number of actual step response data within a second preset time window based on the analog device to be calibrated, and obtain corresponding predicted step response data based on the target simulation model; wherein the second preset time window is any time window after the actual response of the analog device to be calibrated is stable.

[0150] The model updating module is used to re-optimize the standard simulation model when it is determined that the difference between any actual step response data and the corresponding predicted step response data is greater than a preset response difference threshold.

[0151] For another example, the device further includes:

[0152] The second judgment module is used to determine whether the analog device to be calibrated is an abnormal device, or the determined calibration range exceeds the expected tolerance range, and then generate a device fault report and send it to the control end; wherein, the device fault report includes: detection time, detection data, device number, fault type; wherein, the fault type includes: output deviation, overshoot, oscillation, and no response.

[0153] The third judgment module is used to judge that the determined calibration range does not exceed the expected tolerance range, and then compensate for it.

[0154] Combine Figure 6 As shown, this embodiment further provides an electronic device, including at least one processor, wherein the processor is coupled to a memory, wherein a computer program is stored in the memory, and the computer program is configured to execute the method when executed by the processor.

[0155] At the same time, a computer-readable storage medium is also provided, on which a computer program is stored. When the computer program is executed by a computer, the method described above is implemented.

[0156] Since the device, the electronic device and the computer-readable storage medium are all built based on the method or used to implement the method, they also have the technical advantage of greatly reducing the time cost of the calibration process in actual application.

[0157] While the present invention has been disclosed above with reference to preferred embodiments, this is not intended to limit the present invention. Persons skilled in the art will readily appreciate that various modifications and variations can be made without departing from the spirit and scope of the present invention. Therefore, the scope of protection of the present invention shall be determined by the claims.

Claims

1. A rapid calibration method for analog devices, characterized in that: include: constructing an initial simulation model corresponding to a reference analog device based on the transfer function, and iteratively optimizing the initial simulation model until a difference between a simulated response value of the initial simulation model and an actual response value of the reference analog device is less than a preset difference threshold, thereby obtaining a standard simulation model; The reference analog device is a standard device corresponding to the analog device to be calibrated. In the process of building the initial simulation model, the damping ratio, natural frequency, transmission delay and system gain are used as model parameters of the initial simulation model, pulse excitation and step excitation are used as input signals of the initial simulation model, and a Kalman filter algorithm is introduced to preprocess the output signal to obtain the final response signal. Inputting a step signal to the analog device to be calibrated obtains step response data at a plurality of moments within a first preset time window; wherein the first preset time window is a time window starting from the response start moment and in a rising phase; Acquiring an actual gain speed based on the step response data at the plurality of moments, and then determining that the actual gain speed is not within a preset gain speed range, determining that the analog device to be calibrated is an abnormal device, and ending calibration of the analog device to be calibrated; If it is determined that the actual gain speed is within a preset gain speed range, the step response data at the plurality of moments are input into the standard simulation model, and an oscillation frequency equation is introduced to obtain a target simulation model corresponding to the analog device to be calibrated; Based on the target simulation model, the low point occurrence time point and the corresponding low point value, the high point occurrence time point and the corresponding high point value of the analog device to be calibrated are predicted to determine the calibration range.

2. The rapid calibration method for analog devices according to claim 1, characterized in that: The step of predicting the low point occurrence time and the corresponding low point value, the high point occurrence time and the corresponding high point value of the analog device to be calibrated based on the target simulation model to determine the calibration range includes: When it is determined that the preset verification period has been reached, a number of actual step response data within a second preset time window is obtained based on the analog device to be calibrated, and corresponding predicted step response data is obtained based on the target simulation model; wherein the second preset time window is any time window after the actual response of the analog device to be calibrated is stable; When it is determined that the difference between any actual step response data and the corresponding predicted step response data is greater than a preset response difference threshold, the standard simulation model is optimized again.

3. The rapid calibration method for analog devices according to claim 1, characterized in that: The method comprises: constructing an initial simulation model corresponding to a reference analog device based on a transfer function, and iteratively optimizing the initial simulation model until a difference between a simulated response value of the initial simulation model and an actual response value of the reference analog device is less than a preset difference threshold to obtain a standard simulation model; When the reference analog device is a second-order system, the corresponding response equation is: in, is the damping ratio, wn is the natural frequency, t is the time, 4. The rapid calibration method for analog devices according to claim 3, characterized in that: The method comprises: if the actual gain speed is within a preset gain speed range, inputting the step response data at the plurality of moments into the standard simulation model, and introducing an oscillation frequency equation to obtain a target simulation model corresponding to the analog device to be calibrated; comprising: Obtain the step response data at any two moments and substitute them into the response equation to obtain the attenuation signal function of a set of analog devices to be calibrated: Where, (t1, Y1) is the step response data at an arbitrary time, t1 is the time point, and Y1 is the response value corresponding to the time point t1; (t2, Y2) is the step response data at another arbitrary time, t2 is the time point, and Y2 is the response value corresponding to the time point t2; The ratio of the attenuation signal functions of the set of analog devices to be calibrated is solved to eliminate the phase angle, and an intermediate attenuation signal function of the analog device to be calibrated is obtained as follows: in, Introduce the oscillation frequency equation of the analog device to be calibrated in the step response The intermediate attenuation signal function is connected in parallel to obtain the damping ratio and the natural frequency; Among them, w d is the oscillation frequency, which is estimated from the peak interval in the step response signal.

5. The rapid calibration method for analog devices according to claim 1, characterized in that: After predicting the low point occurrence time and the corresponding low point value, the high point occurrence time and the corresponding high point value of the analog device to be calibrated based on the target simulation model to determine the calibration range: If the analog device to be calibrated is an abnormal device, or the determined calibration range exceeds the expected tolerance range, a device fault report is generated and sent to the control end; wherein the device fault report includes: detection time, detection data, device number, and fault type; wherein the fault type includes: output deviation, overshoot, oscillation, and no response; If the determined calibration range does not exceed the expected tolerance range, it is compensated.

6. A rapid calibration device suitable for analog devices, characterized in that: include: A first construction module is configured to construct an initial simulation model corresponding to a reference analog device based on a transfer function, and iteratively optimize the initial simulation model until a difference between a simulated response value of the initial simulation model and an actual response value of the reference analog device is less than a preset difference threshold, thereby obtaining a standard simulation model; The reference analog device is a standard device corresponding to the analog device to be calibrated. In the process of building the initial simulation model, the damping ratio, natural frequency, transmission delay and system gain are used as model parameters of the initial simulation model, pulse excitation and step excitation are used as input signals of the initial simulation model, and a Kalman filter algorithm is introduced to preprocess the output signal to obtain the final response signal. A first acquisition module is configured to input a step signal to the analog device to be calibrated to obtain step response data at a plurality of moments within a first preset time window; wherein the first preset time window is a time window starting from the response start moment and in a rising phase; a first judgment module, configured to obtain an actual gain speed based on the step response data at the plurality of moments, and further determine that if the actual gain speed is not within a preset gain speed range, determine that the analog device to be calibrated is an abnormal device, and terminate calibration of the analog device to be calibrated; A second construction module is configured to determine if the actual gain speed is within a preset gain speed range, input the step response data at the plurality of moments into the standard simulation model, and introduce an oscillation frequency equation to obtain a target simulation model corresponding to the analog device to be calibrated; The calibration prediction module is used to predict the low point occurrence time point and the corresponding low point value, the high point occurrence time point and the corresponding high point value of the analog device to be calibrated based on the target simulation model to determine the calibration range.

7. The rapid calibration device for analog devices according to claim 6, characterized in that: include: a second acquisition module, configured to acquire, upon determining that a preset verification period has been reached, a plurality of actual step response data within a second preset time window based on the analog device to be calibrated, and to acquire corresponding predicted step response data based on a target simulation model; wherein the second preset time window is any time window after the actual response of the analog device to be calibrated stabilizes; The model updating module is used to re-optimize the standard simulation model when it is determined that the difference between any actual step response data and the corresponding predicted step response data is greater than a preset response difference threshold.

8. The rapid calibration device for analog devices according to claim 6, characterized in that: include: A second judgment module is configured to determine if the analog device to be calibrated is an abnormal device or if the determined calibration range exceeds an expected tolerance range, and then generate a device fault report and send it to the control terminal; wherein the device fault report includes: detection time, detection data, device number, and fault type; wherein the fault type includes: output deviation, overshoot, oscillation, and no response; The third judgment module is used to judge that the determined calibration range does not exceed the expected tolerance range, and then compensate for it.

9. An electronic device, characterized in that: The method comprises at least one processor coupled to a memory, wherein a computer program is stored in the memory, and the computer program is configured to execute the method according to any one of claims 1 to 5 when executed by the processor.

10. A computer-readable storage medium, characterized in that A computer program is stored thereon, and when the computer program is executed by a computer, the method according to any one of claims 1 to 5 is implemented.

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