Test loop for testing long-term electrified performance of direct-current equipment

Abstract

The invention relates to a test loop for testing the long-term electrification performance of direct current equipment, and belongs to the field of direct current equipment product tests. The test loop comprises a DC high voltage generator used for outputting a DC voltage, an impulse voltage generator used for providing an impulse voltage, and a protection capacitor used for isolating the DC high voltage. The output end of the direct-current high-voltage generator is connected with a test port through a test line, and the test port is used for being connected with direct-current equipment to be tested; one end of the protection capacitor is connected with the test port, and the other end of the protection capacitor is grounded when direct current tolerance test needs to be performed on the to-be-tested direct current equipment and is connected with the output end of the impulse voltage generator when alternating current and direct current superposition test needs to be performed on the to-be-tested direct current equipment. According to the invention, long-term occupation of the impulse voltage generator can be avoided, the laboratory test efficiency is improved, and other normal test arrangements are not affected.

Description

Technical Field

[0001] The invention relates to a test circuit for testing the long-term live performance of a DC device, belonging to the field of DC device product testing. Background Art

[0002] After DC equipment such as gas insulated switchgear (GIS) or gas insulated transmission line (GIL) meets the type test verification of individual components, in order to verify its long-term energized stability, it is necessary to carry out long-term energized assessment tests. Long-term energized tests include DC energized withstand voltage stage and AC / DC superimposed impulse test. The long-term energized assessment test circuits that have been carried out at home and abroad are to connect test equipment such as DC high-voltage generators, impulse voltage generators and current boosters in the same circuit for testing. When designing the circuit, a protective resistor is installed on the DC equipment side of the line to isolate the impulse voltage, and a protective capacitor is installed on the impulse equipment side to isolate the DC voltage.

[0003] The Chinese utility model patent publication with the authorization announcement number CN208984747U discloses a 500KV high-voltage DC cable superimposed impulse voltage test device. The device includes an impulse voltage generator and a DC voltage generator, a protective resistor and a DC blocking capacitor are connected in series between the impulse voltage generator and the DC voltage generator, the DC blocking capacitor is located between the protective resistor and the impulse voltage generator, a cable to be tested is connected between the DC blocking capacitor and the protective resistor, the cable to be tested is placed in a cable circulation heating device that provides heating and temperature rise for the cable to be tested, and a data acquisition and display device is provided between the cable to be tested and the protective resistor. The utility model has a simple structure, is easy to operate, safe and reliable, and by adopting the utility model structure, the labor intensity of operators can be greatly reduced, and the manufacturing cost is low.

[0004] Although the design of this 500 kilovolt (KV) high-voltage DC cable superimposed impulse voltage test device can meet the test requirements, it will occupy the impulse voltage generator for a long time, that is, the impulse voltage generator will be used in both the DC live withstand voltage stage and the AC / DC superimposed impulse test. When the usage rate of the impulse generator is particularly high, it will have a serious impact on the normal test arrangements of the laboratory. Summary of the invention

[0005] The purpose of the present invention is to provide a test circuit for testing the long-term live performance of a DC device, so as to solve the problem of high frequency of use of an impulse voltage generator when performing long-term live performance testing on a DC device in the prior art.

[0006] To achieve the above object, the solution of the present invention includes: A test circuit for testing the long-term live performance of a DC device of the present invention comprises a DC high voltage generator for outputting a DC voltage, an impulse voltage generator for providing an impulse voltage, and a protective capacitor for isolating the DC high voltage; The output end of the DC high-voltage generator is connected to the test port through a test line, and the test port is used to be connected to the DC device to be tested; one end of the protection capacitor is connected to the test port, and the other end is grounded when a DC withstand test is required for the DC device to be tested, and is connected to the output end of the impulse voltage generator when an AC / DC superposition test is required for the DC device to be tested.

[0007] Furthermore, a switch for being turned on during a DC withstand test is connected in series to the connection line between the protection capacitor and the ground.

[0008] Furthermore, a switch that is turned on during an AC / DC superposition test is connected in series to a connection line between the protection capacitor and the output end of the impulse voltage generator.

[0009] Furthermore, the other end of the protection capacitor is connected to the output end of the impulse voltage generator and the ground respectively through a conversion switch; The conversion switch is used to connect the protection capacitor to the ground during the DC withstand test, and to connect the protection capacitor to the impulse voltage generator during the AC / DC superposition test.

[0010] Furthermore, a protective resistor for isolating impulse voltage is connected in series on the test circuit.

[0011] Furthermore, it also includes a current booster for providing a high current test environment for testing DC equipment during a DC withstand test.

[0012] Furthermore, the voltage value of the DC voltage output by the DC high voltage generator is adjustable.

[0013] The beneficial effects of the present invention are as follows: as a pioneering invention, the present invention provides a test circuit for testing the long-term live performance of a DC device, including a DC high-voltage generator for outputting a DC voltage, an impulse voltage generator for providing an impulse voltage, and a protective capacitor for isolating the DC high voltage; the output end of the DC high-voltage generator is connected to the test port through a test line, and the test port is used to be connected to the DC device to be tested; one end of the protective capacitor is connected to the test port, and the other end is grounded when a DC tolerance test is required for the DC device to be tested, and is connected to the output end of the impulse voltage generator when an AC / DC superposition test is required for the DC device to be tested. By grounding the protective capacitor on the impulse side during the DC tolerance test, disconnecting the connection between the protective capacitor and the impulse voltage generator, and disconnecting the connection between the protective capacitor on the impulse side and the ground during the AC / DC superposition test to connect the impulse voltage generator, the long-term occupation of the impulse voltage generator can be released while the DC voltage is not disconnected, thereby improving the test efficiency of the laboratory and not affecting other normal test arrangements. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 It is a structural schematic diagram of a test circuit for testing the long-term live performance of a DC device provided by an embodiment of the present invention; Figure 2 It is a structural schematic diagram of another test circuit for testing the long-term live performance of a DC device provided by an embodiment of the present invention; Figure 3 It is a structural schematic diagram of another test circuit for testing the long-term live performance of a DC device provided by an embodiment of the present invention; Figure 4 1 is a schematic structural diagram of a fourth test circuit for testing the long-term live performance of a DC device provided by an embodiment of the present invention; Figure 5 It is a structural schematic diagram of a fifth test circuit for testing the long-term live performance of a DC device provided in an embodiment of the present invention. DETAILED DESCRIPTION

[0015] In order to make the purpose, technical solutions and advantages of the present invention more clear, the present invention is further described in detail below in conjunction with the accompanying drawings and embodiments.

[0016] The idea of ​​the present invention is to reduce the use frequency of the impulse voltage generator by changing the connecting line between the protection capacitor and the impulse voltage generator into a detachable connecting line.

[0017] Specifically: it includes a DC high-voltage generator for outputting DC voltage, an impulse voltage generator for providing impulse voltage, and a protection capacitor for isolating DC high voltage; the output end of the DC high-voltage generator is connected to a test port through a test line, and the test port is used to be connected to a DC device to be tested; one end of the protection capacitor is connected to the test port, and the other end is grounded when a DC withstand test is required for the DC device to be tested, and is connected to the output end of the impulse voltage generator when an AC / DC superposition test is required for the DC device to be tested.

[0018] An embodiment of a test circuit for testing the long-term live performance of a DC device: Embodiment 1: Figure 1 is a schematic diagram of the structure of a test circuit for testing the long-term live performance of a DC device provided by an embodiment of the present invention, such as Figure 1 As shown, the test circuit includes: a DC high voltage generator 10 for outputting a DC voltage, an impulse voltage generator 20 for providing an impulse voltage, and a protection capacitor C for isolating the DC high voltage.

[0019] Specifically, the output end of the DC high voltage generator 10 is connected to the test port through the test line, and the test port is used to be connected to the DC device to be tested 40; one end of the protection capacitor C is connected to the test port, and the other end is grounded GND when the DC device to be tested 40 needs to be tested for DC withstand test, and is connected to the output end of the impulse voltage generator 20 when the DC device to be tested 40 needs to be tested for AC and DC superposition test. In order to protect the DC high voltage generator 10 and reduce the damage of the impulse voltage to the DC high voltage generator 10, as an optional embodiment, a protection resistor R for isolating the impulse voltage is connected in series on the test line.

[0020] In order to make the test conditions closer to the actual usage conditions, as an optional implementation, a test circuit for testing the long-term energized performance of a DC device provided in an embodiment of the present invention also includes a current booster 30 for providing a high current test environment for the DC device during a DC withstand test.

[0021] When the DC device 40 to be tested is connected to the test port, when it is necessary to perform a DC withstand test on the DC device 40 to be tested, the current booster 30 is turned on, the current booster 30 provides a large current environment for the test for the DC device 40 to be tested, the other end of the protection capacitor C is manually connected to the ground GND, the protection capacitor C is connected to the ground GND, and the DC high-voltage generator 10 outputs a DC voltage for the DC device 40 to be tested; when it is necessary to perform an AC / DC superposition test on the DC device 40 to be tested, the current booster 30 is turned off, the connection line between the other end of the protection capacitor C and the ground GND is manually disconnected, the protection capacitor C is disconnected from the ground GND, the other end of the protection capacitor C is manually connected to the output end of the impulse voltage generator 20, the protection capacitor C is connected to the impulse voltage generator 20, the DC high-voltage generator 10 outputs a DC voltage for the DC device 40 to be tested, the AC high-voltage generator (not shown) outputs an AC voltage for the DC device 40 to be tested, and the impulse voltage generator 20 provides an impulse voltage for the DC device 40 to be tested.

[0022] The voltage value of the DC voltage output by the DC high voltage generator 10 is adjustable. When performing an AC / DC superposition test on the DC device 40 to be tested, the voltage value of the DC voltage output by the high voltage DC generator 10 can be reduced for safety reasons.

[0023] Embodiment 2: Figure 2 FIG. 1 is a schematic diagram of the structure of another test circuit for testing the long-term live performance of a DC device provided by an embodiment of the present invention. Figure 2 As shown, the long-term live performance test circuit includes: a DC high voltage generator 10 for outputting a DC voltage, an impulse voltage generator 20 for providing an impulse voltage, and a protection capacitor C for isolating the DC high voltage.

[0024] Specifically, the output end of the DC high-voltage generator 10 is connected to the test port through a test line, and the test port is used to be connected to the DC device 40 to be tested; one end of the protection capacitor C is connected to the test port, and the other end is grounded GND through a first switch S1 that is turned on when a DC withstand test needs to be performed on the DC device 40 to be tested. The other end of the protection capacitor C is also used to connect the output end of the impulse voltage generator 20 when an AC / DC superposition test needs to be performed on the DC device 40 to be tested.

[0025] Setting the first switch S1 on the line of the protection capacitor C for grounding GND can reduce the number of times that experimenters frequently change lines, improve test efficiency, improve the safety of the experiment, and reduce the occurrence of safety accidents.

[0026] In order to protect the DC high voltage generator 10 and reduce the damage to the DC high voltage generator 10 caused by the impulse voltage, as an optional implementation, a protection resistor R for isolating the impulse voltage is connected in series on the test line.

[0027] In order to make the test conditions closer to the actual usage conditions, as an optional implementation, a test circuit for testing the long-term energized performance of a DC device provided in an embodiment of the present invention also includes a current booster 30 for providing a high current test environment for the DC device during a DC withstand test.

[0028] When the DC device 40 to be tested is connected to the test port, when it is necessary to perform a DC withstand test on the DC device 40 to be tested, the current booster 30 is turned on, the current booster 30 provides a large current environment for the test for the DC device 40 to be tested, the first switch S1 is controlled to be closed, the protection capacitor C is connected to the ground GND, and the DC high-voltage generator 10 outputs a DC voltage for the DC device 40 to be tested; when it is necessary to perform an AC / DC superposition test on the DC device 40 to be tested, the current booster 30 is turned off, the first switch S1 is controlled to be disconnected, the protection capacitor C is disconnected from the ground GND, the other end of the protection capacitor C is manually connected to the output end of the impulse voltage generator 20, the protection capacitor C is connected to the impulse voltage generator 20, the DC high-voltage generator 10 outputs a DC voltage for the DC device 40 to be tested, the AC high-voltage generator (not shown) outputs an AC voltage for the DC device 40 to be tested, and the impulse voltage generator 20 provides an impulse voltage for the DC device 40 to be tested.

[0029] The first switch S1 may be a circuit breaker or a high voltage switch such as an open switch, which is not particularly limited in the present invention.

[0030] Embodiment 3: Figure 3 is a structural schematic diagram of another test circuit for testing the long-term live performance of a DC device provided by an embodiment of the present invention, such as Figure 3 As shown, the long-term live performance test circuit includes: a DC high voltage generator 10 for outputting a DC voltage, an impulse voltage generator 20 for providing an impulse voltage, and a protection capacitor C.

[0031] Specifically, the output end of the DC high-voltage generator 10 is connected to the test port through a test line, and the test port is used to be connected to the DC device 40 to be tested; one end of the protection capacitor C is connected to the test port, and the other end is grounded GND, and the other end of the protection capacitor C is also connected to the output end of the impulse voltage generator 20 through a second switch S2 that is turned on when the DC device 40 to be tested needs to be subjected to an AC / DC superposition test.

[0032] The second switch S2 is arranged on the line of the protection capacitor C for connecting the impulse voltage generator 20, which can reduce the number of times the experimenter frequently changes the line, improve the test efficiency, improve the safety of the experiment, and reduce the occurrence of safety accidents.

[0033] In order to protect the DC high voltage generator 10 and reduce the damage to the DC high voltage generator 10 caused by the impulse voltage, as an optional implementation, a protection resistor R for isolating the impulse voltage is connected in series on the test line.

[0034] In order to make the test conditions closer to the actual usage conditions, as an optional implementation, a test circuit for testing the long-term energized performance of a DC device provided in an embodiment of the present invention also includes a current booster 30 for providing a high current test environment for the DC device during a DC withstand test.

[0035] When the DC device 40 to be tested is connected to the test port, when it is necessary to perform a DC withstand test on the DC device 40 to be tested, the current booster 30 is turned on, the current booster 30 provides a large current environment for the test of the DC device 40 to be tested, the second switch S2 is controlled to be disconnected, the protection capacitor C is disconnected from the impulse voltage generator 20, the other end of the protection capacitor C is manually connected to the ground GND, the protection capacitor C is connected to the ground GND, and the DC high-voltage generator 10 outputs a DC voltage to the DC device 40 to be tested; when it is necessary to perform an AC / DC superposition test on the DC device 40 to be tested, the current booster 30 is turned off, the connection relationship between the other end of the protection capacitor C and the ground GND is manually disconnected, the protection capacitor C is disconnected from the ground GND, the second switch S2 is controlled to be closed, the protection capacitor C is connected to the impulse voltage generator 20, the DC high-voltage generator 10 outputs a DC voltage to the DC device 40 to be tested, the AC high-voltage generator (not shown) outputs an AC voltage to the DC device 40 to be tested, and the impulse voltage generator 20 provides an impulse voltage to the DC device 40 to be tested.

[0036] The second switch S2 may be a circuit breaker or a high voltage switch such as an open switch, and the present invention does not specifically limit this.

[0037] Embodiment 4: Figure 4 is a schematic diagram of the structure of a fourth test circuit for testing the long-term live performance of a DC device provided by an embodiment of the present invention, such as Figure 4 As shown, the long-term live performance test circuit includes: a DC high voltage generator 10 for outputting a DC voltage, an impulse voltage generator 20 for providing an impulse voltage, and a protection capacitor C.

[0038] Specifically, the output end of the DC high-voltage generator 10 is connected to the test port through a test line, and the test port is used to be connected to the DC device 40 to be tested; one end of the protection capacitor C is connected to the test port, and the other end is grounded GND through a first switch S1 that is turned on when a DC withstand test needs to be performed on the DC device 40 to be tested, and the other end of the protection capacitor C is also connected to the output end of the impulse voltage generator 20 through a second switch S2 that is turned on when an AC / DC superposition test needs to be performed on the DC device 40 to be tested.

[0039] Setting the first switch S1 on the line of the protection capacitor C for grounding GND and setting the second switch S2 on the line of the protection capacitor C for connecting to the impulse voltage generator 20 can further reduce the number of times the experimenter frequently changes the line, improve the test efficiency while improving the safety of the experiment and reduce the occurrence of safety accidents.

[0040] In order to protect the DC high voltage generator 10 and reduce the damage to the DC high voltage generator 10 caused by the impulse voltage, as an optional implementation, a protection resistor R for isolating the impulse voltage is connected in series on the test line.

[0041] In order to make the test conditions closer to the actual usage conditions, as an optional implementation, a test circuit for testing the long-term energized performance of a DC device provided in an embodiment of the present invention also includes a current booster 30 for providing a high current test environment for the DC device during a DC withstand test.

[0042] When the DC device 40 to be tested is connected to the test port, when it is necessary to perform a DC withstand test on the DC device 40 to be tested, the current booster 30 is turned on, the current booster 30 provides a large current environment for the test for the DC device 40 to be tested, the first switch S1 is controlled to be closed, the protection capacitor C is connected to the ground GND, the second switch S2 is controlled to be disconnected, the protection capacitor C is disconnected from the impulse voltage generator 20, and the DC high-voltage generator 10 outputs a DC voltage for the DC device 40 to be tested; when it is necessary to perform an AC / DC superposition test on the DC device 40 to be tested, the current booster 30 is turned off, the first switch S1 is controlled to be disconnected, the protection capacitor C is disconnected from the ground GND, the second switch S2 is controlled to be closed, the protection capacitor C is connected to the impulse voltage generator 20, the DC high-voltage generator 10 outputs a DC voltage for the DC device 40 to be tested, the AC high-voltage generator (not shown) outputs an AC voltage for the DC device 40 to be tested, and the impulse voltage generator 20 provides an impulse voltage for the DC device 40 to be tested.

[0043] For the introduction of the first switch S1 , reference may be made to the relevant description in the aforementioned embodiment 2, which will not be repeated here; for the introduction of the second switch S2 , reference may be made to the relevant description in the aforementioned embodiment 3, which will not be repeated here.

[0044] Embodiment 5: Figure 5 is a schematic diagram of the structure of a fifth test circuit for testing the long-term live performance of a DC device provided by an embodiment of the present invention, such as Figure 5 As shown, the long-term live performance test circuit includes: a DC high voltage generator 10 for outputting a DC voltage, an impulse voltage generator 20 for providing an impulse voltage, and a protection capacitor C.

[0045] Specifically, the output end of the DC high-voltage generator 10 is connected to the test port through a test line, and the test port is used to be connected to the DC device 40 to be tested; one end of the protection capacitor C is connected to the test port, and the other end is connected to the ground GND and the output end of the impulse voltage generator 20 through the conversion switch S3; the conversion switch S3 is used to connect the protection capacitor C to the ground GND during the DC withstand test, and to connect the protection capacitor C to the impulse voltage generator 20 during the AC / DC superposition test.

[0046] The other end of the protection capacitor C is connected to the ground GND and the output end of the impulse voltage generator 20 through the conversion switch S3, which can further reduce the number of times the experimenter frequently changes the line, improve the test efficiency while improving the safety of the experiment and reduce the occurrence of safety accidents.

[0047] In order to protect the DC high voltage generator 10 and reduce the damage to the DC high voltage generator 10 caused by the impulse voltage, as an optional implementation, a protection resistor R for isolating the impulse voltage is connected in series on the test line.

[0048] In order to make the test conditions closer to the actual usage conditions, as an optional implementation, a test circuit for testing the long-term energized performance of a DC device provided in an embodiment of the present invention also includes a current booster 30 for providing a high current test environment for the DC device during a DC withstand test.

[0049] When the DC device 40 to be tested is connected to the test port, when it is necessary to perform a DC withstand test on the DC device 40 to be tested, the current booster 30 is turned on, the current booster 30 provides a large current environment for the test for the DC device 40 to be tested, and the conversion switch S3 is controlled to connect the protection capacitor C to the ground GND, then the protection capacitor C and the impulse voltage generator 20 are disconnected, and the DC high-voltage generator 10 outputs a DC voltage for the DC device 40 to be tested; when it is necessary to perform an AC / DC superposition test on the DC device 40 to be tested, the current booster 30 is turned off, the conversion switch S3 is controlled to connect the protection capacitor C to the impulse voltage generator 20, then the protection capacitor C and the ground GND are disconnected, the DC high-voltage generator 10 outputs a DC voltage for the DC device 40 to be tested, the AC high-voltage generator (not shown) outputs an AC voltage for the DC device 40 to be tested, and the impulse voltage generator 20 provides an impulse voltage for the DC device 40 to be tested.

[0050] The third switch S3 is a high voltage level conversion switch.

[0051] A test circuit for testing the long-term live performance of a DC device provided by an embodiment of the present invention includes a DC high-voltage generator for outputting a DC voltage, an impulse voltage generator for providing an impulse voltage, and a protection capacitor for isolating the DC high voltage; the output end of the DC high-voltage generator is connected to a test port through a test line, and the test port is used to connect to the DC device to be tested; one end of the protection capacitor is connected to the test port, and the other end is grounded when a DC tolerance test is required for the DC device to be tested, and is connected to the output end of the impulse voltage generator when an AC / DC superposition test is required for the DC device to be tested. By grounding the protection capacitor on the impulse side during the DC tolerance test, disconnecting the connection between the protection capacitor and the impulse voltage generator, and disconnecting the connection between the protection capacitor and the ground to connect the impulse voltage generator during the AC / DC superposition test, the long-term occupation of the impulse voltage generator can be released while the DC voltage is not cut off, thereby improving the test efficiency of the laboratory and not affecting other normal test arrangements.

Claims

1. A test circuit for testing the long-term live performance of a DC device, characterized in that: It includes a DC high voltage generator for outputting a DC voltage, an impulse voltage generator for providing an impulse voltage, and a protective capacitor for isolating the DC high voltage; The output end of the DC high-voltage generator is connected to a test port through a test line, and the test port is used to be connected to the DC device to be tested; one end of the protection capacitor is connected to the test port, and the other end is grounded when a DC withstand test is required for the DC device to be tested, and is connected to the output end of the impulse voltage generator when an AC / DC superposition test is required for the DC device to be tested.

2. The test circuit for testing the long-term live performance of a DC device according to claim 1, characterized in that: A switch is connected in series on the connection line between the protection capacitor and the ground and is used for being turned on during the DC withstand test.

3. The test circuit for testing the long-term live performance of a DC device according to claim 1 or 2, characterized in that: A switch that is turned on during the AC / DC superposition test is connected in series to the connection line between the protection capacitor and the output end of the impulse voltage generator.

4. The test circuit for testing the long-term live performance of a DC device according to claim 1, characterized in that: The other end of the protection capacitor is connected to the output end of the impulse voltage generator and the ground respectively through a conversion switch; The conversion switch is used to connect the protection capacitor to the ground during the DC withstand test, and to connect the protection capacitor to the impulse voltage generator during the AC / DC superposition test.

5. The test circuit for testing the long-term live performance of a DC device according to claim 1, characterized in that: The test circuit is connected in series with a protective resistor for isolating the impulse voltage.

6. The test circuit for testing the long-term live performance of a DC device according to claim 5, characterized in that: It also includes a current booster for providing a high current test environment for the tested DC device during the DC withstand test.

7. The test circuit for testing the long-term live performance of a DC device according to claim 6, characterized in that: The voltage value of the DC voltage output by the DC high voltage generator is adjustable.

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