Glass substrate thickness acquisition method

Abstract

The invention relates to the technical field of glass substrate production, in particular to a glass substrate thickness acquisition method, which comprises the following steps of: fixing a glass substrate to be subjected to thickness acquisition by adopting a clamp, and conveying the glass substrate to a station through a trolley, so that a first wall and a second wall of the glass substrate in the length direction are positioned in a thickness measurement interval; driving the thickness gauge to move from a first point to a second point in the thickness measurement interval, and collecting a plurality of thickness values on the glass substrate in the moving process; compared with the prior art, the glass substrate is conveyed to the station to be cooled, and the thickness value of the glass substrate is collected within the cooling time, so that the thickness value collected by the glass substrate in the cooling state is more accurate and comprehensive compared with the thickness value collected by the glass substrate in the moving state; more accurate data can be provided for subsequent analysis and application, and data support can be provided for later improvement of equipment.

Description

Technical Field

[0001] The present invention relates to the technical field of glass substrate production, and in particular to a method for collecting the thickness of a glass substrate. Background Art

[0002] The overflow down-draw method is an advanced flat glass forming technology. Its core principle is to let the molten glass overflow in a special overflow trough. Through the action of gravity, the molten glass flows downward along the two side walls of the overflow trough. After merging at the bottom or the bottom of the two side walls, it is stretched vertically downward to form flat glass.

[0003] In the process of manufacturing liquid crystal substrate glass by overflow down-draw method, the glass liquid flows downward under the action of gravity to form flat glass. Since the shape of the overflow trough is constant, the thickness of the glass in the overflow direction is consistent with the thickness of the overflow trough. In the production process of liquid crystal substrate glass, it is necessary to detect the thickness of the semi-finished glass in real time. The collected thickness data is processed and judged so that products with unqualified thickness can be scrapped. If necessary, the overflow trough can be adjusted according to the thickness change.

[0004] The existing thickness detection device is installed at a fixed position at the entrance of the inspection machine station, and performs real-time thickness measurement during the entire process of the product passing through the sensor head. During measurement, the product is in a suspended state and passes through the sensor head. Usually, the amount of shaking when passing through the sensor head is large or even exceeds the measurement range of the sensor head, resulting in intermittent or uncollected thickness data, which has a serious impact on production. Summary of the invention

[0005] In order to solve the technical problems existing in the above-mentioned background technology, the present invention proposes a method for collecting the thickness of a glass substrate.

[0006] To achieve the above object, the present invention provides the following technical solutions:

[0007] A method for collecting thickness of a glass substrate, characterized by comprising:

[0008] Fix the glass substrate to be measured for thickness by a fixture and transport it to the workstation by a trolley, so that the first wall and the second wall of the glass substrate in the length direction are both located within the thickness measurement range;

[0009] The thickness gauge is driven to move from a first point to a second point in the thickness measuring interval and a plurality of thickness values ​​on the glass substrate are collected during the movement.

[0010] Preferably, two points a1 and a1 ′ are randomly selected in the length direction of the glass substrate, and the thickness D1 at the position a1 is equal to the thickness D1 ′ at the position a1 ′.

[0011] Preferably, the first wall and the second wall of the glass substrate in the length direction are both located in the thickness measuring interval, specifically: the first point, the first point to be detected on the first wall, the second point to be detected on the second wall and the second point are arranged in sequence along the length direction of the thickness measuring interval.

[0012] Preferably, the qualified interval of the glass substrate thickness is [AB, A+B]. When the measurement value of the thickness gauge is zero, the measurement value is a null value. When the measurement value of the thickness gauge is within the qualified interval, the measurement value is a valid value. When the measurement value of the thickness gauge is outside the qualified interval, the measurement value is an invalid value, and the null value is not included in the glass substrate thickness data set.

[0013] Preferably, when the invalid value ratio is lower than a preset value, the glass substrate is a qualified product, and when the invalid value ratio is higher than a preset value, the glass substrate is a defective product.

[0014] Compared with the prior art, the beneficial effects of the present invention are:

[0015] Compared with the prior art, by conveying the glass substrate to the workstation for cooling treatment and completing the collection of the thickness values ​​of the glass substrate during the cooling time, the thickness values ​​collected by the glass substrate in the cooling state are more accurate and comprehensive than when the glass substrate is in the moving state, and can provide more accurate data for subsequent analysis and application, and can also provide data support for the later improvement of the equipment. By making the measuring interval of the thickness measuring interval larger than the width of the glass substrate, for the glass substrate produced by the overflow down-pull method, when the glass substrate has an angle deviation in the clamping state, the collected thickness value set is consistent with the thickness value set collected when no angle deviation occurs, thereby improving the fault tolerance of the glass substrate in the thickness collection process. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 This is a structural schematic diagram of the glass substrate thickness collection method proposed by the present invention;

[0017] Figure 2 This is a structural schematic diagram of a glass substrate in a tilted state in the glass substrate thickness collection method proposed by the present invention;

[0018] In the figure: 1-glass substrate, 11-first wall, 12-second wall, 2-fixture, 3-detection area, 31-first point, 32-second point. DETAILED DESCRIPTION

[0019] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0020] like Figure 1-Figure 2 As shown, this embodiment provides a method for collecting the thickness of a glass substrate, comprising:

[0021] The glass substrate 1 to be measured for thickness is fixed by a fixture 2 and transported to the workstation by a trolley, so that the first wall 11 and the second wall 12 of the glass substrate 1 in the length direction are both located in the thickness measurement interval 3;

[0022] The thickness gauge is driven to move from the first point 31 to the second point 32 in the thickness measuring interval 3 and a plurality of thickness values ​​on the glass substrate 1 are collected during the movement.

[0023] On the whole, after the glass substrate 1 is fixed by the clamp 2, it is transported to the workstation by a trolley for cooling. During the cooling process of the glass, the thickness gauge is driven to move from the first point 31 to the second point 32 of the thickness measuring interval 3, and within the predetermined thickness measuring interval 3, multiple points to be tested are selected at equal intervals, and the thickness values ​​of the multiple points to be tested are collected in sequence to ensure that the obtained thickness values ​​can fully reflect the thickness characteristics of the glass substrate 1.

[0024] Compared with the prior art, by transporting the glass substrate 1 to the workstation for cooling treatment and completing the collection of the thickness value of the glass substrate 1 during its cooling time, compared with the glass substrate 1 in a moving state, the thickness value collected by the glass substrate 1 in a cooling state is more accurate and comprehensive, providing accurate data for subsequent analysis and application, and also providing data support for the later improvement of the equipment.

[0025] like Figure 2 As shown, in this embodiment, two points a1 and a1 ′ are randomly selected in the length direction of the glass substrate 1 , and the thickness D1 at the position a1 is equal to the thickness D1 ′ at the position a1 ′.

[0026] Specifically, for a glass substrate 1 produced by the overflow down-draw method, the thickness of any two points in the length direction of the glass substrate 1 is equal. When the glass substrate 1 is clamped by the clamp 2 and a certain angle of deviation occurs, the thickness gauge is driven to move from the first point 31 to the second point 32, and multiple points a1, a2, a3, ... a to be detected are selected at equal intervals within the predetermined thickness measurement interval 3. n, wherein after removing the null values ​​with measured values ​​of zero, the proportion of invalid values ​​in the remaining thickness data set is calculated, and for the glass substrate 1 produced by the overflow down-pull method, since the thickness values ​​of any two points in its length direction are equal, when the fixture 2 clamps the glass substrate 1 with a certain angle deviation, the measured value is consistent with the value when the glass substrate 1 clamped by the fixture 2 has no angle deviation.

[0027] like Figure 1-Figure 2 As shown, in this embodiment, the first wall 11 and the second wall 12 of the glass substrate 1 in the length direction are both located in the thickness measuring interval 3, specifically: the first point 31, the first point to be detected on the first wall 11, the second point to be detected on the second wall 12, and the second point 32 are arranged in sequence along the length direction of the thickness measuring interval 3.

[0028] Specifically, when the glass substrate 1 is conveyed to the waiting station, the first point 31, the first point to be detected on the first wall 11, the second point to be detected on the second wall 12, and the second point 32, that is, in the length direction of the thickness measuring interval 3, the thickness measuring interval 3 can cover the glass substrate 1 in a group manner to ensure the comprehensiveness of the obtained thickness value of the glass substrate 1 and avoid the situation where part of the glass substrate 1 is not detected.

[0029] like Figure 1-Figure 2 As shown, in this embodiment, the qualified interval of the thickness of the glass substrate 1 is [AB, A+B]. When the measurement value of the thickness gauge is zero, the measurement value is a null value. When the measurement value of the thickness gauge is within the qualified interval, the measurement value is a valid value. When the measurement value of the thickness gauge is outside the qualified interval, the measurement value is an invalid value, and the null value is not included in the glass substrate 1 thickness data set.

[0030] Specifically, the design dimension of the thickness of the glass substrate 1 is A, and the tolerance is B. When the thickness value of the glass substrate 1 is collected, it is necessary to ensure the comprehensiveness of the collected thickness value in the length direction of the thickness measuring interval 3. Therefore, the thickness measuring interval 3 is greater than the length from the first to-be-detected point to the second to-be-detected point on the glass substrate 1. During the detection process, when the detection value of the thickness gauge is zero, the measurement value is a null value. When the detection value of the thickness gauge is within the qualified interval, the collected value is a valid value. When the detection value of the thickness gauge is outside the qualified interval, the collected value is an invalid value, and the zero value collected by the thickness gauge is not included in the thickness value set of the glass substrate 1.

[0031] like Figure 1 As shown, in this embodiment, when the invalid value ratio is lower than the preset value, the glass substrate 1 is a qualified product, and when the invalid value ratio is higher than the preset value, the glass substrate 1 is a defective product.

[0032] Specifically, according to the collected thickness number set of the glass substrate 1, the proportion of invalid values ​​in the entire thickness number set is calculated. When the proportion of invalid values ​​of the glass substrate 1 is lower than a preset value, the glass substrate 1 is a qualified product. When the proportion of invalid values ​​of the glass substrate 1 is higher than the preset value, the glass substrate 1 is a defective product. The production equipment can be improved accordingly according to the collected thickness number set.

[0033] Of course, it will be apparent to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above, but also includes the same or similar structures that can be implemented in other specific forms without departing from the spirit or essential features of the present invention. Therefore, the embodiments should be regarded as exemplary and non-limiting in all respects, and the scope of the present invention is defined by the appended claims rather than the above description, and it is intended that all changes falling within the meaning and scope of the equivalent elements of the claims be included in the present invention. Any reference numeral in a claim should not be regarded as limiting the claim to which it relates.

[0034] In addition, it should be understood that although the present specification is described according to implementation modes, not every implementation mode contains only one independent technical solution. This description of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each embodiment may also be appropriately combined to form other implementation modes that can be understood by those skilled in the art.

[0035] The techniques, shapes, and structural parts not described in detail in the present invention are all well-known techniques.

Claims

1. A glass substrate thickness collection method, used to collect thickness data of a glass substrate in a width direction, characterized in that: include: A glass substrate (1) to be subjected to thickness measurement is fixed by a fixture (2) and transported to a workstation by a trolley, so that a first wall (11) and a second wall (12) of the glass substrate (1) in a length direction thereof are both located within a thickness measurement interval (3); The thickness gauge is driven to move from a first point (31) to a second point (32) in the thickness measuring interval (3), and a plurality of thickness values ​​on the glass substrate (1) are collected during the movement.

2. The method for collecting the thickness of a glass substrate according to claim 1, characterized in that: Two points a1 and a1' are randomly selected in the length direction of the glass substrate (1), and the thickness D1 at the position a1 is equal to the thickness D1' at the position a1'.

3. The method for collecting the thickness of a glass substrate according to claim 1, characterized in that: The first wall (11) and the second wall (12) of the glass substrate (1) in the length direction thereof are both located within the thickness measurement interval (3), specifically: the first point (31), the first point to be detected on the first wall (11), the second point to be detected on the second wall (12), and the second point (32) are arranged in sequence along the length direction of the thickness measurement interval (3).

4. The method for collecting the thickness of a glass substrate according to claim 1, characterized in that: The qualified interval of the thickness of the glass substrate (1) is [AB, A+B]. When the measurement value of the thickness gauge is zero, the measurement value is a null value. When the measurement value of the thickness gauge is within the qualified interval, the measurement value is a valid value. When the measurement value of the thickness gauge is outside the qualified interval, the measurement value is an invalid value. The null value is not included in the thickness data set of the glass substrate (1).

5. The method for collecting the thickness of a glass substrate according to claim 4, characterized in that: When the invalid value ratio is lower than a preset value, the glass substrate (1) is a qualified product, and when the invalid value ratio is higher than a preset value, the glass substrate (1) is a defective product.

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