Aging seat and method for testing IPM (Intelligent Power Module)

Abstract

The invention provides an aging seat for testing an IPM module, and the aging seat comprises a pedestal which is rectangular in an overhead view, and two cavities are formed in the two sides of the pedestal along the length direction; the first movable block and the second movable block are arranged in the two cavities respectively, and the first movable block and the second movable block can move back and forth in the corresponding cavities in the length direction; a plurality of first electrode clamps and a plurality of second electrode clamps, the plurality of first electrode clamps and the plurality of second electrode clamps are respectively arranged according to a preset layout, the first electrode clamps are arranged in the cavity of the first movable block, and the second electrode clamps are arranged in the cavity of the second movable block; the clamping mechanism is used for clamping a pin of the IPM module to be aged and is electrically connected with the testing mechanism; and the cover body is arranged on the upper side of the base, a plurality of insertion holes for the pins to be inserted are formed in the cover body, and the layout of the insertion holes is in one-to-one correspondence with the layout of the first electrode clamp and the second electrode clamp.

Description

Technical Field

[0001] The invention relates to the field of IPM production, and in particular to an aging seat and method for IPM module testing. Background Art

[0002] The IPM module integrates circuits or some components, etc. When powered on, these components are prone to aging, which in turn affects the life of the IPM module. Therefore, in actual production, the IPM module needs to be tested. During the test, a large current needs to be passed through and the aging of the IPM module needs to be observed regularly.

[0003] The existing burn-in sockets can usually only support the testing of one IPM module or electronic component. Special burn-in sockets are required for different IPM modules or electronic components, which increases the cost of use. Summary of the invention

[0004] The main purpose of the present invention is to provide an aging socket for IPM module testing to solve the above technical problems.

[0005] To achieve the above purpose, the technical solution adopted by the present invention is: an aging seat for IPM module testing, comprising:

[0006] The base is rectangular when viewed from above, and two cavities are formed on both sides of the base along the length direction;

[0007] A first movable block and a second movable block are respectively arranged in the two cavities, and the first movable block and the second movable block can move back and forth along the length direction in the corresponding cavity;

[0008] A plurality of first electrode clips and a plurality of second electrode clips, the plurality of first electrode clips and the plurality of second electrode clips are respectively arranged according to a predetermined layout, the first electrode clip is arranged in the cavity of the first movable block, and the second electrode clip is arranged in the cavity where the second movable block is located, and is used to clamp the pins of the IPM module to be aged and electrically connect to the test mechanism;

[0009] The cover body is arranged on the upper side of the base, and is provided with a plurality of insertion holes for inserting pins, and the layout of the insertion holes corresponds one-to-one to the layout of the first electrode clamp and the second electrode clamp.

[0010] Preferably, each of the first electrode clamps includes a conductive block and a conductive spring sheet, the conductive block and the conductive spring sheet are arranged along the length direction and there is a certain gap between the conductive block and the conductive spring sheet for placing the pins of the IPM module to be tested, and the conductive spring sheet is farther away from the second electrode clamp than the conductive block, the conductive spring sheet and the conductive block are fixed on the base and extend from the lower surface of the base for connecting to a testing mechanism, the conductive block and the conductive spring sheet are both conductive, the conductive spring sheet has a certain elasticity, and the upper end of the conductive spring sheet is inserted into the corresponding insertion hole.

[0011] Preferably, a first through hole is provided on the first movable block at a position corresponding to each first electrode clamp, and the first through hole is passed through the upper end of the first electrode clamp; when the first movable block moves along the length direction, it can push the conductive spring sheet toward the conductive block, thereby clamping the pin between the conductive spring sheet and the conductive block.

[0012] Preferably, the second electrode clamp is in an inverted H-shape with an opening facing upward, fixed on the base, and its lower end passes through the base; a second through hole is provided on the second movable block at a position corresponding to each second electrode clamp, and the upper end of the second electrode clamp passes upward from the second through hole.

[0013] Preferably, when viewed from above, mounting notches are provided on both sides of the base and the cover along the length direction, the aging seat also includes two operating handles, one end of each operating handle is located in the corresponding mounting notch and is rotatably connected to the base through a rotating shaft, and the operating handle can move back and forth between a first position and a second position; the operating handle is plate-shaped and the thickness of one end close to the rotating shaft is greater than the thickness of the end away from the rotating shaft, and when viewed along the axial direction of the rotating shaft, the two ends of the operating handle are arc-shaped; at least one return spring is provided in each cavity, the return spring is located on the side opposite to the corresponding first movable block or the second movable block and the corresponding operating handle, one end of the return spring abuts against the side wall of the cavity, and the other end abuts against the corresponding first movable block or the second movable block, and the return spring is always in a compressed state so that the first movable block or the second movable block always abuts against the corresponding operating handle, and when the operating handle is rotated, the operating handle can push the corresponding first movable block or the second movable block to move in a direction away from the corresponding rotating shaft so that the first movable block or the second movable block pushes the first electrode clamp or the second electrode clamp to clamp the pin.

[0014] Preferably, when the operating handle is in the first position, the operating handle is vertical, and the first electrode clamp and the second electrode clamp are in a loose state; when the operating handle is in the second position, the operating handle is horizontal, and the first electrode clamp and the second electrode clamp are in a clamped state.

[0015] Preferably, a positioning plane is provided at one end of the operating handle that cooperates with the first movable block or the second movable block. When the operating handle is located at the second position, the positioning plane just cooperates with the corresponding first movable block or the second movable block. At this time, when the operating handle is not subjected to external force, the operating handle always remains in the second position, and the first electrode clamp and the second electrode clamp always remain in a clamped state.

[0016] The present invention also provides a method for testing an IPM module, using the above-mentioned aging seat, and specifically comprising the following steps:

[0017] Step 1: Insert the pins of the IPM module to be tested into the corresponding insertion holes;

[0018] Step 2: operate the operating handle to move it from the first position to the second position, and the operating handle pushes the first movable block or the second movable block to move in a direction to clamp the first electrode clamp or the second electrode clamp to clamp the lead;

[0019] Step 3, connecting the lower ends of the first electrode clamp and the second electrode clamp to the testing mechanism;

[0020] Step 4: The testing organization tests the IPM module.

[0021] Compared with the prior art, the present invention has the following beneficial effects:

[0022] 1) The aging seat of the present invention has multiple insertion holes, which can be pre-designed according to requirements to meet the detection requirements of multiple IPM modules;

[0023] 2) The first electrode clamp of the present invention adopts a design in which the conductive block and the conductive spring are separated. In this way, the conductive block is designed to be larger in size and can be applied to scenarios with larger currents. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 is a stereogram of the present invention; Figure 2 It is a structural diagram of the present invention without the cover; Figure 3 It is a structural diagram of the bottom of the present invention; Figure 4 It is a structural diagram of the present invention without the cover body and the movable block; Figure 5 is a structural diagram of a first electrode clamp; Figure 6 is a structural diagram of the second electrode clamp; Figure 7 It is a cross-sectional view of the aging seat of the present invention. DETAILED DESCRIPTION

[0030] The following description is used to disclose the present invention so that those skilled in the art can implement the present invention. The preferred embodiments described below are only examples, and those skilled in the art may think of other obvious variations.

[0031] An aging seat for IPM module testing includes a base 1 and a cover 2. When viewed from above, the base 1 is rectangular. Two cavities are formed on both sides of the base 1 along the length direction. A first movable block 31 and a second movable block 32 are respectively arranged in the two cavities. The first movable block 31 and the second movable block 32 can move back and forth along the length direction in the corresponding cavity. The aging seat also includes a plurality of first electrode clips 4 and a plurality of second electrode clips 5. The plurality of first electrode clips 4 and the plurality of second electrode clips 5 are arranged according to a predetermined layout. The first electrode clip 4 is arranged in the cavity described by the first movable block 31, and the second electrode clip 5 is arranged in the cavity where the second movable block 32 is located. Each of the first electrode clips 4 includes a conductive block 41 and a conductive spring 42. The conductive block 41 and the conductive spring 42 are arranged along the length direction, and there is a certain gap between the conductive block 41 and the conductive spring 42 for placing the pins of the IPM module to be tested, and the conductive spring 42 is farther from the second electrode clip 5 than the conductive block 41. The conductive spring sheet 42 and the conductive block 41 are fixed on the base 1 and extend from the lower surface of the base 1 for connecting to a testing mechanism.

[0032] A first through hole 302 is provided on the first movable block 31 at a position corresponding to each first electrode clamp 4, and the upper end of the first electrode clamp 4 passes through the first through hole 302. When the first movable block 31 moves along the length direction, it can push the conductive spring 42 to move toward the conductive block 41, thereby clamping the pin between the conductive spring 42 and the conductive block 41. The conductive spring 42 has a certain elasticity.

[0033] The second electrode clamp 5 is in an inverted H shape, with its opening facing upward, fixed on the base 1, and its lower end passes through the base 1. A second through hole 303 is provided on the second movable block 32 at a position corresponding to each second electrode clamp 5, and the upper end of the second electrode clamp 5 passes upward from the second through hole 303.

[0034] The cover 2 is provided with an insertion hole 201 at a position corresponding to each first electrode clamp 4 and second electrode clamp 5 , and the conductive spring 42 and the upper end of the second electrode clamp 5 are inserted into the insertion hole 201 . The pins of the IPM module to be tested are inserted into the corresponding insertion holes 201 .

[0035] When viewed from above, mounting notches are provided on both sides of the base 1 and the cover 2 along the length direction, and the aging seat further comprises two operating handles 3, one end of each operating handle 3 is located in the corresponding mounting notch and is rotatably connected to the base 1 via a rotating shaft, and the operating handle 3 can move back and forth between a first position and a second position. The operating handle 3 is plate-shaped and the thickness of the end close to the rotating shaft is greater than the thickness of the end away from the rotating shaft. When viewed along the axial direction of the rotating shaft, the two ends of the operating handle 3 are arc-shaped. At least one reset spring (not shown) is arranged in each cavity, and the reset spring is located on the side opposite to the corresponding first movable block 31 or the second movable block 32 and the corresponding operating handle 3. One end of the reset spring abuts against the side wall of the cavity, and the other end abuts against the corresponding first movable block 31 or the second movable block 32. The reset spring is always in a compressed state so that the first movable block 31 or the second movable block 32 always abuts against the corresponding operating handle 3. When the operating handle 3 is rotated, the operating handle 3 can push the corresponding first movable block 31 or the second movable block 32 to move in a direction away from the corresponding rotating shaft so that the first movable block 31 or the second movable block 32 pushes the first electrode clamp 4 or the second electrode clamp 5 to clamp the pin.

[0036] When the operating handle 3 is in the first position, the operating handle 3 is in a vertical position, and the first electrode clamp 4 and the second electrode clamp 5 are in a loose state; when the operating handle 3 is in the second position, the operating handle 3 is in a horizontal state, and the first electrode clamp 4 and the second electrode clamp 5 are in a clamped state. A positioning plane is provided at one end of the operating handle 3 that cooperates with the first movable block 31 or the second movable block 32. When the operating handle 3 is in the second position, the positioning plane just cooperates with the corresponding first movable block 31 or the second movable block 32. At this time, when the operating handle 3 is not subjected to external force, the operating handle 3 will always remain in the second position, and the first electrode clamp 4 and the second electrode clamp 5 will always remain in a clamped state.

[0037] During the test, the pins of the IPM module are inserted into the corresponding insertion holes 201, and the operating handle 3 is operated to move the operating handle 3 to the second position. The operating handle 3 pushes the first movable block 31 and the second movable block 32 to move in the direction of clamping the pins by the first electrode clamp 4 and the second electrode clamp 5; the lower ends of the first electrode clamp 4 and the second electrode clamp 5 are electrically connected to the testing mechanism, and then the testing mechanism performs an aging test on the IPM module. The specific testing method is not the content to be protected by the present invention, and the existing technology can be used.

[0038] The above shows and describes the basic principles, main features and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The above embodiments and descriptions only describe the principles of the present invention. The present invention may be subject to various changes and improvements without departing from the spirit and scope of the present invention. These changes and improvements fall within the scope of the present invention. The scope of protection claimed by the present invention is defined by the attached claims and their equivalents.

Claims

1. An aging seat for IPM module testing, characterized in that: include: The base is rectangular when viewed from above, and two cavities are formed on both sides of the base along the length direction; A first movable block and a second movable block are respectively arranged in the two cavities, and the first movable block and the second movable block can move back and forth along the length direction in the corresponding cavity; A plurality of first electrode clips and a plurality of second electrode clips, the plurality of first electrode clips and the plurality of second electrode clips are respectively arranged according to a predetermined layout, the first electrode clip is arranged in the cavity of the first movable block, and the second electrode clip is arranged in the cavity where the second movable block is located, and is used to clamp the pins of the IPM module to be aged and electrically connect to the test mechanism; The cover body is arranged on the upper side of the base, and is provided with a plurality of insertion holes for inserting pins, and the layout of the insertion holes corresponds one-to-one to the layout of the first electrode clamp and the second electrode clamp.

2. The aging seat for IPM module testing according to claim 1, characterized in that: Each of the first electrode clamps includes a conductive block and a conductive spring sheet, the conductive block and the conductive spring sheet are arranged along the length direction and there is a certain gap between the conductive block and the conductive spring sheet for placing the pins of the IPM module to be tested, and the conductive spring sheet is farther away from the second electrode clamp than the conductive block, the conductive spring sheet and the conductive block are fixed on the base and extend from the lower surface of the base for connecting to a testing mechanism, the conductive block and the conductive spring sheet are both conductive, the conductive spring sheet has a certain elasticity, and the upper end of the conductive spring sheet is inserted into the corresponding insertion hole.

3. The aging seat for IPM module testing according to claim 2, characterized in that: A first through hole is provided on the first movable block at a position corresponding to each first electrode clamp, and the first through hole is passed through the upper end of the first electrode clamp; when the first movable block moves along the length direction, it can push the conductive spring sheet toward the conductive block, thereby clamping the pin between the conductive spring sheet and the conductive block.

4. The aging seat for IPM module testing according to claim 3, characterized in that: The second electrode clamp is in an inverted H-shape with an opening facing upwards, fixed on the base, and its lower end passes through the base; a second through hole is provided on the second movable block at a position corresponding to each second electrode clamp, and the upper end of the second electrode clamp passes upwards from the second through hole.

5. The aging seat for IPM module testing according to claim 4, characterized in that: When viewed from above, mounting notches are provided on both sides of the base and the cover along the length direction, and the aging seat also includes two operating handles, one end of each operating handle is located in the corresponding mounting notch and is rotatably connected to the base through a rotating shaft, and the operating handle can move back and forth between a first position and a second position; the operating handle is plate-shaped and the thickness of one end close to the rotating shaft is greater than the thickness of the end away from the rotating shaft, and when observed along the axial direction of the rotating shaft, the two ends of the operating handle are arc-shaped; at least one return spring is provided in each cavity, and the return spring is located on the side opposite to the corresponding first movable block or the second movable block and the corresponding operating handle, one end of the return spring abuts against the side wall of the cavity, and the other end abuts against the corresponding first movable block or the second movable block, and the return spring is always in a compressed state so that the first movable block or the second movable block always abuts against the corresponding operating handle, and when the operating handle is rotated, the operating handle can push the corresponding first movable block or the second movable block to move in a direction away from the corresponding rotating shaft so that the first movable block or the second movable block pushes the first electrode clamp or the second electrode clamp to clamp the pin.

6. The aging socket for IPM module testing according to claim 5, characterized in that: When the operating handle is located at the first position, the operating handle is vertical, and the first electrode clamp and the second electrode clamp are in a loose state; when the operating handle is located at the second position, the operating handle is horizontal, and the first electrode clamp and the second electrode clamp are in a clamped state.

7. The aging socket for IPM module testing according to claim 6, characterized in that: A positioning plane is provided at one end of the operating handle that cooperates with the first movable block or the second movable block. When the operating handle is located at the second position, the positioning plane just cooperates with the corresponding first movable block or the second movable block. At this time, when the operating handle is not subjected to external force, the operating handle always remains in the second position, and the first electrode clamp and the second electrode clamp always remain in a clamped state.

8. A method for testing an IPM module, using the aging seat for testing an IPM module according to claim 7, characterized in that: The specific steps include: Step 1: Insert the pins of the IPM module to be tested into the corresponding insertion holes; Step 2: operate the operating handle to move it from the first position to the second position, and the operating handle pushes the first movable block or the second movable block to move in a direction to clamp the first electrode clamp or the second electrode clamp to clamp the lead; Step 3, connecting the lower ends of the first electrode clamp and the second electrode clamp to the testing mechanism; Step 4: The testing organization tests the IPM module.

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