Device and method for testing reliability of IGBT (Insulated Gate Bipolar Translator) for sewing machine

Abstract

The invention provides a reliability testing device and method for an IGBT (Insulated Gate Bipolar Translator) for a sewing machine. The reliability testing device of the IGBT for the sewing machine comprises a control module, a motor, a motor clamping module and a short circuit module, wherein the motor clamping module is used for adjusting the position of the motor; the control module is used for generating a large current pulse based on the position of the motor to control the turn-on of the IGBT and drive the motor; the short circuit module is used for simulating short circuit conditions and generating current impact to carry out current impact testing on the IGBT. According to the invention, the position of the motor in the sewing machine is combined with the controller to generate the large-current pulse, and the large-current narrow-pulse condition of a product can be truly simulated, so that the reliability of the power device IGBT of the driver can be more truly tested.

Description

Technical Field

[0001] The present application relates to the technical field of electronic circuits, and in particular to a reliability testing device and method for an IGBT for a sewing machine. Background Art

[0002] For sewing machine controllers, sewing machines are used for a long time and the working conditions are relatively complex. Currently, most of them use single-tube IGBT half-bridge drivers as the indispensable driving part of the controller. The reliability of IGBT, as a core device, directly affects the reliability of electronic control products. Therefore, when selecting IGBT, in addition to some basic parameters, the large current impact adaptability of an IGBT must also be considered.

[0003] In previous tests, the large current impact adaptability test of IGBT is often ignored. However, during the sewing operation, due to the complex external working conditions, IGBT is often damaged during use. Although the electronic control has hardware protection for IGBT, abnormal situations such as untimely protection often occur. Therefore, in order to address this problem, when selecting IGBT, it is necessary to select IGBT with excellent reliability and impact resistance.

[0004] With the strong impact resistance of IGBT, the overcurrent protection rate can be increased, thereby increasing the reliability of the product at the device level. Generally, large current periodic pulse current signals need to be generated by instruments, but most of the large current pulse signals generated by instruments cannot truly and effectively simulate the test conditions of IGBT for sewing machines. Summary of the invention

[0005] The purpose of the present application is to provide a reliability testing device and method for an IGBT for a sewing machine, which is used to solve the technical problem that a large current pulse signal generated by a generating instrument cannot truly and effectively simulate the test conditions of the IGBT for a sewing machine.

[0006] To achieve the above-mentioned purpose and other related purposes, the first aspect of the present application provides a reliability test device for an IGBT for a sewing machine. The reliability test device comprises: a control module, a motor, a motor positioning module and a short-circuit module; wherein the motor positioning module is used to adjust the position of the motor; the control module is used to generate a large current pulse based on the position of the motor to control the opening of the IGBT and drive the motor; the short-circuit module is used to simulate a short-circuit condition and generate a current shock to perform a current shock test on the IGBT.

[0007] In some embodiments of the first aspect of the present application, the control module includes: a single-chip microcomputer, a drive circuit unit and a current sampling unit; the single-chip microcomputer is used to obtain the position of the motor and output a large current pulse based on the position of the motor; the drive circuit unit controls the opening of the IGBT based on the large current pulse and drives the motor through the IGBT; the current sampling unit is used to obtain the voltage signal of the bus current of the short-circuit module when the phase line is short-circuited, and sends the voltage signal of the bus current to the single-chip microcomputer; the single-chip microcomputer calculates and obtains test data of the current impact test based on the voltage signal of the bus current.

[0008] In some embodiments of the first aspect of the present application, the motor positioning module includes: a height adjustment unit, and the height adjustment unit is used to adjust the motor to different heights.

[0009] In some embodiments of the first aspect of the present application, the output is different when the position of the motor is different, and the control module adjusts the duty cycle of the large current pulse based on the position feedback of the motor to control the turning on of the IGBT.

[0010] In some embodiments of the first aspect of the present application, the reliability testing device also includes: a display module; the display module is communicatively connected to the control module, and is used to receive, display and record test data of the current impact test; the test data of the current impact test includes: IGBT protection current threshold, impact current and number of impacts.

[0011] In some embodiments of the first aspect of the present application, the display module is further used to adjust the output current to further adjust the duty cycle of the large current pulse.

[0012] To achieve the above-mentioned purpose and other related purposes, the second aspect of the present application provides a reliability test method for an IGBT for a sewing machine, which is applied to the reliability test device for an IGBT for a sewing machine described in any one of the first aspects of the present application. The reliability test method comprises: obtaining the position of the motor; generating a large current pulse based on the position of the motor to control the opening of the IGBT and drive the motor; using a short-circuit module to simulate a short-circuit condition, generating a current shock and performing a current shock test on the IGBT.

[0013] In some embodiments of the second aspect of the present application, a short-circuit module is used to simulate a short-circuit condition, and a current shock is generated to perform a current shock test on the IGBT, including: under the condition of the current large current pulse, adjusting the current protection threshold of the IGBT, and performing a current shock test on the IGBT based on different current protection thresholds.

[0014] In some embodiments of the second aspect of the present application, the reliability testing method also includes: adjusting the position of the motor to obtain different large current pulses; based on the different large current pulses, using a short-circuit module to simulate short-circuit conditions, generating current shocks to perform current shock tests on the IGBT.

[0015] In some embodiments of the second aspect of the present application, the reliability testing method also includes: counting test data when performing current impact testing based on the different large current pulses and the different current protection thresholds; and obtaining the relationship between the IGBT failure rate and the number of current impacts based on different large current pulses and based on different current protection thresholds based on the test data.

[0016] As described above, the reliability testing device and method of an IGBT for a sewing machine of the present application have the following beneficial effects:

[0017] First, the present application utilizes the position of the motor in the sewing machine in combination with the controller to generate a large current pulse, which can truly simulate the large current narrow pulse condition of the product, thereby more realistically testing the reliability of the driver power device IGBT;

[0018] Second, the present application uses the sewing machine, controller and motor as devices for generating pulses, which can not only simulate the actual usage environment, but also test the current impact of IGBT under different large current pulses and different current protection thresholds, and has strong versatility. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 Shown is a structural schematic diagram of a reliability testing device in an embodiment of the present application.

[0020] Figure 2 Shown is a structural schematic diagram of a control module in one embodiment of the present application.

[0021] Figure 3 Shown is a flow chart of a reliability testing method in an embodiment of the present application.

[0022] Figure 4 Shown is a schematic diagram of the structure of an electronic terminal in an embodiment of the present application.

[0023] Description of symbols

[0024] 100 Reliability Test Device

[0025] 10 Control Module

[0026] 11. Microcontroller

[0027] 12. Driving circuit unit

[0028] 13 Current sampling unit

[0029] 20 Motor

[0030] 30 Motor clamping module

[0031] 31 Height adjustment unit

[0032] 40 Short circuit module

[0033] 50 Display Module

[0034] 400 Electronic Terminal

[0035] 401 Processor

[0036] 402 Memory

[0037] 4021 Operating System

[0038] 4022 Application

[0039] 403 Network Interface

[0040] 404 Bus System

[0041] 405 User Interface

[0042] Steps S1 to S5 DETAILED DESCRIPTION

[0043] The following describes the embodiments of the present application through specific examples, and those skilled in the art can easily understand other advantages and effects of the present application from the contents disclosed in this specification. The present application can also be implemented or applied through other different specific embodiments, and the details in this specification can also be modified or changed in various ways based on different viewpoints and applications without departing from the spirit of the present application. It should be noted that the following embodiments and features in the embodiments can be combined with each other without conflict.

[0044] It should be noted that the illustrations provided in the following embodiments are only schematic illustrations of the basic concept of the present application, and thus the drawings only show components related to the present application rather than being drawn according to the number, shape and size of components in actual implementation. In actual implementation, the type, quantity and proportion of each component may be changed at will, and the component layout may also be more complicated.

[0045] In the reliability testing device and method for IGBT for sewing machines of the present application, since the pulse time and width span of the pulse signal output in the sewing machine system are relatively large, and since the minimum pulse width condition of the driver chip cannot reach the minimum pulse width when the sewing machine is running, the driver chip cannot output the received pulse signal, thereby failing to control the IGBT drive motor. Therefore, when using a high-power power supply and driver, it is impossible to simulate the actual environment of the IGBT working state when the sewing machine is running.

[0046] Therefore, the present application utilizes the characteristics that the position of the motor in the sewing machine is different, and the required output mechanical power is different, so pulse signals with different duty cycles are needed to control the IGBT to drive the motor to output the target mechanical power at the corresponding position. The sewing machine, controller and motor are used as pulse signal generating devices, and a short-circuit module is set in the pulse signal generating device. The short-circuit module and the pulse signal generating device are used to perform current impact test on the IGBT, which can truly simulate the large current and narrow pulse conditions of the product, thereby more realistically testing the reliability of the driver power device IGBT.

[0047] The technical solutions of the embodiments of the present application can be applied to various communication systems, such as: Long Term Evolution (LTE) system, LTE frequency division duplex (FDD) system, future fifth generation (5G) communication system, new radio access technology (NR), LTE time division duplex (TDD), Worldwide Interoperability for Microwave Access (WiMAX), Universal Mobile Telecommunication System (UMTS), and vehicle-to-XV2X. Among them, V2X may include vehicle to network (V2N), vehicle to vehicle (V2V), vehicle to infrastructure (V2I), vehicle to pedestrian (V2P), Long Term Evolution-Vehicle (LTE-V), Internet of Vehicles, machine type communication (MTC), Internet of Things (IoT), Long Term Evolution-Machine (LTE-M), machine to machine (M2M), etc.

[0048] See also Figures 1 to 4 The following embodiments of the present application provide a reliability test device and method for IGBT used in sewing machines. Compared with the commonly used technology, the present application utilizes the position of the motor in the sewing machine in combination with the controller to generate a large current pulse, which can truly simulate the large current narrow pulse condition of the product, thereby more truly testing the reliability of the driver power device IGBT; at the same time, the sewing machine, controller and motor are used as pulse generating devices, which can not only simulate the real use environment, but also test the current impact of the IGBT under different large current pulses and different current protection thresholds, and has strong versatility.

[0049] The technical solutions in the embodiments of the present application will be described in detail below in conjunction with the drawings in the embodiments of the present application.

[0050] See also Figure 1 , which is a schematic diagram of the structure of the reliability testing device described in an embodiment of the present application.

[0051] like Figure 1 As shown, the present application provides a reliability testing device 100 for an IGBT for a sewing machine, which is used to generate a large current pulse based on the sewing machine, a controller and a motor 14 and perform a current impact test on the IGBT.

[0052] like Figure 1 As shown, the reliability testing device 100100 includes: a control module 10, a motor 14, a motor positioning module 30 and a short-circuit module 40.

[0053] In this embodiment, the motor positioning module 30 is used to adjust the position of the motor 14; the control module 10 is used to generate a large current pulse based on the position of the motor 14 to control the opening of the IGBT and drive the motor 14; the short-circuit module 40 is used to simulate the short-circuit condition and generate a current shock to perform a current shock test on the IGBT.

[0054] In this embodiment, the motor 14 is a servo motor 14 or a stepper motor 14 , and the servo motor 14 or the stepper motor 14 is provided with a magnetoelectric encoder or a photoelectric encoder.

[0055] In this embodiment, the locking structure includes: a height adjustment unit 31, and the height adjustment unit 31 is used to adjust the motor 14 to different heights.

[0056] Exemplarily, the height adjustment unit 31 is a steel plate of different thicknesses. By setting steel plates of different thicknesses in the sewing machine, the motor 14 is supported to different heights, thereby changing the position of the motor 14 in the sewing machine, that is, changing the height of the motor 14 in the sewing machine.

[0057] It should be noted that, in a sewing machine system, motors 14 of different heights need to output different mechanical powers.

[0058] In this embodiment, the target output power of the motor 14 is different when the position of the motor 14 is different. The control module 10 adjusts the proportion of the large current pulse based on the position feedback of the motor 14 to control the turning on of the IGBT.

[0059] In this embodiment, the control module 10 obtains the position of the motor 14, and based on the position of the motor 14, obtains the mechanical power that the motor 14 needs to output, thereby reversely adjusting the width of the high-current pulse signal to generate a high-current pulse that meets the actual application scenario.

[0060] Specifically, the control module 10 obtains the position of the motor 14, and based on the position of the motor 14, obtains the target output power of the motor 14 at this position, and calculates the power deviation based on the actual output power of the motor 14 at this position, and then reversely adjusts the duty cycle of the large current pulse signal based on the power deviation.

[0061] Specifically, if the target output power of the motor 14 at this position is lower than the actual output power of the motor 14 at this position, the duty cycle of the large current pulse signal is controlled to be reduced to reduce the average voltage and current of the motor 14, thereby reducing the actual output power of the motor 14;

[0062] If the target output power of the motor 14 at this position is higher than the actual output power of the motor 14 at this position, the duty cycle of the large current pulse signal is controlled to increase to increase the average voltage and current of the motor 14 , thereby increasing the actual output power of the motor 14 .

[0063] In this embodiment, the short-circuit module 40 performs phase short-circuit under different currents to generate different current impact quantities.

[0064] like Figure 2 , which is a schematic diagram of the structure of the control module 10 according to the embodiment of the present application. The control module 10 comprises: a single chip microcomputer 11, a driving circuit unit 12 and a current sampling unit 13.

[0065] In this embodiment, the single-chip microcomputer 11 is used to obtain the position of the motor 14 and output a large current pulse based on the position of the motor 14; the driving circuit unit 12 controls the opening of the IGBT based on the large current pulse, and drives the motor 14 through the IGBT; the current sampling unit 13 is used to obtain the voltage signal of the bus current of the short-circuit module 40 when the phase line is short-circuited, and send the voltage signal of the bus current to the single-chip microcomputer 11; the single-chip microcomputer 11 calculates and obtains the test data of the current impact test based on the voltage signal of the bus current.

[0066] In this embodiment, the single-chip microcomputer 11 obtains the position of the motor 14, and obtains the mechanical power required to be output by the motor 14 based on the position of the motor 14, thereby reversely adjusting the duty cycle of the large current pulse signal; the driving circuit unit 12 receives the large current pulse signal with adjusted duty cycle output by the single-chip microcomputer 11, and controls the turning on of the IGBT to further drive the motor 14 to achieve the mechanical power required to be output at this position.

[0067] In this embodiment, when the IGBT is subjected to a current impact test, when the short-circuit module 40 performs a phase line short-circuit, the current sampling unit 13 acquires the voltage signal of the bus current in real time, and sends the acquired voltage signal of the bus current to the single-chip computer 11, and the single-chip computer 11 calculates the impact current and the number of impacts during the current impact test and the IGBT protection current threshold based on the voltage signal of the bus current, wherein the IGBT protection current threshold is a preset value, a known value, and the IGBT protection current threshold can be adjusted multiple times to obtain the test results of the current impact test with different IGBT protection current thresholds under the same bus current condition.

[0068] Exemplarily, the current sampling unit 13 uses a sampling resistor and an operational amplifier, and amplifies the voltage signal across the sampling resistor to obtain the voltage signal of the bus current.

[0069] Specifically, the inrush current is calculated based on the acquired voltage signal of the bus current and the resistance value of the sampling resistor.

[0070] like Figure 1 As shown, in some implementations, the reliability testing device 100 further includes: a display module 50 .

[0071] In this embodiment, the display module 50 is connected to the control module 10 for receiving and displaying test data of a current impact test; the test data of the current impact test includes: an IGBT protection current threshold, an impact current, and a number of impacts.

[0072] Specifically, the display module 50 is connected to the control module 10 for communication, receives the test data of the current impact test output by the single chip computer 11, and displays the test data for recording and observation.

[0073] In this embodiment, the display module 50 can also be used to adjust the output current to further adjust the duty cycle of the large current pulse.

[0074] Specifically, the display module 50 is used to adjust corresponding component parameters to further adjust the output current.

[0075] When the reliability test of the IGBT is performed on the sewing machine head and in the actual environment of the head, the initial position of the head connecting rod structure (not shown, which is a common structure in the sewing machine system) can be adjusted through the display module 50 to debug the output current.

[0076] It should be understood that the division of modules in the embodiments of the present application is schematic and is only a logical function division. There may be other division methods in actual implementation. In addition, each functional module in each embodiment of the present application may be integrated into a processor, or may exist physically separately, or two or more modules may be integrated into one module. The above-mentioned integrated modules may be implemented in the form of hardware or in the form of software functional modules.

[0077] It should be noted that in the embodiments of the present application, words such as "exemplary" or "for example" represent examples, illustrations or descriptions. Any embodiment or design described as "exemplary" or "for example" in the present application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary" or "for example" is intended to present related concepts in a specific way.

[0078] In order to facilitate understanding of the embodiments of the present application, Figure 3 Detailed description. Figure 3 The flowchart of the reliability test method of the IGBT for sewing machine in the embodiment of the present application is shown. The reliability test method in this embodiment mainly includes the following steps:

[0079] Step S1: Acquire the position of the motor 14 .

[0080] Specifically, the position of the motor 14 is acquired through the control module 10 .

[0081] Step S2 : Based on the position of the motor 14 , a large current pulse is generated to control turning on the IGBT and drive the motor 14 .

[0082] Specifically, the control module 10 obtains the mechanical power that the motor 14 needs to output based on the position of the motor 14, thereby reversely adjusting the width of the high-current pulse signal to generate a high-current pulse that meets the actual application scenario.

[0083] Specifically, the control module 10 obtains the position of the motor 14, and based on the position of the motor 14, obtains the target output power of the motor 14 at this position, and calculates the power deviation based on the actual output power of the motor 14 at this position, and then reversely adjusts the duty cycle of the large current pulse signal based on the power deviation.

[0084] Specifically, if the target output power of the motor 14 at this position is lower than the actual output power of the motor 14 at this position, the duty cycle of the large current pulse signal is controlled to be reduced to reduce the average voltage and current of the motor 14, thereby reducing the actual output power of the motor 14;

[0085] If the target output power of the motor 14 at this position is higher than the actual output power of the motor 14 at this position, the duty cycle of the large current pulse signal is controlled to increase to increase the average voltage and current of the motor 14 , thereby increasing the actual output power of the motor 14 .

[0086] Step S3: simulating a short-circuit condition by using the short-circuit module 40 to generate a current impulse to perform a current impulse test on the IGBT.

[0087] In some implementations, the short-circuit module 40 is used to simulate a short-circuit condition and generate a current shock to perform a current shock test on the IGBT, including: under the current condition of the large current pulse, adjusting the current protection threshold of the IGBT, and performing a current shock test on the IGBT based on different current protection thresholds.

[0088] Step S4: adjusting the position of the motor 14 to obtain different high current pulses; based on the different high current pulses, using the short circuit module 40 to simulate short circuit conditions, generating current shocks to perform current shock tests on the IGBT.

[0089] In some implementations, the position of the motor 14 is adjusted by the control module 10 to adjust the duty cycle of the high current pulse based on the position of the motor 14 to generate a high current pulse that meets the actual application scenario.

[0090] Step S5: Count the test data when performing current impact test based on the different large current pulses and the different current protection thresholds; based on the test data, obtain the relationship between the IGBT failure rate and the number of current impacts based on different large current pulses and based on different current protection thresholds.

[0091] Figure 4 is a schematic block diagram of an electronic terminal provided in an embodiment of the present application. Figure 4 As shown, the electronic terminal 400 includes: at least one processor 401, a memory 402, at least one network interface 403 and a user interface 405. The various components in the device are coupled together through a bus system 404. It can be understood that the bus system 404 is used to achieve connection and communication between these components. In addition to the data bus, the bus system 404 also includes a power bus, a control bus and a status signal bus. However, for the sake of clarity, Figure 4 In the specification, various buses are labeled as bus systems.

[0092] The user interface 405 may include a display, a keyboard, a mouse, a trackball, a click gun, keys, buttons, a touch pad or a touch screen.

[0093] It is understood that the memory 402 can be a volatile memory or a non-volatile memory, and can also include both volatile and non-volatile memories. Among them, the non-volatile memory can be a read-only memory (ROM), a programmable read-only memory (PROM), which is used as an external cache. By way of exemplary but not limiting explanation, many forms of RAM are available, such as static random access memory (SRAM), synchronous static random access memory (SSRAM). The memory described in the embodiments of the present application is intended to include but is not limited to these and any other suitable categories of memory.

[0094] The memory 402 in the embodiment of the present application is used to store various categories of data to support the operation of the electronic terminal 400. Examples of these data include: any executable program for operating on the electronic terminal 400, such as an operating system 4021 and an application 4022; the operating system 4021 includes various system programs, such as a framework layer, a core library layer, a driver layer, etc., for implementing various basic services and processing hardware-based tasks. The application 4022 may include various applications, such as a media player (Media Player), a browser (Browser), etc., for implementing various application services. The reliability testing method provided by the embodiment of the present application may be included in the application 4022.

[0095] The method disclosed in the above embodiment of the present application can be applied to the processor 401, or implemented by the processor 401. The processor 401 may be an integrated circuit chip with signal processing capabilities. In the implementation process, each step of the above method can be completed by an integrated logic circuit of the hardware in the processor 401 or an instruction in the form of software. The above processor 401 may be a general processor, a digital signal processor (DSP, Digital Signal Processor), or other programmable logic devices, discrete gates or transistor logic devices, discrete hardware components, etc. The processor 401 can implement or execute the various methods, steps and logic block diagrams disclosed in the embodiments of the present application. The general processor 401 may be a microprocessor or any conventional processor, etc. In combination with the steps of the accessory optimization method provided in the embodiment of the present application, it can be directly embodied as a hardware decoding processor to execute, or it can be executed by a combination of hardware and software modules in the decoding processor. The software module can be located in a storage medium, which is located in a memory, and the processor reads the information in the memory and completes the steps of the above method in combination with its hardware.

[0096] In summary, the present application provides a reliability test device and method for IGBT used in sewing machines. The present application provides a reliability test device and method for IGBT used in sewing machines. By utilizing the position of the motor in the sewing machine and combining it with the controller to generate a large current pulse, the large current narrow pulse condition of the product can be truly simulated, thereby more truly testing the reliability of the driver power device IGBT. Therefore, the present application effectively overcomes various shortcomings in the prior art and has a high industrial utilization value.

[0097] The protection scope of the reliability testing method for IGBT for sewing machines described in the embodiment of the present application is not limited to the execution order of the steps listed in the present embodiment. All solutions implemented by adding, reducing or replacing steps in the prior art based on the principles of the present application are included in the protection scope of the present application.

[0098] In several embodiments provided in the present application, it should be understood that the disclosed system, device or method can be implemented in other ways. For example, the device embodiments described above are only schematic, for example, the division of modules / units is only a logical function division, and there may be other division methods in actual implementation, for example, multiple modules or units can be combined or integrated into another system, or some features can be ignored or not executed. Another point, the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or modules or units, which can be electrical, mechanical or other forms. The modules / units described as separate components may or may not be physically separated, and the components displayed as modules / units may or may not be physical modules, that is, they may be located in one place, or they may be distributed on multiple network units. Some or all of the modules / units may be selected according to actual needs to achieve the purpose of the embodiments of the present application. For example, each functional module / unit in each embodiment of the present application may be integrated in a processing module, or each module / unit may exist physically alone, or two or more modules / units may be integrated in one module / unit.

[0099] Those of ordinary skill in the art should further appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the composition and steps of each example have been generally described in the above description according to function. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0100] The descriptions of the processes or structures corresponding to the above-mentioned figures have different emphases. For parts that are not described in detail in a certain process or structure, please refer to the relevant descriptions of other processes or structures.

[0101] The above embodiments are merely illustrative of the principles and effects of the present application and are not intended to limit the present application. Anyone familiar with the technology may modify or change the above embodiments without violating the spirit and scope of the present application. Therefore, all equivalent modifications or changes made by a person of ordinary skill in the art without departing from the spirit and technical ideas disclosed in the present application shall still be covered by the claims of the present application.

Claims

1. A reliability test device for an IGBT for a sewing machine, characterized in that: The reliability testing device comprises: a control module, a motor, a motor positioning module and a short circuit module; wherein, The motor positioning module is used to adjust the position of the motor; The control module is used to generate a large current pulse based on the position of the motor to control the IGBT to turn on and drive the motor; The short-circuit module is used to simulate a short-circuit condition and generate a current impulse to perform a current impulse test on the IGBT.

2. The reliability test device for IGBT for sewing machines according to claim 1, characterized in that: The control module includes: a single chip microcomputer, a driving circuit unit and a current sampling unit; The single chip microcomputer is used to obtain the position of the motor and output a large current pulse based on the position of the motor; The driving circuit unit turns on the IGBT based on the large current pulse control, and drives the motor through the IGBT; The current sampling unit is used to obtain the voltage signal of the bus current of the short-circuit module when the phase line is short-circuited, and send the voltage signal of the bus current to the single-chip microcomputer; The single chip microcomputer calculates and obtains test data of the current impact test based on the voltage signal of the bus current.

3. The reliability test device for IGBT for sewing machine according to claim 1, characterized in that: The motor positioning module comprises: a height adjustment unit, and the height adjustment unit is used to adjust the motor to different heights.

4. The reliability test device for IGBT for sewing machine according to claim 3, characterized in that: The output is different when the position of the motor is different. The control module adjusts the duty cycle of the large current pulse based on the position feedback of the motor to control the turning on of the IGBT.

5. The reliability test device for IGBT for sewing machine according to claim 1, characterized in that: The reliability testing device further includes: a display module; The display module is in communication connection with the control module, and is used for receiving, displaying and recording the test data of the current impact test; the test data of the current impact test includes: IGBT protection current threshold, impact current and impact times.

6. The reliability test device for IGBT for sewing machine according to claim 5, characterized in that: The display module is also used to adjust the output current to adjust the duty cycle of the large current pulse.

7. A reliability test method for an IGBT for a sewing machine, applied to the reliability test device for an IGBT for a sewing machine according to any one of claims 1 to 6, characterized in that: The reliability testing method comprises: Get the position of the motor; Generate a large current pulse based on the position of the motor to control the IGBT to turn on and drive the motor; A short-circuit module is used to simulate a short-circuit condition and generate a current impulse to perform a current impulse test on the IGBT.

8. The reliability testing method of an IGBT for a sewing machine according to claim 7, characterized in that: Using a short-circuit module to simulate a short-circuit condition and generate a current impulse to perform a current impulse test on the IGBT includes: Under the condition of the current large current pulse, the current protection threshold of the IGBT is adjusted, and a current impact test is performed on the IGBT based on different current protection thresholds.

9. The reliability testing method of an IGBT for a sewing machine according to claim 7, characterized in that: The reliability testing method further includes: Adjusting the position of the motor to obtain different high current pulses; Based on the different high current pulses, a short circuit module is used to simulate a short circuit condition, and a current impact is generated to perform a current impact test on the IGBT.

10. The reliability testing method of an IGBT for a sewing machine according to claim 9, characterized in that: The reliability testing method further includes: Collecting test data when performing current impact test based on the different large current pulses and the different current protection thresholds; Based on the test data, the relationship between the IGBT failure rate and the number of current impacts based on different large current pulses and based on different current protection thresholds is obtained.

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