Batch chip test equipment

Abstract

The invention relates to the technical field of chip testing, in particular to batch chip testing equipment, which is characterized in that a suction cup drives chips to rotate to adjust the chips to accurate positions, impurities remaining on chip contacts are erased through a cleaning plate so as to ensure the accuracy of chip function testing results, and in addition, the chip testing efficiency is improved. The chip is abutted against the cleaning plate through the sucker, then the angle of the chip is adjusted, the chip and the cleaning plate are in relative friction at the moment, chip contact cleaning operation is automatically completed in the process of angle adjustment of the chip, and compared with one-by-one processing, the process steps are shortened, and the production efficiency is improved; the invention discloses batch chip testing equipment which comprises a bearing plate, a bearing block, an electric push rod, a first connecting block, a first pipeline, a suction cup, a second pipeline, a cleaning plate, a detection assembly, a fixing assembly, a pressing assembly and a driving assembly. The bottom plate is connected with a driving assembly; the driving assembly is connected with a fixing assembly.

Description

Technical Field

[0001] The present invention relates to the technical field of chip testing, and more specifically, to a batch chip testing device. Background Art

[0002] For chip manufacturers, in order to ensure the quality of chip manufacturing, chips generally need to be tested and sorted regularly before leaving the factory. In order to ensure production and processing efficiency, in the previous process of testing, multiple chips are generally placed in the same material tray. During the placement process, some chips will have incorrect contact positions, resulting in the failure of the contacts of the detection mechanism to accurately dock with the contacts of the chip during the test, resulting in test failure or even misjudgment. At the same time, if there are impurities left at the contact position of the chip, the impurities will interfere with the stability of the electrical connection between the chip and the detection mechanism, thereby interfering with the test operation and causing large errors in the test results. Summary of the invention

[0003] In order to overcome the shortcomings that the chip contacts are not positioned correctly and impurities remain on the chip contacts, which may cause errors in testing, the present invention provides a batch chip testing device.

[0004] The technical solution is as follows: A batch chip testing device includes a base plate, a shell and a visual sensor; the base plate is fixedly connected to the shell; the shell is connected to the visual sensor; it also includes a receiving plate, a receiving block, an electric push rod, a connecting block 1, a pipe 1, a suction cup, a pipe 2, a cleaning plate, a detection component, a fixing component, a pressing component and a driving component; the base plate is connected to the driving component; the driving component is connected to the fixing component; the driving component is used to drive the fixing component to move horizontally; the fixing component is connected to the receiving plate, and the fixing component is used to fix the receiving plate; the receiving plate is fixed with a plurality of There are a plurality of receiving blocks; a plurality of electric push rods are connected to the driving assembly; the telescopic end of each electric push rod is fixedly connected to a connecting block 1; each connecting block 1 is rotatably connected to a pipe 1; the driving assembly is used to drive the pipe 1 to rotate; each pipe 1 is connected to a suction cup; each pipe 1 is connected to a pipe 2; pipe 1 is rotatably connected to pipe 2; a cleaning plate is fixedly connected to the outer shell; a detection assembly is connected to the outer shell, and the detection assembly is used to detect the contact position of the chip; a clamping assembly is connected to the outer shell, and the clamping assembly is used to clamp the chip to a limit position.

[0005] Furthermore, the detection component includes a telescopic cylinder, a connecting plate and a detection head; at least two telescopic cylinders are fixedly connected to the outer shell; the telescopic ends of all telescopic cylinders are commonly fixedly connected to a connecting plate; and a plurality of detection heads are fixedly connected to the connecting plate.

[0006] Furthermore, the fixing component includes a supporting frame, a magnet 1 and a limit block 1; at least two supporting frames are fixedly connected to the driving component; each supporting frame is fixedly connected to a magnet 1; at least two limit blocks 1 are fixedly connected to the supporting plate, and the limit block 1 is connected to the corresponding magnet 1; the limit block 1 is set to be made of iron material.

[0007] Furthermore, the clamping assembly includes a telescopic cylinder 2, a fixed plate and a pressure block; at least two telescopic cylinders 2 are fixedly connected to the outer shell; the telescopic ends of all telescopic cylinders 2 are commonly fixedly connected to the fixed plate; and a number of pressure blocks are fixedly connected to the fixed plate.

[0008] Furthermore, the driving assembly includes an electric slide rail, an electric slider, a connecting plate 2, a motor, a gear 1 and a gear 2; at least two electric slide rails are fixedly connected to the bottom plate; each electric slide rail is slidably connected to an electric slider; all electric sliders are commonly fixedly connected to a connecting plate 2, the connecting plate 2 is fixedly connected to the electric push rod, and the connecting plate 2 is fixedly connected to the receiving frame; each connecting block 1 is fixedly connected to a motor; each motor output end is fixedly connected to a gear 1; each pipe 1 is fixedly connected to a gear 2, and the gear 2 is meshed with the corresponding gear 1.

[0009] Furthermore, it also includes an auxiliary component; the receiving block is connected with an auxiliary component; the auxiliary component includes a ring, an L-shaped block, a connecting block 2, a cylinder, a magnet 2, a magnet 3, a magnet 4 and a magnet 5; each receiving block is slidably connected with a ring; each ring is fixedly connected with at least four L-shaped blocks, and the L-shaped blocks are in contact with the corresponding receiving blocks; each suction cup is fixedly connected with a connecting block 2; each connecting block 2 is fixedly connected with at least four cylinders; each cylinder is fixedly connected with a magnet 2; each ring is fixedly connected with a magnet 3; each L-shaped block is fixedly connected with a magnet 4; each receiving block is fixedly connected with at least four magnets 5, and the magnets 5 are in contact with the corresponding magnets 4.

[0010] Furthermore, it also includes a locking component; a locking component is connected to the receiving plate; the locking component includes a sliding rod, a fixed block and a moving unit; two sliding rods are slidably connected to the receiving plate; each sliding rod is fixed with at least four fixed blocks, and the fixed blocks are slidably connected to the corresponding receiving blocks; the sliding rod is connected to the moving unit, and the moving unit is used to drive the sliding rod to move horizontally.

[0011] Furthermore, the moving unit includes a bidirectional screw and a hand wheel; the receiving plate is rotatably connected to the bidirectional screw; the two sliding rods are both rotationally connected to the bidirectional screw; and the hand wheel is fixedly connected to the bidirectional screw.

[0012] Furthermore, it also includes a second limiting block; each slide bar is fixedly connected with two second limiting blocks; and every two adjacent second limiting blocks are in contact with each other.

[0013] Furthermore, a detachable side panel is provided on the shell.

[0014] The beneficial effects are: 1. The chip is rotated by the suction cup to adjust it to the correct position, and the impurities remaining on the chip contacts are wiped off by the cleaning plate to ensure the accuracy of the chip function test results. In addition, the chip is placed against the cleaning plate by the suction cup and then the angle of the chip is adjusted. At this time, the chip will have relative friction with the cleaning plate, that is, the chip contact cleaning operation is automatically completed during the chip angle adjustment process. Compared with one-by-one processing, the process steps are shortened, which is conducive to improving production efficiency; Second, the chip is limited by the L-shaped block to avoid the problem that the chip cannot be reset due to the change of the relative position between the chip and the suction cup, thereby avoiding affecting the chip test operation; 3. The L-shaped block is fixed by a fixing block. During the process of storing and transferring the fixture, the ring and the L-shaped block can be prevented from falling off. At the same time, during the process of placing the fixture, it can automatically detect whether the L-shaped block is locked to avoid the phenomenon of missed locking. At the same time, the limit block 2 used for stacking and fixing the fixture is also used to block and limit the sliding rod to prevent the fixed block from moving too far and separating from the receiving block, which is beneficial to improve stability. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 The schematic diagram of the structure of the batch chip testing equipment of the present invention is shown; Figure 2 A schematic diagram of the structure of the inner side of the housing of the present invention is shown; Figure 3 A front view of a batch chip testing device of the present invention is shown; Figure 4 A schematic structural diagram of a fixing assembly of the present invention is shown; Figure 5 A schematic diagram of the structure of the auxiliary component of the present invention is shown; Figure 6 A schematic diagram of the structure of the drive assembly of the present invention is shown; Figure 7 The present invention is shown Figure 4 The enlarged view of point A in the middle; Figure 8 The present invention is shown Figure 4 The enlarged view of point B in the middle; Fig. 9 The present invention is shown Figure 4 Enlarged view of point C in the middle.

[0016] Markings in the attached drawings: 1-bottom plate, 2-housing, 3-visual sensor, 4-support plate, 5-support block, 6-electric push rod, 7-connecting block 1, 8-pipeline 1, 9-suction cup, 10-pipeline 2, 11-cleaning plate, 101-telescopic cylinder 1, 102-connecting plate 1, 103-detection head, 201-support frame, 202-magnet 1, 203-limiting block 1, 204-telescopic cylinder 2, 205-fixed plate, 206-pressing block, 207-electric slide rail , 208-electric slider, 209-connecting plate 2, 2010-motor, 2011-gear 1, 2012-gear 2, 2013-ring, 2014-L-shaped block, 2015-connecting block 2, 2016-cylinder, 2017-magnet 2, 2018-magnet 3, 2019-magnet 4, 2020-magnet 5, 2021-slide rod, 2022-fixed block, 2023-bidirectional screw rod, 2024-hand dial wheel, 2025-limit block 2. DETAILED DESCRIPTION

[0017] Embodiments of the present invention are described in detail below with reference to the accompanying drawings.

[0018] Example 1 A batch chip testing equipment, such as Figure 1-Figure 6 As shown, it includes a bottom plate 1, a shell 2 and a visual sensor 3; the bottom plate 1 is bolted with the shell 2, and the bottom plate 1 is set to be made of alloy; the visual sensor 3 is connected to the shell 2; it also includes a receiving plate 4, a receiving block 5, an electric push rod 6, a connecting block 7, a pipe 1 8, a suction cup 9, a pipe 2 10, a cleaning plate 11, a detection component, a fixing component, a pressing component and a driving component; the bottom plate 1 is connected to the driving component; the fixing component is connected to the receiving plate 4; the receiving plate 4 is welded with eight A receiving block 5; eight electric push rods 6 are connected to the driving component; a connecting block 7 is fixedly connected to the telescopic end of each electric push rod 6; a pipe 8 is rotatably connected to each connecting block 7; each pipe 8 is connected to and fixed with a suction cup 9; each pipe 18 is connected to a pipe 2 10; pipe 18 is rotatably connected to pipe 2 10; a cleaning plate 11 is detachably connected to the outer shell 2, and an alcohol solution is absorbed on the inner side of the cleaning plate 11; a detection component is connected to the outer shell 2; a clamping component is connected to the outer shell 2.

[0019] The detection component includes a telescopic cylinder 101, a connecting plate 102 and a detection head 103; two telescopic cylinders 101 are bolted to the outer shell 2; the telescopic ends of all telescopic cylinders 101 are commonly fixed to a connecting plate 102; eight detection heads 103 are bolted to the connecting plate 102, and the contact position of the chip is detected by the detection head 103.

[0020] The fixing assembly includes a receiving frame 201, a magnet 202 and a limit block 203; two receiving frames 201 are bolted to the driving assembly; each receiving frame 201 is fixedly connected with a magnet 202; two limit blocks 203 are welded on the receiving plate 4, and the limit blocks 203 are connected with the corresponding magnets 202; the limit blocks 203 are made of iron, and the magnets 202 and the limit blocks 203 are tightly attracted by magnetic force.

[0021] The clamping assembly includes a telescopic cylinder 204, a fixed plate 205 and a pressure block 206; two telescopic cylinders 204 are bolted to the outer shell 2; the telescopic ends of all telescopic cylinders 204 are commonly fixedly connected to a fixed plate 205, and the fixed plate 205 is made of plastic; eight pressure blocks 206 are fixedly connected to the fixed plate 205, and the upper side of the chip is limited by the pressure blocks 206.

[0022] The driving assembly includes an electric slide rail 207, an electric slider 208, a connecting plate 209, a motor 2010, a gear 1 2011 and a gear 2 2012; two electric slide rails 207 are bolted to the bottom plate 1; an electric slider 208 is slidably connected to each electric slide rail 207; all electric sliders 208 are fixedly connected to a connecting plate 209, the connecting plate 209 is bolted to the electric push rod 6, and the connecting plate 209 is bolted to the receiving frame 201; a motor 2010 is bolted to each connecting block 7; a gear 1 2011 is fixedly connected to the output end of each motor 2010; a gear 2 2012 is fixedly connected to each pipeline 8, the gear 2 2012 is meshed with the corresponding gear 1 2011, the motor 2010 drives the gear 1 2011 to rotate, the gear 1 2011 drives the gear 2 2012 to rotate, and the gear 2 2012 drives the pipeline 8 to rotate.

[0023] First, manually connect the external air pump to the pipe 2 10, place a chip in each receiving block 5, and the four thickness surfaces of the chip just touch the inner wall of the receiving block 5, and the upper side of the chip is lower than the upper side of the receiving block 5. During the test, start the electric slide rail 207 and the electric slider 208, the electric slider 208 drives the connecting plate 209 to move rightward, the connecting plate 209 drives the parts on it to move rightward to the inside of the shell 2, and makes the receiving plate 4 move to the bottom of the visual sensor 3, the electric slider 208 stops moving, at this time, the visual sensor 3 is used to visually detect the chip, and its offset angle is determined according to the contact position of the chip, and then the electric cylinder 208 is used to move the connecting plate 209 to the inner side of the shell 2. 04 drives the fixing plate 205 to move downward, and the fixing plate 205 drives the pressing block 206 to move downward, so that the pressing block 206 contacts the upper side of the chip and limits the chip inside the receiving block 5, and then the electric push rod 6 drives the connecting block 1 7 and the parts thereon to move upward, so that the suction cup 9 moves upward to contact the lower side of the chip, and then the external air pump sucks air into the pipe 2 10, so that the air between the chip and the suction cup 9 is discharged through the pipe 1 8 and the pipe 2 10, so that the cavity between the chip and the suction cup 9 is in a negative pressure state, so that the chip is sucked tightly on the suction cup 9, and then the telescopic cylinder 2 204 drives the fixing plate 205 and the pressing block 206 to move upward back to their original positions, so that the pressing block 206 stops limiting the chip; The electric slider 208 drives the parts thereon to continue to move rightward, so that the receiving plate 4 moves to the bottom of the cleaning plate 11, and the electric slider 208 stops moving. Then the electric push rod 6 drives the connecting block 1 7 and the parts thereon to move upward, so that the suction cup 9 drives the chip to move upward and contact the cleaning plate 11, and then the motor 2010 is started. The motor 2010 drives the gear 1 2011 to rotate, the gear 1 2011 drives the gear 2 2012 to rotate, the gear 2 2012 drives the pipe 1 8 to rotate, the pipe 1 8 drives the suction cup 9 to rotate, and the suction cup 9 drives the chip to rotate, so that the chip with an offset angle is rotated to the accurate angle, and the chip with no offset angle is rotated 360 degrees, so that each chip is Slide on the cleaning plate 11, so that most of the impurities remaining on the chip contacts react with the alcohol solution to neutralize, and a small amount of dust particles and impurities are transferred and adhered to the lower side of the cleaning plate 11, and then the electric push rod 6 drives the connecting block 7 and the parts thereon to move downward, so that the chip moves back to the inside of the receiving block 5, and then the electric slider 208 drives the parts thereon to continue to move to the right, so that the receiving plate 4 moves to just below the connecting plate 102, the electric slider 208 pauses, and then the telescopic cylinder 101 drives the connecting plate 102 and the detection head 103 to move downward, so that the detection head 103 contacts the contacts of the chip, so that the detection head 103 is electrically connected to the chip, and the chip is functionally tested through the detection head 103.

[0024] After the detection is completed, the telescopic cylinder 101 drives the connecting plate 102 and the detection head 103 to move back to the original position, the suction cup 9 stops sucking the chip, and the electric slider 208 drives the parts on it to move back to the original position to the left, and then the receiving plate 4 is manually pulled upward, and the receiving plate 4 drives the limit block 203 to move upward, so that the limit block 203 is away from the receiving frame 201 and the magnet 202, so that the receiving plate 4 and the parts on it are removed, and the receiving plate 4 and the parts on it are transported to the next process, and the chip is processed in the next step. At this time, the receiving plate 4 and the parts on it are provided with multiple sets as jigs to meet the needs of mass production. During use, they should be checked regularly. Alcohol solution is added to the inner side of the cleaning plate 11. When there are too many dust particles adhering to the lower side of the cleaning plate 11, the cleaning plate 11 should be replaced. When in use, the chip is rotated by the suction cup 9 to adjust it to the correct position, and the impurities remaining on the chip contacts are wiped off by the cleaning plate 11 to ensure the accuracy of the chip function test results. In addition, the chip is pressed against the cleaning plate 11 by the suction cup 9 and then the angle of the chip is adjusted. At this time, the chip will have relative friction with the cleaning plate 11, that is, the chip contact cleaning operation is automatically completed during the process of adjusting the chip angle. Compared with one by one processing, the process steps are shortened, which is conducive to improving production efficiency.

[0025] Example 2 On the basis of Example 1, Figure 5 and Figure 6 As shown, it also includes auxiliary components; the receiving block 5 is connected with an auxiliary component; the auxiliary component includes a ring 2013, an L-shaped block 2014, a connecting block 2015, a cylinder 2016, a magnet 2 2017, a magnet 3 2018, a magnet 4 2019 and a magnet 5 2020; each receiving block 5 is slidably connected with a ring 2013, and the ring 2013 is set to a smooth material; each ring 2013 is welded with four L-shaped blocks 2014, and the L-shaped blocks 2014 are in contact with the corresponding receiving block 5; each suction cup 9 There is a connecting block 2015 bolted on each of them; four cylinders 2016 are welded on each connecting block 2015; a magnet 2 2017 is fixedly connected to each cylinder 2016; a magnet 3 2018 is fixedly connected to each ring 2013; a magnet 4 2019 is fixedly connected to each L-shaped block 2014; four magnets 5 2020 are fixedly connected to each receiving block 5, the magnets 5 2020 are in contact with the corresponding magnets 4 2019, and the magnets 4 2019 and the magnets 5 2020 are attracted to each other by magnetic force.

[0026] When the suction cup 9 drives the chip to rotate, friction resistance is formed between the chip and the cleaning plate 11. The friction resistance acts on the chip, thereby causing the relative position of the chip and the suction cup 9 to change, so that the suction cup 9 cannot drive the chip back to the receiving block 5. Therefore, after the chip is placed on the inner side of the receiving block 5, the lower side and thickness surface of the chip just contact with the corresponding L-shaped block 2014, and the upper side of the chip is higher than the uppermost part of the L-shaped block 2014. When the pressing block 206 presses the chip to a limit position, the electric push rod 6 drives the connecting block 7 to move upward. The suction cup 9 sucks the chip tightly. At the same time, the suction cup 9 drives the connecting block 2015 to move upward. The connecting block 2015 drives the cylinder 2016 and the magnet 2017 to move upward, so that the cylinder 2016 is inserted into the ring 2013, and the magnet 2 2017 contacts the corresponding magnet 3 2018. At this time, the magnet 2 2017 and the magnet 3 2018 fix the ring 2013 on the connecting block 2 2015 through magnetic force. When the receiving plate 4 moves to the bottom of the cleaning plate 11, the electric push rod 6 drives the connecting block 1 7 and the connecting block 1 7 thereon. The parts move upward, the connecting block 2015 drives the ring 2013 to move upward, the ring 2013 drives the L-shaped block 2014 to move upward away from the receiving block 5, and the L-shaped block 2014 drives the magnet 4 2019 to move upward away from the magnet 5 2020, that is, the L-shaped block 2014 and the chip move upward together until the chip contacts the cleaning plate 11, and the suction cup 9 is controlled by the motor 2010 to rotate, and the suction cup 9 drives the chip to rotate to adjust the angle of the chip. At the same time, the suction cup 9 drives the cylinder 2016 to rotate, and the cylinder 201 6 drives the ring 2013 to rotate, and the ring 2013 drives the L-shaped block 2014 to rotate, that is, the L-shaped block 2014 and the chip rotate together. During this process, the chip is limited by the L-shaped block 2014 to avoid the relative position of the chip and the suction cup 9 from changing, thereby avoiding the problem that the chip cannot move back to the receiving block 5. When in use, the chip is limited by the L-shaped block 2014 to avoid the problem that the chip cannot be reset due to the change in the relative position of the chip and the suction cup 9, thereby avoiding affecting the chip testing operation.

[0027] Example 3 On the basis of Example 2, Figure 4 , Figure 7 , Figure 8 and Fig. 9 As shown, it also includes a locking assembly; a locking assembly is connected to the receiving plate 4; the locking assembly includes a slide bar 2021, a fixed block 2022 and a moving unit; two slide bars 2021 are slidably connected to the receiving plate 4; four fixed blocks 2022 are welded to each slide bar 2021, and the fixed block 2022 is slidably connected to the corresponding receiving block 5; a moving unit is connected to the slide bar 2021.

[0028] The moving unit includes a bidirectional screw rod 2023 and a hand dial wheel 2024; the bidirectional screw rod 2023 is rotatably connected to the receiving plate 4; the two sliding rods 2021 are both screwed to the bidirectional screw rod 2023; the hand dial wheel 2024 is fixedly connected to the bidirectional screw rod 2023, and the hand dial wheel 2024 is manually rotated to drive the bidirectional screw rod 2023 to rotate through the hand dial wheel 2024.

[0029] It also includes a second limiting block 2025; two second limiting blocks 2025 are welded on each sliding rod 2021; and every two adjacent second limiting blocks 2025 are in contact with each other.

[0030] The housing 2 is provided with a detachable side panel to facilitate manual maintenance of the components inside the housing 2 .

[0031] The receiving plate 4 and the parts thereon are provided with multiple sets and used as a jig. In the process of receiving and transferring the jig, the L-shaped block 2014 is fixed on the receiving block 5 by the magnetic force between the magnet four 2019 and the magnet five 2020. When the jig is subjected to a large impact vibration, the ring 2013 and the L-shaped block 2014 will fall off from the receiving block 5. Therefore, before receiving and transferring the jig, the hand wheel 2024 is manually rotated, and the hand wheel 2024 drives the bidirectional screw rod 20 23 rotates, the bidirectional screw rod 2023 drives the slide bar 2021 to move in opposite directions, and the slide bar 2021 drives the fixed block 2022 to move, so that the fixed block 2022 is inserted into the corresponding L-shaped block 2014, and the L-shaped block 2014 is locked to prevent the L-shaped block 2014 from falling off. When in use, the L-shaped block 2014 is fixed by the fixed block 2022, and the ring 2013 and the L-shaped block 2014 can be prevented from falling off during the storage and transfer of the fixture.

[0032] After the fixed block 2022 locks the L-shaped block 2014, the spacing between the two slide bars 2021 is equal to the length of the limit block 1 203. When stacking the jigs, the limit block 1 203 on the upper jig can be just inserted between the two slide bars 2021 of the lower jig. At the same time, the limit block 1 203 on the upper jig can just rest against the inner side of the limit block 2 2025 of the lower jig, thereby plugging the two jigs together, which is beneficial to improve the stability of the stacking. At the same time, if the limit block 1 203 cannot be inserted between the two slide bars 2021, it means that the two slide bars 2021 have not moved to the locked position, that is, the L-shaped block 2014 is not locked, that is, during the process of placing the jig, it can automatically detect whether the L-shaped block 2014 is locked to avoid the phenomenon of missed locking.

[0033] When the fixture is in use, the L-shaped block 2014 should be unlocked. At this time, the hand dial wheel 2024 is manually turned, and the hand dial wheel 2024 drives the bidirectional screw rod 2023 to rotate. The bidirectional screw rod 2023 drives the two slide bars 2021 to move toward each other, and the slide bar 2021 drives the limit block 2025 to move, so that the two limit blocks 2025 are in contact. At this time, the slide bar 2021 is blocked and limited by the two limit blocks 2025, so as to prevent the fixed block 2022 from moving too far and separating from the receiving block 5. When in use, the limit block 2025 used for stacking the fixed fixture is also used to block and limit the slide bar 2021, so as to prevent the fixed block 2022 from moving too far and separating from the receiving block 5, which is beneficial to improve stability.

[0034] While embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes may be made to these embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A batch chip testing device, comprising a base plate (1); a housing (2) fixedly connected to the base plate (1); and a visual sensor (3) connected to the housing (2); characterized in that: The bottom plate (1) is connected to a driving assembly; the driving assembly is connected to a fixing assembly; the driving assembly is used to drive the fixing assembly to move horizontally; the fixing assembly is connected to a receiving plate (4), the fixing assembly is used to fix the receiving plate (4); a plurality of receiving blocks (5) are fixedly connected to the receiving plate (4); a plurality of electric push rods (6) are connected to the driving assembly; the telescopic end of each electric push rod (6) is fixedly connected to a connecting block 1 (7); each connecting block 1 (7) is rotatably connected to a pipe 1 (8); the driving assembly is used to drive the pipe 1 (8) to rotate; each pipe 1 (8) is connected to a suction cup (9); each pipe 1 (8) is connected to a pipe 2 (10); the pipe 1 (8) is rotatably connected to the pipe 2 (10); a cleaning plate (11) is detachably connected to the outer shell (2); a detection assembly is connected to the outer shell (2), the detection assembly is used to detect the contact position of the chip; a pressing assembly is connected to the outer shell (2), the pressing assembly is used to press the chip to limit position.

2. The batch chip testing equipment according to claim 1, characterized in that: The detection component comprises a telescopic cylinder one (101); at least two telescopic cylinders one (101) are fixedly connected to the outer shell (2); the telescopic ends of all telescopic cylinders one (101) are commonly fixedly connected to a connecting plate one (102); and a plurality of detection heads (103) are fixedly connected to the connecting plate one (102).

3. The batch chip testing equipment according to claim 2, characterized in that: The fixing component comprises a receiving frame (201); at least two receiving frames (201) are fixedly connected to the driving component; each receiving frame (201) is fixedly connected to a magnet 1 (202); at least two limiting blocks 1 (203) are fixedly connected to the receiving plate (4), and the limiting blocks 1 (203) are connected to the corresponding magnet 1 (202); the limiting blocks 1 (203) are made of iron.

4. The batch chip testing equipment according to claim 3, characterized in that: The clamping assembly comprises a telescopic cylinder 2 (204); at least two telescopic cylinders 2 (204) are fixedly connected to the outer shell (2); the telescopic ends of all telescopic cylinders 2 (204) are commonly fixedly connected to a fixing plate (205); and a plurality of pressing blocks (206) are fixedly connected to the fixing plate (205).

5. The batch chip testing equipment according to claim 3, characterized in that: The driving assembly comprises an electric slide rail (207); at least two electric slide rails (207) are fixedly connected to the bottom plate (1); each electric slide rail (207) is slidably connected to an electric slider (208); all the electric sliders (208) are commonly fixedly connected to a second connecting plate (209), the second connecting plate (209) is fixedly connected to the electric push rod (6), and the second connecting plate (209) is fixedly connected to the receiving frame (201); each connecting block (7) is fixedly connected to a motor (210); the output end of each motor (210) is fixedly connected to a gear (211); each pipe (8) is fixedly connected to a second gear (212), and the gear (212) is meshed with the corresponding gear (211).

6. The batch chip testing equipment according to claim 5, characterized in that: The invention also comprises an auxiliary component; the receiving block (5) is connected to the auxiliary component; the auxiliary component comprises a ring (2013); each receiving block (5) is slidably connected to a ring (2013); each ring (2013) is fixedly connected to at least four L-shaped blocks (2014), and the L-shaped blocks (2014) are in contact with the corresponding receiving block (5); each suction cup (9) is fixedly connected to a second connecting block (2015); each connecting block (2015 ...4); each connecting block (2015) is fixedly connected to a second connecting block (2014); each connecting block (2015) is fixedly connected to a second connecting block (2014); each connecting block (2015) is fixedly connected to a second connecting block (2014); each connecting block (2014) is fixedly connected to a second connecting block (2014); each connecting block (2014) is fixedly connected to a second connecting block (2014); each connecting block (2014) is fixedly connected to a second connecting block (2014); each connecting block (2014) is fixedly connected to a second connecting block (2014); each connecting ) are fixedly connected to at least four cylinders (2016); each cylinder (2016) is fixedly connected to a magnet two (2017); each ring (2013) is fixedly connected to a magnet three (2018); each L-shaped block (2014) is fixedly connected to a magnet four (2019); each receiving block (5) is fixedly connected to at least four magnets five (2020), and the magnets five (2020) are in contact with the corresponding magnets four (2019).

7. The batch chip testing equipment according to claim 6, characterized in that: The invention also comprises a locking assembly; the locking assembly is connected to the receiving plate (4); the locking assembly comprises a slide bar (2021); two slide bars (2021) are slidably connected to the receiving plate (4); at least four fixed blocks (2022) are fixedly connected to each slide bar (2021), and the fixed blocks (2022) are slidably connected to the corresponding receiving blocks (5); and a moving unit is connected to the slide bar (221), and the moving unit is used to drive the slide bar (2021) to move horizontally.

8. The batch chip testing equipment according to claim 7, characterized in that: The moving unit comprises a bidirectional screw rod (2023); the bidirectional screw rod (2023) is rotatably connected to the receiving plate (4); the two sliding rods (221) are both rotatably connected to the bidirectional screw rod (2023); and a hand wheel (224) is fixedly connected to the bidirectional screw rod (2023).

9. The batch chip testing equipment according to claim 8, characterized in that: It also includes a second limiting block (2025); each sliding rod (2021) is fixedly connected to two second limiting blocks (2025); and each two adjacent second limiting blocks (2025) are in contact with each other.

10. A batch chip testing device according to any one of claims 1 to 9, characterized in that: The outer shell (2) is provided with a detachable side panel.

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